CN109900956A - A kind of supply voltage test device and supply voltage test method - Google Patents
A kind of supply voltage test device and supply voltage test method Download PDFInfo
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- CN109900956A CN109900956A CN201910286436.4A CN201910286436A CN109900956A CN 109900956 A CN109900956 A CN 109900956A CN 201910286436 A CN201910286436 A CN 201910286436A CN 109900956 A CN109900956 A CN 109900956A
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Abstract
The application provides a kind of supply voltage test device, comprising: the test interface module to match with power supply unit interface；For receiving the human-computer interaction module of test parameter；It is respectively connected with the test interface module and the human-computer interaction module, the test module of the supply voltage for testing said supply unit according to the test parameter.By using the test interface module to match with power supply unit interface, solves the problems, such as that the testing efficiency as caused by the processes such as interface verifying matching is low, improve testing efficiency.Meanwhile using human-computer interaction module, user can be made to be tested according to actual test demand power supply unit, be convenient for specific aim test, shorten the development cycle, realize the intelligentized control method test to power supply unit.The application also provides a kind of supply voltage test method, has above-mentioned beneficial effect.
Description
Technical field
This application involves circuit test field, in particular to a kind of supply voltage test device and supply voltage test side
Method.
Background technique
In big data era, power module, the test of reserce cell module type selecting are put forward higher requirements.It is existing to show
Wave device, multimeter are powered voltage tester, and without specific aim switching test interface, test operation is very cumbersome, and waste is a large amount of
Manpower and material resources.It is influenced by sampling rate, sampling precision, each stage reserce cell voltage of reserce cell power supply, reserce cell switching
Process supply voltage test error deviation.It is not able to satisfy storage array design selection, matching test verifying demand.
Summary of the invention
The purpose of the application is to provide a kind of supply voltage test device and supply voltage test method, solves the prior art
In can not to power module carry out specific aim test the problem of
In order to solve the above technical problems, the application provides a kind of supply voltage test device, specific technical solution is as follows:
The test interface module to match with power supply unit interface；
For receiving the human-computer interaction module of test parameter；
It is respectively connected with the test interface module and the human-computer interaction module, for being tested according to the test parameter
The test module of the supply voltage of said supply unit.
Wherein, the test interface module includes switching test interface unit and mainboard measurement point test interface unit.
Wherein, the test module includes:
Signal processing circuit, for sampled signal to be processed into single-chip microcontroller high speed AD sampling matched signal.
Wherein, the test module includes:
Clamp protection circuits are used to protect single-chip microcontroller, I/O mouthfuls of high speed AD sampling when abnormal signal.
Wherein, the test module includes:
Sampling control circuit, for sending high speed AD sampling circuit or list for the sampled signal according to sample requirement
Band AD sample circuit in piece machine.
Wherein, further includes:
Single-chip microcontroller comprising clock circuit and reset circuit.
Wherein, the test module includes:
Communication interface protection circuit, for protecting microcontroller communication mouth, LCD liquid crystal display communication interface.
Wherein, further includes:
Initialization module, for the single-chip microcontroller and communication interface initialization of register.
Wherein, the human-computer interaction module includes LCD liquid crystal display.
The application also provides a kind of supply voltage test method, applied to supply voltage test device described above, packet
It includes:
Human-computer interaction module receives test parameter；
Using test module according to the test parameter and by test interface module to the supply voltage of power supply unit into
Row test；Wherein, the test interface module is connected with the interface of said supply unit.
The application provides a kind of supply voltage test device, comprising: the test interface mould to match with power supply unit interface
Block；For receiving the human-computer interaction module of test parameter；Phase is distinguished with the test interface module and the human-computer interaction module
Even, for testing the test module of the supply voltage of said supply unit according to the test parameter.
The application is solved by using the test interface module to match with power supply unit interface due to interface verifying
With etc. the low problem of testing efficiency caused by processes, improve testing efficiency.Meanwhile using human-computer interaction module, can make
User tests power supply unit according to actual test demand, is convenient for specific aim test, shortens the development cycle, realizes
The intelligentized control method of power supply unit is tested.The application also provides a kind of supply voltage test method, has above-mentioned beneficial to effect
Fruit, details are not described herein again.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of application for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of supply voltage schematic structural diagram of testing device provided by the embodiment of the present application；
Fig. 2 is a kind of supply voltage test method flow chart provided by the embodiment of the present application.
