TW201809668A - A physiological parameter measurement module - Google Patents

A physiological parameter measurement module Download PDF

Info

Publication number
TW201809668A
TW201809668A TW105129876A TW105129876A TW201809668A TW 201809668 A TW201809668 A TW 201809668A TW 105129876 A TW105129876 A TW 105129876A TW 105129876 A TW105129876 A TW 105129876A TW 201809668 A TW201809668 A TW 201809668A
Authority
TW
Taiwan
Prior art keywords
conductive
test strip
test piece
reading device
elements
Prior art date
Application number
TW105129876A
Other languages
Chinese (zh)
Other versions
TWI607217B (en
Inventor
黃椿木
陳明達
劉凍樑
Original Assignee
華廣生技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 華廣生技股份有限公司 filed Critical 華廣生技股份有限公司
Priority to TW105129876A priority Critical patent/TWI607217B/en
Application granted granted Critical
Publication of TWI607217B publication Critical patent/TWI607217B/en
Publication of TW201809668A publication Critical patent/TW201809668A/en

Links

Abstract

A test strip reader is provided, including a module upper body having a plural of test strip placement portions and a plural of operating holes, the plural of operating holes deposes a plural of first operating stroke element; a circuit board having a plural of holes matching the operating holes to allow each of the plural of operating stroke elements moving through the plural of holes and the plural of operating holes, and the annular space around the plural of holes on the bottom side of the circuit board having a plural of conductive area; a plural of module bottom body deposing a plural of second operating stroke elements, the state of contact or the noncontact of each of the plural of second operating stroke elements with each of the plural of conductive area determines a reading signal.

Description

一種分析物量測模組 Analyte measurement module

本發明關於一種試片編碼讀取裝置,特別是關於一種具有彈力元件可用以讀取編碼的試片編碼讀取裝置。 The present invention relates to a test strip code reading apparatus, and more particularly to a test strip code reading apparatus having an elastic element for reading code.

用來量測生理參數(例如血糖濃度、膽固醇數值、尿酸濃度或酸鹼值)的裝置可以透過取樣後的試片來獲取樣品,以利於在預設的裝置條件下執行量測。有些分析物量測裝置能夠讀取不同類型的試片,為了讓分析物量測裝置增加或確認能夠分辨試片的類型,或是達到防偽的功效,可以在試片的某個部位製作編碼區,例如,在試片上的某個部位製作深淺不同的孔洞,分析物量測裝置在讀取試片中的樣品之前先對這些孔洞進行解碼,以辨別試片的類型,協助試片樣品讀取模組選擇適當的試驗配置,同時可以兼具防偽的功能。 The device for measuring physiological parameters (such as blood glucose concentration, cholesterol value, uric acid concentration, or pH value) can be sampled through the sampled sample to facilitate measurement under preset device conditions. Some analyte measuring devices can read different types of test pieces. In order to allow the analyte measuring device to increase or confirm the type of the test piece, or to achieve the anti-counterfeiting effect, a coding area can be made in a certain part of the test piece. For example, a hole of different depth is formed in a certain part of the test piece, and the analyte measuring device decodes the hole before reading the sample in the test piece to identify the type of the test piece and assist in reading the sample piece. The module selects the appropriate test configuration and can also have the function of anti-counterfeiting.

這種利用機械方式讀取編碼的模組還存有一些實際應用於儀器生產組裝方面的問題,例如,多個元件的組合使得尺寸公差的掌控不易。如第1圖所示,習知的分析物量測裝置外殼的上蓋101在成型時已包含一試片插槽的上部結構104,只需再將配置有試片讀取模組100的電路板103和背蓋102等零件一一組裝上去,所述的上蓋101和模組本體140就共同形成試片插槽空間。但此種組裝方式容易隨著分析物量測裝置外殼與讀取模組射出成形的公差影響,造成元件組裝後常需要重工以調整試片承靠面的高度差問題,因為無法精準判別試片編碼而造成的量測錯誤發生。 Such modules that utilize mechanical read coding also have some problems that are actually applied to the assembly of the instrument. For example, the combination of multiple components makes the control of dimensional tolerances difficult. As shown in FIG. 1 , the upper cover 101 of the conventional analyte measuring device housing already includes the upper structure 104 of the test strip slot during molding, and only the circuit board on which the test strip reading module 100 is disposed is required. The components such as the 103 and the back cover 102 are assembled one by one, and the upper cover 101 and the module body 140 together form a test strip slot space. However, this type of assembly is easily affected by the tolerances of the analyte measuring device housing and the reading module for injection molding, which often requires rework to adjust the height difference of the bearing surface of the test piece after assembly, because the test piece cannot be accurately discriminated. A measurement error caused by the encoding occurs.

另一方面,試片讀取模組所量測的試片帶有檢體樣本,在試 片插入試片讀取模組及檢測過程中,若檢體樣本不慎進入分析物量測裝置或生理參數量測裝置之內部,可能造成試片讀取模組沾染檢體樣本,影響試片讀取模組內電子元件的功能而造成檢測不準確,因此也急需提供改善方法以解決檢體樣本汙染問題。 On the other hand, the test piece measured by the test strip reading module has a sample of the sample, which is being tested. During the insertion of the slice reading module and the detection process, if the sample sample accidentally enters the inside of the analyte measuring device or the physiological parameter measuring device, the sample reading module may contaminate the sample sample and affect the test piece. The function of reading the electronic components in the module causes inaccurate detection, so it is urgent to provide an improvement method to solve the contamination problem of the sample sample.

另外,當欲將試片讀取模組100應用到手持裝置如手機、個人數位助理(PDA)等裝置,以提供使用者即時及方便的量測時,先前技術的該試片讀取模組100的外型及高度顯然無法符合手持裝置強調輕薄短小的造型特色。因此,本發明提出一種模組化薄型的試片讀取裝置,以滿足該試片讀取模組應用在手持裝置時所具備的功能及配合手持裝置機構外形的需求。 In addition, when the test strip reading module 100 is to be applied to a handheld device such as a mobile phone or a personal digital assistant (PDA) to provide an immediate and convenient measurement by the user, the test strip reading module of the prior art. The appearance and height of the 100 obviously cannot match the characteristics of the handheld device that emphasizes lightness and shortness. Therefore, the present invention provides a modular thin test strip reading device that satisfies the functions of the test strip reading module when applied to the handheld device and the needs of the shape of the handheld device mechanism.

為了能夠克服習知機械式編碼讀取模組所存在的問題,特別是要能兼顧判讀的正確性、防制汙染及提升組裝便利性的功效。為了達成本發明的目的,本發明提出一種試片讀取裝置,包含一模組上蓋體,設有至少一試片承靠端以及複數操作孔,該複數操作孔可置入複數第一操作行程組件;一電路板,具複數穿孔搭配該複數操作孔,供各該複數第一操作行程組件於各該複數操作孔及各該複數穿孔之間移動,該電路板底部的該複數穿孔周邊設有複數導電區;以及一模組下蓋體,設置有複數第二操作行程組件,各該複數第二操作行程組件與各該導電區之接觸與分離狀態決定一讀取訊號。 In order to overcome the problems of the conventional mechanical code reading module, in particular, it is necessary to take into consideration the correctness of the interpretation, the prevention of pollution and the improvement of assembly convenience. In order to achieve the object of the present invention, the present invention provides a test strip reading device comprising a module upper cover body, at least one test piece bearing end and a plurality of operation holes, wherein the plurality of operation holes can be placed into the plurality of first operation strokes a circuit board having a plurality of perforations and a plurality of operation holes for moving between the plurality of first operation stroke assemblies between each of the plurality of operation holes and each of the plurality of perforations, wherein the plurality of perforations at the bottom of the circuit board are provided a plurality of conductive regions; and a module lower cover body provided with a plurality of second operation stroke assemblies, wherein the contact and separation states of the plurality of second operation stroke assemblies and the conductive regions determine a read signal.

依據本發明的另一觀點為一種試片讀取裝置以容納一試片,包含一模組上蓋體,設有至少一試片承靠端,包含複數操作孔,可置入複數導電元件以及複數第一操作行程組件;一電路板,具複數穿孔搭配該複數操作孔,供該複數導電元件於該複數穿孔與該複數操作孔之間移動,該電路板底部的各該複數穿孔周邊設有複數導電區;以及一模組下蓋 體,設置有複數第二操作行程組件,其中各該複數導電元件與該導電區之接觸與分離狀態決定一讀取訊號。 Another aspect of the present invention is a test strip reading apparatus for accommodating a test piece, comprising a module upper cover body, at least one test piece bearing end, including a plurality of operation holes, a plurality of conductive elements and a plurality of conductive elements a first operation stroke component; a circuit board having a plurality of perforations coupled to the plurality of operation holes for moving the plurality of conductive elements between the plurality of perforations and the plurality of operation holes, wherein each of the plurality of perforations at the bottom of the circuit board is provided with a plurality of Conductive zone; and a module lower cover The body is provided with a plurality of second operating stroke assemblies, wherein the contact and separation states of the plurality of conductive elements and the conductive region determine a read signal.

依據本發明又一觀點為提供一生物檢測系統,包含一試片讀取裝置,包含一試片上承靠端、一試片下承靠端,其中該試片上承靠端及該試片下承靠端之間形成一高度落差以容納一試片,該試片上承靠端及該試片下承靠端與該試片讀取裝置一體成型;一上蓋,設置於該試片讀取裝置上方,可選擇性地遮蔽該試片上承靠端的一頂面;以及一下蓋,設置於該試片讀取裝置下方,以遮蔽該試片讀取裝置的一底面。 According to still another aspect of the present invention, a biological detection system includes a test piece reading device including a test piece upper end and a test piece lower end, wherein the test piece upper end and the test piece are supported Forming a height drop between the ends to accommodate a test piece, the upper end of the test piece and the lower bearing end of the test piece are integrally formed with the test piece reading device; an upper cover is disposed above the test piece reading device a top surface of the test piece on the test piece is selectively shielded; and a lower cover is disposed under the test piece reading device to shield a bottom surface of the test piece reading device.

