CN114563882A - Liquid crystal module aging test system - Google Patents
Liquid crystal module aging test system Download PDFInfo
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- CN114563882A CN114563882A CN202210061821.0A CN202210061821A CN114563882A CN 114563882 A CN114563882 A CN 114563882A CN 202210061821 A CN202210061821 A CN 202210061821A CN 114563882 A CN114563882 A CN 114563882A
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- 230000032683 aging Effects 0.000 title claims abstract description 158
- 238000012360 testing method Methods 0.000 title claims abstract description 128
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 105
- 238000012544 monitoring process Methods 0.000 claims abstract description 55
- 238000003860 storage Methods 0.000 claims description 20
- 230000002159 abnormal effect Effects 0.000 claims description 14
- 238000004891 communication Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 abstract description 11
- 230000002349 favourable effect Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000007405 data analysis Methods 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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Abstract
The invention relates to a liquid crystal module aging test system. This liquid crystal module aging testing system includes: the aging test board is used for connecting the liquid crystal module and carrying out aging test on the liquid crystal module; the aging test board is provided with a WiFi module; and the aging monitoring server is communicated with the WiFi module, the WiFi module is used for transmitting aging test data to the aging monitoring server, and the aging monitoring server is used for monitoring the aging test data of the liquid crystal module in real time. Above-mentioned liquid crystal module aging testing system, the liquid crystal module carries out aging testing after being connected with the aging testing board, among the aging testing process, utilize the wiFi module to convey aging testing data to aging monitoring server in real time to utilize aging monitoring server to carry out real time monitoring to the aging testing process of liquid crystal module, can in time discover the bad phenomenon of device, be favorable to avoiding liquid crystal module and aging testing board to damage, get rid of the potential safety hazard that produces naked light because generate heat.
Description
Technical Field
The invention relates to the technical field of liquid crystal display, in particular to a liquid crystal module aging test system.
Background
A TFT-LCD (Thin film transistor liquid crystal display) liquid crystal module requires an burn-in test board for burn-in test. When the aging test is carried out, the aging test board is connected with the liquid crystal module to be tested, so that the liquid crystal module is lightened, and various data in the working process of the liquid crystal module are collected. However, the burn-in test process cannot be monitored in real time, and when a large current is caused due to poor devices, the liquid crystal module and the burn-in test board may be damaged, or even open fire may be generated due to heat generation.
Disclosure of Invention
Therefore, it is necessary to provide an aging test system for a liquid crystal module, which can improve the above-mentioned defects, in order to solve the problem in the prior art that when a large current is caused due to a defective device or the like in the aging test process for the liquid crystal module, the liquid crystal module and the aging test board may be damaged, or even the potential safety hazard of open fire due to heat generation may be generated.
A liquid crystal module aging test system includes:
the aging test board is used for connecting the liquid crystal module and carrying out aging test on the liquid crystal module; the aging test board is provided with a WiFi module; and
the aging monitoring server is communicated with the WiFi module, the WiFi module is used for transmitting aging test data to the aging monitoring server, and the aging monitoring server is used for monitoring the aging test data of the liquid crystal module in real time.
In one embodiment, the burn-in test board further comprises a display module, and the display module is used for displaying the burn-in test data of the liquid crystal module.
In one embodiment, the display module is used for displaying the voltage and/or the current of the liquid crystal module.
In one embodiment, the burn-in test board comprises a plurality of burn-in test boards which are connected with the liquid crystal modules in a one-to-one correspondence manner;
and the WiFi module of each aging test board is communicated with the aging monitoring server.
In one embodiment, the liquid crystal module aging testing system further comprises a plurality of sub-servers, the plurality of aging testing boards are divided into a plurality of groups corresponding to the plurality of sub-servers one by one, the WiFi modules of the aging testing boards in each group are communicated with one corresponding sub-server, and each sub-server is connected with the aging monitoring server.
In one embodiment, the burn-in boards comprise N, the N burn-in boards are divided into M groups, each group comprises N/M burn-in boards;
the sub-servers comprise M sub-servers, and the WiFi modules of the N/M aging test boards in each group are communicated with one corresponding sub-server;
wherein N and M are both positive integers greater than or equal to 2, and N is a multiple of M.
In one embodiment, the burn-in board further comprises an acquisition module, a storage module and a comparison module, wherein the acquisition module is connected with the WiFi module, the storage module is connected with the comparison module, and the comparison module is connected with the acquisition module and the WiFi module; the acquisition module is used for acquiring aging test data of the liquid crystal module, and the storage module is used for storing a specification data range; the comparison module is used for comparing the aging test data with the specification data range;
when the aging test data exceeds the specification data range, the comparison module sends a working abnormal signal to the aging monitoring server through the WiFi module; and when the aging test data is in the specification data range, the comparison module sends a normal working signal to the aging monitoring server through the WiFi module.
