CN106249097A - A kind of test equipment for photographic head module - Google Patents

A kind of test equipment for photographic head module Download PDF

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Publication number
CN106249097A
CN106249097A CN201610640583.3A CN201610640583A CN106249097A CN 106249097 A CN106249097 A CN 106249097A CN 201610640583 A CN201610640583 A CN 201610640583A CN 106249097 A CN106249097 A CN 106249097A
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CN
China
Prior art keywords
module
pin
test equipment
signal
link block
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Pending
Application number
CN201610640583.3A
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Chinese (zh)
Inventor
高文刚
张广磊
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Goertek Inc
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Goertek Inc
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Priority to CN201610640583.3A priority Critical patent/CN106249097A/en
Publication of CN106249097A publication Critical patent/CN106249097A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Abstract

The invention discloses a kind of test equipment for photographic head module, including link block, control module, channel selecting module, constant-current source module, processing module and image adjustment module, control module is arranged to control the strobe state of channel selecting module, to select all pins of link block to be correspondingly connected to image adjustment module, or a pin of link block is selected to be connected to earth terminal as pin to be measured and select another pin of link block to be connected to the voltage signal inputs of processing module as benchmark pin;Constant-current source module is arranged to export constant current to benchmark pin;Processing module is arranged to detect the connection status between pin to be measured and corresponding benchmark pin according to the voltage signal received;Image adjustment module is arranged to control module and carries out shooting, with the photo obtained according to shooting, module being carried out image alignment treatment.Effectively reduce the configuration of production line station and personnel, also improve the testing efficiency of module.

Description

A kind of test equipment for photographic head module
Technical field
The present invention relates to photographic head module technical field of measurement and test, more particularly it relates to an be used for imaging head mould The test equipment of group.
Background technology
In photographic head module production process, always there is the part of module due to reasons such as FPC, welding and gold threads in module Between the open circuit of pin, short circuit or MIPI signal, there are the phenomenons such as difference in impedance, and this type of module occurs out at part signal Remain to the normal startup optimization of test platform at photographic head module after short circuit, but mobile phone terminal there will be photographic head, and module cannot be just The phenomenon often run.Photographic head module there will be partial image sensor damage phenomenon occurs, a part of image sensor Pin diode value there will be abnormal variation, but photographic head module tends to proper testing and runs, through long-play After there will be exception, problems all can affect the use in client of the photographic head module, to photographic head module production firm shape As causing tremendous influence.When resolving bad product in the defective product of client feedback or factory, it may be desirable to the test of production line Data.Bad module is needed quickly to analyze by research staff, measures photographic head module pin diode value, but production line is existing The automaticity of some module pin open short circuit test devices is low, and photographic head module also must carry out image at production line Adjustment, this needs individually to set station and carries out image adjustment and open-short circuit respectively, and production line operation personnel repeat multiple action, make Industry efficiency is low.
Summary of the invention
It is an object of the present invention to provide one photographic head module to carry out image alignment treatment, can survey simultaneously Try the new solution of connection status between each pin.
According to the first aspect of the invention, it is provided that a kind of test equipment for photographic head module, including link block, Control module, channel selecting module, constant-current source module, processing module and image adjustment module, described link block have for The pin connected one to one with the stitch of described photographic head module;Described control module is arranged to control described channel selecting The strobe state of module, to select all pins of link block to be correspondingly connected to described image adjustment module, or selects institute The pin stating link block is connected to described earth terminal as pin to be measured and selects another pin of described link block to make On the basis of pin be connected to the voltage signal inputs of described processing module;Described constant-current source module is arranged to export constant electricity It flow to described benchmark pin;Described processing module is arranged to detect described pin to be measured with right according to the voltage signal received Connection status between the benchmark pin answered;Described image adjustment module is arranged to control described photographic head module and claps Take the photograph, with the photo obtained according to shooting, described photographic head module carried out image alignment treatment.
Optionally, described test equipment also includes that Signal-regulated kinase, described Signal-regulated kinase are arranged to institute State signal output part output voltage signal carry out signal condition process after be sent to described processing module.
