CN107870834B - Testing jig for hard disk backboard - Google Patents
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- CN107870834B CN107870834B CN201610859249.7A CN201610859249A CN107870834B CN 107870834 B CN107870834 B CN 107870834B CN 201610859249 A CN201610859249 A CN 201610859249A CN 107870834 B CN107870834 B CN 107870834B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
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Abstract
The invention provides a testing jig for a hard disk backboard, which comprises an interface unit, a singlechip, a plurality of port expansion units and a plurality of switching units, wherein the singlechip, the plurality of port expansion units and the plurality of switching units are arranged in the testing jig; the interface unit comprises a plurality of interface groups and a first communication interface; the interface group is correspondingly connected with the interface group of one hard disk on the hard disk backboard to be tested; the switching unit corresponds to the interface group: one end of the switching unit is connected with the corresponding interface group, and the other end of the switching unit is respectively connected with the singlechip and the corresponding port expansion unit; the port expansion unit is connected with the singlechip and used for converting the multipath data received from the switching unit into single-path data and outputting the single-path data to the singlechip; the singlechip is connected with the peripheral electronic equipment through the first communication interface and is used for controlling the switching among the plurality of switching units according to the test program, so that the test of different hard disks on the hard disk backboard to be tested is realized. The invention has low cost, short test time, high test coverage rate and low test risk.
Description
Technical Field
The invention relates to the technical field of server function test, in particular to a test fixture applied to a hard disk backboard of a server.
Background
With the rapid development of society and economy, individuals and enterprises are increasingly using computers. In recent years, with the development of new technologies such as cloud storage and big data, enterprises have raised higher and higher demands on data storage functions of computers. Correspondingly, according to the actual demands of users, computer manufacturers increase the number of hard disks storing data in the computers. Because the middle bridge of the hard disk and the main board is a hard disk backboard, a corresponding multi-interface hard disk backboard is also generated. The hard disk backboard with multiple interfaces is corrected to access a plurality of hard disks simultaneously, so that the simultaneous access of a plurality of hard disk data in a computer is realized, and the requirements of enterprises are met. Before the hard disk backboard leaves the factory, the hard disk backboard is checked to ensure that the produced hard disk backboard meets the factory standard.
At present, computer manufacturers use a server main board to plug in a corresponding number of CPUs, memories and hard disks, and then are matched with a special power supply, a display, a keyboard and other matched devices to run corresponding test programs, so that the test of the multi-interface hard disk backboard is realized. However, with this hard disk back plate testing method, there are the following disadvantages:
1) The tool cost of test is too high: since a series of devices are required to be matched in the existing test method, for example: server motherboard, CPU, memory, hard disk, power supply, etc.; typically, if a hard disk backplane with 24 SAS (Serial Attached SCSI, serial linked SCSI) hard disks inserted is tested, the cost of the device required for the test is about 12 ten thousand yuan; if a hard disk backboard capable of being inserted with 10 solid state disks is tested, the cost of devices required for testing is about 15 ten thousand yuan;
2) The test time is long: typically, if a hard disk back plate with 24 pluggable SAS hard disks is tested, the test takes 13 minutes; if a hard disk backboard capable of being inserted with 10 solid state disks is tested, the test takes 18 minutes;
3) The test coverage rate is low: the test coverage rate of the existing test method is about 85%, and the empty welding of PIN PINs with the same function cannot be covered, such as power supply and grounding, so that the long-term stable operation of a server can be seriously influenced by the empty welding of the PIN PINs;
4) The risk of false detection and missing detection is high: after the test is started, a tester still needs to participate in judgment, and thus the possibility of false detection exists, such as judgment of the working state of the LED lamp. Moreover, in the testing process, the information of the hard disk backboard to be tested needs to be manually brushed, so that the possibility of brushing A and B exists, and missed testing is caused.
Disclosure of Invention
In view of the above-mentioned drawbacks of the prior art, an object of the present invention is to provide a testing fixture for a hard disk back plate of a server, which is used for solving the problems of low testing efficiency, high cost and incomplete coverage of the hard disk back plate of multiple interfaces of the server in the prior art.
