CN108109567B - Liquid crystal module aging testing device and equipment comprising same - Google Patents
Liquid crystal module aging testing device and equipment comprising same Download PDFInfo
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- CN108109567B CN108109567B CN201711447322.0A CN201711447322A CN108109567B CN 108109567 B CN108109567 B CN 108109567B CN 201711447322 A CN201711447322 A CN 201711447322A CN 108109567 B CN108109567 B CN 108109567B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
Abstract
The invention provides a liquid crystal module aging test device and equipment comprising the same, wherein the device comprises: the device comprises a random access memory, a Flash memory, a microprocessor, an FPGA and an output interface, wherein the Flash memory stores display picture data of the liquid crystal module received from an upper computer; the microprocessor calls the test parameters and the display picture parameters from the upper computer from the random access memory and transmits the test parameters and the display picture parameters to the FPGA; the FPGA generates a test signal according to the test parameter, reads the display picture data from the Flash memory according to the display picture parameter, and transmits the test signal and the display picture data to the output interface; and the output interface transmits the test signal and the display picture data to the liquid crystal module.
Description
Technical Field
The invention relates to the field of liquid crystal display, in particular to a liquid crystal module aging test device and equipment comprising the same.
Background
The current TFT-LCD (thin film transistor-liquid crystal display) module aging box control system adopts USB communication to transmit a set driving signal to light a TFT-LCD liquid crystal module, edits parameters through an upper computer, and downloads and updates related parameters to a TFT-LCD liquid crystal module aging box through a USB, wherein the current TFT-LCD (thin film transistor-liquid crystal display) module aging box control system includes a control program of a single chip microcomputer and each parameter required by the module: module clock frequency, horizontal clock, vertical clock, time sequence requirement, voltage and current set value, switching picture time, automatic On/Off mode, aging automatic cycle mode (including three-stage single picture fixed time, multi-picture fixed time cycle, fixed picture On/Off) and the like, and a program of an FPGA programmable logic device, so that the FPGA outputs RGB signal pictures required by the module according to the program requirement to light the driving module. The power supply adopts +12V and +/-24V input, and five circuits of voltages which can be set by software are output through loops such as voltage boosting and the like: VSHD (3-10V), VSHA (3-10V), VGH (1-15V), VGL (-1-15V), VLED (1-42V). The voltage parameters required by the module are set through upper computer software and downloaded into a liquid crystal module aging box control system, and when the equipment is started, the corresponding port voltage is output according to a set amplitude value and supplied to the module. The TFT-LCD liquid crystal module aging box control system can carry out real-time signal transmission control through a USB port, and can also carry out opening and closing, picture switching, mode switching and the like of equipment through a key knob and the like externally connected with the equipment. Signals are interfaced to module interfaces (including digital signal interfaces, analog type interfaces, LVDS signal interfaces, etc.) of different requirements through a distribution substrate, an XF2M ohm dragon connector, an FFC and a ROM substrate.
However, the number of the upper computer connected with the TFT-LCD liquid crystal detection device through the USB port is limited, port conflict can be generated and cannot be identified generally when more than 3 devices are connected, the +5V power supply driving capacity of the USB port of the upper computer is limited, and when a plurality of devices are connected and driven together, voltage can be attenuated to cause that connection cannot be driven. Because the existing TFT-LCD liquid crystal aging signal box drive control system cannot realize simultaneous control of a plurality of computers connected to the same PC, the program can only be updated singly, a large amount of time and manpower and material resources (the PC upper computer) are needed, great inconvenience is brought to a client when the client uses the equipment, and the labor amount and cost of the client are increased.
The existing TFT-LCD liquid crystal module aging box control system does not store Flash, cannot store big data of BMP pictures, can only output built-in pictures of FPGA survival, and cannot meet the requirements of customers when the customers need to display complex pictures or picture photos during testing, thereby causing inconvenience to the customers. In order to meet the requirements of partial complex pictures of TFT-LCD customers, design engineers need to spend much effort on programming internal implementation through the FPGA, and a large amount of FPGA internal resources are occupied, sometimes even impossible. The current TFT-LCD liquid crystal device can not realize the customer requirement.