100‧‧‧試片讀取裝置 100‧‧‧ test piece reading device

101,201‧‧‧前蓋 101,201‧‧‧ front cover

102,202‧‧‧後蓋 102,202‧‧‧Back cover

203‧‧‧限位構件 203‧‧‧Limited components

104‧‧‧試片插槽孔 104‧‧‧Test strip slot

210,310‧‧‧試片讀取模組 210,310‧‧‧Test film reading module

120,220,320‧‧‧試片 120,220,320‧‧‧ test strips

222,322‧‧‧孔洞 222,322‧‧‧ holes

224,324‧‧‧凸起部 224,324‧‧‧ bulging

103,253,353‧‧‧電路板 103,253,353‧‧‧ boards

140‧‧‧模組本體 140‧‧‧Module Ontology

242,342‧‧‧操作孔 242,342‧‧‧Operation hole

243,343‧‧‧試片插槽 243,343‧‧‧ test strip slot

250‧‧‧啟動元件 250‧‧‧Starting components

260,360‧‧‧阻隔元件 260,360‧‧‧ Barrier components

270‧‧‧導電元件 270‧‧‧ conductive elements

203‧‧‧限位構件 203‧‧‧Limited components

225‧‧‧啟動高度 225‧‧‧Starting height

226‧‧‧試片插槽高度範圍 226‧‧‧ test strip slot height range

240,340‧‧‧模組上蓋體 240,340‧‧‧Modular upper cover

241,341‧‧‧試片上承靠端 241,341‧‧‧ test piece on the end

244,344‧‧‧試片下承靠端 244,344‧‧‧ test piece under the end

246,346‧‧‧模組下蓋體 246,346‧‧‧Modular lower cover

251,351‧‧‧穿孔 251,351‧‧‧Perforation

254‧‧‧下端 254‧‧‧Bottom

255‧‧‧電觸部 255‧‧‧Electrical contact

258‧‧‧頂面 258‧‧‧ top surface

260,360‧‧‧阻隔元件 260,360‧‧‧ Barrier components

272,372‧‧‧短路突起 272,372‧‧‧ Short circuit protrusion

280,380‧‧‧彈力元件 280,380‧‧‧ resilient components

290,390‧‧‧接地元件 290,390‧‧‧ Grounding components

291,391‧‧‧信號源 291,391‧‧‧Signal source

292,392‧‧‧導電區 292,392‧‧‧ conductive area

293,393‧‧‧導通元件 293,393‧‧‧Connecting components

296‧‧‧螺絲 296‧‧‧ screws

345‧‧‧第一邊壁 345‧‧‧First side wall

350‧‧‧導電元件 350‧‧‧Conductive components

352‧‧‧第一端 352‧‧‧ first end

354‧‧‧第二端 354‧‧‧ second end

356‧‧‧側邊槽 356‧‧‧ side slot

357‧‧‧第一槽壁 357‧‧‧ first slot wall

358‧‧‧第二槽壁 358‧‧‧Second wall

261,361‧‧‧第一阻隔 261,361‧‧‧first barrier

262,362‧‧‧污染物收集部 262,362‧‧‧Contaminant Collection Department

263,363‧‧‧第二阻隔 263,363‧‧‧second barrier

P‧‧‧汙染物 P‧‧‧ pollutants

Vs‧‧‧電子信號 Vs‧‧‧ electronic signal

在審視以下的圖式、實施方式詳細說明以及申請專利範圍之後,可以得見本發明其他的觀點和優點。 Other aspects and advantages of the present invention will be apparent from the description of the appended claims appended claims.

第1圖是先前技術中試片及試片讀取裝置應用於手持裝置的應用示意圖。 Fig. 1 is a schematic view showing the application of the test piece and the test piece reading device in the prior art to a handheld device.

第2A圖是本發明的試片及薄型試片讀取模組應用於手持裝置的示意圖。 Fig. 2A is a schematic view showing the application of the test piece and the thin test piece reading module of the present invention to a hand-held device.

第2B圖是本發明的試片欲插入試片讀取模組的上視示意圖。 Fig. 2B is a top plan view showing the test piece of the present invention to be inserted into the test piece reading module.

第2C圖是本發明第一具體實施例中試片插入試片讀取模組的局部剖面圖。 2C is a partial cross-sectional view showing the test piece insertion test piece reading module in the first embodiment of the present invention.

第2D圖是本發明的試片欲插入試片讀取模組的下視示意圖。 Fig. 2D is a schematic bottom view showing the test piece of the present invention to be inserted into the test piece reading module.

第2E圖是本發明的試片欲插入試片讀取模組的另一下視示意圖。 Fig. 2E is another schematic view showing the test piece of the present invention to be inserted into the test piece reading module.

第2F圖是本發明第二具體實施例中試片插入試片讀取模組的局部剖面圖。 Fig. 2F is a partial cross-sectional view showing the test piece insertion test piece reading module in the second embodiment of the present invention.

第3A圖是本發明第三具體實施例中試片插入試片讀取模組的局部剖面圖。 Fig. 3A is a partial cross-sectional view showing the test piece insertion test piece reading module in the third embodiment of the present invention.

第3B圖是本發明第四具體實施例中試片插入試片讀取模組的局部剖面圖。 Fig. 3B is a partial cross-sectional view showing the test piece insertion test piece reading module in the fourth embodiment of the present invention.

以下提供本發明之試片編碼讀取模組、試片編碼讀取裝置及生物檢測系統的詳細實施例並佐以參考圖式。 Detailed embodiments of the test strip code reading module, the test strip code reading device, and the biological detection system of the present invention are provided below with reference to the drawings.

除了因元件射出成形尺寸之公差,使得元件組合造成困難,並導致試片承靠端高低誤差,而對於試片讀取模組判讀有所影響外,透過組裝所形成的試片讀取模組無法整合在欲擁有相關功能的電子裝置上,此外,過去為解決血液汙染使用的一片式阻隔元件在多個編碼凸起部長期的擠壓下,會因彈性疲乏出現彈力曲度改變的問題,造成試片讀取模組無法正常運作。為改善前述問題,以下提供實施例來解決上述問題。 In addition to the tolerance of the component injection molding size, the component combination is difficult, and the test piece bearing end height and error, and the test piece reading module interpretation has an impact, the test piece reading module formed by the assembly It cannot be integrated on an electronic device that has a related function. In addition, in the past, a one-piece barrier element used for solving blood pollution has a problem of elastic curvature change due to elastic fatigue due to long-term compression of a plurality of coded convex portions. The test strip reading module is not working properly. In order to improve the foregoing problems, embodiments are provided below to solve the above problems.

請參閱第2A圖及第2B圖,其分別為本發明的試片220及薄型試片讀取模組210應用於手持裝置的示意圖及試片220欲插入試片讀取模組210的示意圖。該手持裝置包含試片讀取模組210、前蓋201及後蓋202,其中試片讀取模組210包含一模組上蓋體240、一電路板253、一模組下蓋體246,而模組上蓋體240具一試片插槽243用以接收該試片220,以進行樣本的生理參數量測,其中手持裝置的前蓋201與後蓋組裝後,前蓋201可選擇性地完全遮蔽或部分遮蔽試片讀取模組的模組上蓋體240,用以修飾手持裝置正面外觀,而電路板253可以是印刷電路板(PCB),但不限於此。 Please refer to FIG. 2A and FIG. 2B , which are schematic diagrams showing the application of the test strip 220 and the thin test strip reading module 210 of the present invention to the handheld device and the test strip 220 to be inserted into the test strip reading module 210 . The handheld device includes a test strip reading module 210, a front cover 201 and a rear cover 202. The test strip reading module 210 includes a module upper cover 240, a circuit board 253, and a module lower cover 246. The module upper cover 240 has a test strip slot 243 for receiving the test strip 220 for performing physiological parameter measurement of the sample. After the front cover 201 and the back cover of the handheld device are assembled, the front cover 201 can be selectively and completely The module upper cover 240 of the test strip reading module is shielded or partially shielded for modifying the front appearance of the handheld device, and the circuit board 253 may be a printed circuit board (PCB), but is not limited thereto.

請參閱第2C圖,其為本發明第一具體實施例中試片插入試片讀取模組210的局部剖面圖,其中本發明的試片讀取模組210包含一具試片插槽的模組上蓋體240、一電路板253、一模組下蓋體246。 Please refer to FIG. 2C , which is a partial cross-sectional view of the test strip insertion test module reading module 210 according to the first embodiment of the present invention, wherein the test strip reading module 210 of the present invention includes a test strip slot. The module upper cover body 240, a circuit board 253, and a module lower cover body 246.

如第2C圖所示,試片插槽243與模組上蓋體240一體成型,且該試片插槽243內定義出試片上承靠端241與試片下承靠端244,該兩承靠端界定一高度以容納試片220,使得試片220插入的高度可以在射出成模組上蓋體240時決定,亦即透過單一物件上進行試片220插入高度管控,而該高度係兩承靠端界定出一試片插槽高度,該試片插槽高度範圍226可定義為一試片厚度加上一適當間隙,如第2C圖所示,當試片厚度為1.0mm,下承靠端與試片底面的間隙設為0.05~0.5mm,故適當試片插槽高度 範圍226則約為1.05mm~1.5mm。 As shown in FIG. 2C, the test strip slot 243 is integrally formed with the module upper cover body 240, and the test piece upper end 241 and the test piece lower bearing end 244 are defined in the test strip slot 243, and the two bearers are supported. The height defines a height to accommodate the test piece 220, so that the height at which the test piece 220 is inserted can be determined when the module cover body 240 is ejected, that is, the test piece 220 is inserted into the height control through a single object, and the height is supported by the height. The end defines a test piece slot height, and the test piece slot height range 226 can be defined as a test piece thickness plus a suitable gap, as shown in FIG. 2C, when the test piece thickness is 1.0 mm, the lower bearing end The gap with the bottom surface of the test piece is set to 0.05~0.5mm, so the appropriate test piece slot height The range 226 is approximately 1.05 mm to 1.5 mm.

模組上蓋體240內包含第一操作行程組件,而第一操作行程組件包含啟動元件250、阻隔元件260以及可容納啟動元件250的操作孔242,模組下蓋體246內則包含第二操作行程組件,其中第二操作行程組件包含導電元件270、彈力元件280以及位於該下蓋體246底部的一接地元件290。該電路板253上配置一導電區292與發出電子信號Vs信號源291的電性連接。 The module upper cover 240 includes a first operational stroke assembly, and the first operational stroke assembly includes an activation element 250, a barrier element 260, and an operation aperture 242 that can receive the activation element 250. The module lower cover body 246 includes a second operation. The stroke assembly, wherein the second operational stroke assembly includes a conductive element 270, an elastic element 280, and a grounding element 290 at the bottom of the lower cover 246. The circuit board 253 is provided with a conductive region 292 electrically connected to the signal source 291 for emitting the electronic signal Vs.