To achieve the above and other related objects, the present invention provides a testing fixture for a hard disk back plate, comprising: the interface unit, the singlechip, the plurality of port expansion units and the plurality of switching units are arranged in the test fixture; the interface unit comprises a plurality of interface groups and a first communication interface; the interface group is correspondingly connected with the interface group of one hard disk on the hard disk backboard to be tested; the switching unit corresponds to the interface group: one end of the switching unit is connected with the corresponding interface group, and the other end of the switching unit is respectively connected with the singlechip and the corresponding port expansion unit; the port expansion unit is connected with the singlechip and is used for converting the multipath data received from the switching unit into single-path data and outputting the single-path data to the singlechip; the singlechip is connected with the peripheral electronic equipment through the first communication interface and is used for controlling the switching among the plurality of switching units according to a test program, so that the test of different hard disks on the hard disk backboard to be tested is realized.
In an embodiment of the invention, the plurality of interface groups are disposed at an upper panel of the test fixture, and the first communication interface is disposed at a side panel of the test fixture.
In an embodiment of the present invention, the peripheral electronic device includes a PC or a raspberry group, and data interaction is implemented between the peripheral electronic device and the single chip microcomputer through the first communication interface, where interaction data includes the test program and test data.
In an embodiment of the present invention, the singlechip includes a test circuit for testing the hard disk backplate to be tested; the test circuit and the test program are adjustable according to the actual test requirements.
In an embodiment of the invention, the interface unit further includes a power interface and a second communication interface set disposed at a side plate of the test fixture; the power interface and the hard disk backboard to be tested are used for supplying power to the hard disk backboard to be tested; the second communication interface group is connected with the communication interface group of the hard disk backboard to be tested, and the second communication interface group comprises: I2C interface, SPI interface, SGPIO interface, USB interface and network interface.
In an embodiment of the invention, the singlechip is further connected with the second communication interface group, and is used for testing the communication interface group of the to-be-tested hard disk backboard.
In an embodiment of the present invention, the interface group includes a hard disk interface group, an LED interface group, and a data read-write interface group; the hard disk interface group is connected with the hard disk interface group of the corresponding hard disk on the hard disk backboard to be tested; the LED interface group is connected with the LED test signal interface group of the corresponding hard disk on the hard disk backboard to be tested; the data read-write interface group is connected with the digital read-write interface group of the corresponding hard disk on the hard disk backboard to be tested.
In an embodiment of the present invention, in the switching unit, data from the LED interface group is directly transmitted to the single chip microcomputer; the data group from the data read-write interface is transmitted to the corresponding port expansion unit; and the data from the hard disk interface group are respectively transmitted to the singlechip and the corresponding port expansion unit.
In an embodiment of the invention, the port expansion unit is integrated on the corresponding switching unit.
In an embodiment of the invention, the test fixture further includes a power socket and a power switch disposed at a side plate of the test fixture, where the power socket is used to provide power for the test fixture; the power switch is used for controlling the on and/or off of the power supply of the test fixture.
As described above, the testing jig for the hard disk backboard applied to the server aims to test the hard disk backboard by adopting the singlechip, and because the testing program of the singlechip is designed according to the actual testing requirement, the testing jig is more flexible in testing the hard disk backboard, is not limited by the type of the hard disk backboard, and is more widely applied; in addition, the invention solves the problem of limited number of I/O interfaces of the singlechip by matching the switching unit and the port expansion unit, and realizes the test of the singlechip on different hard disk back plates. The invention also has the following beneficial technical effects:
1) The invention greatly reduces the cost of the test fixture: testing a hard disk backboard into which 24 SAS hard disks can be inserted, wherein the cost of the testing jig is reduced from 12 ten thousand yuan to about 5 ten thousand yuan; testing a hard disk backboard capable of being inserted with 10 solid state disks, and reducing the cost of the testing jig from 15 ten thousand yuan to about 8 ten thousand yuan;
2) Test time is reduced: the test time of one test backboard is not more than 5 minutes;
3) The test coverage rate is improved: the test coverage rate reaches 100%;
4) The testing risk is reduced: after the test is started, the test personnel are not needed to participate in judgment, so that false detection is avoided; and the novel test backboard is automatically brushed in, so that the possibility of missing test is greatly reduced.
Drawings
Fig. 1 is a schematic structural diagram of a testing fixture for a hard disk back plate according to an embodiment of the invention.
Fig. 2 is a schematic layout diagram of an upper panel of a testing fixture for a hard disk back plate according to an embodiment of the invention.
Fig. 3 is a schematic layout diagram of a front side plate of a testing fixture for a hard disk back plate according to an embodiment of the invention.
Fig. 4 is a schematic layout diagram of a rear side plate of a testing fixture for a hard disk back plate according to an embodiment of the invention.
