CN107515051A - Wavelength measurement method and system based on acoustooptical effect - Google Patents
Wavelength measurement method and system based on acoustooptical effect Download PDFInfo
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- CN107515051A CN107515051A CN201710597100.0A CN201710597100A CN107515051A CN 107515051 A CN107515051 A CN 107515051A CN 201710597100 A CN201710597100 A CN 201710597100A CN 107515051 A CN107515051 A CN 107515051A
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- 230000000694 effects Effects 0.000 title claims abstract description 18
- 238000000691 measurement method Methods 0.000 title claims abstract description 11
- 230000003287 optical effect Effects 0.000 claims abstract description 26
- 238000005259 measurement Methods 0.000 claims abstract description 15
- 229910052744 lithium Inorganic materials 0.000 claims abstract description 6
- 230000000087 stabilizing effect Effects 0.000 claims description 6
- XJUNRGGMKUAPAP-UHFFFAOYSA-N dioxido(dioxo)molybdenum;lead(2+) Chemical group [Pb+2].[O-][Mo]([O-])(=O)=O XJUNRGGMKUAPAP-UHFFFAOYSA-N 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims description 3
- 239000013078 crystal Substances 0.000 claims description 2
- 238000002604 ultrasonography Methods 0.000 claims 1
- 101100117236 Drosophila melanogaster speck gene Proteins 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 8
- 238000001228 spectrum Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 239000002253 acid Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
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- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The present invention relates to wavelength measurement technical field, particularly a kind of wavelength measurement method and system based on acoustooptical effect.Laser light source harmony optical power signals source is opened, makes the monochromatic light that laser exports that diffraction occur in acousto-optical device；The frequency of acousto-optic power signal source is adjusted until Bragg diffraction occurs, records ultrasonic frequency f now；Along the equidistant mobile image carrier of optical axis, and record every time it is mobile after on diffraction image zero order diffracted light and upper level diffraction light distance RiWith image-carrier away from the distance between acousto-optical device Li, i=1,2,3 ... n, n are 8~10；With fLi/ 2u is abscissa, with RiFor ordinate, by the n groups R of recordi、LiValue is fitted to functional image, and the curvature for obtaining the functional image is monochromatic wavelength λ.Using ultrasonic waveform into stationary raster, the relation established between monochromatic wavelength, electrical modulation frequency and diffraction speck spacing.Measurement range is wide, so as to effectively reduce experimental error.
Description
Technical field
The present invention relates to wavelength measurement technical field, particularly a kind of wavelength measurement method based on acoustooptical effect is with being
System.
Background technology
The ways and means of measurement monochromatic wavelength mainly has at present：
(1) michelson interferometer measurement method is used：This method produces dual-beam using divide amplitude and realizes interference, passes through tune
Equal thickness interference and equal inclination interference can be achieved in section, is widely used in the measurement of length and refractive index, is played an important role in Contemporary Physics.But
The regulation process complexity of Michelson's interferometer and the interference of the easy light environmental factor of this method, cause experimental result to produce mistake
Difference.
(2) two-slit interference method of transmission grating is utilized：Due to spectrometer can be used to accurate measurement refractive index, grating color
The physical quantitys such as scattered, grating constant, optical wavelength, it is more accurate so measuring optical wavelength with transmission grating on spectrometer
A measuring method.But when carrying out the measurement of optical wavelength using this method, spectra overlapping be present.Different wave length enters
Corresponding striped can be produced by penetrating light, and the spectral line of different series in spectrum may be caused to be overlapped；Secondly as light source
Breadth of spectrum line problem, grating can not easily by wavelength very close to two spectral lines distinguish.
The content of the invention
In order to solve the above technical problems, it is an object of the invention to provide a kind of simple and fast, and the base that measurement accuracy is high
In the wavelength measurement method and system of acoustooptical effect.
For a kind of wavelength measurement method based on acoustooptical effect of the present invention, its technological means used for：
S1：Laser light source harmony optical power signals source is opened, the monochromatic light that laser exports is sent out in acousto-optical device
Raw diffraction；
S2：The frequency of acousto-optic power signal source is adjusted until Bragg diffraction occurs on image-carrier, is recorded now
Ultrasonic frequency f；
S3：Along the equidistant mobile image carrier of optical axis, and record every time it is mobile after on diffraction image zero order diffracted light with it is upper
The distance R of first-order diffraction lightiWith image-carrier away from the distance between acousto-optical device Li, i=1,2,3 ... n, n are 8~10；
S4：With fLi/ 2u is abscissa, with RiFor ordinate, by the n groups R of recordi、LiValue is fitted to functional image, obtains
The curvature of the functional image is monochromatic wavelength λ；
Wherein, u is the spread speed of ultrasonic wave in media as well.
Further, in step S2, using optical screen as image-carrier, when occur in optical screen three circle center line connectings overlap,
And during equidistant hot spot, it is judged as that Bragg diffraction occurs.
Further, in step S3, using slr camera as image-carrier.
Further, in step S3, image-carrier moves by spacing of 5cm, and moving direction is the side away from acousto-optical device
To.