Optionally, described test equipment also includes that analog-to-digital conversion module, described analog-to-digital conversion module are arranged to institute State signal output part output voltage signal carry out analog-to-digital conversion process after be sent to described processing module.
Optionally, described control module and described processing module are provided by a fpga chip.
Optionally, during described image adjustment includes color adjusting, white balance adjustment and focal length adjustment at least one.
Optionally, described test equipment also includes that induction module, described induction module are arranged to according to described shooting Head mould group starts, to the output of described control module, the enable signal tested with the connection status of described link block.
Optionally, described test equipment also includes that communication module and host computer, described communication module are arranged to institute State connection status and be sent to described host computer.
Optionally, described processing module detects the connection status between described pin to be measured and corresponding benchmark pin During for short circuit or open circuit, output buzzer drives signal extremely described buzzer module, so that described buzzer module sends sound Sound.
Optionally, described test equipment also includes that luminous alarm module, described processing module treat test tube described in detecting When connection status between foot and corresponding benchmark pin is short circuit or open circuit, output luminescence drives signal to described luminous report Alert module, so that described luminous alarm module is luminous.
It was found by the inventors of the present invention that in the prior art, there is the automatization of photographic head module open-short circuit equipment Degree is low, and needs individually to set station and carry out image adjustment and open-short circuit respectively, causes the problem that working performance is low.The present invention Embodiment by control channel selecting module, make link block open short circuit for testing module or module is carried out image tune School so that the present invention tests equipment can either detect the connection status between module pin to be measured and benchmark pin automatically, again can Enough module is carried out image adjustment, effectively reduce the configuration of production line station and personnel, meanwhile, also improve the test of module Efficiency.Therefore, the present invention is to be realized technical assignment or to be solved technical problem is that those skilled in the art are never That expect or it is not expected that, therefore the present invention is a kind of new technical scheme.
By detailed description to the exemplary embodiment of the present invention referring to the drawings, the further feature of the present invention and Advantage will be made apparent from.
Accompanying drawing explanation
Combined in the description and the accompanying drawing of the part that constitutes description shows embodiments of the invention, and even With its explanation together for explaining the principle of the present invention.
Fig. 1 is the square frame principle of a kind of embodiment according to a kind of test equipment for photographic head module of the present invention Figure;
Fig. 2 is the square frame principle of the another embodiment according to a kind of test equipment for photographic head module of the present invention Figure.
Description of reference numerals:
U1-control module;U2-channel selecting module;
U3-constant-current source module;U4-processing module;
U5-display module;U6-Signal-regulated kinase;
U7-analog-to-digital conversion module;U8-communication module;
U9-buzzer module;U10-luminous alarm module;
U11-induction module;PC-host computer;
P1-signal output part;U12-image adjustment module.
Detailed description of the invention
The various exemplary embodiments of the present invention are described in detail now with reference to accompanying drawing.It should also be noted that unless additionally have Body illustrates, the parts illustrated the most in these embodiments and positioned opposite, the numerical expression of step and numerical value are not intended to this The scope of invention.
Description only actually at least one exemplary embodiment is illustrative below, never as to the present invention And any restriction applied or use.
May be not discussed in detail for technology, method and apparatus known to person of ordinary skill in the relevant, but suitable In the case of when, described technology, method and apparatus should be considered a part for description.
It is shown here that any occurrence should be construed as merely exemplary with in all examples discussed, and not It is as restriction.Therefore, other example of exemplary embodiment can have different values.
It should also be noted that similar label and letter represent similar terms, therefore, the most a certain Xiang Yi in following accompanying drawing Individual accompanying drawing is defined, then need not it is further discussed in accompanying drawing subsequently.
Low in order to solve the automaticity of photographic head module open-short circuit equipment present in prior art, and need Individually set station and carry out image adjustment and open-short circuit respectively, cause the problem that working performance is low, it is provided that one is used for imaging The test equipment of head mould group, as it is shown in figure 1, the present invention includes link block J1, control for the test equipment of photographic head module Module U1, channel selecting module U2, constant-current source module U3, processing module U4 and image adjustment module U12.
