CN106525242A - Device for real-time measurement of solar polarization Stokes vector - Google Patents

Device for real-time measurement of solar polarization Stokes vector Download PDF

Info

Publication number
CN106525242A
CN106525242A CN201611093398.3A CN201611093398A CN106525242A CN 106525242 A CN106525242 A CN 106525242A CN 201611093398 A CN201611093398 A CN 201611093398A CN 106525242 A CN106525242 A CN 106525242A
Authority
CN
China
Prior art keywords
wave plate
theta
sin
cos
stokes vector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201611093398.3A
Other languages
Chinese (zh)
Other versions
CN106525242B (en
Inventor
饶长辉
姚本溪
顾乃庭
朱磊
程云涛
李程
黄金龙
刘洋毅
张兰强
王志勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Optics and Electronics of CAS
Original Assignee
Institute of Optics and Electronics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Optics and Electronics of CAS filed Critical Institute of Optics and Electronics of CAS
Priority to CN201611093398.3A priority Critical patent/CN106525242B/en
Publication of CN106525242A publication Critical patent/CN106525242A/en
Application granted granted Critical
Publication of CN106525242B publication Critical patent/CN106525242B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Polarising Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The invention provides a device for real-time measurement of solar polarization Stokes vectors, which comprises a spectral filter, a wave plate array, a polaroid array and a light intensity acquisition camera. The solar magnetic field is the driving force and energy source for solar activity outbreak, and the solar polarization stokes vector measurement is the only way for solar magnetic field detection. The novel device for real-time measurement of solar polarization Stokes vectors, disclosed by the invention, is characterized in that a micro wave plate array is manufactured by adopting a micro-optical technical principle, a micro polaroid array is processed on the basis and is attached to a photosensitive surface of a light intensity acquisition camera, and solar polarization Stokes vector information can be obtained only by one-time exposure. Compared with the traditional device, the device has the advantages of compact structure, strong real-time performance, no need of accurate debugging and artificial modulation, wide spectral response range, low cost, mass production, avoidance of detection errors caused by factors such as uneven response and aberration of the camera and the like, and convenient expansion in other application fields.

