CN202748383U - Test bench for automatic chip test machine - Google Patents
Test bench for automatic chip test machine Download PDFInfo
- Publication number
- CN202748383U CN202748383U CN 201120497272 CN201120497272U CN202748383U CN 202748383 U CN202748383 U CN 202748383U CN 201120497272 CN201120497272 CN 201120497272 CN 201120497272 U CN201120497272 U CN 201120497272U CN 202748383 U CN202748383 U CN 202748383U
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- test bench
- automatic chip
- chip
- test machine
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Abstract
The utility model relates to a chip test bench and especially to a test bench for an automatic chip test machine mounted on the automatic chip test machine. The test bench comprises a circular base disc and test seats circumferentially arranged on the circular base disc, and insulating plates are arranged between the base disc and test seats. According to the utility model, the test seats are circumferentially arranged on the circular base disc, the circular base disc at the bottom is rotated to realize successive testing of chips on every test seat at circumference during automatic testing, and thus, feeding, discharging and detection are synchronously carried out during continuous detection, so waiting time of the test machine in the procedures of feeding and discharging is reduced; time for the whole continuous testing is substantially saved. Circumferential arrangement of the test seats also enables the volume and occupied space of the integral automatic chip test machine to be reduced and is more beneficial for arrangement and placing of equipment.
Description
Technical field
The utility model relates to a kind of chip test base, especially is installed on the automatic chip test machine test bench on the automatic chip test machine.
Technical background
In the chip production flow process, detection to chip is an important step, when the chip testing of carrying out in batches, the chip testing machine of enterprise's normal operation robotization carries out large batch of test to chip, the general straight-line feed that adopts during existing chip testing, it is feed position, test bit is arranged on the straight line, so such chip testing machine generally has a larger length, need the larger space of duty, to having relatively high expectations of the interior space, enterprise often needs according to the chip testing machine that larger workshop is set places this type of, and machine length is very long, is not easy to that operating personnel observe and operation.
Summary of the invention
The utility model provides a kind of automatic chip test machine test bench little, that the convenient operation personnel observe and operate that takes up room.
To achieve these goals, the utility model adopts following technical scheme:
It is installed on the chip testing machine, comprises a circular base plate, and described circular bottom plate is provided with the test bench along circumferential arrangement, is provided with insulcrete between described circular base plate and the test bench, and the test bench top is provided with light inductive lamp box.
Preferably, described test bench comprises the circuit board of bottom, is provided with the test bench shell at circuit board, is provided with one or more chip testings position in the described test bench shell.
Preferably, described each test bit comprises a chip mount pad, and below, chip mount pad inside is provided with testing needle, and the testing needle bottom is provided with circuit connecting plate, and testing needle connects base circuit board.
Preferably, described testing needle is installed in the testing needle holder.
Preferably, described circular base plate top is provided with light inductive lamp box, described light inductive lamp box comprises a lamp box mounting flange that is connected with chip testing machine, lamp box mounting flange bottom surface is provided with the circuit substrate with a plurality of LED, cover one or more layers filter on the light-emitting area of described circuit substrate, described circuit substrate and filter are installed in the filter mounting flange, be fixed with a top board below the described filter mounting flange, be fixed with a top board below the described filter mounting flange, be provided with the through hole of corresponding each test bit in the described top board, corresponding each test bit in described top board bottom is provided with a lower platen, each lower platen is provided with a threaded hole, and an optical imaging lens is installed in the threaded hole.
Preferably, described every metafiltration tabula rasa is multi-segment structure.
Preferably, be provided with the mounting groove of mounting circuit substrate in the described filter mounting flange, be provided with the optical filtering groove that the multistage filter is installed in the described mounting groove.
Preferably, described optical filtering groove is multilevel hierarchy.
Preferably, described optical imaging lens and lower platen are matrix array structure.
Preferably, described top board is provided with an air admission hole, and described lower platen is provided with outgassing groove.
Owing to having adopted said structure, automatic chip test machine test bench in the utility model with test bench with the circumference mode arrange with circular base plate on, when automatically testing, rotating the bottom circular base plate can test the chip on each test bench on the circumference successively, when having realized continuous detecting, charging, discharging and test section can be carried out synchronously, can allow like this test machine reduce charging, stand-by period of going out material process; Fully save the time of whole follow-on test work.Circle type is arranged, and has also dwindled the volume of whole automatic chip test machine, has reduced the space that machine takies, and more is conducive to the arrangement of equipment and puts.