Fig. 5 is a schematic diagram of the internal principle structure of a testing fixture for a hard disk back plate according to an embodiment of the invention.
Description of element reference numerals
100. Interface unit
110. Interface group
111. Hard disk interface group
112 LED interface group
113. Data read-write interface group
120. First communication interface
130. Power interface
140. Second communication interface group
200. Singlechip microcomputer
300. Switching unit
400. Port expansion unit
510. Power socket
520. Power switch
Detailed Description
Further advantages and effects of the present invention will become apparent to those skilled in the art from the disclosure of the present invention, which is described by the following specific examples.
Please refer to the accompanying drawings. It should be understood that the structures, proportions, sizes, etc. shown in the drawings are for illustration purposes only and should not be construed as limiting the invention to the extent that it can be practiced, since modifications, changes in the proportions, or otherwise, used in the practice of the invention, are not intended to be critical to the essential characteristics of the invention, but are intended to fall within the spirit and scope of the invention. Also, the terms such as "upper," "lower," "left," "right," "middle," and "a" and the like recited in the present specification are merely for descriptive purposes and are not intended to limit the scope of the invention, but are intended to provide relative positional changes or modifications without materially altering the technical context in which the invention may be practiced.
The testing jig for the hard disk backboard applied to the server adopts the singlechip to test the hard disk backboard of the server, is more flexible and has lower cost. However, the requirement of hard disk backboard test cannot be met due to the limited I/O (Input/Output) interface of the single chip microcomputer. Therefore, the testing jig of the hard disk backboard is further provided with the switching unit and the port expansion unit, the switching unit and the port expansion unit are matched for use, and the I/O interface is expanded, so that the testing of the singlechip on the hard disk backboard is realized.
Examples
The embodiment discloses a testing fixture for a hard disk backboard, which is applied to a server, namely, the hard disk backboard is a multi-interface hard disk backboard and supports simultaneous access to a plurality of hard disks.
As shown in fig. 1, the testing fixture for the hard disk back plate of the embodiment includes: an interface unit 100, a single chip microcomputer 200, a plurality of switching units 300, and a plurality of port expansion units 400.
The interface unit 100 is disposed on a panel or a side plate of the test fixture.
In this embodiment, for convenience of testing, a placement area 500 for placing the hard disk back plate is provided on the upper panel of the testing fixture, wherein the arrangement of the upper panel of the testing fixture is shown in fig. 2.
As shown in fig. 1 and 2, the interface unit 100 includes a plurality of interface groups 110, a first communication interface 120, a power interface 130, and a second communication interface group 140.
The number of the interface groups 110 is also related to the to-be-tested hard disk back plate, that is, the number of the interface groups 110 is the same as the number of the to-be-tested hard disk back plates supporting the simultaneously accessed hard disks. In this embodiment, taking the to-be-tested hard disk backboard support for simultaneously accessing 24 hard disks as an example, the description will be made. That is, the number of interface groups 110 in the present embodiment is 24. Of course, the hard disk backboard detectable by the test fixture is not limited to this type, and the test fixture can realize the test of the hard disk backboard provided that the hard disk backboard supports the simultaneous access of a plurality of hard disks.
One interface group 110 is correspondingly connected with the interface group of one hard disk of the hard disk backboard to be tested. In addition, since the hard disk back plate to be tested is placed in the placement area 500 of the upper panel of the test fixture, the 24 interface groups 110 are also disposed at the upper panel of the test fixture for the convenience of wiring.
Further, the interface group of one hard disk of the hard disk backboard to be tested includes, but is not limited to, a hard disk interface group, an LED test signal interface group and a digital read-write interface group. The hard disk interface group, the LED test signal interface group and the digital read-write interface group can be in the form of PIN PINs or gold fingers.
Correspondingly, an interface group 110 includes, but is not limited to: a hard disk interface group 111, an LED interface group 112, and a data read-write interface group 113; wherein,
the hard disk interface group 111 is used for being connected with the hard disk interface group of the corresponding hard disk of the hard disk backboard to be tested;
the LED interface group 112 is used for connecting with the LED test signal interface group of the corresponding hard disk of the hard disk backboard to be tested;
and the data read-write interface group 113 is used for being connected with the data read-write interface group of the corresponding hard disk of the hard disk backboard to be tested.
