CN107941329B - High-order interferometer - Google Patents
High-order interferometer Download PDFInfo
- Publication number
- CN107941329B CN107941329B CN201710950808.XA CN201710950808A CN107941329B CN 107941329 B CN107941329 B CN 107941329B CN 201710950808 A CN201710950808 A CN 201710950808A CN 107941329 B CN107941329 B CN 107941329B
- Authority
- CN
- China
- Prior art keywords
- interference
- detector array
- light
- photon detector
- photon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000013307 optical fiber Substances 0.000 claims abstract description 33
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- 238000001514 detection method Methods 0.000 claims description 25
- 239000000835 fiber Substances 0.000 claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 10
- 229910003460 diamond Inorganic materials 0.000 claims description 5
- 239000010432 diamond Substances 0.000 claims description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- 239000005337 ground glass Substances 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 21
- 230000001427 coherent effect Effects 0.000 abstract description 20
- 238000009825 accumulation Methods 0.000 abstract description 3
- 230000008878 coupling Effects 0.000 abstract description 3
- 238000010168 coupling process Methods 0.000 abstract description 3
- 238000005859 coupling reaction Methods 0.000 abstract description 3
- 238000002474 experimental method Methods 0.000 description 9
- 230000000694 effects Effects 0.000 description 7
- 239000002245 particle Substances 0.000 description 6
- 238000012545 processing Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 238000010276 construction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000036962 time dependent Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005305 interferometry Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002159 nanocrystal Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000004083 survival effect Effects 0.000 description 1
- 230000005428 wave function Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0425—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0477—Prisms, wedges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4413—Type
- G01J2001/442—Single-photon detection or photon counting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/446—Photodiode
- G01J2001/4466—Avalanche
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/448—Array [CCD]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention relates to the technical field of optical interference measurement equipment, in particular to a high-order interferometer, which is characterized in that: the interferometer at least comprises a light source, a Fresnel biprism, a positive cylindrical lens, an optical fiber array and a single-photon detector array, wherein the light source sequentially passes through the Fresnel biprism, the positive cylindrical lens and the optical fiber array and enters the single-photon detector array, the Fresnel biprism enables the light source to generate interference, the positive cylindrical lens vertically compresses the light generating interference in the vertical direction, the optical fiber array receives optical signals and transmits the light to the single-photon detector array, and the single-photon detector array is used for recording photon counts and photon arrival time transmitted by different optical fibers in the optical fiber array. The invention has the advantages that: the structure is simple, and the coupling efficiency is increased while the integrity of the interference pattern is kept; the accumulation of interference patterns can be observed in space and time while achieving higher order coherent measurements.
Description
Technical Field
The invention relates to the technical field of optical interference measurement equipment, in particular to a high-order interferometer.
Background
Light is used as an indispensable substance for human survival and a carrier for receiving external information, and attracts a plurality of scientists to explore and research. The debate of the students about the particle and fluctuation of light has been long, and the research on light has not been stopped. In 1801, Thomas Young establishes experimental foundation for optical fluctuation through a famous double-slit interference experiment. In 1905, Einstein proposed a photon hypothesis through a study of the photoelectric effect, and it is believed that the energy of light is essentially transmitted in parts, and the light is also particulate. In 1926 german physicist Max Born formulated the Born principle, which states that at time t, the probability density of finding a particle at location r is proportional to the square of the amplitude of the particle wave function at that point.
