CN208384003U - A kind of test device and system - Google Patents
A kind of test device and system Download PDFInfo
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- CN208384003U CN208384003U CN201820667078.2U CN201820667078U CN208384003U CN 208384003 U CN208384003 U CN 208384003U CN 201820667078 U CN201820667078 U CN 201820667078U CN 208384003 U CN208384003 U CN 208384003U
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Abstract
The utility model relates to STORAGE MEASUREMENT TECHNIQUE fields, disclose a kind of test device and system, the test device is used to store the multifunctional testing of equipment, the test device includes at least one slave computer, each slave computer includes: veneer, it is communicated to connect respectively with host computer and the storage equipment, the test instruction sent for receiving and executing the host computer, and returns to the multifunctional testing result to the storage equipment to the host computer；Measurement module is connect with the veneer by unified interface, for receiving the test instruction from the veneer, to realize the multifunctional testing to the storage equipment.By the above-mentioned means, the utility model can be realized the multifunctional testing of storage equipment, testing efficiency is improved, reduces testing cost.
Description
Technical field
The utility model embodiment is related to STORAGE MEASUREMENT TECHNIQUE field, more particularly to a kind of test device and system.
Background technique
Storing equipment includes USB flash disk (USB flash drive, USB flash disk), SSD (solid state hard disk, Solid State
Drive), eMMC (built-in multimedia storage card, Embedded Multi Media Card), eMCP (embedded type multi-core piece envelope
Dress, embedded Multi Chip Package), UFS (Common Flash Memory storage, Universal Flash Storage), SD
Block equipment such as (safe digital storage card, Secure Digital Memory Card), is widely used in various products, example
Such as computer, mobile phone electronic product.
Currently, storing software as storage industry technology is fast-developing and related hardware being increasingly complicated, for enterprise
It is most important to release product to market how fast and reliablely for speech.In the development process of storage equipment, testing process is play
Important role, therefore, improve testing efficiency and reduce testing cost, for improve storage equipment product competitiveness to close weight
It wants.Currently, being carried out generally be directed to different working conditions using instrument for the test for storing equipment electrical characteristic parameter
Independent measurement, alternatively, being tested using programmable instrument and test device are online.
Utility model people has found during realizing the utility model embodiment: these current test methods, mainly
There are testing procedure is cumbersome and the higher disadvantage of testing cost, since there are a variety of working conditions for storage equipment, if each
Kind working condition will use instrument individually measure, then test process is very cumbersome, and testing efficiency is lower；And if used
Programmable instrument carries out online testing, then needs to purchase expensive programmable instrument, and testing cost is higher.
Utility model content
The utility model embodiment provides a kind of test device and system, to solve storage equipment of the existing technology
Testing efficiency is low, the high technical problem of testing cost.
In order to solve the above-mentioned technical problem, the utility model embodiment the following technical schemes are provided:
In a first aspect, the utility model embodiment provides a kind of test device, for storing the multifunctional testing of equipment, institute
Stating test device includes at least one slave computer, and each slave computer includes:
Veneer is communicated to connect with host computer and the storage equipment respectively, is sent for receiving and executing the host computer
Test instruction, and to the host computer return to it is described storage equipment multifunctional testing result；
Measurement module is connect with the veneer by unified interface, for receiving the test instruction from the veneer, with
Realize the multifunctional testing to the storage equipment.
In some embodiments, the veneer includes:
Host computer connecting interface, for connecting the host computer；
Measurement module connecting interface, for connecting the measurement module；
Equipment connecting interface is stored, for connecting the storage equipment；
Chip is controlled, the control chip connects the measurement module connecting interface and the storage equipment connecting interface,
The control chip, which is used to be instructed according to the test, controls the storage equipment and the measurement module.
In some embodiments, the veneer further includes power module, and the power module is used to be the measurement module
Power input is provided.
In some embodiments, the measurement module includes:
Multichannel adjustable voltage power supply unit, for providing multichannel adjustable voltage power supply for the storage equipment；
Multiple power supplies on-off control unit, for controlling the on-off of the multichannel adjustable voltage power supply；
Plurality of voltages measuring unit, for measuring the multiple-way supply voltage of the storage equipment；
Multichannel current measuring unit, for measuring the multiple-way supply electric current of the storage equipment；
Temperature measurement unit, for measuring the environment temperature of the storage equipment；
Processing unit, respectively with the multichannel adjustable voltage power supply unit, multiple power supplies on-off control unit, plurality of voltages
Measuring unit, multichannel current measuring unit and temperature measurement unit connection, for carrying out different operating shape to the storage equipment
The measurement of electrical characteristic parameter, the measurement of environment temperature under state and the control of multiple power supplies on-off is carried out to the storage equipment
System.
In some embodiments, the measurement module further include:
Connector interface, for connecting the measurement module connecting interface of the veneer by the first connector.
In some embodiments, the measurement module connecting interface and the connector interface use identical agreement,
And it is defined as unified interface.
