CN111063283A - Liquid crystal module aging testing equipment - Google Patents
Liquid crystal module aging testing equipment Download PDFInfo
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- CN111063283A CN111063283A CN202010057614.9A CN202010057614A CN111063283A CN 111063283 A CN111063283 A CN 111063283A CN 202010057614 A CN202010057614 A CN 202010057614A CN 111063283 A CN111063283 A CN 111063283A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
Abstract
The invention discloses a liquid crystal module aging test device which comprises an aging chamber, wherein the aging chamber at least comprises an IP channel; at least one liquid crystal module aging test device; the IP storage chip is positioned in the aging chamber and is arranged corresponding to the liquid crystal module aging test device, and signal communication is realized between the IP storage chip and the IP channel; the IP storage chip is configured to provide independent IP addresses for the liquid crystal module aging test device. The aging test equipment for the liquid crystal module can realize the cascade connection of a plurality of aging test devices for the liquid crystal module, carry out centralized control and real-time monitoring, facilitate the control, update and monitoring of the equipment by a user, save the update time and ensure that the actual position of the aging test device for the liquid crystal module is matched with the display position in the software.
Description
Technical Field
The invention relates to the field of liquid crystal display, in particular to a liquid crystal module aging test device.
Background
The current TFT-LCD (thin film transistor-liquid crystal display) module aging box control system adopts USB communication to transmit a set driving signal to light a TFT-LCD liquid crystal module, edits parameters through an upper computer, and downloads and updates related parameters to a TFT-LCD liquid crystal module aging box through a USB, wherein the current TFT-LCD (thin film transistor-liquid crystal display) module aging box control system includes a control program of a single chip microcomputer and each parameter required by the module: module clock frequency, horizontal clock, vertical clock, time sequence requirement, voltage and current set value, switching picture time, automatic On/Off mode, aging automatic cycle mode (including three-stage single picture fixed time, multi-picture fixed time cycle, fixed picture On/Off) and the like, and a program of an FPGA programmable logic device, so that the FPGA outputs RGB signal pictures required by the module according to the program requirement to light the driving module. The power supply adopts +12V and +/-24V input, and five circuits of voltages which can be set by software are output through loops such as voltage boosting and the like: VSHD (3-10V), VSHA (3-10V), VGH (1-15V), VGL (-1-15V), VLED (1-42V). The voltage parameters required by the module are set through upper computer software and downloaded into a liquid crystal module aging box control system, and when the equipment is started, the corresponding port voltage is output according to a set amplitude value and supplied to the module. The TFT-LCD liquid crystal module aging box control system can carry out real-time signal transmission control through a USB port, and can also carry out opening and closing, picture switching, mode switching and the like of equipment through a key knob and the like externally connected with the equipment. Signals are connected to module interfaces (comprising a digital signal interface, an analog type interface, an LVDS signal interface, an RSDS signal interface, a Mini-LVDS interface and the like) with different requirements through a distribution substrate, an XF2M ohm dragon connector, an FFC and a ROM substrate.
Because the number of the upper computer connected with the TFT-LCD liquid crystal detection equipment through the USB port is limited, port conflict can be generated and cannot be identified generally when more than 3 devices are connected, the +5V power supply driving capacity of the USB port of the upper computer is limited, and when a plurality of devices are connected and driven together, voltage can be attenuated to cause that the connection cannot be driven. Because the existing TFT-LCD liquid crystal aging signal box drive control system cannot realize simultaneous control of a plurality of computers connected to the same PC, the program can only be updated singly, a large amount of time and manpower and material resources (the PC upper computer) are needed, great inconvenience is brought to a client when the client uses the equipment, and the labor amount and cost of the client are increased.
The existing TFT-LCD liquid crystal module aging box control system does not store Flash, cannot store big data of BMP pictures, can only output built-in pictures of FPGA survival, and cannot meet the requirements of customers when the customers display complex pictures or picture photos when needing to be tested, thereby causing inconvenience to the customers. In order to meet the requirements of partial complex pictures of TFT-LCD customers, design engineers need to spend much effort on programming internal implementation through the FPGA, and a large amount of FPGA internal resources are occupied, sometimes even impossible. The current TFT-LCD liquid crystal device can not realize the customer requirement.
