CN107462827A - 带有内部稳压器的电源毛刺检测电路 - Google Patents
带有内部稳压器的电源毛刺检测电路 Download PDFInfo
- Publication number
- CN107462827A CN107462827A CN201710769874.7A CN201710769874A CN107462827A CN 107462827 A CN107462827 A CN 107462827A CN 201710769874 A CN201710769874 A CN 201710769874A CN 107462827 A CN107462827 A CN 107462827A
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- Prior art keywords
- power supply
- voltage
- module
- power
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Semiconductor Integrated Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201710769874.7A CN107462827B (zh) | 2017-08-31 | 2017-08-31 | 带有内部稳压器的电源毛刺检测电路 |
Applications Claiming Priority (1)
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CN201710769874.7A CN107462827B (zh) | 2017-08-31 | 2017-08-31 | 带有内部稳压器的电源毛刺检测电路 |
Publications (2)
Publication Number | Publication Date |
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CN107462827A true CN107462827A (zh) | 2017-12-12 |
CN107462827B CN107462827B (zh) | 2019-07-23 |
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CN201710769874.7A Active CN107462827B (zh) | 2017-08-31 | 2017-08-31 | 带有内部稳压器的电源毛刺检测电路 |
Country Status (1)
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CN (1) | CN107462827B (zh) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111010267A (zh) * | 2019-11-14 | 2020-04-14 | 上海华虹集成电路有限责任公司 | 基于随机数对芯片内部安全检测传感器信号进行加密的方法 |
CN111566492A (zh) * | 2020-04-01 | 2020-08-21 | 深圳市汇顶科技股份有限公司 | 电压攻击检测电路和芯片 |
CN111670367A (zh) * | 2020-04-01 | 2020-09-15 | 深圳市汇顶科技股份有限公司 | 电压攻击检测电路和芯片 |
CN112148103A (zh) * | 2020-09-09 | 2020-12-29 | 北京中电华大电子设计有限责任公司 | 一种保护从pad实施电源攻击的电路 |
CN112673263A (zh) * | 2019-08-15 | 2021-04-16 | 深圳市汇顶科技股份有限公司 | 毛刺信号检测电路、安全芯片和电子设备 |
US20210333334A1 (en) * | 2020-04-22 | 2021-10-28 | Nxp Usa, Inc. | Power supply peak current measurement |
US11250168B2 (en) | 2019-04-12 | 2022-02-15 | Nxp B.V. | Microcontroller and power supply |
TWI804449B (zh) * | 2022-01-05 | 2023-06-01 | 聯發科技股份有限公司 | 具有電源毛刺檢測功能之芯片 |
Citations (6)
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JP2002181894A (ja) * | 2000-12-12 | 2002-06-26 | Nippon Scientific Co Ltd | バーイン試験装置、及び、バーイン試験方法 |
CN101943728A (zh) * | 2009-07-06 | 2011-01-12 | 北京中电华大电子设计有限责任公司 | 一种防电源毛刺攻击的检测电路 |
US20150015283A1 (en) * | 2013-07-10 | 2015-01-15 | Apple Inc. | Method and Apparatus for Power Glitch Detection in Integrated Circuits |
CN104714193A (zh) * | 2014-08-27 | 2015-06-17 | 北京中电华大电子设计有限责任公司 | 一种高精度低功耗电源毛刺检测电路 |
CN105116353A (zh) * | 2015-09-29 | 2015-12-02 | 成都贝发信息技术有限公司 | 基于信息系统的低功耗电源检测装置 |
CN106405208A (zh) * | 2015-07-30 | 2017-02-15 | 三星电子株式会社 | 毛刺检测器和具有该毛刺检测器的电子装置 |
-
2017
- 2017-08-31 CN CN201710769874.7A patent/CN107462827B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002181894A (ja) * | 2000-12-12 | 2002-06-26 | Nippon Scientific Co Ltd | バーイン試験装置、及び、バーイン試験方法 |
CN101943728A (zh) * | 2009-07-06 | 2011-01-12 | 北京中电华大电子设计有限责任公司 | 一种防电源毛刺攻击的检测电路 |
US20150015283A1 (en) * | 2013-07-10 | 2015-01-15 | Apple Inc. | Method and Apparatus for Power Glitch Detection in Integrated Circuits |
CN104714193A (zh) * | 2014-08-27 | 2015-06-17 | 北京中电华大电子设计有限责任公司 | 一种高精度低功耗电源毛刺检测电路 |
CN106405208A (zh) * | 2015-07-30 | 2017-02-15 | 三星电子株式会社 | 毛刺检测器和具有该毛刺检测器的电子装置 |
