CN107953028B - A kind of monitoring device of bessel beam - Google Patents

A kind of monitoring device of bessel beam Download PDF

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Publication number
CN107953028B
CN107953028B CN201711463922.6A CN201711463922A CN107953028B CN 107953028 B CN107953028 B CN 107953028B CN 201711463922 A CN201711463922 A CN 201711463922A CN 107953028 B CN107953028 B CN 107953028B
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reflecting mirror
imaging device
laser
guan jing
focus
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CN107953028A (en
Inventor
陶雄兵
徐俊南
李光辉
林小波
王耀波
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Dongguan Shengxiong Laser Advanced Equipment Co Ltd
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Dongguan Shengxiong Laser Advanced Equipment Co Ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/064Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Laser Beam Processing (AREA)

Abstract

Monitoring device provided by the present invention is equipped with multiple imaging devices on the output light path of laser, the laser for forming front and back to bessel beam carries out multiple spot detection, the quality of laser beam and its quality of stability, the laser light ring quality that bessel beam is formed and its focal beam spot are detected respectively, simultaneously can also real-time monitoring workpiece processing effect, data are comprehensively objective, and deviation is small.The monitoring device of bessel beam of the invention includes: laser, axicon, the first focusing Guan Jing and focus lamp are disposed with along the output light path of laser, the focus point of focus lamp is directed at workpieces processing, the first half-reflecting mirror and the second half-reflecting mirror are equipped between laser and axicon, first focuses between Guan Jing and focus lamp equipped with third half-reflecting mirror, first half-reflecting mirror connects the first imaging device, second half-reflecting mirror connects the second imaging device, and third half-reflecting mirror connects third imaging device and the 4th imaging device.