In addition, no matter the interface form of the interface group of the hard disk backboard to be tested, the interfaces of the interface group 110 of the embodiment are connected with the interfaces of the interface group of the corresponding hard disk of the hard disk backboard to be tested through the switching circuit board or the wire rod. Also, as shown in fig. 2, the interface groups 110 of the interface unit 100 are 24, and each interface group 110 corresponds to a hard disk interface group 111, an LED interface group 112, and a data read/write interface group 113.
The first communication interface 120 is in communication connection with a peripheral electronic device, and is used for realizing data interaction with the single-chip microcomputer 200. The method specifically comprises the following steps: writing a test program into the singlechip 200; the singlechip 200 is used for controlling data switching among the plurality of switching units 300, so that the singlechip 200 can test the hard disk backboard to be tested; test data is obtained from the single chip 200. Wherein the peripheral electronic devices connected to the first communication interface 120 include, but are not limited to, a PC, a notebook, and/or a raspberry group. In this embodiment, the first communication interface 120 preferably employs an MCU-ISP (Microcontroller Unit-Internet Service Provider) interface.
The power interface 130 is connected to a power interface of the hard disk backboard to be tested, and is used for supplying power to the hard disk backboard to be tested.
The second communication interface group 140 is connected to the communication interface group of the hard disk backboard to be tested. The second communication interface group 140 includes, but is not limited to: I2C (Inter-Integrated Circuit) interface, SPI (Serial Peripheral Interface ) interface, SGPIO (Serial General Purpose Input Output, serial universal input/output) interface, USB interface, and network interface, among others. When the hard disk backboard to be tested is tested, the interface of the second communication interface group 140 is connected with the corresponding communication interface of the hard disk backboard to be tested.
In addition, in the present embodiment, the first communication interface 120 and the power interface 130 are provided on the front side board of the test fixture; the interfaces of the second communication interface group 140 are respectively disposed on the front side plate and the rear side plate of the test fixture. The arrangement of the front side plate of the test fixture is shown in fig. 3, and the arrangement of the rear side plate of the test fixture is shown in fig. 4.
Further, as shown in fig. 3 and 4, in order to solve the power supply problem of the test fixture, the test fixture is further provided with a power socket 510 and a power switch 520. The power socket 510 is connected with an external direct current power supply or an alternating current power supply and is used for providing power for the test fixture; the power switch 520 is used for controlling the on and/or off of the power supply of the test fixture, so as to supply power to the singlechip 200 in the test fixture, and to supply power to the hard disk backboard to be tested through the power interface 130. In addition, for the convenience of use of the test, the power socket 510 is disposed on the rear side plate of the test fixture, and the power switch 520 is disposed on the front side plate of the test fixture.
The single chip microcomputer 200, the plurality of switching units 300 and the plurality of port expansion units 400 are disposed inside the test fixture.
In this embodiment, the testing of the hard disk back plate is completed by using the single chip microcomputer 200. However, since the number of terminals of the single-chip microcomputer 200 is limited, all data access of the hard disk back plate cannot be realized at the same time, and therefore, the data access problem of the single-chip microcomputer 200 is solved by using the plurality of switching units 300 and the plurality of port expansion units 400 in this embodiment.
The switching unit 300 and the port expansion unit 400 are used cooperatively, and the number of the switching unit 300 and the port expansion unit 400 is related to the hard disk back plate to be tested, i.e. the number of the switching unit 300 and the port expansion unit 400 is the same as the number of the hard disks which are supported by the hard disk back plate to be tested and accessed simultaneously. That is, the number of the switching units 300 and the port expansion units 400 of the present embodiment is 24. For convenience of illustration, only a schematic block diagram of the interface group 110, the switching unit 300, the port expansion unit 400, and the single chip 200 is shown in fig. 5, and the schematic block diagram of the remaining 23 interface groups 110, the switching unit 300, the port expansion unit 400, and the single chip 200 is the same as that shown in fig. 5.
The switching unit 300 is configured to integrate the data of the to-be-tested hard disk backboard accessed by the interface unit 100 according to each hard disk of the to-be-tested hard disk backboard, and finally transmit the integrated data to the singlechip 200 and the corresponding port expansion unit 400 respectively; the port expansion unit 400 is also connected with the single-chip microcomputer 200, and is used for converting multiple paths of data into single-path data and outputting the single-path data to the single-chip microcomputer 200 for testing, so that the problem of data access of the single-chip microcomputer 200 is solved. The data transmitted from the switching unit 300 to the singlechip 200 and the port expansion unit 400 is determined according to the data interface of one hard disk of the hard disk backboard to be tested.