Description of drawings
Fig. 1 is the one-piece construction schematic diagram of the utility model embodiment;
Fig. 2 is the test bench structural representation of the utility model embodiment;
Fig. 3 is the light inductive lamp box explosive view of the utility model embodiment.
Embodiment
Shown in Fig. 1,2 and 3, automatic chip test machine test bench of the present utility model is installed on the chip testing machine, comprise a circular base plate 1, described circular bottom plate 1 is provided with the test bench 2 along circumferential arrangement, be provided with insulcrete 3 between described circular base plate 1 and the test bench 2, described test bench top is provided with light inductive lamp box 4.
Wherein, described test bench 2 comprises the circuit board 21 of bottom, is provided with test bench shell 22 at circuit board 21, is provided with one or more chip testings position 23 in the described test bench shell 22.In order once simultaneously to carry out the test of a plurality of chips, comprise four chip testing positions 23 in the present embodiment in each test bench shell 22.
In the said structure, described each test bit 23 comprises a chip mount pad 24, and chip mount pad 24 inner belows are provided with double end testing needle 25, and double end testing needle 25 bottoms are provided with the lower needle mould 26 of stationary probe, and probe 25 connects base circuit board 21.
In the said structure, the top elasticity syringe needle of double ended probes is connected with chip pin, and bottom elasticity syringe needle is connected with base circuit board, makes chip pin and test board circuit realize physical connection, electric conduction signal; In order to realize the electric performance test of chip.
In the present embodiment, described upper needle mould 27, with lower needle mould 26 clampings probe, make the testing needle can steady operation, in test process, be not offset.
In the present embodiment, described light inductive lamp box 4 comprises a lamp box mounting flange 401, lamp box mounting flange 401 bottom surfaces are provided with the circuit substrate 402 with a plurality of LED, because LED is pointolite, in order to obtain soft uniform test light, the present embodiment covers one or more layers filter 403 in the light-emitting area of described circuit substrate 402, comprise two-layer filter in the present embodiment, described circuit substrate 402 and filter 403 are installed in the filter mounting flange 404, be fixed with a top board 405 below the described filter mounting flange 404, be provided with the through hole 4051 of the optical imaging lens of corresponding test bit in the described top board 405, corresponding each position of 4051, described top board 405 bottoms, be respectively equipped with a lower platen 407, threaded hole 4072 and gas outlet 4071 are arranged on the lower platen, and optical imaging lens 406 is installed in the threaded hole 4072.
In the present embodiment, described every metafiltration tabula rasa 403 is multi-segment structure, for the filter 403 that holds circuit substrate 402 and multi-segment structure, in described filter mounting flange 404, be provided with the mounting groove 4041 of mounting circuit substrate, be provided with the optical filtering groove 4042 that the multistage filter is installed in the described mounting groove 4041.In order to realize the installation of multilayer filter, described optical filtering groove is multilevel hierarchy, and in conjunction with the two-layer filter structure in the present embodiment, optical filtering groove 4042 also is two-layer configuration accordingly.
In the present embodiment, described optical imaging lens 406 and lower platen 407 are the matrix structure of multiple lines and multiple rows as shown in the figure.
The lamp box structure of the chip testing machine of the present embodiment is when work, the pallet that is loaded with sensitive chip runs to assigned address, lamp box structure presses down sensitive chip placed side by side is detected, after being completed, lamp box structure rises, and pallet is further forward, is pressing down test, the above-mentioned course of work circulates, until be completed, but lamp box structure in the process that rises, lower platen easily takes up tested sensitive chip, make it break away from pallet, when sensitive chip adheres to the lower platen bottom, when press down next time, then the chip of adhesion can be damaged, described top board 405 is provided with an air admission hole 4052, and described lower platen 407 is provided with outgassing groove 4071.
The above only is preferred embodiment of the present utility model; be not so limit claim of the present utility model; every equivalent structure or equivalent flow process conversion that utilizes the utility model instructions and accompanying drawing content to do; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present utility model.
Claims (10)
1. automatic chip test machine test bench, it is characterized in that: comprise a circular base plate, described circular bottom plate is provided with the test bench along circumferential arrangement, is provided with insulcrete between described circular base plate and the test bench.
2. automatic chip test machine test bench as claimed in claim 1 is characterized in that: described test bench comprises the circuit board of bottom, is provided with the test bench shell at circuit board, is provided with one or more chip testings position in the described test bench shell.
3. automatic chip test machine test bench as claimed in claim 2, it is characterized in that: described each test bit comprises a chip mount pad, below, chip mount pad inside is provided with testing needle, and the testing needle bottom is provided with circuit connecting plate, and circuit board switching electric signal is to test machine.
