CN106887256A - The optimal inspection method and optimal inspection device of a kind of flash storage - Google Patents
The optimal inspection method and optimal inspection device of a kind of flash storage Download PDFInfo
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- CN106887256A CN106887256A CN201710002497.4A CN201710002497A CN106887256A CN 106887256 A CN106887256 A CN 106887256A CN 201710002497 A CN201710002497 A CN 201710002497A CN 106887256 A CN106887256 A CN 106887256A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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Abstract
The invention discloses a kind of optimal inspection method of flash storage, it includes：Generation test vector；Algorithm to the test vector is optimized, automatic to adapt to tested minimum operation time of the flash storage in this test, and is operated by the minimum operation time, makes the testing time close to the minimum time because of the limitation of flash storage inherent characteristic；Allow the multiple flash storage test device carries out the concurrent testing of the multiple tested flash storages of multiple stations according to the test vector in the same time；Receive and come from each self-corresponding test result of the multiple flash storage test device.The present invention combines vector algorithm optimization and generation and parallel test techniques, and the testing efficiency of flash storage is greatly improved on the premise of test coverage is ensured, reduces testing cost.
Description
Technical field
The present invention relates to chip testing technology field, the optimal inspection method of more particularly to a kind of flash storage and excellent
Change test device.
Background technology
Flash storage is widely used in storing electronic data in electronic system.As each electronic system storage inside
The core devices of unit, the quality of flash storage directly affects the quality of electronic system data storage, so as to influence whole
The operation of system.Therefore, the test of flash storage is for ensureing that it is great that the operation function and data storage of electronic system have
Meaning, also plays a key effect for the important industries such as Aero-Space escort.Due to the inherent characteristic of flash storage, its
Operations are required for certain operating time, and the minimum time of operation is within the specific limits unfixed, therefore generally
When testing flash storage, the required time is more long, and is possible to cause one because the minimum operation time is unknown
A little wastes of time, cause the testing time for flash storage occur efficiency long low and testing cost problem higher.Therefore,
On the premise of test coverage is ensured, a kind of optimal inspection method of flash storage is realized, improve testing efficiency, reduced
Testing cost, is of great immediate significance.
The content of the invention
In view of this, it is an object of the invention to propose the optimal inspection method and optimal inspection of a kind of flash storage
Device, optimizes and uses parallel test techniques comprising the algorithm to test vector, is ensureing the premise of test coverage
Under the testing efficiency of flash storage is greatly improved, reduce testing cost.
A kind of optimal inspection method of the flash storage provided based on above-mentioned purpose, the present invention, it includes：
Test vector generation step, generates test vector；
Testing time Optimization Steps, the algorithm to the test vector is optimized, automatic to adapt to tested flash storage
The minimum operation time in this test, and operated by the minimum operation time, make the testing time close to because of Flash
The minimum time of memory inherent characteristic limitation；
Concurrent testing rate-determining steps, it is allowed to which the multiple flash storage test device is according to the test vector same
One time carried out the concurrent testing of the multiple tested flash storages of multiple stations；
Test result receiving step, receives from each self-corresponding test knot of the multiple flash storage test device
Really.
Preferably, the optimal inspection method of flash storage of the invention, the testing time Optimization Steps bag
Include：The test vector is sent to multiple flash storage test devices, the algorithm to the test vector is optimized,
Make flash storage in test, erasing and the flag bit or result of write operation judged, when judge operation terminate and
After success, it is no longer waiting for the remaining operating time and continues to carry out downwards.
The optimal inspection method of flash storage of the invention, the concurrent testing includes：
Multiple threads or process are built, each thread or process are used to control a flash storage, each line
Journey or process are separate；
Each thread or process independently connect memorizer test device, and each thread or Process Synchronization are transported
OK；And
After a thread or process complete the operation to flash storage test device, the thread or process are released immediately
The flash storage test device is put, so that other threads or process can continue to use flash storage to test dress
Put.
Further, the optimal inspection method of flash storage of the invention, the test vector is given birth to by controller
Into, and the test vector is sent to by multiple flash storage test devices by bus.