For a kind of wave length measuring system based on acoustooptical effect of the present invention, its technological means used for, including：Laser
Device, acousto-optic power signal source, acousto-optical device, frequency meter and image-carrier, the acousto-optical device are arranged at the laser light source
Between described image carrier, the acousto-optical device center is provided with light hole, the optical axis of the laser light source output laser with
The light hole center and image-carrier center superposition, the frequency signal input end of the frequency meter and the acousto-optic power signal
The frequency signal output end electrical connection in source, the control signal output of the acousto-optic power signal source and the control of acousto-optical device are believed
The electrical connection of number receiving terminal.
Further, the acousto-optic medium of the acousto-optical device is lead molybdate, and piezoelectric transducer material is lithium columbate crystal.
Further, the effective length of acousto-optic medium and width are respectively 1.7cm and 1.4cm in the acousto-optical device, are led to
Unthreaded hole effective diameter is 1.8mm.
Further, in addition to boosting Voltage stabilizing module, power supply signal output end and the acousto-optic work(of the boosting Voltage stabilizing module
The energization input electrical connection of rate signal source.
Further, described image carrier is optical screen or slr camera, during wavelength measurement, first using optical screen conduct
Image-carrier uses slr camera as image-carrier to catch diffraction image afterwards, counted to judge whether that Bragg diffraction occurs
Calculate the distance of zero order diffracted light and upper level diffraction light.
The beneficial effects of the invention are as follows：
(1), by the thought of controllable phase of light wave spatial modulation, monochromatic optical wave is established into stationary raster using ultrasonic waveform
Relation between long, electrical modulation frequency and diffraction speck spacing.And series data can be obtained by changing electrical modulation frequency, can adjust
Frequency of sound wave realizes a variety of monochromatic wavelength measurements, and measurement range is wide, so as to effectively reduce experimental error.
(2) from main making material of the lead molybdate stable, acousto-optic factor is big as acousto-optical device, cost it is low and compared with
Preferable diffraction efficiency is easily obtained, is not easily susceptible to the interference of environmental factor change, experiment measurement accuracy is higher.
(3) industrial camera collection image, with MATLAB fitting function images, precision is high, and operation is time-consuming short.
Brief description of the drawings
Fig. 1 is a kind of wave length measuring system connection diagram based on acoustooptical effect；
Fig. 2 is the hot spot schematic diagram on diffraction image in slr camera；
Fig. 3 is the functional image of MATLAB fittings；
In figure：1-power switch, 2-laser, 3-acousto-optical device, 4-boosting Voltage stabilizing module, 5-slr camera,
6-acousto-optic power signal source, 7-frequency meter, 8-computer.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.The specific embodiments described herein are merely illustrative of the present invention, is not used to limit
The fixed present invention.In addition, as long as technical characteristic involved in each embodiment of invention described below is each other
Conflict can is not formed to be mutually combined.
As shown in figure 1, a kind of wave length measuring system based on acoustooptical effect includes power switch 1, laser 2, acousto-optic device
Part 3, boosting Voltage stabilizing module 4, slr camera 5, acousto-optic power signal source 6, frequency meter 7 and computer 8.What laser 2 was sent
The light hole of laser and acousto-optical device 3 is located at the same horizontal position.Acousto-optical device 3 is from lead molybdate as acousto-optic medium, niobic acid
Crystalline lithium is piezoelectric transducer material；The effective length and width of acousto-optic medium are respectively 1.7cm, 1.4cm, acousto-optical device 3
Light hole effective diameter is 1.8mm.Slr camera 5 is the mono- anti-digital cameras of Olympus E-P3, its image signal output end with
Computer 8 connects.
The process that wavelength measurement is carried out using the system is as follows：
S1：The light source harmony optical power signals source 6 of laser 2 is opened, laser is allowed by the light hole of acousto-optical device 3, makes to swash
In acousto-optical device 3 diffraction occurs for the monochromatic light that light device 2 exports；
S2：The mono- anti-digital cameras of Olympus E-P3 are removed, and one piece of optical screen is placed at about one meter away from acousto-optical device 3,
The frequency of acousto-optic power signal source 6 is adjusted, (is sent out positioned at same level, equidistant hot spot until only occurring three on optical screen
Raw Bragg diffraction), the output frequency of acousto-optic power signal source 6 is read on frequency meter 7, and the frequency recorded now is f.
S3：Remove optical screen, reappose the mono- anti-digital cameras of Olympus E-P3, make its between acousto-optical device 3 away from
From LiFor 30cm, observe that three levels, adjacent occur in the mono- anti-digital camera lens centers of Olympus E-P3 on computer 8
Equidistant circular speck, and image is recorded, as shown in Figure 2.The mono- anti-digital cameras of mobile Olympus E-P3, make Olympus E-
The distance between the mono- anti-digital cameras of P3 and acousto-optical device 3 increase 5cm successively, repeat aforesaid operations step 8 to 10 times, while
The image shown on computer is measured after movement every time, using three-point circle method, the center of circle of three hot spots is determined, determines
The distance between both ends Liang Ge centers of circle, are designated as 2Ri(RiThe as distance of zero order diffracted light and upper level diffraction light).
