CN108169655A - A kind of image chip focuses heart test jack automatically - Google Patents

A kind of image chip focuses heart test jack automatically Download PDF

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Publication number
CN108169655A
CN108169655A CN201810116908.7A CN201810116908A CN108169655A CN 108169655 A CN108169655 A CN 108169655A CN 201810116908 A CN201810116908 A CN 201810116908A CN 108169655 A CN108169655 A CN 108169655A
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CN
China
Prior art keywords
chip
test
image
socket
positioning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810116908.7A
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Chinese (zh)
Inventor
金英杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Kun Kun Science And Technology Industrial Co Ltd
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Shenzhen Kun Kun Science And Technology Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Kun Kun Science And Technology Industrial Co Ltd filed Critical Shenzhen Kun Kun Science And Technology Industrial Co Ltd
Priority to CN201810116908.7A priority Critical patent/CN108169655A/en
Publication of CN108169655A publication Critical patent/CN108169655A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses a kind of image chips to focus heart test jack automatically, including lamp box, chip test base, chip positioning presss from both sides autokeyer, test system workbench, the placement arranged side by side of the lamp box and interconnecting module, and lens mount flange is provided with below lamp box, image imager chip is provided with below the lens mount flange, the chip test base is set to the inside of socket positioning pedestal, and test adaptor plate is provided with below socket positioning pedestal, the chip positioning folder autokeyer is set to the outside of socket positioning pedestal, the test system workbench is set to the lower section of socket heating module.The image chip focuses heart test jack automatically and is provided with socket positioning pedestal, shading sealing ring and socket positioning pedestal, and lens mount flange forms confined space, and imaging light is only allowed to enter the image imager chip on chip test base from optical lens;The light entered by other positions is covered, light leakage interference is excluded, seals shading.