On the other hand, the present invention also provides a kind of optimal inspection device of flash storage, and it includes：
Test vector generation module, generates test vector；
Testing time optimization module, the algorithm to the test vector is optimized, automatic to adapt to tested flash storage
The minimum operation time in this test, and operated by the minimum operation time, make the testing time close to because of Flash
The minimum time of memory inherent characteristic limitation；
Concurrent testing control module, it is allowed to which the multiple flash storage test device is according to the test vector same
One time carried out the concurrent testing of the multiple tested flash storages of multiple stations；And
Test result receiver module, receives from each self-corresponding test knot of the multiple flash storage test device
Really.
Preferably, the optimal inspection device of flash storage of the invention, the testing time optimization module bag
Include：
Test vector optimizes submodule, the test vector is sent into multiple flash storage test devices, to described
The algorithm of test vector is optimized；And
Judging submodule, according to the optimum results for testing the vector optimization submodule, makes flash storage in test
When, flag bit or result to erasing and write operation judge, after operation end and success is judged, are no longer waiting for residue
Operating time and continue to carry out downwards.
Further, the optimal inspection device of flash storage of the invention, the concurrent testing control module is entered
One step includes：
Thread or process build submodule, build multiple threads or process, and each thread or process are used to control
One flash storage, each thread or process are separate；
Synchronous operation submodule, controls each thread or process independently to connect flash storage test device,
Each thread or Process Synchronization run；And
Memorizer test device seizes submodule, and control, should after a thread or process complete the operation to tester
Thread or process discharge flash storage test device immediately, so that other threads or process can continue to be deposited using Flash
Reservoir test device.
Preferably, the optimal inspection device of flash storage of the invention, is sent out the test vector by bus
Give the multiple flash storage test device.
From the above it can be seen that the optimal inspection scheme of the flash storage provided according to the present invention, due to using
Parallel test techniques, can make the test program of flash storage carries out the multiple tested Flash of multiple stations in the same time
The concurrent testing of memory, can be accurately positioned and show the test result of each parallel station, and single Flash storage is greatly lowered
The testing time of device.Further, since test when, make the testing time close to because flash storage inherent characteristic limitation it is minimum when
Between, therefore avoid the waste of the time caused by the minimum operation time is unknown.
Brief description of the drawings
Fig. 1 is the flow chart of the flash storage optimal inspection method of the embodiment of the present invention.
Fig. 2 is the particular flow sheet of the parallel test method of the embodiment of the present invention.
Fig. 3 is the structured flowchart of the flash storage optimal inspection device of the embodiment of the present invention.
Fig. 4 is the structured flowchart of the concurrent testing control module of the embodiment of the present invention.
Specific embodiment
To make the object, technical solutions and advantages of the present invention become more apparent, below in conjunction with specific embodiment, and reference
Accompanying drawing, the present invention is described in more detail.
It should be noted that the statement of all uses " first " and " second " is for differentiation two in the embodiment of the present invention
The entity of individual same names non-equal or the parameter of non-equal, it is seen that " first " " second " should not only for the convenience of statement
The restriction to the embodiment of the present invention is interpreted as, subsequent embodiment is no longer illustrated one by one to this.
The present invention provides a kind of optimal inspection method of flash storage, and it includes：
Test vector generation step, generates test vector；
Testing time Optimization Steps, the algorithm to the test vector is optimized, automatic to adapt to tested flash storage
The minimum operation time in this test, and operated by the minimum operation time, make the testing time close to because of Flash
The minimum time of memory inherent characteristic limitation；
Concurrent testing rate-determining steps, it is allowed to which the multiple flash storage test device is according to the test vector same
One time carried out the concurrent testing of the multiple tested flash storages of multiple stations；
Test result receiving step, receives from each self-corresponding test knot of the multiple flash storage test device
Really.
It is well known that the functional test of the test of semiconductor memory, DC parameter test, AC parameter test, and work(
Can test and AC parameter test for memory it is critical that.For the test of flash storage, its is common
Method of testing such as even-odd check figure method of inspection (in parity Graphics testing method, to memory cell matrix write number
Depending on being the parity according to memory cell addressing address code according to pattern), in step method (be to each unit of memory successively
A kind of method tested) etc..