The current TFT-LCD liquid crystal module aging box control system can only drive a Single interface module and cannot drive a Dual interface module because of fewer FPGA ports. When the resolution of a TFT-LCD market module tends to high resolution more and more, the traditional TFT-LCD aging box control system is very sensitive to the situation and cannot drive the corresponding situation.
The current TFT-LCD liquid crystal module aging box control system cannot monitor the voltage and current of an output port, and when large current or large voltage of equipment is output due to pressure welding dislocation, poor damage of devices and the like, the TFT-LCD liquid crystal module can be damaged, or the equipment generates heat due to the fact that the equipment outputs the large current for a long time, and potential safety hazards such as naked flames and the like exist.
Disclosure of Invention
In order to solve at least one of the above technical problems, the present invention provides a liquid crystal module burn-in test apparatus and a device including the same.
A first aspect of the present invention provides a liquid crystal module aging test apparatus, including:
random access memory, Flash memory, microprocessor, FPGA and output interface, wherein
The Flash memory stores the display picture data of the liquid crystal module received from the upper computer;
the microprocessor calls the test parameters and the display picture parameters from the upper computer from the random access memory and transmits the test parameters and the display picture parameters to the FPGA;
the FPGA generates a test signal according to the test parameter, reads the display picture data from the Flash memory according to the display picture parameter, and transmits the test signal and the display picture data to the output interface;
and the output interface transmits the test signal and the display picture data to the liquid crystal module.
By the testing device of the embodiment, when a client needs to display a complex picture or a picture photo, a designer does not need to generate the complex picture by programming the interior of the FPGA and only needs to load the complex picture in the Flash memory.
In a preferred embodiment, the output interface includes a first output interface outputting RGB driving signals and clock control signals and a second output interface outputting RGB driving signals.
By the preferred embodiment, the liquid crystal module can be driven under the condition of testing the high-resolution TFT-LCD.
In a preferred embodiment, the apparatus further comprises:
a LAN port and a USB interface for connecting the device and an upper computer,
the display picture data is downloaded from the upper computer to the Flash memory through the LAN port;
and the test parameters are downloaded into the device from the upper computer through the USB interface.
In a preferred embodiment, the number of the devices is multiple, and the devices are networked with the upper computer through a wireless router and the LAN portal.
Through this preferred embodiment, can control many testing arrangement simultaneously with a host computer.
In a preferred embodiment, the device further comprises a signal distribution buffer substrate for providing the required operating voltage for the device.
In a preferred embodiment, the test parameters include: the device comprises a voltage set value, a voltage maximum and minimum protection value, a current maximum and minimum protection value, power supply time sequence precedence time, clock frequency, a horizontal clock, a vertical clock, front and rear edge time, picture editing, a picture main code, RGB signal output variables and picture waiting time.
In a preferred embodiment, the random access memory is two DDR3 memories, and the Flash memories are two memories.
A second aspect of the present invention provides a liquid crystal module burn-in test apparatus comprising the test device of the first aspect of the present invention.
In a preferred embodiment, the apparatus further comprises:
a flexible printed circuit board;
a ROM substrate; wherein
The test signal and the display picture data output by the output interface are transmitted to the ROM substrate through the flexible printed circuit board;
the ROM substrate is connected with the liquid crystal module to be tested, and can be configured according to the requirements of the ports of the liquid crystal module to be tested.
By the preferred embodiment, the equipment has more flexibility and can correspond to TFT-LCD liquid crystal modules with different interfaces, and the TFT-LCD liquid crystal module can be widely applied to small and medium TFT-LCD liquid crystal module mobile phone screens and vehicle-mounted screens.
In a preferred embodiment, the apparatus further comprises: the installation part is used for installing the LCD module that awaits measuring on the equipment, the installation part includes:
the tray is used for placing the liquid crystal module to be tested;
electrical contacts for electrically connecting the testing portion of the module to be tested with corresponding ports of the ROM substrate;
and the positioning device is used for positioning the test part at the position of the corresponding port of the ROM substrate.
