CN107454938B - Chip testing head, chip testing device and testing method - Google Patents
Chip testing head, chip testing device and testing method Download PDFInfo
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- CN107454938B CN107454938B CN201780000491.1A CN201780000491A CN107454938B CN 107454938 B CN107454938 B CN 107454938B CN 201780000491 A CN201780000491 A CN 201780000491A CN 107454938 B CN107454938 B CN 107454938B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
Abstract
The embodiment of the application provides a chip testing head, a chip testing device and a chip testing method. The chip testing head comprises an opaque shell and an opaque conductive pressure head; the shell is provided with a hollow channel penetrating through the bottom end of the shell, and the conductive pressure head is arranged in the hollow channel and is in close contact with the inner wall of the shell; the conductive pressure head moves towards the bottom end along the hollow channel when being pressed so as to test the chip at the bottom end. This application embodiment adopts this chip test head, collects fingerprint chip's optical property test and fingerprint detection capability test in an organic whole to simplify fingerprint chip volume production test's flow, be favorable to improving efficiency, the reduce cost of fingerprint chip volume production test.
Description
Technical Field
The present disclosure relates to the field of chip testing, and more particularly, to a chip testing head, a chip testing apparatus and a chip testing method.
Background
Traditional fingerprint chip volume production test only need gather the data under two kinds of scenes, and the data of sensor when fingerprint chip induction zone has the conducting material to press promptly to and the data of sensor when fingerprint chip induction zone does not have any material to press. For the fingerprint chip with optical function (i.e. optical fingerprint chip), it is not only necessary to collect the above two data to analyze the fingerprint detection performance, but also to perform the optical performance test. In general, optical data of the fingerprint chip under the condition of isolating ambient light needs to be collected for optical performance analysis. On the basis, some optical fingerprint chips also need to collect optical data when the chips shield the light of the chips themselves while isolating the ambient light.
For the mass production test of optical fingerprint chips, the conventional method is to divide the two tests into two independent stations, i.e. to test the fingerprint detection performance and the optical performance respectively. The testing method adds a station, and a link of loading and unloading is added, so that the complexity and the cost of the test are increased, and the testing efficiency is reduced.
Disclosure of Invention
An object of some embodiments of the present invention is to provide a chip testing head, a chip testing apparatus and a testing method, which integrate an optical performance test and a fingerprint detection performance test of a fingerprint chip, thereby simplifying a mass production testing process of the fingerprint chip, improving mass production testing efficiency and reducing cost.
One embodiment of the present application provides a chip test head comprising an opaque housing and an opaque conductive indenter; the shell is provided with a hollow channel penetrating through the bottom end of the shell, and the conductive pressure head is arranged in the hollow channel and is in close contact with the inner wall of the shell; the conductive pressure head moves towards the bottom end along the hollow channel when being pressed so as to test the chip at the bottom end.
The embodiment of the application also provides a chip testing device, which comprises the chip testing head, a first driving mechanism connected with the shell of the chip testing head and used for pushing the chip testing head to move, and a second driving mechanism connected with the conductive pressure head of the chip testing head and used for pushing the conductive pressure head to move.
The embodiment of the application also provides a testing method of a fingerprint chip, which applies the chip testing device, and the testing method comprises the following steps: pushing a chip testing head to move towards the direction of a fingerprint chip to be tested through a first driving device until the chip testing head is placed on the fingerprint chip to be tested; the optical sensing area of the fingerprint chip to be detected is positioned in the hollow channel, and a gap is formed between the optical sensing area and the conductive pressure head; collecting first optical data and first fingerprint data of the fingerprint chip to be detected; pushing the conductive pressure head to the surface of the fingerprint chip to be detected through a second driving device; collecting second optical data and second fingerprint data of the fingerprint chip to be detected; analyzing the first optical data and the second optical data to obtain the optical performance of the fingerprint chip to be detected; and analyzing the first fingerprint data and the second fingerprint data to obtain the fingerprint detection performance of the fingerprint chip to be detected.