Description

A kind of device that can be used for the Stokes vector measurement in real time of sun polarization
Technical field
The present invention relates to polarimetry field, more particularly to one kind can be used for sun polarization Stokes vector measure in real time Device.
Background technology
Solar magnetic field is the driving force of solar activity outburst and energy source, and sun polarization Stokes vector measurement is The unique channel of solar magnetic field detection.Traditional sun polarimetry is same frequently with time division modulation (as shown in Figure 2) and point amplitude When modulate (as shown in Figure 3) mode.Time division modulation includes rotating wave plate, modulates Phase Retardation of Wave Plate, modulation wave plate optical axis side To etc..
Fig. 2 (a) show the mode of rotating wave plate, and wherein 2-1 is quarter wave plate, and 2-2 is electric angle turntable, and 2-3 is inclined Shake piece, and 2-4 is intensity collection camera, and 2-5 is controller.Controller control turntable rotation, and then wave plate quick shaft direction is modulated, Intensity collection camera record successively wave plate in different quick shaft direction when light intensity value, by the light intensity value and wave plate fast axle side that measure To angle, can be with inverting sunshine Stokes vector to be measured.
Fig. 2 (b) show the mode of modulation Phase Retardation of Wave Plate, and wherein 2-6 is electro-optic crystal, and 2-3 is polarizer, 2-4 For intensity collection camera, 2-5 is controller.In the presence of external electrical field, the birefringence of electro-optic crystal can change, Its phase-delay quantity changes with applied voltage, and its quick shaft direction does not change.Controller is by additional to electro-optic crystal So as to be modulated to its phase delay, intensity collection camera is recorded when electro-optic crystal out of phase postpones different voltages successively Light intensity value, by the light intensity value and retardation of wave plate that measure, can be with inverting sunshine Stokes vector to be measured.
Fig. 2 (c) show the mode of modulation wave plate optical axis direction, and wherein 2-7 is FLC crystal, and phase delay is 1/2 ripple Long, 2-8 is FLC crystal, and phase delay is 1/4 wavelength, and 2-3 is polarizer, and 2-4 is intensity collection camera, and 2-5 is controller. In the presence of external electrical field, FLC optical axis of crystal direction rotates and its phase delay is constant.Controller is by brilliant to FLC External plus different voltages make its optical axis direction switch between specific two angles, and intensity collection camera records FLC crystal successively Light intensity value during different optical axis directions, by the light intensity value and FLC optical axis of crystal deflections that measure, can with inverting sunshine to be measured this Lentor vector.
Fig. 3 show point amplitude while the mode of modulation, wherein 3-1 is Amici prism, and 3-2 is quarter wave plate, and 3-3 is inclined Shake piece, and 3-4 is intensity collection camera, and 3-5 is controller.Light beam is divided into 4 beams by Amici prism, adds different in each light path The wave plate and polarizer of direction of rotation, controller controls 4 intensity collection cameras to be carried out to the light intensity value of each light path while gather, Using the light intensity value and wave plate and the modulation system of polarizer of 4 collected by camera, sunshine Stokes to be measured can be finally inversed by Vector.
But it is affected by environment, within the intensity collection camera double exposure cycle, into the sunshine of polarimeter There is light intensity flicker, therefore the mode certainty of measurement of time division modulation is restricted.Also, there is machinery and shake in the mode of rotating wave plate It is dynamic, and modulating frequency is low, to reach the higher stability of a system, diagonal turntable has higher requirements, high cost;Modulation wave plate phase The mode that position postpones is more sensitive to temperature because of electro-optic crystal phase-delay quantity, generally requires extra thermostatic equipment, system complex. The mode of modulation wave plate optical axis direction is more sensitive equally to temperature because of FLC optical axis directions, and processing difficulties, relatively costly, to certain A little systems are difficult to meet use requirement;The mode that point amplitude is modulated simultaneously by light path be divided into 4 beams, system complex, and each camera it Between there is inhomogeneities, affect certainty of measurement.
For problem above, a kind of new dress that can be used for the Stokes vector measurement in real time of sun polarization of the present invention Put, the microwave chip arrays made using micro-optics know-why, and process micro- polarization chip arrays on this basis, and adopt with light intensity Collection camera photosurface laminating, it is only necessary to which single exposure can obtain sun polarization Stokes vector information.Relative to tradition dress Put, apparatus of the present invention compact conformation is real-time, without the need for accurately debugging and artificial modulation, spectral response range width, low cost and Can mass production, while avoiding the factors such as camera nonuniform response, can conveniently spread over other application field.It is of the invention real Strong with property, novelty is obvious.
The content of the invention
The technical problem to be solved in the present invention is:The real-time survey of full Stokes vector parameter is carried out to sun polarization state Amount.
