CN108031992A - The ultrafast systems of processing of LTCC and its method - Google Patents

The ultrafast systems of processing of LTCC and its method Download PDF

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Publication number
CN108031992A
CN108031992A CN201711471017.5A CN201711471017A CN108031992A CN 108031992 A CN108031992 A CN 108031992A CN 201711471017 A CN201711471017 A CN 201711471017A CN 108031992 A CN108031992 A CN 108031992A
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CN
China
Prior art keywords
light
polarisations
processing
light beam
scanning element
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Application number
CN201711471017.5A
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Chinese (zh)
Inventor
赵裕兴
吴安定
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JIANGYIN DELI LASER EQUIPMENT CO Ltd
Suzhou Delphi Laser Co Ltd
Original Assignee
JIANGYIN DELI LASER EQUIPMENT CO Ltd
Suzhou Delphi Laser Co Ltd
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Application filed by JIANGYIN DELI LASER EQUIPMENT CO Ltd, Suzhou Delphi Laser Co Ltd filed Critical JIANGYIN DELI LASER EQUIPMENT CO Ltd
Priority to CN201711471017.5A priority Critical patent/CN108031992A/en
Publication of CN108031992A publication Critical patent/CN108031992A/en
Pending legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • B23K26/702Auxiliary equipment

Abstract

The present invention relates to the ultrafast systems of processing of LTCC and method, it is equipped with according to optical path direction:Laser, output beam;First reflector element, will inject light beam sizing die group from Laser Output Beam;Beam shaping module, expands light beam and is filtered;Incident light, is divided into the two-beam of parallel direction and vertical direction by decay module;Second reflector element, the first scanning element is incident to by the P polarisations of the horizontal direction after light splitting;First scanning element, the light beam that the second reflector element reflects is focused, field lens is focused on processing object;Third reflecting unit, the second scanning element is incident to by the S polarisations of the vertical direction after light splitting;Second scanning element, the light beam that third reflecting unit reflects is focused, field lens is focused on processing object.Using ultrafast green ray picosecond laser device and matched high-speed vibrating mirror and optics, micro through hole diameter on ltcc substrate is down to less than 50 μm, micro through hole circularity reaches more than 95%, in 3 μm of taper.