In some embodiments, the multichannel adjustable voltage power supply of the multichannel adjustable voltage power supply unit output passes through described
First connector is input to the veneer, then the multichannel adjustable voltage power supply is output to the storage by the veneer and is set
It is standby.
In some embodiments, the slave computer further include: storage equipment adapter unit, including storage device interface and list
Plate connecting interface for connecting the storage equipment by the storage device interface, and is connected by the veneer connecting interface
The veneer is connect, to realize the communication connection of the storage equipment and the veneer.
Second aspect, the utility model embodiment provide a kind of test macro, comprising: host computer, at least one storage are set
Standby and at least one above-mentioned test device；
The host computer connects the test device, and each test device and each storage equipment pass through second
Connector is correspondingly connected with.
In some embodiments, the host computer is by cable with fixed communication agreement and the test device communication link
It connects.
The beneficial effect of the utility model embodiment is: being in contrast to the prior art, the utility model embodiment party
Formula provides a kind of test device and system, and the test device is used to store the multifunctional testing of equipment, the test device packet
At least one slave computer is included, each slave computer includes: veneer, it is communicated to connect respectively with host computer and the storage equipment,
The test instruction sent for receiving and executing the host computer, and more function to the storage equipment are returned to the host computer
It can test result；Measurement module is connect by unified interface with the veneer, is referred to for receiving the test from the veneer
It enables, to realize the multifunctional testing to the storage equipment.By the above-mentioned means, the utility model embodiment can be realized and deposit
The multifunctional testing of equipment is stored up, testing efficiency is improved, reduces testing cost.
Detailed description of the invention
One or more embodiments are illustrated by corresponding attached drawing, these exemplary illustrations not structure
The restriction of pairs of embodiment, the element with same reference numbers label is expressed as similar element in attached drawing, unless there are special
It declares, composition does not limit the figure in attached drawing.
Fig. 1 is a kind of structural schematic diagram of the test device of multiple slave computers provided by the embodiment of the utility model；
Fig. 2 is a kind of structural schematic diagram of the test device of single slave computer provided by the embodiment of the utility model；
Fig. 3 is the structural schematic diagram of the test device of another single slave computer provided by the embodiment of the utility model；
Fig. 4 is a kind of structural schematic diagram of test macro provided by the embodiment of the utility model；
Fig. 5 is a kind of structural schematic diagram of veneer provided by the embodiment of the utility model；
Fig. 6 is a kind of connection schematic diagram of veneer provided by the embodiment of the utility model；
Fig. 7 is a kind of structural schematic diagram for storing equipment provided by the embodiment of the utility model；
Fig. 8 is a kind of structural schematic diagram of measurement module provided by the embodiment of the utility model；
Fig. 9 is a kind of structural schematic diagram for storing equipment adapter unit provided by the embodiment of the utility model.
Referring to Fig. 1 to Fig. 9,100, test device；10, slave computer；11, veneer；111, chip is controlled；112, host computer connects
Connection interface；113, measurement module connecting interface；114, equipment connecting interface is stored；115, power module；12, measurement module；
121, processing unit；122, connector interface；123, multichannel adjustable voltage power supply unit；124, the control of multiple power supplies on-off is single
Member；125, plurality of voltages measuring unit；126, multichannel current measuring unit；127, temperature measurement unit；13, storage equipment switching
Unit；131, storage device interface；132, veneer connecting interface；14, cable；15, the first connector；16, the second connector；
200, equipment is stored；210, test interface；220, storage unit；300, host computer；400, test macro.
Specific embodiment
For the ease of understanding the utility model, with reference to the accompanying drawings and detailed description, the utility model is carried out more
Detailed description.It should be noted that it can be directly in another element when element is expressed " being fixed on " another element
Upper or placed in the middle there may be one or more therebetween elements.When an element is expressed " connection " another element, it can
To be directly to another element or elements placed in the middle there may be one or more therebetween.This specification is used
Term "vertical", "horizontal", "left" and "right" and similar statement for illustrative purposes only.
Unless otherwise defined, technical and scientific term all used in this specification and the skill for belonging to the utility model
The normally understood meaning of the technical staff in art field is identical.Art used in the description of the utility model in this specification
Language is only for the purpose of describing specific embodiments, and is not intended to limitation the utility model.Art used in this specification
Language "and/or" includes any and all combinations of one or more related listed items.
The utility model embodiment provides a kind of test device and system, for solving existing storage in the prior art
The test process of equipment is cumbersome, and testing efficiency is low, alternatively, carrying out online testing by programmable instrument, needs to purchase valuableness
Programmable instrument leads to the technical problem that testing cost is high, to realize multifunctional testing, improves testing efficiency, reduce test at
This.
In order to solve the above technical problems, general thought is as follows for the technical solution of the utility model embodiment:
Test macro provided by the embodiment of the utility model, comprising:
Host computer, for sending test instruction and showing and check test result.Specifically, the host computer can be meter
The electronic equipments such as calculation machine, smart phone, tablet computer.