The present invention solves the technical scheme of above-mentioned technical problem employing:One kind can be used for sun polarization Stokes vector The device of measurement, including spectral filter in real time, wave plate array, polarization chip arrays and intensity collection camera,
Wherein, before spectral filter is located at wave plate array, the light into wave plate array is limited to into certain spectrum model In enclosing;Wave plate array is processed into the wave plate combined of out of phase delay in adjacent 2 × 2 four units using same wave plate, And so on, ultimately form array;Polarization chip arrays are processed into different polarization side using in adjacent 2 × 2 four units To polarizer combination, and so on, ultimately form array;Wave plate array is equivalently-sized with polarization chip arrays each unit, number It is corresponding;Intensity collection camera is located on horizontal solar telescope system focal plane, respectively light intensity value of the record by array each unit, Which is fit together with wave plate array, polarization chip arrays, makes integrating device;
The data handling procedure of the device is as described below:
First, the Stokes vector for defining sunshine to be measured is S=[I Q U V]T;In adjacent 2 × 2 four units Interior wave plate has four kinds of various combination modes with polarizer, is designated as a, b, c, d respectively.Wave plate Muller matrixes are respectively Mwa,Mwb, Mwc,Mwd, polarizer Muller matrixes are Mpa,Mpb,Mpc,Mpd.Combination Muller matrixes are respectively Ma,Mb,Mc,Md.Wherein:
Note a units Muller matrixes be:
After the wave plate and polarizer unit that are labeled as a, its emergent light Stokes vector is sunshine:
Then, sunshine enters intensity collection camera (4), and the corresponding light intensity value of collected by camera is:
Ia=a11I+a12Q+a13U+a14V (13)
The Muller matrixes of known polarization piece are:
Wherein, α is polarizer polarizing angle.
The Muller matrixes of wave plate are:
Wherein, δ is the phase delay that wave plate is produced, and θ is wave plate quick shaft direction and coordinate system X-direction angle.
Then:
In the same manner, camera gathers 2 × 2 four corresponding light intensity values of unit respectively and is:Ia,Ib,Ic,Id, have:
By this group of light intensity value Ia,Ib,Ic,IdThe Stokes vector of inverting sunshine to be measured,
Wherein:
The condition of formula (5) existence and unique solution is:Metzler matrix full rank, i.e.,:
Rank (M)=4 (20)
In a, tetra- units of b, c, d make α, δ, θ take different values, Metzler matrix can be made to meet the condition of formula (10).
Wherein, spectral filter effect is that the spectrum of incident light is limited in certain bandwidth range, and which can use Grating spectrograph, interference light filter, atomic light filter and birefringent filter, will as long as meeting system in polarimetry application Ask.
Wherein, this device can be directed to multiple wavelength and the spectrum of bandwidth completes to polarize Stokes vector measurement, not office It is limited to specific wavelength and bandwidth, but is limited to the spectral response of intensity collection camera.
Wherein, the effect of spectral filter is that the spectrum of incident light is limited in certain bandwidth range, and which can make With grating spectrograph, interference light filter, atomic light filter and birefringent filter etc., as long as in meeting polarimetry application being System is required.
Wherein, wave plate array, can be using method systems such as impressing, etchings for producing different phase delays to light beam Make.
Wherein, the etching or depth of indentation of wave plate are relevant with wavelength and phase-shift phase, as long as meet right formula (14) being retouched The full rank condition stated, can accurately measure polarization Stokes vector parameter.
Wherein, polarize chip arrays to combine using the polarizer unit in different polarization direction, can be using in substrate The mode of the wire grating of the different orientations of plating is produced, it would however also be possible to employ the mode such as nano impression, etching, as long as meeting this The polarization characteristic of bright requirement.
Wherein, this device adopts different Phase Retardation of Wave Plate and polarizer polarization side in adjacent 2 × 2 four units To combination, but do not limit its combination, as long as its modulation matrix M is reversible after combination.
Wherein, intensity collection camera can gather the light distribution required for polarimetry, its can for CCD, CMOS, EMCCD, photomultiplier etc., as long as meeting intensity collection function.
Wherein, single wave plate array can not only correspond to single photodetector list with polarizer array element size Unit, it is also possible to a correspondence arbitrarily photodetector unit, as long as can be to being gathered by the light of each array element respectively.
Wherein, this device medium wave chip arrays, polarization chip arrays and intensity collection camera fit together, and are integrating device, Which can be individual devices, be combined together by modes such as glued or pressings, it is also possible to add on the two sides of same substrate respectively Work, as long as meeting the polarimetry function of this patent description.
The present invention principle be:
Stokes vector can completely represent the polarization information of light, and transmission of the optical element to Stokes vector can be with Represented with Muller matrixes.It is assumed that the Stokes vector of sunshine to be measured is S=[I Q U V]T, it is known that polarizer Muller matrixes are:
Wherein, θ is polarizer polarizing angle.
The Muller matrixes of wave plate are:
Wherein, δ is the phase delay that wave plate is produced, and θ is wave plate quick shaft direction and coordinate system X-direction angle.