Existing photographic head module all includes FPC and the imageing sensor being welded on this FPC and is welded on this FPC use In setting up the adapter being connected with external circuits, wherein, FPC is also printed with the stitch correspondence for making imageing sensor even The gold thread of connecting connector, causes module holding between the part pin of module can occur due to reasons such as FPC, welding and gold threads Between road, short circuit or MIPI signal pin, there is the phenomenon of difference in impedance.
Above-mentioned link block J1 has the pin for connecting one to one with the stitch of photographic head module, in the company of module Connect after device and link block J1 set up and is connected so that the connection of the pin of link block J1 stitch corresponding with module.
Above-mentioned control module U1 control module is arranged to control the strobe state of channel selecting module U2, to select to connect All pins of module J 1 are correspondingly connected to image adjustment module U1, or select a pin of link block J1 as treating test tube Foot is connected to earth terminal and selects another pin of link block J1 to be connected to the voltage letter of processing module U4 as benchmark pin Number input P1.
In one particular embodiment of the present invention, control module can first control channel selecting module U2 so that connects All pins of module J 1 are correspondingly connected to image adjustment module U1, and image adjustment module U12 controls what link block J1 connected Photographic head module carries out shooting, with the photo obtained according to shooting, this photographic head module being carried out image alignment treatment, wherein, schemes As adjustment module U12 also includes display unit and input block, the photograph that display unit obtains for showing photographic head module to shoot Sheet, input block is used for inputting adjustment end signal, after image adjustment module U12 receives this adjustment reception signal, can To be terminated by the notice control module U1 image adjustment of I2C bus, control module U1 will control passage choosing after receiving this notice Select the strobe state of module U2, link block J1 is disconnected with image adjustment module U1, and selects a pin of link block J1 It is connected to earth terminal as pin to be measured and selects another pin of link block J1 to be connected to processing module as benchmark pin The voltage signal inputs P1 of U4, to start out the test of short circuit.
Wherein, during image alignment treatment includes color adjusting process, white balance alignment treatment and focal length alignment treatment at least A kind of.
So, it becomes possible to achieve and carry out image adjustment and open-short circuit by the test equipment of the present invention simultaneously, subtract Lack personnel cost, further increase testing efficiency.
During short-circuit test, arbitrary pin can be selected as benchmark pin, in residue pin, select a work For pin to be measured, in order to test in residue pin the connection status between each pin and benchmark pin, residue pipe can be selected Foot is alternately as pin to be measured.
Further, in order to detect whether there is short circuit between each pin, each pipe of link block J1 can be selected While foot is alternately as benchmark pin, select the pin in addition to benchmark pin alternately as pin to be measured.
Owing to photographic head module is in order to avoid static interference, one all can be connected between each pin and ground pin for quiet The backward diode of electric protection, therefore, during open test, selects the ground pin of link block J1 as prover pipe Foot, select in residue pin one as pin to be measured, in order to test in residue pin between each pin and benchmark pin Connection status, can select remain pin alternately as pin to be measured, so, it becomes possible to detect what link block J1 connected Whether camera module exists open circuit between each pin and ground pin.
Above-mentioned constant-current source module U3 be arranged to export constant current to signal output part P1, this constant current Can be such as 1mA.Constant-current source module U3 output constant current to signal output part P1, this signal output part P1 and benchmark pin Connecting, therefore, constant current exports to the benchmark pin chosen through channel selecting module U2.
Above-mentioned processing module U4 is arranged to detect pin to be measured and corresponding prover pipe according to the voltage signal received Connection status between foot.
During short-circuit test, owing to pin to be measured is connected with earth terminal, it is therefore contemplated that the voltage of pin to be measured Being zero, if short circuit between benchmark pin and pin to be measured, this electric current is in benchmark pin, formation between pin to be measured and earth terminal Path, the voltage of benchmark pin is zero, then, the voltage of signal output part P1 is identical with the voltage of benchmark pin, is also zero;As Really do not have short circuit between benchmark pin and pin to be measured, then the voltage of benchmark pin is not zero, the voltage of signal output part P1 with The voltage of benchmark pin is identical, is also not zero.Therefore, if the voltage signal that processing module U4 receives is zero, the most permissible Judge short circuit between pin to be measured and benchmark pin;If the voltage signal that processing module U4 receives is not zero, the most permissible Judge there is no short circuit between pin to be measured and benchmark pin.
