CN108037525A - A kind of device detected jointly for mass spectrum and optoelectronic speed imaging - Google Patents
A kind of device detected jointly for mass spectrum and optoelectronic speed imaging Download PDFInfo
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- CN108037525A CN108037525A CN201711225994.7A CN201711225994A CN108037525A CN 108037525 A CN108037525 A CN 108037525A CN 201711225994 A CN201711225994 A CN 201711225994A CN 108037525 A CN108037525 A CN 108037525A
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- straight line
- mass spectrum
- inducting device
- line inducting
- speed imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
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Abstract
A kind of device detected jointly for mass spectrum and optoelectronic speed imaging, is related to mass spectrum and photoelectronic imaging.Equipped with mass spectrum MCP detectors, optoelectronic speed imaging lens system, imaging detection system, the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device, the 3rd spiral straight line inducting device, the 1st slide and the 2nd slide；The mass spectrum MCP detectors are connected with the 3rd spiral straight line inducting device, the 3rd spiral straight line inducting device adjusts the vertical height of imaging detection system, 1st spiral straight line inducting device, the 2nd spiral straight line inducting device are connected with optoelectronic speed imaging lens system, rotate the 1st spiral straight line inducting device and the 2nd spiral straight line inducting device adjusts the horizontal level of optoelectronic speed imaging lens system, optoelectronic speed imaging lens system is located on the 1st slide and the 2nd slide.
Description
Technical field
The present invention relates to mass spectrum and photoelectronic imaging, is used for mass spectrum more particularly, to one kind and optoelectronic speed is imaged jointly
The device of detection.
Background technology
Cluster is widely present in nature and the practical activity of the mankind, and the research for cluster science at present concentrates on spy
Study carefully composition, geometry electronic structure and response characteristic of cluster etc. ([1] Le ó n I, Yang Z, Liu HT, Wang LS.The
Design and Construction of a High-Resolution Velocity-Map Imaging Apparatus
for Photoelectron Spectroscopy Studies of Size-Selected Clusters[J].Rev Sci
Instrum.2014,85 (8)), flight time mass spectrum can directly make weather observations the Mass Distribution of cluster ions, according to its mass spectrum
The relative intensity at peak, can also judge the stability of various sizes of cluster, be imitated in terms of definite ion component and reactivity
Fruit is notable, but mass spectrum cannot directly give the electronics integrated structure information of material, it is necessary to be used in conjunction from different spectrum methods, pass through
The photoelectron spectroscopy that optoelectronic speed is imaged can obtain the electron affinity of central element or cluster, excited electronic state
Excitation energy, can also obtain vibration fine structure ([2] Yandell MA, the King SB, Neumark of electronic state sometimes
DM.Time-Resolved Radiation Chemistry:Photoelectron Imaging of Transient
Negative Ions of Nucleobases[J].J Am Chem Soc.2013,135(6):2128-31).Flight time matter
The combination of spectrum and optoelectronic speed imaging then meets definite cluster species and obtains the double requirements of material electronic structure information.
At present, the design of domestic and international flight time mass spectrum optoelectronic speed imager, is that mass detector is placed in light mostly
Desorption point above a certain position, obtains after determining mass number ion, by quality gate repel other ions by or pass through calculating
The time application pulse for obtaining reaching light desorption point comes light desorption a certain specific ion ([3] Tang Zichao, Liu Zhiling, Xie Hua, a generation
A kind of conllinear formula imaging detector [P] Chinese patents for ion imaging of space：CN 205139397 U,2016-04-06).
Quality gate has three pieces electrode slice composition more, and wherein two panels carries aperture plate, this can cause the loss of amount of ions, and by calculating
Applying the mode of pulse to the time, then experiment is both needed to calculate and time sweep need to be carried out near the time accurately to take off calculating every time
It is attached.In addition, both the above method all cannot truly show the species and signal quality information that ion is located at light desorption point.
The content of the invention
To solve the above-mentioned problems, it is an object of the invention to provide can light be desorbed point measurement mass signal but also
A kind of device detected jointly for mass spectrum and optoelectronic speed imaging of point progress light desorption electronic imaging is desorbed in light.
