CN112560390B - Method, device and equipment for automatically generating ignore bin in cross coverage point - Google Patents
Method, device and equipment for automatically generating ignore bin in cross coverage point Download PDFInfo
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Abstract
The present disclosure provides a method, apparatus, device, and storage medium for automatically generating ignore bins in cross-over coverage points. A method of automatically generating ignore bins in a cross-over coverage point, comprising: a defining step, analyzing all bins in the coverage points, and defining cross bins which are statistically significant for functional coverage; establishing a cross coverage point, namely establishing the cross coverage point containing the meaningful cross bin aiming at the coverage point needing to be combined; an information generation step, analyzing the meaningful cross bins in the cross coverage points, and combining the meaningful cross bins to automatically generate the residual cross bin information; an ignore bin generating step of generating an ignore bin based on the remaining cross-bin information. The method and the device can save a large amount of function coverage rate development time of verification personnel, improve the development efficiency of the function coverage rate, and avoid errors possibly caused by manually establishing a large amount of neglected bins.
Description
Technical Field
The present disclosure relates to the field of chip verification, and in particular, to a method, an apparatus, a device, and a storage medium for automatically generating a skip bin in a cross coverage point.
Background
In the field of chip verification, the function coverage is used for counting the verification coverage of all function points in the whole chip design, and the statistical result of the function coverage can help a verifier to find a vulnerability on the verification completeness. The coverage group is a model for functional coverage rate statistics and is composed of one or more coverage points, each coverage point corresponds to one functional point in the functional coverage group, and the functional points are represented through bins in the coverage points. For a complex chip design, there are often cases where multiple design function points are combined with each other, and these combined function points need to be characterized by mutually crossing several coverage points to generate crossing coverage points.
In one cross coverage point, there are a series of cross bins, which are formed by cross combining the bins in each coverage point crossing each other to represent different functional point combinations. However, for some combinations of function points in the chip design, only a small number of combinations of function points are meaningful, and for a large number of combinations of function points without meaning, the combination of function points needs to be listed in a form of ignoring bin, and the result is excluded from the statistical result of the coverage rate. In the case of complicated functional coverage point combinations, the number of meaningless functional point combinations to be excluded from the cross coverage points is enormous, and especially when the combinations to be excluded cannot be expressed by continuous numerical values, the following problems are caused:
1. a large amount of time is consumed by verification personnel when a large number of neglecting bins in each cross coverage point are artificially established;
2. manually establishing a large number of ignore bins in each cross coverage point is easy to cause errors, and once the combined function point needing to be covered is written into the ignore bins, the omission of the function coverage rate statistical result is caused.
Disclosure of Invention
The present disclosure has been made to solve the above problems, and an object of the present disclosure is to provide a method, an apparatus, a device, and a storage medium for automatically generating a skip bin in a cross coverage point in a reverse direction by extracting information from a cross bin automatically generated by a simulation tool using a script.
This disclosure provides this summary in order to introduce a selection of concepts in a simplified form that are further described below in the detailed description. This summary is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used to limit the scope of the claimed subject matter.
In order to solve the above technical problem, an embodiment of the present disclosure provides a method for automatically generating an ignore bin in a cross coverage point, which adopts the following technical solution, including:
a defining step, analyzing all bins in the coverage points, and defining cross bins which are statistically significant for functional coverage;
establishing a cross coverage point, namely establishing the cross coverage point containing the meaningful cross bin aiming at the coverage point needing to be combined;
an information generation step, analyzing the meaningful cross bins in the cross coverage points, and combining the meaningful cross bins to automatically generate the residual cross bin information;
an ignore bin generating step of generating an ignore bin based on the remaining cross-bin information.
In order to solve the above technical problem, an embodiment of the present disclosure further provides an apparatus for automatically generating a skip bin in a cross coverage point, which adopts the following technical solution, including:
a definition module that analyzes all bins in the coverage points and defines cross bins that are statistically significant for functional coverage;
the cross coverage point establishing module is used for establishing a cross coverage point containing the meaningful cross bin aiming at the coverage point needing to be combined;
an information generation module for analyzing the meaningful cross bins in the cross coverage points and combining the meaningful cross bins to automatically generate the remaining cross bin information;
an ignore bin generating module that generates an ignore bin based on the remaining cross-bin information.
