CN107941329A - A kind of high-order interferometer - Google Patents
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- CN107941329A CN107941329A CN201710950808.XA CN201710950808A CN107941329A CN 107941329 A CN107941329 A CN 107941329A CN 201710950808 A CN201710950808 A CN 201710950808A CN 107941329 A CN107941329 A CN 107941329A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0425—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using optical fibers
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0477—Prisms, wedges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4413—Type
- G01J2001/442—Single-photon detection or photon counting
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/448—Array [CCD]
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Abstract
The present invention relates to the interferometry equipment technical field of light, especially a kind of high-order interferometer, it is characterised in that：The interferometer includes at least light source, double prism, positive cylindrical lens, fiber array and single-photon detector array, wherein described light source passes through the double prism successively, the positive cylindrical lens and the fiber array enter to the single-photon detector array, the double prism makes the light source produce interference, the light in the vertical direction for producing interference is carried out vertical compression by the positive cylindrical lens, the fiber array receives optical signal and transmits light to the single-photon detector array, the single-photon detector array is used to record the photon counting and photon arrival time that different optical fiber are transmitted in the fiber array.It is an advantage of the invention that：It is simple in structure, while keeping interference figure integrality, and add coupling efficiency；The accumulation of interference figure can be observed on room and time, while realize high-order coherent measurement.
Description
Technical field
The present invention relates to the interferometry equipment technical field of light, especially a kind of high-order interferometer.
Background technology
The light material indispensable as human survival and the carrier for receiving external information, have attracted many scientific workers
It is explored and is studied.Scholars are said on the particle of light and the arguement of eave theory continue for for a long time, the research for light
Also never stop.1801, Thomas Young said for optical variation by famous Dual-slit Interference Experiment and have established experiment base
Plinth.1905, Einstein was by photoelectric research, proposing light quantum hypothesis, it is believed that the energy of light is substantially one
What part was propagated aly, light also has corpuscular property.Nineteen twenty-six roentgen Max, Born formulated Born principles, it is pointed out
Moment t, found at the r of position particle probability density and the amplitude of the particle wave function at the point it is square directly proportional.
P(r,t)=Ψ*(r,t)Ψ(r,t)=∣Ψ(r,t)∣²
With the foundation of modern quantum theory, the duality principle of light is accepted extensively by people.Optical interference effects are just well
The duality principle of light is confirmed.Interference phenomenon is usually expressed as the light and dark bar of distribution of light intensity spatially quite stable
Line is distributed.Interference effect between dual-beam or multiple beam is simplest interference effect.Only frequency is identical, and phase difference is permanent
Fixed, the consistent coherent source of direction of vibration, could produce the interference of light.And in reality, the two-beam of two arbitrary source generations
It can not meet these interference conditions, can not just produce stable interference fringe.In order to make up this drawback, generally pass through interferometer
The light beam sent to same light source is split, so as to produce the two-beam or multi-beam for meeting interference condition.Produce dry
The two-beam related to can form stable light and dark interference fringe, the light and shade pair of interference fringe in the area of space to meet
Than, it is necessary to be represented with visibility, its definition is：
V=(Imax-Imin)⁄（Imax+Imin）
When Imin=0（Dark fringe is completely black）When, V=1, striped is most clear；As Imax ≈ Imin, V ≈ 0, striped is smudgy, very
It can not extremely differentiate.