By the preferred embodiment, the short circuit possibly caused by the pressure welding dislocation of the TFT-LCD liquid crystal module can be effectively prevented.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:
FIG. 1 is a schematic diagram of an aging test apparatus for a liquid crystal module according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating a liquid crystal module degradation testing apparatus according to an embodiment of the present invention, wherein fig. 2(a) is a top view and fig. 2(b) is a front view.
It should be noted that the drawings herein are not drawn to scale and are for illustrative purposes only and, therefore, should not be taken as limiting or restricting the scope of the present invention in any way. In the drawings, like elements are identified with like reference numerals.
Detailed Description
The technical solution of the present invention is further described below with reference to the accompanying drawings. The following detailed description refers to the accompanying drawings, which form a part hereof, and in which is shown by way of illustration specific embodiments in which the invention may be practiced. It is to be understood that other embodiments may be utilized and structural or logical changes may be made without departing from the scope of the present invention. For example, features illustrated or described with respect to one embodiment can be used on or in conjunction with other embodiments to yield yet a further embodiment. It is intended that the present invention include such modifications and variations. These examples are described in specific language and are not to be construed as limiting the scope of the appended claims. The figures are for explanatory purposes only and are not drawn to scale. Corresponding elements are denoted by the same reference numerals in the different figures for clarity purposes, unless otherwise specified.
The terms "having," "containing," "including," "containing," and the like are open-ended and mean that there are additional elements, components, or features described, but not the exclusion of additional elements or features.
As shown in fig. 1, the present invention provides a liquid crystal module aging test apparatus, including: the device comprises a random access memory, a Flash memory, a microprocessor, an FPGA and an output interface, wherein the Flash memory stores display picture data of the liquid crystal module received from an upper computer; the microprocessor calls the test parameters and the display picture parameters from the upper computer from the random access memory and transmits the test parameters and the display picture parameters to the FPGA; the FPGA generates a test signal according to the test parameter, reads the display picture data from the Flash memory according to the display picture parameter, and transmits the test signal and the display picture data to the output interface; and the output interface transmits the test signal and the display picture data to the liquid crystal module.
The upper computer provides editing control signal transmission and transmits the editing control signal transmission to the liquid crystal module aging test device. The upper computer software provides an editing interface to set liquid crystal module test parameters required by the liquid crystal module, and the test parameters mainly comprise voltage set values, voltage maximum and minimum protection values, current maximum and minimum protection values, power supply time sequence time, clock frequency, a horizontal clock, a vertical clock, front and back edge time, picture editing, picture Main codes, Code codes, RGB signal output variables, picture waiting time and the like required by the module. The upper computer can set and select the aging test device needed in the aging chamber, and the aging test device is a single-layer multi-layer or all-connected aging test device.
In a preferred embodiment, the aging test device adopts a LAN port and a USB port to realize complementation. The large data such as image data can be transmitted through the LAN port, networking can be realized by connecting the TP-Link through the LAN port, and a single upper computer can simultaneously control and operate a plurality of detection signal driving devices.
The USB port of the aging test device can be connected to an upper computer through a USB line to realize the control, read and write operation of the device. It can send various commands to turn on and off the device, switch pictures, skip pictures, write required commands and characters into the chip, rewrite modification of network IP, read relevant parameters of the chip, read program version, write Module parameter reading (Module name, clock parameter). Only the PRG program is required to output the monitored variable and can be read and displayed through the software set by the USB, so that the monitoring and debugging of the equipment are facilitated for debugging personnel. Especially, the USB port is used for modifying the IP written into the device, so that the configuration of an external dial switch can be saved, and convenience is provided for the use of the testing device. The client can modify the IP address of the configuration device according to the needs of the client, namely, the IP of the position where the device and the software in the high-temperature aging chamber are conveniently placed is matched.
In a preferred example, the microprocessor in the testing device is implemented by a single chip microcomputer, and more preferably, a single chip microcomputer of the model STM32F407IE is used.
In a preferred example, the FPGA employs a seling Spartan6FPGA chip.
In a preferred example, the random access memory employs 2 DDR3 memories.