Generally, the method for testing of flash storage can be carried out in accordance with the following steps：
The first step, generates test vector；
Second step, multiple memorizer test devices are sent to by the test vector, to cause that the multiple memory is surveyed
Trial assembly is put each self-corresponding flash storage to be tested is tested respectively according to the test vector；
3rd step, receives and comes from each self-corresponding test result of the multiple flash storage test device.
Preferably, test vector is generated by controller, the test vector is sent to by multiple Flash by bus and is deposited
Reservoir test device.
In above-mentioned test, the test vector generated by controller is each to flash storage test device self-corresponding
Memory to be tested is tested respectively, it is not necessary to design corresponding build-in self-test for each memory, section
The control logic circuit needed for being tested memory is saved and has made the chip area shared by the control logic circuit, entered
One step reduces hardware cost.
But, in above-mentioned test, be generally set to the maximum of flash storage permission the operating time, cause operation
Having substantial amounts of free time after end does not carry out test operation, or the operating time will be set to empirical value, if in test process
Go wrong, be suitably adjusted, cause test program bad adaptability
In order to solve the above problems, in the present invention, flash storage is tested based on J750HD test systems, led to
Cross and test vector algorithm is optimized, make FLASH memory in test, to erasing and the flag bit or result of write operation
Judged, after operation end and success is judged, be no longer waiting for the remaining operating time and continue to carry out downwards.Namely
Say, employ so-called " matching-circulation " method.
Using above-mentioned " matching-circulation " method, can make in test process, test program adapts to tested Flash storages automatically
Minimum operation time of the device in this test, and being operated by the minimum operation time, make the testing time close to because
The minimum time of flash storage inherent characteristic limitation.
In addition, the above-mentioned test of prior art only carries out the single test of flash storage for each run test program,
Therefore existing method of testing testing efficiency is relatively low.
In order to accelerate test speed, test effect is improved, the present invention is based on J750HD test systems, designs concurrent testing
Adapter and concurrent testing program, make the test program of flash storage allow to carry out many quilts of multiple stations in the same time
The concurrent testing of flash storage is surveyed, and can be accurately positioned and show the test result of each parallel station, list is greatly lowered
The testing time of flash storage.
As shown in figure 1, being the flow chart of flash storage optimal inspection method of the invention.Flash storages of the invention
The optimal inspection method of device includes：
Step S101：Test vector generation step, generates test vector.
Preferably, the test vector is generated by controller, the test vector can be sent into multiple by bus
Flash storage test device.
Step S102：Testing time Optimization Steps, the algorithm to the test vector is optimized, automatic to adapt to tested
Minimum operation time of the flash storage in this test, and operated by the minimum operation time, so that test
Time is close because of the minimum time of flash storage inherent characteristic limitation.
Preferably, the step S102 includes：The test vector is sent to multiple memorizer test devices, to described
The algorithm of test vector is optimized, so that flash storage is in test, to erasing and the flag bit or knot of write operation
Fruit is judged, after operation end and success is judged, is no longer waiting for the remaining operating time and continues to carry out downwards.
Step S103：Concurrent testing rate-determining steps, it is allowed to which the multiple flash storage test device is according to the test
Vector carries out the concurrent testing of the multiple tested flash storages of multiple stations in the same time.
Step S104：Test result receiving step, reception is each corresponded to from the multiple flash storage test device
Test result.
As shown in Fig. 2 being the idiographic flow of above-mentioned concurrent testing of the invention.As shown in Figure 2, in some embodiments
In, above-mentioned concurrent testing may include following steps：
Thread or process construction step S201, build multiple threads or process, and each thread or process are used to control
One flash storage of system, each thread or process are separate；
Synchronous operation step S202, each thread or process independently connect flash storage test device, respectively
Individual thread or Process Synchronization run；
Memorizer test device seizes step S203, when a thread or process are completed to flash storage test device
Operation after, the thread or process discharge the flash storage test device immediately, so that other threads or process can
It is continuing with flash storage test device.