After sunshine to be measured sequentially passes through wave plate and polarizer, its Stokes vector is:
Under specific wave plate and polarizer modulation condition a, it is assumed that its Muller matrix is:
The light intensity value of collected by camera is:
Ia=a11I+a12Q+a13U+a14V (19)
Equally, in b, under c, d state, collected by camera light intensity is Ib,Ic,Id, have:
By this group of light intensity value Ia,Ib,Ic,IdThe Stokes vector of inverting sunshine to be measured
Wherein:
Combination of the wave plate array (2) with polarization chip arrays (3) in adjacent 2 × 2 four units is selected, modulation is made Matrix M is reversible, i.e.,:
Rank (M)=4 (23)
The present invention has the following advantages compared with prior art:
(1). a kind of new device that can be used for the Stokes vector measurement in real time of sun polarization proposed by the present invention, realize Sun polarization state is measured in real time, it is not necessary to time division modulation, it is only necessary to which single exposure can just calculate complete this support of target Gram this vector parameters, it is to avoid the impact of traditional timesharing measurement light intensity flicker, effectively improve detection accuracy and sensitivity.
(2). a kind of new device that can be used for the Stokes vector measurement in real time of sun polarization proposed by the present invention, need not Beam splitter and relay optical system can complete single intensity collection and realize that sun light polarization Stokes vector is measured in real time, Its structure is substantially reduced, and structural compactness is greatly improved, and the stability of a system strengthens.
(3). a kind of new device that can be used for the Stokes vector measurement in real time of sun polarization proposed by the present invention, need not Relay optical system and extra beam splitter, it is less demanding to the dispersion of transmissive element, improve effective detecting light spectrum scope. Meanwhile, system aberration and spectra overlap are substantially reduced, the accuracy and sensitivity of polarization Stokes vector detection is improved.
(4). a kind of new device that can be used for the Stokes vector measurement in real time of sun polarization proposed by the present invention, adopt Integrated Light micro-optical device realizes the function of conventional geometric optics, without the need for accurately debugging and artificial modulation, easy to operate. Its operation understands that repeatable and sequencing degree is high, is conducive to the standardization and mass production of measurement device, substantially reduces The cost of mass production.
(5). a kind of new device that can be used for the Stokes vector measurement in real time of sun polarization proposed by the present invention, which is only Complete to polarize Stokes vector measurement by needing to measure a width intensity distribution image, it is real-time, can be used for high-speed motion The polarimetry of target.It is low to environmental requirement, the effectively application of extension polarization Stokes vector sensitive detection parts and application Scope.
In a word, by a kind of new dress that can be used for the Stokes vector measurement in real time of sun polarization proposed by the present invention Put, break through traditional modulation, it is only necessary to which single exposure can obtain sun polarization Stokes vector information.Relative to tradition Device, apparatus of the present invention compact conformation are real-time, without the need for accurately debugging and artificial modulation, spectral response range width, low cost And can mass production, while avoiding the factors such as camera nonuniform response, can conveniently spread over other application field.The present invention Practical, novelty is obvious.
Description of the drawings
Fig. 1 is a kind of device that can be used for the Stokes vector measurement in real time of sun polarization.Wherein, 1-1 is spectral filtering Device, 1-2 are wave plate array, and to polarize chip arrays, 1-4 is intensity collection camera to 1-3.
Fig. 2 is time division modulation polarimeter, wherein, modes of the Fig. 2 (a) for rotating wave plate, Fig. 2 (b) are modulating wave The mode of piece phase delay, Fig. 2 (c) are the mode for modulating wave plate optical axis direction.Wherein, 2-1 is quarter wave plate, and 2-2 is electric angle Turntable, 2-3 are polarizer, and 2-4 is intensity collection camera, and 2-5 is controller, and 2-6 is electro-optic crystal, and 2-7,2-8 are that FLC is brilliant Body.
Fig. 3 is point amplitude while modulating polarization measurement apparatus.Wherein, 3-1 is Amici prism, and 3-2 is quarter wave plate, and 3-3 is Polarizer, 3-4 are intensity collection camera, and 3-5 is controller.
Fig. 4 is wave plate array processing mode.
Fig. 5 is polarization chip arrays processing mode.
Fig. 6 be wave plate array, polarization chip arrays and intensity collection camera it is integrated, wherein, 6-1 is wave plate array, and 6-2 is Polarization chip arrays, 6-3 is CCD camera.
Fig. 7 is that this device gathers example images.
Fig. 8 be by this device gather image inverting Stokes example distribution schematic diagram, wherein, Fig. 8 (a) for incident light this Lentor parameter I distribution schematic diagrams, Fig. 8 (b) are incident light stokes parameter Q distribution schematic diagrams, Fig. 8 (c) for incident light this Lentor parameter U distribution schematic diagrams, Fig. 8 (d) are incident light stokes parameter V distribution schematic diagrams.
Specific embodiment
Below in conjunction with the accompanying drawings and instantiation further illustrates the present invention.