In order to solve the above technical problem, an embodiment of the present disclosure further provides a computer device, which adopts the following technical solution, including:
a memory in which a computer program is stored, and a processor which, when executing the computer program, implements the method as described in the foregoing.
In order to solve the above technical problem, an embodiment of the present disclosure further provides a computer-readable storage medium, which adopts the following technical solutions and includes:
the computer-readable storage medium has stored thereon a computer program which, when executed by a processor, implements the method as described above.
According to the technical scheme disclosed by the disclosure, compared with the prior art, the method can extract information from the cross bins automatically generated by the simulation tool by using the script so as to reversely and automatically establish the ignore bins in the cross coverage points. The scheme has the advantages that:
1. only a small number of meaningful function combination points need to be listed in the cross bins of the cross coverage points, so that the time for establishing a large number of neglected bins is saved;
2. information is reversely extracted from the cross bins automatically generated by the simulation tool by using the script, and further, the process of automatically establishing the neglected bins in the cross coverage points does not need human intervention, so that errors possibly caused by manually establishing a large number of neglected bins are avoided.
Drawings
FIG. 1 is a flow diagram of one embodiment of a method of automatically generating ignore bins in cross-coverage points in accordance with the present disclosure;
FIG. 2 is a schematic diagram of one embodiment of establishing cross-coverage points for a method of automatically generating ignore bins in cross-coverage points, according to the present disclosure;
FIG. 3 is a schematic diagram of one embodiment of generating a functional coverage report for a method of automatically generating ignore bins in cross-coverage points according to the present disclosure;
FIG. 4 is a schematic diagram of one embodiment of generating ignore bins for cross-coverage points in accordance with a method of automatically generating ignore bins in cross-coverage points of the present disclosure;
FIG. 5 is a schematic diagram of one embodiment of a cross-coverage point after adding ignore bins, in accordance with a method of automatically generating ignore bins in the cross-coverage point of the present disclosure;
FIG. 6 is a schematic diagram of one embodiment of an apparatus to automatically generate ignore bins in cross-coverage points, according to the present disclosure;
FIG. 7 is a block diagram of one embodiment of a computer device according to the present disclosure.
The foregoing and other features, advantages and aspects of the embodiments of the present disclosure will become more apparent from the following detailed description, which, when taken in conjunction with the accompanying drawings, illustrate by way of example only. Throughout the drawings, the same or similar reference numbers refer to the same or similar elements. It should be understood that the drawings are schematic and that elements and elements are not necessarily drawn to scale.
Detailed Description
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs; the terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure; the terms "including" and "having," and any variations thereof, in the description and claims of this disclosure and the description of the above figures are intended to cover non-exclusive inclusions. The terms "first," "second," and the like in the description and claims of the present disclosure or in the above-described drawings are used for distinguishing between different objects and not for describing a particular order.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the disclosure. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein may be combined with other embodiments.
In order to make the technical solutions of the present disclosure better understood by those skilled in the art, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings.
[ method for automatically generating ignore bins in Cross-coverage Point ]
Referring to fig. 1, a flow diagram of one embodiment of a method of automatically generating ignore bins in cross-coverage points is shown, in accordance with the present disclosure. The method for automatically generating the skip bin in the cross coverage point comprises the following steps:
a defining step S11 of analyzing all bins in the coverage points and defining cross bins statistically significant for functional coverage;
in one or more embodiments, for example as shown in fig. 2, the defining step S11 further includes determining function points characterizing different design functions in the design to be verified, dividing different coverage groups according to the categories of the function points, and constructing corresponding coverage points in the coverage groups, such as CVPT0, CVPT1, and CVPTN, according to different specific function points in the categories of the function points.
In one or more embodiments, coverage points CVPT0, CVPT1, CVPTN are each for a particular function, and bins in a coverage point, such as bins CVPT0_ bin0, CVPT0_ bin1, CVPT0_ bin2 in coverage point CVPT0 are each for a description of all configurations or scenarios involved in the particular function. For example, if the function point is that the chip can operate in different speed modes, then the coverage group may be a "speed" class, where one coverage point, e.g., CVPT0, may be a "clock frequency", and the bins CVPT0_ bin0, CVPT0_ bin1, CVPT0_ bin2 in the coverage point CVPT0 correspond one-to-one to the various clock frequency points supported by the chip design.