P(r,t)=Ψ*(r,t)Ψ(r,t)=∣Ψ(r,t)∣²
With the establishment of modern quantum theory, the wave-particle duality of light is widely accepted by people. The optical interference effect well demonstrates the wavelike-particle duality of light. The interference phenomenon is usually manifested as a spatially rather stable fringe distribution between light and dark. The interference effect between two or more beams is the simplest interference effect. Only coherent light sources with the same frequency, constant phase difference and consistent vibration direction can generate light interference. In reality, two beams of light generated by two independent light sources cannot satisfy the interference conditions, and stable interference fringes cannot be generated. To compensate for this disadvantage, the light beam emitted by the same light source is generally split by an interferometer to produce two or more beams of light that satisfy the interference condition. Two beams of light generating interference form stable interference fringes with alternate bright and dark in a meeting space region, the bright and dark contrast of the interference fringes needs to be expressed by visibility, and the definition is as follows:
V=(Imax-Imin)⁄（Imax+Imin）
when Imin =0 (dark stripes are all black), V =1, the stripes are clearest; when Imax ≈ Imin, V ≈ 0, the fringes are blurred, or even indistinguishable.
In 2005, the v.jacques group implemented single photon interference experiments using a single photon source based on a single nitrogen hole (NV) color center in diamond nanocrystals. A homemade pulse laser with the wavelength of 532 nm and the pulse duration of 800 ps is used in the experiment to excite a single NV color center to generate a single photon source. The generated single photon source generates interference through a Fresnel biprism, and then an interference image is displayed on a Charge Coupled Device (CCD) camera, so that the fluctuation of light is reflected. Two beams of coherent light which generate interference through the Fresnel biprism can also be subjected to second-order autocorrelation measurement through two Avalanche Photodiodes (APDs), so that the particle property of the light is reflected. In the experiment, single photon sources are used for verifying the volatility and the particle property of light, but only first-order interference and second-order interference of the light can be realized, and higher-order interference cannot be realized. In addition, in the experiment, the display of the first-order interference pattern and the measurement of the second-order interference need to use a CCD or an APD independently, and the measurement cannot be carried out by using the same device. In 2008, the group performed single photon interference experiments with a fresnel biprism and a grating with an adjustable transmission slit, and the visibility of the interference image can be changed by changing the width of the grating slit. The experiment well verifies the Bohr's complementary principle, but the grating itself can generate diffraction phenomenon, which has certain influence on the experimental result.
Disclosure of Invention
The invention aims to provide a high-order interferometer and a method for carrying out coherent measurement by using the same, according to the defects of the prior art, a light source generates interference through a Fresnel biprism, light is vertically compressed in the vertical direction by using a cylindrical lens, so that the light is conveniently coupled into an optical fiber array and is transmitted to a single photon detector array, and a more precise interferometer capable of simultaneously observing first-order interference and high-order interference is constructed.
The purpose of the invention is realized by the following technical scheme:
a higher order interferometer, characterized by: the interferometer at least comprises a light source, a Fresnel biprism, a positive cylindrical lens, an optical fiber array and a single-photon detector array, wherein the light source sequentially passes through the Fresnel biprism, the positive cylindrical lens and the optical fiber array and enters the single-photon detector array, the Fresnel biprism enables the light source to generate interference, the positive cylindrical lens vertically compresses the light generating interference in the vertical direction, the optical fiber array receives optical signals and transmits the light to the single-photon detector array, and the single-photon detector array is used for recording photon counts and photon arrival time transmitted by different optical fibers in the optical fiber array.
The fresnel biprism is the essence of the interference device before the wave division, so that the emitted light wave is refracted by the upper and lower prisms to form two coherent refracted lights, which can be regarded as being emitted from two virtual light sources, and the interference can be generated in the overlapping area. The light beams generate interference after passing through the Fresnel double prism, and the property of the interference fringes is the same as that of the Young interference fringes. A Charge Coupled Device (CCD) may be placed behind the fresnel biprism and a CCD camera records the interference pattern formed behind the biprism. By adjusting the position of the double prism, the evolution of the pattern is shown on the CCD, thus determining the clearest interference fringes.