The basic thought of the present invention is to provide a kind of device that can be used for the Stokes vector measurement in real time of sun polarization, By spectral filter 1-1, wave plate array 1-2, chip arrays 1-3 is polarized, intensity collection camera 1-4 is constituted, as shown in Figure 1.
Wherein, before wave plate array 1-2, the standard for making the light into wave plate be certain bandwidth is single for spectral filter 1-1 Coloured light;Wave plate array 1-2 is processed into the wave plate group of out of phase delay in adjacent 2 × 2 four units using same wave plate Close, and so on, ultimately form array;Polarization chip arrays 1-3 is processed into difference using in adjacent 2 × 2 four units The polarizer combination of polarization direction, and so on, ultimately forms array;Wave plate array 1-2 and polarization chip arrays 1-3 each unit chis Very little identical, number is corresponding;Intensity collection camera 1-4 is located on horizontal solar telescope system focal plane, and record is by array respectively The light intensity value of each unit, which is fit together with wave plate array 1-2, polarization chip arrays 1-3, makes integrating device.
The data handling procedure of the device is as described below:
First, the Stokes vector for defining sunshine to be measured is S=[I Q U V]T;In adjacent 2 × 2 four units Interior wave plate has four kinds of various combination modes with polarizer, is designated as a, b, c, d respectively.Wave plate Muller matrixes are respectively Mwa,Mwb, Mwc,Mwd, polarizer Muller matrixes are Mpa,Mpb,Mpc,Mpd.Combination Muller matrixes are respectively Ma,Mb,Mc,Md.Wherein:
Note a units Muller matrixes be:
After the wave plate and polarizer unit that are labeled as a, its Stokes vector is sunshine:
Then, sunshine enters intensity collection camera 1-4, and the corresponding light intensity value of collected by camera is:
Ia=a11I+a12Q+a13U+a14V (26)
In the same manner, camera gathers 2 × 2 four corresponding light intensity values of unit respectively and is:Ia,Ib,Ic,Id, have:
By changing Phase Retardation of Wave Plate, quick shaft direction, polarizer polarizing angle, only modulation matrix M need to be made reversible, i.e. its order For 4, you can by this group of light intensity value Ia,Ib,Ic,IdThe Stokes vector of inverting sunshine to be measured.
Wherein:
The Muller matrixes of known wave plate are:
Wherein, δ is the phase delay that wave plate is produced, and θ is wave plate quick shaft direction and coordinate system X-direction angle.
Known Phase Retardation of Wave Plate is:
Wherein no,neThe respectively refractive index of o light and e light in crystal, for certain material, specific wavelength, no,neIt is permanent Fixed, function of the phase delay of δ for crystal thickness d, by changing crystal thickness d, can postpone δ with phase modulation.Wave plate array 1-2 Using calcite material, its optical axis of crystal is vertical with incident light, and quick shaft direction is fixed as -45 °.Calcite material etch is added Work is wave plate array, and processing mode is as shown in fig. 4 a.Tetra- units of a, b, c, d are combined as shown in table 1 from Phase Retardation of Wave Plate:
Table 1
As depicted in fig. 4b, for the light that wavelength is 656.3 nanometers, no=1.6544, ne=1.4846, by calcite plus Work is quarter wave plate, to meet b, the phase delay of c units.In a, wave plate is etched by d units, and groove depth d=966.284 receives Rice, to meet its phase delay.
The Muller matrixes of known polarization piece are:
Wherein, θ is polarizer polarizing angle.
As shown in Figure 5 b, polarize chip arrays 1-3 by the way of the metallization traces grid in substrate, polarizer polarization direction with Wire grating orientation is orthogonal.As shown in Figure 5 b, a, b, c, d unit polarizer polarization direction is combined as shown in table 2:
Table 2
Sequence a b c d
Polarizing angle θ 45° -45°
Now Polarization Modulation matrix is:
Camera 6-3 is located on horizontal solar telescope system focal plane, and the characteristic such as its Pixel size and quantity meets the sun and looks in the distance Mirror observation is required.Wave plate array 6-1 is fit together with camera 6-3 target surfaces with polarization chip arrays 6-2, as shown in Figure 6.The sun is hoped Remote mirror institute uses collected by camera into image after spectroscopy equipment and wave plate array and polarization chip arrays, with four of adjacent 2 × 2 Pixel record light intensity value:
Using four light intensity values and Polarization Modulation matrix computations incident light Stokes vector of collection:
S=M-1·I′ (33)
More intuitively to show this device using effect, analog simulation is We conducted.Assume in simulation that incident sunshine is Partial poolarized light, at each picture point, stokes parameter is random value.When sunshine to be measured is after the collection of this device modulates, obtain Image is as shown in Figure 7.After complementary operation, show that each stokes parameter distribution of incident light is as shown in Figure 8.Wherein, Fig. 8 A () is incident light stokes parameter I distribution schematic diagrams, Fig. 8 (b) is incident light stokes parameter Q distribution schematic diagrams, Fig. 8 C () is incident light stokes parameter U distribution schematic diagrams, Fig. 8 (d) is incident light stokes parameter V distribution schematic diagrams.
The above, the only specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, any It is familiar with the people of the technology in disclosed technical scope, it will be appreciated that the replacement arrived or increase and decrease, all should covers at this It is bright include within the scope of, therefore, protection scope of the present invention should be defined by the protection domain of claims.