At least one slave computer, each slave computer connect the host computer, each slave computer include: veneer with
And measurement module.Each slave computer connects a storage equipment, wherein each veneer and the host computer and described
Store equipment communication connection.Specifically, the veneer refers to that single circuit board, the veneer are printed circuit board or printing electricity
Road plate, the storage equipment are memory or other storage mediums, and the storage equipment includes USB flash disk (USB flash drive, USB
Flash disk), SSD (solid state hard disk, Solid State Drive), eMMC (built-in multimedia storage card, Embedded
Multi Media Card), eMCP (embedded type multi-core piece encapsulation, embedded Multi Chip Package), UFS it is (general
Flash memory storage, Universal Flash Storage), SD card (safe digital storage card, Secure Digital Memory
The equipment such as Card), the measurement module are tester or test machine.
Wherein, the veneer is communicated to connect with the host computer and the storage equipment respectively, described in the veneer bridge joint
Host computer, storage equipment and measurement module.After the veneer is communicated with host computer foundation, the control chip of the veneer
The test instruction sent by receiving the host computer, is instructed by executing the test, to the storage equipment or the survey
Amount module is operated.The measurement module, which passes through, receives the test instruction that the control chip of the veneer is sent, with realization pair
The multifunctional testing of the storage equipment.
It is practical new below in conjunction with this to keep the objectives, technical solutions, and advantages of the embodiments of the present invention clearer
Attached drawing in type embodiment, is clearly and completely described the technical solution of the utility model, it is clear that described implementation
Example is a part of the embodiment of technical solutions of the utility model, instead of all the embodiments.Based on being recorded in present specification
Embodiment, every other embodiment obtained by those of ordinary skill in the art without making creative efforts,
Belong to the range of technical solutions of the utility model protection.
Embodiment 1
It is a kind of survey including multiple slave computers provided by the embodiment of the utility model also referring to Fig. 1 and Fig. 2, Fig. 1
The structural schematic diagram that trial assembly is set；Fig. 2 is a kind of structure of the test device of single slave computer provided by the embodiment of the utility model
Schematic diagram.
As shown in Figure 1, the test device 100 include multiple slave computers, respectively slave computer 1, slave computer 2, slave computer 3,
Slave computer 4, slave computer 5 ..., slave computer N, wherein each slave computer includes veneer and measurement module, each slave computer
A storage equipment is connected, the slave computer and the storage equipment correspond, and each slave computer passes through the veneer
It is communicated to connect with the storage equipment.Specifically, only including a slave computer in the utility model embodiment with test device 100
For be illustrated.
As shown in Fig. 2, the test device 100 includes a slave computer 10, the slave computer 10 includes veneer 11 and measurement
Module 12.Wherein, the slave computer 10 connects a storage equipment 200, the veneer 11 respectively with the storage equipment 200 with
And measurement module 12 connects.Specifically, the veneer 11 and the storage equipment 200 and measurement module 12 can pass through system
One interface is communicatively coupled, and the unified interface can be general-purpose interface, such as: serial ports, micro usb interface, USB
TypeA interface, USB TypeB interface, USB TypeC interface, cable mouth, earphone jack, SD card interface, sensor interface, reading
Write at least one of device interface.
Wherein, can carry out data transmission between the veneer 11 and the storage equipment 200, measurement module 12 or power supply
Input.The veneer 11 can be by sending test instruction to the storage equipment 200 and the measurement module 12, and then controls
The storage equipment 200 and measurement module 12.
It is the knot of the test device of another single slave computer provided by the embodiment of the utility model referring again to Fig. 3, Fig. 3
Structure schematic diagram；
As shown in figure 3, the slave computer 10 includes: veneer 11, measurement module 12 and storage equipment adapter unit 13.Its
In, the veneer 11 is separately connected the measurement module 12 and the storage equipment adapter unit 13, and the storage equipment turns
Order member 13 connects a storage equipment 200.It, cannot since connecting interface may and be not present in the storage equipment 200 itself
Veneer 11 directly with the host computer 10 is attached, and therefore, it is necessary to by storing equipment adapter unit 13 for the storage
Equipment 200 is attached with the veneer 11, realizes the multifunctional testing to the storage equipment 200.Such as: the storage is set
Standby 200 be SD card, and the storage equipment adapter unit 13 is card reader, and the SD card is realized and the list by the card reader
The connection of plate 11, and then realize the multifunctional testing to the SD card.
Referring to Fig. 4, Fig. 4 is a kind of structural schematic diagram of test macro provided by the embodiment of the utility model；
As shown in figure 4, the test macro 400 include: at least one test device 100, at least one storage equipment 200 with
And host computer 300.Wherein, each test device 100 include slave computer 10, the slave computer 10 include: veneer 11 and
Measurement module 12.The host computer 300 connects the test device 100, each test device 100 and each storage
Equipment 200 is correspondingly connected with by the second connector.Each storage equipment includes test interface, and the test interface is for leading to
It crosses the second connector and connects the corresponding test device of the storage equipment.