The present invention is equipped with mass spectrum MCP detectors, optoelectronic speed imaging lens system, imaging detection system, the 1st spiral straight
Line inducting device, the 2nd spiral straight line inducting device, the 3rd spiral straight line inducting device, the 1st slide and the 2nd slide；The mass spectrum MCP detections
Device is connected with the 3rd spiral straight line inducting device, the vertical height of the 3rd spiral straight line inducting device adjusting imaging detection system, and the 1st
Spiral straight line inducting device, the 2nd spiral straight line inducting device are connected with optoelectronic speed imaging lens system, rotate the 1st spiral straight line
Inducting device and the 2nd spiral straight line inducting device adjust the horizontal level of optoelectronic speed imaging lens system, optoelectronic speed imaging
Lens combination is located on the 1st slide and the 2nd slide.
The optoelectronic speed imaging lens system is equipped with reference electrode piece and three acceleration electrode slices.
The imaging detection system is equipped with MCP, fluorescent screen and CCD camera.
Spiral straight line inducting device is equipped with 3, including the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device and the 3rd spiral shell
Straight line inducting device is revolved, a spiral straight line inducting device is connected with mass spectrum MCP detectors, for controlling its vertical lift, in addition two
A spiral straight line inducting device is connected with optoelectronic speed imaging lens system, for controlling it to be moved horizontally on slide.Slide
The rapidoprint material different from optoelectronic speed imaging lens system.When falling mass spectrum MCP detectors, its position is lucky
At the light desorption point of optoelectronic speed imaging system.
First optoelectronic speed imaging lens system is moved by the 1st spiral straight line inducting device and the 2nd spiral straight line inducting device
To the 1st slide and one section of the nonionic flight path of the 2nd slide, mass spectrum MCP detectors are imported by the 3rd spiral straight line of rotation
Device declines, and obtains the mass spectra peak of ion interested at light desorption point, writes down flight time t, then revolve mass spectrum MCP detectors
Turn to rise, the sub- velocity imaging lens combination of moving photoconductor to ion flight passage, when the time is flight time t, open desorption
Laser simultaneously adds pulse to the electrode slice in optoelectronic speed imaging lens system, forms acceleration fields and accelerates the photoelectron after desorption
Reach imaging detection system.
Operation is simple by the present invention, its principle is first to move optoelectronic speed imaging lens system by straight line inducting device
To one section of nonionic flight path, mass spectrum MCP detectors are fallen by rotational alignment inducting device, are felt at light desorption point
The mass spectra peak of interest ion, writes down flight time t, then rotates mass spectrum MCP detectors and rises, and mobile imaging lens system is extremely
Ion flight passage, when the time is flight time t, opens desorption laser and to the high pressure and sub-high pressure in imaging lens system
Electrode slice adds pulse, forms three-level acceleration fields and accelerates the photoelectron after desorption to reach imaging MCP, signal is amplified to be struck
Fluorescent screen forms hot spot, has been recorded by CCD camera below and has obtained optoelectronic speed imaging.
Its center must be positioned at light desorption point when the mass spectrum MCP detectors are fallen.
The rapidoprint of optoelectronic speed imaging system must be different from slide material.
Advantage of the present invention is as follows：
It is the mass signal that can obtain ion at light desorption point by elevating translational, avoids ion caused by quality gate and damage
Become estranged and calculate the trouble of time.
Brief description of the drawings
Fig. 1 is the structure composition schematic diagram of the embodiment of the present invention.
Embodiment
Following embodiments will the invention will be further described with reference to attached drawing.
As shown in Figure 1, the embodiment of the present invention is equipped with mass spectrum MCP detectors 1, optoelectronic speed imaging lens system 2, imaging
Detection system 3, the 1st spiral straight line inducting device 4, the 2nd spiral straight line inducting device 5, the 3rd spiral straight line inducting device 6,7 and of the 1st slide
2nd slide 8；The mass spectrum MCP detectors 1 are connected with the 3rd spiral straight line inducting device 6, and the 3rd spiral straight line inducting device 6 is adjusted
Save the vertical height of imaging detection system 3, the 1st spiral straight line inducting device 4, the 2nd spiral straight line inducting device 5 and optoelectronic speed into
Picture lens combination 2 is connected, and the 1st spiral 4 and the 2nd spiral straight line inducting device 5 of straight line inducting device of rotation adjusts optoelectronic speed imaging
The horizontal level of lens combination 2, optoelectronic speed imaging lens system 2 are located on the 1st slide 7 and the 2nd slide 8.
