CN107369475A - Flash continuously wipes the automated testing method with programming - Google Patents
Flash continuously wipes the automated testing method with programming Download PDFInfo
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- CN107369475A CN107369475A CN201710584272.4A CN201710584272A CN107369475A CN 107369475 A CN107369475 A CN 107369475A CN 201710584272 A CN201710584272 A CN 201710584272A CN 107369475 A CN107369475 A CN 107369475A
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- China
- Prior art keywords
- flash
- programming
- continuously
- testing method
- automated testing
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- Tests Of Electronic Circuits (AREA)
Abstract
The automated testing method with programming is continuously wiped the present invention relates to a kind of Flash, described method comprises the following steps:(1) the automatic test model continuously wiped and programmed for carrying out Flash is built;(2) call more new procedures to be wiped Flash and programming operation in automatic test model, and include default cycle-index in described more new procedures, described more new procedures carry out continuously erasing and programming operation according to the cycle-index.Continuous Flash erasings and programming are carried out by more new procedures, to test the reliabilities of Flash in itself, very simple is convenient.
Description
Technical field
The present invention relates to communication products technical field, more particularly to Flash testing fields, in particular to a kind of Flash to connect
The automated testing method of continuous erasing and programming.
Background technology
When developing electronic product, it is often necessary to some data are preserved after power-off, this just needs to use FLASH or EEPROM cores
Piece, the number of the erasable reprogram of both chips is conditional.Two kinds of main Flash flash memories in the market:Nor
The maximum erasable number of each block is 1,000,000 times in Flash and Nand Flash, Nand Flash, and Nor Flash 100,000
It is secondary.
This writable maximum times are that the characteristic of chip determines that developer is to change in use
's.Maximum this parameter of write-in number should be taken into full account during using Flash, it is to be ensured that product does not surpass in real work
Cross this parameter.
The content of the invention
The purpose of the present invention be overcome it is above-mentioned in the prior art the shortcomings that, there is provided a kind of Flash continuously erasing and programming
Automated testing method.
In order to realize above-mentioned purpose, Flash of the invention continuously wipes specific such as with the automated testing method of programming
Under:
The Flash continuously wipes the automated testing method with programming, and it is mainly characterized by, and described method includes following
Step:
(1) the automatic test model continuously wiped and programmed for carrying out Flash is built;
(2) call more new procedures to be wiped Flash and programming operation in automatic test model, and it is described more
Include default cycle-index in new procedures, described more new procedures carry out continuous erasing according to the cycle-index and grasped with programming
Make.
It is preferred that described automatic test model includes electronic product and test equipment comprising Flash to be tested,
The described electronic product comprising Flash to be tested is connected with described test equipment by Serial Port Line.
More preferably, described test equipment includes PC.
More preferably, more new procedures and more new file are included in described test equipment, described more new procedures pass through choosing
The software to be updated stored on the Flash to be tested in the electronic product comprising Flash to be tested of its connection is selected, it is entered
The burning of row more new file, realize that described more new procedures are wiped and programmed to Flash.
It is particularly preferred that described step (2) comprises the following steps:
(2.1) screen of the programmed acquisition software to be updated on the serial ports interface of automatic test model is updated described in
Coordinate (X1, Y1), and mouse click commands, taps screen coordinate (X1, Y1) are selected after the public delay S that is delayed;
(2.2) screen that the more new procedures described in gather more new file in the file selection interface of automatic test model is sat
Mark (X2, Y2), and mouse click commands, taps screen coordinate (X2, Y2) are selected after the public delay S that is delayed;
(2.3) the renewal programmed acquisition file described in sends the screen coordinate (X3, Y3) of confirming button, and selects mouse point
Hit instruction, taps screen coordinate (X3, Y3), to determine to send file.
It is it is still further preferred that further comprising the steps of after described step (2.3):
(2.4) renewal Program time delay one first described in is delayed S1, with etc. burning of the file to be updated in Flash it is complete
Into.
Capitally, the more new procedures described in described step (2) carry out continuous erasing and programming according to the cycle-index
Operate and be:
Described renewal Program time delay one first is delayed after S1, enters back into described step (2.1), carries out Flash erasings
With programming operation.
Automated testing method with programming is continuously wiped using the Flash of the present invention, Flash automation can be carried out
Test, and solve it is unattended in the case of test problem, more easily realize automatic test, it is relatively low to enter gate threshold, is applicable
In majority of populations, test period can be shortened, reduce R & D Cost.
Brief description of the drawings
Fig. 1 is that the Flash of the present invention continuously wipes the schematic flow sheet with the automated testing method of programming.
Fig. 2 is that continuous wipe of the Flash of the present invention passes through serial ports with Flash in the automated testing method of programming with computer
Line connects
Connection relationship diagram.