在本具體實施例中,電路板253設置於模組上蓋體240與模組下蓋體246之間的位置,使試片讀取模組210的整體厚度相較於圖1中透過組裝形成約11~12mm的試片讀取模組,約可降低2~3mm的模組厚度,本具體實施例藉由調整元件間的堆疊順序,使得試片讀取模組210相較於習知技術的試片讀取模組更為輕薄。而每個操作孔242所配置的阻隔元件260為獨立運作,因此不會對相鄰或其他操作孔242所配置的阻隔元件260的運作造成干涉。 In the embodiment, the circuit board 253 is disposed at a position between the module upper cover 240 and the module lower cover 246, so that the overall thickness of the test strip reading module 210 is formed by the transmission assembly of FIG. The test piece reading module of 11~12mm can reduce the thickness of the module by about 2~3mm. In this embodiment, by adjusting the stacking order between components, the test piece reading module 210 is compared with the prior art. The test strip reading module is lighter and thinner. The barrier element 260, which is disposed in each of the operation holes 242, operates independently, and thus does not interfere with the operation of the barrier element 260 disposed adjacent or other operation holes 242.

本發明所使用的彈力元件280並不限於彈簧,其他可提供彈力的元件諸如金屬彈片、金屬簧片(metal dome)都可適用。導電元件270可為柱型、球型元件,但不限定為其他形狀態樣,材質可為金屬材質,例如鋼材。阻隔元件260為一彈性元件,可為橡膠、矽膠材質。在該電路板253上,配置複數個穿孔251與操作孔242匹配,以容納複數個阻隔元件260於其中作動,該電路板253上相對於該複數個穿孔251的周圍,亦配置複數個導電區292。在試片220插入時,複數個阻隔元件260依試片220的孔洞222的編碼設計而穿過該複數個穿孔251上下活動。 The elastic member 280 used in the present invention is not limited to a spring, and other elastic-providing members such as a metal dome and a metal dome are applicable. The conductive element 270 can be a cylindrical or spherical element, but is not limited to other shapes. The material can be a metal material such as steel. The barrier element 260 is an elastic component and can be made of rubber or silicone. On the circuit board 253, a plurality of through holes 251 are arranged to match the operation holes 242 to accommodate a plurality of blocking elements 260, and a plurality of conductive areas are disposed on the circuit board 253 with respect to the periphery of the plurality of through holes 251. 292. When the test strip 220 is inserted, the plurality of barrier elements 260 move up and down through the plurality of perforations 251 according to the coding design of the holes 222 of the test strip 220.

當試片220未插入試片讀取模組210時,彈力元件280頂住導電元件270的下端254,將導電元件270向上方推擠,短路突起272的一頂面258配置以因應彈力元件280之推擠而接觸電路板253的導電區292, 因此電子信號Vs可以經電路板253的導電區292到導電元件270,並透過彈力元件280而與接地元件290構成導電狀態,構成的路徑一路電連接到接地端,第2D圖為試片讀取模組的下視示意圖,顯示出導電區292在試片讀取模組210的位置,第2E圖為在第2D圖所顯示的試片讀取模組上增加模組下蓋體246的示意圖,模組下蓋體246以螺絲296固定在電路板253上。 When the test strip 220 is not inserted into the test strip reading module 210, the elastic element 280 bears against the lower end 254 of the conductive element 270, pushing the conductive element 270 upward, and a top surface 258 of the short-circuiting protrusion 272 is configured to respond to the elastic element 280. Pushing to contact the conductive region 292 of the circuit board 253, Therefore, the electronic signal Vs can pass through the conductive region 292 of the circuit board 253 to the conductive member 270 and form a conductive state with the ground member 290 through the elastic member 280, and the formed path is electrically connected to the ground end, and the 2D picture is the test piece reading. The bottom view of the module shows the position of the conductive area 292 in the test strip reading module 210, and the second E is a schematic diagram of adding the lower cover body 246 to the test strip reading module shown in the second drawing. The module lower cover 246 is fixed to the circuit board 253 by screws 296.

如果電子信號Vs是一電壓,則上述的迴路將形成電流。在另一實施方式中,發出電子信號Vs的信號源291可以配置於電路板253上。如第2C圖左側操作孔242所示,試片220插入試片讀取模組210後,當啟動元件250對應到不含凸起部224的孔洞222時,啟動元件250未受到擠壓,導電元件270依然與電路板253的導電區292接觸而構成導電狀態,可被判讀為第一編碼訊號。 If the electronic signal Vs is a voltage, the above loop will form a current. In another embodiment, the signal source 291 that emits the electronic signal Vs may be disposed on the circuit board 253. As shown in the left operation hole 242 of FIG. 2C, after the test piece 220 is inserted into the test piece reading module 210, when the starting element 250 corresponds to the hole 222 without the convex portion 224, the starting element 250 is not pressed, and is electrically conductive. The component 270 is still in contact with the conductive region 292 of the circuit board 253 to form a conductive state, which can be interpreted as a first encoded signal.

如第2C圖右側操作孔242所示,當啟動元件250對應到試片220的凸起部224而受擠壓時,操作孔242中啟動元件250的位置向下擠壓阻隔元件260,進而使得導電元件270的短路突起272的頂面258與電路板253的導電區292構成斷路的狀態,來自信號源291的電子信號Vs無法傳送到接地端,所以沒有形成迴路以形成電流,則被判讀為第二編碼訊號。此外,啟動元件250受到凸起部224被擠壓的啟動高度225約為0.4mm~0.8mm之間,幫助第一操作行程組件以及第二操作行程組件的作動能夠有效執行。換句話說,當試片220配置於試片讀取模組210上方時,上述無電流的狀態也就意謂著孔洞222之中存在有凸起部224,這也可以用作是對於試片220上孔洞密碼的解讀。 As shown in the right operation hole 242 of FIG. 2C, when the activation member 250 is pressed corresponding to the convex portion 224 of the test piece 220, the position of the activation member 250 in the operation hole 242 presses the barrier member 260 downward, thereby making The top surface 258 of the short-circuit protrusion 272 of the conductive element 270 and the conductive region 292 of the circuit board 253 form a disconnected state, and the electronic signal Vs from the signal source 291 cannot be transmitted to the ground, so that no loop is formed to form a current, and it is interpreted as The second coded signal. In addition, the starting height 225 of the actuating element 250 that is squeezed by the raised portion 224 is between about 0.4 mm and 0.8 mm, which facilitates the actuation of the first operational stroke assembly and the second operational stroke assembly. In other words, when the test strip 220 is disposed above the test strip reading module 210, the current-free state means that the convex portion 224 is present in the hole 222, which can also be used as a test strip. Interpretation of the hole password on 220.

因此本領域具有通常知識的人士可以了解本發明的試片讀取裝置的密碼讀取原理,在另一實施方式中,將試片孔洞222存在有凸起部224的地方設計為導電的狀態,而未存在凸起部224的地方則設計為斷 路。透過以上具體實施例的配置方式,可依據來自信號源291的電子信號Vs構成電流與否,而能夠解讀或辨識試片220上單一孔洞的編碼。以二位元編碼為例,其中一種編碼狀態代表0,則另一種編碼狀態代表1;反之亦然。 Therefore, those skilled in the art can understand the principle of password reading of the test strip reading device of the present invention. In another embodiment, the portion of the test strip hole 222 where the convex portion 224 is present is designed to be electrically conductive. Where the raised portion 224 is not present, it is designed to be broken. road. Through the configuration of the above specific embodiment, the current can be formed according to the electronic signal Vs from the signal source 291, and the code of the single hole on the test strip 220 can be interpreted or recognized. Taking a two-bit encoding as an example, one of the encoding states represents 0, and the other encoding state represents 1; vice versa.

在本具體實施例中,請參考第2B圖,試片讀取模組210更包含一電觸部255,可與試片220上的電極進行電連接,且電觸部255由兩個電觸點形成。當試片220插入試片插槽243時,試片220上的工作電極與對電極與兩個觸點進行電接觸,其中電觸部的材質較佳為黃金材質,對應的試片電極材料較佳為黃金材質,例如Rightest® Blood test strip使用材料,使得試片產生的電流有較佳的穩定性與傳導性。試片220不限於凹洞形狀的設計,其可為其他設計選擇,例如一凸塊、一鋸齒、一排齒、一切縫、一凹槽及一通孔其中之一,並與試片讀取模組210進行組配作動。 In this embodiment, referring to FIG. 2B, the test strip reading module 210 further includes an electrical contact portion 255 electrically connected to the electrodes on the test strip 220, and the electrical contact portion 255 is electrically contacted by two contacts. Point formation. When the test strip 220 is inserted into the test strip slot 243, the working electrode and the counter electrode on the test strip 220 are in electrical contact with the two contacts, wherein the material of the electric contact portion is preferably made of gold material, and the corresponding electrode material of the test strip is compared. Good for gold materials, such as the Righttest® Blood test strip, allows the current produced by the test strip to have better stability and conductivity. The test piece 220 is not limited to the design of the concave shape, and may be other design choices, such as one of a bump, a saw tooth, a row of teeth, a slit, a groove and a through hole, and the test piece is read with the test piece. Group 210 performs a combination of actions.

請參閱第2F圖,其為本發明第二具體實施例中試片插入試片讀取模組210的局部剖面圖。第2F圖是以第2C圖為基礎的局部改良,且第2F圖沿用與第2C圖一樣的元件符號。第2F圖相較於第2C圖的差異在於,第2F的第二具體實施例可進一步降低讀取模組210的高度。其中接地元件290與導電區292配置在電路板253上,因此原本配置於模組下蓋體246底部的接地元件290可以被移除,使得試片讀取模組210的高度降低,且該彈力元件280可以是具導電性或不具導電性的任何有彈力之材料所形成。 Please refer to FIG. 2F, which is a partial cross-sectional view of the test strip insertion test strip reading module 210 in the second embodiment of the present invention. The 2Fth diagram is a partial improvement based on the 2Cth diagram, and the 2Fth diagram is the same as the 2C diagram. The difference between the 2F map and the 2C map is that the second embodiment of the 2F can further reduce the height of the reading module 210. The grounding component 290 and the conductive region 292 are disposed on the circuit board 253. Therefore, the grounding component 290 originally disposed at the bottom of the module lower cover 246 can be removed, so that the height of the test strip reading module 210 is reduced, and the elastic force is reduced. Element 280 can be formed of any resilient material that is electrically conductive or non-conductive.

