CN108020775A - Integrated circuit DC parameter I-V curve tests system - Google Patents
Integrated circuit DC parameter I-V curve tests system Download PDFInfo
- Publication number
- CN108020775A CN108020775A CN201711283292.4A CN201711283292A CN108020775A CN 108020775 A CN108020775 A CN 108020775A CN 201711283292 A CN201711283292 A CN 201711283292A CN 108020775 A CN108020775 A CN 108020775A
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- module
- test
- parameter
- circuit
- integrated circuit
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention discloses integrated circuit DC parameter I V curves to test system,Including test module,USB2.0 communication modules,Main control module,Display module,Report generation module,ACCESS database management modules and self-test and calibration software module,The data message of the test module detection is transferred to main control module by USB2.0 communication modules,Integrated circuit I V curves test system of the present invention uses USB2.0 communications protocol and host communication,The configuration of TCH test channel highest is up to 2048,Each passage can configure ground,Two kinds of power supplys and leg signal test four kinds of patterns,Host application program is multiple document interface,Support 7 system of Windows XP and Windows,General DC parameter such as static working current,The leakage current of input pin,Pin opens short circuit,The test function of impedance analysis and IV curves between pin makes test module,As long as user has configured test condition in corresponding configuration interface and can just test,User model can flexible programming and testing logic function after technical staff is familiar with DLL functions.
Description
Technical field
The present invention relates to integrated circuit DC test technical field, is specially the test of integrated circuit DC parameter I-V curve
System.
Background technology
With the development of integrated circuit technology and technology, chip system integrate development trend become increasingly complex with it is huge, draw
Also more and more difficulty of test and the challenges for reaching hundreds and thousands of, bigger being brought to chip testing of foot.It is and low in the market
The TCH test channel of end test equipment is both less than 256 passages, and the configuration of high-end test equipment passage is 2048 reachable, but price
Up to more than million U.S. dollars, test program is complicated, will professional person, such testing expense is high, testing time length.It is and high-end
Test equipment is American-European and Japanese development ＆ production entirely, though there is production in the low and middle-end test equipment country, and it is relatively American-European and Japan
Low and middle-end test equipment is clearly present equipment backwardness, and upgrading is slow, and occupation rate of market is extremely low.Set for the domestic test of lifting
Standby independent development is horizontal, reduces and break away from the dependence to external test equipment, improves testing efficiency, reduces testing cost, promotes
The development of domestic IC industrial chain.Therefore, it is to design a kind of new type integrated circuit DC parameter I-V curve test system very much
It is necessary.
The content of the invention
It is an object of the invention to provide integrated circuit DC parameter I-V curve to test system, to solve above-mentioned background skill
The problem of being proposed in art.
In order to solve the above technical problem, the present invention provides following technical solution：Integrated circuit DC parameter I-V curve is surveyed
Test system, including test module, USB2.0 communication modules, main control module, display module, report generation module, ACCESS data
Database management module and self-test and calibration software module, the data message of the test module detection are passed by USB2.0 communication modules
It is defeated to arrive main control module, the main control module be electrically connected display module, report generation module, ACCESS database management modules and
Self-test and calibration software module.
According to above-mentioned technical proposal, the test module includes pin open-short circuit module, input pin leakage current is surveyed
Die trial block, user model test module, quiescent current test module and IV curve test modules.
According to above-mentioned technical proposal, the pin open-short circuit module includes slave computer, matrix switch module and test
Circuit, the matrix switch module includes several submodules, and each submodule includes several matrix switch chips, each
Matrix switch chip includes several TCH test channels, and the control signal input of the matrix switch chip is connected with slave computer
Connect, the TCH test channel of the matrix switch chip is connected with test circuit, and the power input of the matrix switch chip is set
There is an electric capacity of voltage regulation, the ground terminal of matrix switch chip is equipped with an electric capacity of voltage regulation.
According to above-mentioned technical proposal, the quiescent current test module include magnetic inductive current sensor, resistance board,
And the host computer being electrically connected with resistance board output terminal, power supply is powered by two electric wires for tested module, wherein two electricity
Any one passes through magnetic inductive current sensor in line；The magnetic inductive current sensor output is defeated with resistance board
Enter end to be electrically connected；The host computer is by controlling resistance board to obtain the transient current value of tested module in real time, and according to transient state
Electric current is worth to the quiescent current of tested module.