Optoelectronic speed imaging lens system 2 is first passed through into the 1st spiral 4 and the 2nd spiral straight line inducting device 5 of straight line inducting device
One section of the nonionic flight path of the 1st slide 7 and the 2nd slide 8 is moved to, mass spectrum MCP detectors 1 is spiral straight by rotation the 3rd
Line inducting device 6 declines, and the mass spectra peak of ion interested is obtained (at asterisk) at light desorption point, writes down flight time t, then will
The rotation of mass spectrum MCP detectors 1 rises, the sub- velocity imaging lens combination 2 of moving photoconductor to ion flight passage, is flight in the time
During time t, open desorption laser and add pulse to the electrode slice in optoelectronic speed imaging lens system 2, form acceleration fields
The photoelectron after desorption is accelerated to reach imaging detection system 3.
Claims (4)
- It is 1. a kind of for mass spectrum and the device that detects jointly of optoelectronic speed imaging, it is characterised in that equipped with mass spectrum MCP detectors, Optoelectronic speed imaging lens system, imaging detection system, the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device, the 3rd spiral shell Revolve straight line inducting device, the 1st slide and the 2nd slide；The mass spectrum MCP detectors are connected with the 3rd spiral straight line inducting device, and described 3 spiral straight line inducting devices adjust the vertical height of imaging detection system, the 1st spiral straight line inducting device, the 2nd spiral straight line inducting device It is connected with optoelectronic speed imaging lens system, rotates the 1st spiral straight line inducting device and the 2nd spiral straight line inducting device adjusts photoelectricity The horizontal level of sub- velocity imaging lens combination, optoelectronic speed imaging lens system are located on the 1st slide and the 2nd slide.
- A kind of 2. device detected jointly for mass spectrum and optoelectronic speed imaging as claimed in claim 1, it is characterised in that institute Optoelectronic speed imaging lens system is stated equipped with reference electrode piece and three acceleration electrode slices.
- A kind of 3. device detected jointly for mass spectrum and optoelectronic speed imaging as claimed in claim 1, it is characterised in that institute State imaging detection system and be equipped with MCP, fluorescent screen and CCD camera.
- A kind of 4. device detected jointly for mass spectrum and optoelectronic speed imaging as claimed in claim 1, it is characterised in that institute State its center when mass spectrum MCP detectors are fallen and be located at light desorption point.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711225994.7A CN108037525B (en) | 2017-11-29 | 2017-11-29 | It is a kind of that the device detected jointly being imaged for mass spectrum and optoelectronic speed |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711225994.7A CN108037525B (en) | 2017-11-29 | 2017-11-29 | It is a kind of that the device detected jointly being imaged for mass spectrum and optoelectronic speed |
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| Publication Number | Publication Date |
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| CN108037525A true CN108037525A (en) | 2018-05-15 |
| CN108037525B CN108037525B (en) | 2019-06-07 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111739785A (en) * | 2020-06-30 | 2020-10-02 | 中国科学院上海应用物理研究所 | Dual ion source slow electron speed imaging device |
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| CN103065921A (en) * | 2013-01-18 | 2013-04-24 | 中国科学院大连化学物理研究所 | Multiple-reflection high resolution time-of-flight mass spectrometer |
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| CN106206239A (en) * | 2016-09-27 | 2016-12-07 | 北京印刷学院 | A kind of efficient combined-type atmospheric pressure ionization source |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111739785A (en) * | 2020-06-30 | 2020-10-02 | 中国科学院上海应用物理研究所 | Dual ion source slow electron speed imaging device |
| CN111739785B (en) * | 2020-06-30 | 2023-08-01 | 中国科学院上海应用物理研究所 | Dual ion source slow electron speed imaging device |
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| Publication number | Publication date |
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| CN108037525B (en) | 2019-06-07 |
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