In one or more embodiments, the design functions represented between different coverage points CVPT0, CVPT1, CVPTN may be combined and identified by cross bins in the cross coverage points. But when two coverage points generate a cross coverage point, not all of the respective bins below it can cross two by two to construct a cross bin. For example, the overlay point CVPT0 represents a "clock frequency," where bins CVPT0_ bin0, CVPT0_ bin1, and CVPT0_ bin2 correspond to all clock frequencies that the chip can support, respectively. Another coverage point CVPT1 represents a "power mode" where bins CVPT1_ bin0 and CVPT1_ bin1 correspond to a high power mode and a low power mode. Then there may be some clock frequencies that can run in either the high power mode or the low power mode, while other clock frequencies can only run in either the high power mode or the low power mode. This makes it necessary to exclude cross bins whose clock frequencies and power modes are incompatible and to cross compatible bins to create meaningful cross bins when creating cross bins in their cross coverage points based on these two coverage points.
In one or more embodiments, all bins in the different coverage points CVPT0, CVPT1, CVPTN are analyzed, and compatible bins in the different coverage points CVPT0, CVPT1, CVPTN that need to be combined are interleaved to create meaningful interleaved bins. For example, if the bins that can be compatible in the different coverage points CVPT0, CVPT1 that need to be combined are CVPT0_ bin0 in coverage point CVPT0, CVPT1_ bin3 in CVPT1, then the two bins are crossed to create a meaningful cross bin CVPT0_ bin0 combined CVPT1_ bin 3.
A step S12 of establishing cross coverage points, which is to establish the cross coverage points containing meaningful cross bins composed of bins in the coverage points aiming at the coverage points needing to be combined;
in one or more embodiments, such as shown in fig. 2, all bins in the different coverage points CVPT0 through CVPTN that need to be combined are analyzed, cross bins statistically significant to functional coverage are determined, and a cross coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN containing only those significant cross bins is established.
An information generation step S13, analyzing the meaningful cross bins in the cross coverage points, and combining the meaningful cross bins to automatically generate the remaining cross bin information;
in one or more embodiments, the information generating step S13 further includes storing the generated remaining cross-bin information in a functional coverage report.
In one or more embodiments, meaningful cross bins in cross coverage points are analyzed by a pre-set simulation tool by running regression tests in the information generating step S13.
In one or more embodiments, as shown in fig. 3, by running a regression test, the simulation tool automatically analyzes all cross bins in the established cross coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN, including defined significant cross bins and undefined bins, and automatically generates the remaining cross bin information in conjunction with the defined significant cross bins for storage in the functional coverage report.
An ignore bin generating step S14 generates an ignore bin based on the remaining cross-bin information.
In one or more embodiments, the skip bin generating step further comprises looking up statistics of all cross bins corresponding to the cross coverage points in the functional coverage report and extracting the remaining cross bin information in the cross coverage points by further looking up automatically generated keywords for all cross bins.
It should be understood here that since all cross bin statistics are contained in the functional coverage report, once the simulation tool finds that there are undefined cross bins in the cross coverage point, these undefined cross bin information will be automatically generated into the coverage report. These automatically generated undefined cross bins are therefore the remaining cross bins in the cross coverage point.
In one or more embodiments, the skip bin generating step further comprises generating skip bins through format conversion after extracting the remaining cross-bin information in the cross-coverage points.
In one or more embodiments, the skip bin generating step generates the skip bin by executing a preset script.
In one or more embodiments, as shown in fig. 4, a preset script is run to find in the functional coverage report the cross-bin statistics corresponding to the name of the cross-coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN, and extract the remaining cross-bin information in the cross-coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN by further finding the key of the auto-generated cross-bin, where in one or more embodiments the key of the auto-generated cross-bin may be different for different simulation tools.
In one or more embodiments, since all meaningful cross bins that need to be covered have been defined in the cross coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN, the remaining cross bins automatically generated by the simulation tool represent insignificant combinations of functions in the cross coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN. After extracting the residual cross bin information in the cross coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN, the preset script generates a form of ignoring bin through format conversion processing.
In one or more embodiments, the method for automatically generating the ignore bin in the cross coverage point further includes a ignore bin writing step, writing the generated ignore bin into the corresponding cross coverage point, as shown in fig. 5, writing the ignore bin converted from the preset script into the corresponding cross coverage point, that is, completing the reverse automatic generation of the ignore bin in the cross coverage point.
