CN108226649B - 电容检测装置及方法 - Google Patents
电容检测装置及方法 Download PDFInfo
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- CN108226649B CN108226649B CN201611191663.1A CN201611191663A CN108226649B CN 108226649 B CN108226649 B CN 108226649B CN 201611191663 A CN201611191663 A CN 201611191663A CN 108226649 B CN108226649 B CN 108226649B
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- capacitance
- storage capacitor
- variable storage
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- specific voltage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
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Abstract
Description
Cs(pf) | 300 | 303 | 306 | 309 | 312 | 315 | 318 | 321 | 324 | 327 | |
Cf(pf) | N1 | N2 | N3 | N4 | N5 | N6 | N7 | N8 | N9 | N10 | N |
14.5 | 11 | 11 | 11 | 11 | 11 | 11 | 12 | 12 | 12 | 12 | 113 |
14.0 | 11 | 11 | 11 | 12 | 12 | 12 | 12 | 12 | 12 | 12 | 117 |
Claims (7)
Priority Applications (1)
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CN201611191663.1A CN108226649B (zh) | 2016-12-21 | 2016-12-21 | 电容检测装置及方法 |
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CN201611191663.1A CN108226649B (zh) | 2016-12-21 | 2016-12-21 | 电容检测装置及方法 |
Publications (2)
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CN108226649A CN108226649A (zh) | 2018-06-29 |
CN108226649B true CN108226649B (zh) | 2021-05-04 |
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CN201611191663.1A Active CN108226649B (zh) | 2016-12-21 | 2016-12-21 | 电容检测装置及方法 |
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Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113109628B (zh) * | 2020-01-10 | 2022-11-08 | 海速芯(杭州)科技有限公司 | 电容检测电路及其运行方法 |
CN112611988B (zh) * | 2020-12-11 | 2024-03-12 | 四川英杰电气股份有限公司 | 一种可变真空电容剩余寿命的检测方法和装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101943716A (zh) * | 2009-07-09 | 2011-01-12 | 联咏科技股份有限公司 | 电容值测量电路与方法 |
CN102346607A (zh) * | 2010-08-05 | 2012-02-08 | 义隆电子股份有限公司 | 触控感测电路及方法 |
CN102609128A (zh) * | 2010-12-16 | 2012-07-25 | 刘鸿达 | 双模式触控感应元件暨其触控显示器相关装置及其触控驱动方法 |
CN102929455A (zh) * | 2011-08-11 | 2013-02-13 | 微创高科有限公司 | 一种应用于液晶显示模组的触控电容检测电路及方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
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US7075316B2 (en) * | 2003-10-02 | 2006-07-11 | Alps Electric Co., Ltd. | Capacitance detector circuit, capacitance detection method, and fingerprint sensor using the same |
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2016
- 2016-12-21 CN CN201611191663.1A patent/CN108226649B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101943716A (zh) * | 2009-07-09 | 2011-01-12 | 联咏科技股份有限公司 | 电容值测量电路与方法 |
CN102346607A (zh) * | 2010-08-05 | 2012-02-08 | 义隆电子股份有限公司 | 触控感测电路及方法 |
CN102609128A (zh) * | 2010-12-16 | 2012-07-25 | 刘鸿达 | 双模式触控感应元件暨其触控显示器相关装置及其触控驱动方法 |
CN102929455A (zh) * | 2011-08-11 | 2013-02-13 | 微创高科有限公司 | 一种应用于液晶显示模组的触控电容检测电路及方法 |
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CN108226649A (zh) | 2018-06-29 |
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Effective date of registration: 20200515 Address after: Room 1309-1312, Building C, Huangdu Plaza, 3008 Yitian Road, Futian District, Shenzhen City, Guangdong Province Applicant after: TENX XINGYE TECHNOLOGY (SHENZHEN) CO.,LTD. Applicant after: Haishui Core (Wuxi) Technology Co.,Ltd. Address before: Futian District Yitian road Shenzhen city Guangdong province 518048 C Royal Plaza, No. 3008 building 1309-1312 room Applicant before: TENX XINGYE TECHNOLOGY (SHENZHEN) Co.,Ltd. Applicant before: TENX TECHNOLOGY, INC. |
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Address after: 518100 2B, building 3, Tingwei Industrial Park, No. 6 Liufang Road, Xingdong community, Xin'an street, Bao'an District, Shenzhen, Guangdong Province Patentee after: Shenzhen hisu core technology Co.,Ltd. Patentee after: Haisuxin (Hangzhou) Technology Co., Ltd Address before: 518048 room 1309-1312, building C, Huangdu Plaza, No. 3008, Yitian Road, Futian District, Shenzhen, Guangdong Province Patentee before: TENX XINGYE TECHNOLOGY (SHENZHEN) CO.,LTD. Patentee before: Haisuxin (Wuxi) Technology Co., Ltd |