Compared with the prior art, the embodiment of the application provides the fingerprint chip test head, and the conductive pressure head which can move along the hollow channel when being subjected to external force is arranged in the fingerprint chip test head. When testing fingerprint chip, arrange the chip test head in the fingerprint chip that awaits measuring on, when electrically conductive pressure head did not receive to press, the shells inner wall of chip test head, electrically conductive pressure head and the fingerprint chip that awaits measuring itself will form the confined space of an isolation environment light, and the light of fingerprint chip self that awaits measuring just can form an independent return circuit in this confined space. At this moment, can gather fingerprint data and the optical data under isolated ambient light condition when the fingerprint chip that awaits measuring does not receive to press. When electrically conductive pressure head was pressed to the surface of the fingerprint chip that awaits measuring, the light of fingerprint chip self that awaits measuring was also sheltered from completely, at this moment, can gather the fingerprint data that the fingerprint chip that awaits measuring received when pressing to and the optical data under isolated ambient light and self light condition. Therefore, the chip testing head can integrate the fingerprint detection performance test and the optical performance measurement of the fingerprint chip, which is beneficial to simplifying the flow of mass production test, improving the efficiency of mass production test and reducing the cost.
In addition, the conductive indenter is an elastomer. The elastomer compliance is good, when electrically conductive pressure head is pressed to the surface of the fingerprint chip that awaits measuring, and is inseparabler with the laminating degree on fingerprint chip surface that awaits measuring, light-proofness are better.
In addition, the elastomer is conductive rubber. A conductive indenter of the type is provided.
In addition, one surface of the conductive pressure head facing the chip and the inner wall of the shell are rough surfaces. The design can make the light source of the fingerprint chip to be tested generate diffuse reflection in the sealed space formed by the inner wall of the shell of the chip testing head, the conductive pressure head and the fingerprint chip to be tested. The multiple diffuse reflection loops are overlapped, so that the effect of light equalization can be achieved, and the accuracy of optical performance test can be improved.
In addition, diffuse reflection films are attached to one surface, facing the chip, of the conductive pressure head and the inner wall of the shell. And providing another structure which can make the light of the fingerprint chip to be detected generate diffuse reflection.
In addition, a skirt edge extends out of the top end of the shell; and a plurality of mounting holes are formed in the skirt edge. A fixing structure of a housing is provided.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
FIG. 1 is a schematic diagram of a chip test head according to a first embodiment of the present application;
FIG. 2 is a cross-sectional view of a chip test head before and after pressing a conductive indenter according to a first embodiment of the present application;
FIG. 3 is a cross-sectional view of a chip test head according to a first embodiment of the present application positioned on a fingerprint chip to be tested and a conductive pressure head not pressed;
FIG. 4 is a schematic structural diagram of a chip testing device according to a third embodiment of the present application;
fig. 5 is a schematic structural diagram of a testing method of a fingerprint chip according to a fourth embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, some embodiments of the present application will be described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
A first embodiment of the present application is directed to a chip test head. The chip testing head can be applied to mass production testing of fingerprint chips. As shown in fig. 1, the chip testing head includes a housing 1 which is opaque to light, a hollow channel 2 which penetrates the bottom end of the housing 1, and a conductive indenter 3 which is disposed in the hollow channel 2.
Specifically, the housing 1 can be made of a light-proof material (e.g., metal) for the purpose of light-proof. However, the objective of light-tight can be achieved by attaching a light-tight film on the surface of the substrate. A skirt edge extends outwards from the top end of the shell 1, and a plurality of mounting holes 6 are formed in the skirt edge. When a chip test is performed, the chip test head can be fixed to the corresponding control device through the mounting hole 6.
The conductive indenter 3 placed in the hollow passage 2 has conductivity and light-shielding properties, and is in close contact with the inner wall of the housing 1. When not subjected to external force, the conductive indenter 3 can be fixed in the hollow channel 2, as shown in fig. 2 (a); the conductive indenter 3 is movable along the hollow channel 2 when subjected to an external force. When a downward pressing force is applied, the conductive ram 3 can move along the hollow channel 2 toward the bottom end of the housing 1, as shown in fig. 2 (b).
How to apply the chip test head to the test of fingerprint chips will be described in detail below:
as shown in fig. 3, when testing the fingerprint chip, the chip testing head can be disposed on the fingerprint chip 5 to be tested, and the optical sensing area (including the light emitting portion and the light receiving portion) of the fingerprint chip to be tested is disposed in the hollow channel 2 of the chip testing head. When not pressing electrically conductive pressure head 3, there is the clearance between electrically conductive pressure head 3 and the fingerprint chip 5 that awaits measuring, and at this moment, electrically conductive pressure head 3, the inner wall 4 of casing and the fingerprint chip 5 that awaits measuring will form the sealed space of isolated ambient light between. The light emitted by the fingerprint chip 5 to be measured can form an independent light path in the sealed space. At this time, the optical data corresponding to the fingerprint chip is the optical data under the condition of isolating the ambient light, and the corresponding fingerprint data is the fingerprint data when the fingerprint chip is not pressed.