According to above-mentioned technical proposal, the main control module includes USB communication functions interface circuit, FPGA control circuit, DPS
Power circuit, channel control circuit, SDRAM storage circuits, analog to digital conversion circuit and PMU parameter measurement circuits, the USB communications
Functional interface circuit is electrically connected USB. communication modules, and institute's data FPGA control circuit is electrically connected DPS power circuits, passage control
Circuit, SDRAM storage circuits, analog to digital conversion circuit and PMU parameter measurement circuits processed.
According to above-mentioned technical proposal, the FPGA control circuit includes a FPGA, and the FPGA is configured to 32
NIOSII processors, the FPGA is by 5 I/O ports and user mutual and controls burning voltage and burning flow.
According to above-mentioned technical proposal, the report generation module includes setting module, receiving module, establishes module, sign
Module and output module, the setting module, for setting the number of conditional parameter needed for report, result parameter, result parameter
It is worth the method for expressing of section and numerical intervals；The receiving module, for receiving initial data, which includes setting
The numerical value of conditional parameter and result parameter；It is described to establish module, for establishing conditional parameter and result parameter on setting
Report, extracts the conditional parameter of setting and the numerical value of result parameter from the initial data of reception, and by the conditional parameter of extraction
And the numerical value of result parameter is imported in the report established；The sign module, the expression side for the numerical intervals of application settings
Method indicates the numerical intervals belonging to the numerical value of each result parameter in the report of foundation, and the output module, is marked for exporting
Shown on report to display device after showing.
Compared with prior art, the beneficial effect that is reached of the present invention is：Integrated circuit I-V curve of the present invention tests system
Using USB2.0 communications protocol and host communication, the configuration of TCH test channel highest up to 2048, each passage can configure ground, two kinds
Power supply and leg signal test four kinds of patterns, and host application program is multiple document interface, support Windows XP and Windows 7
System, the impedance opened between short circuit, pin of general DC parameter such as static working current, the leakage current of input pin, pin
The test function of analysis and IV curves makes test module, as long as user has configured test condition with regard to energy in corresponding configuration interface
Test, user model after technical staff is familiar with DLL functions can flexible programming and testing logic function, effectively improve what is used
Convenience, so as to lift work efficiency.
Brief description of the drawings
Attached drawing is used for providing a further understanding of the present invention, and a part for constitution instruction, the reality with the present invention
Apply example to be used to explain the present invention together, be not construed as limiting the invention.In the accompanying drawings：
Fig. 1 is the test overall system architecture block diagram of the present invention；
Fig. 2 is the test module composition block diagram of the present invention；
Fig. 3 is the main control module composition block diagram of the present invention；
In figure：1- test modules；2-USB2.0 communication modules；3- main control modules；4- display modules；5- report generation moulds
Block；6-ACCESS database management modules；7- self-tests and calibration software module；8- pin open-short circuit modules；9- inputs are drawn
Foot leakage current test module；10- user model test modules；11- quiescent current test modules；12-IV curve test modules；
13-USB communication function interface circuits；14-FPGA control circuits；15-DPS power circuits；16- channel control circuits；17-
SDRAM storage circuits；18- analog to digital conversion circuits；19-PMU parameter measurement circuits.
Embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment, belongs to the scope of protection of the invention.
- 3 are please referred to Fig.1, the present invention provides technical solution：Integrated circuit DC parameter I-V curve tests system, including surveys
Die trial block 1, USB2.0 communication modules 2, main control module 3, display module 4, report generation module 5, ACCESS data base administration moulds
Block 6 and self-test and calibration software module 7, the data message that test module 1 detects are transferred to master control by USB2.0 communication modules 2
Module 3, main control module 3 be electrically connected display module 4, report generation module 5, ACCESS database management modules 6 and self-test and
Calibration software module 7.
According to above-mentioned technical proposal, test module 1 includes pin open-short circuit module 8, input pin electric leakage current test
Module 9, user model test module 10, quiescent current test module 11 and IV curves test module 12.
According to above-mentioned technical proposal, pin open-short circuit module 8 includes slave computer, matrix switch module and test electricity
Road, matrix switch module includes several submodules, and each submodule includes several matrix switch chips, and each matrix is opened
Closing chip includes several TCH test channels, and the control signal input of matrix switch chip is connected with slave computer, matrix switch
The TCH test channel of chip is connected with test circuit, and the power input of matrix switch chip is equipped with an electric capacity of voltage regulation, matrix
The ground terminal of switch chip is equipped with an electric capacity of voltage regulation.