Wherein, the veneer 11 is communicated to connect with the host computer 300, is sent out for receiving and executing the host computer 300
The test instruction sent, and test result is returned to the host computer 300.Specifically, the host computer 300 can be intelligent hand
Machine, tablet computer or computer.In the utility model embodiment, the host computer 300 is by taking computer as an example.Specifically, institute
The computer that host computer 300 refers to directly issuing test instruction or operational order is stated, the host computer 300 can pass through
Screen, display and check test result.The host computer 300 can be also used for storing at least one the storage equipment 200
Test result, specifically, can be stored the test result of at least one the storage equipment 200 by the host computer 300
To Cloud Server or local server.In the utility model embodiment, the slave computer 10 can be control storage equipment 200
And the computer of the data of storage equipment 200 is obtained, such as single-chip microcontroller, the slave computer 10 can be according to the host computers 300
The test of transmission instructs, and test result is returned to the host computer 300 after testing the storage equipment 200, described
Host computer 300 will show and verify the test result.It is cooperated by host computer 300 and slave computer 10, may be implemented one
Electrical characteristic parameter under a variety of working conditions of at least one the storage equipment 200 of secondary test, the storage equipment 200
Working condition include: read operation state, write operation state, read-write operation state, without working conditions such as read-write operation states, it is described
Electrical characteristic parameter includes: voltage, electric current etc., the electricity under a variety of working conditions by once testing the storage equipment 200
Gas characterisitic parameter can be improved testing efficiency, and reduce testing cost.
Wherein, the host computer 300 and the slave computer 10 are communicated using identical communications protocol, the communication protocols
View can be a variety of, such as: it can also be used more suitable by the serial communication of RS232 or using RS485 serial communication
The PROFI BUS-DP communication of the two-wire of Industry Control is closed, or can be controlled on described by writing the interface protocol of driving class
The communication of position machine 300 and the slave computer 10.In the utility model embodiment, the host computer 300 and the slave computer 10
Veneer 11 communicate to connect, specifically, the host computer 300 is connected with the veneer 11 by cable, the cable includes:
USB cable, Serial Port Line, the veneer 11 are communicated with the host computer 300 by fixed protocol, the fixed protocol packet
It includes: usb protocol, serial communication protocol, serial communication protocol.Specifically, the communication protocol can be nonvolatile memory
Quickly (NVMe), peripheral component interconnection quick (PCIe), attachment serial (SATA), small computer system interface (SCSI), string
Row connection SCSI (SAS), universal storage bus (USB) connect SCSI (UAS), Internet Small Computer Systems Interface
(iSCSI), one or more of optical-fibre channel or Ethernet optical-fibre channel (FCoE) etc..Wherein, the host computer 300 carries out
The collaborative work with the slave computer 10 may be implemented after customized development, specifically, the customized development includes: for test function
Can customized development test software, communication protocol matching, test result show, test result verifies, UI interactive interface customizes etc..
It is understood that the host computer 300 can also be separately connected with multiple slave computers 10, specifically, on described
Position machine 300 includes multiple interfaces, and the veneer 11 of the host computer 300 and the multiple slave computer 10 communicates to connect respectively, each
Slave computer 10 has fixed number, such as: slave computer 1, slave computer 2, slave computer 3 ..., slave computer N.Host computer can be simultaneously
Test instruction is sent to the multiple slave computer 10, since each slave computer 10 is all connected with a storage equipment 200, can
To test simultaneously multiple storage equipment 200, the electrical characteristic under the different working condition of multiple storage equipment 200 is tested
Parameter, such as: the parameters such as voltage, electric current are conducive to improve testing efficiency, reduce testing cost.
Referring to Fig. 5, Fig. 5 is a kind of structural schematic diagram of veneer provided by the embodiment of the utility model；
As shown in figure 5, the veneer 11 includes control chip 111, host computer connecting interface 112, measurement module connecting interface
113, equipment connecting interface 114 and power module 115 are stored.Wherein, the control chip 111 is separately connected the host computer
Connecting interface 112, measurement module connecting interface 113, storage equipment connecting interface 114 and power module 115, the control core
The test instruction that piece 111 is sent by host computer 300 described in cable reception controls the storage equipment according to test instruction
200 and the measurement module 12.The control chip 111 be also used to control the power module 115 to the measurement module or
Storage equipment is powered.