It is worth mentioning that, in order to achieve better light shielding effect, the inner diameter of the hollow channel 2 can be designed according to the size of the fingerprint chip in the embodiment, so that the fingerprint chip to be detected can be integrally arranged in the hollow channel 2, thereby better avoiding the interference of ambient light.
It should be noted that, in actual production, due to the limitation of the manufacturing process, the relative position deviation of each part of the chip testing head exists within the tolerance range. This relative positional deviation affects the direction of the light. For specular reflection, any slight relative positional deviation caused by the change in the light path may cause a large deviation between the intensity of the received light and the intensity of the emitted light, thereby affecting the test result. However, the diffuse reflection is not sensitive to the position of the emitting light source, and the superposition of multiple diffuse reflection loops can achieve the light path effect similar to uniform light, so that the influence of the relative position deviation within the tolerance range on the test effect is reduced. For this reason, the present embodiment preferably considers that the light emitted by the fingerprint chip 5 to be measured is diffusely reflected on the inner wall 4 of the housing and the side of the conductive indenter 3 facing the fingerprint chip 5 to be measured.
In order to diffuse the light emitted by the fingerprint chip 5 to be measured, in the embodiment, the inner wall 4 of the housing and one surface of the conductive pressure head 3 facing the fingerprint chip 5 to be measured are roughened in advance, so that the surfaces of the inner wall and the conductive pressure head are roughened. However, in practical applications, the diffuse reflection film may be attached to the inner wall 4 of the housing and the surface of the conductive pressure head 3 facing the fingerprint chip 5 to be detected, so that the light emitted by the fingerprint chip 5 to be detected is diffusely reflected.
After acquiring the optical data under the condition of isolating the ambient light and the fingerprint data when the fingerprint chip is not pressed, the conductive pressure head 3 can be pressed towards the direction close to the fingerprint chip 5 to be detected. When the conductive pressure head 3 is attached to the surface of the fingerprint chip 5 to be detected, the light of the fingerprint chip 5 to be detected is shielded by the conductive pressure head 3. At this moment, the optical data that the fingerprint chip corresponds is the optical data of fingerprint chip under isolated ambient light and self light condition that awaits measuring promptly, and the fingerprint data that corresponds is the fingerprint data when the fingerprint chip that awaits measuring receives to press promptly.
Compared with the prior art, the embodiment provides the chip testing head for testing the fingerprint chip. The chip testing head can integrate the optical performance test and the fingerprint detection performance test of the fingerprint chip, and is beneficial to simplifying the flow of mass production test of the fingerprint chip, improving the efficiency of mass production test and reducing the cost.
A second embodiment of the present application is directed to a chip test head. This embodiment is further improved in the conductive indenter of the chip test head based on the first embodiment. The main improvement is that in the embodiment, the conductive indenter is arranged to be an elastic body.
The elastomer has certain compliance, when pressing it to the fingerprint chip that awaits measuring, its combination with the fingerprint chip that awaits measuring can be inseparabler, and the effect of sheltering from to light can be better. Simultaneously, what electrically conductive pressure head imitate is people's finger, consequently, sets up electrically conductive pressure head into the elastomer that has certain compliance, and the emulation nature also can be stronger, and the measuring result can be more reliable.
In view of the high similarity of the conductive rubber to the fingers, the present embodiment preferably uses the conductive rubber as the conductive indenter. In practical application, other elastic bodies without conductivity can be selected as the conductive pressure head, and in this case, the purpose of conductivity can be achieved by plating a layer of metal on the surface of the elastic bodies. For example, a layer of copper sheet can be adhered to the surface of common rubber.
This embodiment is for first embodiment, and the electrically conductive pressure head that sets up the chip test head is the elastomer, has strengthened electrically conductive pressure head and the laminating effect of the fingerprint chip that awaits measuring, helps further improving shading effect, makes measuring result more reliable.
The third embodiment of the present application relates to a chip testing apparatus. As shown in fig. 4, the chip testing apparatus includes the chip testing head described in the above embodiment, a first driving mechanism 7 connected to the housing 1 of the chip testing head and used for pushing the chip testing head to move, and a second driving mechanism 8 connected to the conductive indenter 3 of the chip testing head and used for pushing the conductive indenter 3 to move.