The Fresnel biprism is used for wave-splitting front interference of light beams, and a cylindrical lens is also used. The cylindrical lens can be divided into a positive cylindrical lens and a negative cylindrical lens, wherein the positive cylindrical lens has a convergence effect on light, and the negative cylindrical lens has a divergence effect on light. The interferometer uses a positive cylindrical lens. The light beam is refracted by the Fresnel biprism to generate two beams of coherent light, and the coherent light enters the cylindrical lens in a direction vertical to the cylindrical surface. The cylindrical lens allows vertical compression of the light in the vertical direction, while also compressing the resulting interference fringes, thereby facilitating coupling into the fiber array.
The light source refers to a laser beam generated by a laser, or a pseudo-thermal light source generated by the laser hitting on rotating ground glass, or a single-photon source generated by the laser exciting a single nitrogen hole color center of diamond.
The optical fiber array comprises a plurality of optical fibers which are linearly arranged in one dimension, and the optical fibers are used for receiving optical signals and respectively transmitting light of interference fringes at different positions to corresponding detection channels of the single photon detector array.
The single photon detector array is composed of a plurality of fiber-coupled discrete silicon avalanche photodiodes, and is provided with detection channels corresponding to the number of optical fibers of the fiber array.
The single photon detector array is connected to a logic analyzer or to a single photon counter.
Used to perform first order and higher order interferometry is a single photon detector array based on silicon avalanche photodiodes (Si-APDs). The Si-APD is a high-gain bandwidth photodiode which is high-speed, high-sensitive and has an internal gain mechanism, and has an excellent measurement effect under the requirements of low light and quick response time. The light compressed by the cylindrical lens is respectively coupled to corresponding detection channels of the single photon detector array through the optical fiber array. Different detection channels of a single photon detector array are connected to a logic analyzer, so that photon counting and photon arrival time on each channel can be recorded at the same time, and data processing is performed, so that first-order coherent measurement and high-order coherent measurement can be realized. It is also possible to connect different detection channels of a single photon detector array to a time dependent single photon counter (TCSPC) to make coherence measurements between any of the channels.
The invention has the advantages that: the Fresnel prism can generate light interference, and the cylindrical lens can perfectly focus the light which is interfered onto the optical fiber array, so that the coupling efficiency is increased while the integrity of interference patterns is maintained; not only can the accumulation of interference patterns with high resolution be observed in space and time, but also high-order coherent measurement can be realized simultaneously; the method has wide application range, and is suitable for laser, a single photon source from a single nitrogen hole color center of a diamond crystal and a pseudo-thermal light source generated by the laser hitting on rotating ground glass.
Drawings
FIG. 1 is a schematic structural diagram of a first-order interference experiment according to the present invention;
FIG. 2 is a first-order interferometric experimental measurement of the present invention;
FIG. 3 is a schematic structural diagram of a second order interference experiment according to the present invention;
FIG. 4 is a second order interferometric experimental measurement of the present invention.
Detailed Description
The features of the present invention and other related features are described in further detail below by way of example in conjunction with the following drawings to facilitate understanding by those skilled in the art:
as shown in fig. 1-4, reference numerals 1-7 in the drawings denote: the device comprises a light source 1, a Fresnel biprism 2, a positive cylindrical lens 3, an optical fiber array 4, a single photon detector array 5, a logic analyzer 6 and a single photon counter 7.
The first embodiment is as follows: as shown in fig. 1, the higher-order interferometer in this embodiment includes a laser that can emit a laser beam as a light source 1. A fresnel biprism 2 is arranged behind the light source 1, and the fresnel biprism 2 is used for refracting the light beam and generating two beams of coherent light, which can be regarded as being emitted from two virtual light sources and can generate interference in an overlapping area, that is, the fresnel biprism 2 can generate interference for the light source 1. The rear part of the Fresnel biprism 2 is provided with a positive cylindrical lens 3 used for vertically compressing light in the vertical direction, and meanwhile, the positive cylindrical lens 3 can also compress light which is interfered by the light source 1 after passing through the Fresnel biprism 2, so that the light can be conveniently coupled into the optical fiber array 4. An optical fiber array 4 for receiving optical signals and transmitting the optical signals to a single photon detector array 5 is arranged behind the positive cylindrical lens 3, and the single photon detector array 5 is used for recording photon counting and photon arrival time. The single photon detector array 5 is connected to a logic analyzer 6, and the logic analyzer 6 is used for acquiring data and processing and displaying the data.