It is a kind of connection schematic diagram of veneer provided by the embodiment of the utility model referring again to Fig. 6, Fig. 6；
As shown in fig. 6, the host computer connecting interface 112 of the veneer 11 connects the host computer 300 by cable 14,
In, the host computer connecting interface 112 can be data interaction interface, and the cable 14 includes: USB cable, Serial Port Line, described
Veneer 11 is communicated with the host computer 300 by communication protocol, realizes the interaction of data.Specifically, the communication protocol
It can be nonvolatile memory quickly (NVMe), peripheral component interconnection quickly (PCIe), attachment serial (SATA), small-sized calculating
Machine system interface (SCSI), Serial Attached SCSI (SAS) (SAS), universal storage bus (USB) connect SCSI (UAS), internet small
One or more of computer system interface (iSCSI), optical-fibre channel or Ethernet optical-fibre channel (FCoE) etc..In order to guarantee
The stability of the communication of host computer 300 and slave computer is generally led to using fixed between the veneer 11 and the host computer 300
Letter agreement is communicated, and the stability for improving data interaction between host computer 300 and slave computer is conducive to.
Wherein, the slave computer further includes the first connector 15, and the measurement module connecting interface 113 of the veneer 11 passes through
First connector 15 connects the measurement module 12, specifically, the measurement module connecting interface 113 of the veneer 11 is described in
First connector 15 connects the connector interface of the measurement module 12, by the first connector 15 of the slave computer, realizes
The connection of the veneer 11 and the measurement module 12.Specifically, first connector 15 can be USB data line, serial
Bus, Serial Port Line, twisted pair etc., first connector 15 can be used between the veneer 11 and the measurement module 12
Data transmission.First connector 15 can be also used for the veneer 11 and export direct current piezoelectricity to the measurement module 12
Source.
Wherein, the slave computer further includes the second connector 16, and the storage equipment connecting interface 114 of the veneer 11 connects
Equipment adapter unit 13 is stored, the storage equipment adapter unit 13 connects the storage equipment by second connector 16
200, specifically, the storage equipment connecting interface 114 of the veneer 11 connects the storage equipment adapter unit 13, the storage
Equipment adapter unit 13 connects the storage equipment 200 by second connector 16, such as: the storage equipment 200 is
SD card, the storage equipment adapter unit 13 are card reader, and the SD card is realized and the veneer 11 by the card reader
Connection, and then realize the multifunctional testing to the SD card.Or, it may not be necessary to the storage equipment adapter unit 13, directly
The second connector 16 of the slave computer was connected, the storage equipment 200 is connected, realizes that the veneer 11 and the storage are set
Standby 200 connection.For example, the storage equipment 200 is USB flash disk, the USB flash disk directly pass through second connector 16 connect it is described
Store equipment connecting interface 114.Specifically, second connector 16 can be USB data line, universal serial bus, Serial Port Line, double
Twisted wire etc., second connector 16 can be used for the data transmission between the veneer 11 and the storage equipment 200.It is described
Second connector 16 can be also used for the veneer 11 to 200 out-put supply of storage equipment, specifically, can deposit to described
Store up 200 output multi-channel adjustable voltage power supply of equipment.Wherein, second connector 16 and first connector 15 can phases
Together, it can also be different.It is understood that veneer 11 bridges the measurement module 12 and storage equipment 200 for convenience, it is described
First connector 15 and the second connector 16 can carry out unification, and first connector 15 and the second connector 16 are unified for
One of USB data line, universal serial bus, Serial Port Line or twisted pair are conducive to veneer 11 and the measurement module 12 and storage
Data interaction between equipment 200, the reliability of improve data transfer.
Wherein, the power module 115 of the veneer 11 connects the measurement module connecting interface 113 and storage equipment connects
Connection interface 114, the power module 115 pass through the measurement module connecting interface 113 and/or the storage equipment connecting interface
114 provide power input for the measurement module 12 and/or storage equipment 200.Specifically, the power module 115 can be
Battery, dry cell, DC power supply, AC power source, Switching Power Supply, ups power, converter power supply etc..Wherein, the power supply mould
Block 115 can be also used for receiving the power supply that the host computer 300 exports.
Referring to Fig. 7, Fig. 7 is a kind of structural schematic diagram for storing equipment provided by the embodiment of the utility model；
As shown in fig. 7, the storage equipment 200 includes: test interface 210 and storage unit 220.Wherein, the test
Interface 210 is for connecting the veneer, and the test interface 210 is used to carry out data transmission with the veneer and power supply is defeated
Enter, wherein the test interface 210 connects the storage equipment connecting interface of the veneer, specifically, the test interface 210
Connect by the second connector with the storage equipment connecting interface of the veneer, thus realize the storage equipment 200 with it is described
Data transmission and power input between veneer.Specifically, the veneer receives the test instruction that host computer is sent, the list
Plate sends the storage equipment 200 for test instruction by second connector, is instructed and is obtained according to the test
The data of the storage equipment 200 and/or the storage equipment 200 is operated, such as I/O operation, alternatively, can also obtain
The internal information of the storage equipment 200 is taken, the internal information includes: the memory size for storing equipment 200, model coding etc.
Information.
