CN107861047A - The detecting system and detection method of safety test pattern - Google Patents
The detecting system and detection method of safety test pattern Download PDFInfo
- Publication number
- CN107861047A CN107861047A CN201711058364.5A CN201711058364A CN107861047A CN 107861047 A CN107861047 A CN 107861047A CN 201711058364 A CN201711058364 A CN 201711058364A CN 107861047 A CN107861047 A CN 107861047A
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- fuse
- module
- time series
- signal
- test pattern
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
Abstract
The invention discloses a kind of detecting system and detection method of safety test pattern, to prevent the test circuit of chip to be again introduced into safety test pattern after being revoked, the detecting system of safety test pattern includes detecting system：Time series stereodata module, detection circuit module and trigger module.Trigger module is used to, according on off operating mode, produce high level or low level trigger signal.Time series stereodata module exports the test mode signal of high level, so that chip can enter safety test pattern according to low level trigger signal；Or, time series stereodata module exports low level test mode signal, so that detection circuit module output self-destruction signal makes chip carry out self-destruction operation according to the trigger signal of high level.Whereby, the detecting system of safety test pattern of the invention, multiple guarantee improve the Vaccine effectiveness to chip sensitive information, meet most techniques and realize demand, can be widely applied to all kinds of safety chips.
Description
Technical field
The present invention relates to the information security field of integrated circuit, more particularly to a kind of safety test applied to safety chip
The detecting system and detection method of pattern.
Background technology
There can be some manufacturing defect during chip production, it is necessary to carry out chip testing to reflect the true feelings of chip
Condition, screen the chip that goes wrong.Safety chip also generally can all have test circuit, to ensure that the chip product for giving user can be just
Really reliably work, therefore test circuit is the essential part of safety chip.To improve testing efficiency, reducing test
The design complexities of circuit, test circuit typically can be with all resources in access chip inside, and the level of security of test pattern is very
It is high.Test pattern is utilized in order to be effective against attacker, safety chip internal user critical data is stolen, distorts chip program
Deng, chip complete test after test circuit must reliably, irreversibly be abrogated.
Prior art is typically to be placed into some control signal or clock, reset signal as chip fuse (Fuse)
Scribe line, disconnected by its stroke by dicing methods after the completion of safety chip test, hereafter chip can not enter back into test pattern.
With developing rapidly for intrusive mood attack technology so that attacker reconnects scribing using technological means such as FIB
The ability that disconnected fuse Fuse signals have been drawn in groove greatly enhances, and so as to recover the function of test mode circuit, gets safe core
Sensitive information and significant data in piece.
The information for being disclosed in the background section is merely intended to understanding of the increase to the general background of the present invention, without answering
It has been the prior art well known to persons skilled in the art when being considered as recognizing or implying the information structure in any form.
The content of the invention
It is multiple to ensure to improve it is an object of the invention to provide a kind of detecting system and detection method of safety test pattern
To the Vaccine effectiveness of chip sensitive information, meet most techniques and realize demand, can be widely applied to all kinds of safety chips.
To achieve the above object, a kind of detecting system of safety test pattern is provided according to an aspect of the present invention,
To prevent the test circuit of chip to be again introduced into safety test pattern, the detecting system bag of safety test pattern after being revoked
Contain：Time series stereodata module, detection circuit module and trigger module.Time series stereodata module is exporting test pattern
Signal；The circuit state of circuit module detection detecting system is detected, and detect circuit module to export certainly according to circuit state
Ruin signal；The trigger module being electrically connected with time series stereodata module, for according on off operating mode, producing high level or low electricity
Flat trigger signal；Wherein, time series stereodata module according to low level trigger signal, believe by the test pattern for exporting high level
Number, so that chip can enter safety test pattern；Or, time series stereodata module is according to the trigger signal of high level,
Low level test mode signal is exported, so that detection circuit module output self-destruction signal makes chip carry out self-destruction operation.