2005, V.Jacques groups, which utilize, was based on single nitrogen hole in diamond nanocrystals（NV）The monochromatic light of colour center
Component, realizes Single-photon interference experiment.The use of wavelength is 532 nm in experiment, the pulse duration is the self-control arteries and veins of 800 ps
Laser is rushed, to excite single NV colour centers to produce single-photon source.The single-photon source of generation produces interference by double prism,
Then in charge coupling device（CCD）The display of interference image is carried out on camera, so as to embody the fluctuation of light.Can also make through
Cross double prism and produce two beam coherent lights of interference respectively by two avalanche photodides（APD）To carry out second order certainly
Measurement of correlation, embodies the corpuscular property of light.The experiment demonstrates the fluctuation and corpuscular property of light using single-photon source, but only
It can realize single order interference and the Second Order Interferometric of light, can not realize the interference of higher order.And single order interference figure in an experiment
Display and the measurement of Second Order Interferometric need that CCD or APD is used alone, and can not be measured using same device.2008
Year, which carries out Single-photon interference experiment, Ke Yitong using double prism and the grating with adjustable transmissive slits again
Cross and change the width of grating slit and change the visibility of interference image.The experiment demonstrates the principle of complementarity of bohr well,
But since grating can produce diffraction phenomena in itself, also have a certain impact to experimental result.
The content of the invention
The purpose of the present invention is according to above-mentioned the deficiencies in the prior art, there is provided a kind of high-order interferometer and utilize its progress
The method of coherent measurement, light source produce interference by double prism, recycle cylindrical lens that light in the vertical direction is vertical
Compression, makes it conveniently be coupled in fiber array, and is transported to single-photon detector array, so that build to observe at the same time
Single order is interfered and the more accurate interferometer of high-order interference.
The object of the invention is realized and completed by following technical scheme：
A kind of high-order interferometer, it is characterised in that：The interferometer includes at least light source, double prism, positive cylindrical lens, light
Fibre array and single-photon detector array, wherein the light source successively by the double prism, the positive cylindrical lens and
The fiber array enters to the single-photon detector array, and the double prism makes the light source produce interference, institute
State positive cylindrical lens and will produce the light in the vertical direction of interference and carry out vertical compression, the fiber array receives optical signal and by light
The single-photon detector array is transmitted to, the single-photon detector array is used to record different optical fiber in the fiber array
The photon counting transmitted and photon arrival time.
Double prism is the essence of wavefront-splitting interference device, and the light wave for making to send is formed after the refraction of upper and lower two prisms
The refraction light that two beams are concerned with, they are considered as sending from two imaginary light sources, and interference can be produced in overlapping region.Light beam is by luxuriant and rich with fragrance
Interference is produced after Nie Er biprisms, interference fringe property is identical with Young's interfenrece fringes.It can be placed after double prism
One charge coupling device（CCD）, CCD camera have recorded the interference figure formed below in biprism.By adjusting biprism
Position, the differentiation of pattern is shown on CCD, so that it is determined that most clearly interference fringe.
Use double prism to carry out wavefront-splitting interference to light beam, also use cylindrical lens.Cylindrical lens can be divided into
Positive cylindrical lens and negative cylindrical lens, positive column lens on light have converging action, and negative cylindrical lens have disperse function to light.The interferometer uses
Be exactly positive cylindrical lens.Light beam produces two beam coherent lights after double prism reflects, and coherent light is with the side of vertical cylinder
To inciding cylindrical lens.Cylindrical lens can carry out vertical compression with the vertical direction to these light, while also make the interference of generation
Striped is compressed, so that it is conveniently coupled in fiber array.
The light source refers to that the laser beam that laser produces, or the laser are beaten on rotating frosted glass
The counterfeit thermal light source produced, or the single-photon source that the laser excites the single nitrogen vacancy color centers of diamond to produce.
The fiber array includes the multifiber in one-dimensional linear arrangement, and the more optical fiber are used to receive optical signal simultaneously
The light of diverse location interference fringe is transported in the corresponding detection channels of single-photon detector array respectively.
The single-photon detector array is made of the discrete silicon avalanche photodiode of multiple fiber couplings, the monochromatic light
Sub- detector array has the corresponding detection channels of number of fibers with the fiber array.
The single-photon detector array is connected to a logic analyser or is connected to a single photon counter.