The current TFT-LCD liquid crystal module aging box control system can only drive a Single interface module and cannot drive a Dual interface module because of fewer FPGA ports. When the resolution of a TFT-LCD market module tends to high resolution more and more, the traditional TFT-LCD aging box control system is very sensitive to the situation and cannot drive the corresponding situation.
The current TFT-LCD liquid crystal module aging box control system cannot monitor the voltage and current of an output port, and when large current or large voltage of equipment is output due to pressure welding dislocation, poor damage of devices and the like, the TFT-LCD liquid crystal module can be damaged, or the equipment generates heat due to the fact that the equipment outputs the large current for a long time, and potential safety hazards such as naked flames and the like exist.
If the existing TFT-LCD liquid crystal module aging box equipment is damaged and needs to be replaced again or maintained, the situation that the actual position of the aging box equipment is not matched with the IP position displayed on software easily occurs, and a user cannot conveniently monitor the service condition of the TFT-LCD liquid crystal module aging box equipment in real time.
Therefore, it is desirable to provide a new aging test apparatus for liquid crystal modules.
Disclosure of Invention
In order to solve at least one of the above technical problems, the present invention provides an aging test apparatus for a liquid crystal module, which can realize the cascade connection of a plurality of aging test apparatuses for the liquid crystal module, perform centralized control and real-time monitoring, facilitate the control, update and monitoring of the apparatus by a user, save the update time, and ensure that the actual position of the aging test apparatus for the liquid crystal module is matched with the display position in the software.
In order to achieve the above object, the present invention provides a liquid crystal module aging test apparatus, including: the aging chamber at least comprises an IP channel; at least one liquid crystal module aging test device; the IP storage chip is positioned on the IP channel in the aging chamber and is arranged corresponding to the liquid crystal module aging test device, and signal communication is realized between the IP storage chip and the IP channel; the IP storage chip is configured to provide independent IP addresses for the liquid crystal module aging test device.
Optionally, the IP memory chip has a model number of 24AA025 UIDT.
Optionally, the liquid crystal module aging testing device includes: the device comprises a random access memory, a Flash memory, a microprocessor, an FPGA, an output interface and a monitoring unit, wherein the Flash memory stores display picture data of the liquid crystal module received from an upper computer; the microprocessor calls the test parameters and the display picture parameters from the upper computer from the random access memory and transmits the test parameters and the display picture parameters to the FPGA; the FPGA generates a test signal according to the test parameter, reads the display picture data from the Flash memory according to the display picture parameter, and transmits the test signal and the display picture data to the output interface; the output interface transmits the test signal and the display picture data to the liquid crystal module; the monitoring unit is used for monitoring the test signal output by the output interface, and if the test signal is abnormal, the power supply to the device is closed and an alarm signal is sent.
Optionally, the output interface includes a first output interface and a second output interface, where the first output interface outputs RGB driving signals and clock control signals, and the second output interface outputs RGB driving signals.
Optionally, a fool-proof assembly is arranged on the output interface.
Optionally, the liquid crystal module aging testing device further includes: the liquid crystal module aging test device is connected with an LAN (local area network) port and a USB (universal serial bus) interface of an upper computer, wherein the display picture data is downloaded from the upper computer to the Flash memory through the LAN port; and the test parameters are downloaded from the upper computer to the aging storage test device of the liquid crystal module through the LAN port.
Optionally, the liquid crystal module aging testing equipment comprises a plurality of liquid crystal module aging testing devices, and the liquid crystal module aging testing devices are connected and networked with the upper computer through a router and the LAN port.
Optionally, the test parameters include: the device comprises a voltage set value, a voltage maximum and minimum protection value, a current maximum and minimum protection value, power supply time sequence time, clock frequency, a horizontal clock, a vertical clock, front and rear edge time, picture editing, a picture main code, RGB signal output variables and picture waiting time.
Optionally, the liquid crystal module aging test equipment further includes: a flexible printed circuit board; a ROM substrate; the test signal and the display picture data output by the output interface are transmitted to the ROM substrate through the flexible printed circuit board; the ROM substrate is connected with the liquid crystal module to be tested, and can be configured according to the requirements of the ports of the liquid crystal module to be tested.
Optionally, the liquid crystal module aging testing equipment further comprises an installation part for installing the liquid crystal module to be tested on the equipment, wherein the installation part comprises: the tray is used for placing the liquid crystal module to be tested; the signal port contact is used for connecting the module to be tested with a corresponding port of the ROM substrate in a signal mode; and the positioning device is used for positioning the module to be tested at the position of the corresponding port of the ROM substrate.