During open test, in the case of being connected between pin to be measured and ground pin normally, this constant current At ground pin, diode, forming path between pin to be measured and earth terminal, the voltage of ground pin is equal to signal output part P1 Voltage, the voltage at diode two ends connected equal to this pin to be measured, i.e. reference voltage, such as, can be 0.2V-0.7V, that , the voltage of signal output part P1 is also 0.2V-0.7V;If opened a way between pin to be measured and ground pin, then ground pin Voltage equal to the voltage of signal output part, the set point of the voltage at the diode two ends that this pin to be measured connects will be exceeded, More than 2V, the voltage of such as ground pin then thinks that between pin to be measured and ground pin, existence is opened a way.Therefore, if processing mould When the voltage signal that block U4 receives is not less than the set point of reference voltage signal, pin to be measured and ground pipe can be detected Do not open a way between foot;If the voltage signal that processing module U4 receives exceedes the set point of reference voltage signal, can Open a way between pin to be measured and ground pin to detect.
Wherein, during test, the pin in addition to benchmark pin and pin to be measured is the most unsettled, to avoid test Result produces interference.
On this basis, this equipment can be also used for testing MIPI signal pin (or parallel port pin etc. needs impedance identical Pin) impedance the problem of difference occurs, if at same pin as benchmark pin, MIPI signal pin (or parallel port Pin) respectively as pin to be measured time, the voltage differences of benchmark pin exceedes setting value, such as, can be more than 0.2V, then recognize For the impedance between MIPI signal pin (or parallel port pin), difference occurs.
The present invention is used for the test equipment of photographic head module and can include being provided with the startup control circuit starting button, opens Dynamic control circuit is arranged to start the enable signal of test to the output of control module U1, specifically, be pressed starting button Time, starting control circuit and will start the enable signal of test to the output of control module U1, this enable signal can be such as high Level so that control module U1 controls the strobe state of channel selecting module U2, using select a pin of link block J1 as Pin to be measured is connected to earth terminal and selects another pin of link block to be connected to for processing module as benchmark pin The signal output part P1 of voltage signal is provided.
Further, this startup control circuit is also configured to when starting button and being lifted, it is impossible to control module U1 Output starts the enable signal of test, such as, can be lasting output low level so that control module U1 stops.
In another specific embodiment of the present invention, it is also possible to be to be opened to the output of control module U1 by induction module The enable signal of dynamic test, as in figure 2 it is shown, induction module U11 can be configured so that according to photographic head module and link block J1 Connection status to control module U1 output start test enable signal, concrete, induction module U11 can be to sense Photographic head module sets up the enable signal starting test when being connected to the output of control module U1 with link block J1;At test equipment In the case of shielding case, this shielding case can shield the external environment interference to test, it is ensured that the accuracy of test result, Now, if shielding case is closed, i.e. represent photographic head module and be placed in test equipment, establish even with link block J1 Connecing, therefore, induction module U11 can also is that when sensing that shielding case is closed, and starts making of test to the output of control module U1 Can signal.
So, it becomes possible to automatically begin to the test to photographic head module, it is not necessary to manual operation, so improve test effect Rate.
Further, test equipment also includes Signal-regulated kinase, as in figure 2 it is shown, Signal-regulated kinase U5 is arranged to The voltage signal exporting signal output part P1 is sent to processing module U4 after carrying out signal condition process, wherein, and signal condition Briefly exactly measured signal is converted into, by operations such as amplification, filtering, the standard signal that collecting device is capable of identify that.Letter Number conditioning processes the precision of the voltage signal that can improve signal output part P1 output.
If processor is merely able to process digital signal, then this test equipment also should include analog-to-digital conversion module U7, Analog-to-digital conversion module U7 is sent to place after being arranged to the voltage signal of signal output part P1 output is carried out analog-to-digital conversion process Reason module U4.
Owing to analog-to-digital conversion module U7 can only receive a range of analogue signal, and the voltage of signal output part P1 output Signal may not be in the range of this, therefore, signal output part P1 output voltage signal sometimes must also amplified, filtering, Linear compensation, isolate, after the signal condition such as protection processes, could send to analog-to-digital conversion module U7 and carry out at analog digital conversion Reason, then the signal after analog-to-digital conversion process is sent to processing module U4.
On this basis, above-mentioned control module U1 and processing module U4 can be provided by a fpga chip.Due to FPGA There is the parallel processing capability of excellence and higher integrated level, use fpga chip to carry out test and can effectively simplify test equipment Circuit structure, improve machine system efficiency, system operating rate soon be conducive to improve production line working performance, due to The capability of sequential control of FPGA is relatively strong, and the operation sequential being controlled whole system by FPGA control module detects each pin Connection status, so that detection efficiency is higher, ensure the accuracy of testing result, it is possible to effectively prevent the stream of problem module Go out, and cost is relatively low, it is simple to safeguard.
In order to all results of test are preserved, it is simple to testing result carries out the later stage reviews, the test of the present invention Equipment also includes communication module U8 and host computer PC, and communication module U8 is arranged to be connected between pin to be measured with benchmark pin State is sent to host computer PC in real time, meanwhile, host computer PC can preserve and demonstrate the connection status of each pin, this Sample, it becomes possible to comparison is the clearest, see the connection status between each pin timely, and, the later stage, this test information can be reviewed.
Concrete, this communication module U8 can be to convert data to the transformats such as USB, LAN, serial ports or WiFi pass Deliver to host computer PC.
It is low that the present invention tests equipment cost, it is possible to measures module multi-pipe pin abnormal, can detect pin and open a way with short-circuit, multiple The multiple bad detections such as pin is short-circuit, the diode value of module pin is abnormal, convenient product line operation, it is possible to by module measurement data Uploading to host computer PC in real time preserve, facilitate product test data traceability, device reliability is high, good stability, and is easily installed With maintenance.
In order to when module exists the pin of short circuit or open circuit, notify tester in time, it is to avoid test person Member's operation by mistake, in one particular embodiment of the present invention, test equipment also includes buzzer module U9, as in figure 2 it is shown, process When module U4 detects the connection status between pin to be measured and corresponding benchmark pin for short circuit or open circuit, export buzzer Drive signal to buzzer module U9, so that buzzer module U9 sends sound, point out tester.
Further, test equipment can also include luminous alarm module U10, as in figure 2 it is shown, processing module U4 detects When connection status between pin to be measured and corresponding benchmark pin is short circuit or open circuit, output luminescence drives signal to luminous Alarm module U10, so that luminous alarm module is luminous, points out tester.This luminous alarm module U10 can be such as one Controlled LED display lamp, processing module detect connection status between pin to be measured and corresponding benchmark pin for short circuit or When person opens a way, output luminescence drives signal to this LED display lamp, makes this LED display lamp luminous.
In another specific embodiment of the present invention, this test equipment also includes display module U5, this display module U5 Being arranged to show the connection status of each pin to be measured, concrete, display module U5 can include and each pin one to be measured The LED display lamp group of one correspondence, each LED display lamp group all includes and each connection status LED display lamp one to one. So, such as when, in the LED display lamp group of two MIPI signal pins of correspondence of display module U5, the LED of corresponding short circuit shows Lamp is bright, shows to occur between the two MIPI signal pin short circuit;Such as when the LED display lamp of the power pin showing module U5 In group, the LED display lamp of corresponding open circuit is bright, shows that open circuit occurs in this power pin;The clock signal pin of display module U5 In LED display lamp group, corresponding normal LED display lamp is bright, shows that this clock signal pin is normal, short circuit does not occur or open The problem on road.
Display module U5 can include and each pin to be measured LED display lamp group one to one, each LED display lamp group All include and open-circuit condition and short-circuit condition LED display lamp the most one to one, so, such as when the correspondence of display module U5 In the LED display lamp group of two MIPI signal pins, the LED display lamp of corresponding short circuit is bright, shows the two MIPI signal pin Between occur short circuit;Such as when, in the LED display lamp group of the power pin of display module U5, the LED display lamp of corresponding open circuit is bright, Show that open circuit occurs in this power pin;In the LED display lamp group of the clock signal pin of display module U5, corresponding open-circuit condition and The LED display lamp of short-circuit condition does not all work, and shows that this clock signal pin is normal, problem short circuit or open circuit do not occur.
Can also is that display module U5 includes and each pin to be measured LED display lamp one to one, each LED display lamp Can send the light of different colours, the light of each color and the connection status one_to_one corresponding of pin, such as, LED display lamp sends HONGGUANG represents corresponding pin open circuit, and LED display lamp sends gold-tinted and represents corresponding pin short circuit, and LED display lamp sends green glow and represents Corresponding pin connects normal.
In such manner, it is possible to be clear that the connection status of each pin whether normal, which pin open circuit, which pin it Between short circuit, and display module U5 realizes simple, with low cost.
Although by example, some specific embodiments of the present invention have been described in detail, but the skill of this area Art personnel are it should be understood that example above is merely to illustrate rather than in order to limit the scope of the present invention.The skill of this area Art personnel are it should be understood that can modify to above example without departing from the scope and spirit of the present invention.This Bright scope is defined by the following claims.
It addition, this test equipment can also include interface arrangement, communicator, input equipment etc..Interface arrangement is such as Including USB interface, RS232 interface, RS485 interface etc..Communicator such as can carry out there is wired or wireless communication.Input dress Put and such as can include touch screen, keyboard etc..
The various embodiments described above primary focus describes the difference with other embodiments, but those skilled in the art should be clear Chu, the various embodiments described above can be used alone as required or be combined with each other.
Each embodiment in this specification all uses the mode gone forward one by one to describe, identical similar portion between each embodiment Dividing cross-reference, what each embodiment stressed is the difference with other embodiments, but people in the art Member is it should be understood that, the various embodiments described above can be used alone as required or be combined with each other.It addition, for device For embodiment, owing to it is corresponding with embodiment of the method, so describing fairly simple, relevant part sees method and implements The explanation of the corresponding part of example.System embodiment described above is only schematically, wherein as separating component The module illustrated can be or may not be physically separate.
The present invention can be device, method and/or computer program.Computer program can include computer Readable storage medium storing program for executing, containing for making processor realize the computer-readable program instructions of various aspects of the invention.
Computer-readable recording medium can be to keep and to store instruction tangible used by instruction execution equipment Equipment.Computer-readable recording medium such as may be-but not limited to-storage device electric, magnetic storage apparatus, optical storage Equipment, electromagnetism storage device, semiconductor memory apparatus or the combination of above-mentioned any appropriate.Computer-readable recording medium More specifically example (non exhaustive list) including: portable computer diskette, hard disk, random access memory (RAM), read-only deposits Reservoir (ROM), erasable type programmable read only memory (EPROM or flash memory), static RAM (SRAM), portable Compact disk read only memory (CD-ROM), digital versatile disc (DVD), memory stick, floppy disk, mechanical coding equipment, such as on it Storage has the punch card of instruction or groove internal projection structure and the combination of above-mentioned any appropriate.Calculating used herein above Machine readable storage medium storing program for executing is not construed as instantaneous signal itself, the electromagnetic wave of such as radio wave or other Free propagations, logical Cross waveguide or the electromagnetic wave (such as, by the light pulse of fiber optic cables) of other transmission mediums propagation or pass through wire transfer The signal of telecommunication.