Specifically, the first drive mechanism 7 includes a crossbar 71 and a first actuator 72 connected to the crossbar 71. The chip testing head is fixed on the cross bar 71 by using a positioning column or a screw to penetrate through a mounting hole on the skirt edge at the top end of the shell 1. When the chip is tested, the first driver 72 can be started first to push the whole of the cross rod 71 and the chip testing head to move towards the direction of the fingerprint chip 5 to be tested until the bottom end of the chip testing head butts against the fingerprint chip 5 to be tested.
It is worth mentioning that when the fingerprint chip 5 to be detected is placed, the optical sensing area of the fingerprint chip 5 to be detected can be kept opposite to the hollow channel 2. When the bottom end of the chip testing head is abutted against the fingerprint chip 5 to be tested, the optical sensing area can be arranged in the hollow channel 2. At this moment, a sealed space for isolating the ambient light is formed among the conductive pressure head 3, the inner wall 4 of the shell and the fingerprint chip 5 to be detected, so that the fingerprint chip 5 to be detected is in an independent light path. The situation meets the test requirement of optical performance and the test requirement of the situation that the fingerprint chip to be tested is not pressed.
After the current optical data and fingerprint data are collected, the second driving mechanism 8 can be started, the conductive pressure head 3 is pushed to move towards the direction of the fingerprint chip 5 to be detected until the conductive pressure head 3 is attached to the surface of the fingerprint chip 5 to be detected. At this moment, the optical sensing area of the fingerprint chip 5 to be measured is shielded by the conductive pressure head 3, and the light source of the fingerprint chip 5 to be measured is isolated. The situation can be used for fingerprint pressing test and also meets optical shading (the light of the chip is shaded on the basis of isolating the ambient light) test.
After the current optical data and fingerprint data are collected, the chip testing head can be driven by the first driving mechanism 7 to move towards the direction deviating from the fingerprint testing chip 5.
In this embodiment, the first driver 72 and the second driving mechanism 8 may be motors or air cylinders.
Compared with the prior art, the embodiment provides the chip testing device, the chip testing device can integrate the fingerprint detection performance test and the optical performance measurement of the fingerprint chip, and is beneficial to simplifying the flow of mass production test of the fingerprint chip, improving the efficiency of mass production test and reducing the cost.
The fourth embodiment of the application relates to a testing method of a fingerprint chip. The test method employs the chip test apparatus of the third embodiment. The specific flow is shown in fig. 5:
step 501: the chip testing head is pushed by the first driving device to move towards the direction of the fingerprint chip to be tested until the chip testing head is arranged on the fingerprint chip to be tested.
The embodiment can set the position of each fingerprint chip to be tested in advance according to the position of each chip testing head, so that the optical sensing area of each fingerprint chip to be tested is opposite to the hollow channel of the chip testing head. Therefore, when the chip testing head moves to the fingerprint chip to be tested, the optical sensing area of the fingerprint chip to be tested falls into the range wrapped by the hollow channel, and the purpose of isolating ambient light is achieved.
It is worth mentioning that in the process of pushing the chip testing head to move through the first driving device, it is further ensured that the conductive pressure head located in the hollow channel is not pushed by external force at the moment, and a gap exists between the conductive pressure head and the bottom end of the shell of the chip testing head. Like this, when the chip test head removed to the fingerprint chip that awaits measuring on, when the casing bottom of chip test head was conflicted the fingerprint chip surface promptly, the electrically conductive pressure head will have the clearance with the optical sensing region of the fingerprint chip that awaits measuring between, and the inner wall of electrically conductive pressure head, casing and the fingerprint chip that awaits measuring will form the confined space of isolated ambient light between the fingerprint chip that awaits measuring, and the fingerprint chip that awaits measuring should be can be shaped at independent light path in this confined space, satisfies the demand of optical performance test.
Step 502: the method comprises the steps of collecting first optical data and first fingerprint data of a fingerprint chip to be detected.
The first optical data is the optical data corresponding to the fingerprint chip to be measured under the condition of isolating the ambient light. The first fingerprint data is the fingerprint data corresponding to the fingerprint chip to be detected when the fingerprint chip to be detected is not pressed.
Step 503: and pushing the conductive pressure head to the surface of the fingerprint chip to be detected through the second driving device.
When the optical sensing area for maintaining the fingerprint chip to be detected is arranged in the hollow channel, the conductive pressure head is moved towards the direction of the fingerprint chip to be detected until the conductive pressure head is attached to the surface of the fingerprint chip to be detected. At the moment, the optical sensing area of the fingerprint chip to be tested is shielded by the conductive pressure head, so that the aim of shielding the light of the fingerprint chip to be tested is fulfilled, the shading (shielding the light of the chip on the basis of isolating the ambient light) test is met, and the fingerprint pressing test is also met.
Step 504: and collecting second optical data and second fingerprint data of the fingerprint chip to be detected.
The second optical data is the optical data corresponding to the fingerprint chip to be tested under the condition of isolating the ambient light and the self light. The second fingerprint data is the fingerprint data corresponding to the fingerprint chip to be detected when the fingerprint chip to be detected is pressed.
Step 505: analyzing the first optical data and the second optical data to obtain the optical performance of the fingerprint chip to be detected; and analyzing the first fingerprint data and the second fingerprint data to obtain the fingerprint detection performance of the fingerprint chip to be detected.
It is worth mentioning that after the first optical data, the second optical data, and the first fingerprint data and the second fingerprint data are obtained, the chip test head disposed on the fingerprint chip can be removed by the first driving device.
Compared with the prior art, the optical performance test and the fingerprint detection performance test of the fingerprint chip are completed on one station, so that the flow of mass production test of the fingerprint chip is simplified, the efficiency of mass production test is improved, and the cost is reduced.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the present application, and that various changes in form and details may be made therein without departing from the spirit and scope of the present application in practice.
Claims (8)
1. The chip testing head is characterized by comprising an opaque shell and an opaque conductive pressure head;
the shell is provided with a hollow channel penetrating through the bottom end of the shell, and the conductive pressure head is arranged in the hollow channel and is in close contact with the inner wall of the shell;
the conductive pressure head moves towards the bottom end along the hollow channel when being pressed so as to test the chip at the bottom end;
the surface of the conductive pressure head facing the chip and the inner wall of the shell are rough surfaces, or diffuse reflection films are attached to the surface of the conductive pressure head facing the chip and the inner wall of the shell.
2. The chip test head according to claim 1, wherein the conductive indenter is an elastomer.
3. The chip test head according to claim 2, wherein the elastomer is a conductive rubber.
4. The chip testing head according to claim 1, wherein a skirt extends from a top end of said housing; and a plurality of mounting holes are formed in the skirt edge.
5. A chip testing apparatus, comprising the chip testing head according to any one of claims 1 to 4, a first driving mechanism connected to a housing of the chip testing head for driving the chip testing head to move, and a second driving mechanism connected to the conductive indenter of the chip testing head for driving the conductive indenter to move.
6. The chip testing apparatus according to claim 5, wherein the first driving mechanism comprises a cross bar and a first driver connected to the cross bar;
the shell of the chip testing head is fixed on the cross rod.
7. The chip testing apparatus according to claim 6, wherein the first driver is an air cylinder or a motor.
8. A method for testing a fingerprint chip, wherein the chip testing apparatus of claim 5 is applied, the method comprising:
pushing a chip testing head to move towards the direction of a fingerprint chip to be tested through a first driving device until the chip testing head is placed on the fingerprint chip to be tested; the optical sensing area of the fingerprint chip to be detected is positioned in the hollow channel, and a gap is formed between the optical sensing area and the conductive pressure head;
collecting first optical data and first fingerprint data of the fingerprint chip to be detected;
pushing the conductive pressure head to the surface of the fingerprint chip to be detected through a second driving device;
collecting second optical data and second fingerprint data of the fingerprint chip to be detected;
analyzing the first optical data and the second optical data to obtain the optical performance of the fingerprint chip to be detected; and analyzing the first fingerprint data and the second fingerprint data to obtain the fingerprint detection performance of the fingerprint chip to be detected.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2017/087211 WO2018223268A1 (en) | 2017-06-05 | 2017-06-05 | Chip testing probe, chip testing device, and testing method |
Publications (2)
| Publication Number | Publication Date |
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| CN107454938A CN107454938A (en) | 2017-12-08 |
| CN107454938B true CN107454938B (en) | 2021-06-25 |
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| CN201780000491.1A Active CN107454938B (en) | 2017-06-05 | 2017-06-05 | Chip testing head, chip testing device and testing method |
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| CN (1) | CN107454938B (en) |
| WO (1) | WO2018223268A1 (en) |
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Also Published As
| Publication number | Publication date |
|---|---|
| WO2018223268A1 (en) | 2018-12-13 |
| CN107454938A (en) | 2017-12-08 |
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