Specific embodiment
To keep the purposes, technical schemes and advantages of the embodiment of the present application clearer, below in conjunction with the embodiment of the present application
In attached drawing, the technical scheme in the embodiment of the application is clearly and completely described, it is clear that described embodiment is
Some embodiments of the present application, instead of all the embodiments.Based on the embodiment in the application, those of ordinary skill in the art
Every other embodiment obtained without making creative work, shall fall in the protection scope of this application.
Referring to FIG. 1, Fig. 1 is a kind of supply voltage schematic structural diagram of testing device provided by the embodiment of the present application, it should
Supply voltage test device may include:
The test interface module to match with power supply unit interface；
For receiving the human-computer interaction module of test parameter；
It is respectively connected with test interface module and human-computer interaction module, for testing the confession of power supply unit according to test parameter
The test module of piezoelectric voltage.
Test interface module may include switching test interface unit and mainboard measurement point test interface unit.Switching test
Interface unit can be used for supply voltage test device and be connected with supply intelligent fault simulation system.And the test of mainboard measurement point connects
Mouth unit is used to be connected with unified storage array mainboard.In general, supply voltage test device provided herein mainly for
In unified storage array mainboard, since unified storage array mainboard includes multiple branches, and the power supply interface of each branch may not
It is identical to the greatest extent, and supply voltage standard may also be different, therefore are difficult to carry out electricity for unified storage array mainboard in the prior art
Pressure test, reason are inconvenient for unified storage array mainboard progress test parameter setting.And mainboard provided by the present application is surveyed
Examination interface unit and switching test interface unit can satisfy the testing requirement of different branch, when there are distinct interface or different electricity
When the branch of pressure standard, the switching that can use switching test interface unit progress interface is convenient for realize the unification of interface
Voltage tester.
Test module is connected with test interface module and human-computer interaction module respectively.Specifically, with test interface module phase
Even, it can receive the related data for the power supply unit that test interface module is directly obtained, mainly include voltage.It needs to illustrate
It is that test module can call different sampling control algorithms to meet sampling request according to sample requirement.While test module is also
It can receive the user operation instruction that human-computer interaction module receives, and power supply unit surveyed according to user operation instruction
Examination, so it is easy to understand that include relevant test circuit in test module.Specifically, the application provides one kind preferably herein
Scheme, the test module may include following several test circuits or structure:
Signal processing circuit, for sampled signal to be processed into single-chip microcontroller high speed AD sampling matched signal.
Clamp protection circuits are used to protect single-chip microcontroller, I/O mouthfuls of high speed AD sampling when abnormal signal.
Sampling control circuit, for sending high speed AD sampling circuit or single-chip microcontroller for sampled signal according to sample requirement
Interior band AD sample circuit.
Signal processing circuit, can be to adopting after treatment for the ease of single-chip microcontroller for handling sampled signal
Sample signal is handled, and can simply be understood as handling sampled signal so that sampled signal becomes single-chip microcontroller and can locate
The high speed AD sampling matched signal of reason.
Clamp protection circuits are actually overvoltage crowbar, once there is abnormal signal, can protect single-chip microcontroller or
I/O mouthfuls by the damage of transient high voltage.
Sampling control circuit be actually the user operation instruction determination that is received according to human-computer interaction module be actually by
Sampled signal is sent to band AD sample circuit in high speed AD sampling circuit or single-chip microcontroller.Certainly, specifically it is sent to which AD is adopted
Sample circuit should make corresponding selection according to the power supply unit of actual test by those skilled in the art, be not specifically limited herein.
It should be pointed out that the sampled signal that sampling control circuit is sent is usually the single-chip microcontroller for passing through signal processing circuit and handling
High speed AD sampling matched signal.The sending direction that sampled signal can certainly be controlled first with sampling control circuit, recycles
Signal processing circuit carries out signal processing to sampled signal.
