CN106093689A - A kind of test equipment for photographic head module - Google Patents
A kind of test equipment for photographic head module Download PDFInfo
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- CN106093689A CN106093689A CN201610643214.XA CN201610643214A CN106093689A CN 106093689 A CN106093689 A CN 106093689A CN 201610643214 A CN201610643214 A CN 201610643214A CN 106093689 A CN106093689 A CN 106093689A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
The invention discloses a kind of test equipment for photographic head module, including link block, control module, channel selecting module, constant-current source module, processing module and display module, link block has the pin for connecting one to one with the stitch of photographic head module；Control module is arranged to control the strobe state of channel selecting module, to select a pin of link block to be connected to test earth terminal and select another pin of link block to be connected to the signal output part for providing voltage signal to processing module as benchmark pin as pin to be measured；Constant-current source module is arranged to export constant current to signal output part；Processing module is arranged to detect the connection status between pin to be measured and corresponding benchmark pin according to the voltage signal received；Display module is arranged to show this connection status.Embodiments of the invention can detect the connection status between pin to be measured and benchmark pin automatically, improves the testing efficiency of module.
Description
Technical field
The present invention relates to photographic head module technical field of measurement and test, more particularly it relates to an be used for imaging head mould
The test equipment of group.
Background technology
In photographic head module produces, always there is the part pin of module due to reasons such as FPC, welding and gold threads in module
Open circuit and short circuit or MIPI signal between impedance the phenomenons such as difference occur, and there is out short circuit at part signal in this type of module
After remain to the normal startup optimization of test platform at photographic head module, but mobile phone terminal there will be photographic head module and cannot normally transport
The phenomenon of row.Photographic head module there will be partial image sensor damage phenomenon, the pin of a part of image sensor occur
Diode value there will be abnormal variation, but photographic head module tends to proper testing and runs, and can go out through long-play
Now abnormal.Problems all can affect the use in client of the photographic head module, causes photographic head module production firm image
Tremendous influence.When resolving bad product in the defective product of client feedback or factory, it may be desirable to produce the test data of line.Research and development
Bad photographic head module is needed quickly to analyze by personnel, measures photographic head module pin diode value.Production line is existing to be taken the photograph
As the automaticity of head mould group pin open short circuit test device is low, operator is needed to use circuit tester to test, in test
During need to repeat multiple action, working performance is low.
Summary of the invention
It is an object of the present invention to provide a kind of connection status that can automatically test each pin of photographic head module
New solution.
According to the first aspect of the invention, it is provided that a kind of test equipment for photographic head module, including link block,
Control module, channel selecting module, constant-current source module, processing module and display module, described link block have for institute
State the pin that the stitch of photographic head module connects one to one；Described control module is arranged to control described channel selecting module
Strobe state, to select a pin of described link block be connected to described test earth terminal as pin to be measured and select
Another pin of described link block is connected to the signal for providing voltage signal to described processing module as benchmark pin
Outfan；Described constant-current source module is arranged to export constant current to described signal output part；Described processing module is set
According to the voltage signal that receives detect the connection status between described pin to be measured and corresponding benchmark pin；Described display
Module is arranged to show the connection status of each described pin to be measured.
Optionally, described test equipment also includes that Signal-regulated kinase, described Signal-regulated kinase are arranged to institute
State signal output part output voltage signal carry out signal condition process after be sent to described processing module.
Optionally, described test equipment also includes that analog-to-digital conversion module, described analog-to-digital conversion module are arranged to institute
State signal output part output voltage signal carry out analog-to-digital conversion process after be sent to described processing module.
Optionally, described control module and described processing module are provided by a fpga chip.
Optionally, described display module includes and each described pin to be measured LED display lamp group one to one, each
Described LED display lamp group all includes and each connection status LED display lamp one to one.
Optionally, described test equipment also includes being provided with the startup control circuit starting button, and described startup controls
Circuit is arranged to start the enable signal of test to the output of described control module.
Optionally, described test equipment also includes that buzzer module, described processing module detect described pin to be measured
And when the connection status between corresponding benchmark pin is short circuit or open circuit, output buzzer drives signal to described buzzer
Module, so that described buzzer module sends sound.