It is be based on silicon avalanche photodiode for carrying out single order interference and high-order interferometry（Si-APD）Monochromatic light
Sub- detector array.Si-APD is high speed, Gao Min and the high-gain bandwidth photodiode with internal gain mechanism, low
Under the requirement of light and fast response time, there is very outstanding measurement effect.By the light of cylindrical lens compression by fiber array,
It is respectively coupled on the corresponding detection channels of single-photon detector array.The different detection channels of single-photon detector array are connected
It is connected on logic analyser, it is possible to while the photon counting on each passage and photon arrival time are recorded, then carry out data
Processing, it is possible to realize single order coherent measurement and high-order coherent measurement.The difference of single-photon detector array can also be detected
Passage is connected to the single photon counter of time correlation（TCSPC）On, carry out the coherence measurement between any passage.
It is an advantage of the invention that：It is simple in structure, the interference of light can be produced by fresnel prism, the setting of cylindrical lens can
The light interfered is ideally focused on fiber array, while keeping interference figure integrality, and coupling is added
Efficiency；The accumulation with high-resolution interference figure can not only be observed on room and time, moreover it is possible to while realize height
Rank coherent measurement；It is applied widely, single-photon source and laser suitable for laser, from the single nitrogen vacancy color centers of diamond crystal
Beat the caused counterfeit thermal light source on rotating frosted glass.
Brief description of the drawings
Fig. 1 is the structure diagram of the single order interference experiment of the present invention；
Fig. 2 is the single order interference experiment measurement figure of the present invention；
Fig. 3 is the structure diagram of the Second Order Interferometric experiment of the present invention；
Fig. 4 is the Second Order Interferometric experiment measurement figure of the present invention.
Embodiment
Feature of present invention and other correlated characteristics are described in further detail by embodiment below in conjunction with attached drawing, so as to
In the understanding of technical staff of the same trade：
As shown in Figs 1-4, figure label 1-7 is expressed as：Light source 1, double prism 2, positive cylindrical lens 3, fiber array
4th, single-photon detector array 5, logic analyser 6, single photon counter 7.
Embodiment one：As shown in Figure 1, the high-order interferometer in the present embodiment includes a laser, laser can be launched
Laser beam as light source 1.Double prism 2 is provided with the rear of light source 1, double prism 2 is used for light beam
Reflected and it is produced two beam coherent lights, they are considered as sending from two imaginary light sources, can be produced in overlapping region dry
Relate to, i.e., double prism 2 can make light source 1 produce interference.It is provided with and is used for light vertical at the rear of double prism 2
The positive cylindrical lens 3 of vertical compression are carried out on direction, while positive cylindrical lens 3 also can produce light source 1 after double prism 2
The light of interference is compressed, so that it is conveniently coupled among fiber array 4.The rear of positive cylindrical lens 3 is provided with receiving
Optical signal and the fiber array 4 for being transported to single-photon detector array 5, single-photon detector array 5 are used to record photon counting
With the photon arrival time.Single-photon detector array 5 is connected to logic analyser 6, and logic analyser 6 is gone forward side by side for gathered data
Row data processing and display.
By taking wavelength is the laser light source 1 of 637nm as an example, which is refracted into two beams by double prism 2 and is concerned with
Light, so as to produce interference.Interference figure can be observed by CCD, so that it is determined that most clearly interference fringe, but because of optics instrument below
Device is built, and CCD is not placed in light path shown in attached drawing.Then light in the vertical direction is hung down using positive cylindrical lens 3
Vertical compression contracts, and output coupling is into 16 optical fiber of fiber array 4.16 optical fiber of fiber array 4 are in one-dimensional linear array, will
The light of diverse location interference fringe is transported in 5 corresponding detection channels of single-photon detector array, that is to say, that 16 optical fiber
16 Si-APD detection channels on single-photon detector array 5 are corresponded to respectively, and each Si-APD detection channels can record it
Corresponding photon counting and photon arrival time.Single-photon detector array 5 by multiple fiber couplings discrete silicon avalanche optoelectronic
Diode（Si-APD）Composition, each discrete silicon avalanche photodiode form a detection channels.With single-photon detector
The logic analyser 6 that array 5 is connected, can detect each Si-APD of single-photon detector array 5 in a period of time logical
The photon counting in road all integration summations respectively, it is possible to the photon counting of 16 Si-APD detection channels is calculated, so that directly
Make the single order interference image of light source 1.