Preferably, in above-mentioned technical proposal, trigger module includes：Melted with time series stereodata module is electrically connected with first
Silk, the first fuse is to according to by a stroke disconnected state, the first trigger signal of generation；Wherein, break if the first fuse is not drawn, pass
The first trigger signal for being defeated by time series stereodata module is low level, and time series stereodata module output test mode signal is
High level, so that chip can enter safety test pattern；Wherein, break if the first fuse is drawn, be transferred to sequential and patrol
The first trigger signal for collecting control module is high level, and time series stereodata module output test mode signal is low level, from
And detection circuit module output self-destruction signal is caused chip is carried out self-destruction operation.
Preferably, in above-mentioned technical proposal, the detecting system of safety test pattern also includes：Scribe line；First fuse
A part is arranged in scribe line, and in scribe line draw and broken.
Preferably, in above-mentioned technical proposal, trigger module also includes：One end is electrically connected to ground terminal, and the other end is by drawing
The second fuse that film trap is connected with time series stereodata module, the second fuse is to according to disconnected state is drawn, generation second is touched
Signal；Wherein, break if the second fuse is not drawn, the second trigger signal for being transferred to time series stereodata module is low electricity
Flat, time series stereodata module output test mode signal is high level, so that chip can enter safety test pattern；
Wherein, if the second fuse is drawn disconnected, the second trigger signal for being transferred to time series stereodata module is high level, sequential logic
Control module output test mode signal is low level, so that detection circuit module output self-destruction signal makes chip carry out certainly
Ruin operation.
Preferably, in above-mentioned technical proposal, trigger module also includes the 3rd fuse, and it electrically connects with detection circuit module
Connect, a part for the 3rd fuse is arranged in scribe line, and a part for the 3rd fuse is off-state, and the 3rd fuse is to root
According to connected state, the 3rd trigger signal is produced；Wherein, if the first fuse and/or the second fuse are connected with the 3rd fuse,
The 3rd trigger signal for being then transferred to time series stereodata module is high level, and time series stereodata module output test pattern is believed
Number it is low level, so that detection circuit module output self-destruction signal makes chip carry out self-destruction operation.
Preferably, in above-mentioned technical proposal, there is first resistor on the first fuse, when the first fuse in scribe line one
When part is drawn disconnected, the first fuse pull-up first resistor is set to high level and exports the first trigger signal and patrolled for high level to sequential
Collect control module；And/or second have second resistance on fuse, when a part of second fuse in scribe line is drawn disconnected,
Second fuse pull-up second resistance is set to high level and exports the second trigger signal gives time series stereodata module for high level；
And/or the 3rd have 3rd resistor and the 4th resistance on fuse, and the 3rd fuse is the partial pressure letter of 3rd resistor and the 4th resistance
Number.
Preferably, in above-mentioned technical proposal, detection circuit module includes：Reference source unit and comparator.Reference source list
Member is providing reference signal；Comparator is to compare voltage division signal and reference signal, and comparator can export self-destruction signal.
A kind of detection method of safety test pattern is provided according to another aspect of the present invention, comprising：Obtain at least
One is drawn disconnected state with the first fuse that time series stereodata module is electrically connected with；Disconnected shape is drawn according to the first fuse
State, produce the first trigger signal；Wherein, break if the first fuse is not drawn, be transferred to time series stereodata module first touches
Signal as low level, time series stereodata module output test mode signal is high level, so that chip can enter
Safety test pattern；Wherein, break if the first fuse is drawn, the first trigger signal for being transferred to time series stereodata module is height
Level, time series stereodata module output test mode signal is low level, so that detection circuit module output self-destruction letter
Chip number is set to carry out self-destruction operation.
Compared with prior art, the present invention has the advantages that：The detecting system of the safety test pattern of the present invention
And detection method, the difficulty of fuse signal reconnect can be not only improved, and add the detection electricity to fuse reconnection attack
Road module, by detecting that fuse bootrom self-destruction under attack operates, multiple guarantee is improved to chip sensitive information
Vaccine effectiveness, in addition all interlock circuits of the invention realize feasibility height, meet most techniques and realize demand, can answer extensively
For all kinds of safety chips.
Brief description of the drawings
Fig. 1 is the structural representation according to a kind of detecting system of safety test pattern of the present invention.
Fig. 2 is the structural representation according to a kind of detection circuit module of the detecting system of safety test pattern of the present invention
Figure.
