CN107607581A - 一种基于差示扫描量热法对led元器件的稳定性和可靠性的检测方法 - Google Patents
一种基于差示扫描量热法对led元器件的稳定性和可靠性的检测方法 Download PDFInfo
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- CN107607581A CN107607581A CN201710915217.9A CN201710915217A CN107607581A CN 107607581 A CN107607581 A CN 107607581A CN 201710915217 A CN201710915217 A CN 201710915217A CN 107607581 A CN107607581 A CN 107607581A
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CN201710915217.9A CN107607581B (zh) | 2017-09-30 | 2017-09-30 | 一种基于差示扫描量热法对led元器件的稳定性和可靠性的检测方法 |
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CN201710915217.9A CN107607581B (zh) | 2017-09-30 | 2017-09-30 | 一种基于差示扫描量热法对led元器件的稳定性和可靠性的检测方法 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN111795992A (zh) * | 2019-04-08 | 2020-10-20 | 江苏和成显示科技有限公司 | 液晶组合物向列相低温稳定性的确定方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07176795A (ja) * | 1993-12-21 | 1995-07-14 | Rohm Co Ltd | ポッティング樹脂によるチップledのレンズ形成方法 |
CN1889389A (zh) * | 2005-06-30 | 2007-01-03 | 华为技术有限公司 | 一种根据可靠性要求传输业务流的方法 |
US20070222371A1 (en) * | 2006-03-21 | 2007-09-27 | Eastman Kodak Company | Top-emitting OLED device with improved stability |
CN103294867A (zh) * | 2013-06-05 | 2013-09-11 | 桂林电子科技大学 | 一种基于有限元仿真分析的led灯具寿命快速预测方法 |
CN103616578A (zh) * | 2013-11-01 | 2014-03-05 | 清华大学 | 电力系统中高温超导电缆系统的多状态可靠性确定方法 |
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2017
- 2017-09-30 CN CN201710915217.9A patent/CN107607581B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07176795A (ja) * | 1993-12-21 | 1995-07-14 | Rohm Co Ltd | ポッティング樹脂によるチップledのレンズ形成方法 |
CN1889389A (zh) * | 2005-06-30 | 2007-01-03 | 华为技术有限公司 | 一种根据可靠性要求传输业务流的方法 |
US20070222371A1 (en) * | 2006-03-21 | 2007-09-27 | Eastman Kodak Company | Top-emitting OLED device with improved stability |
CN103294867A (zh) * | 2013-06-05 | 2013-09-11 | 桂林电子科技大学 | 一种基于有限元仿真分析的led灯具寿命快速预测方法 |
CN103616578A (zh) * | 2013-11-01 | 2014-03-05 | 清华大学 | 电力系统中高温超导电缆系统的多状态可靠性确定方法 |
Non-Patent Citations (1)
Title |
---|
HONGYU TANG 等: "Multi-physics simulation and reliability analysis for LED luminaires under step stress accelerated degradation test", 《2012 13TH INTERNATIONAL CONFERENCE ON THERMAL,MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111795992A (zh) * | 2019-04-08 | 2020-10-20 | 江苏和成显示科技有限公司 | 液晶组合物向列相低温稳定性的确定方法 |
CN111795992B (zh) * | 2019-04-08 | 2023-08-18 | 江苏和成显示科技有限公司 | 液晶组合物向列相低温稳定性的确定方法 |
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Inventor after: Liu Dongjing Inventor after: Fan Yasong Inventor after: Zhang Chaochao Inventor after: Zheng Guifang Inventor after: Yang Daoguo Inventor after: Liu Hanqing Inventor before: Liu Dongjing Inventor before: Fan Yasong Inventor before: Zhang Chaoyang Inventor before: Zheng Guifang Inventor before: Yang Daoguo Inventor before: Liu Hanqing |
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Application publication date: 20180119 Assignee: Guilin yanchuang Semiconductor Technology Co.,Ltd. Assignor: GUILIN University OF ELECTRONIC TECHNOLOGY Contract record no.: X2023980046590 Denomination of invention: A Method for Detecting the Stability and Reliability of LED Components Based on Differential Scanning Calorimetry Granted publication date: 20190920 License type: Common License Record date: 20231108 |