Description

The ultrafast systems of processing of LTCC and its method
Technical field
The present invention relates to a kind of ultrafast systems of processing of LTCC and its method.
Background technology
At present, high density low-temperature co-fired ceramics (Low-temperature cofired ceramics, LTCC) substrate Make the fine interconnection technique dependent on substrate inner conductor.In recent years, with the development of microelectric technique and packaging technology, surpass The density of large scale integrated circuit is higher and higher.In order to meet the technological requirement of LTCC multilager base plates high density interconnection, it is necessary to make The diameter and conducting wire line width of substrate micro through hole narrow down to 100 μm even less than 50 μm.Meanwhile the micro through hole on every ltcc substrate Quantity reaches 50K even more than 100K, and the spacing accuracy of micro through hole is also higher and higher.
The processing of cutting and micropore (100 μm of <) for arbitrary shape, traditional processing method are extremely difficult to require.But It is that laser has the characteristics that high accuracy, high density, high efficiency and contactless damage, and the energy of laser and hot spot are in very little In the range of realize and be precisely controlled, so the lines of Laser Processing are very fine, aperture can reach very little, and can process and appoint Meaning shape.Therefore mainly processing method of the laser-beam drilling machine as ltcc substrate micro through hole is used at present.
Ltcc substrate micro through hole laser-beam drilling machine on the market is primarily directed to a diameter of 50~100 μm of micropore at present, The type of laser and the type selecting of other optics are limited to, is difficult to reach for a diameter of less than 50 μm of micro through holes and wants Ask, and processing efficiency is difficult more than 1000 holes/second, even if improving efficiency reluctantly, reaches requirement, but thing followed micro through hole Spacing accuracy also causes laser-beam drilling machine on the market to hang back.
The content of the invention
The purpose of the present invention is overcome the shortcomings of the prior art, there is provided a kind of ultrafast system of processing of LTCC and its side Method.
The purpose of the present invention is achieved through the following technical solutions:
The ultrafast systems of processing of LTCC, are provided with according to optical path direction:
Laser, output beam;
First reflector element, comprising the first speculum arranged according to optical path direction, the light beam exported from laser is injected Beam shaping module;
Beam shaping module, expands light beam and is changed the size for expanding hot spot, and to laser beam after expanding Filtered;
Decay module, change the polarization state of laser beam after shaping and incident light is divided into parallel direction and vertical direction Two-beam, comprising polarization slide and polarisation cube beamsplitter, polarization slide is located at polarisation cube beamsplitter incidence optical port, partially The slide that shakes change incident beam polarization state, adjust light beam in the ratio of P polarisations and S polarisations, polarisation cube beamsplitter according to The polarization state of light splits the light into the outgoing of two mutually perpendicular directions, and P polarisations are emitted from parallel direction, and S polarisations are from vertical direction Outgoing;
Second reflector element, comprising the second speculum being sequentially arranged according to the horizontal optical path direction after light splitting, the 3rd anti- Mirror and the 4th speculum are penetrated, the horizontal direction light after light splitting is incident to the first scanning element;
First scanning element, the light beam that the second reflector element reflects is focused, comprising being sequentially arranged according to optical path direction Galvanometer and field lens, the P polarisations light of the horizontal direction after light splitting is mapped on the eyeglass of galvanometer through the second reflector element, gathered by field lens It is burnt on processing object;
Third reflecting unit, it is anti-comprising the 5th speculum and the 6th being sequentially arranged according to the vertical optical path direction after light splitting Mirror is penetrated, the S polarisations of the vertical direction after light splitting are incident to the second scanning element;
Second scanning element, the light beam that third reflecting unit reflects is focused, comprising being sequentially arranged according to optical path direction Galvanometer and field lens, the vertical direction light after light splitting is mapped on the eyeglass of galvanometer through third reflecting unit, focused to by field lens plus On work object;
Processing platform, for placing rapidoprint.
Further, the ultrafast systems of processing of above-mentioned LTCC, wherein, the laser is the ultrafast picosecond laser of narrow spaces Device.
Further, the ultrafast systems of processing of above-mentioned LTCC, wherein, laser emitting end light path is opened equipped with control The optical gate of Guan Guang.
Further, the ultrafast systems of processing of above-mentioned LTCC, wherein, the beam shaping module includes beam expanding lens and optical filtering Piece, beam expanding lens are arranged in light path using oppositely positioned, and the size for expanding hot spot, optical filter cloth are expanded and changed to light beam It is placed in after beam expanding lens, laser beam after expanding is filtered.