The invention has the following beneficial effects:
1. the aging test equipment for the liquid crystal module can realize the cascade connection of at least 40 aging test devices for the liquid crystal module, and perform centralized control and real-time monitoring on the aging test devices, the aging test devices for the liquid crystal module can be randomly replaced, the actual position of the aging test device for the liquid crystal module can be ensured to be always matched with the display position in software, a user can conveniently control, update and monitor the equipment, the update time is saved, and the service condition of each aging test device is better monitored in real time.
2. The liquid crystal module aging test equipment provided by the invention is provided with the fool-proof assembly, so that the situation of short circuit caused by direction errors during plugging can be avoided, and meanwhile, the fool-proof assembly adopts a contact mode of left and right buckles, so that the contact is more reliable.
3. The liquid crystal module aging test device provided by the invention is provided with the monitoring unit, and the liquid crystal module aging test device and the connected liquid crystal module to be tested can be effectively protected by monitoring the voltage and the current of the output port in real time, so that the liquid crystal module aging test device and the liquid crystal module to be tested are protected from being damaged.
Drawings
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of a liquid crystal module aging test apparatus according to an embodiment of the present invention;
fig. 2 is a plan view showing a liquid crystal module burn-in test apparatus according to an embodiment of the present invention.
Fig. 3 is a front view showing a liquid crystal module burn-in test apparatus according to an embodiment of the present invention.
Fig. 4 shows a software interface of the liquid crystal module aging test apparatus according to an embodiment of the present invention.
It should be noted that the drawings herein are not drawn to scale and are for illustrative purposes only and, therefore, should not be taken as limiting or restricting the scope of the present invention in any way. In the drawings, like elements are identified with like reference numerals.
Detailed Description
In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of one or more embodiments. It may be evident, however, that such embodiment(s) may be practiced without these specific details.
In order to more clearly illustrate the invention, the invention is further described below with reference to preferred embodiments and the accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
As shown in fig. 1 to 4, an embodiment of the present invention provides a liquid crystal module burn-in test apparatus, including: the aging chamber at least comprises an IP channel 10, at least one liquid crystal module aging test device 20, a plurality of liquid crystal module aging test devices, for example 40, and an IP storage chip 30 which is positioned on the IP channel 10 in the aging chamber and is arranged corresponding to the liquid crystal module aging test device 20. The liquid crystal module to be tested is a TFT-LCD liquid crystal module, for example. The IP storage chip 30 and the IP channel 10 realize signal communication; the IP memory chip 30 is configured to provide an independent IP address for the liquid crystal module burn-in apparatus 20. It can be understood that when a plurality of liquid crystal module aging test devices are included, a plurality of IP memory chips are correspondingly included, and each IP memory chip provides an independent IP address for each liquid crystal module aging test device. It is further preferred that the IP memory chip is 24AA025UIDT, and those skilled in the art will understand that the IP memory chip can also be a chip known in the art that can be used to provide a separate IP address for the lcd module burn-in tester.
The working principle of the aging test equipment for the liquid crystal module provided by the embodiment is as follows: the liquid crystal module aging test device 20 receives a downloaded program and set parameters from software of an upper computer (not shown in the figure), configures corresponding output parameters (each voltage, clock frequency, picture pictures and the like), receives an external control command of the upper computer or a key to start output to drive the TFT-LCD liquid crystal module 40, performs functions of picture switching, automatic cycle switching, automatic closing, starting and the like, and completes signal driving of the TFT-LCD liquid crystal module according to the setting in the high-temperature aging process.