S4：With fLi/ 2u is abscissa, with RiFor ordinate, by the n groups R of recordi、LiValue is fitted to functional image, obtains
The curvature of the functional image is monochromatic wavelength λ；Wherein, u is the spread speed of ultrasonic wave in media as well.With fLi/ 2u is
Abscissa, with RiIt is for the foundation of ordinate：
, it is known thatFrom momentum matching theorem, when incidence angle is Bragg angle, deflection angle Φ is：I.e.：R=λ * fL/2u.
When being illustrated in figure 3 green (light) laser progress wavelength measurement, the functional image fitted using MATLAB is illustrated, can
Using draw function expression as：Y=530.75x-0.0095, i.e. slope 530.75 are the green wavelength measured.
It should be appreciated that for those of ordinary skills, can according to the above description be improved or converted,
And all these modifications and variations should all belong to the protection domain of appended claims of the present invention.
Claims (9)
- A kind of 1. wavelength measurement method based on acoustooptical effect, it is characterised in that：S1：Laser light source harmony optical power signals source is opened, makes the monochromatic light that laser goes out that diffraction occur in acousto-optical device；S2：The frequency of acousto-optic power signal source is adjusted until Bragg diffraction occurs on image-carrier, records ultrasound now Wave frequency rate f；S3：Along the equidistant mobile image carrier of optical axis, and record every time it is mobile after zero order diffracted light and upper level on diffraction image The distance R of diffraction lightiWith image-carrier away from the distance between acousto-optical device Li, i=1,2,3 ... n；S4：With fLi/ 2u is abscissa, with RiFor ordinate, by the n groups R of recordi、LiValue is fitted to functional image, obtains described The curvature of functional image is monochromatic wavelength λ；Wherein, u is the spread speed of ultrasonic wave in media as well.
- 2. the wavelength measurement method based on acoustooptical effect as claimed in claim 1, it is characterised in that：In step S2, using optical screen As image-carrier, when occurring three circle center line connectings coincidences and equidistant hot spot in optical screen, it is judged as that Prague, which occurs, spreads out Penetrate.
- 3. the wavelength measurement method based on acoustooptical effect as claimed in claim 1, it is characterised in that：In step S3, using single anti- Camera is as image-carrier.
- 4. the wavelength measurement method based on acoustooptical effect as claimed in claim 1, it is characterised in that：In step S3, image-carrier Moved by spacing of 5cm, moving direction is the direction away from acousto-optical device.
- A kind of 5. wave length measuring system based on acoustooptical effect, it is characterised in that including：Laser, acousto-optic power signal source, sound Optical device, frequency meter and image-carrier, the acousto-optical device are arranged between the laser light source and described image carrier, institute State acousto-optical device center and be provided with light hole, the optical axis of the laser light source output laser carries with the light hole center and image Body center superposition, the frequency signal input end of the frequency meter and the frequency signal output end of the acousto-optic power signal source are electrically connected Connect, the control signal output of the acousto-optic power signal source electrically connects with the control signal receiving terminal of acousto-optical device.
- 6. the wave length measuring system based on acoustooptical effect as claimed in claim 5, it is characterised in that：The sound of the acousto-optical device Optical medium is lead molybdate, and piezoelectric transducer material is lithium columbate crystal.
- 7. the wave length measuring system based on acoustooptical effect as claimed in claim 5, it is characterised in that：Sound in the acousto-optical device The effective length and width of optical medium are respectively 1.7cm and 1.4cm, and light hole effective diameter is 1.8mm.
- 8. the wave length measuring system based on acoustooptical effect as claimed in claim 5, it is characterised in that：Also include boosting voltage stabilizing mould Block, the power supply signal output end of the boosting Voltage stabilizing module electrically connect with the energization input of acousto-optic power signal source.
- 9. the wave length measuring system based on acoustooptical effect as claimed in claim 5, it is characterised in that：Described image carrier is light Screen or slr camera, during wavelength measurement, first use optical screen as image-carrier to judge whether that Bragg diffraction occurs, Slr camera is used, to catch diffraction image, to calculate the distance of zero order diffracted light and upper level diffraction light as image-carrier afterwards.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113686453A (en) * | 2021-09-08 | 2021-11-23 | 中国矿业大学(北京) | Radio wave wavelength measuring device and radio wave wavelength measuring method |
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2017
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| CN1892193A (en) * | 2006-04-28 | 2007-01-10 | 清华大学 | Method and apparatus for measuring laser wave-length using heterodyne in interference method |
| CN102192728A (en) * | 2010-10-14 | 2011-09-21 | 长春理工大学 | Acousto-optic filtering spectrum camera |
| JP2013044669A (en) * | 2011-08-25 | 2013-03-04 | Toray Eng Co Ltd | Method and device for measuring surface shape |
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| CN113686453A (en) * | 2021-09-08 | 2021-11-23 | 中国矿业大学(北京) | Radio wave wavelength measuring device and radio wave wavelength measuring method |
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