Taking a laser light source 1 with a wavelength of 637nm as an example, the laser light is refracted into two beams of coherent light by a fresnel biprism 2, thereby generating interference. The interference pattern can be observed by the CCD to determine the sharpest interference fringes, but because of the construction of the optical instrument at the back, the CCD is not placed in the optical path shown in the drawings. The light is then compressed vertically in the vertical direction using a positive cylindrical lens 3 and out-coupled into the 16 fibers of the fiber array 4. The 16 optical fibers of the optical fiber array 4 are arranged in a one-dimensional linear shape, and light of interference fringes at different positions is transmitted to corresponding detection channels of the single photon detector array 5, that is, the 16 optical fibers respectively correspond to 16 Si-APD detection channels on the single photon detector array 5, and each Si-APD detection channel can record corresponding photon counting and photon arrival time. The single photon detector array 5 is composed of a plurality of fiber-coupled discrete silicon avalanche photodiodes (Si-APDs), each of which forms a detection channel. The logic analyzer 6 connected with the single photon detector array 5 can respectively integrate and sum the photon counting of each Si-APD detection channel of the single photon detector array 5 in a period of time, and can calculate the photon counting of 16 Si-APD detection channels, thereby directly making a first-order interference image of the light source 1.
After a certain accumulation time, the logic analyzer 6 collects the accumulated signals as shown in fig. 2, the intensity of the middle bright fringe is 104kcounts/s, the intensity of the dark fringe is 13kcounts/s, and the interference visibility is as high as 78%. By using the coherent measurement method in this embodiment, the first order coherence of the photons of the light source 1 can be obtained, thereby realizing the first order coherent measurement of the light source 1.
The logic analyzer 6 can also record the arrival time of each photon of each Si-APD detection channel of the single photon detector array 5, and optionally two Si-APD detection channels are connected to the logic analyzer 6 to collect and process time information so as to perform second-order coherent measurement. It is also possible to select n (n ≦ 16) channels and use the logic analyzer 6 for data processing to achieve higher order coherent measurements of the n-order interference.
Example two: as shown in fig. 3, the difference between the first embodiment and the second embodiment is: in the first embodiment, the single photon detector array 5 is connected with a logic analyzer 6, and the single photon detector array 5 is connected with a time-correlated single photon counter 7 (TCSPC) which can realize coherent measurement between any detection channels on the single photon detector array 5.
Also taking a laser light source 1 with a wavelength of 637nm as an example, the light source 1 is refracted into two beams of coherent light by a fresnel biprism 2, thereby generating interference. The interference pattern can be observed by the CCD to determine the sharpest interference fringes, but because of the construction of the optical instrument at the back, the CCD is not placed in the optical path shown in the drawings. The light is then compressed vertically in the vertical direction using a positive cylindrical lens 3 and out-coupled into the 16 fibers of the fiber array 4. The 16 optical fibers respectively correspond to 16 Si-APD detection channels on the single photon detector array 5, and each Si-APD detection channel can record corresponding photon counting and photon arrival time. Optionally, two Si-APD detection channels are connected to a time-dependent single photon counter (TCSPC) to allow second-order coherence measurements.
When a Si-APD detection channel of the single photon detector array 5 receives a photon signal, a pulse is transmitted to the single photon counter 7, the single photon counter 7 starts to time and can be recorded as start, until another Si-APD detection channel of the single photon detector array 5 receives a photon, an electric pulse is transmitted to TCSPC, and the time is stopped and recorded as stop. The single photon counter 7 connected with the Si-APD channel stores the information of the time difference and obtains the correlation information between the photons by counting a large amount of the time difference data. By calculating photon coherence through the start-stop inter-processing, a second order coherence measure can be achieved.