Claims (10)

  1. It is 1. a kind of to can be used for the device that sun polarization Stokes vector is measured in real time, it is characterised in that:The device includes spectrum Filter (1-1), wave plate array (1-2), polarization chip arrays (1-3) and intensity collection camera (1-4);
    Wherein, the light into wave plate array (1-2) was limited to one before wave plate array (1-2) by spectral filter (1-1) In fixed spectral region;Wave plate array (1-2) is processed into out of phase using same wave plate in adjacent 2 × 2 four units The wave plate combined of delay, and so on, ultimately forms array;Polarization chip arrays (1-3) is using four lists adjacent 2 × 2 The polarizer combination in different polarization direction is processed in unit, and so on, array is ultimately formed;Wave plate array (1-2) and polarization Chip arrays (1-3) each unit is equivalently-sized, and number is corresponding;Intensity collection camera (1-4) is burnt flat positioned at horizontal solar telescope system On face, record passes through the light intensity value of array each unit respectively, and which is fitted in one with wave plate array (1-2), polarization chip arrays (1-3) Rise, make integrating device;
    The data handling procedure of the device is as described below:
    First, the Stokes vector for defining sunshine to be measured is S=[I Q U V]T;The ripple in adjacent 2 × 2 four units Piece has four kinds of various combination modes with polarizer, is designated as a respectively, and b, c, d, wave plate Muller matrixes are respectively Mwa,Mwb,Mwc, Mwd, polarizer Muller matrixes are Mpa,Mpb,Mpc,Mpd.Combination Muller matrixes are respectively Ma,Mb,Mc,Md, wherein:
    M a = M p a M w a M b = M p b M w b M c = M p c M w c M d = M p d M w d - - - ( 1 )
    Note a units Muller matrixes be:
    After the wave plate and polarizer unit that are labeled as a, its emergent light Stokes vector is sunshine:
    S ′ = I a Q a U a V a = M a S - - - ( 2 )
    Then, sunshine enters intensity collection camera (4), and the corresponding light intensity value of collected by camera is:
    Ia=a11I+a12Q+a13U+a14V (3)
    The Muller matrixes of known polarization piece are:
    M p = 1 2 1 c o s 2 α s i n 2 α 0 c o s 2 α cos 2 2 α c o s 2 α s i n 2 α 0 s i n 2 α c o s 2 α sin 2 α sin 2 2 α 0 0 0 0 0 - - - ( 4 )
    Wherein, α is polarizer polarizing angle;
    The Muller matrixes of wave plate are:
    M w = 1 0 0 0 0 cos 2 2 θ + sin 2 2 θ cos δ 1 2 sin 4 θ ( 1 - cos δ ) - sin 2 θ sin δ 0 1 2 sin 4 θ ( 1 - cos δ ) sin 2 2 θ + cos 2 2 θ cos δ c o s 2 θ sin δ 0 sin 2 θ sin δ - c o s 2 θ sin δ cos δ - - - ( 5 )
    Wherein, δ is the phase delay that wave plate is produced, and θ is wave plate quick shaft direction and coordinate system X-direction angle;
    Then:
    a 11 = 1 2 a 12 = 1 2 cos 2 α ( cos 2 2 θ + sin 2 2 θ cos δ ) + sin 2 α ( sin 2 θ cos 2 θ - sin 2 θ cos 2 θ cos δ ) a 13 = 1 2 cos 2 α ( sin 2 θ cos 2 - sin 2 θ cos 2 θ cos δ ) + sin 2 α ( sin 2 2 θ + cos 2 2 θ cos δ ) a 13 = 1 2 sin ( 2 α - 2 θ ) sin δ - - - ( 6 )
    In the same manner, camera gathers 2 × 2 four corresponding light intensity values of unit respectively and is:Ia,Ib,Ic,Id, have:
    I a I b I c I d = a 11 a 12 a 13 a 14 b 11 b 12 b 13 b 14 c 11 c 12 c 13 c 14 d 11 d 12 d 13 d 14 I Q U V - - - ( 7 )
    By this group of light intensity value Ia,Ib,Ic,IdThe Stokes vector of inverting sunshine to be measured,
    S = I Q U V = a 11 a 12 a 13 a 14 b 11 b 12 b 13 b 14 c 11 c 12 c 13 c 14 d 11 d 12 d 13 d 14 - 1 · I a I b I c I d = M - 1 · I a b c d - - - ( 8 )
    Wherein:
    M = a 11 a 12 a 13 a 14 b 11 b 12 b 13 b 14 c 11 c 12 c 13 c 14 d 11 d 12 d 13 d 14 , I a b c d = I a I b I c I d - - - ( 9 )
    The condition of formula (5) existence and unique solution is:Metzler matrix full rank, i.e.,:
    Rank (M)=4 (10)
    In a, tetra- units of b, c, d make α, δ, θ take different values, Metzler matrix can be made to meet the condition of formula (10).
  2. 2. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:Spectral filter effect is that the spectrum of incident light is limited in certain bandwidth range, and which can use grating spectrum Instrument, interference light filter, atomic light filter and birefringent filter, as long as meeting system requirements in polarimetry application.
  3. 3. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:The device can be directed to multiple wavelength and the spectrum of bandwidth completes to polarize Stokes vector measurement, be not limited to specific Wavelength and bandwidth, but it is limited to the spectral response of intensity collection camera.
  4. 4. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:Wave plate array can be made using impressing, lithographic method for producing different phase delays to light beam.
  5. 5. a kind of sun that can be used for according to claim 1 or 4 polarizes the device that Stokes vector is measured in real time, and which is special Levy and be:The etching or depth of indentation of wave plate is relevant with wavelength and phase-shift phase, as long as meet formula in claim 1 (7) being retouched The full rank condition stated, can accurately measure polarization Stokes vector parameter.
  6. 6. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:Polarization chip arrays (1-3) is combined using the polarizer unit in different polarization direction, can be plated not using in substrate Produce with the mode of the wire grating of orientation, it would however also be possible to employ nano impression or etching mode, as long as meeting the inclined of requirement Shake characteristic.
  7. 7. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:In the interior combination for adopting different Phase Retardation of Wave Plate and polarizer polarization direction of adjacent 2 × 2 four units, but not Its combination is limited, as long as its modulation matrix M is reversible after combination.
  8. 8. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:Intensity collection camera can gather the light distribution required for polarimetry, and which can be CCD, CMOS, EMCCD or light Electric multiplier tube, as long as meeting intensity collection function.
  9. 9. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:Single wave plate array can not only correspond to single photodetector unit with polarizer array element size, it is also possible to A correspondence arbitrarily photodetector unit.
  10. 10. a kind of sun that can be used for according to claim 1 polarizes the device that Stokes vector is measured in real time, its feature It is:Device medium wave chip arrays (1-2), polarization chip arrays ((1-3) ((1-4) fits together, and is with intensity collection camera Integrating device, which can be individual devices, be combined together by glued or pressing mode, it is also possible on the two sides of same substrate Process respectively.
CN201611093398.3A 2016-12-02 2016-12-02 Device for real-time measurement of solar polarization Stokes vector Active CN106525242B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611093398.3A CN106525242B (en) 2016-12-02 2016-12-02 Device for real-time measurement of solar polarization Stokes vector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611093398.3A CN106525242B (en) 2016-12-02 2016-12-02 Device for real-time measurement of solar polarization Stokes vector