Persistently launch light source 1 and pass through certain accumulated time, the cumulative signal that logic analyser 6 is collected into such as Fig. 2 institutes
Show, the intensity of middle bright fringes is 104kcounts/s, and dark fringe intensity is 13kcounts/s, and interference visibility is up to 78%.
Using this coherent measurement method in the present embodiment, the single order coherence of the photon of light source 1 can be obtained, so as to fulfill light source
1 single order coherent measurement.
Logic analyser 6 can be with each light of each Si-APD detection channels of record photon detector array 5
The arrival time of son, optional two of which Si-APD detection channels, are connected on logic analyser 6 to carry out temporal information
Collection and processing, it is possible to carry out second-order coherence measurement.It can also select n（n≤16）A passage, uses logic analyser 6
To carry out data processing, so as to fulfill the high-order coherent measurement of n ranks interference.
Embodiment two：As shown in figure 3, the present embodiment is compared to the difference of embodiment one：It is single in embodiment one
Photon detector array 5 connect be logic analyser 6, and in the present embodiment single-photon detector array 5 connected be can
Realize the single photon counter 7 of the time correlation of coherent measurement between any detection channels on single-photon detector array 5
（TCSPC）.
Equally by taking wavelength is the laser light source 1 of 637 nm as an example, which is refracted into two by double prism 2
Beam coherent light, so as to produce interference.Interference figure can be observed by CCD, so that it is determined that most clearly interference fringe, but because below
Optical instrument is built, and CCD is not placed in light path shown in attached drawing.Positive cylindrical lens 3 are then used by light in the vertical direction
Vertical compression is carried out, and output coupling is into 16 optical fiber of fiber array 4.16 optical fiber correspond to single-photon detector array respectively
16 Si-APD detection channels on 5, each Si-APD detection channels can record its corresponding photon counting and photon arrives at
Time.Optional two Si-APD detection channels are connected to the single photon counter of time correlation（TCSPC）, it is possible to carry out second order
Coherent measurement.
, can be by a pulse when a Si-APD detection channels of single-photon detector array 5 receive photon signal
Send single photon counter 7 to, single photon counter 7 starts timing, start can be denoted as, until single-photon detector array 5
After another Si-APD detection channels receives photon, an electric pulse is also conveyed to TCSPC, timing stops, and is denoted as stop.
The single photon counter 7 being connected with Si-APD passages is by the information storage of time difference and by largely counting this time difference
According to the correlation information between photon can be obtained.Mutually processing is carried out by this start-stop to calculate photon coherence,
It can realize that second-order coherence measures.
It is equally possible that three Si-APD detection channels optionally on single-photon detector array 5 carry out start-
Stop-stop realizes the coherent measurement of three ranks interference, and optional four Si-APD detection channels carry out two start-stop comes
Realize that quadravalence is interfered.Similarly, we can optional n（N≤16, the actual quantity depending on detection channels）A Si-APD detections are logical
Road, to carry out n rank interference.As shown in figure 4, using single photon counter 7 to No. 3 on single-photon detector array 5（Optical fiber mark
Number）Passage and No. 13（Optical fiber label）Passage carries out second-order coherence measurement, and second order auto-correlation coefficient g2 (τ) ≈ 1, meets laser
Second-order coherence property.
Above-described embodiment is in the specific implementation：Light source 1 can be the laser beam that laser produces, or laser beats
The counterfeit thermal light source produced on rotating frosted glass, or the list that laser excites the single nitrogen vacancy color centers of diamond to produce
Photon source；That is, the high-order interferometer in above-described embodiment is applicable to above-mentioned three kinds of light sources.
Although the design to the object of the invention and embodiment elaborate above example referring to the drawings, this
Field those of ordinary skill will recognize, still can be right in the case where limiting the precondition of scope without departing from claim
The present invention makes various modifications and variations, therefore does not repeat one by one herein.