4. automatic chip test machine test bench as claimed in claim 3, it is characterized in that: described testing needle is installed in the testing needle holder.
5. automatic chip test machine test bench as claimed in claim 1, it is characterized in that: described circular base plate top is provided with light inductive lamp box, described light inductive lamp box comprises a lamp box mounting flange that is connected with chip testing machine, lamp box mounting flange bottom surface is provided with the circuit substrate with a plurality of LED, cover one or more layers filter on the light-emitting area of described circuit substrate, described circuit substrate and filter are installed in the filter mounting flange, be fixed with a top board below the described filter mounting flange, be fixed with a top board below the described filter mounting flange, be provided with the through hole of corresponding each test bit in the described top board, corresponding each test bit in described top board bottom is provided with a lower platen, each lower platen is provided with a threaded hole, and an optical imaging lens is installed in the threaded hole.
6. automatic chip test machine test bench as claimed in claim 5, it is characterized in that: described every metafiltration tabula rasa is multi-segment structure.
7. automatic chip test machine test bench as claimed in claim 6 is characterized in that: be provided with the mounting groove of mounting circuit substrate in the described filter mounting flange, be provided with the optical filtering groove that the multistage filter is installed in the described mounting groove.
8. automatic chip test machine test bench as claimed in claim 7, it is characterized in that: described optical filtering groove is multilevel hierarchy.
9. automatic chip test machine test bench as claimed in claim 8, it is characterized in that: described optical imaging lens and lower platen are matrix array structure.
10. automatic chip test machine test bench as claimed in claim 9, it is characterized in that: described top board is provided with an air admission hole, and described lower platen is provided with outgassing groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120497272 CN202748383U (en) | 2011-12-02 | 2011-12-02 | Test bench for automatic chip test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120497272 CN202748383U (en) | 2011-12-02 | 2011-12-02 | Test bench for automatic chip test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202748383U true CN202748383U (en) | 2013-02-20 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201120497272 Expired - Lifetime CN202748383U (en) | 2011-12-02 | 2011-12-02 | Test bench for automatic chip test machine |
Country Status (1)
| Country | Link |
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| CN (1) | CN202748383U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439541A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Automatic locating and testing socket for CMOS camera shooting chip floating carrier plate |
| CN103439540A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Wafer level camera shooting module WLC automatic testing socket |
| CN103439539A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Mega-pixel CMOS optical chip module automatic testing socket |
| CN103487609A (en) * | 2013-09-09 | 2014-01-01 | 苏州创瑞机电科技有限公司 | Tens of millions of pixel level CMOS optical chip module test socket |
| CN108169655A (en) * | 2018-02-02 | 2018-06-15 | 深圳市世坤科技实业有限公司 | A kind of image chip focuses heart test jack automatically |
| CN116679183A (en) * | 2023-08-03 | 2023-09-01 | 深圳市诺泰芯装备有限公司 | IGBT product testing method and device |
-
2011
- 2011-12-02 CN CN 201120497272 patent/CN202748383U/en not_active Expired - Lifetime
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439541A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Automatic locating and testing socket for CMOS camera shooting chip floating carrier plate |
| CN103439540A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Wafer level camera shooting module WLC automatic testing socket |
| CN103439539A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Mega-pixel CMOS optical chip module automatic testing socket |
| CN103439541B (en) * | 2013-09-03 | 2016-05-18 | 苏州创瑞机电科技有限公司 | The CMOS camera chip automatic assignment test socket of support plate that floats |
| CN103487609A (en) * | 2013-09-09 | 2014-01-01 | 苏州创瑞机电科技有限公司 | Tens of millions of pixel level CMOS optical chip module test socket |
| CN108169655A (en) * | 2018-02-02 | 2018-06-15 | 深圳市世坤科技实业有限公司 | A kind of image chip focuses heart test jack automatically |
| CN116679183A (en) * | 2023-08-03 | 2023-09-01 | 深圳市诺泰芯装备有限公司 | IGBT product testing method and device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20170221 Address after: 518000 Shenzhen Industrial Zone, West Street community, Gongming street, Guangming New District, Guangdong, 29, China Patentee after: Shenzhen City Tianyu Intelligent Equipment Co. Ltd. Address before: 518000 Guangdong city of Shenzhen province Futian District Huilong Garden 1 Swiss Pavilion dragon 401 Patentee before: Jin Yingjie |
|
| CX01 | Expiry of patent term |
Granted publication date: 20130220 |
|
| CX01 | Expiry of patent term |