When damage appears in LCD module aging testing equipment, when will changing or maintaining, need take out LCD module aging testing equipment from ageing cavity, LCD module aging testing equipment among the prior art is when changing the position, can lead to LCD module aging testing device actual position in ageing cavity and the IP position that shows in the software not match, can appear software interface promptly and still show the IP position, and the LCD module aging testing device that this IP position corresponds has changed the position or has been changed in fact, need distinguish LCD module aging testing device again, thereby lead to the user can't carry out real time monitoring to each aging testing device's in-service behavior. The application can realize the cascade connection of at least 40 liquid crystal module aging test devices by the IP memory chips arranged in the aging chamber, and carry out centralized control and real-time monitoring On the devices, carry out centralized Power On/off and centralized and simultaneous updating of programs (as shown in figure 4, for example, the liquid crystal module aging test devices corresponding to a plurality of IP memory chips such as F1-1, F1-2, F1-3, F1-4, F1-5 and the like are updated simultaneously), carry out single-layer control On cascade equipment for selection and the like, wherein F1-1 is the IP address of a single IP memory chip, the liquid crystal module aging test devices can be replaced at will by the IP memory chips arranged in the aging chamber without additionally distinguishing each liquid crystal module aging test device, the IP addresses can be distinguished only by connecting the liquid crystal module aging test devices with the IP memory chips, the method can ensure that the actual position of the aging test device of the liquid crystal module is always matched with the IP position displayed in the software, is more flexible to operate, facilitates the control, update and monitoring of equipment by a user, saves the update time, and better monitors the service condition of each aging test device in real time.
In some optional implementations of the present embodiment, as shown in fig. 1 to 4, the liquid crystal module aging test apparatus 20 includes: the device comprises a random access memory 21, a Flash memory 22, a microprocessor 23, an FPGA24, an output interface 25 and a monitoring unit 26, wherein the Flash memory 22 stores display picture data of the liquid crystal module received from an upper computer; the microprocessor 23 calls the test parameters and the display picture parameters from the upper computer from the random access memory 21 and transmits the test parameters and the display picture parameters to the FPGA 24; the FPGA24 generates a test signal according to the test parameter, reads the display picture data from the Flash memory 22 according to the display picture parameter, and transmits the test signal and the display picture data to the output interface 25; the output interface 25 transmits the test signal and the display image data to the liquid crystal module 40 to be tested; the monitoring unit 26 is configured to monitor the test signal output by the output interface 25, and if an abnormality is found, turn off power supply to the liquid crystal module aging test apparatus 20 and send an alarm signal.
The upper computer provides the transmission of the editing control signal and transmits the editing control signal to the liquid crystal module aging test device 20. The upper computer software provides an editing interface to set liquid crystal module testing parameters required by the liquid crystal module, and the liquid crystal module testing parameters mainly comprise voltage set values, voltage maximum and minimum protection values, current maximum and minimum protection values, power supply time sequence time, clock frequency, horizontal clock, vertical clock, front and back edge time, picture editing, picture Main Code, Code, RGB signal output variables, picture waiting time and the like required by the module. The upper computer can set and select the aging test device 20 needed in the aging chamber, so that the aging test device 20 with single-layer, multi-layer or all connection can perform the following operations: updating a single chip microcomputer program, updating a FPGA programmable logic device program, emptying BMP pictures, downloading and storing the BMP pictures into Flash, downloading and updating Module and pattern parameters, and reading a program version when downloading is finished. The online real-time control can select a single layer or all of the aging test devices 20 to be started, closed, and cyclically pause the screen through a software interface.
The monitoring unit monitors three groups of voltages and 12 currents of four groups of output ports in real time, reads and displays output voltages and consumed currents of the TFT-LCD liquid crystal module on each group of output ports, and comprises (VSHD, VSHA, VBL, IDD1, IEE1, IBL1, IDD2, IEE2, IBL2, IDD3, IEE3, IBL3, IDD4, IEE4 and IBL4), the read and monitored voltages and currents are transmitted to upper computer software for recording, when the voltage or the current output by the ports is detected to exceed a set protection value, the testing device closes a channel exceeding the set protection value, and transmits an alarm signal to the upper computer software for displaying to a tester. And clearing the alarm signal or manually closing the aging test device by the upper computer and then removing the alarm. Therefore, the damage of large current to the aging test equipment or the TFT-LCD liquid crystal module when the equipment voltage is abnormal or the output end is short-circuited can be reduced, and particularly, the danger of open fire possibly caused by the large current of the output end in a long time is avoided, so that the equipment and the connected TFT-LCD liquid crystal module are effectively protected, and safer protection is brought to the use of customers.