Publications (2)

Publication Number Publication Date
CN106525242A true CN106525242A (en) 2017-03-22
CN106525242B CN106525242B (en) 2018-11-30

Family

ID=58354254

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611093398.3A Active CN106525242B (en) 2016-12-02 2016-12-02 Device for real-time measurement of solar polarization Stokes vector

Country Status (1)

Country Link
CN (1) CN106525242B (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107014490A (en) * 2017-04-17 2017-08-04 大连理工大学 One kind point focal plane type real-time polarization imaging system
JP2018010048A (en) * 2016-07-11 2018-01-18 キヤノン株式会社 Optical device and imaging apparatus
CN108007575A (en) * 2017-11-29 2018-05-08 中国科学院光电技术研究所 Miniaturized full-Stokes vector polarization imaging device based on binary digital coding birefringent crystal
CN108490214A (en) * 2018-03-14 2018-09-04 中国科学院光电技术研究所 Solar atmosphere apparent velocity field measuring method based on tunable optical filter imaging observation
CN109655160A (en) * 2018-03-05 2019-04-19 曹毓 A kind of extension target divides visual field polarization measurement system and method in real time
CN110631705A (en) * 2019-09-17 2019-12-31 哈尔滨理工大学 Method and device for carrying out real-time Stokes polarization measurement by using DMD
CN114166348A (en) * 2021-12-16 2022-03-11 中国科学院光电技术研究所 Rapid polarization imaging method based on full Stokes vector

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5734473A (en) * 1997-02-27 1998-03-31 United States Of America As Represented By The Secretary Of The Army Method of determining polarization profiles for polychromatic sources
CN1930462A (en) * 2003-09-17 2007-03-14 株式会社光学格子 Polarization analysis apparatus and polarization analysis method
JP2009156712A (en) * 2007-12-26 2009-07-16 Photonic Lattice Inc Polarization measuring device and measuring system
CN102539119A (en) * 2011-12-27 2012-07-04 上海大学 Mueller matrix testing device based on rotatable wave plate and method
CN103454712A (en) * 2013-09-10 2013-12-18 中国科学技术大学 Wave plate array based on pixels and preparation methods of wave plate array
CN103630336A (en) * 2013-12-02 2014-03-12 南京理工大学 Dynamic interference measuring method based on random fast axis azimuth delay array
CN103837476A (en) * 2012-11-21 2014-06-04 中国科学院国家天文台 Mueller matrix self calibration measurement method
CN104833977A (en) * 2015-05-11 2015-08-12 福州大学 Instantaneous remote-sensing polarization imaging device based on microwave plate array and realizing method thereof