如前所述,在電路板253上,配置複數個穿孔251與操作孔242匹配,以容納各對應的複數個阻隔元件260於該複數個穿孔251內上下活動,原本的接地元件290改為設置於電路板253上的導通元件293完成接地元件290的任務,導通元件293設置於穿孔251的周圍而相對於導電元件270之第一側,導電區292則設置於於電路板253上穿孔251的周圍 且相對於各導電元件270之穿孔251的第二側。因此,各該導通元件293與導電區292分別配置於電路板253的穿孔251周圍且相對於導電元件270之穿孔251兩側以產生電性隔離,其所擁有的效果與第一實施例中的接地元件290及導電區292相同。在本具體實施例中,當試片220未插入時,彈力元件280頂住導電元件270的下端254,將導電元件270向上方推擠,使得電路板253上的導電區292與導通元件293接觸形成短路,因此電子信號Vs透過導電元件270使電路板253的導電區292與導通元件293接觸,而構成導電狀態及形成迴路。 As described above, on the circuit board 253, a plurality of through holes 251 are arranged to match the operation holes 242 to accommodate the corresponding plurality of blocking elements 260 to move up and down in the plurality of through holes 251, and the original grounding element 290 is set to be set. The conducting component 293 on the circuit board 253 completes the task of the grounding component 290. The conducting component 293 is disposed around the through hole 251 with respect to the first side of the conductive component 270, and the conductive region 292 is disposed on the circuit board 253 with the through hole 251. around And relative to the second side of the perforations 251 of each of the conductive elements 270. Therefore, each of the conductive elements 293 and the conductive regions 292 are respectively disposed around the through holes 251 of the circuit board 253 and are electrically isolated from opposite sides of the through holes 251 of the conductive member 270, and the effect thereof is the same as that in the first embodiment. The grounding element 290 and the conductive region 292 are the same. In the present embodiment, when the test strip 220 is not inserted, the elastic member 280 bears against the lower end 254 of the conductive member 270, pushing the conductive member 270 upward, so that the conductive region 292 on the circuit board 253 is in contact with the conductive member 293. A short circuit is formed, so that the electrical signal Vs contacts the conductive region 292 of the circuit board 253 and the conductive member 293 through the conductive member 270 to form a conductive state and form a loop.

如第2F左側操作孔242所示,當試片220插入且啟動元件250對應到不含凸起部224的試片孔洞222時,啟動元件250未受到擠壓,使導電元件270依然保持當試片220未插入時,導電區292與導通元件293接觸構成導電的狀態,可被判讀為第一編碼訊號;如第2F右側操作孔242所示,當啟動元件250對應到試片220的凸起部224而受擠壓時,操作孔242中啟動元件250的位置向下擠壓阻隔元件260,進而使得導電元件270的一頂面258脫離電路板253,電路板253上的導電區292與導通元件293形成斷路的狀態,因此電子信號Vs與導通元件293構成不導電狀態,可被判讀為第二編碼訊號。各該導通元件293與電路板253上的偵測電路(未示出)電性連接,使各該導通元件293是否與導電區292接觸構成導電的狀態,送至偵測電路以判讀前述的編碼訊號。 As shown in the left operating hole 242 of the 2F, when the test piece 220 is inserted and the starting element 250 corresponds to the test piece hole 222 without the convex portion 224, the starting element 250 is not pressed, so that the conductive element 270 remains tested. When the sheet 220 is not inserted, the conductive region 292 is in contact with the conductive element 293 to form a conductive state, which can be interpreted as a first encoded signal; as shown in the 2F right operating hole 242, when the starting component 250 corresponds to the bump of the test strip 220 When the portion 224 is squeezed, the position of the activation member 250 in the operation hole 242 presses the barrier member 260 downward, so that a top surface 258 of the conductive member 270 is separated from the circuit board 253, and the conductive region 292 on the circuit board 253 is electrically connected. The element 293 is in an open state, so that the electronic signal Vs and the conducting element 293 form a non-conducting state and can be interpreted as a second encoded signal. Each of the conductive elements 293 is electrically connected to a detecting circuit (not shown) on the circuit board 253, such that each of the conductive elements 293 is in contact with the conductive region 292 to form a conductive state, and is sent to the detecting circuit to interpret the foregoing encoding. Signal.

在處理試片讀取模組於使用上常發生的血液或灰塵汙染的問題,本發明提出以下解決方法,但不限於此。 The present invention proposes the following solutions in dealing with the problem of blood or dust contamination which often occurs in the use of the test strip reading module, but is not limited thereto.

如第2C圖所示,當試片插入試片插槽243後,啟動元件250將因應試片上孔洞222的編碼而上下移動,在移動的同時會擠壓到下方的阻隔元件260,阻隔元件再進一步擠壓導電元件270,藉此解讀試片上的編碼,其中阻隔元件包含呈懸臂型的第一阻隔261及平行於邊壁的第二阻隔 263,使得各個啟動元件得以獨立運作,不會受到鄰近的操作孔242中的作動影響,而有錯誤讀碼的情形。此外,第一阻隔261在啟動元件250往下作動時會產生形變,使得啟動元件250在下壓時需要額外的壓力差,讓下方連動的導電元件270作動更加精確,達到準確編碼的目的,另一方面,當外部的汙染物經由操作孔242進入讀取模組時,會被聚集在啟動元件下方兩個呈V型的汙染物收集部262中,而不會直接影響到下層的導電作動方式。 As shown in FIG. 2C, when the test piece is inserted into the test strip slot 243, the actuating element 250 will move up and down in response to the coding of the hole 222 in the test piece, and will move to the lower barrier element 260 while moving, and the blocking element is again The conductive element 270 is further extruded, thereby interpreting the code on the test strip, wherein the barrier element comprises a first barrier 261 of a cantilever type and a second barrier parallel to the side wall 263, so that each of the activation elements can operate independently without being affected by the actuation in the adjacent operation holes 242, and there is a case of erroneous reading. In addition, the first barrier 261 is deformed when the starting element 250 is actuated downward, so that the starting element 250 requires an additional pressure difference when the pressing element is pressed, so that the lower conductive element 270 is more accurately operated to achieve accurate encoding, and the other On the other hand, when external contaminants enter the reading module via the operating hole 242, they are collected in the two V-shaped contaminant collecting portions 262 under the starting element without directly affecting the conductive operation mode of the lower layer.

請參閱第3A圖,為另一個具體實施例,各部位的元件配置及作動原理基本與第2C圖的實施例相似,差異在於利用加長型的導電元件350取代啟動元件150,該導電元件350具有用以接觸試片320之孔洞322的第一端352,以及用以抵頂彈力元件380的第二端354,導電元件350具有較靠近第一端352的第一槽壁357以及相對於第一槽壁357的第二槽壁358。第一槽壁357及第二槽壁358之間的空間為側邊槽356。 Referring to FIG. 3A, for another embodiment, the component arrangement and actuation principle of each portion is substantially similar to the embodiment of FIG. 2C, with the difference that the elongated component 150 is used in place of the activation component 150, the conductive component 350 has a first end 352 for contacting the aperture 322 of the test strip 320, and a second end 354 for abutting the resilient member 380, the conductive element 350 having a first slot wall 357 closer to the first end 352 and relative to the first The second groove wall 358 of the groove wall 357. The space between the first groove wall 357 and the second groove wall 358 is a side groove 356.

如第3A圖左側操作孔342所示,當試片320插入在試片上承靠端341與試片下承靠端344之間所定義的試片插槽343後且導電元件350對應到試片320之孔洞322不含凸起部324時,導電元件350未受到擠壓,使導電元件350的第二槽壁358依然與電路板353上的導電區392接觸,因此電子信號Vs透過導電區392與接地元件390構成導電狀態且形成迴路,而可被判讀為第一編碼訊號;如第3A圖右側操作孔342所示,當導電元件350對應到試片320之凸起部324而受擠壓時,操作孔342中導電元件350的位置向下方移動,進而使得導電元件350的第二槽壁358與該導電區392脫離,使得電子信號Vs與接地元件390構成斷路的狀態。 As shown in the left operation hole 342 of FIG. 3A, when the test piece 320 is inserted into the test piece slot 343 defined between the bearing end 341 and the test piece lower bearing end 344, and the conductive member 350 corresponds to the test piece. When the hole 322 of the 320 does not contain the protrusion 324, the conductive element 350 is not pressed, so that the second groove wall 358 of the conductive element 350 is still in contact with the conductive area 392 on the circuit board 353, so the electronic signal Vs is transmitted through the conductive area 392. Forming a conductive state with the grounding member 390 and forming a loop, which can be interpreted as a first encoded signal; as shown in the right operating hole 342 of FIG. 3A, when the conductive member 350 is pressed against the raised portion 324 of the test strip 320, it is squeezed. At this time, the position of the conductive member 350 in the operation hole 342 moves downward, thereby causing the second groove wall 358 of the conductive member 350 to be separated from the conductive portion 392, so that the electronic signal Vs and the ground member 390 form an open state.

如第3A圖所示,每個操作孔342所配置的阻隔元件360為獨立運作,因此不會對其他操作孔342所配置之阻隔元件360的運作造成干涉。由於阻隔元件360較佳為彈性材質,可以隨著導電元件350的上下 移動而形變,所以和第一槽壁357維持匹配的狀態。然而,由於這時導電元件350與接地元件390之間是在斷路的狀態,來自信號源391的電子信號Vs無法傳送到接地端,所以沒有形成迴路以形成電流,則被判讀為第二編碼訊號。 As shown in FIG. 3A, the barrier elements 360 disposed in each of the operation holes 342 operate independently, and thus do not interfere with the operation of the barrier elements 360 in which the other operation holes 342 are disposed. Since the blocking element 360 is preferably an elastic material, it can follow the upper and lower sides of the conductive element 350. It moves and deforms, so it maintains a matching state with the first groove wall 357. However, since the electronic signal Vs from the signal source 391 cannot be transmitted to the ground terminal when the conductive element 350 and the ground element 390 are in an open state at this time, the loop is not formed to form a current, and is interpreted as the second encoded signal.