In some optional implementations of the present embodiment, the liquid crystal module aging test apparatus 20 further includes: connecting the liquid crystal module aging test device 20 with a LAN port and a USB interface 27 of an upper computer, wherein the display picture data is downloaded from the upper computer to the Flash memory 22 through the LAN port and the USB interface 27; and the test parameters are downloaded from the upper computer to the liquid crystal module aging test device 20 through the LAN port. In the preferred embodiment, the aging test device for the liquid crystal module adopts a LAN port and a USB port to realize complementation. The large data transmission such as image data transmission can be realized through a LAN port. Further preferably, when the aging test equipment for the liquid crystal modules comprises a plurality of aging test devices for the liquid crystal modules, the aging test devices for the liquid crystal modules connect the wireless router and the LAN port to the TP-Link through network cables and then connect the wireless router and the LAN port to the upper computer for networking, so that a single upper computer can simultaneously control and operate a plurality of aging test devices for the liquid crystal modules, a large amount of manpower and material resources can be saved, and convenience is brought to customers to use the aging test devices for the logging modules in the preferred embodiment.
The USB port of the liquid crystal module aging test device can also be connected to an upper computer through a USB line to realize the control, read and write operation of the liquid crystal module aging test device. It can send various commands to turn on and off the device, switch pictures, skip pictures, write required commands and characters into the chip, rewrite modification of network IP, read relevant parameters of the chip, read program version, write Module parameter reading (Module name, clock parameter). Only the PRG program is required to output the monitored variable and can be read and displayed through the software set by the USB, so that the monitoring and debugging of the equipment are facilitated for debugging personnel. Especially, the USB port is used for modifying the IP written in the IP storage chip, so that the configuration of an external dial switch can be saved, and convenience is provided for the use of the testing device. The client can modify the IP address of the configured IP memory chip according to the requirement, namely, the IP address of the device and the software in the high-temperature aging chamber can be conveniently placed for matching.
In some optional implementations of this embodiment, the output interface 25 includes a first output interface 251 and a second output interface 252, wherein the first output interface 251 outputs RGB driving signals and clock control signals; the second output interface 252 outputs RGB driving signals for use by a high resolution Dual module. In the subsequent measurement, as shown in fig. 1, the first output interface 251 and the second output interface 252 are a first set of output interfaces, and the output signals are transmitted to a liquid crystal module 40 to be tested; the third output interface 253 and the fourth output interface 254 are a second set of output interfaces, and output signals are transmitted to another liquid crystal module 40 under test. Fig. 1 schematically shows two sets of output interfaces corresponding to two modules to be tested. However, as can be understood by those skilled in the art, the invention can be provided with a plurality of output interfaces, each testing device corresponds to a plurality of liquid crystal modules to be tested, and because of the use of the LAN between the testing device and the upper computer, one upper computer can control a plurality of testing devices, so that through the scheme of the invention, one upper computer can simultaneously test more liquid crystal modules to be tested than the existing testing system.
In some optional implementation manners of this embodiment, a fool-proof assembly (not shown in the drawings) is disposed on the output interface, for example, fool-proof connectors FI-RE51 and FI-RE41 series, so that a short circuit caused by a direction error during plugging can be avoided, and meanwhile, the fool-proof assembly adopts a contact manner of left and right buckles, which is more reliable and more beneficial to plugging.
In one specific example, the microprocessor 23 in the testing device is implemented by a single chip microcomputer, and more preferably, a single chip microcomputer of the model STM32F407 IE.
In one particular example, the FPGA24 employs a seling Spartan6 FPGA chip.
In one specific example, random access memory 21 employs 2 DDR3 memory.
In one specific example, the Flash memory 22 employs 2 Flash memory chips.
By adopting 2G Flash storage devices, 60 large-resolution BMP pictures can be provided, and convenience is provided for clients to correspond to various machines. The BMP is recorded at one time, the needed BMP picture can be directly called as required when the model is switched, the BMP with the needed size is manufactured by software when the model corresponds to the complex picture, and the BMP is downloaded to a testing device and stored in Flash, and the BMP can be displayed on a liquid crystal module after being called out when in use. The method is realized without language description in the FPGA by engineering personnel, and can be realized by general personnel through guidance and training, thereby bringing great convenience to customers.