Similarly, three Si-APD detection channels on the single photon detector array 5 can be selected to perform start-stop-stop to realize the coherent measurement of the third-order interference, and four Si-APD detection channels can be selected to perform two start-stops to realize the fourth-order interference. Similarly, we can optionally select n (n ≦ 16, depending on the actual number of detection channels) Si-APD detection channels for n-order interference. As shown in fig. 4, the single photon counter 7 is used to perform second-order coherent measurement on the channel No. 3 (fiber label number) and the channel No. 13 (fiber label number) on the single photon detector array 5, and the second-order autocorrelation coefficient g (τ) is kept equal to 1, which accords with the second-order coherence property of laser.
The above embodiments are embodied as follows: the light source 1 can be a laser beam generated by a laser, or a pseudo-thermal light source generated by the laser hitting on rotating ground glass, or a single-photon source generated by the laser exciting a single nitrogen hole color center of diamond; that is, the high-order interferometer in the above embodiment can be applied to the above three light sources.
Although the conception and the embodiments of the present invention have been described in detail with reference to the drawings, those skilled in the art will recognize that various changes and modifications can be made therein without departing from the scope of the appended claims, and therefore, they are not to be considered repeated herein.
Claims (5)
1. A higher order interferometer, characterized by: the interferometer at least comprises a light source, a Fresnel biprism, a positive cylindrical lens, an optical fiber array and a single-photon detector array, wherein the light source sequentially passes through the Fresnel biprism, the positive cylindrical lens and the optical fiber array and enters the single-photon detector array, the Fresnel biprism enables the light source to generate interference, the positive cylindrical lens vertically compresses the light generating interference in the vertical direction, the optical fiber array receives optical signals and transmits the light to the single-photon detector array, and the single-photon detector array is used for recording photon counts and photon arrival time transmitted by different optical fibers in the optical fiber array.
2. The higher order interferometer of claim 1, wherein: the light source refers to a laser beam generated by a laser, or a pseudo-thermal light source generated by the laser hitting on rotating ground glass, or a single-photon source generated by the laser exciting a single nitrogen hole color center of diamond.
3. The higher order interferometer of claim 1, wherein: the single-photon detector array is connected with a logic analyzer or a single-photon counter.
4. The higher order interferometer of claim 1, wherein: the optical fiber array comprises a plurality of optical fibers which are linearly arranged in one dimension, and the optical fibers are used for receiving optical signals and respectively transmitting light of interference fringes at different positions to corresponding detection channels of the single photon detector array.
5. The higher order interferometer of claim 1, wherein: the single photon detector array is composed of a plurality of fiber-coupled discrete silicon avalanche photodiodes, and is provided with detection channels corresponding to the number of optical fibers of the fiber array.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710950808.XA CN107941329B (en) | 2017-10-13 | 2017-10-13 | High-order interferometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710950808.XA CN107941329B (en) | 2017-10-13 | 2017-10-13 | High-order interferometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107941329A CN107941329A (en) | 2018-04-20 |
| CN107941329B true CN107941329B (en) | 2019-12-27 |
Family
ID=61935235
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710950808.XA Active CN107941329B (en) | 2017-10-13 | 2017-10-13 | High-order interferometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107941329B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110703394A (en) * | 2018-07-09 | 2020-01-17 | 余姚舜宇智能光学技术有限公司 | Large-area signal light energy acquisition system and method |