As shown in fig. 5, in this embodiment, the data interface of one hard disk of the hard disk backplate to be tested includes: the device comprises a hard disk interface group, an LED test signal interface group and a data read-write interface group (not marked in the drawing), wherein the hard disk interface 111 group of the interface group 110 is connected with the hard disk interface group of one hard disk of the hard disk backboard to be tested, the LED interface group is connected with the LED test signal interface group of one hard disk of the hard disk backboard to be tested, and the data read-write interface group is connected with the data read-write interface group of one hard disk of the hard disk backboard to be tested. Since the data from the hard disk interface group 111 of the interface group 110 is relatively more, the switching unit 300 divides the data into two parts, and one part is directly transmitted to the singlechip 200 for testing, wherein the testing contents include but are not limited to: assignment and/or reading of circuit level states, reading of voltages, etc.; the other part is transmitted to the corresponding port expansion unit 400, and the data is converted into single-path data through the port expansion unit 400 and then transmitted to the singlechip 200 for testing. Compared with the data from the hard disk interface group 111 and the data read-write interface group 113, the data from the LED interface 112 of the interface group 110 is less, so the switching unit 300 directly transmits the data to the single chip microcomputer 200 to perform the photosensitive test and the color-sensitive test of the LED of the corresponding hard disk on the hard disk backboard to be tested. The data from the data read/write interface group 113 of the interface group 110 is the most, so the switching unit 300 transmits the data to the corresponding port expansion unit 400, converts the data into single-path data through the port expansion unit 400, and transmits the single-path data to the singlechip 200 for testing the signal channel of the corresponding hard disk on the hard disk backboard to be tested.
The port expansion unit 400 is configured to convert the received multi-path data into single-path data, and finally output the single-chip microcomputer 200. In this embodiment, the port expansion unit 400 preferably expands the I/O port using an I2C bus. Typically, one I2C bus extends 64I/O ports, and in this embodiment, more than ten thousand I/O ports of one I2C bus are extended by I2C bus extension I/O ports.
Further, the port expansion unit 400 and the corresponding switching unit 300 of the present embodiment are integratable.
The single chip microcomputer 200 is used for testing the hard disk backboard to be tested. In this embodiment, the single-chip microcomputer 200 is connected with an external electronic device through the first communication interface 120 in the interface unit 100, so as to implement data interaction between the single-chip microcomputer 200 and the external electronic device. The singlechip 200 is connected with the communication interface group of the hard disk backboard to be tested through the second communication interface group 140 in the interface unit 100, and is used for testing the communication interface group of the hard disk backboard to be tested. The single chip microcomputer 200 is also connected with each switching unit 300 and each port expansion unit 400 respectively, and is used for controlling data switching between the plurality of switching units 300 and the plurality of port expansion units 400 according to a test program, so as to realize corresponding test of each hard disk of the hard disk backboard to be tested.
Further, the singlechip 200 of this embodiment adopts an 8-bit or 32-bit MCU (Microcontroller Unit, micro control unit) and a test circuit, in which a test program is written, and the test of the hard disk backplate to be tested is realized through the test program and the test circuit. In this embodiment, the testing of the hard disk backboard that the singlechip 200 can realize includes, but is not limited to: testing the open and short circuit of the hard disk backboard and the digital logic circuit by using the level; the capacitive coupling circuit and the filter circuit of the hard disk backboard are tested by using the charge and discharge characteristics of the capacitor; testing the IC with the communication interface of the corresponding hard disk backboard by using a singlechip communication port (such as I2C, SPI, SGPIO, UART and the like); such as EEPROM for I2C communication, FLASH for SPI communication, MG9094 for SGPIO communication; testing capacitance/resistance parameters of the hard disk backboard through a test circuit; testing the color of the luminescence of the LED with a color sensor; the brightness of the light emitted by the LED was tested with a light sensor.
In addition, in order to highlight the innovative part of the present invention, units less closely related to solving the technical problem presented by the present invention are not introduced in the present embodiment, but it does not indicate that other units are not present in the present embodiment.
In summary, the testing fixture for the hard disk backboard of the server aims to test the hard disk backboard by adopting the singlechip, and because the testing program of the singlechip is designed according to the actual testing requirement, the testing fixture is more flexible in testing the hard disk backboard, is not limited by the type of the hard disk backboard, and is more widely applied; in addition, the invention solves the problem of limited number of I/O interfaces of the singlechip by matching the switching unit and the port expansion unit, and realizes the test of the singlechip on different hard disk back plates. In addition, the test fixture reduces test cost, test time and test risk, and improves test coverage rate. Therefore, the invention effectively overcomes various defects in the prior art and has high industrial utilization value.