Description

A kind of image chip focuses heart test jack automatically
Technical field
The present invention relates to image chip technical field, specially a kind of image chip focuses heart test jack automatically.
Background technology
Image chip is in production-manufacturing engineering, it is necessary to imaging test is carried out, with the photosensitive of detection image chip imaging Whether ten hundreds of each pixels is qualified in region, all pixels point test passes, is indefectible product, at present image core The automatic test jack of the not damaged quick-clamping of piece, since there is mismachining tolerance, reserved nothings in all parts process Damage, quick-clamping are tested the position gap of image chip;Each error of these objective realities, it is larger by adding up to bring Site error.The site error of test jack so that the optical axis of imaging len and the sensitivity centre of imager chip point be not be overlapped, Image space deviates, and the regional area of image cannot be seen by eventually leading to the appearance of chip photosensitive region, for this part Chip light-sensitive image vegetarian refreshments in region can not be tested, i.e., the quality of entire chip cannot be measured accurately.
Invention content
The purpose of the present invention is to provide a kind of image chips to focus heart test jack automatically, to solve above-mentioned background technology The appearance of chip photosensitive region currently on the market proposed cannot see the regional area of image, in this regional area The problem of chip light-sensitive image vegetarian refreshments can not be tested, i.e., cannot accurately be measured the quality of entire chip.
To achieve the above object, the present invention provides following technical solution:A kind of image chip focuses heart test jack automatically, Including lamp box, chip test base, chip positioning folder autokeyer, test system workbench, the lamp box and interconnecting module are simultaneously Row are placed, and lens mount flange is provided with below lamp box, and image imager chip, institute are provided with below the lens mount flange The inside that chip test base is set to socket positioning pedestal is stated, and test adaptor plate is provided with below socket positioning pedestal, institute It states and socket heating module is provided with below test adaptor plate, the chip positioning folder autokeyer is set to socket positioning base The outside of seat, the test system workbench are set to the lower section of socket heating module.
Preferably, the interconnecting module includes adapting probe and switching needle mould.
Preferably, the lens mount flange includes Y-direction adjustment screw, x adjusts screw ,-θ angles to adjustment screw ,+θ angles Degree adjustment screw, Y-direction pressure slider II, X are to pressure slider, lens mount, Y-direction pressure slider I, Y-direction compression spring, optical frames Head, X are to pressure slider I and X to compression spring.
Preferably, the Y-direction adjustment screw includes Y-direction adjustment sliding block I and Y-direction adjustment sliding block II.
Preferably, the chip test base include chip positioning kickboard, chip positioning folder, testing probe template A, test probe and Testing probe template B.
Preferably, the socket positioning pedestal includes shading sealing ring.
Preferably, the test adaptor plate includes switching needle mould connection pad and chip connection pads.
Preferably, the chip positioning folder autokeyer includes chip positioning folder control button, chip positioning folder side pushes away Bar A and chip positioning folder side push rod B.
Compared with prior art, the beneficial effects of the invention are as follows:The image chip focuses heart test jack automatically:
1. lens mount flange is provided with, by adjusting the corresponding Y-direction adjustment screw of lens mount each on lens mount flange, x To adjustment screw, make the optical axis of the optical lens that each lens mount is assembled on lens mount flange with being clamped by chip locating clip By image imager chip sensitivity centre be overlapped, this eliminates System Testing Pressure mechanism depress lens mount flange when, it is whole The optical axis of optical lens caused by a movement, clamping mechanism and the sense by altimetric image imager chip clamped by chip locating clip The site error of light center makes the optical axis of optical lens be directed at imager chip photosensitive region central point, by adjusting lens mount method Corresponding+θ angles adjustment the screw of each lens mount on orchid ,-θ angles adjustment screw make each lens mount institute on lens mount flange Rectangular edges edge and the rectangle of the photosensitive region of chip under test clamped by chip locating clip of the imaging of the optical lens of assembling Edge is parallel, makes the imaging of adjustment optical lens with imager chip photosensitive region face without angle;
2. being provided with socket positioning pedestal, shading sealing ring and socket positioning pedestal, lens mount flange form confined space, Imaging light is only allowed to enter the image imager chip on chip test base from optical lens;Cover the light entered by other positions Line excludes light leakage interference, seals shading;
3. be provided with chip positioning folder autokeyer, by chip positioning press from both sides that autokeyer and chip positioning press from both sides from Dynamic linkage work, makes to be adjacent to completely with the positioning right-angle side of chip positioning kickboard when being tested by altimetric image imager chip, In this way, chip test base required reserved position gap when fast picking and placeing the new imager chip by altimetric image is just eliminated, It realizes the zero clearance between image imager chip and positioning frame, keeps the resetting of image imager chip without site error, it can To exclude the gap that quick fetching is tested imager chip automatically.
Description of the drawings
Fig. 1 is schematic structural view of the invention;
Fig. 2 is overlooking the structure diagram of the present invention;
Fig. 3 is side structure schematic view of the present invention.
In figure:1st, lamp box, 2, interconnecting module, 201, adapting probe, 202, switching needle mould, 3, lens mount flange, 301, Y-direction Adjust screw, 30101, Y-direction adjustment sliding block I, 30102, Y-direction adjustment sliding block II, 302, x to adjustment screw, 303 ,+θ angle tune Whole screw, 304 ,-θ angles adjustment screw, 305, Y-direction pressure slider II, 306, X to pressure slider II, 307, lens mount, 308, Y-direction pressure slider I, 309, Y-direction compression spring, 310, optical lens, 311, X to pressure slider I, 312, X to compression spring, 4, Image imager chip, 5, chip test base, 501, chip positioning kickboard, 502, chip positioning folder, 503, testing probe template A, 504, Test probe, 505, testing probe template B, 6, socket positioning pedestal, 601 shading sealing rings, 7, test adaptor plate, 701, switching needle mould Connect pad, 702, chip connection pads, 8, socket heating module, 9, chip positioning folder autokeyer, 901, chip positioning Press from both sides control button, 902, piece locating clip side push rod A, 903, chip positioning folder side push rod B, 10, test system workbench.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work Embodiment shall fall within the protection scope of the present invention.