Computer-readable program instructions as described herein can from computer-readable recording medium download to each calculate/ Processing equipment, or download to outer computer or outer by network, such as the Internet, LAN, wide area network and/or wireless network Portion's storage device.Network can include copper transmission cable, fiber-optic transfer, be wirelessly transferred, router, fire wall, switch, gateway Computer and/or Edge Server.Adapter or network interface in each calculating/processing equipment receive meter from network Calculation machine readable program instructions, and forward this computer-readable program instructions, for the meter being stored in each calculating/processing equipment In calculation machine readable storage medium storing program for executing.
For perform the present invention operation computer program instructions can be assembly instruction, instruction set architecture (ISA) instruction, Machine instruction, machine-dependent instructions, microcode, firmware instructions, condition setup data or with one or more programming languages Source code that combination in any is write or object code, described programming language includes OO programming language such as Smalltalk, C++ etc., and the procedural programming languages of routine such as " C " language or similar programming language.Computer Readable program instructions can perform the most on the user computer, perform the most on the user computer, as one solely Vertical software kit performs, part part on the user computer performs or on the remote computer completely at remote computer Or perform on server.In the situation relating to remote computer, remote computer can be by the network packet of any kind Include LAN (LAN) or wide area network (WAN) is connected to subscriber computer, or, it may be connected to outer computer (such as profit Internet connection is passed through) with ISP.In certain embodiments, by utilizing computer-readable program instructions Status information carry out personalized customization electronic circuit, such as Programmable Logic Device, field programmable gate array (FPGA) or can Programmed logic array (PLA) (PLA), this electronic circuit can perform computer-readable program instructions, thus realize each side of the present invention Face.
Referring herein to method according to embodiments of the present invention, device (system) and computer program flow chart and/ Or block diagram describes various aspects of the invention.Should be appreciated that flow chart and/or each square frame of block diagram and flow chart and/ Or the combination of each square frame in block diagram, can be realized by computer-readable program instructions.
These computer-readable program instructions can be supplied to general purpose computer, special-purpose computer or other programmable data The processor of processing means, thus produce a kind of machine so that these instructions are by computer or other programmable data When the processor of processing means performs, create the merit of regulation in the one or more square frames in flowchart and/or block diagram The device of energy/action.These computer-readable program instructions can also be stored in a computer-readable storage medium, these refer to Order makes computer, programmable data processing means and/or other equipment work in a specific way, thus, storage has instruction Computer-readable medium then includes a manufacture, and it includes in the one or more square frames in flowchart and/or block diagram The instruction of the various aspects of the function/action of regulation.
Can also computer-readable program instructions be loaded into computer, other programmable data processing means or other On equipment so that perform sequence of operations step on computer, other programmable data processing means or miscellaneous equipment, to produce Raw computer implemented process, so that perform on computer, other programmable data processing means or miscellaneous equipment Function/the action of regulation in one or more square frames in instruction flowchart and/or block diagram.
Flow chart and block diagram in accompanying drawing show the system of multiple embodiments according to the present invention, method and computer journey Architectural framework in the cards, function and the operation of sequence product.In this, each square frame in flow chart or block diagram can generation One module of table, program segment or a part for instruction, a part for described module, program segment or instruction comprises one or more use Executable instruction in the logic function realizing regulation.At some as in the realization replaced, the function marked in square frame is also Can occur to be different from the order marked in accompanying drawing.Such as, two continuous print square frames can essentially be held substantially in parallel OK, they can also perform sometimes in the opposite order, and this is depending on involved function.It is also noted that block diagram and/or The combination of the square frame in each square frame in flow chart and block diagram and/or flow chart, can be with performing the function of regulation or dynamic The special hardware based system made realizes, or can realize with the combination of specialized hardware with computer instruction.Right It is well known that for those skilled in the art, realized by hardware mode, realized by software mode and by software and The mode of combination of hardware realizes being all of equal value.
Being described above various embodiments of the present invention, described above is exemplary, and non-exclusive, and also It is not limited to disclosed each embodiment.In the case of the scope and spirit without departing from illustrated each embodiment, for this skill For the those of ordinary skill in art field, many modifications and changes will be apparent from.The selection of term used herein, purport Explaining the principle of each embodiment, actual application or the technological improvement to the technology in market best, or making this technology lead Other those of ordinary skill in territory is understood that each embodiment disclosed herein.The scope of the present invention is limited by claims Fixed.