Description

A kind of monitoring device of bessel beam
Technical field
The invention belongs to laser cutting technique fields, and in particular to a kind of monitoring device of bessel beam.
Background technique
Bezier laser beam because of its focal beam spot and the longer depth of focus, be now widely used in processing thickness material, The deeply bigger drilling etc. of diameter.The quality of bessel beam affects the cut quality of product, and the formation pair of bessel beam The quality of laser and its stability it is more demanding, thus in the processing and assembling process of optical mirror slip, it is often necessary to mating Special equipment monitors the quality and its stability of laser transmitting laser.
However existing monitoring device is bulky, the deviation of monitoring data and actual value is larger, and this kind of equipment is logical Often only monitoring emits the quality of laser, and has ignored or even cannot achieve the focusing light final to laser-formed bessel beam Spot is measured in real time, these direct relation final products processing qualities.
Summary of the invention
For above-mentioned technical problem, the purpose of the present invention is to provide a kind of monitoring devices of bessel beam, specific Technical solution is as follows:
A kind of monitoring device of bessel beam, comprising: laser is set gradually along the output light path of the laser There are axicon, first to focus Guan Jing and focus lamp, the focus point of the focus lamp is directed at workpieces processing, the laser and described It is equipped with the first half-reflecting mirror and the second half-reflecting mirror between axicon, is equipped between the first focusing Guan Jing and the focus lamp Third half-reflecting mirror;
First half-reflecting mirror is arranged in presetting angle, and first is equipped on the reflected light path of first half-reflecting mirror Imaging device;
Second half-reflecting mirror is arranged in presetting angle, is successively arranged on the reflected light path of second half-reflecting mirror Second focuses Guan Jing and the second imaging device, and described second focuses Guan Jingke in second half-reflecting mirror and second imaging It is moved back and forth between device;
The third half-reflecting mirror is arranged in presetting angle, and the 4th is equipped on the reflected light path of the third half-reflecting mirror Half-reflecting mirror;It is successively arranged tertiary focusing Guan Jing and third imaging device on the reflected light path of 4th half-reflecting mirror, it is described Tertiary focusing Guan Jingke is moved back and forth between the 4th half-reflecting mirror and the third imaging device, the 4th half reflection The direct projection optical path of mirror is directed at the 4th imaging device.
Preferably, the monitoring device further include: monitoring system, monitoring system electrical connection the first imaging dress It sets, the second imaging device, third imaging device and the 4th imaging device, for collecting and surveying data.
It is furthermore preferred that the monitoring device further include: kinematic system and control system, described in kinematic system electrical connection Second focuses Guan Jing and focus lamp;
The control system is electrically connected the monitoring system and kinematic system, and the fortune can be driven in real time according to monitoring data Dynamic system adjusts the described first position for focusing Guan Jing and focus lamp.
Preferably, the kinematic system is electrically connected the axicon, is missed for finely tuning the position of the axicon with calibrating Difference.
Preferably, it described first focuses equipped with the 5th half-reflecting mirror between Guan Jing and the third half-reflecting mirror, described The 4th focusing Guan Jing and LED light source are successively arranged on the reflected light path of 5th half-reflecting mirror.
Preferably, the laser, axicon, the first focusing Guan Jing and focus lamp are coaxially fixedly mounted.
Preferably, the angle between the axis of first half-reflecting mirror and the axis of the axicon is 45 degree.
Preferably, the angle between the axis of the third half-reflecting mirror and the axis of the tertiary focusing Guan Jing is 45 Degree.
Preferably, the angle between the axis of the 4th half-reflecting mirror and the axis of the tertiary focusing Guan Jing is 45 Degree.
Compared with prior art, the monitoring device of bessel beam provided by the present invention has the advantage that
1) monitoring device of the present invention is equipped with multiple imaging devices on the output light path of laser, is formed to bessel beam The laser of front and back carries out multiple spot detection, the laser that the quality and its stability, bessel beam for detecting laser beam respectively are formed The quality of ring of light quality and its focal beam spot, at the same can also position of the real-time monitoring laser focus point in workpieces processing, data Comprehensively objective, deviation is small;
2) monitoring device of the present invention is connected with monitoring system, kinematic system and control system, control system electrical connection monitoring System and kinematic system can drive in real time kinematic system to adjust second according to the data that monitoring system is fed back and focus Guan Jing, focus The position of mirror and axicon, in real time adjust optical mirror slip position, solve bessel beam formed in axicon, focus manage Mirror and the technical problems such as focus lamp three's concentricity requirement height and axicon installation and adjustment difficulty are big, realize automation Control production reduces production waste, save the cost.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis The attached drawing of offer obtains other attached drawings.
Fig. 1 is the annexation figure of the monitoring device of the bessel beam of the preferred embodiment of the present invention;
Fig. 2 is the imaging results of the first imaging device;
Fig. 3 is the imaging results of the second imaging device;
Fig. 4 is the imaging results of third imaging device;
Fig. 5 is the imaging results of the 4th imaging device.