In a preferred example, the Flash memory employs 2 Flash memory chips.
By adopting 2G Flash storage devices, 60 large-resolution BMP pictures can be provided, and convenience is provided for clients to correspond to various machines. The BMP is recorded at one time, the needed BMP picture can be directly called as required when the model is switched, the BMP with the needed size is manufactured by software when the model corresponds to the complex picture, and the BMP is downloaded to a testing device and stored in Flash, and the BMP can be displayed on a liquid crystal module after being called out when in use. The method is realized without language description in the FPGA by engineering personnel, and can be realized by general personnel through guidance and training, thereby bringing great convenience to customers.
The single chip microcomputer, the FPGA chip, the DDR3 internal memory and the FLASH memory chip form a microcomputer memory control system. The part is a brain of a hardware part, all parts are connected through an STM32F407IE single chip microcomputer to realize coordination work, the STM32F407IE single chip microcomputer is loaded and operated according to a downloaded storage program after the equipment is powered on and started, and set power supply parameters of the TFT-LCD liquid crystal module are sent to a power supply device to be configured to required voltage and limited parameters. The STM32F407IE singlechip reads the picture parameters needing to be configured of the TFT-LCD liquid crystal module and transmits the picture parameters to a sailing Spartan6FPGA chip, so that the FPGA can load and read the BMP in the FLASH. The STM32F407IE single chip microcomputer monitors and receives commands of LAN ports, USB ports, keys and the like of all external ports to coordinate all devices to realize required functions (program downloading, FLASH clearing, picture output including built-in and BMP pictures, Power On signals are output successively according to set timing requirements, Power off signals are closed successively according to set timing requirements, the previous picture is switched, the next picture is switched, automatic picture circulation output display in sequence is carried out, starting circulation is closed automatically after the fixed picture sequence is set, and picture display is kept according to the fixed set time).
The test device controls including: the method comprises the steps of updating a single chip microcomputer program, updating a FPGA programmable logic device program, emptying BMP pictures, downloading and storing the BMP pictures into Flash, downloading and updating Module and pattern parameters, and reading a program version after downloading. The on-line real-time control can select a single-layer or all detection signal driving devices to carry out operations such as opening, closing, picture circulation pause and the like through a software interface.
In a preferred embodiment, the output interface includes a first output interface outputting RGB driving signals and clock control signals and a second output interface outputting only RGB driving signals, such as J1A and J1B in fig. 1. In the subsequent measurement, the first output interface J1A and the second output interface J1B are the first group of output interfaces, and the output signals are transmitted to the liquid crystal module 1 to be tested.
The testing device supports Dual signal ports, is suitable for corresponding TFT-LCD liquid crystal modules with high resolution such as FULL HD and the like, and has wider practical range. In the current high resolution is a big direction, many TFT-LCD liquid crystal manufacturers need the device corresponding to FULL HD to detect whether the TFT-LCD liquid crystal module corresponding to factory is qualified.
Two sets of output interfaces are schematically shown in the figure, corresponding to two modules under test. However, as will be apparent to those skilled in the art, the present invention may be provided with a plurality of output interfaces, each testing device corresponds to a plurality of liquid crystal modules to be tested, and because of the use of the LAN between the testing device and the upper computer, one upper computer can control a plurality of testing devices, so that by the solution of the present invention, one upper computer can test more liquid crystal modules to be tested than the existing testing system at the same time.
In a preferred example, the measurement device further comprises a signal distribution buffer substrate (shown as "power supply" in the figure) for providing the required operating voltage for the device. The distribution buffer substrate converts the input +12V and +/-24V working voltages to supply power to each chip on the device.