Claims (9)

1. the test equipment for photographic head module, it is characterised in that include link block (J1), control module (U1), Channel selecting module (U2), constant-current source module (U3), processing module (U4) and image adjustment module (U12), described link block (J1) there is the pin for connecting one to one with the stitch of described photographic head module;Described control module (U1) is arranged to Control the strobe state of described channel selecting module (U2), described to select all pins of link block (J1) to be correspondingly connected to Image adjustment module (U12), or select a pin of described link block (J1) as pin to be measured be connected to earth terminal and Another pin selecting described link block (J1) is connected to for providing electricity to described processing module (U4) as benchmark pin The signal output part (P1) of pressure signal;Described constant-current source module (U3) is arranged to export constant current to described signal output part (P1);Described processing module (U4) is arranged to detect described pin to be measured and corresponding benchmark according to the voltage signal received Connection status between pin;Described image adjustment module (U12) be arranged to control described photographic head module carry out shooting, with According to the photo that shooting obtains, described photographic head module is carried out image alignment treatment.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes Signal-regulated kinase (U6) voltage signal that, described Signal-regulated kinase (U6) is arranged to export described signal output part (P1) carries out signal tune Reason is sent to described processing module (U4) after processing.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes analog-to-digital conversion module (U7) voltage signal that, described analog-to-digital conversion module (U7) is arranged to export described signal output part (P1) carries out modulus and turns Described processing module (U4) it is sent to after changing process.
Test equipment the most according to claim 3, it is characterised in that described control module (U1) and described processing module (U4) provided by a fpga chip.
Test equipment the most according to claim 1, it is characterised in that described image alignment treatment includes at color adjusting In reason, white balance alignment treatment and focal length alignment treatment at least one.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes induction module (U11), Described induction module (U11) is arranged to the connection status according to described photographic head module and described link block (J1) to described Control module (U1) output starts the enable signal of test.
Test equipment the most according to claim 1, it is characterised in that described test equipment also include communication module (U8) and Host computer (PC), described communication module (U8) is arranged to be sent to described connection status described host computer (PC).
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes buzzer module (U9), described processing module (U4) detect connection status between described pin to be measured and corresponding benchmark pin for short circuit or When person opens a way, output buzzer drives signal extremely described buzzer module (U9), so that described buzzer module (U9) sends sound Sound.
Test equipment the most according to claim 1, it is characterised in that described test equipment also includes luminous alarm module (U10), described processing module (U4) detects that the connection status between described pin to be measured and corresponding benchmark pin is short circuit Or during open circuit, output luminescence drives signal extremely described luminous alarm module (U10), so that described luminous alarm module (U10) Luminous.
CN201610640583.3A 2016-08-05 2016-08-05 A kind of test equipment for photographic head module Pending CN106249097A (en)

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CN104635104A (en) * 2013-11-14 2015-05-20 宁波舜宇光电信息有限公司 Camera module open circuit and short circuit auto-test apparatus and method
CN105245870A (en) * 2015-09-24 2016-01-13 苏州富晶微精密电子科技有限公司 Camera module automatic testing system and camera module automatic testing method
CN105510763A (en) * 2016-02-25 2016-04-20 珠海全志科技股份有限公司 Integrated circuit pin testing device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080224721A1 (en) * 2005-12-12 2008-09-18 Optopac Co., Ltd. Apparatus, unit and method for testing image sensor packages
CN101360254A (en) * 2007-07-30 2009-02-04 比亚迪股份有限公司 Test system for CMOS image sensor electrical performance
CN202939240U (en) * 2012-11-14 2013-05-15 珠海迈科电子科技有限公司 Set-top-box control panel testing tool
CN104104761A (en) * 2013-04-10 2014-10-15 赛龙通信技术(深圳)有限公司 Automatic detection system and detection method for mobile phone camera
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CN105510763A (en) * 2016-02-25 2016-04-20 珠海全志科技股份有限公司 Integrated circuit pin testing device

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