- 3 are please referred to Fig.1, the present invention provides a kind of technical solution:A kind of image chip focuses heart test jack automatically, packet Include lamp box 1, interconnecting module 2, lens mount flange 3, image imager chip 4, chip test base 5, socket positioning pedestal 6, test turn Fishplate bar 7, socket heating module 8, chip positioning folder autokeyer 9, test system workbench 10, lamp box 1 and interconnecting module 2 are simultaneously Row are placed, and the lower section of lamp box 1 is provided with lens mount flange 3, and interconnecting module 2 includes adapting probe 201 and switching needle mould 202, The gap that quick fetching is tested imager chip can be excluded automatically, the lower section of lens mount flange 3 is provided with image imager chip 4, Lens mount flange 3 includes Y-direction adjustment screw 301, x adjusts screw to adjustment screw 302 ,+θ angles adjustment screw 303 ,-θ angles 304th, Y-direction pressure slider II 305, X are to pressure slider 306, lens mount 307, Y-direction pressure slider I 308, Y-direction compression spring 309th, optical lens 310, X are provided with+θ angles adjustment screw 303 ,-θ angles to pressure slider I 311 and X to compression spring 312 Degree adjustment screw 304 can exclude the angular error of optical imagery and chip photosensitive area, and Y-direction adjusts screw 301 and adjusted including Y-direction Sliding block I 30101 and Y-direction adjustment sliding block II 30102 can exclude error the optical axis alignment imager chip of optical lens is photosensitive Regional center point, chip test base 5 is set to the inside of socket positioning pedestal 6, and the lower section of socket positioning pedestal 6 is provided with survey Preliminary operation fishplate bar 7, chip test base 5 include chip positioning kickboard 501, chip positioning folder 502, testing probe template A503, test probe 504 and testing probe template B505, optical axis focus the heart automatically, and socket positioning pedestal 6 includes shading sealing ring 601, with lens mount flange 3 Confined space is formed, the lower section of test adaptor plate 7 is provided with socket heating module 8, and test adaptor plate 7 includes switching needle mould connection Pad 701 and chip connection pads 702, fixed chip, chip positioning folder autokeyer 9 are set to socket positioning pedestal 6 Outside, chip positioning folder autokeyer 9 include chip positioning folder control button 901, chip positioning folder side push rod A902 and core Piece locating clip side push rod B903, by chip positioning, test system workbench 10 is set to the lower section of socket heating module 8.
Operation principle:When the image chip is used to focus heart test jack automatically, firstly, it is necessary to exclude quickly to take automatically When putting the gap of tested imager chip, when lamp box 1 with lens mount flange 3 with switching needle mould 202 together by the pressure of test system Force mechanisms downlink, presses to the chip test base 5 for having placed image imager chip 4, and lens mount flange 3 is first pressed onto normal convex state The chip positioning folder control button 901 of (protruding from) socket positioning pedestal 6, chip positioning folder control button 901 are forced downlink, push away Dynamic chip positioning folder side push rod A902, chip positioning press from both sides side push rod B903, and chip positioning presss from both sides side push rod B903 by normally opened shape as a result, The chip positioning folder 502 of state it is automatic it is horizontal pushes away, make by altimetric image imager chip 4 when being tested with chip positioning kickboard 501 Positioning right-angle side is adjacent to completely, in this way, just eliminating chip test base 5 when fast picking and placeing the new imager chip 4 by altimetric image Required reserved position gap realizes the zero clearance between image imager chip 4 and positioning frame, keeps image imager chip 4 resettings when the optical axis of optical lens is aligned imager chip photosensitive region central point, test the pressure of system without site error Force mechanisms downwardly together go lamp box 1 and lens mount flange 3 with switching needle mould 202, press to and have placed image imager chip 4 Chip test base 5, when lens mount flange 3 is fully pressed against in socket positioning pedestal 6, the photosensitive image arrived of image imager chip 4 is believed Number, by testing probe 504, chip connection pads 702, switching needle mould connects pad 701, and adapting probe 201 is connected to image Functional test plate forms image;The image that image imager chip 4 senses is exported again to show to computer, is detected, in this socket Under the conditions of the electric signal unicom of pressing, screw is adjusted by adjusting 307 corresponding Y-direction of each lens mount on lens mount flange 3 301, x to adjustment screw 302, on computer monitor, it can be seen that or detect each 307 institute of lens mount on lens mount flange 3 The optical axis of the optical lens 310 of assembling and the sensitivity centre weight by altimetric image imager chip 4 clamped by chip locating clip 502 It is folded, when depressing lens mount flange 3 this eliminates System Testing Pressure mechanism, optical frames caused by entire movement, clamping mechanism First 310 optical axis and the site error of the sensitivity centre by altimetric image imager chip 4 clamped by chip locating clip 502, are adjusted The imaging of whole optical lens and imager chip photosensitive region face are without angle, under the conditions of socket presses electric signal unicom, by adjusting Each 307 corresponding+θ angles of lens mount adjustment screw 303 on lens mount flange 3 ,-θ angles adjustment screw 304 are shown in computer Show on device, it is seen that or detect the rectangle of the imaging of optical lens 310 that each lens mount 307 is assembled on lens mount flange 3 Edge with by the rectangular edges of the photosensitive region by altimetric image imager chip 4 that chip locating clip 502 clamps along parallel, sealing hides Light, under socket stitching state, shading sealing ring 601 and socket positioning pedestal 6, lens mount flange 3 form confined space, only allow It is imaged the image imager chip 4 that light enters from optical lens 310 on chip test base 5;Cover the light entered by other positions Line excludes light leakage interference, after completion more than debugging efforts, in the automatic test course of work later test jack just realize Image chip focuses the heart automatically, test the pressure mechanism of system lamp box 1 and lens mount flange 3 with switching needle mould 202 together It lifts, test system workbench 10 rotates clockwise 90 degree, and the image imager chip 4 tested is sent out System Testing Pressure Mechanism;It tests system workbench 10 simultaneously with this and is imaged new testing image has been placed in another group of socket positioning pedestal 6 The chip test base 5 of chip 4 has been sent in pressure mechanism, is tested the pressure mechanism of system lamp box 1 and lens mount flange 3 and is turned It connects needle mould 202 to depress together, realizes that 4 sensitivity centre of image imager chip focuses the heart automatically with 310 optical axis of optical lens;Test chart As imager chip 4, circulating repetition pressure mechanism lifts, loading and unloading;Pressure, test, test jack in chip testing process not Image imager chip 4 is completed disconnectedly and focuses heart work automatically, and here it is the uses that the image chip focuses heart test jack automatically Flow, the content not being described in detail in this explanation belong to the prior art well known to professional and technical personnel in the field.
Although the present invention is described in detail referring to the foregoing embodiments, for those skilled in the art, It still can modify to the technical solution recorded in foregoing embodiments or which part technical characteristic is carried out etc. With replacing, all within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in this Within the protection domain of invention.