Appended drawing reference: laser 1, monitoring system 2, kinematic system 3, control system 4, axicon 5, first focus Guan Jing 61, focus lamp 7, the first half-reflecting mirror 41, the second half-reflecting mirror 42, third half-reflecting mirror 43, the 4th half-reflecting mirror the 44, the 5th half Reflecting mirror 45, the first imaging device 21, the second imaging device 22, third imaging device 23, the 4th imaging device 24, second focus Pipe mirror 62, tertiary focusing pipe mirror the 63, the 4th focus pipe mirror 64.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall within the protection scope of the present invention.
As shown in Figure 1, the monitoring device of the bessel beam of the preferred embodiment of the present invention, comprising: laser, monitoring system System, kinematic system and control system;Axicon, the first focusing Guan Jing and focusing are disposed with along the output light path of laser The focus point of mirror, focus lamp is directed at workpieces processing, and the first half-reflecting mirror and the second half reflection are equipped between laser and axicon Mirror, first focuses between Guan Jing and focus lamp equipped with third half-reflecting mirror.
Wherein, the first half-reflecting mirror is arranged in presetting angle, between the axis of the first half-reflecting mirror and the axis of axicon Angle be preferably 45 degree.Fraction of laser light is reflected through the first half-reflecting mirror, the first imaging device being equipped on its reflected light path, Reflection laser is imaged in the first imaging device.
The dislocation reflected using laser in the upper and lower surface of parallel plate glass, so that the part for forming two rings of light is folded Add, optical path difference forms interference.As shown in Fig. 2, there is light and shade striped in the imaging in the first imaging device, by observing light and shade striped Angle, monitor the angle of divergence of laser, the angle of divergence can reflect the quality of laser.
Second half-reflecting mirror is arranged in presetting angle, the angle between the axis of the second half-reflecting mirror and the axis of axicon Preferably -45 degree.Fraction of laser light is reflected through the second half-reflecting mirror, and the second focusing Guan Jing and are successively arranged on its reflected light path Two imaging devices, the second focus point for focusing Guan Jing are directed at the second imaging device, and second focuses Guan Jingke in the second half-reflecting mirror And second move back and forth between imaging device.
Mobile second focuses the position of Guan Jing, is imaged using laser focal beam spot in different defocus positions, passes through analysis Image quality can determine whether out that the quality of laser beam, the imaging results of the second imaging device are as shown in Figure 3.
Third half-reflecting mirror is arranged in presetting angle, the angle between the axis of third half-reflecting mirror and the axis of axicon Preferably 45 degree.The 4th half-reflecting mirror is equipped on the reflected light path of third half-reflecting mirror, optical path is divided by the 4th half-reflecting mirror Reflected light path and direct projection optical path.Tertiary focusing Guan Jing and third imaging dress are successively arranged on the reflected light path of 4th half-reflecting mirror It sets, tertiary focusing Guan Jingke is moved back and forth between the 4th half-reflecting mirror and third imaging device, the direct projection of the 4th half-reflecting mirror Optical path is directed at the 4th imaging device.Fig. 4 and Fig. 5 is respectively the imaging results of third imaging device and the 4th imaging device.
The laser of laser transmitting focuses Guan Jing through first by forming bessel beam, bessel beam after axicon Workpieces processing surface is focused to focus lamp.Light beam passes through the reflex of third half-reflecting mirror and the 4th half-reflecting mirror, and The focussing force of tertiary focusing Guan Jing is imaged in third imaging device, thus third imaging device can see Bezier always Clearest imaging of the light beam on workpieces processing surface.
When workpieces processing is when showing to be uneven, light beam focuses on workpieces processing surface cutting processing cannot be perfect Cutting effect.In order to make up this defect, the present embodiment kinematic system is connected using piezoelectric motor or other upper and lower inching gears It drives focus lamp to be moved up and down according to the space curved surface of product surface, guarantees that light beam focus point falls in the cutting of workpieces processing always On position, clearest imaging at this moment can be seen always in third imaging device.It, can be real according to the imaging in third imaging device When adjust focus lamp position, realize the auto-focusing of light beam.
4th imaging device is used to monitor in real time the ring of light quality of bessel beam formation, and then reflects bessel beam Quality.When the 4th imaging device reflect the bessel beam to be formed it is second-rate when, can be by kinematic system to axicon Position be finely adjusted, or adjust axicon simultaneously, focus Guan Jing and focus lamp concentricity, and then realize optimal Bezier Focus on light beam quality.
Monitoring system is electrically connected the first imaging device, the second imaging device, third imaging device and the 4th imaging device, receives Collect and analyzes the monitoring data transmitted by each imaging device in real time.
Kinematic system electrical connection first focuses Guan Jing and focus lamp, and control system is electrically connected monitoring system and kinematic system, Control system drives kinematic system to adjust the second displacement for focusing Guan Jing and focus lamp in real time according to the monitoring result of monitoring system And/or angle.
There is mismachining tolerance cost to reduce in time, the kinematic system of the present embodiment is electrically connected axicon, when adding When work error, kinematic system finely tunes the position of axicon with calibration error.
Further, it first focuses equipped with the 5th half-reflecting mirror between Guan Jing and third half-reflecting mirror, in the 5th half reflection The 4th focusing Guan Jing and LED light source are successively arranged on the reflected light path of mirror.The monitoring device of the present embodiment acts not only as shellfish The monitoring device of Sai Er light beam is also used as microscope use.
Further, laser, axicon, the first focusing Guan Jing and focus lamp are coaxially fixedly mounted.

Claims (7)

1. a kind of monitoring device of bessel beam, comprising: laser is disposed with along the output light path of the laser Axicon, first focus Guan Jing and focus lamp, and the focus point of the focus lamp is directed at workpieces processing, which is characterized in that described to swash The first half-reflecting mirror and the second half-reflecting mirror are equipped between light device and the axicon, described first focuses Guan Jing and the focusing Third half-reflecting mirror is equipped between mirror;
First half-reflecting mirror is arranged in presetting angle, and the first imaging is equipped on the reflected light path of first half-reflecting mirror Device;
Second half-reflecting mirror is arranged in presetting angle, is successively arranged second on the reflected light path of second half-reflecting mirror Guan Jing and the second imaging device are focused, described second focuses Guan Jingke in second half-reflecting mirror and second imaging device Between move back and forth;
The third half-reflecting mirror is arranged in presetting angle, and it is anti-that the 4th half is equipped on the reflected light path of the third half-reflecting mirror Penetrate mirror;Tertiary focusing Guan Jing and third imaging device, the third are successively arranged on the reflected light path of 4th half-reflecting mirror Guan Jingke is focused to move back and forth between the 4th half-reflecting mirror and the third imaging device, the 4th half-reflecting mirror Direct projection optical path is directed at the 4th imaging device;
Further include: monitoring system, the monitoring system are electrically connected first imaging device, the second imaging device, third imaging Device and the 4th imaging device, for collecting and surveying data;
Further include: kinematic system and control system, the kinematic system electrical connection described first focus Guan Jing and focus lamp;
The control system is electrically connected the monitoring system and kinematic system, and the kinetic system can be driven in real time according to monitoring data System adjusts the described second position for focusing Guan Jing and focus lamp.
2. monitoring device according to claim 1, which is characterized in that the kinematic system is electrically connected the axicon, uses In the position of the fine tuning axicon with calibration error.
3. monitoring device according to claim 1, which is characterized in that described first focuses Guan Jing and the third half reflection Between mirror be equipped with the 5th half-reflecting mirror, be successively arranged on the reflected light path of the 5th half-reflecting mirror the 4th focusing Guan Jing and LED light source.
4. monitoring device according to claim 1, which is characterized in that the laser, axicon, first focus Guan Jing and Focus lamp is coaxially fixedly mounted.
5. monitoring device according to claim 1, which is characterized in that the axis of first half-reflecting mirror and the axis rib Angle between the axis of mirror is 45 degree.
6. monitoring device according to claim 1, which is characterized in that the axis of the third half-reflecting mirror and the third The angle focused between the axis of Guan Jing is 45 degree.
7. monitoring device according to claim 1, which is characterized in that the axis of the 4th half-reflecting mirror and the third The angle focused between the axis of Guan Jing is 45 degree.
CN201711463922.6A 2017-12-28 2017-12-28 A kind of monitoring device of bessel beam Active CN107953028B (en)

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Publication number Priority date Publication date Assignee Title
CN109332877A (en) * 2018-11-07 2019-02-15 江汉大学 A kind of laser Remote Dynamic focusing system
CN112433365B (en) * 2020-11-17 2022-02-11 中国科学院西安光学精密机械研究所 Deviation correction method of light beam pointing control system based on conical mirror
DE102021112271A1 (en) 2021-05-11 2022-11-17 Trumpf Laser- Und Systemtechnik Gmbh Device and method for determining the beam quality

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CN101559629A (en) * 2009-05-12 2009-10-21 苏州德龙激光有限公司 Coaxial image system applied to LED laser cutting device
CN101769718A (en) * 2010-01-28 2010-07-07 哈尔滨工业大学 Device for detecting and adjusting coaxial coplanarity of laser focus and micropore
CN104655290A (en) * 2013-11-20 2015-05-27 南京理工大学 Fizeau dual-wavelength laser tuning phase-shifting interference testing device and testing method thereof
CN205650938U (en) * 2016-03-29 2016-10-19 深圳英诺激光科技有限公司 Laser beam machining device based on two coaxial CCD carry out vision positioning
CN107014793A (en) * 2017-04-21 2017-08-04 浙江大学 One kind is based on double galvanometer doublet multi-mode wide fields super-resolution micro imaging system
CN107088706A (en) * 2017-05-23 2017-08-25 武汉松盛光电科技有限公司 Multi-point sensing laser scanning manufacturing system
CN107329275A (en) * 2017-08-30 2017-11-07 苏州大学 A kind of method and system for producing high-quality quasi- bessel array light beam

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101134266A (en) * 2007-10-10 2008-03-05 厦门大学 Multifunctional laser processing tool bit with measuring apparatus
CN101559629A (en) * 2009-05-12 2009-10-21 苏州德龙激光有限公司 Coaxial image system applied to LED laser cutting device
CN101769718A (en) * 2010-01-28 2010-07-07 哈尔滨工业大学 Device for detecting and adjusting coaxial coplanarity of laser focus and micropore
CN104655290A (en) * 2013-11-20 2015-05-27 南京理工大学 Fizeau dual-wavelength laser tuning phase-shifting interference testing device and testing method thereof
CN205650938U (en) * 2016-03-29 2016-10-19 深圳英诺激光科技有限公司 Laser beam machining device based on two coaxial CCD carry out vision positioning
CN107014793A (en) * 2017-04-21 2017-08-04 浙江大学 One kind is based on double galvanometer doublet multi-mode wide fields super-resolution micro imaging system
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CN107329275A (en) * 2017-08-30 2017-11-07 苏州大学 A kind of method and system for producing high-quality quasi- bessel array light beam

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