當試片320配置於試片讀取模組310上方時,孔洞322中未有凸起部324時為無電流的狀態。因此本領域具有通常知識的人士可以了解本發明的試片讀取裝置的密碼讀取原理,透過以上實施例的配置方式,可依據來自信號源391的電子信號Vs構成電流與否,而能夠解讀或辨識試片320上單一孔洞的編碼。以二位元編碼為例,其中一種編碼狀態代表0,則另一種編碼狀態代表1;反之亦然。 When the test piece 320 is disposed above the test piece reading module 310, the hole 322 is in a state of no current when the convex portion 324 is not present. Therefore, those skilled in the art can understand the principle of password reading of the test strip reading device of the present invention. According to the configuration of the above embodiment, the current can be interpreted according to the electronic signal Vs from the signal source 391. Or identify the code of a single hole on the test strip 320. Taking a two-bit encoding as an example, one of the encoding states represents 0, and the other encoding state represents 1; vice versa.

請參考第3B圖,其為本發明第四具體實施例中試片插入試片讀取模組310的局部剖面圖。第3B圖是以第3A圖為基礎的局部改良,且第3B圖沿用與第3A圖一樣的元件符號。第3B圖相較於第3A圖的差異在於,第3B圖是在該電路板353上同時配置接地元件及導電區392,使得原本配置於該試片讀取模組310底部的接地元件390可以被移除,以進一步降低試片讀取模組310的高度,且該彈力元件380可以是具導電性或不具導電性的任何有彈力之材料所形成。與第2F類似,原本的接地元件390改為導通元件393,設置於電路板353上穿孔351周圍而相對於各導電元件350的短路突起372之第一側,而導電區392形成於電路板353上的穿孔351週圍而相對於短路突起372之第二側。因此,各該導通元件393與導電區392分別配置於電路板353上的穿孔351周圍而相對於短路突起372之兩側以產生電性隔離。 Please refer to FIG. 3B, which is a partial cross-sectional view of the test strip insertion test strip reading module 310 in the fourth embodiment of the present invention. Fig. 3B is a partial improvement based on Fig. 3A, and Fig. 3B is the same as that of Fig. 3A. The difference between FIG. 3B and FIG. 3A is that the grounding element and the conductive region 392 are disposed on the circuit board 353 at the same time, so that the grounding element 390 originally disposed at the bottom of the test strip reading module 310 can be It is removed to further reduce the height of the test strip reading module 310, and the elastic element 380 can be formed of any resilient material that is electrically conductive or non-conductive. Similar to the 2F, the original grounding element 390 is changed to the conducting element 393, disposed on the circuit board 353 around the through hole 351 with respect to the first side of the shorting protrusion 372 of each conductive element 350, and the conductive region 392 is formed on the circuit board 353. The upper perforation 351 is around the second side of the shorting protrusion 372. Therefore, each of the conductive elements 393 and the conductive regions 392 are respectively disposed around the through holes 351 on the circuit board 353 to be electrically isolated from the two sides of the short-circuit protrusions 372.

在本第四具體實施例中,當試片320未插入時,彈力元件380頂住的第二端354,將導電元件350向上方推擠,使得導電區392接與導通元件393接觸形成短路,因此電子信號Vs透過導電元件350使導電區 392與導通元件393接觸而構成導電狀態且形成迴路。如第3B圖左側操作孔342所示,當試片插入且導電元件350對應到不含凸起部324的試片孔洞322時,導電元件350未受到擠壓,使導電元件350依然保持當試片320未插入時,導電區392與導通元件393接觸構成導電的狀態,可被判讀為第一編碼訊號;如第3B圖右側操作孔342所示,當導電元件350對應到試片的凸起部324而受擠壓時,操作孔322中導電元件350的位置向下擠壓阻隔元件360,進而使得導電元件350的第二槽壁358脫離導電區392與導通元件393形成斷路的狀態,因此電子信號Vs與導通元件393構成不導電狀態,可被判讀為第二編碼訊號。各該導通元件393與電路板353上的偵測電路(未示出)電性連接,使各該導通元件393是否與導電區392接觸而構成導電的狀態,送至偵測電路以判讀前述的編碼訊號。 In the fourth embodiment, when the test strip 320 is not inserted, the second end 354 of the elastic element 380 pushes the conductive element 350 upward, so that the conductive area 392 is in contact with the conductive element 393 to form a short circuit. Therefore, the electronic signal Vs transmits the conductive region through the conductive member 350 392 is in contact with the conductive element 393 to form a conductive state and form a loop. As shown in the left operation hole 342 of FIG. 3B, when the test piece is inserted and the conductive member 350 corresponds to the test piece hole 322 which does not include the convex portion 324, the conductive member 350 is not pressed, so that the conductive member 350 remains tested. When the sheet 320 is not inserted, the conductive region 392 is in contact with the conductive member 393 to form a conductive state, which can be interpreted as a first encoded signal; as shown in the right operating hole 342 of FIG. 3B, when the conductive member 350 corresponds to the bump of the test strip When the portion 324 is squeezed, the position of the conductive member 350 in the operating hole 322 presses the blocking member 360 downward, so that the second groove wall 358 of the conductive member 350 is separated from the conductive portion 392 and the conductive member 393 to form an open state. The electronic signal Vs and the conducting element 393 form a non-conducting state and can be interpreted as a second encoded signal. Each of the conductive elements 393 is electrically connected to a detecting circuit (not shown) on the circuit board 353, so that each of the conductive elements 393 is in contact with the conductive region 392 to form a conductive state, and is sent to the detecting circuit to read the foregoing. Coded signal.

為解決過去阻隔元件所帶來的問題以及血液不慎進入生理參數測量裝置內部造成的血汙問題,本發明提出的解決方案如下,但不限於此。 In order to solve the problems caused by the past barrier elements and the blood pollution caused by the inadvertent entry of blood into the physiological parameter measuring device, the solution proposed by the present invention is as follows, but is not limited thereto.

如第3A圖所示,當試片320插入後,該阻隔元件360會隨著導電元件350的上下移動而形變,該阻隔元件360包含第一阻隔361及第二阻隔363,使各別導電元件350之作動可獨立運作,因此不會發生公用阻隔元件時誤壓到鄰近的導電元件而造成錯誤讀碼的情形。且該第一阻隔361使阻隔元件360在被擠壓的過程中需額外壓力差,使第一阻隔361變形,讓連動之導電元件350作動能更加精確,可增進讀碼的準確性。 As shown in FIG. 3A, after the test strip 320 is inserted, the blocking element 360 is deformed as the conductive element 350 moves up and down. The blocking element 360 includes a first barrier 361 and a second barrier 363 to make the respective conductive elements. The operation of the 350 can be operated independently, so that the common blocking element does not accidentally press into the adjacent conductive element to cause an erroneous reading. Moreover, the first barrier 361 causes the barrier element 360 to have an additional pressure difference during the process of being squeezed, so that the first barrier 361 is deformed, so that the interlocking conductive component 350 can be more accurate in motion, thereby improving the accuracy of reading.

如第3A圖所示,改良後的阻隔元件360配置一汙染物收集裝置362,該汙染物收集部362形成於第一阻隔361及第二阻隔363之間,該第二阻隔363貼近並平行於操作孔的第一邊壁345,該污染物收集部362並和該側邊槽356相匹配。如第3A圖顯示,該汙染物收集部362剖面如一口袋般的凹槽,設置於鄰近第一端352處。當有來自試片或是空氣中的污 染物P不慎進入試片讀取模組310,汙染物P會被限制在該汙染物收集部362中,不會往下進入模組下層而影響導電作動方式。 As shown in FIG. 3A, the modified barrier element 360 is configured with a contaminant collection device 362 formed between the first barrier 361 and the second barrier 363, the second barrier 363 being proximate and parallel to The first side wall 345 of the aperture is operated, and the contaminant collection portion 362 is matched to the side slot 356. As shown in FIG. 3A, the contaminant collection portion 362 is sectioned as a pocket-like recess disposed adjacent the first end 352. When there is a stain from the test piece or the air The dye P inadvertently enters the test strip reading module 310, and the contaminant P is confined in the contaminant collecting portion 362, and does not enter the lower layer of the module to affect the conductive operation mode.

第3A圖所示的阻隔元件360與第2C圖的阻隔元件260相較之下,阻隔元件360的第一阻隔361厚度增加且寬度變窄,可使阻隔元件受力更為集中。因此在被擠壓的過程中,連結之導電元件350作動能更加精確,且阻隔元件360同樣包含汙染物收集部362,如第3B圖中顯示的是剖面如口袋般的U型凹槽,本發明的阻隔元件設計態樣不限於其他類似型態。 The barrier element 360 shown in FIG. 3A is compared to the barrier element 260 of FIG. 2C. The thickness of the first barrier 361 of the barrier element 360 is increased and the width is narrowed, so that the barrier element is more concentrated. Therefore, during the process of being squeezed, the connected conductive element 350 is more precise in kinetic energy, and the blocking element 360 also includes a contaminant collecting portion 362. As shown in FIG. 3B, a U-shaped groove having a cross-section such as a pocket is shown. The design of the barrier element of the invention is not limited to other similar types.

請參閱第2A與第2B圖,其為本發明的薄型試片及試片讀取模組應用於手持裝置的示意範例。如前所述,本發明的試片讀取模組210可再連接一通訊模組(未顯示),再將其連接好的兩個模組組裝於手持裝置的前蓋201及後蓋202內,而其前蓋201上緣有一開放的缺口,以容納不同的試片讀取模組210及供其試片插拔。試片讀取模組210並配置試片上承靠端241及試片下承靠端244,並在兩個承靠端之間形成一固定高度的試片插槽243,以容納不同的分析物量測試片。由於試片讀取模組210配置的承靠端已決定出一固定高度的試片插槽243,因而該手持裝置不會因為不同的分析物量測裝置,而需要重新調整試片承靠面的高度。另外,透過一限位構件203的設計來固定試片讀取模組210,進而完成試片讀取模組210的組裝部分。本發明的試片讀取模組210具有能夠量測分析物的功能性元件,體積極小,方便組裝,因此可被選擇性地組裝入不同類型的手持裝置內,使手持裝置能夠具備量測分析物功能並兼具分析物讀值的傳輸功能。若採用第2A圖的分析物量測模組結構,相較於圖1中透過組裝形成的試片讀取模組,其厚度降低約2~3mm。因此,可省下約18~27%的空間來做其他有效的利用。 Please refer to FIGS. 2A and 2B , which are schematic examples of the application of the thin test piece and the test piece reading module of the present invention to a handheld device. As described above, the test strip reading module 210 of the present invention can be further connected to a communication module (not shown), and the two connected modules are assembled in the front cover 201 and the rear cover 202 of the handheld device. The upper edge of the front cover 201 has an open notch to accommodate different test strip reading modules 210 and for inserting and unplugging the test strips. The test strip reading module 210 is configured with the test piece upper bearing end 241 and the test piece lower bearing end 244, and a fixed height test strip slot 243 is formed between the two bearing ends to accommodate different amounts of analyte. Test piece. Since the bearing end of the test strip reading module 210 has determined a fixed height test strip slot 243, the handheld device does not need to re-adjust the test strip bearing surface due to different analyte measuring devices. the height of. In addition, the test strip reading module 210 is fixed by the design of a limiting member 203, and the assembled portion of the test strip reading module 210 is completed. The test strip reading module 210 of the present invention has functional components capable of measuring analytes, which are small in size and easy to assemble, and thus can be selectively assembled into different types of handheld devices, so that the handheld device can be measured. Analyte function and transfer function of analyte readings. If the structure of the analyte measuring module of FIG. 2A is used, the thickness of the test piece reading module formed by the assembly in FIG. 1 is reduced by about 2 to 3 mm. Therefore, about 18 to 27% of the space can be saved for other effective use.

實施例: Example:

如實施例1所述之一種試片讀取裝置,包含:一模組上蓋體,設有至少一試片承靠端以及複數操作孔,各該複數操作孔可置入複數第一操作行程組件;一電路板,具複數穿孔搭配該複數操作孔,供各該複數第一操作行程組件於各該複數操作孔及各該複數穿孔之間移動,該電路板底部的該複數穿孔周邊設有複數導電區;以及一模組下蓋體,設置有複數第二操作行程組件,各該複數第二操作行程組件與各該導電區之接觸與分離狀態決定一讀取訊號。 A test strip reading device according to the first embodiment, comprising: a module upper cover body, at least one test piece bearing end and a plurality of operation holes, each of the plurality of operation holes being insertable into the plurality of first operation stroke components a circuit board having a plurality of perforations matching the plurality of operation holes for moving between the plurality of first operation stroke assemblies between each of the plurality of operation holes and each of the plurality of perforations, and the plurality of perforations at the bottom of the circuit board are provided with a plurality of perforations The conductive region; and a module lower cover body are provided with a plurality of second operation stroke assemblies, and the contact and separation states of the plurality of second operation stroke assemblies and the conductive regions determine a read signal.

如實施例1所述之試片讀取裝置,其中該模組上蓋體更包含一試片上承靠端與一試片下承靠端,以形成與該模組上蓋體一體成型的一試片插槽,以容納一試片,該試片插槽的高度為該試片的厚度加上一個介於0.05~0.5mm的空隙。 The test strip reading device of the first embodiment, wherein the module upper cover further comprises a test piece upper bearing end and a test piece lower bearing end to form a test piece integrally formed with the module upper cover body. a slot for accommodating a test piece, the height of the test piece slot being the thickness of the test piece plus a gap of 0.05 to 0.5 mm.

如實施例1所述之試片讀取裝置,其中該複數第一操作行程組件包含複數啟動元件,用於接觸該試片上複數編碼孔。 The test strip reading device of embodiment 1, wherein the plurality of first operational stroke assemblies comprise a plurality of activation elements for contacting the plurality of coded apertures on the test strip.

如實施例1所述之試片讀取裝置,其中該複數第一操作行程組件更包含複數阻隔元件,配置於該複數啟動元件下方,其中該複數阻隔元件具複數汙染物收集部。 The test strip reading device of embodiment 1, wherein the plurality of first operational stroke assemblies further comprises a plurality of barrier elements disposed under the plurality of activation elements, wherein the plurality of barrier elements have a plurality of contaminant collection portions.

如實施例2所述之試片讀取裝置,其中該複數第二操作行程組件包含複數導電元件設置於該複數阻隔元件下方,以及複數彈力元件用以抵頂該複數導電元件。 The test strip reading device of embodiment 2, wherein the plurality of second operational stroke assemblies comprise a plurality of electrically conductive elements disposed under the plurality of barrier elements, and a plurality of elastic elements for abutting the plurality of electrically conductive elements.

如實施例3所述之試片讀取裝置,其中該複數第二操作行程組件更包含複數接地元件,設置於該複數彈力元件下方,各該複數導電元件因應各該複數彈力元件之推擠而接觸各該複數接地元件,當各該複數導電元件與各該複數導電區接觸時,形成一導電狀態,以及當各該複數導電元件與各該複數導電區分離時,形成一未導電狀態。 The test strip reading device of embodiment 3, wherein the plurality of second operational stroke assemblies further comprises a plurality of grounding elements disposed under the plurality of elastic elements, each of the plurality of conductive elements being adapted to the pushing of the plurality of elastic elements Each of the plurality of grounding elements is contacted to form a conductive state when each of the plurality of conductive elements is in contact with each of the plurality of conductive regions, and an unconducting state is formed when each of the plurality of conductive elements is separated from each of the plurality of conductive regions.

如實施例3所述之試片讀取裝置,其中當該試片插入該試片 插槽時,根據各該複數個編碼孔中是否有一凸起部,決定各該複數導電區與各該複數接地元件是否電接觸,以經由各該導電狀態或該未導電狀態判斷該試片上相對於各該複數個操作孔位置的該讀取訊號。 The test strip reading device of embodiment 3, wherein the test strip is inserted into the test strip In the case of a slot, determining whether each of the plurality of conductive regions is in electrical contact with each of the plurality of grounding elements according to whether each of the plurality of coded holes has a convex portion, so as to determine the relative position on the test piece via each of the conductive state or the non-conductive state. The read signal at each of the plurality of operation hole positions.

如實施例3所述之試片讀取裝置,其中該電路板更包含複數導通元件,設置於該電路板底部的該複數穿孔周邊,當各該複數導電元件與各該複數導電區及各該複數導通元件接觸時,形成一導電狀態,以及當各該複數導電元件與各該複數導電區及各該複數導通元件分離時,形成一未導電狀態,並經由該導電狀態或該未導電狀態判斷該試片上相對於各該複數個操作孔位置的該讀取訊號。 The test strip reading device of embodiment 3, wherein the circuit board further comprises a plurality of conductive elements disposed on the periphery of the plurality of perforations at the bottom of the circuit board, and each of the plurality of conductive elements and each of the plurality of conductive regions and each of the plurality of conductive regions When the plurality of conductive elements are in contact, a conductive state is formed, and when each of the plurality of conductive elements is separated from each of the plurality of conductive regions and each of the plurality of conductive elements, an unconducting state is formed, and the conductive state or the non-conductive state is determined. The read signal on the test piece relative to each of the plurality of operation hole positions.

如實施例4所述之一種試片讀取裝置以容納一試片,包含:一模組上蓋體,設有至少一試片承靠端,包含複數操作孔,可置入複數導電元件以及複數第一操作行程組件;一電路板,具複數穿孔搭配該複數操作孔,供該複數導電元件於該複數穿孔與該複數操作孔之間移動,該電路板底部的各該複數穿孔周邊設有複數導電區;以及一模組下蓋體,設置有複數第二操作行程組件,其中各該複數導電元件與該導電區之接觸與分離狀態決定一讀取訊號。 A test strip reading device as described in Embodiment 4, comprising: a test piece upper cover body, comprising at least one test piece bearing end, comprising a plurality of operation holes, capable of inserting a plurality of conductive elements and a plurality of a first operation stroke component; a circuit board having a plurality of perforations coupled to the plurality of operation holes for moving the plurality of conductive elements between the plurality of perforations and the plurality of operation holes, wherein each of the plurality of perforations at the bottom of the circuit board is provided with a plurality of The conductive region; and a module lower cover body are provided with a plurality of second operation stroke assemblies, wherein the contact and separation states of the plurality of conductive elements and the conductive region determine a read signal.

如實施例4所述之試片讀取裝置,其中各該複數導電元件為一柱狀導電元件。 The test strip reading device of embodiment 4, wherein each of the plurality of conductive elements is a columnar conductive element.

如實施例4所述之試片讀取裝置,其中各該複數導電元件具一第一端,用以接觸該試片上的複數編碼孔,以及一第二端,用以抵頂各該複數第二操作行程組件。 The test strip reading device of embodiment 4, wherein each of the plurality of conductive elements has a first end for contacting the plurality of coded holes on the test strip, and a second end for abutting each of the plurality of Two operating stroke components.

如實施例4所述之試片讀取裝置,其中各該複數第一操作行程組件包含被配置於鄰近該第一端的一汙染物收集部,俾收集進入該試片讀取裝置之一汙染物,且其中該柱狀導電元件更具有與該汙染物收集部相匹配的一側邊槽。 The test strip reading device of embodiment 4, wherein each of the plurality of first operational stroke assemblies comprises a contaminant collection portion disposed adjacent to the first end, and is collected into a contamination of the test strip reading device And wherein the columnar conductive element further has a side slot that matches the contaminant collection portion.

如實施例4所述之試片讀取裝置,其中各該複數第二操作行程組件包含一彈力元件用以抵頂該柱狀導電元件。 The test strip reading device of embodiment 4, wherein each of the plurality of second operational stroke assemblies includes a resilient member for abutting the cylindrical conductive member.

如實施例4所述之試片讀取裝置,其中各該複數第二操作行程組件更包含一接地元件,該側邊槽具有靠近該第一端的一第一槽壁以及相對於該第一槽壁的一第二槽壁,且該第二槽壁被配置以因應該彈力元件之推擠而接觸該接地元件。 The test strip reading device of embodiment 4, wherein each of the plurality of second operational stroke assemblies further comprises a grounding member, the side slot having a first slot wall adjacent to the first end and opposite to the first a second slot wall of the slot wall, and the second slot wall is configured to contact the ground element due to pushing of the spring element.

如實施例4所述之試片讀取裝置,其中各該複數編碼孔包含或不包含一凸起部;當各該複數編碼孔中包含該凸起部時,該凸起部抵頂該第一端,使各該複數導電元件與該複數導電區分離時,而形成一未導電狀態;當各該複數編碼孔中不包含凸起部時,該第一端未被抵頂,使各該複數導電元件與該複數導電區接觸時,而形成一導電狀態。 The test strip reading device of embodiment 4, wherein each of the plurality of coded holes includes or does not include a convex portion; and when the convex portion is included in each of the plurality of coded holes, the raised portion abuts the first portion One end, when each of the plurality of conductive elements is separated from the plurality of conductive regions, forming an unconducting state; when each of the plurality of coded holes does not include a convex portion, the first end is not abutted, so that each When a plurality of conductive elements are in contact with the plurality of conductive regions, a conductive state is formed.

如實施例4所述之試片讀取裝置,其中當該試片插入該試片插槽時,根據各該複數個編碼孔中是否有該凸起部,決定該未導電狀態或該導電狀態,以判斷該試片上相對於該複數個操作孔位置的該讀取訊號。 The test strip reading device according to the fourth embodiment, wherein when the test strip is inserted into the test strip slot, the non-conductive state or the conductive state is determined according to whether the protrusion portion is present in each of the plurality of code holes. And determining the read signal on the test piece relative to the position of the plurality of operation holes.

如實施例4所述之試片讀取裝置,其中該電路板更包含複數導通元件,設置於該電路板底部的該複數穿孔周邊,當各該複數導電元件在操作時,依據該試片上相對各該複數操作孔之結構,決定各該複數導電元件與各該複數導電區及各該複數導通元件形成一導電狀態或一未導電狀態,由該導電狀態與該未導電狀態判斷該試片上相對各該複數操作孔的該讀取訊號。 The test strip reading device of embodiment 4, wherein the circuit board further comprises a plurality of conductive elements disposed at a periphery of the plurality of perforations at the bottom of the circuit board, wherein each of the plurality of conductive elements is operated according to the relative The structure of each of the plurality of operating holes determines that each of the plurality of conductive elements forms a conductive state or a non-conductive state with each of the plurality of conductive regions and each of the plurality of conductive elements, and the conductive state and the non-conductive state determine that the test piece is opposite The read signal of each of the plurality of operation holes.

如實施例4所述之試片讀取裝置,該電路板包含至少一電觸部,以電連接該試片的至少一電極。 The test strip reading device of embodiment 4, wherein the circuit board comprises at least one electrical contact portion for electrically connecting at least one electrode of the test strip.

如實施例5所述之一生物檢測系統,包含:一試片讀取裝置,包含一試片上承靠端及一試片下承靠端,其中該試片上承靠端及該試片下承靠端之間形成一高度落差以容納一試片,該試片上承靠端及該試片 下承靠端與該試片讀取裝置一體成型;一上蓋,設置於該試片讀取裝置上方,可選擇性地遮蔽該試片上承靠端的一頂面;以及一下蓋,設置於該試片讀取裝置下方,以遮蔽該試片讀取裝置的一底面。 A biological detection system according to the embodiment 5, comprising: a test piece reading device comprising a test piece upper bearing end and a test piece lower bearing end, wherein the test piece upper bearing end and the test piece lower bearing end Forming a height drop between the ends to accommodate a test piece, the test piece upper end and the test piece The lower bearing end is integrally formed with the test piece reading device; an upper cover is disposed above the test piece reading device to selectively cover a top surface of the bearing end of the test piece; and a lower cover is disposed on the test piece Under the sheet reading device, a bottom surface of the test strip reading device is shielded.

如實施例5所述之生物檢測系統,其中該試片讀取裝置更包含一電路板,該電路板設置有複數個穿孔,各該複數穿孔周邊設有複數導電區,使抵頂該試片的各該複數編碼孔的各該複數啟動元件接觸或分離以決定一讀取訊號。 The bio-detection system of embodiment 5, wherein the test strip reading device further comprises a circuit board, the circuit board is provided with a plurality of perforations, and each of the plurality of perforations is provided with a plurality of conductive regions to abut the test strip Each of the plurality of activation elements of the plurality of coded apertures contacts or separates to determine a read signal.

如實施例5所述之生物檢測系統,其中該高度落差為該試片的一厚度加上一個介於0.05~0.5mm的空隙。 The biological detection system of embodiment 5, wherein the height difference is a thickness of the test piece plus a gap of 0.05 to 0.5 mm.

本發明以上述的較佳實施例與範例作為參考而揭露,本領域一般技藝人士須了解這些例子是用於描述而非限定之意。凡習知此技藝者,在不脫離本發明的精神與範圍之下,當可做各種組合與修飾,其仍應屬在本發明專利的涵蓋範圍之內。 The present invention has been described with reference to the preferred embodiments and examples of the invention. It will be understood by those skilled in the art that various combinations and modifications may be made without departing from the spirit and scope of the invention.

Claims (21)