The above embodiments are merely illustrative of the principles of the present invention and its effectiveness, and are not intended to limit the invention. Modifications and variations may be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of the invention. Accordingly, it is intended that all equivalent modifications and variations of the invention be covered by the claims, which are within the ordinary skill of the art, be within the spirit and scope of the present disclosure.
Claims (10)
1. The utility model provides a test fixture of hard disk backplate which characterized in that includes: the interface unit, the singlechip, the plurality of port expansion units and the plurality of switching units are arranged in the test fixture;
the interface unit comprises a plurality of interface groups and a first communication interface; the interface group is correspondingly connected with the interface group of one hard disk on the hard disk backboard to be tested;
the switching unit corresponds to the interface group: one end of the switching unit is connected with the corresponding interface group, and the other end of the switching unit is respectively connected with the singlechip and the corresponding port expansion unit; the switching unit is used for integrating the data of the to-be-tested hard disk backboard accessed by the interface unit according to each hard disk of the to-be-tested hard disk backboard, and transmitting the integrated data to the singlechip and the corresponding port expansion unit respectively;
the port expansion unit is connected with the singlechip and is used for converting the multipath data received from the switching unit into single-path data and outputting the single-path data to the singlechip;
the singlechip is connected with the peripheral electronic equipment through the first communication interface and is used for controlling the switching among the plurality of switching units according to a test program, so that the test of different hard disks on the hard disk backboard to be tested is realized.
2. The test fixture for a hard disk back plate according to claim 1, wherein: the plurality of interface groups are arranged at the upper panel of the test fixture, and the first communication interface is arranged at the side plate of the test fixture.
3. The test fixture for a hard disk back plate according to claim 1, wherein: the peripheral electronic equipment comprises a PC or a raspberry group, and data interaction is realized between the peripheral electronic equipment and the singlechip through the first communication interface, wherein the interaction data comprise the test program and the test data.
4. The test fixture for a hard disk back plate according to claim 1, wherein: the singlechip comprises a test circuit for testing the hard disk backboard to be tested; the test circuit and the test program are adjustable according to the actual test requirements.
5. The test fixture for a hard disk back plate according to claim 1, wherein: the interface unit also comprises a power interface and a second communication interface group which are arranged at the side plate of the test fixture; wherein,
the power interface is connected with the hard disk backboard to be tested and is used for supplying power to the hard disk backboard to be tested;
the second communication interface group is connected with the communication interface group of the hard disk backboard to be tested, and the second communication interface group comprises: I2C interface, SPI interface, SGPIO interface, USB interface and network interface.
6. The test fixture for a hard disk back plate of claim 5, wherein: and the singlechip is also connected with the second communication interface group and is used for testing the communication interface group of the hard disk backboard to be tested.
7. The test fixture for a hard disk back plate according to claim 1, wherein: the interface group comprises a hard disk interface group, an LED interface group and a data read-write interface group;
the hard disk interface group is connected with the hard disk interface group of the corresponding hard disk on the hard disk backboard to be tested;
the LED interface group is connected with the LED test signal interface group of the corresponding hard disk on the hard disk backboard to be tested;
the data read-write interface group is connected with the digital read-write interface group of the corresponding hard disk on the hard disk backboard to be tested.
8. The test fixture for a hard disk back plate of claim 7, wherein: in the switching unit, a switching unit is provided,
the data from the LED interface group is directly transmitted to the singlechip;
the data group from the data read-write interface is transmitted to the corresponding port expansion unit;
and the data from the hard disk interface group are respectively transmitted to the singlechip and the corresponding port expansion unit.
9. The test fixture for a hard disk back plate according to claim 1, wherein: the port expansion units are integrated on the corresponding switching units.
10. The test fixture for a hard disk back plate according to claim 1, wherein: the test fixture also comprises a power socket and a power switch which are arranged at the side plate of the test fixture,
the power socket is used for providing power for the test fixture;
the power switch is used for controlling the on and/or off of the power supply of the test fixture.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610859249.7A CN107870834B (en) | 2016-09-28 | 2016-09-28 | Testing jig for hard disk backboard |
Applications Claiming Priority (1)
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| CN107870834A (en) | 2018-04-03 |
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