Further, the ultrafast systems of processing of above-mentioned LTCC, wherein, the galvanometer of first scanning element is light inlet hole The galvanometer of footpath 14mm.
Further, the ultrafast systems of processing of above-mentioned LTCC, wherein, the galvanometer of second scanning element is light inlet hole The galvanometer of footpath 14mm.
The ultrafast processing methods of LTCC of the present invention,
The light of laser output enters beam shaping module after the first speculum reflection of the first reflector element;
Light beam is expanded and filtered into shaping module, and the light beam after shaping is emitted directly toward decay module;
The polarization slide of decay module changes the polarization state for the light beam for inciding decay module, polarizes slide adjustment beam The ratio of middle P polarisations and S polarisations, the light beam after polarizing enter the polarisation cube beamsplitter of decay module, polarisation cube Optical splitter splits the light into two mutually perpendicular direction outgoing according to the polarization state of light, and P polarisations are emitted from parallel direction, S polarisations It is emitted from vertical direction;
From the light beam of the horizontal direction of decay module outgoing, the second speculum, the 3rd speculum through the second reflector element Enter the first scanning element after being reflected with the 4th speculum;After field lens focusing of the light beam through the first scanning element with galvanometer Corresponding drawing is processed the material on processing platform;
From the light beam of the vertical direction of decay module outgoing, the 5th speculum and the 6th speculum through third reflecting unit Enter the second scanning element after reflection;Field lens of the light beam Jing Guo the second scanning element focus on after with galvanometer corresponding drawing Material on processing platform is processed.
Further, the ultrafast processing methods of above-mentioned LTCC, wherein, the beam shaping module includes beam expanding lens and filter Mating plate, beam expanding lens are arranged in light path using oppositely positioned, and the size for expanding hot spot, optical filter are expanded and changed to light beam It is arranged in after beam expanding lens, laser beam after expanding is filtered.
Further, the ultrafast processing methods of above-mentioned LTCC, wherein, the polarization slide adjusts P polarisations and S in light beam The ratio of polarisation so that the light intensity of both direction is suitable, i.e., power error is within 5%.
Further, the ultrafast processing methods of above-mentioned LTCC, wherein, the processing platform can place four processing at the same time Material, meets that the first scanning element and the second scanning element are processed at the same time.
The present invention has significant advantages and beneficial effects compared with prior art, embodies in the following areas:
1. the present invention uses ultrafast green ray picosecond laser device and matched high-speed vibrating mirror and other optics, Micro through hole diameter on ltcc substrate can be reduced to less than 50 μm, while ensure that the circularity of micro through hole reaches more than 95%, Taper is within 3 μm;
2. can be on the premise of machining accuracy be ensured, by processing efficiency lifting to 1500 holes/second, than at present on the market Fast more than 1 times of laser-beam drilling machine;The precision controlling of micro through hole spacing is within ± 5 μm;
3. filter element can optimize the quality at hot spot edge so as to improve the circularity of micro through hole profile;Various sizes of filter Optical element coordinates different laser powers to achieve the purpose that to control micro through hole aperture;Can be by adjusting galvanometer scaling and every The position of a concatenation module ensures the precision of micro through hole spacing.
Brief description of the drawings
Fig. 1:The light channel structure schematic diagram of the present invention.
Embodiment
In order to which the technical features, objects and effects of the present invention are more clearly understood, specific implementation is now described in detail Scheme.
As shown in Figure 1, the ultrafast systems of processing of LTCC, are provided with according to optical path direction:
Laser A, is the ultrafast picosecond laser of narrow spaces, output beam, has higher repetition rate;Laser A goes out Penetrate the optical gate that end light path is equipped with controlling switch light;
First reflector element, comprising the first speculum C1 arranged according to optical path direction, the light beam exported from laser A is penetrated Enter beam shaping module B;
Beam shaping module B, comprising beam expanding lens B1 and optical filter B2, beam expanding lens B1 is arranged in light path using oppositely positioned On, the size for expanding hot spot is expanded and changed to light beam, and optical filter B2 is arranged in after beam expanding lens B1, to swashing after expanding Light light beam is filtered, to obtain the laser beam of quality higher;
Decay module D, change shaping after laser beam polarization state and incident light is divided into parallel direction and vertical direction Two-beam, comprising polarization slide D1 and polarisation cube beamsplitter D2, polarization slide D1 be located at polarisation cube beamsplitter D2 Incident optical port, polarization slide D1 change the polarization state of incident beam, adjust the ratio of P polarisations and S polarisations in light beam, polarisation cube Body optical splitter D2 splits the light into two mutually perpendicular direction outgoing according to the polarization state of light, and P polarisations are emitted from parallel direction, S Polarisation is emitted from vertical direction;