一種試片讀取裝置,包含:一模組上蓋體,設有至少一試片承靠端以及複數操作孔,該複數操作孔可置入複數第一操作行程組件;一電路板,具複數穿孔搭配該複數操作孔,供各該複數第一操作行程組件於各該複數操作孔及各該複數穿孔之間移動,該電路板底部的該複數穿孔周邊設有複數導電區;以及一模組下蓋體,設置有複數第二操作行程組件,各該複數第二操作行程組件與各該導電區之接觸與分離狀態決定一讀取訊號。 A test piece reading device comprises: a module upper cover body, at least one test piece bearing end and a plurality of operation holes, the plurality of operation holes being insertable into the plurality of first operation stroke components; a circuit board having a plurality of perforations And the plurality of operation holes are arranged to move between the plurality of first operation stroke assemblies between the plurality of operation holes and each of the plurality of perforations, and the plurality of conductive regions are disposed around the plurality of perforations at the bottom of the circuit board; The cover body is provided with a plurality of second operation stroke assemblies, and the contact and separation states of the plurality of second operation stroke assemblies and the conductive regions determine a read signal. 如申請專利範圍第1項所述之試片讀取裝置,其中該模組上蓋體更包含一試片上承靠端與一試片下承靠端,以形成與該模組上蓋體一體成型的一試片插槽,以容納一試片,該試片插槽的高度為該試片的厚度加上一個介於0.05~0.5mm的空隙。 The test strip reading device according to claim 1, wherein the upper cover body of the module further comprises a bearing end bearing end and a test piece lower bearing end to form an integral part of the module upper cover body. A test piece slot for accommodating a test piece, the height of the test piece slot being the thickness of the test piece plus a gap of 0.05 to 0.5 mm. 如申請專利範圍第1項所述之試片讀取裝置,其中該複數第一操作行程組件包含複數啟動元件,用於接觸該試片上複數編碼孔。 The test strip reading device of claim 1, wherein the plurality of first operational stroke components comprise a plurality of activation elements for contacting the plurality of coded apertures on the test strip. 如申請專利範圍第3項所述之試片讀取裝置,其中該複數第一操作行程組件更包含複數阻隔元件,配置於該複數啟動元件下方,其中該複數阻隔元件具複數汙染物收集部。 The test strip reading device of claim 3, wherein the plurality of first operational stroke assemblies further comprises a plurality of barrier elements disposed under the plurality of activation elements, wherein the plurality of barrier elements have a plurality of contaminant collection portions. 如申請專利範圍第4項所述之試片讀取裝置,其中該複數第二操作行程組件包含複數導電元件設置於該複數阻隔元件下方,以及複數彈力元件用以抵頂該複數導電元件。 The test strip reading device of claim 4, wherein the plurality of second operational stroke assemblies comprise a plurality of conductive elements disposed under the plurality of barrier elements, and a plurality of elastic elements for abutting the plurality of conductive elements. 如申請專利範圍第5項所述之試片讀取裝置,其中該複數第二操作行程組件更包含複數接地元件,設置於該複數彈力元件下方,各該複數導電元件因應各該複數彈力元件之推擠而接觸各該複數接地元件,當各該複數導電元件與各該複數導電區接觸時,形成一導電狀態,以及當各該複數導電元件與各該複數導電區分離時,形成一未導電狀態。 The test strip reading device of claim 5, wherein the plurality of second operational stroke assemblies further comprise a plurality of grounding elements disposed under the plurality of elastic elements, each of the plurality of conductive elements corresponding to each of the plurality of elastic elements Pushing and contacting each of the plurality of grounding elements, forming a conductive state when each of the plurality of conductive elements is in contact with each of the plurality of conductive regions, and forming a non-conductive when each of the plurality of conductive elements is separated from each of the plurality of conductive regions status. 如申請專利範圍第6項所述之試片讀取裝置,其中當該試片插入該試片插槽時,根據各該複數個編碼孔中是否有一凸起部,決定各該複數導電 區與各該複數接地元件是否電接觸,以經由該導電狀態或該未導電狀態判斷該試片上相對於各該複數個操作孔位置的該讀取訊號。 The test strip reading device of claim 6, wherein when the test strip is inserted into the test strip slot, determining whether each of the plurality of code holes has a convex portion determines each of the plurality of conductive holes. Whether the region is in electrical contact with each of the plurality of grounding elements to determine the read signal on the test strip relative to each of the plurality of operating aperture locations via the conductive state or the non-conductive state. 如申請專利範圍第5項所述之試片讀取裝置,其中該電路板更包含複數導通元件,設置於該電路板底部的該複數穿孔周邊,當各該複數導電元件與各該複數導電區及各該複數導通元件接觸時,形成一導電狀態,以及當各該複數導電元件與各該複數導電區及各該複數導通元件分離時,形成一未導電狀態,並經由該導電狀態或該未導電狀態判斷該試片上相對於各該複數個操作孔位置的該讀取訊號。 The test strip reading device of claim 5, wherein the circuit board further comprises a plurality of conductive elements disposed at a periphery of the plurality of perforations at the bottom of the circuit board, and each of the plurality of conductive elements and each of the plurality of conductive regions And each of the plurality of conductive elements is in contact with each other to form a conductive state, and when each of the plurality of conductive elements is separated from each of the plurality of conductive regions and each of the plurality of conductive elements, forming an unconducting state, and via the conductive state or the The conductive state determines the read signal on the test piece relative to each of the plurality of operation hole positions. 一種試片讀取裝置以容納一試片,包含:一模組上蓋體,設有至少一試片承靠端,包含複數操作孔,可置入複數導電元件以及複數第一操作行程組件;一電路板,具複數穿孔搭配該複數操作孔,供該複數導電元件於該複數穿孔與該複數操作孔之間移動,該電路板底部的各該複數穿孔周邊設有複數導電區;以及一模組下蓋體,設置有複數第二操作行程組件,其中各該複數導電元件與各該複數導電區之接觸與分離狀態決定一讀取訊號。 A test strip reading device for accommodating a test piece, comprising: a module upper cover body, at least one test piece bearing end, comprising a plurality of operation holes, a plurality of conductive elements and a plurality of first operation stroke components; a circuit board having a plurality of perforations matching the plurality of operation holes for moving between the plurality of perforations and the plurality of operation holes, and a plurality of conductive regions around the plurality of perforations at the bottom of the circuit board; and a module The lower cover body is provided with a plurality of second operation stroke assemblies, wherein the contact and separation states of the plurality of conductive elements and the plurality of conductive regions determine a read signal. 如申請專利範圍第9項所述之試片讀取裝置,其中各該複數導電元件為一柱狀導電元件。 The test strip reading device of claim 9, wherein each of the plurality of conductive elements is a columnar conductive element. 如申請專利範圍第10項所述之試片讀取裝置,其中各該複數導電元件具一第一端,用以接觸該試片上的複數編碼孔,以及一第二端,用以抵頂各該複數第二操作行程組件。 The test strip reading device of claim 10, wherein each of the plurality of conductive members has a first end for contacting a plurality of coded holes on the test strip, and a second end for abutting each The plurality of second operating stroke assemblies. 如申請專利範圍第11項所述之試片讀取裝置,其中各該複數第一操作行程組件包含被配置於鄰近該第一端的一汙染物收集部,俾收集進入該試片讀取裝置之一汙染物,且其中該柱狀導電元件更具有與該汙染物收集部相匹配的一側邊槽。 The test strip reading device of claim 11, wherein each of the plurality of first operational stroke assemblies includes a contaminant collection portion disposed adjacent to the first end, and is collected into the test strip reading device One of the contaminants, and wherein the columnar conductive element further has a side groove that matches the contaminant collection portion. 如申請專利範圍第12項所述之試片讀取裝置,其中各該複數第二操作 行程組件包含一彈力元件用以抵頂該柱狀導電元件。 The test strip reading device according to claim 12, wherein each of the plurality of second operations The stroke assembly includes a resilient member for abutting the cylindrical conductive member. 如申請專利範圍第13項所述之試片讀取裝置,其中各該複數第二操作行程組件更包含一接地元件,該側邊槽具有靠近該第一端的一第一槽壁以及相對於該第一槽壁的一第二槽壁,且該第二槽壁被配置以因應該彈力元件之推擠而接觸該接地元件。 The test strip reading device of claim 13, wherein each of the plurality of second operational stroke assemblies further comprises a grounding member, the side groove having a first groove wall adjacent to the first end and relative to a second slot wall of the first slot wall, and the second slot wall is configured to contact the ground element due to pushing of the spring element. 如申請專利範圍第11項所述之試片讀取裝置,其中各該複數編碼孔包含或不包含一凸起部;當各該複數編碼孔中包含該凸起部時,該凸起部抵頂該第一端,使各該複數導電元件與該複數導電區分離而形成一未導電狀態;當各該複數編碼孔中不包含凸起部時,該第一端未被抵頂,使各該複數導電元件與該複數導電區接觸而形成一導電狀態。 The test strip reading device of claim 11, wherein each of the plurality of coded holes includes or does not include a convex portion; and when the convex portion is included in each of the plurality of coded holes, the raised portion is abutted The first end is configured to separate each of the plurality of conductive elements from the plurality of conductive regions to form an unconducting state; and when each of the plurality of coded holes does not include a protrusion, the first end is not abutted, so that each The plurality of conductive elements are in contact with the plurality of conductive regions to form a conductive state. 如申請專利範圍第15項所述之試片讀取裝置,其中當該試片插入一試片插槽時,根據各該複數個編碼孔中是否有該凸起部,決定該未導電狀態或該導電狀態,以判斷該試片上相對於各該複數個操作孔位置的該讀取訊號。 The test strip reading device of claim 15, wherein when the test strip is inserted into a test strip slot, determining whether the convex portion is included in each of the plurality of code holes determines the non-conductive state or The conductive state is used to determine the read signal on the test strip relative to each of the plurality of operating hole positions. 如申請專利範圍第9項所述之試片讀取裝置,其中該電路板更包含複數導通元件,設置於該電路板底部的該複數穿孔周邊,當各該複數導電元件在操作時,依據該試片上相對各該複數操作孔之結構,決定各該複數導電元件與各該複數導電區及各該複數導通元件形成一導電狀態或一未導電狀態,由該導電狀態與該未導電狀態判斷該試片上相對各該複數操作孔的該讀取訊號。 The test strip reading device of claim 9, wherein the circuit board further comprises a plurality of conductive elements disposed at a periphery of the plurality of perforations at the bottom of the circuit board, when each of the plurality of conductive elements is in operation, The structure of the plurality of operation holes on the test piece determines that each of the plurality of conductive elements forms a conductive state or an unconductive state with each of the plurality of conductive regions and each of the plurality of conductive elements, and the conductive state and the non-conductive state determine The read signal on the test piece relative to each of the plurality of operation holes. 如申請專利範圍第9項所述之試片讀取裝置,其中該電路板包含至少一電觸部,以電連接該試片的至少一電極。 The test strip reading device of claim 9, wherein the circuit board comprises at least one electrical contact portion to electrically connect at least one electrode of the test strip. 一生物檢測系統,包含:一試片讀取裝置,包含一試片上承靠端及一試片下承靠端,其中該試片上承靠端及該試片下承靠端之間形成一高度落差以容納一試片,該試片上承靠端及該試片下承靠端與該試片讀取裝置一體成型; 一上蓋,設置於該試片讀取裝置上方,可選擇性地遮蔽該試片上承靠端的一頂面;以及一下蓋,設置於該試片讀取裝置下方,以遮蔽該試片讀取裝置的一底面。 A biological detection system comprises: a test piece reading device comprising a test piece upper bearing end and a test piece lower bearing end, wherein a height between the bearing end of the test piece and the lower bearing end of the test piece forms a height Having a drop to accommodate a test piece, the bearing end of the test piece and the lower bearing end of the test piece are integrally formed with the test piece reading device; An upper cover disposed above the test strip reading device to selectively shield a top surface of the bearing end of the test strip; and a lower cover disposed under the test strip reading device to shield the test strip reading device a bottom surface. 如申請專利範圍第19項所述之生物檢測系統,其中該試片讀取裝置更包含一電路板,該電路板設置有複數穿孔,各該複數穿孔周邊設有複數導電區,使抵頂該試片的複數編碼孔的複數啟動元件接觸或分離以決定一讀取訊號。 The biometric detection system of claim 19, wherein the test strip reading device further comprises a circuit board, the circuit board is provided with a plurality of perforations, and each of the plurality of perforations is provided with a plurality of conductive regions, so as to abut the top The complex numbering elements of the plurality of coded apertures of the test strip are contacted or separated to determine a read signal. 如申請專利範圍第19項所述之生物檢測系統,其中該高度落差為該試片的一厚度加上一介於0.05~0.5mm的空隙 The biological detection system of claim 19, wherein the height difference is a thickness of the test piece plus a gap of 0.05 to 0.5 mm.
TW105129876A 2016-09-13 2016-09-13 A physiological parameter measurement module TWI607217B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW105129876A TWI607217B (en) 2016-09-13 2016-09-13 A physiological parameter measurement module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW105129876A TWI607217B (en) 2016-09-13 2016-09-13 A physiological parameter measurement module

Publications (2)

Publication Number Publication Date
TWI607217B TWI607217B (en) 2017-12-01
TW201809668A true TW201809668A (en) 2018-03-16

Family

ID=61230683

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105129876A TWI607217B (en) 2016-09-13 2016-09-13 A physiological parameter measurement module

Country Status (1)

Country Link
TW (1) TWI607217B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI723731B (en) * 2019-08-02 2021-04-01 華廣生技股份有限公司 Biosensor implantation device and implantation method
US11896804B2 (en) 2019-08-02 2024-02-13 Bionime Corporation Insertion device for a biosensor and insertion method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI485391B (en) * 2012-11-12 2015-05-21 Taidoc Technology Corp Electronic assay apparatus, method and kit thereof
US20140318987A1 (en) * 2013-04-30 2014-10-30 Lifescan Scotland Limited Analyte meter test strip detection
CN204439553U (en) * 2015-03-17 2015-07-01 深圳市海王英特龙生物技术股份有限公司 Positioning pedestal, dark chamber and use the vitro detection analytical equipment in this dark chamber

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI723731B (en) * 2019-08-02 2021-04-01 華廣生技股份有限公司 Biosensor implantation device and implantation method
US11896804B2 (en) 2019-08-02 2024-02-13 Bionime Corporation Insertion device for a biosensor and insertion method thereof

Also Published As

Publication number Publication date
TWI607217B (en) 2017-12-01

Similar Documents

Publication Publication Date Title
CN108344771B (en) Test piece reading device
US7896704B2 (en) Strip connectors for measurement devices
TWI513121B (en) Socket for micro subscriber identification module card
JP5547024B2 (en) Board to board connector
TWI607217B (en) A physiological parameter measurement module
KR20080040045A (en) Electrical connector
KR101668382B1 (en) Method and apparatus for encoding test strips
KR101470370B1 (en) analyzer
CN107817337B (en) Analyte measuring module
JP2007048684A (en) Connector
TWI628438B (en) A physiological parameter measurement module
KR101017279B1 (en) Cartridge and analysis system
KR20100031567A (en) Analyzing system
CN108601561B (en) Test paper strip discharging device for blood glucose meter
US10139391B2 (en) Ejection structure and connector with ejection mechanism
CN107818275B (en) Analyte measuring module
US20100161240A1 (en) Test strip and device for measuring sample properties and system incorporating the same
CN111463593B (en) Connecting method, connecting structure and connecting component of covered wire
JP5044347B2 (en) Card connector
JP4787463B2 (en) Writing instrument type input device
US20070131777A1 (en) Chip card retaining mechanism
JPH11251022A (en) Contact pin of ic socket, contact pin unit and ic socket
JP4117827B2 (en) Socket for electrical parts
CN113745037A (en) Input device
JP2001183391A (en) Multi-electrode probe device for inspecting semiconductor device