For complex large-scale chip designs, a large number of functional blocks and combinations of functional blocks are involved. In the development of the functional coverage rate, when the combined coverage condition among the functional modules is described through the cross coverage points, the verification personnel only need to care about meaningful functional combinations, therefore, the method and the device realize that a large number of neglect bins are defined in the cross coverage points to exclude meaningless functional combinations, so that the meaningless functional combinations are not counted in the functional coverage rate result. If a large number of neglected bins in the cross coverage point are defined manually, a large amount of time and energy of verification personnel are consumed, and the development period of the function coverage rate is prolonged; it is also prone to false definitions, resulting in functional combinations that need to be covered being defined into ignore bins, affecting the reliability of the coverage statistics.
By adopting the technical means provided by the disclosure, the neglected bins in all the cross coverage points can be automatically generated only by automatically extracting the information in the functional coverage rate report through the preset script after the regression test is run. Therefore, the development work of the function coverage rate can be automatically completed, a large amount of function coverage rate development time of a verifier is saved, the development efficiency of the function coverage rate is improved, and errors possibly caused by manually establishing a large amount of neglected bins are avoided.
It should be understood that, although the steps in the flowcharts of the figures are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and may be performed in other orders unless explicitly stated herein. Moreover, at least a portion of the steps in the flow chart of the figure may include multiple sub-steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed alternately or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium, and can include the processes of the embodiments of the methods described above when the computer program is executed. The storage medium may be a non-volatile storage medium such as a magnetic disk, an optical disk, a Read Only Memory (ROM), or a Random Access Memory (RAM).
[ means for automatically generating skip bins in cross-over points ]
As shown in fig. 6, in order to implement the technical solution in the embodiment of the present disclosure, the present disclosure provides an apparatus for automatically generating a skip bin in a cross coverage point, which may be specifically applied to various electronic terminal devices.
The apparatus for automatically generating skip bins in cross coverage points described in this embodiment includes: a cross definition module 601, a cross coverage point establishing module 602, an information generating module 603, and an ignore bin generating module 604.
A definition module 601, which analyzes all bins in the coverage points and defines cross bins statistically significant for functional coverage;
in one or more embodiments, for example, as shown in fig. 2, the defining module 601 is further configured to determine function points characterizing different design functions in the design to be verified, divide different coverage groups according to the large class of the function points, and construct corresponding coverage points in the coverage groups, such as CVPT0, CVPT1, and CVPTN, according to different specific function points in the large class of the function points.
In one or more embodiments, coverage points CVPT0, CVPT1, CVPTN are each for a particular function, and bins in a coverage point, such as bins CVPT0_ bin0, CVPT0_ bin1, CVPT0_ bin2 in coverage point CVPT0 are each for a description of all configurations or scenarios involved in the particular function. For example, if the function point is that the chip can operate in different speed modes, then the coverage group may be a "speed" class, where one coverage point, e.g., CVPT0, may be a "clock frequency", and the bins CVPT0_ bin0, CVPT0_ bin1, CVPT0_ bin2 in the coverage point CVPT0 correspond one-to-one to the various clock frequency points supported by the chip design.
In one or more embodiments, the design functions represented between different coverage points CVPT0, CVPT1, CVPTN may be combined and identified by cross bins in the cross coverage points. But when two coverage points generate a cross coverage point, not all of the respective bins below it can cross two by two to construct a cross bin. For example, the overlay point CVPT0 represents a "clock frequency," where bins CVPT0_ bin0, CVPT0_ bin1, and CVPT0_ bin2 correspond to all clock frequencies that the chip can support, respectively. The other coverage point CVPT1 represents a "power mode" in which bins CVPT1_ bin0, CVPT1_ bin1 correspond to a high power mode and a low power mode. Then there may be some clock frequencies that can run in either the high power mode or the low power mode, while other clock frequencies can only run in either the high power mode or the low power mode. This makes it necessary to exclude cross bins whose clock frequencies and power modes are incompatible and to cross compatible bins to create meaningful cross bins when creating cross bins in their cross coverage points based on these two coverage points.