In one embodiment, the aging monitoring server is connected with a display device, and the display device is used for displaying the state of each liquid crystal module.
In one embodiment, when the aging monitoring server receives the normal working signal of any one of the liquid crystal modules, the display device displays that the corresponding liquid crystal module is in a normal state; and when the aging monitoring server receives the abnormal working signal of any one liquid crystal module, the display equipment displays that the corresponding liquid crystal module is in an abnormal state.
In one embodiment, the aging monitoring server has a storage device, and the storage device is used for storing the aging test data of each liquid crystal module received by the aging monitoring server.
Above-mentioned liquid crystal module aging testing system, liquid crystal module carries out aging testing after being connected with the aging testing board, among the aging testing process, utilize the wiFi module to carry out aging testing data transfer to aging monitoring server in real time, thereby utilize aging monitoring server to carry out real time monitoring (remote monitoring promptly) to the aging testing process of liquid crystal module, need not personnel on producing the line on duty, can in time discover the bad phenomenon of device, be favorable to avoiding liquid crystal module and aging testing board to damage, get rid of the potential safety hazard that produces naked light because generate heat.
Drawings
FIG. 1 is a schematic diagram of an aging testing system for a liquid crystal module according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an aging testing system for a liquid crystal module according to another embodiment of the present invention;
FIG. 3 is a schematic diagram of an aging testing system for a liquid crystal module according to another embodiment of the present invention;
FIG. 4 is a schematic diagram of a system for testing aging of a liquid crystal module according to another embodiment of the present invention.
Reference numerals:
100: an aging test board; 101: a WiFi module;
102: an acquisition module; 103: a storage module;
104: a comparison module; 105: a display module;
200: an aging monitoring server; 300: a sub-server;
400: a liquid crystal module is provided.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention more comprehensible, embodiments accompanying figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to implicitly indicate the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless explicitly specified otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like as used herein are for illustrative purposes only and do not denote a unique embodiment.
Referring to fig. 1, fig. 1 is a schematic diagram illustrating a principle of a liquid crystal module aging test system according to an embodiment of the invention. An embodiment of the invention provides an aging test system for a liquid crystal module, which includes an aging test board 100 and an aging monitoring server 200. The burn-in board 100 is used for connecting with the liquid crystal module 400 and performing a burn-in test on the liquid crystal module 400. That is, the burn-in board 100 can light up the liquid crystal module 400 connected thereto and acquire the burn-in test data of the liquid crystal module 400. The burn-in board 100 has a WiFi module 101. The aging monitor server 200 is in communication with the WiFi module 101. The WiFi module 101 is configured to transmit the aging test data to the aging monitoring server 200, and the aging monitoring server 200 is configured to monitor the aging test data of the liquid crystal module 400 in real time.
So, the aging test is carried out after LCD module 400 is connected with aging test board 100, in the aging test process, utilize wiFi module 101 to carry out aging test data transfer to aging monitor server 200 in real time, thereby utilize aging monitor server 200 to carry out real time monitoring (remote monitoring promptly) to the aging test process of LCD module 400, need not personnel on producing the line on duty, can in time discover the bad phenomenon of device, be favorable to avoiding LCD module 400 and aging test board 100 to damage, get rid of the potential safety hazard that produces naked light because generate heat.
In the embodiment of the invention, the burn-in board 100 further has an obtaining module 102, a storing module 103 and a comparing module 104. The obtaining module 102 is connected with the WiFi module 101, the storage module 103 is connected with the comparison module 104, and the comparison module 104 is connected with the obtaining module 102 and the WiFi module 101. The obtaining module 102 is used for obtaining the aging test data of the liquid crystal module 400, and the storing module 103 is used for storing the specification data range of the liquid crystal module 400. The comparing module 104 is configured to compare the aging test data acquired by the acquiring module 102 with the specification data range stored in the storing module 103.
When the aging test data is within the specification data range, the comparison module 104 sends a normal operation signal to the aging monitoring server 200 through the WiFi module 101. When the aging test data exceeds the specification data range, the comparison module 104 sends an abnormal operation signal to the aging monitoring server 200 through the WiFi module 101.
In this way, before the burn-in test is performed, the specification data range of the liquid crystal module 400 to be tested (the specification data range of the liquid crystal modules 400 with different specifications is different) is input to the storage module 103 for storage. In the process of performing the aging test, the obtaining module 102 obtains the aging test data of the liquid crystal module 400, and the comparing module 104 compares the aging test data with the specification data range stored in the storage module 103. If the aging test data is within the specification data range, it indicates that the liquid crystal module 400 is in a normal state, and at this time, the comparison module 104 sends a normal operation signal to the aging monitor server 200 through the WiFi module 101. If the aging test data exceeds the specification data range, it indicates that the liquid crystal module is in an abnormal state, and at this time, the comparison module 104 sends a working abnormal signal to the aging monitoring server 200 through the WiFi module 101. Meanwhile, the obtaining module 102 transmits the obtained aging test data to the aging monitoring server 200 through the WiFi module 101.
Specifically, in the embodiment, the aging monitor server 200 is connected to a display device for displaying the status of each liquid crystal module 400. Thus, the operator can visually monitor each liquid crystal module in real time through the display device of the aging monitoring server 200. Alternatively, the display device may be a display.
Further, when the aging monitoring server 200 receives a normal operation signal of any one of the liquid crystal modules 400, the display device displays that the corresponding liquid crystal module 400 is in a normal state. When the aging monitoring server 200 receives the abnormal operation signal of any one of the liquid crystal modules 400, the display device displays that the corresponding liquid crystal module 400 is in an abnormal state. Thus, the operator can clearly and timely grasp the operating status of each liquid crystal module 400 through the display device. Alternatively, the display device may distinguish the normal state and the abnormal state by different colors. For example, when the liquid crystal module 400 is in a normal state, green is displayed; when the liquid crystal module 400 is in an abnormal state, red color is displayed.
In an embodiment, the aging monitor server 200 further has a storage device, and the storage device is used for storing the aging test data of each liquid crystal module 400 received by the aging monitor server 200. Therefore, the aging test data of each liquid crystal module 400 in the aging test process is stored by using the storage device, so that the data can be conveniently subjected to big data analysis subsequently, the design optimization of the liquid crystal module 400 is assisted, the performance of the liquid crystal module 400 is favorably improved, and the cost of the liquid crystal module 400 is reduced. Optionally, the storage device may be a cloud storage device to facilitate retrieval of data for big data analysis.
Referring to fig. 2, in the embodiment of the invention, the burn-in board 100 further has a display module 105, and the display module 105 is used for displaying the burn-in data of the liquid crystal module 400, so that the display module 105 of the burn-in board 100 can be used for monitoring the burn-in data of the liquid crystal module 400 in real time (i.e. line monitoring). Thus, when the aging monitor server 200 monitors and finds that the lcd module 400 is abnormal, the operator can check the aging test parameters of the lcd module 400 displayed by the display module 105 of the aging test board 100 on the production line, so that the operator can timely eliminate the abnormality or stop the test. Alternatively, the burn-in test data may be a voltage and a current. Of course, the aging test data may also include other indicators, such as whether the liquid crystal module 400 itself displays normal or black screen, and the like, which is not limited herein.
Preferably, the display module 105 is used for displaying the voltage and/or current of the liquid crystal module 400. Of course, the display module 105 may also display other aging test data, and is not limited herein.
Referring to fig. 3, in the embodiment of the invention, the burn-in board 100 includes a plurality of burn-in boards 100, and the plurality of burn-in boards 100 are connected to the plurality of liquid crystal modules 400 in a one-to-one correspondence. The WiFi module 101 of each burn-in board 100 is in communication with the burn-in monitoring server 200. Thus, the aging test can be performed on the plurality of liquid crystal modules 400 at the same time, and the aging monitoring server 200 can be used to monitor the plurality of liquid crystal modules 400 at the same time in real time.
When the number of the liquid crystal modules 400 that need to perform the burn-in test at the same time is large, the WiFi modules 101 of the corresponding number of burn-in test boards 100 transmit data to the burn-in monitoring server 200 at the same time, that is, the burn-in monitoring server 200 needs to receive the data transmitted by the WiFi modules 101 of each burn-in test board 100 at the same time, which is prone to data accumulation or data errors due to insufficient data transmission capability. Referring to fig. 4, to solve the problem, in an embodiment, the liquid crystal module burn-in test system further includes a plurality of sub-servers 300 connected to the burn-in monitoring server 200. The burn-in boards 100 are divided into a plurality of groups corresponding to the sub-servers 300 one by one, and the WiFi modules 101 of each burn-in board 100 in each group are all in communication with a corresponding sub-server 300. In this way, the WiFi modules 101 of the burn-in boards 100 in each group transmit the burn-in test data to the corresponding sub-servers 300, and then the sub-servers 300 transmit the burn-in test data received by the sub-servers to the burn-in monitoring server 200. That is, each sub-server 300 is used to receive the burn-in test data of the burn-in test board 100 in the corresponding group first, so that the burn-in monitoring server 200 only needs to receive the burn-in test data transmitted by each sub-server 300 at the same time, and the data transmission is smoother, safer and more reliable. Alternatively, a wired connection may be used between each sub-server 300 and the aging monitor server 200, and a wireless connection may also be used, which is not limited herein.
Further, the burn-in boards 100 include N, and the N burn-in boards 100 are divided into M groups. Each group includes N/M burn-in boards 100, and each burn-in board 100 is used to connect one lcd module 400, i.e. the burn-in test can be performed on N lcd modules 400 simultaneously. The sub-server 300 comprises M, and the WiFi modules 101 of the N/M burn-in boards 100 in each group are all in communication with a corresponding sub-server 300. Wherein N and M are both positive integers greater than or equal to 2, and N is a multiple of M. Thus, the aging monitor server 200 only needs to receive the data transmitted by the M sub-servers 300 at the same time, thereby reducing the pressure of data transmission and ensuring smooth, safe and reliable data transmission.
In one embodiment, the burn-in boards 100 include 500, and 500 burn-in boards 100 are divided into 10 groups, each group including 50 burn-in boards 100. At this time, the sub-servers 300 include 10, and the WiFi modules 101 of 50 burn-in boards 100 in each group are all in communication with a corresponding sub-server 300. The 10 sub-servers 300 are each connected to the aging monitor server 200. Of course, the number of the burn-in boards 100 is not limited to 500, and is determined according to the number of the liquid crystal modules 400 to be tested for burn-in, and is not limited herein.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A liquid crystal module aging test system is characterized by comprising:
the aging test board is used for being connected with the liquid crystal module and carrying out aging test on the liquid crystal module; the aging test board is provided with a WiFi module; and
the aging monitoring server is communicated with the WiFi module, the WiFi module is used for transmitting aging test data to the aging monitoring server, and the aging monitoring server is used for monitoring the aging test data of the liquid crystal module in real time.
2. The system for testing the aging of the liquid crystal module as set forth in claim 1, wherein the aging test board further comprises a display module for displaying the aging test data of the liquid crystal module.
3. The system for testing the aging of a liquid crystal module as claimed in claim 2, wherein the display module is used for displaying the voltage and/or current of the liquid crystal module.
4. The system according to claim 1, wherein the burn-in board comprises a plurality of burn-in boards, and the plurality of burn-in boards are connected with the plurality of liquid crystal modules in a one-to-one correspondence;
and the WiFi module of each aging test board is communicated with the aging monitoring server.
5. The system according to claim 4, further comprising a plurality of sub-servers, wherein the plurality of burn-in boards are divided into a plurality of groups corresponding to the plurality of sub-servers, the WiFi modules of the plurality of burn-in boards in each group are in communication with a corresponding one of the sub-servers, and each of the sub-servers is connected to the burn-in monitoring server.
6. The system for testing the aging of a liquid crystal module as set forth in claim 5, wherein the number of the aging test boards is N, the N aging test boards are divided into M groups, each group includes N/M aging test boards;
the sub-servers comprise M sub-servers, and the WiFi modules of the N/M aging test boards in each group are communicated with one corresponding sub-server;
wherein N and M are both positive integers greater than or equal to 2, and N is a multiple of M.
7. The system for testing the aging of a liquid crystal module as set forth in claim 1, wherein the aging test board further comprises an acquisition module, a storage module and a comparison module, the acquisition module is connected with the WiFi module, the storage module is connected with the comparison module, and the comparison module is connected with the acquisition module and the WiFi module; the acquisition module is used for acquiring aging test data of the liquid crystal module, and the storage module is used for storing a specification data range; the comparison module is used for comparing the aging test data acquired by the acquisition module with the specification data range stored by the storage module;
when the aging test data exceeds the specification data range, the comparison module sends a working abnormal signal to the aging monitoring server through the WiFi module; and when the aging test data is in the specification data range, the comparison module sends a normal working signal to the aging monitoring server through the WiFi module.
8. The aging test system for liquid crystal modules according to claim 7, wherein a display device is connected to the aging monitor server, and the display device is used for displaying the status of each liquid crystal module.
9. The aging test system for liquid crystal modules according to claim 8, wherein when the aging monitor server receives the normal operation signal of any one of the liquid crystal modules, the display device displays that the corresponding liquid crystal module is in a normal state; and when the aging monitoring server receives the abnormal working signal of any one liquid crystal module, the display equipment displays that the corresponding liquid crystal module is in an abnormal state.
10. The aging test system for liquid crystal modules as claimed in claim 1, wherein the aging monitor server has a storage device for storing the aging test data of each of the liquid crystal modules received by the aging monitor server.
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