Second reflector element, includes the second speculum C2 being sequentially arranged according to the horizontal optical path direction after light splitting, the 3rd Speculum C3 and the 4th speculum C4, the first scanning element is incident to by the horizontal direction light after light splitting;
First scanning element, the light beam that the second reflector element reflects is focused, comprising being sequentially arranged according to optical path direction Galvanometer E1 and field lens F1, galvanometer E1 is the galvanometer of light inlet aperture 14mm, and the P polarisations of the horizontal direction after light splitting are anti-through second Penetrate unit to be mapped on the eyeglass of galvanometer E1, without being in the light or lacking optical phenomenon, focused to by field lens F1 on processing object;
Third reflecting unit, includes the 5th speculum C5 and the 6th being sequentially arranged according to the vertical optical path direction after light splitting Speculum C6, the second scanning element is incident to by the vertical direction S polarisations after light splitting;
Second scanning element, the light beam that third reflecting unit reflects is focused, comprising being sequentially arranged according to optical path direction Galvanometer E2 and field lens F2, galvanometer E2 is the galvanometer of light inlet aperture 14mm, and vertical direction light after light splitting is single through the 3rd reflection Member is mapped on the eyeglass of galvanometer E2, without being in the light or lacking optical phenomenon, is focused to by field lens F2 on processing object;
Processing platform G, for placing rapidoprint;Can place four rapidoprints at the same time, meet the first scanning element and Second scanning element is processed at the same time.
When said system is used for LTCC ultrafast processing, first, the light of laser A outputs passes through the first of the first reflector element Enter beam shaping module B after speculum C1 reflections;
Light beam enters after shaping module B after beam expanding lens B1 is expanded and filtered with optical filter B2, and beam quality is improved, Light beam after shaping is emitted directly toward decay module D;
The polarization slide D1 of decay module D changes the polarization state for the light beam for inciding decay module, and polarization slide D1 is adjustable Save the ratio of P polarisations and S polarisations in light beam so that the light intensity of both direction is suitable, i.e. power error polarizes it within 5% Rear light beam enters polarisation the cube beamsplitter D2, polarisation cube beamsplitter D2 of decay module according to the polarization state of light by light It is divided into two mutually perpendicular direction outgoing, P polarisations are emitted from parallel direction, and S polarisations are emitted from vertical direction;
From the light beam of the horizontal direction of decay module D outgoing, the second speculum C2 through the second reflector element, the 3rd reflection Enter the first scanning element after mirror C3 and the 4th speculum C4 reflections;Field lens F1 of the light beam through the first scanning element focus on after by Galvanometer E1 coordinates corresponding drawing to be processed the material on processing platform G;
From the light beam of the vertical direction of decay module D outgoing, the 5th speculum C5 and the 6th through third reflecting unit is anti- Enter the second scanning element after penetrating mirror C6 reflections;After field lens F2 focusing of the light beam Jing Guo the second scanning element with galvanometer E1 Corresponding drawing is processed the material on processing platform G.
Can by manipulator from upper magazine feeding, then expect again on processing platform down.Processing platform is moved to processing Position, is processed with the machined parameters and correction parameter of debugging.After machining, processing platform is moved to lower discharge position, Expect blanking box under after manipulator feeding.
Using ultrafast green ray picosecond laser device and matched high-speed vibrating mirror and other optics, can incite somebody to action Micro through hole diameter on ltcc substrate is reduced to less than 50 μm, while ensures that the circularity of micro through hole reaches more than 95%, and taper is 3 Within μm.
Can be on the premise of machining accuracy be ensured, by processing efficiency lifting to 1500 holes/second, than swashing on the market at present Fast more than 1 times of light puncher.The precision controlling of micro through hole spacing is within ± 5 μm.
In conclusion the present invention can control the aperture of micro through hole and ensure machining accuracy, filter element can optimize The quality at hot spot edge is so as to improve the circularity of micro through hole profile;Various sizes of filter element coordinates different laser powers to reach To the purpose in control micro through hole aperture;It can be ensured by adjusting the position of galvanometer scaling and each concatenation module micro- logical The precision of pitch of holes.
It should be noted that:The foregoing is merely the preferred embodiment of the present invention, is not limited to power of the invention Sharp scope;At the same time more than description, should can understand and implement for the special personage of correlative technology field, thus it is other without departing from The equivalent change or modification completed under disclosed spirit, should be included in claim.