In one or more embodiments, all bins in the different coverage points CVPT0, CVPT1, CVPTN are analyzed, and compatible bins in the different coverage points CVPT0, CVPT1, CVPTN that need to be combined are interleaved to create meaningful interleaved bins. For example, if the bins that can be compatible in the different coverage points CVPT0, CVPT1 that need to be combined are CVPT0_ bin0 in coverage point CVPT0, CVPT1_ bin3 in CVPT1, then the two bins are crossed to create a meaningful cross bin CVPT0_ bin0 combined CVPT1_ bin 3.
A cross coverage point establishing module 602, which establishes a cross coverage point containing a meaningful cross bin composed of bins in the coverage points for the coverage points that need to be combined;
in one or more embodiments, such as shown in fig. 2, all bins in the different coverage points CVPT0 through CVPTN that need to be combined are analyzed, cross bins statistically significant to functional coverage are determined, and a cross coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN containing only those significant cross bins is established.
The information generation module 603 analyzes meaningful cross bins in the cross coverage points and automatically generates the residual cross bin information by combining the meaningful cross bins;
in one or more embodiments, the information generation module 603 is further configured to store the generated remaining cross-bin information in a functional coverage report.
In one or more embodiments, meaningful cross bins in the cross coverage points are analyzed by a pre-set simulation tool by running regression tests at the information generation module 603.
In one or more embodiments, as shown in fig. 3, by running a regression test, the simulation tool automatically analyzes all cross bins in the established cross coverage points CVPT0_ X _ CVPT1_ X … _ CVPTN, including defined significant cross bins and undefined bins, and combines the defined significant cross bins to automatically generate the remaining cross bin information for storage in the functional coverage report.
The ignore bin generation module 604 generates ignore bins based on the remaining cross-bin information.
In one or more embodiments, the skip bin generation module 604 further comprises looking up statistics of all cross bins corresponding to the cross coverage point in the functional coverage report and extracting the remaining cross bin information in the cross coverage point by further looking up automatically generated keywords for all cross bins.
It should be understood here that since all cross bin statistics are contained in the functional coverage report, once the simulation tool finds that there are undefined cross bins in the cross coverage point, these undefined cross bin information will be automatically generated into the coverage report. These automatically generated undefined cross bins are therefore the remaining cross bins in the cross coverage point.
In one or more embodiments, the skip bin generation module 604 further comprises generating skip bins through format conversion after extracting the remaining cross-bin information in the cross-coverage points.
In one or more embodiments, the ignore bin generating module 604 generates the ignore bin by running a preset script.
In one or more embodiments, as shown in fig. 4, a preset script is run to find in the functional coverage report the cross-bin statistics corresponding to the name of the cross-coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN, and extract the remaining cross-bin information in the cross-coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN by further finding the key of the auto-generated cross-bin, where in one or more embodiments the key of the auto-generated cross-bin may be different for different simulation tools.
In one or more embodiments, since all meaningful, need-to-be-covered cross-bins have been defined in the cross-coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN, the remaining cross-bins automatically generated by the simulation tool represent insignificant combinations of functions in the cross-coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN. After extracting the residual cross bin information in the cross coverage point CVPT0_ X _ CVPT1_ X … _ CVPTN, the preset script generates a skip bin form through format conversion.
In one or more embodiments, the method for automatically generating the ignore bin in the cross coverage point further includes a ignore bin writing module, writing the generated ignore bin into the corresponding cross coverage point, as shown in fig. 5, writing the ignore bin converted from the preset script into the corresponding cross coverage point, that is, completing the reverse automatic generation of the ignore bin in the cross coverage point.
It should be understood that although each block in the block diagrams of the figures may represent a module, a portion of which comprises one or more executable instructions for implementing the specified logical function(s), the blocks are not necessarily executed sequentially. Each module and functional unit in the device embodiments in the present disclosure may be integrated into one processing module, or each unit may exist alone physically, or two or more modules or functional units are integrated into one module. The integrated modules can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a separate product, may also be stored in a computer-readable storage medium. The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc.
[ apparatus for automatically generating ignore bins in Cross-coverage Point ]
Referring now to fig. 7, a schematic diagram of an electronic device (e.g., a terminal device or server) 700 suitable for use in implementing embodiments of the present disclosure is shown. The terminal device in the embodiment of the present disclosure may be various terminal devices in the above system. The electronic device shown in fig. 7 is only an example, and should not bring any limitation to the functions and the scope of use of the embodiments of the present disclosure.