It is easily understood that the core of test module is usually single-chip microcontroller, certainly, when also including that single-chip microcontroller is almost indispensable
Clock circuit and reset circuit.Specific single-chip microcontroller model is not construed as limiting herein.
Preferably, test module may include:
Communication interface protection circuit, for protecting microcontroller communication mouth, LCD liquid crystal display communication interface.
Communication interface protection circuit is mainly used for that microcontroller communication mouth and the communication of LCD liquid crystal display is protected to connect under abnormal conditions
Mouthful, abnormal conditions here include but is not limited in device transient current caused by the reasons such as short circuit it is excessive etc..
Preferably, which can also include:
Initialization module, for single-chip microcontroller and communication interface initialization of register.
When being ready for power supply unit test every time, it is required to initialize supply voltage test device, initially
Change module mainly to initialize single-chip microcontroller and communication interface register, for the data that empty the cache etc..
Preferably, which can also include:
Test result processing module for handling test result, while storing test result.Specifically, processing test knot
It should also include the relevant information of test result in addition to test result when can classify to test result, and store when fruit,
Such as test type, version information etc..Specifically, can store in LCD FLASH.
The effect of human-computer interaction module is the operational order for receiving user, and is sent to test module.Herein for man-machine
The concrete form of interactive module is not construed as limiting, such as may include LCD liquid crystal display, and all information of man-machine interactive interface are shown
On LCD.Certainly, so it is easy to understand that human-computer interaction module should also be equipped with input unit, which includes but is not limited to
The equipment such as keyboard or touch screen.In addition, human-computer interaction module also typically includes communication unit, i.e., the operational order of user is sent out
It send to test module.The particular content of user operation instruction is not construed as limiting herein, for example, may include test function selection,
The contents such as test parameter setting, test parameter are usually to make corresponding setting according to storage array type.Likewise, single for communication
The concrete form of member is not construed as limiting, usually communication interface corresponding with communication interface in test module.Certainly, herein not
It is required that the communication interface type in test module is identical as the communication interface type on human-computer interaction module, specific communication interface class
Type can be done according to demand corresponding setting by those skilled in the art.Further, it is also possible to using wireless communication mode, such as bluetooth,
Zigbee etc..
Certainly, other than test interface module, human-computer interaction module and test module, which is also needed
To include power supply module, be mainly used for as test module power supply, naturally it is also possible to be concurrently or separately human-computer interaction module and survey
Try interface module power supply.Need at this time according between three degree of coupling determine power supply module be specially a component or by
Multiple components are constituted, and individual Power Supply Assembly can be set in test interface module, human-computer interaction module and test module, or
Entire supply voltage test device is simultaneously three module for power supply by power supply module.
Specifically, being based on the various embodiments described above, when executing test, process be can be such that
After connecting equipment to be tested using test interface module, initialization module first will be in supply voltage test device
Each device is initialized, and hereafter, the communication unit in human-computer interaction module obtains test function selection, setting test parameter etc.
Information, at the same information can be shown with LCD liquid crystal display on.At this point, after taking sampled signal, first with signal processing circuit
Sampled signal is processed into single-chip microcontroller high speed AD sampling matched signal, sampling control circuit is recycled, sends sampled signal to
Band AD sample circuit in high speed AD sampling circuit or single-chip microcontroller.After test, is handled and tested using test result processing module
As a result, storing test result simultaneously.Finally, can use human-computer interaction module to user feedback test result.
The application is solved by using the test interface module to match with power supply unit interface due to interface verifying
With etc. the low problem of testing efficiency caused by cumbersome process, improve testing efficiency.It, can meanwhile using human-computer interaction module
So that user tests power supply unit according to actual test demand, it is convenient for specific aim test, shortens exploitation week
Phase realizes the intelligentized control method test to power supply unit.
Referring to fig. 2, Fig. 2 is a kind of supply voltage test method flow chart provided by the embodiment of the present application, and the application is also
A kind of supply voltage test method is provided, applied to supply voltage test device described in each embodiment above, specific test side
Method includes:
S101: human-computer interaction module receives test parameter；
S102: using test module according to the test parameter and by test interface module to the power supply electricity of power supply unit
Pressure is tested；Wherein, the test interface module is connected with the interface of said supply unit.