The substrate can realize DC-DC input conversion, and provide various working voltages (+5V, +3.3V, +1.5V, +1.2V and the like) required by a chip on the device through +12V and +/-24V conversion, and automatically adjust the voltage output according to the set requirement according to the received set parameters, wherein the voltage output according to the set requirement comprises the following steps: VSHD (+1.6 to +12V), VSHA (+1.6 to +12V), VGH (+1 to +30V), VGL (-2 to-30V), VLED (+2 to +36V), and +12V, and these voltages are simultaneously distributed to 4 output ports. The substrate can also distribute signals on the testing device to a plurality of output ports simultaneously, and the signals comprise (clock frequency, horizontal clock, vertical clock, enabling clock, R (2-9), G (2-9), B (2-9), R (12-19), G (12-19), B (12-19), SPI communication signal, I2C signal and the like, so that a plurality of TFT-LCD liquid crystal modules can be driven simultaneously.
The invention also provides a liquid crystal module aging test device which comprises the test device.
As shown in fig. 2, the test apparatus further includes a flexible printed circuit board and a ROM substrate.
The test signal and the display picture data output by the output interface are transmitted to the ROM substrate through the flexible printed circuit board.
The ROM substrate is connected with the liquid crystal module to be tested, and the ROM substrate can be configured according to the requirements of the ports of the liquid crystal module to be tested. The ROM signal conversion switching substrate designed and manufactured according to different module ports can be newly designed according to different module port requirements (LVDS chips, constant current loops, voltage stabilizing loops, redistribution of power supplies and test points can be added, so that the device has higher flexibility and can correspond to TFT-LCD liquid crystal modules with interfaces of different requirements, and the device can be widely applied to small and medium TFT-LCD liquid crystal module mobile phone screens and vehicle-mounted screens.
As can be seen from fig. 2(a) and (b), the liquid crystal module to be tested is mounted on the test equipment (4 in the figure) by the mounting portion of the test equipment at the time of testing.
The installation department includes the tray, can be according to the suitable layer board of placing of TFT-LCD liquid crystal module size appearance design.
When the test part of the liquid crystal module is electrically connected with equipment, the crimping is very important for the TFT-LCD liquid crystal module and the signal connection, and the crimping dislocation can cause short circuit and burn the module or the equipment when the equipment is opened. If the pressure of the pressure welding probe is too large, the FPC golden finger of the TFT-LCD liquid crystal module can be damaged.
To this end, the testing apparatus further comprises electrical contacts for electrically connecting the testing portion of the module to be tested with respective ports of the ROM substrate. The convenience of connecting the TFT-LCD liquid crystal module to the ROM substrate from top to bottom is taken into consideration, and various connection modes are designed, including golden finger FPC compression joint, probe compression joint, half-contact B to B, full-contact, FPC putting-in connector and the like.
At the same time, in order to further ensure the reliability of the contact, the apparatus is further provided with positioning means for positioning the test portions at the positions of the respective ports of the ROM substrate. The positioning device can be precisely aligned in a manner known to those skilled in the art, for example, by using a positioning pin, a positioning block, a groove, an anti-oblique device, and the like.
The invention has been described above with reference to embodiments thereof. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be devised by those skilled in the art without departing from the scope of the invention, and these alternatives and modifications are intended to be within the scope of the invention.
Claims (9)
1. The utility model provides a liquid crystal module aging testing device which characterized in that includes:
random access memory, Flash memory, microprocessor, FPGA and output interface, wherein
The Flash memory stores the display picture data of the liquid crystal module received from the upper computer;
the microprocessor calls the test parameters and the display picture parameters from the upper computer from the random access memory and transmits the test parameters and the display picture parameters to the FPGA;
the FPGA generates a test signal according to the test parameter, reads the display picture data from the Flash memory according to the display picture parameter, and transmits the test signal and the display picture data to the output interface;
the output interface transmits the test signal and the display picture data to the liquid crystal module;
further comprising:
a LAN port and a USB interface for connecting the device and an upper computer,
the display picture data is downloaded from the upper computer to the Flash memory through the LAN port;
the test parameters are downloaded into the device from the upper computer through the USB interface;
through the USB interface, the control read-write operation of the device can be realized.
2. The apparatus of claim 1, wherein the output interface comprises a first output interface and a second output interface, wherein the first output interface outputs RGB drive signals and clock control signals, and wherein the second output interface outputs RGB drive signals.
3. The device according to claim 1, wherein the device is a plurality of devices, and the plurality of devices are networked with the upper computer through a wireless router and the LAN port.