Wherein, the test interface 210 can be serial ports, micro usb interface, USB TypeA interface, USB TypeB
Interface, USB TypeC interface, cable mouth, earphone jack, SD card interface, sensor interface, at least one in reader interface
Kind.Wherein, the test interface 210 can be identical as the storage equipment connecting interface of the veneer.Pass through the unified veneer
Storage equipment connecting interface and it is described storage equipment 200 test interface 210, ensure that the veneer under different hardware scheme can
To be applicable in the storage equipment 200, veneer is only needed to change in the case where veneer changes, reaches recycling and drop
The effect of low cost.
Wherein, for storing data, the storage unit 220 includes at least one processor, institute to the storage unit 220
State memory include: USB flash disk (USB flash drive, USB flash disk), SSD (solid state hard disk, Solid State Drive),
EMMC (built-in multimedia storage card, Embedded Multi Media Card), eMCP (embedded type multi-core piece encapsulation,
Embedded Multi Chip Package), UFS (Common Flash Memory storage, Universal Flash Storage), SD card
The equipment such as (safe digital storage card, Secure Digital Memory Card), NAND Flash chip, the storage unit
220 can also include at least one buffer storage, and the buffer storage includes: static random access memory
(StaticRandom Access Memory, SRAM), dynamic random access memory (Dynamic Random Access
Memory, DRAM), phase random access memory (Phase Change Random Access Memory, PRAM) etc. sets
It is standby.The storage unit 220 can also include at least one nonvolatile semiconductor memory member, the nonvolatile semiconductor memory member packet
It includes: nand flash memory, vertical nand flash memory (VNAND), NOR flash memory, resistive ram (RRAM), magnetic-resistance random access
Memory (MRAM), ferroelectric RAM (FRAM), spin transfer torque random access memory (STT-RAM) etc. are set
It is standby.
Referring to Fig. 8, Fig. 8 is a kind of structural schematic diagram of measurement module provided by the embodiment of the utility model；
As shown in figure 8, the measurement module 12 includes: processing unit 121, connector interface 122, multichannel adjustable voltage power supply
Unit 123, multiple power supplies on-off control unit 124, plurality of voltages measuring unit 125, multichannel current measuring unit 126 and temperature
Spend measuring unit 127.
Wherein, the processing unit 121 is separately connected the connector interface 122, multichannel adjustable voltage power supply unit
123, multiple power supplies on-off control unit 124, plurality of voltages measuring unit 125, multichannel current measuring unit 126 and temperature are surveyed
Measure unit 127.The processing unit 121 is for controlling the multichannel adjustable voltage power supply unit 123, the control of multiple power supplies on-off
Unit 124, plurality of voltages measuring unit 125, multichannel current measuring unit 126 and temperature measurement unit 127, the processing are single
Member 121 can also be surveyed according to the multichannel adjustable voltage power supply unit 123, multiple power supplies on-off control unit 124, plurality of voltages
The test of unit 125, multichannel current measuring unit 126 and temperature measurement unit 127 to the storage equipment is measured, is deposited to described
It stores up equipment and carries out the measurement of electrical characteristic parameter, the measurement of environment temperature and to the storage equipment under different working condition
It carries out the control of multiple power supplies on-off and generates test result, and send the veneer for the test result.
Wherein, for connecting the veneer, the measurement module 12 is connect the connector interface 122 by the connector
Mouth 122 carries out data transmission with the veneer and power input, wherein the connector interface 122 connects the veneer
Measurement module connecting interface, wherein the connector interface 122 of the measurement module 12 is connect with the measurement module of the veneer to be connect
Mouthful be unified interface, such as: the connector interface 122 and the measurement module connecting interface of the veneer be serial ports,
Micro usb interface, USB TypeA interface, USB TypeB interface, USB TypeC interface, cable mouth, earphone jack, SD card
One kind of interface, sensor interface, reader interface.Pass through the measurement module connecting interface and the measurement of the unified veneer
The connector interface 122 of module 12 ensure that the veneer under different hardware scheme can be applicable in the measurement module 12, in veneer
Veneer is only needed to change in the case where changing, and achievees the effect that reuse and reduce cost.
Specifically, the connector interface 122 connects the measurement module connecting interface of the veneer by the first connector,
To realize the transmission of the data between the measurement module 12 and the veneer and power input.Specifically, the veneer connects
The test instruction that the host computer is sent is received, the veneer sends test instruction to by first connector described
Measurement module 12, the measurement module 12 instruct according to the test and carry out multifunctional testing to the storage equipment, such as: it is more
Road voltage tester, multichannel testing current, environment temperature test, burn-in test, power failure test etc..