CN105116353A (zh) * | 2015-09-29 | 2015-12-02 | 成都贝发信息技术有限公司 | 基于信息系统的低功耗电源检测装置 |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11250168B2 (en) | 2019-04-12 | 2022-02-15 | Nxp B.V. | Microcontroller and power supply |
CN112673263A (zh) * | 2019-08-15 | 2021-04-16 | 深圳市汇顶科技股份有限公司 | 毛刺信号检测电路、安全芯片和电子设备 |
CN111010267A (zh) * | 2019-11-14 | 2020-04-14 | 上海华虹集成电路有限责任公司 | 基于随机数对芯片内部安全检测传感器信号进行加密的方法 |
US11940471B2 (en) | 2020-04-01 | 2024-03-26 | Shenzhen GOODIX Technology Co., Ltd. | Voltage attack detection circuit and chip |
CN111566492A (zh) * | 2020-04-01 | 2020-08-21 | 深圳市汇顶科技股份有限公司 | 电压攻击检测电路和芯片 |
CN111670367A (zh) * | 2020-04-01 | 2020-09-15 | 深圳市汇顶科技股份有限公司 | 电压攻击检测电路和芯片 |
WO2021196094A1 (zh) * | 2020-04-01 | 2021-10-07 | 深圳市汇顶科技股份有限公司 | 电压攻击检测电路和芯片 |
CN111566492B (zh) * | 2020-04-01 | 2022-02-11 | 深圳市汇顶科技股份有限公司 | 电压攻击检测电路和芯片 |
US12086294B2 (en) | 2020-04-01 | 2024-09-10 | Shenzhen GOODIX Technology Co., Ltd. | Voltage attack detection circuit and chip |
CN111670367B (zh) * | 2020-04-01 | 2023-10-20 | 深圳市汇顶科技股份有限公司 | 电压攻击检测电路和芯片 |
US20210333334A1 (en) * | 2020-04-22 | 2021-10-28 | Nxp Usa, Inc. | Power supply peak current measurement |
US12066501B2 (en) * | 2020-04-22 | 2024-08-20 | Nxp Usa, Inc. | Power supply peak current measurement |
CN112148103A (zh) * | 2020-09-09 | 2020-12-29 | 北京中电华大电子设计有限责任公司 | 一种保护从pad实施电源攻击的电路 |
US11916432B2 (en) | 2022-01-05 | 2024-02-27 | Mediatek Inc. | Chip with power-glitch detection |
TWI804449B (zh) * | 2022-01-05 | 2023-06-01 | 聯發科技股份有限公司 | 具有電源毛刺檢測功能之芯片 |
Also Published As
Publication number | Publication date |
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CN107462827B (zh) | 2019-07-23 |
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Address after: 100192 Beijing, Haidian District West Road, No. 66, Zhongguancun Dongsheng science and Technology Park, building A, building No. 3 Co-patentee after: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. Patentee after: BEIJING SMARTCHIP MICROELECTRONICS TECHNOLOGY Co.,Ltd. Co-patentee after: STATE GRID CORPORATION OF CHINA Address before: 100192 Beijing, Haidian District West Road, No. 66, Zhongguancun Dongsheng science and Technology Park, building A, building No. 3 Co-patentee before: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. Patentee before: BEIJING SMARTCHIP MICROELECTRONICS TECHNOLOGY Co.,Ltd. Co-patentee before: State Grid Corporation of China |
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Effective date of registration: 20191125 Address after: 102299 1st floor, building 12, courtyard 79, Shuangying West Road, science and Technology Park, Changping District, Beijing Co-patentee after: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. Patentee after: Beijing Smart core semiconductor technology Co.,Ltd. Co-patentee after: STATE GRID CORPORATION OF CHINA Address before: 100192 Beijing, Haidian District West Road, No. 66, Zhongguancun Dongsheng science and Technology Park, building A, building No. 3 Co-patentee before: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. Patentee before: BEIJING SMARTCHIP MICROELECTRONICS TECHNOLOGY Co.,Ltd. Co-patentee before: STATE GRID CORPORATION OF CHINA |
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