4. The device of claim 1, further comprising a signal distribution buffer substrate for providing a desired operating voltage for the device.
5. The apparatus of any of claims 1-4, wherein the test parameters comprise: the device comprises a voltage set value, a voltage maximum and minimum protection value, a current maximum and minimum protection value, power supply time sequence precedence time, clock frequency, a horizontal clock, a vertical clock, front and rear edge time, picture editing, a picture main code, RGB signal output variables and picture waiting time.
6. The apparatus of any of claims 1-4, wherein the random access memory is two DDR3 memories, and the Flash memory is two.
7. A liquid crystal module burn-in test apparatus comprising a test device according to any one of claims 1 to 6.
8. The apparatus of claim 7, further comprising:
a flexible printed circuit board;
a ROM substrate; wherein
The test signal and the display picture data output by the output interface are transmitted to the ROM substrate through the flexible printed circuit board;
the ROM substrate is connected with the liquid crystal module to be tested, and can be configured according to the requirements of the ports of the liquid crystal module to be tested.
9. The apparatus of claim 8, further comprising a mounting part for mounting a liquid crystal module to be tested on the apparatus, the mounting part comprising:
the tray is used for placing the liquid crystal module to be tested;
electrical contacts for electrically connecting the testing portion of the module to be tested with corresponding ports of the ROM substrate;
and the positioning device is used for positioning the test part at the position of the corresponding port of the ROM substrate.
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| CN109346119B (en) * | 2018-08-30 | 2021-07-23 | 武汉精鸿电子技术有限公司 | Semiconductor memory aging test core board |
| CN109215548B (en) * | 2018-11-08 | 2020-09-08 | 惠科股份有限公司 | Circuit for aging display panel and display panel |
| CN109617757B (en) * | 2018-11-26 | 2021-02-19 | 北京润科通用技术有限公司 | Test method, device and system of tested system |
| CN110187199B (en) * | 2019-04-16 | 2022-03-25 | 昆山国显光电有限公司 | Aging treatment equipment and aging treatment method for display panel |
| CN110176200B (en) * | 2019-06-11 | 2023-03-21 | 苏州华兴源创科技股份有限公司 | Method and system for generating panel detection signal |
| CN111063283A (en) * | 2020-01-19 | 2020-04-24 | 苏州华兴源创科技股份有限公司 | Liquid crystal module aging testing equipment |
| CN113985248B (en) * | 2021-10-26 | 2023-07-11 | 西安微电子技术研究所 | High-temperature dynamic aging system and method for PCIe (peripheral component interconnect express) switching circuit |
| CN114563882A (en) * | 2022-01-19 | 2022-05-31 | 业成科技（成都）有限公司 | Liquid crystal module aging test system |
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| CN101202027B (en) * | 2006-12-13 | 2010-05-26 | 群康科技(深圳)有限公司 | Control system and control method for display screen |
| CN202385229U (en) * | 2011-11-18 | 2012-08-15 | 北京牡丹视源电子有限责任公司 | Signal source applicable to stereotelevision crosstalk measurement |
| CN203616547U (en) * | 2013-12-19 | 2014-05-28 | Tcl显示科技（惠州）有限公司 | Test system of liquid crystal display module |
| CN104795025B (en) * | 2015-04-29 | 2017-10-17 | 西安诺瓦电子科技有限公司 | LED display modules and its condition detection method |
| CN105226415A (en) * | 2015-10-16 | 2016-01-06 | 京东方科技集团股份有限公司 | Display module test fixture |
| CN105702187B (en) * | 2016-01-15 | 2019-07-09 | 京东方科技集团股份有限公司 | A kind of interface circuit, test device |
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Address after: 215000 Qingqiu Lane 8, Suzhou Industrial Park, Suzhou City, Jiangsu Province Applicant after: Suzhou Huaxing source Polytron Technologies Inc Address before: 215000 East Fang Industrial Park Building, No. 1 Huayun Road, Suzhou Park, Jiangsu Province Applicant before: Suzhou HYC Electronic Technology Co., Ltd. |
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