Claims (10)

  1. The ultrafast systems of processing of 1.LTCC, it is characterised in that:It is provided with according to optical path direction:
    Laser (A), output beam;
    First reflector element, comprising the first speculum (C1) arranged according to optical path direction, the light beam exported from laser (A) is penetrated Enter beam shaping module (B);
    Beam shaping module (B), expands light beam and is changed the size for expanding hot spot, and to laser beam after expanding into Row filtering;
    Decay module (D), change the polarization state of laser beam after shaping and incident light is divided into parallel direction and vertical direction Two-beam, comprising polarization slide (D1) and polarisation cube beamsplitter (D2), polarization slide (D1) is located at the light splitting of polarisation cube Device (D2) incidence optical port, polarization slide (D1) change the polarization state of incident beam, adjust the ratio of P polarisations and S polarisations in light beam, Polarisation cube beamsplitter (D2) splits the light into the outgoing of two mutually perpendicular directions according to the polarization state of light, and P polarisations are from parallel Direction is emitted, and S polarisations are emitted from vertical direction;
    Second reflector element, comprising the second speculum (C2) being sequentially arranged according to the horizontal optical path direction after light splitting, the 3rd anti- Mirror (C3) and the 4th speculum (C4) are penetrated, the horizontal direction light after light splitting is incident to the first scanning element;
    First scanning element, the light beam that the second reflector element reflects is focused, is shaken comprising what is be sequentially arranged according to optical path direction Mirror (E1) and field lens (F1), the P polarisations light of the horizontal direction after light splitting are mapped to through the second reflector element on the eyeglass of galvanometer (E1), Focused to by field lens (F1) on processing object;
    Third reflecting unit, it is anti-comprising the 5th speculum (C5) and the 6th being sequentially arranged according to the vertical optical path direction after light splitting Mirror (C6) is penetrated, the S polarisations of the vertical direction after light splitting are incident to the second scanning element;
    Second scanning element, the light beam that third reflecting unit reflects is focused, is shaken comprising what is be sequentially arranged according to optical path direction Mirror (E2) and field lens (F2), the vertical direction light after light splitting is mapped to through third reflecting unit on the eyeglass of galvanometer (E2), by field lens (F2) focus on processing object;
    Processing platform (G), for placing rapidoprint.
  2. 2. the ultrafast systems of processing of LTCC according to claim 1, it is characterised in that:The laser (A) surpasses for narrow spaces Fast picosecond laser.
  3. 3. the ultrafast systems of processing of LTCC according to claim 1 or 2, it is characterised in that:Laser (A) the exit end light Road is equipped with the optical gate of controlling switch light.
  4. 4. the ultrafast systems of processing of LTCC according to claim 1, it is characterised in that:The beam shaping module (B) includes Beam expanding lens (B1) and optical filter (B2), beam expanding lens (B1) are arranged in light path using oppositely positioned, light beam are expanded and is changed Become the size for expanding hot spot, optical filter (B2) is arranged in after beam expanding lens (B1), laser beam after expanding is filtered.
  5. 5. the ultrafast systems of processing of LTCC according to claim 1, it is characterised in that:The galvanometer of first scanning element (E1) galvanometer for being light inlet aperture 14mm.
  6. 6. the ultrafast systems of processing of LTCC according to claim 1, it is characterised in that:The galvanometer of second scanning element (E2) galvanometer for being light inlet aperture 14mm.
  7. 7. the system described in claim 1 realizes the ultrafast processing methods of LTCC, it is characterised in that:
    The light of laser (A) output enters beam shaping module after the first speculum (C1) reflection of the first reflector element (B);
    Light beam is expanded and filtered into shaping module (B), and the light beam after shaping is emitted directly toward decay module (D);
    The polarization slide (D1) of decay module (D) changes the polarization state for the light beam for inciding decay module, and polarization slide (D1) can The ratio of P polarisations and S polarisations in light beam is adjusted, the light beam after polarizing enters the polarisation cube beamsplitter of decay module (D2), polarisation cube beamsplitter (D2) splits the light into the outgoing of two mutually perpendicular directions according to the polarization state of light, P polarisations from Parallel direction is emitted, and S polarisations are emitted from vertical direction;
    From the light beam of the horizontal direction of decay module (D) outgoing, the second speculum (C2) through the second reflector element, the 3rd reflection Enter the first scanning element after mirror (C3) and the reflection of the 4th speculum (C4);Field lens (F1) of the light beam through the first scanning element focuses on The material on processing platform (G) is processed from corresponding drawing with galvanometer (E1) afterwards;
    From the light beam of the vertical direction of decay module (D) outgoing, the 5th speculum (C5) and the 6th through third reflecting unit are anti- Enter the second scanning element after penetrating mirror (C6) reflection;By galvanometer after field lens (F2) focusing of the light beam Jing Guo the second scanning element (E1) corresponding drawing is coordinated to be processed the material on processing platform (G).
  8. 8. the ultrafast processing methods of LTCC according to claim 7, it is characterised in that:The beam shaping module (B) includes Beam expanding lens (B1) and optical filter (B2), beam expanding lens (B1) are arranged in light path using oppositely positioned, light beam are expanded and is changed Become the size for expanding hot spot, optical filter (B2) is arranged in after beam expanding lens (B1), laser beam after expanding is filtered.
  9. 9. the ultrafast processing methods of LTCC according to claim 7, it is characterised in that:The polarization slide (D1) adjusts light beam The ratio of middle P polarisations and S polarisations so that the light intensity of both direction is suitable, i.e., power error is within 5%.
  10. 10. the ultrafast processing methods of LTCC according to claim 7, it is characterised in that:The processing platform (G) can put at the same time Four rapidoprints are put, meet that the first scanning element and the second scanning element are processed at the same time.
CN201711471017.5A 2017-12-29 2017-12-29 The ultrafast systems of processing of LTCC and its method Pending CN108031992A (en)