Claims (8)

1. a kind of image chip focuses heart test jack automatically, automatic including lamp box (1), chip test base (5), chip positioning folder Control key (9), test system workbench (10), it is characterised in that:The lamp box (1) is placed, and lamp side by side with interconnecting module (2) Lens mount flange (3) is provided with below case (1), image imager chip (4) is provided with below the lens mount flange (3), The chip test base (5) is set to the inside of socket positioning pedestal (6), and is provided with survey below socket positioning pedestal (6) Preliminary operation fishplate bar (7) is provided with socket heating module (8), the automatic control of chip positioning folder below the test adaptor plate (7) Key (9) processed is set to the outside of socket positioning pedestal (6), and the test system workbench (10) is set to socket heating module (8) lower section.
2. a kind of image chip according to claim 1 focuses heart test jack automatically, it is characterised in that:The switching model Block (2) includes adapting probe (201) and switching needle mould (202).
3. a kind of image chip according to claim 1 focuses heart test jack automatically, it is characterised in that:The lens mount Flange (3) adjusts spiral shell including Y-direction adjustment screw (301), x to adjustment screw (302) ,+θ angles adjustment screw (303) ,-θ angles Silk (304), Y-direction pressure slider II (305), X are to pressure slider (306), lens mount (307), Y-direction pressure slider I (308), Y-direction Compression spring (309), optical lens (310), X are to pressure slider I (311) and X to compression spring (312).
4. a kind of image chip according to claim 3 focuses heart test jack automatically, it is characterised in that:The Y-direction tune Whole screw (301) includes Y-direction adjustment sliding block I (30101) and Y-direction adjustment sliding block II (30102).
5. a kind of image chip according to claim 1 focuses heart test jack automatically, it is characterised in that:The chip is surveyed Seat (5) is tried including chip positioning kickboard (501), chip positioning folder (502), testing probe template A (503), test probe (504) and is surveyed Test point mould B (505).
6. a kind of image chip according to claim 1 focuses heart test jack automatically, it is characterised in that:The socket is determined Position pedestal (6) includes shading sealing ring (601).
7. a kind of image chip according to claim 1 focuses heart test jack automatically, it is characterised in that:The test turns Fishplate bar (7) includes switching needle mould connection pad (701) and chip connection pads (702).
8. a kind of image chip according to claim 1 focuses heart test jack automatically, it is characterised in that:The chip is determined Position folder autokeyer (9) includes chip positioning folder control button (901), chip positioning folder side push rod A (902) and chip positioning Press from both sides side push rod B (903).
CN201810116908.7A 2018-02-02 2018-02-02 A kind of image chip focuses heart test jack automatically Pending CN108169655A (en)