The single chip 23, the FPGA chip 24, the DDR3 memory 21 and the FLASH memory chip 22 form a microcomputer memory control system. The part is a brain of a hardware part, all parts are connected through an STM32F407IE single chip microcomputer 23 to realize coordination work, the STM32F407IE single chip microcomputer 23 is loaded and operated according to a downloaded storage program after the equipment is powered on and started, and set power supply parameters of the TFT-LCD liquid crystal module 40 are sent to a power supply device to be configured to required voltage and all limited parameters. The STM32F407IE single chip microcomputer 23 transmits the read picture parameters to be configured of the TFT-LCD liquid crystal module 40 to the sailing Spartan6 FPGA chip 24, so that the FPGA chip 24 loads and reads the BMP in the FLASH memory 22. The STM32F407IE single chip 23 monitors and receives commands from external ports such as LAN port & USB port 27 and keys, and coordinates the functions of the devices (program download, FLASH clear, frame output including built-in and BMP frames, Power On signal output according to the set timing requirement, Power off signal off according to the set timing requirement, previous frame switching, next frame switching, automatic frame cycle output display according to sequence, automatic off start cycle after setting fixed frame sequence, and keeping frame display according to fixed set time).
The testing device in the embodiment supports Dual signal ports, is suitable for corresponding TFT-LCD liquid crystal modules with high resolution such as FULL HD and the like, and has wider practical range. In the current high resolution direction, many TFT-LCD liquid crystal manufacturers need the equipment corresponding to the FULL HD so as to detect whether the corresponding factory TFT-LCD liquid crystal module is qualified or not.
In one particular example, the measurement device further includes a signal distribution buffer substrate 28 for providing a desired operating voltage for the burn-in test device 30. The distribution buffer substrate 28 supplies the input +12V and ± 24V converted operating voltages to the respective chips on the device.
The signal distribution buffer substrate can realize DC-DC input conversion, and convert the input +12V and + -24V to various working voltages (+5V, +3.3V, +1.5V, +1.2V and the like) required by a chip of the burn-in test equipment, and automatically adjust the voltage output according to the setting requirement according to the received setting parameters, and the signal distribution buffer substrate comprises the following steps: VSHD (+1.6 to +12V), VSHA (+1.6 to +12V), VGH (+1 to +30V), VGL (-2 to-30V), VLED (+2 to +36V), and +12V, and these voltages are simultaneously distributed to 4 output ports. The signal distribution buffer substrate can simultaneously distribute signals on the testing device to a plurality of output ports, and the signals comprise (clock frequency, horizontal clock, vertical clock, enable clock, R (2-9), G (2-9), B (2-9), R (12-19), G (12-19), B (12-19) signals, SPI communication signals, I2C signals and the like, so that a plurality of TFT-LCD liquid crystal modules can be simultaneously driven.
In some optional implementations of this embodiment, as shown in fig. 2 to 3, the liquid crystal module aging test apparatus further includes: a flexible printed circuit board 50 and a ROM substrate 60; wherein the test signal and the display picture data outputted from the output interface 25 are transmitted to the ROM substrate 60 through the flexible printed circuit board 50;
the ROM substrate 60 is connected to the liquid crystal module 40 to be tested, and can be configured according to the requirements of the ports of the liquid crystal module to be tested. The ROM signal conversion switching substrate manufactured according to different module port designs can be newly designed according to different module port requirements (LVDS chips, constant current loops, voltage stabilizing loops, redistribution of power supplies and test points can be added). Therefore, the device has more flexibility, can correspond to TFT-LCD liquid crystal modules with different interfaces, and can be widely applied to small and medium TFT-LCD liquid crystal module mobile phone screens and vehicle-mounted screens.
In some optional implementation manners of this embodiment, the liquid crystal module aging testing apparatus further includes an installation part for installing the liquid crystal module to be tested on the apparatus, where the installation part includes:
the tray is used for placing the liquid crystal module to be tested; the proper placing support plate can be designed according to the size and the shape of the TFT-LCD liquid crystal module.
When the test part of the liquid crystal module is electrically connected with equipment, the crimping is very important for the TFT-LCD liquid crystal module and the signal connection, and the crimping dislocation can cause short circuit and burn the module or the equipment when the equipment is opened. If the pressure of the pressure welding probe is too large, the FPC golden finger of the TFT-LCD liquid crystal module can be damaged.
Therefore, in order to avoid poor crimping and improve the success rate of crimping, the mounting part also comprises a signal port contact part which is used for performing signal connection between the module to be tested and the corresponding port of the ROM substrate; the convenience of connecting the TFT-LCD liquid crystal module to the ROM substrate from top to bottom is taken into consideration, and various connection modes are designed, including golden finger FPC compression joint, probe compression joint, half-contact B to B, full-contact, FPC putting-in connector and the like.