As shown in fig. 7, the electronic device 700 may include a processing means (e.g., central processing unit, graphics processor, etc.) 701 for controlling the overall operation of the electronic device. The processing device may include one or more processors to execute instructions to perform all or a portion of the steps of the method described above. Further, the processing device 701 may also include one or more modules for processing interactions with other devices.
The storage device 702 is used to store various types of data, and the storage device 702 can be any type or combination of computer-readable storage media, such as an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the above. More specific examples of the computer readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present disclosure, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The sensor means 703, which senses the information specified to be measured and converts it into a usable output signal according to a certain rule, may comprise one or more sensors. For example, it may include an acceleration sensor, a gyro sensor, a magnetic sensor, a pressure sensor or a temperature sensor, etc. for detecting changes in the on/off state, relative positioning, acceleration/deceleration, temperature, humidity, light, etc. of the electronic device.
The processing device 701, the memory device 702 and the sensor device 703 are connected to each other by a bus 704. An input/output (I/O) interface 705 is also connected to bus 704.
The multimedia device 706 may include an input device such as a touch screen, a touch pad, a keyboard, a mouse, a camera, a microphone, etc. for receiving an input signal from a user, and various input devices may cooperate with various sensors of the sensor device 703 to perform, for example, a gesture operation input, an image recognition input, a distance detection input, etc.; the multimedia device 706 may also include output devices such as a Liquid Crystal Display (LCD), speakers, vibrators, and the like.
The power supply device 707, which is used to provide power to various devices in the electronic equipment, may include a power management system, one or more power supplies, and components to distribute power to other devices.
The communication device 708 may allow the electronic device 700 to communicate with other devices wirelessly or by wire to exchange data.
Each of the above devices may also be connected to the I/O interface 705 to implement applications of the electronic device 700.
While fig. 7 illustrates an electronic device 700 having various means, it is to be understood that not all illustrated means are required to be implemented or provided. More or fewer devices may be alternatively implemented or provided.
In particular, according to an embodiment of the present disclosure, the processes described above with reference to the flowcharts may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program carried on a non-transitory computer readable medium, the computer program containing program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network via the communication means, or may be installed from a storage means. The computer program, when executed by a processing device, performs the functions defined in the methods of the embodiments of the present disclosure.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
It should be noted that the computer readable medium of the present disclosure may be a computer readable signal medium or a computer readable storage medium or any combination of the two. In contrast, in the present disclosure, a computer readable signal medium may comprise a propagated data signal with computer readable program code embodied therein, either in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: electrical wires, optical cables, RF (radio frequency), etc., or any suitable combination of the foregoing.
The computer readable medium may be embodied in the electronic device; or may be separate and not incorporated into the electronic device.
Computer program code for carrying out operations for the present disclosure may be written in any combination of one or more programming languages, including but not limited to an object oriented programming language such as Java, Smalltalk, C + +, and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network or connection may be made to an external computer (for example, through the Internet using an Internet service provider).
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The units described in the embodiments of the present disclosure may be implemented by software or hardware. Where the name of an element does not in some cases constitute a limitation on the element itself.
The functions described herein above may be performed, at least in part, by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: field Programmable Gate Arrays (FPGAs), Application Specific Integrated Circuits (ASICs), Application Specific Standard Products (ASSPs), system on a chip (SOCs), Complex Programmable Logic Devices (CPLDs), and the like.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating an ignore bin in an intersection coverage point, comprising:
a defining step, analyzing all bins in the coverage points, and defining cross bins which are statistically significant to the functional coverage;
a step of establishing cross coverage points, which is to establish the cross coverage points containing the meaningful cross bins aiming at the coverage points needing to be combined;
an information generating step, analyzing the meaningful cross bins in the cross coverage points, and combining the meaningful cross bins to automatically generate the residual cross bin information;
an ignore bin generating step of generating an ignore bin based on the remaining cross bin information.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating ignore bins in cross-coverage points, characterized in that,
the step of defining may further comprise,
determining functional points representing different design functions in the design to be verified;
determining the corresponding coverage point according to the function point;
all bins in different coverage points are analyzed, and compatible bins in different coverage points that need to be combined are interleaved to create the meaningful interleaved bins.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating skip bins in cross-coverage points,
the information generating step further comprises storing the generated remaining cross-bin information in a functional coverage report.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating ignore bins in cross-coverage points, characterized in that,
the information generating step analyzes the meaningful cross bins in the cross coverage points by running a regression test with a preset simulation tool.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating skip bins in cross-coverage points,
the step of generating the skip bins further comprises the steps of searching the statistical information of all the cross bins corresponding to the cross coverage points in the functional coverage rate report, and further searching the keywords of all the automatically generated cross bins to extract the information of the rest cross bins in the cross coverage points.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating skip bins in cross-coverage points,
the step of generating the skip bins further comprises generating the skip bins through format conversion after the residual cross bin information in the cross coverage points is extracted.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating ignore bins in cross-coverage points, characterized in that,
and the step of generating the ignore bin generates the ignore bin by running a preset script.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating ignore bins in cross-coverage points, further comprising,
and a step of writing the neglected bins, namely writing the generated neglected bins into the corresponding cross coverage points.