According to above-mentioned technical proposal, quiescent current test module 11 include magnetic inductive current sensor, resistance board, with
And the host computer being electrically connected with resistance board output terminal, power supply is powered by two electric wires for tested module, wherein two electric wires
In any one pass through magnetic inductive current sensor；The input terminal electricity of magnetic inductive current sensor output and resistance board
Connection；Host computer obtains the transient current value of tested module in real time by controlling resistance board, and is worth to according to transient current
The quiescent current of tested module.
According to above-mentioned technical proposal, main control module 3 include USB communication functions interface circuit 13, FPGA control circuit 14,
DPS power circuits 15, channel control circuit 16, SDRAM storage circuits 17, analog to digital conversion circuit 18 and PMU parameter measurement circuits
19, USB communication function interface circuits 13 are electrically connected USB2.0 communication modules 2, and institute's data FPGA control circuit 14 is electrically connected
DPS power circuits 15, channel control circuit 16, SDRAM storage circuits 17, analog to digital conversion circuit 18 and PMU parameter measurement circuits
19。
According to above-mentioned technical proposal, FPGA control circuit 14 includes a FPGA, and FPGA is configured to 32 NIOSII processing
Device, FPGA is by 5 I/O ports and user mutual and controls burning voltage and burning flow.
According to above-mentioned technical proposal, report generation module 5 includes setting module, receiving module, establishes module, sign module
And output module, setting module, for set conditional parameter needed for report, result parameter, result parameter numerical intervals and
The method for expressing of numerical intervals；Receiving module, for receiving initial data, which includes the conditional parameter and knot of setting
The numerical value of fruit parameter；Module is established, for establishing on the conditional parameter of setting and the report of result parameter, from the original of reception
The conditional parameter of extracting data setting and the numerical value of result parameter, and the numerical value of the conditional parameter of extraction and result parameter is led
In the report for entering foundation；Module is indicated, the method for expressing for the numerical intervals of application settings indicates respectively in the report of foundation
Numerical intervals belonging to the numerical value of a result parameter, output module, shows for exporting on report to the display device after indicating.
Operation principle：Integrated circuit I-V curve test system of the present invention uses USB2.0 communications protocol and host communication, surveys
Highest configuration is pinged up to 2048, each passage can configure ground, two kinds of power supplys and leg signal and test four kinds of patterns, host
Application program is multiple document interface, supports 7 system of Windows XP and Windows, general DC parameter such as quiescent operation electricity
The test function of stream, the impedance analysis opened between short circuit, pin of the leakage current of input pin, pin and IV curves makes test
Module, can just test, user model is familiar with DLL in technical staff as long as user has configured test condition in corresponding configuration interface
After function can flexible programming and testing logic function, the convenience used is effectively improved, so as to lift work efficiency.
Finally it should be noted that：The foregoing is only a preferred embodiment of the present invention, is not intended to limit the invention,
Although the present invention is described in detail with reference to the foregoing embodiments, for those skilled in the art, it still may be used
To modify to the technical solution described in foregoing embodiments, or equivalent substitution is carried out to which part technical characteristic.
Within the spirit and principles of the invention, any modification, equivalent replacement, improvement and so on, should be included in the present invention's
Within protection domain.
Claims (7)
1. integrated circuit DC parameter I-V curve tests system, including test module (1), USB2.0 communication modules (2), master control
Module (3), display module (4), report generation module (5), ACCESS database management modules (6) and self-test and calibration software mould
Block (7), it is characterised in that：The data message of test module (1) detection is transferred to master control by USB2.0 communication modules (2)
Module (3), the main control module (3) are electrically connected display module (4), report generation module (5), ACCESS data base administration moulds
Block (6) and self-test and calibration software module (7).
2. integrated circuit DC parameter I-V curve according to claim 1 tests system, it is characterised in that：The test
Module (1) includes pin open-short circuit module (8), input pin leakage current test module (9), user model test module
(10), quiescent current test module (11) and IV curves test module (12).
3. integrated circuit DC parameter I-V curve according to claim 2 tests system, it is characterised in that：The pin
Open-short circuit module (8) includes slave computer, matrix switch module and test circuit, and the matrix switch module includes several
Submodule, and each submodule includes several matrix switch chips, each matrix switch chip includes several TCH test channels,
The control signal input of the matrix switch chip is connected with slave computer, the TCH test channel of the matrix switch chip and survey
Examination circuit is connected, and the power input of the matrix switch chip is equipped with an electric capacity of voltage regulation, the ground connection of matrix switch chip
End is equipped with an electric capacity of voltage regulation.