Wherein, the power input of the measurement module 12 comes from veneer, and the measurement module 12 is connect by the first connector
By the power input of the veneer, the power input of the veneer may come from the host computer, and the host computer passes through line
DC voltage power supply is input to the veneer by cable.After the measurement module 12 receives the power input of the veneer, it will pass through
123 output multi-channel adjustable voltage power supply of multichannel adjustable voltage power supply unit.Such as: the host computer to the veneer input 5V or
The direct voltage output to the measurement module 12, the measurement module 12 are passed through institute by the DC voltage of 12V, the veneer
123 output multi-channel adjustable voltage power supply of multichannel adjustable voltage power supply unit is stated, such as: the multi-channel DCs electricity such as 0.5V, 2V, 3V, 10V
Pressure, the multichannel adjustable voltage power supply that the multichannel adjustable voltage power supply unit 123 exports are input to by first connector
The veneer, then the multichannel adjustable voltage power supply is output to the storage equipment by the veneer.All due to integrated circuit
There is the voltage range of a job, the voltage range is the voltage margin of the integrated circuit, adjustable by output multi-channel
Voltage source tests the reliability of integrated circuit under maximum or the smallest voltage, and the voltage of the storage equipment may be implemented
Nargin reliability test.
Wherein, the multiple power supplies on-off control unit 124 is used to control the output of multichannel adjustable voltage power supply unit 123
The on-off of multichannel adjustable voltage power supply is simulated the case where reality powers off and is carried out by controlling the on-off of multichannel adjustable voltage power supply
Test can be used for the high and low temperature test, the burn-in test etc. of the test storage equipment.
Wherein, the temperature measurement unit 127 is used to measure the environment temperature of the storage equipment, and the environment temperature can
To acquire by temperature sensor, and the temperature measurement unit 127 is inputted, to realize the acquisition to environment temperature, and passed through
The environment temperature of the storage equipment is measured, burn-in test can be carried out to the storage equipment.
Specifically, the processing unit 121 is central processing unit (Central Processing Unit, CPU), institute
Stating connector interface 122 is general-purpose interface, comprising: serial ports, microusb, USB TypeA interface, USB TypeB interface, USB
At least one of TypeC interface, cable mouth, earphone jack, SD card interface, sensor interface, reader interface.
The multichannel adjustable voltage power supply unit 123 is multichannel adjustable voltage power unit circuit, the multichannel adjustable electric
Piezoelectricity source circuit may include multiple transformers, and the multiple power supplies on-off control unit 124 is multiple power supplies on-off control electricity
Road, for example, multi-way switch circuit, the plurality of voltages measuring unit 125 is tension measuring circuit, and the tension measuring circuit can
To include voltage sensor, the multichannel current measuring unit 126 is current measurement circuit, and the current measurement circuit can wrap
Current sensor or current transformer are included, the temperature measurement unit 127 is temperature measuring circuit, and the temperature measuring circuit can
To include temperature sensor.
Referring to Fig. 9, Fig. 9 is a kind of structural representation for storing equipment adapter unit provided by the embodiment of the utility model
Figure；
As shown in figure 9, the storage equipment adapter unit 13 includes: storage device interface 131 and veneer connecting interface
132.Wherein, the storage device interface 131 connects the veneer connecting interface 132, and the storage device interface 131 is for connecting
Storage equipment is connect, the veneer connecting interface 132 is used for connecting single board, to realize the communication of the storage equipment and the veneer
Connection.Specifically, the veneer connecting interface 132 connects the storage equipment connecting interface of the veneer, the storage equipment is connect
The test interface of 131 connection of the mouth storage equipment, and then realize the communication connection of the storage equipment and the veneer.
In the utility model embodiment, by providing a kind of test macro, the test macro include host computer and
At least one slave computer, each slave computer connect a storage equipment, and each slave computer includes: veneer, respectively with
The host computer and storage equipment communication connection, the test instruction sent for receiving and executing the host computer, and to
The host computer returns to the multifunctional testing result to the storage equipment；Measurement module passes through unified interface with the veneer
Connection, for receiving the test instruction from the veneer, to realize the multifunctional testing to the storage equipment.It is described upper
Machine connects the veneer by cable, and the veneer is communicated with the host computer by fixed protocol.By the above-mentioned means,
The utility model embodiment can be realized the multifunctional testing of storage equipment, improve testing efficiency, reduce testing cost.
It should be noted that giving the preferable implementation of the utility model in the specification and its attached drawing of the utility model
Mode, still, the utility model can be realized by many different forms, however it is not limited to which this specification is described to be implemented
Mode, these embodiments are not as the additional limitation to the content of the present invention, the purpose of providing these embodiments is that making
It is more thorough and comprehensive to the understanding of the disclosure of the utility model.Also, above-mentioned each technical characteristic continues to be combined with each other, and is formed
The various embodiments not being enumerated above are accordingly to be regarded as the range of the utility model specification record；Further, to this field
For those of ordinary skill, it can be modified or changed according to the above description, and all these modifications and variations all should belong to
The protection scope of the appended claims for the utility model.