Embodiment
Below in conjunction with the accompanying drawings, the embodiment of the present invention is described in detail, it is to be understood that the guarantor of the present invention
Shield scope is not limited by embodiment.
Explicitly indicated that unless otherwise other, otherwise in entire disclosure and claims, term " comprising " or its change
Change such as "comprising" or " including " etc. and will be understood to comprise stated element or part, and do not exclude other members
Part or other parts.
As shown in Figure 1 to Figure 2, according to a kind of detecting system of safety test pattern of the specific embodiment of the invention, use
To prevent the test circuit of chip to be again introduced into safety test pattern after being revoked, the detecting system of safety test pattern includes：
Time series stereodata module, detection circuit module, scribe line and trigger module.Time series stereodata module is tested to export
Mode signal；Detection circuit module is to detect the circuit state of detecting system, and detection circuit module can be according to circuit shape
State exports self-destruction signal；The trigger module being electrically connected with time series stereodata module, for according on off operating mode, producing high electricity
Flat or low level trigger signal；Wherein, time series stereodata module exports the survey of high level according to low level trigger signal
Mode signal is tried, so that chip can enter safety test pattern；Or, time series stereodata module touching according to high level
Signal, export low level test mode signal, so that detection circuit module output self-destruction signal makes chip carry out certainly
Ruin operation.
Preferably, trigger module includes：With time series stereodata module be electrically connected with the first fuse, the first fuse to
According to disconnected state is drawn, the first trigger signal is produced；Wherein, break if the first fuse is not drawn, be transferred to sequential logic control
First trigger signal of molding block is low level, and time series stereodata module output test mode signal is high level, so that
Safety test pattern can be entered by obtaining chip；Wherein, if the first fuse is drawn disconnected, it is transferred to the of time series stereodata module
One trigger signal is high level, and time series stereodata module output test mode signal is low level, so that detection circuit
Module output self-destruction signal makes chip carry out self-destruction operation.
Preferably, the detecting system of safety test pattern also includes：Scribe line；A part for first fuse is arranged at scribing
In groove, and in scribe line draw and break.
Preferably, trigger module also includes：One end is electrically connected to ground terminal, and the other end passes through scribe line and sequential logic control
Second fuse of molding block connection, the second fuse is to according to by a stroke disconnected state, the second trigger signal of generation；Wherein, if
Two fuses are not drawn disconnected, then the second trigger signal for being transferred to time series stereodata module is low level, time series stereodata mould
Block output test mode signal is high level, so that chip can enter safety test pattern；Wherein, if the second fuse quilt
Draw and break, then the second trigger signal for being transferred to time series stereodata module is high level, and the output of time series stereodata module is tested
Mode signal is low level, so that detection circuit module output self-destruction signal makes chip carry out self-destruction operation.
Preferably, trigger module also includes the 3rd fuse, and it is electrically connected with detection circuit module, one of the 3rd fuse
Set up separately and be placed in scribe line, a part for the 3rd fuse is off-state, and the 3rd fuse is to according to connected state, production
Raw 3rd trigger signal；Wherein, if the first fuse and/or the second fuse are connected with the 3rd fuse, it is transferred to sequential logic
3rd trigger signal of control module is high level, and time series stereodata module output test mode signal is low level, so as to
So that detection circuit module output self-destruction signal makes chip carry out self-destruction operation.
Preferably, there is first resistor (resistance R1), when a part of quilt of first fuse in scribe line on the first fuse
When drawing disconnected, the first fuse pull-up first resistor is set to high level, and exports the first trigger signal and give sequential logic control for high level
Molding block, time series stereodata module output test mode signal is low level, so that chip cannot be introduced into safety test
Pattern；And/or second have second resistance (resistance R2) on fuse, when a part of second fuse in scribe line drawn it is disconnected
When, the second fuse pull-up second resistance is set to high level, and exports the second trigger signal and give time series stereodata mould for high level
Block, time series stereodata module output test mode signal is low level, so that chip cannot be introduced into safety test pattern；
And/or the 3rd have 3rd resistor (R3) and the 4th resistance (R4) on fuse, and the 3rd fuse is 3rd resistor and the 4th resistance
Voltage division signal.
Preferably, detection circuit module includes：Reference source unit and comparator.Reference source unit refers to letter to provide
Number；Comparator is to compare voltage division signal and reference signal, and comparator can export self-destruction signal.
According to a kind of detection method of safety test pattern of another embodiment of the invention specific, comprising：Obtain at least
One is drawn disconnected state with the first fuse that time series stereodata module is electrically connected with；Disconnected shape is drawn according to the first fuse
State, produce the first trigger signal；Wherein, break if the first fuse is not drawn, be transferred to time series stereodata module first touches
Signal as low level, time series stereodata module output test mode signal is high level, so that chip can enter
Safety test pattern；Wherein, break if the first fuse is drawn, the first trigger signal for being transferred to time series stereodata module is height
Level, time series stereodata module output test mode signal is low level, so that detection circuit module output self-destruction letter
Chip number is set to carry out self-destruction operation.
Preferably, the detection method of safety test pattern also includes：Obtain what is be electrically connected with time series stereodata module
Second fuse is drawn disconnected state；Disconnected state is drawn according to the second fuse, produces the second trigger signal；Wherein, if second is molten
Silk, which is not drawn, to break, then the second trigger signal for being transferred to time series stereodata module is low level, and time series stereodata module is defeated
It is high level to go out test mode signal, so that chip can enter safety test pattern；Wherein, if the second fuse is drawn
Disconnected, then the second trigger signal for being transferred to time series stereodata module is high level, and mould is tested in the output of time series stereodata module
Formula signal is low level, so that detection circuit module output self-destruction signal makes chip carry out self-destruction operation.Obtain and detect
The state that the 3rd fuse that circuit module is electrically connected with is connected；The state being connected according to the 3rd fuse, produce the 3rd triggering
Signal；Wherein, if the first fuse and/or the second fuse are connected with the 3rd fuse, it is transferred to time series stereodata module
3rd trigger signal is high level, and time series stereodata module output test mode signal is low level, so that detection electricity
Road module output self-destruction signal makes the chip carry out self-destruction operation.
In actual applications, only when the first fuse and the second fuse normally connect, and the 3rd fuse and the first fuse,
Second fuse is that high level is effective without any annexation, output test mode signal, i.e., chip enters safety test pattern.
As long as the first fuse and the second fuse have one drawn it is disconnected, as long as or detecting the 3rd fuse and the first fuse and/or second
Fuse is connected, then it is low level to export test mode signal, that is, cannot be introduced into test pattern, and export self-destruction signal.
The structural representation to the detection circuit module of fuse reconnection attack is illustrated in figure 2, the 3rd fuse is the 3rd electricity
The voltage division signal of (resistance R3) and the 4th resistance (resistance R4) is hindered, the reference signal provided with a reference source is relatively sentenced by comparator
It is disconnected, export self-destruction signal.When the 3rd fuse and the first fuse, the second fuse connectionless relation, i.e. the 3rd fuse is only
The voltage division signal of three resistance and the 4th resistance, for reference signal level higher than now the 3rd fuse, output self-destruction signal is low level.
When the 3rd fuse is connected with the first fuse, i.e. the 3rd fuse is that 3rd resistor and first resistor are in parallel electric with the 4th again afterwards
Resistance carries out partial pressure, and for reference signal level less than now the 3rd fuse, output self-destruction signal is high level (starting self-destruction operation).Together
Reason understood when the 3rd fuse is connected with the second fuse, or the 3rd fuse and the second fuse, the first fuse while when being connected,
That is the 3rd fuse be 3rd resistor and second resistance in parallel or 3rd resistor and second resistance, first resistor it is in parallel after again and
4th resistance carries out partial pressure, and for reference signal level less than now the 3rd fuse, output self-destruction signal is high level.When self-destruction signal
When being set to high level, it is meant that now chip must be attacked by intrusive mood, and meeting bootrom carries out self-destruction operation, to non-volatile
Memory carries out full sheet erasing, then carries out chip full sheet reset, so as to avoid chip sensitive data from revealing.
In summary, the detecting system and detection method of safety test pattern of the invention, fuse letter can not only be improved
Number reconnect difficulty, and add to fuse reconnection attack detection circuit module, by detecting that fuse is under attack
Bootrom self-destruction operates, and multiple guarantee improves the Vaccine effectiveness to chip sensitive information, of the invention all mutually powered-down in addition
Feasibility height is realized on road, is met most techniques and is realized demand, can be widely applied to all kinds of safety chips.