| CN109375379A (en) * | 2018-11-26 | 2019-02-22 | 北京科技大学 | A kind of laser interferencefringes transmitter |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4320973A (en) * | 1975-02-11 | 1982-03-23 | Agence Nationale De Valorisation De La Recherche (Anvar) | Device for interferential spectrometry with selective modulation |
| US5131747A (en) * | 1988-12-28 | 1992-07-21 | Aerospatiale Societe Nationale Industrielle | Interferometry device for fourier transform multiplex spectro-imaging apparatus and spectro-imaging apparatus containing the same |
| CN1916575A (en) * | 2005-08-18 | 2007-02-21 | 中国科学院西安光学精密机械研究所 | Large-shearing-quantity transverse shearing beam splitting method and transverse shearing beam splitter for realizing method |
| CN107144352A (en) * | 2017-05-16 | 2017-09-08 | 中国电子科技集团公司第四十研究所 | A kind of open score section interference spectroscope and detection method |
-
2017
- 2017-10-13 CN CN201710950808.XA patent/CN107941329B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4320973A (en) * | 1975-02-11 | 1982-03-23 | Agence Nationale De Valorisation De La Recherche (Anvar) | Device for interferential spectrometry with selective modulation |
| US5131747A (en) * | 1988-12-28 | 1992-07-21 | Aerospatiale Societe Nationale Industrielle | Interferometry device for fourier transform multiplex spectro-imaging apparatus and spectro-imaging apparatus containing the same |
| CN1916575A (en) * | 2005-08-18 | 2007-02-21 | 中国科学院西安光学精密机械研究所 | Large-shearing-quantity transverse shearing beam splitting method and transverse shearing beam splitter for realizing method |
| CN107144352A (en) * | 2017-05-16 | 2017-09-08 | 中国电子科技集团公司第四十研究所 | A kind of open score section interference spectroscope and detection method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107941329A (en) | 2018-04-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103115680B (en) | Super sensitive spectrograph and spectrum detection method | |
| CN104054266B (en) | A kind of time resolution single photon or pole low light level multiplanar imaging spectroscopic system and method | |
| Zhou et al. | Third-order correlation function and ghost imaging of chaotic thermal light in the photon counting regime | |
| CN101435970B (en) | Imaging with nondegenerate frequency-entangled photons | |
| US7667824B1 (en) | Range gated shearography systems and related methods | |
| US8159680B2 (en) | Single-transducer, three-dimensional laser imaging system and method | |
| CN103090971A (en) | Ultra-sensitive time resolution imaging spectrometer and time resolution imaging method thereof | |
| CN102768069B (en) | Single-photon spectral counting and imaging system and method for complementary measurement | |
| CN102564575B (en) | Laser far-field focal spot measuring method based on orthogonal optical wedge light splitting characteristics and focal spot reconstruction algorithm | |
| CN103472457A (en) | Three-dimensional imaging system and method for calculating correlation flight time by means of sparse aperture compression | |
| CN103472456A (en) | Active imaging system and method based on sparse aperture compressing calculation correlation | |
| CN107941329B (en) | High-order interferometer | |
| CN103471718A (en) | Hyperspectral imaging system and method based on sparse aperture compressing calculation correlation | |
| Iskhakov et al. | Intensity correlations of thermal light: Noise reduction measurements and new ghost imaging protocols | |
| US11231323B2 (en) | Time-resolved hyper-spectral single-pixel imaging | |
| CN103994719A (en) | High-precision three-dimensional imaging device based on Geiger APD arrays and using method thereof | |
| CN102426062A (en) | Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device | |
| CN104267407A (en) | Initiative imaging method and system based on compressed sampling | |
| Nomerotski et al. | Spatial and temporal characterization of polarization entanglement | |
| CN102359814B (en) | Three-dimensional laser motion attitude measuring system and method | |
| US11892801B2 (en) | Systems and methods for simultaneous multi-channel off-axis holography | |
| CN103115681B (en) | Super sensitive time resolution spectrograph and time resolution method thereof | |
| CN110161433B (en) | Intermediate layer magnetic field remote measuring device based on gated photon counting | |
| CN102878930A (en) | Phase object phase distribution quantitative measurement method and device as well as application of method and device | |
| CN201819989U (en) | Laser radar based on strongly correlated quantum imaging principle |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |