CN108037525B - It is a kind of that the device detected jointly being imaged for mass spectrum and optoelectronic speed - Google Patents
It is a kind of that the device detected jointly being imaged for mass spectrum and optoelectronic speed Download PDFInfo
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- CN108037525B CN108037525B CN201711225994.7A CN201711225994A CN108037525B CN 108037525 B CN108037525 B CN 108037525B CN 201711225994 A CN201711225994 A CN 201711225994A CN 108037525 B CN108037525 B CN 108037525B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
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Abstract
It is a kind of that the device detected jointly being imaged for mass spectrum and optoelectronic speed, it is related to mass spectrum and photoelectronic imaging.Equipped with mass spectrum MCP detector, optoelectronic speed imaging lens system, imaging detection system, the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device, the 3rd spiral straight line inducting device, the 1st sliding rail and the 2nd sliding rail；The mass spectrum MCP detector is connected with the 3rd spiral straight line inducting device, the 3rd spiral straight line inducting device adjusts the vertical height of imaging detection system, 1st spiral straight line inducting device, the 2nd spiral straight line inducting device are connected with optoelectronic speed imaging lens system, it rotates the 1st spiral straight line inducting device and the 2nd spiral straight line inducting device adjusts the horizontal position of optoelectronic speed imaging lens system, optoelectronic speed imaging lens system is located on the 1st sliding rail and the 2nd sliding rail.
Description
Technical field
The present invention relates to mass spectrum and photoelectronic imagings, are imaged jointly more particularly, to one kind for mass spectrum and optoelectronic speed
The device of detection.
Background technique
Cluster is widely present in nature and the practical activity of the mankind, at present the research of cluster science is concentrated on visiting
Study carefully composition, geometry electronic structure and response characteristic of cluster etc. ([1] Le ó n I, Yang Z, Liu HT, Wang LS.The
Design and Construction of a High-Resolution Velocity-Map Imaging Apparatus
for Photoelectron Spectroscopy Studies of Size-Selected Clusters[J].Rev Sci
Instrum.2014,85 (8)), flight time mass spectrum can directly make weather observations the Mass Distribution of cluster ions, according to its mass spectrum
The relative intensity at peak can also judge the stability of various sizes of cluster, imitate in terms of determining ion component and reactivity
Fruit is significant, but mass spectrum cannot directly give the electronics integrated structure information of substance, need to be used in conjunction from different spectrum methods, pass through
The photoelectron spectroscopy that optoelectronic speed is imaged can obtain the electron affinity of central element or cluster, excited electronic state
Excitation energy, also can get vibration fine structure ([2] Yandell MA, the King SB, Neumark of electronic state sometimes
DM.Time-Resolved Radiation Chemistry:Photoelectron Imaging of Transient
Negative Ions of Nucleobases[J].J Am Chem Soc.2013,135(6):2128-31).Flight time matter
The combination of spectrum and optoelectronic speed imaging then meets determining cluster type and obtains the double requirements of substance electronic structure information.
Currently, the design of flight time mass spectrum optoelectronic speed imager both at home and abroad, is mostly that mass detector is placed in light
The desorption point a certain position in front, obtains after determining mass number ion, repels other ions by quality gate and pass through or pass through calculating
The time application pulse for obtaining reaching light desorption point comes light desorption a certain specific ion ([3] Tang Zichao, Liu Zhiling, Xie Hua, generation
A kind of conllinear formula imaging detector [P] Chinese patent for ion imaging of space: CN 205139397 U, 2016-04-06).
Quality gate has three pieces electrode slice composition more, and wherein two panels has aperture plate, this will cause the loss of amount of ions, and by calculating
The mode for applying pulse to the time is then tested every time to be both needed to calculate and need to carry out time sweep near the time calculating accurately to take off
It is attached.In addition, both the above method all cannot really show the species and signal quality information that ion is located at light desorption point.
Summary of the invention
To solve the above-mentioned problems, the purpose of the present invention is to provide can light be desorbed point measurement mass signal but also
A kind of device detected jointly for mass spectrum and optoelectronic speed imaging that point carries out light desorption electronic imaging is desorbed in light.
It is straight that the present invention is equipped with mass spectrum MCP detector, optoelectronic speed imaging lens system, imaging detection system, the 1st spiral
Line inducting device, the 2nd spiral straight line inducting device, the 3rd spiral straight line inducting device, the 1st sliding rail and the 2nd sliding rail；The mass spectrum MCP detection
Device is connected with the 3rd spiral straight line inducting device, the vertical height of the 3rd spiral straight line inducting device adjusting imaging detection system, and the 1st
Spiral straight line inducting device, the 2nd spiral straight line inducting device are connected with optoelectronic speed imaging lens system, rotate the 1st spiral straight line
Inducting device and the 2nd spiral straight line inducting device adjust the horizontal position of optoelectronic speed imaging lens system, optoelectronic speed imaging
Lens system is located on the 1st sliding rail and the 2nd sliding rail.
The optoelectronic speed imaging lens system is equipped with reference electrode piece and three acceleration electrode slices.
The imaging detection system is equipped with MCP, fluorescent screen and CCD camera.
Spiral straight line inducting device is equipped with 3, including the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device and the 3rd spiral shell
Straight line inducting device is revolved, a spiral straight line inducting device is connected with mass spectrum MCP detector, for controlling its vertical lift, in addition two
A spiral straight line inducting device is connected with optoelectronic speed imaging lens system, moves horizontally on the slide rail for controlling it.Sliding rail
The rapidoprint material different from optoelectronic speed imaging lens system.When falling mass spectrum MCP detector, position is lucky
At the light desorption point of optoelectronic speed imaging system.
First optoelectronic speed imaging lens system is moved by the 1st spiral straight line inducting device and the 2nd spiral straight line inducting device
To one section of nonionic flight path of the 1st sliding rail and the 2nd sliding rail, mass spectrum MCP detector is imported by the 3rd spiral straight line of rotation
Device decline obtains the mass spectra peak of ion interested at light desorption point, writes down flight time t, then revolve mass spectrum MCP detector
Turn to rise, the sub- velocity imaging lens system of moving photoconductor to ion flight passage, when the time is flight time t, opens desorption
Laser simultaneously adds pulse to the electrode slice in optoelectronic speed imaging lens system, forms acceleration fields and accelerates the photoelectron after desorption
Reach imaging detection system.
Operation of the present invention is simple and easy, and principle is first to move optoelectronic speed imaging lens system by straight line inducting device
To one section of nonionic flight path, mass spectrum MCP detector is fallen by rotational alignment inducting device, is felt at light desorption point
The mass spectra peak of interest ion writes down flight time t, then rotates mass spectrum MCP detector and rises, and mobile imaging lens system is extremely
Ion flight passage opens desorption laser and to the high pressure and sub-high pressure in imaging lens system when the time is flight time t
Electrode slice adds pulse, forms three-level acceleration fields and the photoelectron after desorption is accelerated to reach imaging MCP, signal is amplified to be struck
Fluorescent screen forms hot spot, has been recorded by subsequent CCD camera and has obtained optoelectronic speed imaging.
Its center must be positioned at light desorption point when the mass spectrum MCP detector is fallen.
The rapidoprint of optoelectronic speed imaging system must be different from sliding rail material.
Advantage of the present invention is as follows:
The mass signal that ion at light desorption point can be obtained by elevating translational, avoids the damage of ion caused by quality gate
It becomes estranged and calculates the trouble of time.
Detailed description of the invention
Fig. 1 is the structure composition schematic diagram of the embodiment of the present invention.
Specific embodiment
Following embodiment will the invention will be further described in conjunction with attached drawing.
As shown in Figure 1, the embodiment of the present invention is equipped with mass spectrum MCP detector 1, optoelectronic speed imaging lens system 2, imaging
Detection system 3, the 1st spiral straight line inducting device 4, the 2nd spiral straight line inducting device 5, the 3rd spiral straight line inducting device 6,7 and of the 1st sliding rail
2nd sliding rail 8；The mass spectrum MCP detector 1 is connected with the 3rd spiral straight line inducting device 6, and the 3rd spiral straight line inducting device 6 is adjusted
Save imaging detection system 3 vertical height, the 1st spiral straight line inducting device 4, the 2nd spiral straight line inducting device 5 and optoelectronic speed at
Picture lens system 2 is connected, and rotates the 1st spiral straight line inducting device 4 and the 2nd spiral straight line inducting device 5 adjusts optoelectronic speed imaging
The horizontal position of lens system 2, optoelectronic speed imaging lens system 2 are located on the 1st sliding rail 7 and the 2nd sliding rail 8.