It was found by the inventors of the present invention that in the prior art, there is the automatization of photographic head module open-short circuit equipment
Degree is low, causes the problem that working performance is low.Embodiments of the invention are by detecting the magnitude of voltage of benchmark pin, it is possible to automatically examine
Survey the connection status between pin to be measured and benchmark pin, and show test result by display module, improve the survey of module
Examination efficiency.Therefore, the present invention is to be realized technical assignment or to be solved technical problem is that those skilled in the art from
That do not expect or it is not expected that, therefore the present invention is a kind of new technical scheme.
By detailed description to the exemplary embodiment of the present invention referring to the drawings, the further feature of the present invention and
Advantage will be made apparent from.
Accompanying drawing explanation
Combined in the description and the accompanying drawing of the part that constitutes description shows embodiments of the invention, and even
With its explanation together for explaining the principle of the present invention.
Fig. 1 is the square frame principle of a kind of embodiment according to a kind of test equipment for photographic head module of the present invention
Figure；
Fig. 2 is the square frame principle of the another embodiment according to a kind of test equipment for photographic head module of the present invention
Figure.
Description of reference numerals:
U1-control module；U2-channel selecting module；
U3-constant-current source module；U4-processing module；
U5-display module；U6-Signal-regulated kinase；
U7-analog-to-digital conversion module；U8-communication module；
U9-buzzer module；U10-luminous alarm module；
U11-induction module；PC-host computer；
P1-signal output part.
Detailed description of the invention
The various exemplary embodiments of the present invention are described in detail now with reference to accompanying drawing.It should also be noted that unless additionally have
Body illustrates, the parts illustrated the most in these embodiments and positioned opposite, the numerical expression of step and numerical value are not intended to this
The scope of invention.
Description only actually at least one exemplary embodiment is illustrative below, never as to the present invention
And any restriction applied or use.
May be not discussed in detail for technology, method and apparatus known to person of ordinary skill in the relevant, but suitable
In the case of when, described technology, method and apparatus should be considered a part for description.
It is shown here that any occurrence should be construed as merely exemplary with in all examples discussed, and not
It is as restriction.Therefore, other example of exemplary embodiment can have different values.
It should also be noted that similar label and letter represent similar terms, therefore, the most a certain Xiang Yi in following accompanying drawing
Individual accompanying drawing is defined, then need not it is further discussed in accompanying drawing subsequently.
Low in order to solve the automaticity of photographic head module open-short circuit equipment present in prior art, cause making
The problem that industry is inefficient, it is provided that a kind of can automatically test the test of connection status between all pins of photographic head module and set
It is standby, as it is shown in figure 1, the present invention includes link block J1, control module U1, channel selecting for the test equipment of photographic head module
Module U2, constant-current source module U3 and processing module U4.
Existing photographic head module all includes FPC and the imageing sensor being welded on this FPC and is welded on this FPC use
In setting up the adapter being connected with external circuits, wherein, FPC is also printed with the stitch correspondence for making imageing sensor even
The gold thread of connecting connector, causes module holding between the part pin of module can occur due to reasons such as FPC, welding and gold threads
Between road, short circuit or MIPI signal pin, there is the phenomenon of difference in impedance.
Above-mentioned link block J1 has the pin for connecting one to one with the stitch of photographic head module, in the company of module
Connect after device and link block J1 set up and is connected so that the connection of the pin of link block J1 stitch corresponding with module.
Above-mentioned control module U1 is arranged to control the strobe state of channel selecting module U2, to select link block J1
One pin is connected to test earth terminal and select another pin of link block to be connected to as benchmark pin as pin to be measured
For providing the signal output part P1 of voltage signal to processing module.
During short-circuit test, arbitrary pin can be selected as benchmark pin, in residue pin, select a work
For pin to be measured, in order to test in residue pin the connection status between each pin and benchmark pin, residue pipe can be selected
Foot is alternately as pin to be measured.
Further, in order to detect whether there is short circuit between each pin, each pipe of link block J1 can be selected
While foot is alternately as benchmark pin, select the pin in addition to benchmark pin alternately as pin to be measured.