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Application Number Priority Date Filing Date Title
CN201810116908.7A CN108169655A (en) 2018-02-02 2018-02-02 A kind of image chip focuses heart test jack automatically

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Application Number Priority Date Filing Date Title
CN201810116908.7A CN108169655A (en) 2018-02-02 2018-02-02 A kind of image chip focuses heart test jack automatically

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CN108169655A true CN108169655A (en) 2018-06-15

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110954807A (en) * 2018-09-27 2020-04-03 精工爱普生株式会社 Electronic component conveying device and electronic component inspection device
CN113030523A (en) * 2021-03-04 2021-06-25 西安微电子技术研究所 Aging test socket for optical imaging micro-system module
CN115343594A (en) * 2022-06-24 2022-11-15 苏州吾爱易达物联网有限公司 Test device for SIP packaging NB-IoT chip

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Publication number Priority date Publication date Assignee Title
US5321351A (en) * 1990-05-25 1994-06-14 Everett Charles Technologies, Inc. Test fixture alignment system
KR20010004196A (en) * 1999-06-28 2001-01-15 김영환 Apparatus for testing chip of image sensor
CN202748383U (en) * 2011-12-02 2013-02-20 金英杰 Test bench for automatic chip test machine
CN203241443U (en) * 2013-05-09 2013-10-16 金英杰 Clamp of unpacked chip testing tool
CN104406541A (en) * 2014-11-12 2015-03-11 浙江大学 Precise assembling and adjusting device and method for detector chip of imaging system
CN207742302U (en) * 2018-02-02 2018-08-17 深圳市世坤科技实业有限公司 A kind of image chip focuses heart test jack automatically

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5321351A (en) * 1990-05-25 1994-06-14 Everett Charles Technologies, Inc. Test fixture alignment system
KR20010004196A (en) * 1999-06-28 2001-01-15 김영환 Apparatus for testing chip of image sensor
CN202748383U (en) * 2011-12-02 2013-02-20 金英杰 Test bench for automatic chip test machine
CN203241443U (en) * 2013-05-09 2013-10-16 金英杰 Clamp of unpacked chip testing tool
CN104406541A (en) * 2014-11-12 2015-03-11 浙江大学 Precise assembling and adjusting device and method for detector chip of imaging system
CN207742302U (en) * 2018-02-02 2018-08-17 深圳市世坤科技实业有限公司 A kind of image chip focuses heart test jack automatically

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110954807A (en) * 2018-09-27 2020-04-03 精工爱普生株式会社 Electronic component conveying device and electronic component inspection device
CN113030523A (en) * 2021-03-04 2021-06-25 西安微电子技术研究所 Aging test socket for optical imaging micro-system module
CN115343594A (en) * 2022-06-24 2022-11-15 苏州吾爱易达物联网有限公司 Test device for SIP packaging NB-IoT chip

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