Embodiment
In order to be more clearly understood that this practical technique content, described in detail especially exemplified by following examples.
The Flash continuously wipes the automated testing method with programming, and it is mainly characterized by, and described method includes following
Step:
(1) the automatic test model continuously wiped and programmed for carrying out Flash is built;
(2) call more new procedures to be wiped Flash and programming operation in automatic test model, and it is described more
Include default cycle-index in new procedures, described more new procedures carry out continuous erasing according to the cycle-index and grasped with programming
Make.In a kind of specific embodiment, described default cycle-index is the erasing of the Flash, programs the theoretical value of number.
Referring to Fig. 2, in a kind of specific embodiment, described automatic test model includes including Flash to be tested
Electronic product and test equipment, the described electronic product comprising Flash to be tested and described test equipment pass through string
Mouth line is connected.
In a kind of more preferably embodiment, described test equipment includes PC.
In a kind of more preferably embodiment, more new procedures and more new file are included in described test equipment, it is described
More new procedures are by selecting what is stored on the Flash to be tested in the electronic product comprising Flash to be tested that it is connected to treat more
New software, the burning of file is updated to it, realizes that described more new procedures are wiped and programmed to Flash.
Referring to Fig. 1, in a kind of preferred embodiment, described step (2) is:
(2.1) screen of the programmed acquisition software to be updated on the serial ports interface of automatic test model is updated described in
Coordinate (X1, Y1), and mouse click commands, taps screen coordinate (X1, Y1) are selected after the public delay S that is delayed;
(2.2) screen that the more new procedures described in gather more new file in the file selection interface of automatic test model is sat
Mark (X2, Y2), and mouse click commands, taps screen coordinate (X2, Y2) are selected after the public delay S that is delayed;
(2.3) the renewal programmed acquisition file described in sends the screen coordinate (X3, Y3) of confirming button, and selects mouse point
Hit instruction, taps screen coordinate (X3, Y3), to determine to send file.
In a kind of favourable embodiment, a step is also included after described step (2.3):
(2.4) renewal Program time delay one first described in is delayed S1, with etc. burning of the file to be updated in Flash it is complete
Into.
In a kind of splendid embodiment, the more new procedures described in described step (2) are carried out according to the cycle-index
Continuously wipe with programming operation and be:
Described renewal Program time delay one first is delayed after S1, enters back into described step (2.1), carries out Flash erasings
With programming operation.
In the particular embodiment, because Flash to be known continuously wipes the result with the automated testing method of programming,
More new procedures also include an output program and a counting procedure, described technical program be used to measuring the Flash continuously erasing with
The automated testing method of programming carries out the total degree that Flash is continuously wiped and programmed.And described output program is then for defeated
Go out the total degree.
Embodiment one is referred to below, and in embodiment one, Flash continuously wipes to be had with the automated testing method of programming
Have the following steps:
(1) as shown in Fig. 2 building the automatic test model that the Flash is continuously wiped and programmed;
(2) in the screen coordinate (X1, Y1) of the serial ports software interface collection of automatic test model software to be updated, and
Be delayed a public delay S, and mouse click commands, taps screen coordinate (X1, Y1) are selected after the completion of delay;
Step (2) can be realized by following language:
MoveTo X1, Y1 // movement mouse extremely upgrade software button screen
The public delay S of Delay S // setting
LeftClick 1 // mouse left clicks
(3) screen coordinate (X2, Y2) of more new file is gathered in the file selection interface of automatic test model, and be delayed
One public delay S, mouse click commands, taps screen coordinate (X2, Y2) are selected after the completion of delay.
Step (3) is realized by following language:
MoveTo X2, Y2 // movement mouse are to file 1
The public delay S of Delay S // setting
LeftClick 1 // mouse left clicks
(4) the renewal programmed acquisition file described in sends the screen coordinate (X3, Y3) of confirming button, and selects mouse to click on
Instruction, taps screen coordinate (X3, Y3), it is determined that send file, and be delayed one first delay S1 with etc. file to be updated in Flash
In burning complete.
Step (4) is realized by following language:
MoveTo X2, Y2 // movement mouse determine to send
LeftClick 1 // movement mouse is to file 1
Delay S1 // the delay of setting first S1
It is to ensure the integrality of script operation that public delay S is added in step (2), (3).
A kind of described Flash of the present embodiment is continuously wiped with the automated testing method of programming specific implementation process such as
Under:
Automated testing method with programming is continuously wiped using the Flash of the present invention, Flash automation can be carried out
Test, and solve it is unattended in the case of test problem, more easily realize automatic test, it is relatively low to enter gate threshold, is applicable
In majority of populations, test period can be shortened, reduce R & D Cost.