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CN108907457A (en) * 2018-08-14 2018-11-30 江苏瑞驰机电科技有限公司 The device for merging, separating optical delivery is realized by laser reversal
CN109967866A (en) * 2019-04-19 2019-07-05 苏州德龙激光股份有限公司 Marking on the fly mode Combined process equipment
CN110216382A (en) * 2019-07-05 2019-09-10 北京莱泽光电技术有限公司 Drilling equipment and boring method
CN110695524A (en) * 2019-06-20 2020-01-17 西安中科微精光子制造科技有限公司 Light beam scanning system for laser micropore machining
CN111624725A (en) * 2020-04-22 2020-09-04 大族激光科技产业集团股份有限公司 System for realizing zooming and light path shaping
CN112139679A (en) * 2020-09-22 2020-12-29 东莞市盛雄激光先进装备股份有限公司 LTCC (Low temperature Co-fired ceramic) green ceramic ultrafast laser drilling system and method
CN112658509A (en) * 2020-12-31 2021-04-16 苏州科韵激光科技有限公司 Precise micropore machining system based on femtosecond laser
CN112705841A (en) * 2020-12-18 2021-04-27 武汉理工大学 Ultrafast laser high-speed micro-nano processing system based on polygon scanning rotating mirror
CN113857699A (en) * 2021-10-22 2021-12-31 广东中科微精光子制造科技有限公司 Blind hole drilling equipment and drilling method
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CN114951876A (en) * 2021-02-25 2022-08-30 东捷科技股份有限公司 Welding equipment

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CN204308408U (en) * 2014-12-02 2015-05-06 大族激光科技产业集团股份有限公司 Laser Machining head and laser process equipment
CN107052592A (en) * 2017-05-23 2017-08-18 苏州德龙激光股份有限公司 Double light beam laser system of processing and its method
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CN109967866A (en) * 2019-04-19 2019-07-05 苏州德龙激光股份有限公司 Marking on the fly mode Combined process equipment
CN110695524A (en) * 2019-06-20 2020-01-17 西安中科微精光子制造科技有限公司 Light beam scanning system for laser micropore machining
CN110695524B (en) * 2019-06-20 2020-08-21 西安中科微精光子制造科技有限公司 Light beam scanning system for laser micropore machining
CN110216382A (en) * 2019-07-05 2019-09-10 北京莱泽光电技术有限公司 Drilling equipment and boring method
CN111624725A (en) * 2020-04-22 2020-09-04 大族激光科技产业集团股份有限公司 System for realizing zooming and light path shaping
CN112139679A (en) * 2020-09-22 2020-12-29 东莞市盛雄激光先进装备股份有限公司 LTCC (Low temperature Co-fired ceramic) green ceramic ultrafast laser drilling system and method
CN112139679B (en) * 2020-09-22 2022-06-28 东莞市盛雄激光先进装备股份有限公司 LTCC (Low temperature Co-fired ceramic) green ceramic ultrafast laser drilling system and method
CN112705841A (en) * 2020-12-18 2021-04-27 武汉理工大学 Ultrafast laser high-speed micro-nano processing system based on polygon scanning rotating mirror
CN112658509A (en) * 2020-12-31 2021-04-16 苏州科韵激光科技有限公司 Precise micropore machining system based on femtosecond laser
CN114799541A (en) * 2021-01-19 2022-07-29 深圳市大族数控科技股份有限公司 Multi-axis micro blind hole machining method and system based on ultrafast laser
CN114951876A (en) * 2021-02-25 2022-08-30 东捷科技股份有限公司 Welding equipment
CN113857699A (en) * 2021-10-22 2021-12-31 广东中科微精光子制造科技有限公司 Blind hole drilling equipment and drilling method

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