Claims (10)
1. a kind of test device, which is characterized in that for storing the multifunctional testing of equipment, the test device includes at least one
A slave computer, each slave computer include:
Veneer is communicated to connect with host computer and the storage equipment respectively, the survey sent for receiving and executing the host computer
Examination instruction, and the multifunctional testing result to the storage equipment is returned to the host computer；
Measurement module is connect with the veneer by unified interface, for receiving the test instruction from the veneer, to realize
To the multifunctional testing of the storage equipment.
2. test device according to claim 1, which is characterized in that the veneer includes:
Host computer connecting interface, for connecting the host computer；
Measurement module connecting interface, for connecting the measurement module；
Equipment connecting interface is stored, for connecting the storage equipment；
Chip is controlled, the control chip connects the measurement module connecting interface and the storage equipment connecting interface, described
Chip is controlled to be used to instruct the control storage equipment and the measurement module according to the test.
3. test device according to claim 2, which is characterized in that the veneer further includes power module, the power supply
Module is used to provide power input for the measurement module.
4. test device according to claim 3, which is characterized in that the measurement module includes:
Multichannel adjustable voltage power supply unit, for providing multichannel adjustable voltage power supply for the storage equipment；
Multiple power supplies on-off control unit, for controlling the on-off of the multichannel adjustable voltage power supply；
Plurality of voltages measuring unit, for measuring the multiple-way supply voltage of the storage equipment；
Multichannel current measuring unit, for measuring the multiple-way supply electric current of the storage equipment；
Temperature measurement unit, for measuring the environment temperature of the storage equipment；
Processing unit is measured with the multichannel adjustable voltage power supply unit, multiple power supplies on-off control unit, plurality of voltages respectively
Unit, multichannel current measuring unit and temperature measurement unit connection, for being carried out under different working condition to the storage equipment
The measurement of electrical characteristic parameter, the measurement of environment temperature and to the storage equipment carry out the control of multiple power supplies on-off.
5. test device according to claim 4, which is characterized in that the measurement module further include:
Connector interface, for connecting the measurement module connecting interface of the veneer by the first connector.
6. test device according to claim 5, which is characterized in that the measurement module connecting interface and the connection
Device interface uses identical agreement, and is defined as unified interface.
7. test device according to claim 5, which is characterized in that the multichannel adjustable voltage power supply unit exports more
Road adjustable voltage power supply is input to the veneer by first connector, then by the veneer by the multichannel adjustable voltage
Power supply is output to the storage equipment.
8. test device according to claim 1-7, which is characterized in that the slave computer further include:
Equipment adapter unit, including storage device interface and veneer connecting interface are stored, for passing through the storage device interface
Connect the storage equipment, and the veneer connected by the veneer connecting interface, with realize the storage equipment with it is described
The communication connection of veneer.
9. a kind of test macro characterized by comprising host computer, at least one storage equipment and at least one such as right
It is required that the described in any item test devices of 1-8；
The host computer connects the test device, and each test device is connect with each storage equipment by second
Device is correspondingly connected with.
10. test macro according to claim 9, which is characterized in that the host computer is assisted by cable with fixed communication
View is communicated to connect with the test device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820667078.2U CN208384003U (en) | 2018-05-03 | 2018-05-03 | A kind of test device and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820667078.2U CN208384003U (en) | 2018-05-03 | 2018-05-03 | A kind of test device and system |
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| CN208384003U true CN208384003U (en) | 2019-01-15 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108563542A (en) * | 2018-05-03 | 2018-09-21 | 中山市江波龙电子有限公司 | A kind of test device, system and test method |
| TWI696069B (en) * | 2019-02-13 | 2020-06-11 | 睿寬智能科技有限公司 | Wide-range power measurement device for PCIe equipment |
| TWI700590B (en) * | 2019-01-28 | 2020-08-01 | 瑞昱半導體股份有限公司 | Interface adapter circuit |
| TWI703446B (en) * | 2019-01-29 | 2020-09-01 | 瑞昱半導體股份有限公司 | Interface adapter circuit |
| TWI763291B (en) * | 2021-02-02 | 2022-05-01 | 佳世達科技股份有限公司 | Test fixture and test assembly line |
-
2018
- 2018-05-03 CN CN201820667078.2U patent/CN208384003U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108563542A (en) * | 2018-05-03 | 2018-09-21 | 中山市江波龙电子有限公司 | A kind of test device, system and test method |
| TWI700590B (en) * | 2019-01-28 | 2020-08-01 | 瑞昱半導體股份有限公司 | Interface adapter circuit |
| TWI703446B (en) * | 2019-01-29 | 2020-09-01 | 瑞昱半導體股份有限公司 | Interface adapter circuit |
| TWI696069B (en) * | 2019-02-13 | 2020-06-11 | 睿寬智能科技有限公司 | Wide-range power measurement device for PCIe equipment |
| TWI763291B (en) * | 2021-02-02 | 2022-05-01 | 佳世達科技股份有限公司 | Test fixture and test assembly line |
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