Since a kind of supply voltage test method provided by the embodiments of the present application can be based on embodiments described above
In supply voltage test device, therefore supply voltage Test Methods section specific embodiment process and supply voltage test device
Specific test process as described in the examples can correspond to each other reference, and test interface module, human-computer interaction module and survey
The concrete form and parameter of die trial block can refer to each embodiment above, be not repeated explanation herein.
Each embodiment is described in a progressive manner in specification, the highlights of each of the examples are with other realities
The difference of example is applied, the same or similar parts in each embodiment may refer to each other.For embodiment provide system and
Speech, since it is corresponding with the method that embodiment provides, so being described relatively simple, related place is referring to method part illustration
?.
Specific examples are used herein to illustrate the principle and implementation manner of the present application, and above embodiments are said
It is bright to be merely used to help understand the present processes and its core concept.It should be pointed out that for the ordinary skill of the art
For personnel, under the premise of not departing from the application principle, can also to the application, some improvement and modification can also be carried out, these improvement
It is also fallen into the protection scope of the claim of this application with modification.
It should also be noted that, in the present specification, relational terms such as first and second and the like be used merely to by
One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation
Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant meaning
Covering non-exclusive inclusion, so that the process, method, article or equipment for including a series of elements not only includes that
A little elements, but also including other elements that are not explicitly listed, or further include for this process, method, article or
The intrinsic element of equipment.In the absence of more restrictions, the element limited by sentence "including a ...", is not arranged
Except there is also other identical elements in the process, method, article or apparatus that includes the element.
Claims (10)
1. a kind of supply voltage test device characterized by comprising
The test interface module to match with power supply unit interface；
For receiving the human-computer interaction module of test parameter；
It is respectively connected with the test interface module and the human-computer interaction module, for according to test parameter test
The test module of the supply voltage of power supply unit.
2. supply voltage test device according to claim 1, which is characterized in that the test interface module includes switching
Test interface unit and mainboard measurement point test interface unit.
3. supply voltage test device according to claim 1, which is characterized in that the test module includes:
Signal processing circuit, for sampled signal to be processed into single-chip microcontroller high speed AD sampling matched signal.
4. supply voltage test device according to claim 3, which is characterized in that the test module includes:
Clamp protection circuits are used to protect single-chip microcontroller, I/O mouthfuls of high speed AD sampling when abnormal signal.
5. supply voltage test device according to claim 3, which is characterized in that the test module includes:
Sampling control circuit, for sending high speed AD sampling circuit or single-chip microcontroller for the sampled signal according to sample requirement
Interior band AD sample circuit.
6. supply voltage test device according to claim 5, which is characterized in that further include:
Single-chip microcontroller comprising clock circuit and reset circuit.
7. supply voltage test device according to claim 6, which is characterized in that the test module includes:
Communication interface protection circuit, for protecting microcontroller communication mouth, LCD liquid crystal display communication interface.
8. supply voltage test device according to claim 1, which is characterized in that further include:
Initialization module, for the single-chip microcontroller and communication interface initialization of register.
9. supply voltage test device according to claim 1, which is characterized in that the human-computer interaction module includes LCD
Liquid crystal display.
10. a kind of supply voltage test method is applied to the described in any item supply voltage test devices of claim 1-9,
It is characterized in that, comprising:
Human-computer interaction module receives test parameter；
It is surveyed using test module according to the test parameter and by supply voltage of the test interface module to power supply unit
Examination；Wherein, the test interface module is connected with the interface of said supply unit.
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| CN201910286436.4A CN109900956A (en) | 2019-04-10 | 2019-04-10 | A kind of supply voltage test device and supply voltage test method |
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Cited By (1)
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| CN111273105A (en) * | 2020-03-03 | 2020-06-12 | 海信集团有限公司 | Intelligent household appliance and power supply detection method thereof |
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Application publication date: 20190618 |