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5734473A (en) * 1997-02-27 1998-03-31 United States Of America As Represented By The Secretary Of The Army Method of determining polarization profiles for polychromatic sources
CN1930462A (en) * 2003-09-17 2007-03-14 株式会社光学格子 Polarization analysis apparatus and polarization analysis method
JP2009156712A (en) * 2007-12-26 2009-07-16 Photonic Lattice Inc Polarization measuring device and measuring system
CN102539119A (en) * 2011-12-27 2012-07-04 上海大学 Mueller matrix testing device based on rotatable wave plate and method
CN103837476A (en) * 2012-11-21 2014-06-04 中国科学院国家天文台 Mueller matrix self calibration measurement method
CN103454712A (en) * 2013-09-10 2013-12-18 中国科学技术大学 Wave plate array based on pixels and preparation methods of wave plate array
CN103630336A (en) * 2013-12-02 2014-03-12 南京理工大学 Dynamic interference measuring method based on random fast axis azimuth delay array
CN104833977A (en) * 2015-05-11 2015-08-12 福州大学 Instantaneous remote-sensing polarization imaging device based on microwave plate array and realizing method thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
陈振跃 等: "微光偏振成像系统设计及实验", 《光子学报》 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018010048A (en) * 2016-07-11 2018-01-18 キヤノン株式会社 Optical device and imaging apparatus
CN107014490A (en) * 2017-04-17 2017-08-04 大连理工大学 One kind point focal plane type real-time polarization imaging system
CN108007575A (en) * 2017-11-29 2018-05-08 中国科学院光电技术研究所 Miniaturized full-Stokes vector polarization imaging device based on binary digital coding birefringent crystal
CN109655160A (en) * 2018-03-05 2019-04-19 曹毓 A kind of extension target divides visual field polarization measurement system and method in real time
CN108490214A (en) * 2018-03-14 2018-09-04 中国科学院光电技术研究所 Solar atmosphere apparent velocity field measuring method based on tunable optical filter imaging observation
CN110631705A (en) * 2019-09-17 2019-12-31 哈尔滨理工大学 Method and device for carrying out real-time Stokes polarization measurement by using DMD
CN110631705B (en) * 2019-09-17 2021-04-20 哈尔滨理工大学 Method and device for carrying out real-time Stokes polarization measurement by using DMD
CN114166348A (en) * 2021-12-16 2022-03-11 中国科学院光电技术研究所 Rapid polarization imaging method based on full Stokes vector
CN114166348B (en) * 2021-12-16 2023-09-19 中国科学院光电技术研究所 Rapid polarization imaging method based on full Stokes vector

Also Published As

Publication number Publication date
CN106525242B (en) 2018-11-30

Similar Documents

Publication Publication Date Title
CN106525242B (en) Device for real-time measurement of solar polarization Stokes vector
US9976906B2 (en) Light polarization state modulation and detection apparatuses and detection method
CN107367329B (en) A kind of image, spectrum, polarization state integration acquisition device and detection method
CN107741274B (en) Miniature polarization spectrum imaging detection system and method
CN104833977A (en) Instantaneous remote-sensing polarization imaging device based on microwave plate array and realizing method thereof
CN102297722B (en) Double-channel differential polarizing interference imaging spectrometer
CN104568765B (en) Miniature spectroscopic ellipsometer device and measuring method
CN101504316B (en) Color filter tuning type window scanning optical spectrum imaging system and method
JP2012507027A (en) Spectroscopic polarimetry apparatus and method in visible and near infrared region
CN108007574B (en) The fast illuminated image spectrum linear polarization detection device of resolution ratio adjustable type and method
US6744509B2 (en) Retardance sweep polarimeter and method
CN103954360A (en) Spectrum polarization device based on polarization array and detection method
CN103134445A (en) Wide-range high-precision facial contour detection device and detection method thereof
CN111562223A (en) Polarizing imaging device and method based on micro-polarizer array
CN103528688B (en) A kind of full polarization hyper spectral interference imaging device and method
CN105511066A (en) Microscopic polarization imaging device based on microwave sheet array and implement method thereof
CN115314626B (en) Integrated quantitative phase imaging camera, method and image processing method
US20200149966A1 (en) Method and system for polarimetry using static geometric polarization manipulation
CN113375800A (en) Adjustable optical filter based on optical super-surface and spectral imaging system
CN102620830B (en) Foundation airglow imaging interferometer and method thereof for detecting wind speed and temperature of upper atmosphere
CN203688946U (en) Electronic control liquid crystal tunable optical filter
CN104535191B (en) Polarization spectral imaging measuring structure based on magnetic vortice light and AOTF
CN107421641A (en) A kind of broadband full polarization imaging device based on Mach Zehnder interferometer
CN107101722A (en) A kind of broadband linear polarization imaging method based on Mach Zehnder interferometer
EP3505883A1 (en) Color filter used with liquid-crystal polarization interferometer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant