CN107703425A - A kind of method of testing and device of detection CCL materials proof voltage energy - Google Patents
A kind of method of testing and device of detection CCL materials proof voltage energy Download PDFInfo
- Publication number
- CN107703425A CN107703425A CN201710881707.1A CN201710881707A CN107703425A CN 107703425 A CN107703425 A CN 107703425A CN 201710881707 A CN201710881707 A CN 201710881707A CN 107703425 A CN107703425 A CN 107703425A
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- Prior art keywords
- test
- detection
- copper sheet
- ccl
- proof voltage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses the method for testing and device of a kind of detection CCL materials proof voltage energy, it is as follows that methods described includes content：Lamination, sheet material and the type selecting of test board are set according to test request；Each aspect of test board sets one piece of copper sheet as test section；Copper sheet overlapping placement of each aspect as test section；The CCL materials for needing to test are set between adjacent aspect as medium；Each aspect draws a cabling from the copper sheet as test section, is drawn out to the surface of test board；In lead outer end, one control source point is set；During test, in the control source point applied voltage test of base material adjacent aspect to be measured.The present invention can be accurately positioned sheet material proof voltage grade, during Design PCB board, be referred to design limit value selection corresponding grade sheet material, lifting system longtime running reliability.
Description
Technical field
The present invention relates to board design field, and in particular to a kind of test side of detection CCL materials proof voltage energy
Method and device.
Background technology
With cloud computing, the broad development of big data, informationization is gradually coated on the every field of society, web database technology
Sharply increase, signal speed is more and more faster, and originally many wide in range design rules have been not sufficient to ensure that signal quality, and this certainly will
Cause the tightened up requirement of all design considerations.Such as the release of new material emerges in an endless stream, new manufacturing process greatly reduces
Production cost, performance have also obtained very big lifting, undoubtedly improve design density, also a part has benefited from this to trend toward miniaturization.
Furthermore on the one hand the enhancing of procedure for processing ability improves efficiency, on the other hand also can not be same in control accuracy
Day and language.Bigger design margin is provided to designer, meanwhile, also shorten production life cycle.
However, along with the improvement of technology, old design experiences start not acclimatized, the limit point of material and processing link
Start the cognitive range for departing from designer, realizations of all circuit functions is all based on the electrical characteristic parameter and reliably of certain material
Property parameter, therefore, how accurately to test sheet properties turns into new problem.
In recent years, the test for material electric property tends to be ripe, also gradually forms industry standard.In contrast, may be used
It is just less perfect by property test, which kind of method test is material property can be accurately reflected using and never comes to a conclusion.
Instantly, high density storage increasing prevalence, the disk size of carry is increasing, certainly will when system power is very high
The lifting of voltage and current can be brought, while also brings along the lifting of board temperature, magnitude of voltage and the lifting of plate temperature can cause board material
Expect accelerated ageing, puncture and can catch someone on the wrong foot between the flaggy under big voltage, eventually bring computer room burning plate problem.So resistance to electricity of sheet material
Pressure characteristic is to influence an important indicator of system design.
The content of the invention
The technical problem to be solved in the present invention is：In view of the above-mentioned problems, the present invention provides a kind of detection CCL material proof voltages
It the method for testing and device of performance, can fast and accurately reflect the voltage-resistent characteristic of material, be that late design and product are stable
Property provide data support, solution how to judge PCB material proof voltage performance issue.
The technical solution adopted in the present invention is：
A kind of method of testing of detection CCL materials proof voltage energy, it is as follows that methods described includes content：
Lamination, sheet material and the type selecting of test board are set according to test request；
Each aspect of test board sets one piece of copper sheet as test section；
Copper sheet overlapping placement of each aspect as test section；
The CCL materials for needing to test are set between adjacent aspect as medium；
Each aspect draws a cabling from the copper sheet as test section, is drawn out to the surface of test board；
In lead outer end, one control source point is set；
During test, in the control source point applied voltage test of base material adjacent aspect to be measured.
The copper sheet as test section is shaped as circle, a diameter of 1 inch or so.
The medium is core plate or pp, thickness 3mil to 5mil.
The width of the cabling is 20mil.
The medium chooses different materials, and test voltage selects the voltage of identical pressuring curve, to judge different materials
Breakdown voltage value under identical pressuring curve.
The medium chooses identical material, and dielectric thickness is different, and test voltage selects the electricity of identical pressuring curve
Pressure, to judge breakdown voltage value of the same material under different medium thickness, or the breakdown temperature value under same current.
A kind of device of detection CCL materials proof voltage energy, described device include test board；
Lamination, sheet material and the type selecting of the test board are set according to test request；
Each aspect of test board is provided with one piece of copper sheet as test section；
The overlapping placement of copper sheet of each aspect test section；
The CCL materials for needing to test are set between adjacent aspect as medium；
Each aspect draws a cabling from the copper sheet as test section, is drawn out to the surface of test board；
Cabling outer end is provided with a control source point.
The copper sheet as test section is shaped as circle, a diameter of 1 inch or so.
The medium is core plate or pp, thickness 3mil to 5mil.
The width of the cabling is 20mil.
Beneficial effects of the present invention are：
The present invention can be accurately positioned sheet material proof voltage grade, and during Design PCB board, it is corresponding to be referred to the selection of design limit value
Grade sheet material, lifting system longtime running reliability.
Brief description of the drawings
Fig. 1 is test device structural representation of the present invention.
Embodiment
According to Figure of description, with reference to embodiment, the present invention is further described：
As shown in figure 1, a kind of device of detection CCL materials proof voltage energy, described device include test board 1；
The lamination of the test board 1 is 16 layers；
Each aspect of test board 1 is provided with one piece of a diameter of 1 inch circular copper sheet 2 as test section；
The 2 overlapping placement of copper sheet of each aspect test section；
Being set between adjacent aspect needs the CCL materials tested as medium, corresponds to 3mil to 5mil core plate and pp respectively（Core plate
The PCB substrate with copper sheet pressed in CCL shipment, pp is the base material without copper sheet, in PCB factories bonding processes
It can heat and soften, core plate has more preferable reliability performance than pp under same thickness）；
Each aspect draws the cabling 3 that a width is 20mil from the copper sheet 2 as test section, is drawn out to the table of test board 1
Face；
The outer end of cabling 3 is provided with a control source point 4.
During test, one layer of control source point connects power supply, adjacent layer control source point ground connection, and voltage rises to 1500V from 0V,
Rate of pressure rise 100V/S, keeps 10s, and record smashes voltage；
Judge breakdown voltage value of the different materials under identical pressuring curve；
Judge breakdown voltage value of the same material under different medium thickness or the breakdown temperature value under same current；
Finally, quality of materials is judged according to breakdown voltage value of the different materials under identical pressuring curve, standard is breakdown voltage
The bigger performance of value is better.
Embodiment is merely to illustrate the present invention, and not limitation of the present invention, the ordinary skill about technical field
Personnel, without departing from the spirit and scope of the present invention, it can also make a variety of changes and modification, thus it is all equivalent
Technical scheme fall within scope of the invention, scope of patent protection of the invention should be defined by the claims.
Claims (10)
1. a kind of method of testing of detection CCL materials proof voltage energy, it is characterised in that it is as follows that methods described includes content：
Lamination, sheet material and the type selecting of test board are set according to test request；
Each aspect of test board sets one piece of copper sheet as test section；
Copper sheet overlapping placement of each aspect as test section；
The CCL materials for needing to test are set between adjacent aspect as medium；
Each aspect draws a cabling from the copper sheet as test section, is drawn out to the surface of test board；
In lead outer end, one control source point is set；
During test, in the control source point applied voltage test of base material adjacent aspect to be measured.
2. the method for testing of a kind of detection CCL materials proof voltage energy according to claim 1, it is characterised in that described
Circle is shaped as the copper sheet of test section.
3. the method for testing of a kind of detection CCL materials proof voltage energy according to claim 1, it is characterised in that described
Medium is core plate or pp.
4. the method for testing of a kind of detection CCL materials proof voltage energy according to claim 1, it is characterised in that described
The width of cabling is 20mil.
5. according to a kind of method of testing of any described detection CCL materials proof voltage energy of claim 1-4, its feature exists
In the medium chooses different materials, and test voltage selects the voltage of identical pressuring curve, to judge different materials identical
Breakdown voltage value under pressuring curve.
6. according to a kind of method of testing of any described detection CCL materials proof voltage energy of claim 1-4, its feature exists
In, the medium chooses identical material, and dielectric thickness is different, and test voltage selects the voltage of identical pressuring curve, with
Judge breakdown voltage value of the same material under different medium thickness, or the breakdown temperature value under same current.
A kind of 7. device of detection CCL materials proof voltage energy, it is characterised in that：
Described device includes test board；
Lamination, sheet material and the type selecting of the test board are set according to test request；
Each aspect of test board is provided with one piece of copper sheet as test section；
The overlapping placement of copper sheet of each aspect test section；
The CCL materials for needing to test are set between adjacent aspect as medium；
Each aspect draws a cabling from the copper sheet as test section, is drawn out to the surface of test board；
Cabling outer end is provided with a control source point.
8. a kind of detection CCL materials proof voltage according to claim 7 can device, it is characterised in that it is described as
The copper sheet of test section is shaped as circle.
A kind of 9. device of detection CCL materials proof voltage energy according to claim 7, it is characterised in that the medium
For core plate or pp.
A kind of 10. device of detection CCL materials proof voltage energy according to claim 7, it is characterised in that the cabling
Width be 20mil.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710881707.1A CN107703425A (en) | 2017-09-26 | 2017-09-26 | A kind of method of testing and device of detection CCL materials proof voltage energy |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710881707.1A CN107703425A (en) | 2017-09-26 | 2017-09-26 | A kind of method of testing and device of detection CCL materials proof voltage energy |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107703425A true CN107703425A (en) | 2018-02-16 |
Family
ID=61174464
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710881707.1A Pending CN107703425A (en) | 2017-09-26 | 2017-09-26 | A kind of method of testing and device of detection CCL materials proof voltage energy |
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| CN (1) | CN107703425A (en) |
Citations (9)
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|---|---|---|---|---|
| CN101344569A (en) * | 2008-08-06 | 2009-01-14 | 广东生益科技股份有限公司 | Test device and method for interlaminar voltage resistance performance of copper clad plate |
| CN201247235Y (en) * | 2008-08-08 | 2009-05-27 | 东莞生益电子有限公司 | PCB synthesis reliability testing board |
| CN102421241A (en) * | 2011-08-01 | 2012-04-18 | 东莞生益电子有限公司 | Withstand voltage test pattern of layer insulation medium of PCB (Printed Circuit Board) multilayer board |
| KR101237243B1 (en) * | 2012-02-08 | 2013-02-26 | 아주스틸 주식회사 | Manufacturing method of metal copper clad laminate for voltage test and the metal ccl thereof |
| CN105388411A (en) * | 2015-10-13 | 2016-03-09 | 浪潮电子信息产业股份有限公司 | Current carrying capability testing method for circuit board |
| CN105578784A (en) * | 2015-12-31 | 2016-05-11 | 东莞市优森电子有限公司 | Production technology for single-sided PCB |
| CN106093735A (en) * | 2016-08-11 | 2016-11-09 | 浪潮电子信息产业股份有限公司 | A kind of printed circuit board (PCB) voltage-withstanding test method and device |
| CN205861837U (en) * | 2016-07-01 | 2017-01-04 | 深圳中富电路有限公司 | PCB pressure resistant testing device |
| CN206038832U (en) * | 2016-09-12 | 2017-03-22 | 江苏华神电子有限公司 | High heat conduction copper base plate withstand voltage test system of thermoelectric separation type and fill discharge device thereof |
-
2017
- 2017-09-26 CN CN201710881707.1A patent/CN107703425A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101344569A (en) * | 2008-08-06 | 2009-01-14 | 广东生益科技股份有限公司 | Test device and method for interlaminar voltage resistance performance of copper clad plate |
| CN201247235Y (en) * | 2008-08-08 | 2009-05-27 | 东莞生益电子有限公司 | PCB synthesis reliability testing board |
| CN102421241A (en) * | 2011-08-01 | 2012-04-18 | 东莞生益电子有限公司 | Withstand voltage test pattern of layer insulation medium of PCB (Printed Circuit Board) multilayer board |
| KR101237243B1 (en) * | 2012-02-08 | 2013-02-26 | 아주스틸 주식회사 | Manufacturing method of metal copper clad laminate for voltage test and the metal ccl thereof |
| CN105388411A (en) * | 2015-10-13 | 2016-03-09 | 浪潮电子信息产业股份有限公司 | Current carrying capability testing method for circuit board |
| CN105578784A (en) * | 2015-12-31 | 2016-05-11 | 东莞市优森电子有限公司 | Production technology for single-sided PCB |
| CN205861837U (en) * | 2016-07-01 | 2017-01-04 | 深圳中富电路有限公司 | PCB pressure resistant testing device |
| CN106093735A (en) * | 2016-08-11 | 2016-11-09 | 浪潮电子信息产业股份有限公司 | A kind of printed circuit board (PCB) voltage-withstanding test method and device |
| CN206038832U (en) * | 2016-09-12 | 2017-03-22 | 江苏华神电子有限公司 | High heat conduction copper base plate withstand voltage test system of thermoelectric separation type and fill discharge device thereof |
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Application publication date: 20180216 |
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