In accordance with one or more embodiments of the present disclosure, there is provided an apparatus for automatically generating an ignore bin in an intersection coverage point, comprising:
a definition module that analyzes all bins in the coverage points and defines cross bins that are statistically significant for functional coverage;
the cross coverage point establishing module is used for establishing a cross coverage point containing the meaningful cross bin aiming at the coverage point needing to be combined;
an information generation module for analyzing the meaningful cross bins in the cross coverage points and combining the meaningful cross bins to automatically generate the remaining cross bin information;
an ignore bin generating module that generates an ignore bin based on the remaining cross-bin information.
In accordance with one or more embodiments of the present disclosure, there is provided an apparatus for automatically generating an ignore bin in an intersection coverage point, characterized in that,
the definition module is further configured to,
determining functional points representing different design functions in the design to be verified;
determining the corresponding coverage point according to the function point;
all bins in different coverage points are analyzed, and compatible bins in different coverage points that need to be combined are interleaved to create the meaningful interleaved bins.
In accordance with one or more embodiments of the present disclosure, there is provided a method of automatically generating skip bins in cross-coverage points,
the information generation module is also used for storing the generated residual cross bin information into a functional coverage rate report;
the information generation module analyzes the meaningful cross bins in the cross coverage points by running a regression test with a preset simulation tool.
In accordance with one or more embodiments of the present disclosure, there is provided an apparatus for automatically generating an ignore bin in an intersection coverage point, characterized in that,
the skip bin generation module is further configured to search statistical information of all cross bins corresponding to the cross coverage points in the functional coverage rate report, and further search automatically generated keywords of all cross bins to extract information of remaining cross bins in the cross coverage points.
In accordance with one or more embodiments of the present disclosure, there is provided an apparatus for automatically generating an ignore bin in an intersection coverage point, characterized in that,
the neglected bin generating module is further used for generating the neglected bin through format conversion after the residual cross bin information in the cross coverage point is extracted;
the ignore bin generating module generates the ignore bin by running a preset script.
In accordance with one or more embodiments of the present disclosure, there is provided an apparatus for automatically generating an ignore bin in an intersection coverage point, characterized in that it further comprises,
and the ignoring bin writing module writes the generated ignoring bin into the corresponding cross coverage point.
According to one or more embodiments of the present disclosure, a computer device is provided, which includes a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the method according to any one of the above.
According to one or more embodiments of the present disclosure, a computer-readable storage medium is provided, characterized in that a computer program is stored thereon, which, when being executed by a processor, implements the method according to any one of the above.
The foregoing description is only exemplary of the preferred embodiments of the disclosure and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the disclosure herein is not limited to the particular combination of features described above, but also encompasses other combinations of features described above or equivalents thereof without departing from the spirit of the disclosure. For example, the above features and the technical features disclosed in the present disclosure (but not limited to) having similar functions are replaced with each other to form the technical solution.
Further, while operations are depicted in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order. Under certain circumstances, multitasking and parallel processing may be advantageous. Likewise, while several specific implementation details are included in the above discussion, these should not be construed as limitations on the scope of the disclosure. Certain features that are described in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.