In this description, the present invention is described with reference to its specific embodiment.But it is clear that it can still make
Various modifications and alterations are without departing from this practical spirit and scope.Therefore, specification and drawings be considered as it is illustrative and
It is nonrestrictive.
Claims (7)
1. a kind of Flash continuously wipes the automated testing method with programming, it is characterised in that described method includes following step
Suddenly:
(1) the automatic test model continuously wiped and programmed for carrying out Flash is built;
(2) more new procedures are called to be wiped Flash and programming operation in automatic test model, and described renewal journey
Include default cycle-index in sequence, described more new procedures carry out continuously erasing and programming operation according to the cycle-index.
2. Flash according to claim 1 continuously wipes the automated testing method with programming, it is characterised in that described
Automatic test model include electronic product and test equipment comprising Flash to be tested, it is described comprising to be tested
Flash electronic product is connected with described test equipment by Serial Port Line.
3. Flash according to claim 2 continuously wipes the automated testing method with programming, it is characterised in that described
Test equipment include PC.
4. Flash according to claim 2 continuously wipes the automated testing method with programming, it is characterised in that described
Test equipment in include more new procedures and more new file, described more new procedures are by selecting that it connects comprising to be tested
The software to be updated stored on Flash to be tested in Flash electronic product, the burning of file is updated to it, it is real
Existing described more new procedures are wiped and programmed to Flash.
5. Flash according to claim 4 continuously wipes the automated testing method with programming, it is characterised in that described
The step of (2) comprise the following steps:
(2.1) screen coordinate of the programmed acquisition software to be updated on the serial ports interface of automatic test model is updated described in
(X1, Y1), and mouse click commands, taps screen coordinate (X1, Y1) are selected after the public delay S that is delayed;
(2.2) the more new procedures described in gather the screen coordinate of more new file in the file selection interface of automatic test model
(X2, Y2), and mouse click commands, taps screen coordinate (X2, Y2) are selected after the public delay S that is delayed;
(2.3) the renewal programmed acquisition file described in sends the screen coordinate (X3, Y3) of confirming button, and selects mouse to click on and refer to
Order, taps screen coordinate (X3, Y3), to determine to send file.
6. Flash according to claim 5 continuously wipes the automated testing method with programming, it is characterised in that described
The step of (2.3) after it is further comprising the steps of:
(2.4) renewal Program time delay one first described in is delayed S1, with etc. burning of the file to be updated in Flash complete.
7. Flash according to claim 6 continuously wipes the automated testing method with programming, it is characterised in that described
The step of (2) described in more new procedures according to the cycle-index continuously wipe with programming operation and be:
Described renewal Program time delay one first is delayed after S1, enters back into described step (2.1), carries out Flash erasings and compiles
Journey operates.
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CN201710584272.4A CN107369475A (en) | 2017-07-18 | 2017-07-18 | Flash continuously wipes the automated testing method with programming |
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CN201710584272.4A CN107369475A (en) | 2017-07-18 | 2017-07-18 | Flash continuously wipes the automated testing method with programming |
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JP2006004496A (en) * | 2004-06-16 | 2006-01-05 | Toshiba Corp | Semiconductor storage device |
CN103854704A (en) * | 2012-12-03 | 2014-06-11 | 上海斐讯数据通信技术有限公司 | Automatic detection method and automatic detection device of flash memory bad block |
CN105162655A (en) * | 2015-08-26 | 2015-12-16 | 上海斐讯数据通信技术有限公司 | Method and system for automated testing of network throughput |
CN106887256A (en) * | 2017-01-03 | 2017-06-23 | 航天科工防御技术研究试验中心 | The optimal inspection method and optimal inspection device of a kind of flash storage |
CN106951348A (en) * | 2017-03-03 | 2017-07-14 | 惠州Tcl移动通信有限公司 | A kind of mobile terminal control Flash erasable method of testings and system repeatedly |
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2017
- 2017-07-18 CN CN201710584272.4A patent/CN107369475A/en active Pending
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JP2006004496A (en) * | 2004-06-16 | 2006-01-05 | Toshiba Corp | Semiconductor storage device |
CN103854704A (en) * | 2012-12-03 | 2014-06-11 | 上海斐讯数据通信技术有限公司 | Automatic detection method and automatic detection device of flash memory bad block |
CN105162655A (en) * | 2015-08-26 | 2015-12-16 | 上海斐讯数据通信技术有限公司 | Method and system for automated testing of network throughput |
CN106887256A (en) * | 2017-01-03 | 2017-06-23 | 航天科工防御技术研究试验中心 | The optimal inspection method and optimal inspection device of a kind of flash storage |
CN106951348A (en) * | 2017-03-03 | 2017-07-14 | 惠州Tcl移动通信有限公司 | A kind of mobile terminal control Flash erasable method of testings and system repeatedly |
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