Claims (5)
- A kind of 1. high-order interferometer, it is characterised in that：The interferometer include at least light source, double prism, positive cylindrical lens, Fiber array and single-photon detector array, wherein the light source is successively by the double prism, the positive cylindrical lens The single-photon detector array is entered to the fiber array, the double prism makes the light source produce interference, The light in the vertical direction for producing interference is carried out vertical compression by the positive cylindrical lens, and the fiber array receives optical signal and will To the single-photon detector array, the single-photon detector array is used to record not share the same light in the fiber array optical transport The photon counting and photon arrival time that fibre is transmitted.
- A kind of 2. high-order interferometer according to claim 1, it is characterised in that：The light source refers to what laser produced Laser beam, or the laser beat on rotating frosted glass the counterfeit thermal light source produced, or the laser swashs The single-photon source for sending out the single nitrogen vacancy color centers of diamond to produce.
- A kind of 3. high-order interferometer according to claim 1, it is characterised in that：The single-photon detector array is connected to One logic analyser is connected to a single photon counter.
- A kind of 4. high-order interferometer according to claim 1, it is characterised in that：It is in one-dimensional linear that the fiber array, which includes, The multifiber of arrangement, the more optical fiber are used to receive optical signal and the light of diverse location interference fringe is transported to institute respectively State in the corresponding detection channels of single-photon detector array.
- A kind of 5. high-order interferometer according to claim 1, it is characterised in that：The single-photon detector array is by multiple The discrete silicon avalanche photodiode composition of fiber coupling, the single-photon detector array have the light with the fiber array The fine corresponding detection channels of quantity.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109375379A (en) * | 2018-11-26 | 2019-02-22 | 北京科技大学 | A kind of laser interferencefringes transmitter |
| CN110703394A (en) * | 2018-07-09 | 2020-01-17 | 余姚舜宇智能光学技术有限公司 | Large-area signal light energy acquisition system and method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4320973A (en) * | 1975-02-11 | 1982-03-23 | Agence Nationale De Valorisation De La Recherche (Anvar) | Device for interferential spectrometry with selective modulation |
| US5131747A (en) * | 1988-12-28 | 1992-07-21 | Aerospatiale Societe Nationale Industrielle | Interferometry device for fourier transform multiplex spectro-imaging apparatus and spectro-imaging apparatus containing the same |
| CN1916575A (en) * | 2005-08-18 | 2007-02-21 | 中国科学院西安光学精密机械研究所 | Large-shearing-quantity transverse shearing beam splitting method and transverse shearing beam splitter for realizing method |
| CN107144352A (en) * | 2017-05-16 | 2017-09-08 | 中国电子科技集团公司第四十研究所 | A kind of open score section interference spectroscope and detection method |
-
2017
- 2017-10-13 CN CN201710950808.XA patent/CN107941329B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4320973A (en) * | 1975-02-11 | 1982-03-23 | Agence Nationale De Valorisation De La Recherche (Anvar) | Device for interferential spectrometry with selective modulation |
| US5131747A (en) * | 1988-12-28 | 1992-07-21 | Aerospatiale Societe Nationale Industrielle | Interferometry device for fourier transform multiplex spectro-imaging apparatus and spectro-imaging apparatus containing the same |
| CN1916575A (en) * | 2005-08-18 | 2007-02-21 | 中国科学院西安光学精密机械研究所 | Large-shearing-quantity transverse shearing beam splitting method and transverse shearing beam splitter for realizing method |
| CN107144352A (en) * | 2017-05-16 | 2017-09-08 | 中国电子科技集团公司第四十研究所 | A kind of open score section interference spectroscope and detection method |
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| CN110703394A (en) * | 2018-07-09 | 2020-01-17 | 余姚舜宇智能光学技术有限公司 | Large-area signal light energy acquisition system and method |
| CN109375379A (en) * | 2018-11-26 | 2019-02-22 | 北京科技大学 | A kind of laser interferencefringes transmitter |
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