The description of the foregoing specific illustrative embodiment to the present invention is to illustrate and the purpose of illustration.These descriptions
It is not wishing to limit the invention to disclosed precise forms, and it will be apparent that according to above-mentioned teaching, can be much changed
And change.The purpose of selecting and describing the exemplary embodiment is that explain that the certain principles of the present invention and its reality should
With so that those skilled in the art can realize and utilize the present invention a variety of exemplaries and
Various chooses and changes.The scope of the present invention is intended to be limited by claims and its equivalents.
Claims (10)
- A kind of 1. detecting system of safety test pattern, to prevent the test circuit of chip to be again introduced into safe survey after being revoked Die trial formula, it is characterised in that the detecting system of the safety test pattern includes：Time series stereodata module, it is exporting test mode signal；Circuit module is detected, it is to detect the circuit state of the detecting system, and the detection circuit module being capable of basis The circuit state exports self-destruction signal；AndThe trigger module being electrically connected with the time series stereodata module, for according on off operating mode, producing high level or low The trigger signal of level；The time series stereodata module exports the test mode signal of high level according to low level trigger signal, so that Safety test pattern can be entered by obtaining the chip；Or,The time series stereodata module exports low level test mode signal according to the trigger signal of high level, so that Obtaining the detection circuit module output self-destruction signal makes the chip carry out self-destruction operation.
- 2. the detecting system of safety test pattern according to claim 1, it is characterised in that the trigger module includes： The first fuse being electrically connected with the time series stereodata module；First fuse is to according to by a stroke disconnected state, the first trigger signal of generation；Wherein, break if first fuse is not drawn, be transferred to the first triggering letter of the time series stereodata module Number it is low level, it is high level that the time series stereodata module, which exports the test mode signal, so that the chip Safety test pattern can be entered；Wherein, break if first fuse is drawn, be transferred to first trigger signal of the time series stereodata module For high level, it is low level that the time series stereodata module, which exports the test mode signal, so that the detection electricity Road module, which exports the self-destruction signal, makes the chip carry out self-destruction operation.
- 3. the detecting system of safety test pattern according to claim 2, it is characterised in that the safety test pattern Detecting system also includes：Scribe line；A part for first fuse is arranged in the scribe line, and in the scribe line draw and broken.
- 4. the detecting system of safety test pattern according to claim 3, it is characterised in that the trigger module also wraps Contain：One end is electrically connected to ground terminal, and the other end is connected second molten by the scribe line with the time series stereodata module Silk, second fuse is to according to by a stroke disconnected state, the second trigger signal of generation；Wherein, break if second fuse is not drawn, be transferred to the second triggering letter of the time series stereodata module Number it is low level, it is high level that the time series stereodata module, which exports the test mode signal, so that the chip Safety test pattern can be entered；Wherein, break if second fuse is drawn, be transferred to second trigger signal of the time series stereodata module For high level, it is low level that the time series stereodata module, which exports the test mode signal, so that the detection electricity Road module, which exports the self-destruction signal, makes the chip carry out self-destruction operation.
- 5. the detecting system of the safety test pattern according to claim 3 or 4, it is characterised in that the trigger module is also Comprising：3rd fuse, it is electrically connected with the detection circuit module, and a part for the 3rd fuse is arranged at the scribing In groove, the part of the 3rd fuse is off-state, and the 3rd fuse is to according to connected state, production Raw 3rd trigger signal；Wherein, if first fuse and/or second fuse are connected with the 3rd fuse, it is transferred to the sequential The 3rd trigger signal of Logic control module is high level, and the time series stereodata module exports the test pattern letter Number it is low level, so that the detection circuit module exports the self-destruction signal and the chip is carried out self-destruction operation.
- 6. the detecting system of safety test pattern according to claim 5, it is characterised in thatThere is first resistor on first fuse, drawn and broken when the part of first fuse in the scribe line When, it is high level to described that first fuse, which pulls up the first resistor and is set to high level and exports first trigger signal, Time series stereodata module；And/orThere is second resistance on second fuse, drawn and broken when the part of second fuse in the scribe line When, it is high level to described that second fuse, which pulls up the second resistance and is set to high level and exports second trigger signal, Time series stereodata module；And/orThere is 3rd resistor and the 4th resistance, and the 3rd fuse is the 3rd resistor and described the on 3rd fuse The voltage division signal of four resistance.
- 7. the detecting system of safety test pattern according to claim 6, it is characterised in that detection circuit module includes：Reference source unit, it is providing reference signal；AndComparator, it is to the voltage division signal and the reference signal, and the comparator can export the self-destruction Signal.
- 8. a kind of detection method of the detecting system of the safety test pattern based on as described in claim 1-7 any one, its It is characterised by, comprising：Obtain the first fuse that at least one and time series stereodata module is electrically connected with and drawn a disconnected state；Disconnected state is drawn according to first fuse, produces the first trigger signal；Wherein, break if first fuse is not drawn, be transferred to the first triggering letter of the time series stereodata module Number it is low level, the time series stereodata module output test mode signal is high level, so that chip can enter Safety test pattern；Wherein, break if first fuse is drawn, be transferred to first trigger signal of the time series stereodata module For high level, it is low level that the time series stereodata module, which exports the test mode signal, so that detection circuit mould Block output self-destruction signal makes the chip carry out self-destruction operation.
- 9. the detection method of safety test pattern according to claim 8, it is characterised in that the safety test pattern Detection method also includes：Obtain and drawn disconnected state with the second fuse that the time series stereodata module is electrically connected with；Disconnected state is drawn according to second fuse, produces the second trigger signal；Wherein, break if second fuse is not drawn, be transferred to the second triggering letter of the time series stereodata module Number it is low level, the time series stereodata module output test mode signal is high level, so that chip can enter Safety test pattern；Wherein, break if second fuse is drawn, be transferred to second trigger signal of the time series stereodata module For high level, it is low level that the time series stereodata module, which exports the test mode signal, so that detection circuit mould Block output self-destruction signal makes the chip carry out self-destruction operation.
- 10. the detection method of safety test pattern according to claim 9, it is characterised in that the safety test pattern Detection method also include：Obtain the connected state of the 3rd fuse being electrically connected with the detection circuit module；The state being connected according to the 3rd fuse, produce the 3rd trigger signal；Wherein, if first fuse and/or second fuse are connected with the 3rd fuse, it is transferred to the sequential The 3rd trigger signal of Logic control module is high level, and the time series stereodata module exports the test pattern letter Number it is low level, so that the detection circuit module exports the self-destruction signal and the chip is carried out self-destruction operation.
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| CN110399691A (en) * | 2019-07-31 | 2019-11-01 | 中国工程物理研究院电子工程研究所 | A kind of the all-electronin fuze safety Logic control module and its software timing design method of high security |
| CN110648964A (en) * | 2019-10-30 | 2020-01-03 | 华虹半导体(无锡)有限公司 | Method for repairing fuse circuit of chip |
| CN110995233A (en) * | 2019-11-11 | 2020-04-10 | 北京中电华大电子设计有限责任公司 | Method and circuit for high-safety calibration and screening test |
| CN112749419A (en) * | 2020-12-31 | 2021-05-04 | 广州万协通信息技术有限公司 | Protection device and method for security chip test mode |
| CN117785590A (en) * | 2024-02-27 | 2024-03-29 | 深圳市纽创信安科技开发有限公司 | Chip and chip data protection method |
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| CN110995233A (en) * | 2019-11-11 | 2020-04-10 | 北京中电华大电子设计有限责任公司 | Method and circuit for high-safety calibration and screening test |
| CN110995233B (en) * | 2019-11-11 | 2023-10-13 | 北京中电华大电子设计有限责任公司 | Method and circuit for high-safety calibration and screening test |
| CN112749419A (en) * | 2020-12-31 | 2021-05-04 | 广州万协通信息技术有限公司 | Protection device and method for security chip test mode |
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| CN117785590A (en) * | 2024-02-27 | 2024-03-29 | 深圳市纽创信安科技开发有限公司 | Chip and chip data protection method |
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