Optoelectronic speed imaging lens system 2 is first passed through into the 1st spiral straight line inducting device 4 and the 2nd spiral straight line inducting device 5
One section of nonionic flight path of the 1st sliding rail 7 and the 2nd sliding rail 8 is moved to, mass spectrum MCP detector 1 is straight by the 3rd spiral of rotation
Line inducting device 6 declines, and obtains the mass spectra peak of ion interested (at asterisk) at light desorption point, writes down flight time t, then will
The rotation of mass spectrum MCP detector 1 rises, the sub- velocity imaging lens system 2 of moving photoconductor to ion flight passage, is flight in the time
When time t, opens desorption laser and add pulse to the electrode slice in optoelectronic speed imaging lens system 2, form acceleration fields
Photoelectron after accelerating desorption reaches imaging detection system 3.
Claims (3)
1. a kind of be imaged the device detected jointly for mass spectrum and optoelectronic speed, it is characterised in that be equipped with mass spectrum MCP detector,
Optoelectronic speed imaging lens system, imaging detection system, the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device, the 3rd spiral shell
Revolve straight line inducting device, the 1st sliding rail and the 2nd sliding rail；The mass spectrum MCP detector is connected with the 3rd spiral straight line inducting device, and described
3 spiral straight line inducting devices adjust the vertical height of imaging detection system, the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device
It is connected with optoelectronic speed imaging lens system, rotates the 1st spiral straight line inducting device and the 2nd spiral straight line inducting device adjusts photoelectricity
The horizontal position of sub- velocity imaging lens system, optoelectronic speed imaging lens system are located on the 1st sliding rail and the 2nd sliding rail；Institute
Optoelectronic speed imaging lens system is stated equipped with reference electrode piece and three acceleration electrode slices.
2. a kind of as described in claim 1 be imaged the device detected jointly for mass spectrum and optoelectronic speed, it is characterised in that institute
Imaging detection system is stated equipped with MCP, fluorescent screen and CCD camera.
3. a kind of as described in claim 1 be imaged the device detected jointly for mass spectrum and optoelectronic speed, it is characterised in that institute
It states its center when mass spectrum MCP detector is fallen and is located at light desorption point.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711225994.7A CN108037525B (en) | 2017-11-29 | 2017-11-29 | It is a kind of that the device detected jointly being imaged for mass spectrum and optoelectronic speed |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711225994.7A CN108037525B (en) | 2017-11-29 | 2017-11-29 | It is a kind of that the device detected jointly being imaged for mass spectrum and optoelectronic speed |
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| CN108037525A CN108037525A (en) | 2018-05-15 |
| CN108037525B true CN108037525B (en) | 2019-06-07 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111739785B (en) * | 2020-06-30 | 2023-08-01 | 中国科学院上海应用物理研究所 | Dual ion source slow electron speed imaging device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103065921A (en) * | 2013-01-18 | 2013-04-24 | 中国科学院大连化学物理研究所 | Multiple-reflection high resolution time-of-flight mass spectrometer |
| CN103558628A (en) * | 2013-10-09 | 2014-02-05 | 中国科学院大连化学物理研究所 | Novel double-reflection type flight time mass spectrum photoelectron velocity imager |
| CN104701129A (en) * | 2015-03-12 | 2015-06-10 | 广西电网有限责任公司电力科学研究院 | Device and method of inhibiting anions generated by low-energy photoelectron resonance ionization |
| CN205139379U (en) * | 2015-11-26 | 2016-04-06 | 中国科学院大连化学物理研究所 | A collineation formula imaging detector for particle formation of image |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103762149B (en) * | 2013-12-31 | 2015-11-18 | 华中科技大学 | A kind of device improving velocity of electrons imaging resolution |
| CN203967029U (en) * | 2014-07-18 | 2014-11-26 | 大连华扬科技有限公司 | A kind of ion focusing lens for velocity imaging |
| JP6359470B2 (en) * | 2015-02-13 | 2018-07-18 | キヤノンアネルバ株式会社 | Mass spectrometer |
| CN106206239B (en) * | 2016-09-27 | 2020-06-30 | 北京印刷学院 | High-efficient combination formula atmospheric pressure ionization source |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103065921A (en) * | 2013-01-18 | 2013-04-24 | 中国科学院大连化学物理研究所 | Multiple-reflection high resolution time-of-flight mass spectrometer |
| CN103558628A (en) * | 2013-10-09 | 2014-02-05 | 中国科学院大连化学物理研究所 | Novel double-reflection type flight time mass spectrum photoelectron velocity imager |
| CN104701129A (en) * | 2015-03-12 | 2015-06-10 | 广西电网有限责任公司电力科学研究院 | Device and method of inhibiting anions generated by low-energy photoelectron resonance ionization |
| CN205139379U (en) * | 2015-11-26 | 2016-04-06 | 中国科学院大连化学物理研究所 | A collineation formula imaging detector for particle formation of image |
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