Meanwhile, in order to further ensure the reliability of contact, the mounting part also comprises a positioning device which is used for positioning the module to be tested at the position of the corresponding port of the ROM substrate. The positioning device can be precisely aligned in a manner known to those skilled in the art, for example, by using a positioning pin, a positioning block, a groove, an anti-oblique device, and the like.
In the description of the present invention, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
It is further noted that, in the description of the present invention, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.
Claims (10)
1. The utility model provides a liquid crystal module aging testing equipment which characterized in that includes:
the aging chamber at least comprises an IP channel;
at least one liquid crystal module aging test device;
the IP storage chip is positioned on the IP channel in the aging chamber and is arranged corresponding to the liquid crystal module aging test device, and signal communication is realized between the IP storage chip and the IP channel;
the IP storage chip is configured to provide independent IP addresses for the liquid crystal module aging test device.
2. The apparatus of claim 1, wherein the IP memory chip has a model number of 24AA025 UIDT.
3. The liquid crystal module aging testing apparatus of claim 1, wherein the liquid crystal module aging testing device comprises:
random access memory, Flash memory, microprocessor, FPGA, output interface and monitoring unit
The Flash memory stores the display picture data of the liquid crystal module received from the upper computer;
the microprocessor calls the test parameters and the display picture parameters from the upper computer from the random access memory and transmits the test parameters and the display picture parameters to the FPGA;
the FPGA generates a test signal according to the test parameter, reads the display picture data from the Flash memory according to the display picture parameter, and transmits the test signal and the display picture data to the output interface;
the output interface transmits the test signal and the display picture data to the liquid crystal module;
the monitoring unit is used for monitoring the test signal output by the output interface, and if the test signal is abnormal, the power supply to the device is closed and an alarm signal is sent.
4. The apparatus of claim 3, wherein the output interface comprises a first output interface and a second output interface, wherein the first output interface outputs RGB driving signals and clock control signals, and the second output interface outputs RGB driving signals.
5. The aging test equipment for liquid crystal modules as claimed in claim 3, wherein the output interface is provided with a fool-proof component.
6. The liquid crystal module aging testing apparatus of claim 3, wherein the liquid crystal module aging testing device further comprises:
the LAN port and the USB interface are connected with the liquid crystal module aging test device and the upper computer,
the display picture data is downloaded from the upper computer to the Flash memory through the LAN port;
and the test parameters are downloaded from the upper computer to the liquid crystal module aging test device through the LAN port.
7. The liquid crystal module aging testing equipment of claim 6, wherein the liquid crystal module aging testing equipment comprises a plurality of liquid crystal module aging testing devices, and the plurality of liquid crystal module aging testing devices are connected and networked with the upper computer through a router and the LAN port.
8. The liquid crystal module burn-in apparatus of any one of claims 3-7, wherein the test parameters include: the device comprises a voltage set value, a voltage maximum and minimum protection value, a current maximum and minimum protection value, power supply time sequence time, clock frequency, a horizontal clock, a vertical clock, front and rear edge time, picture editing, a picture main code, RGB signal output variables and picture waiting time.
9. The liquid crystal module burn-in apparatus of claim 1, wherein the liquid crystal module burn-in apparatus further comprises:
a flexible printed circuit board;
a ROM substrate; wherein
The test signal and the display picture data output by the output interface are transmitted to the ROM substrate through the flexible printed circuit board;
the ROM substrate is connected with the liquid crystal module to be tested, and can be configured according to the requirements of the ports of the liquid crystal module to be tested.
10. The liquid crystal module aging testing apparatus of claim 1, further comprising a mounting part for mounting a liquid crystal module to be tested on the apparatus, the mounting part comprising:
the tray is used for placing the liquid crystal module to be tested;
the signal port contact is used for connecting the module to be tested with a corresponding port of the ROM substrate in a signal mode;
and the positioning device is used for positioning the module to be tested at the position of the corresponding port of the ROM substrate.
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| CN202010057614.9A CN111063283A (en) | 2020-01-19 | 2020-01-19 | Liquid crystal module aging testing equipment |
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| CN202010057614.9A CN111063283A (en) | 2020-01-19 | 2020-01-19 | Liquid crystal module aging testing equipment |
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| CN114563882A (en) * | 2022-01-19 | 2022-05-31 | 业成科技（成都）有限公司 | Liquid crystal module aging test system |
| CN115662492A (en) * | 2022-12-26 | 2023-01-31 | 合肥康芯威存储技术有限公司 | Mass production test method and device for data storage equipment |
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