Owing to photographic head module is in order to avoid static interference, one all can be connected between each pin and ground pin for quiet
The backward diode of electric protection, therefore, during open test, selects the ground pin of link block J1 as prover pipe
Foot, select in residue pin one as pin to be measured, in order to test in residue pin between each pin and benchmark pin
Connection status, can select remain pin alternately as pin to be measured, so, it becomes possible to detect what link block J1 connected
Whether camera module exists open circuit between each pin and ground pin.
Above-mentioned constant-current source module U3 be arranged to export constant current to signal output part P1, this constant current
Can be such as 1mA.Constant-current source module U3 output constant current to signal output part P1, this signal output part P1 and benchmark pin
Connecting, therefore, constant current exports to the benchmark pin chosen through channel selecting module U2.
Above-mentioned processing module U4 is arranged to detect pin to be measured and corresponding prover pipe according to the voltage signal received
Connection status between foot.
During short-circuit test, owing to pin to be measured is connected with test earth terminal, it is therefore contemplated that pin to be measured
Voltage is zero, if short circuit between benchmark pin and pin to be measured, this electric current is at benchmark pin, between pin to be measured and earth terminal
Forming path, the voltage of benchmark pin is zero, then, the voltage of signal output part P1 is identical with the voltage of benchmark pin, is also
Zero；If not having short circuit between benchmark pin and pin to be measured, then the voltage of benchmark pin is not zero, the electricity of signal output part P1
Press identical with the voltage of benchmark pin, be also not zero.Therefore, if the voltage signal that processing module U4 receives is zero, then
Can be determined that short circuit between pin to be measured and benchmark pin；If the voltage signal that processing module U4 receives is not zero, then
Can be determined that there is no short circuit between pin to be measured and benchmark pin.
During open test, in the case of being connected between pin to be measured and ground pin normally, this constant current
At ground pin, diode, forming path between pin to be measured and earth terminal, the voltage of ground pin is equal to signal output part P1
Voltage, the voltage at diode two ends connected equal to this pin to be measured, i.e. reference voltage, such as, can be 0.2V-0.7V, that
, the voltage of signal output part P1 is also 0.2V-0.7V；If opened a way between pin to be measured and ground pin, then ground pin
Voltage equal to the voltage of signal output part, the set point of the voltage at the diode two ends that this pin to be measured connects will be exceeded,
More than 2V, the voltage of such as ground pin then thinks that between pin to be measured and ground pin, existence is opened a way.Therefore, if processing mould
When the voltage signal that block U4 receives is not less than the set point of reference voltage signal, pin to be measured and ground pipe can be detected
Do not open a way between foot；If the voltage signal that processing module U4 receives exceedes the set point of reference voltage signal, can
Open a way between pin to be measured and ground pin to detect.
Wherein, during test, the pin in addition to benchmark pin and pin to be measured is the most unsettled, to avoid test
Result produces interference.
On this basis, this equipment can be also used for testing MIPI signal pin (or parallel port pin etc. needs impedance identical
Pin) impedance the problem of difference occurs, if at same pin as benchmark pin, MIPI signal pin (or parallel port
Pin) respectively as pin to be measured time, the voltage differences of benchmark pin exceedes setting value, such as, can be more than 0.2V, then recognize
For the impedance between MIPI signal pin (or parallel port pin), difference occurs.
The present invention is used for the test equipment of photographic head module and can include being provided with the startup control circuit starting button, opens
Dynamic control circuit is arranged to start the enable signal of test to the output of control module U1, specifically, be pressed starting button
Time, starting control circuit and will start the enable signal of test to the output of control module U1, this enable signal can be such as high
Level so that control module U1 controls the strobe state of channel selecting module U2, using select a pin of link block J1 as
Pin to be measured is connected to test earth terminal and select another pin of link block to be connected to for process as benchmark pin
Module provides the signal output part P1 of voltage signal.
Further, this startup control circuit is also configured to when starting button and being lifted, it is impossible to control module U1
Output starts the enable signal of test, such as, can be lasting output low level so that control module U1 stops.
In another specific embodiment of the present invention, it is also possible to be to be opened to the output of control module U1 by induction module
The enable signal of dynamic test, as in figure 2 it is shown, induction module U11 can be configured so that according to photographic head module and link block J1
Connection status to control module U1 output start test enable signal, concrete, induction module U11 can be to sense
Photographic head module sets up the enable signal starting test when being connected to the output of control module U1 with link block J1；At test equipment
In the case of shielding case, this shielding case can shield the external environment interference to test, it is ensured that the accuracy of test result,
Now, if shielding case is closed, i.e. represent photographic head module and be placed in test equipment, establish even with link block J1
Connecing, therefore, induction module U11 can also is that when sensing that shielding case is closed, and starts making of test to the output of control module U1
Can signal.
So, it becomes possible to automatically begin to the test to photographic head module, it is not necessary to manual operation, so improve test effect
Rate.
Further, test equipment also includes Signal-regulated kinase, as in figure 2 it is shown, Signal-regulated kinase U5 is arranged to
The voltage signal exporting signal output part P1 is sent to processing module U4 after carrying out signal condition process, wherein, and signal condition
Briefly exactly measured signal is converted into, by operations such as amplification, filtering, the standard signal that collecting device is capable of identify that.Letter
Number conditioning processes the precision of the voltage signal that can improve signal output part P1 output.
If processor is merely able to process digital signal, then this test equipment also should include analog-to-digital conversion module U7,
Analog-to-digital conversion module U7 is sent to place after being arranged to the voltage signal of signal output part P1 output is carried out analog-to-digital conversion process
Reason module U4.
Owing to analog-to-digital conversion module U7 can only receive a range of analogue signal, and the voltage of signal output part P1 output
Signal may not be in the range of this, therefore, signal output part P1 output voltage signal sometimes must also amplified, filtering,
Linear compensation, isolate, after the signal condition such as protection processes, could send to analog-to-digital conversion module U7 and carry out at analog digital conversion
Reason, then the signal after analog-to-digital conversion process is sent to processing module U4.
On this basis, above-mentioned control module U1 and processing module U4 can be provided by a fpga chip.Due to FPGA
There is the parallel processing capability of excellence and higher integrated level, use fpga chip to carry out test and can effectively simplify test equipment
Circuit structure, improve machine system efficiency, system operating rate soon be conducive to improve production line working performance, due to
The capability of sequential control of FPGA is relatively strong, and the operation sequential being controlled whole system by FPGA control module detects each pin
Connection status, so that detection efficiency is higher, ensure the accuracy of testing result, it is possible to effectively prevent the stream of problem module
Go out, and cost is relatively low, it is simple to safeguard.
In order to all results of test are preserved, it is simple to testing result carries out the later stage reviews, the test of the present invention
Equipment also includes communication module U8 and host computer PC, and communication module U8 is arranged to be connected between pin to be measured with benchmark pin
State is sent to host computer PC in real time, meanwhile, host computer PC can preserve and demonstrate the connection status of each pin, this
Sample, it becomes possible to comparison is the clearest, see the connection status between each pin timely, and, the later stage, this test information can be reviewed.
Concrete, this communication module U8 can be to convert data to the transformats such as USB, LAN, serial ports or WiFi pass
Deliver to host computer PC.
It is low that the present invention tests equipment cost, it is possible to measures module multi-pipe pin abnormal, can detect pin and open a way with short-circuit, multiple
The multiple bad detections such as pin is short-circuit, the diode value of module pin is abnormal, convenient product line operation, it is possible to by module measurement data
Uploading to host computer PC in real time preserve, facilitate product test data traceability, device reliability is high, good stability, and is easily installed
With maintenance.
In order to when module exists the pin of short circuit or open circuit, notify tester in time, it is to avoid test person
Member's operation by mistake, in one particular embodiment of the present invention, test equipment also includes buzzer module U9, as in figure 2 it is shown, process
When module U4 detects the connection status between pin to be measured and corresponding benchmark pin for short circuit or open circuit, export buzzer
Drive signal to buzzer module U9, so that buzzer module U9 sends sound, point out tester.
Further, test equipment can also include luminous alarm module U10, as in figure 2 it is shown, processing module U4 detects
When connection status between pin to be measured and corresponding benchmark pin is short circuit or open circuit, output luminescence drives signal to luminous
Alarm module U10, so that luminous alarm module is luminous, points out tester.This luminous alarm module U10 can be such as one
Controlled LED display lamp, processing module detect connection status between pin to be measured and corresponding benchmark pin for short circuit or
When person opens a way, output luminescence drives signal to this LED display lamp, makes this LED display lamp luminous.
In another specific embodiment of the present invention, this test equipment also includes display module U5, this display module U5
Being arranged to show the connection status of each pin to be measured, concrete, display module U5 can include and each pin one to be measured
The LED display lamp group of one correspondence, each LED display lamp group all includes and each connection status LED display lamp one to one.
So, such as when, in the LED display lamp group of two MIPI signal pins of correspondence of display module U5, the LED of corresponding short circuit shows
Lamp is bright, shows to occur between the two MIPI signal pin short circuit；Such as when the LED display lamp of the power pin showing module U5
In group, the LED display lamp of corresponding open circuit is bright, shows that open circuit occurs in this power pin；The clock signal pin of display module U5
In LED display lamp group, corresponding normal LED display lamp is bright, shows that this clock signal pin is normal, short circuit does not occur or open
The problem on road.
Display module U5 can include and each pin to be measured LED display lamp group one to one, each LED display lamp group
All include and open-circuit condition and short-circuit condition LED display lamp the most one to one, so, such as when the correspondence of display module U5
In the LED display lamp group of two MIPI signal pins, the LED display lamp of corresponding short circuit is bright, shows the two MIPI signal pin
Between occur short circuit；Such as when, in the LED display lamp group of the power pin of display module U5, the LED display lamp of corresponding open circuit is bright,
Show that open circuit occurs in this power pin；In the LED display lamp group of the clock signal pin of display module U5, corresponding open-circuit condition and
The LED display lamp of short-circuit condition does not all work, and shows that this clock signal pin is normal, problem short circuit or open circuit do not occur.
Can also is that display module U5 includes and each pin to be measured LED display lamp one to one, each LED display lamp
Can send the light of different colours, the light of each color and the connection status one_to_one corresponding of pin, such as, LED display lamp sends
HONGGUANG represents corresponding pin open circuit, and LED display lamp sends gold-tinted and represents corresponding pin short circuit, and LED display lamp sends green glow and represents
Corresponding pin connects normal.
In such manner, it is possible to be clear that the connection status of each pin whether normal, which pin open circuit, which pin it
Between short circuit, and display module U5 realizes simple, with low cost.
Although by example, some specific embodiments of the present invention have been described in detail, but the skill of this area
Art personnel are it should be understood that example above is merely to illustrate rather than in order to limit the scope of the present invention.The skill of this area
Art personnel are it should be understood that can modify to above example without departing from the scope and spirit of the present invention.This
Bright scope is defined by the following claims.
It addition, this test equipment can also include interface arrangement, communicator, input equipment etc..Interface arrangement is such as
Including USB interface, RS232 interface, RS485 interface etc..Communicator such as can carry out there is wired or wireless communication.Input dress
Put and such as can include touch screen, keyboard etc..
The various embodiments described above primary focus describes the difference with other embodiments, but those skilled in the art should be clear
Chu, the various embodiments described above can be used alone as required or be combined with each other.
Each embodiment in this specification all uses the mode gone forward one by one to describe, identical similar portion between each embodiment
Dividing cross-reference, what each embodiment stressed is the difference with other embodiments, but people in the art
Member is it should be understood that, the various embodiments described above can be used alone as required or be combined with each other.It addition, for device
For embodiment, owing to it is corresponding with embodiment of the method, so describing fairly simple, relevant part sees method and implements
The explanation of the corresponding part of example.System embodiment described above is only schematically, wherein as separating component
The module illustrated can be or may not be physically separate.
The present invention can be device, method and/or computer program.Computer program can include computer
Readable storage medium storing program for executing, containing for making processor realize the computer-readable program instructions of various aspects of the invention.
Computer-readable recording medium can be to keep and to store instruction tangible used by instruction execution equipment
Equipment.Computer-readable recording medium such as may be-but not limited to-storage device electric, magnetic storage apparatus, optical storage
Equipment, electromagnetism storage device, semiconductor memory apparatus or the combination of above-mentioned any appropriate.Computer-readable recording medium
More specifically example (non exhaustive list) including: portable computer diskette, hard disk, random access memory (RAM), read-only deposits
Reservoir (ROM), erasable type programmable read only memory (EPROM or flash memory), static RAM (SRAM), portable
Compact disk read only memory (CD-ROM), digital versatile disc (DVD), memory stick, floppy disk, mechanical coding equipment, such as on it
Storage has the punch card of instruction or groove internal projection structure and the combination of above-mentioned any appropriate.Calculating used herein above
Machine readable storage medium storing program for executing is not construed as instantaneous signal itself, the electromagnetic wave of such as radio wave or other Free propagations, logical
Cross waveguide or the electromagnetic wave (such as, by the light pulse of fiber optic cables) of other transmission mediums propagation or pass through wire transfer
The signal of telecommunication.
Computer-readable program instructions as described herein can from computer-readable recording medium download to each calculate/
Processing equipment, or download to outer computer or outer by network, such as the Internet, LAN, wide area network and/or wireless network
Portion's storage device.Network can include copper transmission cable, fiber-optic transfer, be wirelessly transferred, router, fire wall, switch, gateway
Computer and/or Edge Server.Adapter or network interface in each calculating/processing equipment receive meter from network
Calculation machine readable program instructions, and forward this computer-readable program instructions, for the meter being stored in each calculating/processing equipment
In calculation machine readable storage medium storing program for executing.
For perform the present invention operation computer program instructions can be assembly instruction, instruction set architecture (ISA) instruction,
Machine instruction, machine-dependent instructions, microcode, firmware instructions, condition setup data or with one or more programming languages
Source code that combination in any is write or object code, described programming language includes OO programming language such as
Smalltalk, C++ etc., and the procedural programming languages of routine such as " C " language or similar programming language.Computer
Readable program instructions can perform the most on the user computer, perform the most on the user computer, as one solely
Vertical software kit performs, part part on the user computer performs or on the remote computer completely at remote computer
Or perform on server.In the situation relating to remote computer, remote computer can be by the network packet of any kind
Include LAN (LAN) or wide area network (WAN) is connected to subscriber computer, or, it may be connected to outer computer (such as profit
Internet connection is passed through) with ISP.In certain embodiments, by utilizing computer-readable program instructions
Status information carry out personalized customization electronic circuit, such as Programmable Logic Device, field programmable gate array (FPGA) or can
Programmed logic array (PLA) (PLA), this electronic circuit can perform computer-readable program instructions, thus realize each side of the present invention
Face.
Referring herein to method according to embodiments of the present invention, device (system) and computer program flow chart and/
Or block diagram describes various aspects of the invention.Should be appreciated that flow chart and/or each square frame of block diagram and flow chart and/
Or the combination of each square frame in block diagram, can be realized by computer-readable program instructions.
These computer-readable program instructions can be supplied to general purpose computer, special-purpose computer or other programmable data
The processor of processing means, thus produce a kind of machine so that these instructions are by computer or other programmable data
When the processor of processing means performs, create the merit of regulation in the one or more square frames in flowchart and/or block diagram
The device of energy/action.These computer-readable program instructions can also be stored in a computer-readable storage medium, these refer to
Order makes computer, programmable data processing means and/or other equipment work in a specific way, thus, storage has instruction
Computer-readable medium then includes a manufacture, and it includes in the one or more square frames in flowchart and/or block diagram
The instruction of the various aspects of the function/action of regulation.
Can also computer-readable program instructions be loaded into computer, other programmable data processing means or other
On equipment so that perform sequence of operations step on computer, other programmable data processing means or miscellaneous equipment, to produce
Raw computer implemented process, so that perform on computer, other programmable data processing means or miscellaneous equipment
Function/the action of regulation in one or more square frames in instruction flowchart and/or block diagram.
Flow chart and block diagram in accompanying drawing show the system of multiple embodiments according to the present invention, method and computer journey
Architectural framework in the cards, function and the operation of sequence product.In this, each square frame in flow chart or block diagram can generation
One module of table, program segment or a part for instruction, a part for described module, program segment or instruction comprises one or more use
Executable instruction in the logic function realizing regulation.At some as in the realization replaced, the function marked in square frame is also
Can occur to be different from the order marked in accompanying drawing.Such as, two continuous print square frames can essentially be held substantially in parallel
OK, they can also perform sometimes in the opposite order, and this is depending on involved function.It is also noted that block diagram and/or
The combination of the square frame in each square frame in flow chart and block diagram and/or flow chart, can be with performing the function of regulation or dynamic
The special hardware based system made realizes, or can realize with the combination of specialized hardware with computer instruction.Right
It is well known that for those skilled in the art, realized by hardware mode, realized by software mode and by software and
The mode of combination of hardware realizes being all of equal value.
Being described above various embodiments of the present invention, described above is exemplary, and non-exclusive, and also
It is not limited to disclosed each embodiment.In the case of the scope and spirit without departing from illustrated each embodiment, for this skill
For the those of ordinary skill in art field, many modifications and changes will be apparent from.The selection of term used herein, purport
Explaining the principle of each embodiment, actual application or the technological improvement to the technology in market best, or making this technology lead
Other those of ordinary skill in territory is understood that each embodiment disclosed herein.The scope of the present invention is limited by claims
Fixed.
Claims (7)
1. the test equipment for photographic head module, it is characterised in that include link block (J1), control module (U1),
Channel selecting module (U2), constant-current source module (U3), processing module (U4) and display module (U5), described link block (J1) has
There is the pin for connecting one to one with the stitch of described photographic head module；Described control module (U1) is arranged to control institute
State the strobe state of channel selecting module (U2), to select a pin of described link block (J1) to be connected to as pin to be measured
Described test earth terminal also selects another pin of described link block (J1) to be connected to for described place as benchmark pin
Reason module (U4) provides the signal output part (P1) of voltage signal；Described constant-current source module (U3) is arranged to export constant current
To described signal output part (P1)；The voltage signal detection that described processing module (U4) is arranged to according to receiving is described to be measured
Connection status between pin and corresponding benchmark pin；Described display module (U5) is arranged to show described connection status.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes Signal-regulated kinase
(U6) voltage signal that, described Signal-regulated kinase (U6) is arranged to export described signal output part (P1) carries out signal tune
Reason is sent to described processing module (U4) after processing.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes analog-to-digital conversion module
(U7) voltage signal that, described analog-to-digital conversion module (U7) is arranged to export described signal output part (P1) carries out modulus and turns
Described processing module (U4) it is sent to after changing process.
Test equipment the most according to claim 3, it is characterised in that described control module (U1) and described processing module
(U4) provided by a fpga chip.
Test equipment the most according to claim 1, it is characterised in that described display module includes treating test tube described in each
Foot LED display lamp group one to one, each described LED display lamp group all includes with each connection status one to one
LED display lamp.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes being provided with startup button
Startup control circuit, described startup control circuit be arranged to described control module (U4) output start test enable letter
Number.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes buzzer module
(U9), described processing module (U4) detect connection status between described pin to be measured and corresponding benchmark pin for short circuit or
When person opens a way, output buzzer drives signal extremely described buzzer module (U9), so that described buzzer module (U9) sends sound
Sound.
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| CN201610643214.XA CN106093689A (en) | 2016-08-05 | 2016-08-05 | A kind of test equipment for photographic head module |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610643214.XA CN106093689A (en) | 2016-08-05 | 2016-08-05 | A kind of test equipment for photographic head module |
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| CN106093689A true CN106093689A (en) | 2016-11-09 |
Family
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| CN201610643214.XA Pending CN106093689A (en) | 2016-08-05 | 2016-08-05 | A kind of test equipment for photographic head module |
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Application publication date: 20161109 |