4. integrated circuit DC parameter I-V curve according to claim 2 tests system, it is characterised in that：The static state
Testing current module (11) includes magnetic inductive current sensor, resistance board and is electrically connected with resistance board output terminal
Host computer, power supply by two electric wires be tested module power, wherein in two electric wires any one pass through magnetic inductive electric current
Sensor；The magnetic inductive current sensor output is electrically connected with the input terminal of resistance board；The host computer passes through control
Resistance board processed obtains the transient current value of tested module in real time, and the quiescent current of tested module is worth to according to transient current
Value.
5. integrated circuit DC parameter I-V curve according to claim 1 tests system, it is characterised in that：The master control
Module (3) includes USB communication functions interface circuit (13), FPGA control circuit (14), DPS power circuits (15), passage control
Circuit (16), SDRAM storage circuits (17), analog to digital conversion circuit (18) and PMU parameter measurement circuits (19), the USB communications
Functional interface circuit (13) is electrically connected USB2.0 communication modules (2), and institute's data FPGA control circuit (14) is electrically connected DPS electricity
Source circuit (15), channel control circuit (16), SDRAM storage circuits (17), analog to digital conversion circuit (18) and PMU parameter measurements electricity
Road (19).
6. integrated circuit DC parameter I-V curve according to claim 5 tests system, it is characterised in that：The FPGA
Control circuit (14) includes a FPGA, and the FPGA is configured to 32 NIOSII processors, the FPGA by 5 I/O ports with
User mutual simultaneously controls burning voltage and burning flow.
7. integrated circuit DC parameter I-V curve according to claim 1 tests system, it is characterised in that：The report
Generation module (5) includes setting module, receiving module, establishes module, sign module and output module, and the setting module, is used
In the method for expressing of the conditional parameter needed for setting report, result parameter, the numerical intervals of result parameter and numerical intervals；It is described
Receiving module, for receiving initial data, which includes the conditional parameter of setting and the numerical value of result parameter；It is described to build
Formwork erection block, for establishing on the conditional parameter of setting and the report of result parameter, extracts setting from the initial data of reception
Conditional parameter and result parameter numerical value, and by the numerical value of the conditional parameter of extraction and result parameter import establish report
In；The sign module, the method for expressing for the numerical intervals of application settings indicate each result ginseng in the report of foundation
Numerical intervals belonging to several numerical value, the output module, shows for exporting on report to the display device after indicating.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201711283292.4A CN108020775A (en) | 2017-12-07 | 2017-12-07 | Integrated circuit DC parameter I-V curve tests system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711283292.4A CN108020775A (en) | 2017-12-07 | 2017-12-07 | Integrated circuit DC parameter I-V curve tests system |
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| CN108020775A true CN108020775A (en) | 2018-05-11 |
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| CN201711283292.4A Pending CN108020775A (en) | 2017-12-07 | 2017-12-07 | Integrated circuit DC parameter I-V curve tests system |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109900956A (en) * | 2019-04-10 | 2019-06-18 | 苏州浪潮智能科技有限公司 | A kind of supply voltage test device and supply voltage test method |
| CN110824336A (en) * | 2019-10-10 | 2020-02-21 | 合肥格易集成电路有限公司 | Test system and test method |
| CN110940909A (en) * | 2019-10-18 | 2020-03-31 | 天津大学 | Measuring unit circuit for testing direct current parameter of integrated circuit |
| CN112485653A (en) * | 2020-11-13 | 2021-03-12 | 中国电子科技集团公司第二十四研究所 | Integrated circuit testing system and method |
| CN115932540A (en) * | 2022-11-25 | 2023-04-07 | 镇江矽佳测试技术有限公司 | Multi-channel multifunctional chip testing machine and testing method |
| CN116794491A (en) * | 2023-08-22 | 2023-09-22 | 悦芯科技股份有限公司 | Relay matrix software and hardware system for assisting remote debugging |
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| CN110940909A (en) * | 2019-10-18 | 2020-03-31 | 天津大学 | Measuring unit circuit for testing direct current parameter of integrated circuit |
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| CN116794491A (en) * | 2023-08-22 | 2023-09-22 | 悦芯科技股份有限公司 | Relay matrix software and hardware system for assisting remote debugging |
| CN116794491B (en) * | 2023-08-22 | 2023-11-24 | 悦芯科技股份有限公司 | Relay matrix software and hardware system for assisting remote debugging |
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Application publication date: 20180511 |