Claims (15)
1. A method of automatically generating ignore bins in a cross-coverage point, comprising:
a defining step, analyzing all bins in the coverage points, and defining cross bins which are statistically significant to the functional coverage;
establishing a cross coverage point, namely establishing the cross coverage point containing the meaningful cross bin aiming at the coverage point needing to be combined;
an information generation step, analyzing the meaningful cross bins in the cross coverage points by a preset simulation tool, and automatically generating the residual cross bin information by combining the meaningful cross bins;
and an ignore bin generating step of generating an ignore bin by running a preset script based on the residual cross bin information.
2. The method of automatically generating ignore bins in a cross-coverage point of claim 1,
the step of defining may further comprise,
determining function points representing different design functions in the design to be verified;
determining the corresponding coverage point according to the function point;
all bins in different coverage points are analyzed, and compatible bins in different coverage points that need to be combined are interleaved to create the meaningful interleaved bins.
3. The method of automatically generating ignore bins in a cross-coverage point of claim 1,
the information generating step further comprises storing the generated remaining cross-bin information in a functional coverage report.
4. A method of automatically generating ignore bins in a cross-coverage point as recited in claim 3,
the information generating step analyzes the meaningful cross bins in the cross coverage points by running a regression test with a preset simulation tool.
5. The method of automatically generating ignore bins in a cross-coverage point as recited in claim 1,
the step of generating the skip bins further comprises the steps of searching the statistical information of all the cross bins corresponding to the cross coverage points in the functional coverage rate report, and further searching the keywords of all the automatically generated cross bins to extract the information of the rest cross bins in the cross coverage points.
6. The method of automatically generating ignore bins in a cross-coverage point as recited in claim 5,
the step of generating the skip bins further comprises generating the skip bins through format conversion after the residual cross bin information in the cross coverage points is extracted.
7. The method for automatically generating ignore bins in a cross-coverage point of claim 1 further comprising,
and a step of writing the neglected bins, in which the generated neglected bins are written into the corresponding cross coverage points.
8. An apparatus for automatically generating ignore bins in a cross-coverage point, comprising:
a definition module that analyzes all bins in the coverage points and defines cross bins that are statistically significant for functional coverage;
the cross coverage point establishing module is used for establishing a cross coverage point containing the meaningful cross bin aiming at the coverage point needing to be combined;
the information generation module analyzes the meaningful cross bins in the cross coverage points by a preset simulation tool and automatically generates residual cross bin information by combining the meaningful cross bins;
and the skip bin generation module is used for generating skip bins by running a preset script based on the residual cross bin information.
9. The apparatus for automatically generating ignore bins in cross-coverage point of claim 8,
the defining module is further configured to,
determining functional points representing different design functions in the design to be verified;
determining the corresponding coverage point according to the function point;
analyzing all bins in different coverage points, and crossing compatible bins in different coverage points needing to be combined to establish the meaningful cross bins.
10. The apparatus for automatically generating ignore bins in cross-coverage point of claim 8,
the information generating module is also used for storing the generated residual cross bin information into a functional coverage rate report;
the information generation module analyzes the meaningful cross bins in the cross coverage points by running a regression test with a preset simulation tool.
11. The apparatus for automatically generating ignore bins in cross-coverage point of claim 8,
the skip bin generation module is further configured to search statistical information of all cross bins corresponding to the cross coverage points in the functional coverage rate report, and further search automatically generated keywords of all cross bins to extract information of remaining cross bins in the cross coverage points.
12. The apparatus for automatically generating ignore bins in cross-coverage point of claim 11 wherein,
the skip bin generation module is further configured to generate the skip bin through format conversion after the remaining cross bin information in the cross coverage point is extracted.
13. The apparatus for automatically generating ignore bins in cross-coverage points of claim 8 further comprising,
and the neglected bin writing module writes the generated neglected bin into the corresponding cross coverage point.
14. A computer device comprising a memory in which a computer program is stored and a processor which, when executing the computer program, carries out the method according to any one of claims 1-7.
15. A computer-readable storage medium, characterized in that the computer-readable storage medium has stored thereon a computer program which, when being executed by a processor, carries out the method according to any one of claims 1-7.
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| CN116663492B (en) * | 2023-07-26 | 2023-10-13 | 北京云枢创新软件技术有限公司 | Method for acquiring number of cross items covered by cross bin, electronic equipment and medium |
| CN117873900A (en) * | 2024-02-02 | 2024-04-12 | 摩尔线程智能科技(北京)有限责任公司 | Chip function test method, device and storage medium |
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