Above-mentioned flash storage optimal inspection method of the invention is practical, easy to use, reliable, Neng Gouyou
Change existing flash storage method of testing, improve the efficiency of flash storage test, it is ensured that electronic system storage is single
The q＆r of unit.
On the other hand, the present invention also provides a kind of flash storage optimal inspection device, and it includes：
Test vector generation module：Generation test vector.
Testing time optimization module：Algorithm to the test vector is optimized, automatic to adapt to tested flash storage
The minimum operation time in this test, and operated by the minimum operation time, make the testing time close to because of Flash
The minimum time of memory inherent characteristic limitation.
Concurrent testing control module：Allow the multiple flash storage test device according to the test vector same
One time carried out the concurrent testing of the multiple tested flash storages of multiple stations.
Test result receiver module：Receive from each self-corresponding test knot of the multiple flash storage test device
Really.
As shown in figure 3, being the structured flowchart of flash storage optimal inspection device of the invention, the optimal inspection device
Including：
Test vector generation module 101：Generation test vector.
Preferably, test vector generation module 101 is set in the controller, is sent to the test vector by bus
Multiple flash storage test devices.
Testing time optimization module 102：Algorithm to the test vector is optimized, and the automatic tested Flash of adaptation is deposited
Minimum operation time of the reservoir in this test, and being operated by the minimum operation time, make the testing time close to because
The minimum time of flash storage inherent characteristic limitation.
Preferably, above-mentioned testing time optimization module 102 may include：
Test vector optimizes submodule (not shown), and the test vector is sent into multiple memorizer test devices, right
The algorithm of the test vector is optimized；And
Judging submodule (not shown), the optimum results of submodule are optimized according to test vector, are surveying flash storage
During examination, flag bit or result to erasing and write operation judge, after operation end and success is judged, are no longer waiting for remaining
Remaining operating time and continue to carry out downwards.
Concurrent testing control module 103：The multiple flash storage test device is allowed to be existed according to the test vector
The same time carries out the concurrent testing of the multiple tested flash storages of multiple stations.
Test result receiver module 104：Receive and come from each self-corresponding test of the multiple flash storage test device
As a result.
As shown in figure 4, the structured flowchart of the concurrent testing control module for the embodiment of the present invention.In certain embodiments,
Above-mentioned concurrent testing control module 103 also includes：
Thread or process build submodule 1031, build multiple threads or process, and each thread or process are used for
One flash storage of control, each thread or process are separate；
Synchronous operation submodule 1032, controls each thread or process independently to connect flash storage and tests
Device, each thread or Process Synchronization run；
Memorizer test device seizes submodule 1033, and control completes to survey flash storage when a thread or process
After the operation that trial assembly is put, the thread or process discharge the flash storage test device immediately, so that other threads or process
Can continue to use flash storage test device.
As a result of concurrent testing control module 103, the test program of flash storage can be made to enter in the same time
The concurrent testing of the multiple tested flash storages of row multiple station, and can be accurately positioned and show the test of each parallel station
As a result, the single testing time of flash storage is greatly lowered.
Furthermore, during due to test, the testing time is made close to because flash storage is solid using testing time optimization module 102
There is the minimum time that characteristic is limited, therefore avoid the waste of the time caused by the minimum operation time is unknown.
Those of ordinary skill in the art should be understood：The discussion of any of the above embodiment is exemplary only, not
It is intended to imply that the scope of the present disclosure (including claim) is limited to these examples；Under thinking of the invention, above example
Or can also be combined between the technical characteristic in different embodiments, step can be realized with random order, and be existed such as
Many other changes of upper described different aspect of the invention, for simplicity, they are provided not in details.Therefore, it is all
Within the spirit and principles in the present invention, any omission, modification, equivalent, improvement for being made etc. should be included in of the invention
Within protection domain.
Claims (8)
1. a kind of optimal inspection method of flash storage, it is characterised in that including：
Test vector generation step, generates test vector；
Testing time Optimization Steps, the algorithm to the test vector is optimized, automatic to adapt to tested flash storage at this
The minimum operation time in secondary test, and operated by the minimum operation time, make the testing time close to because Flash is stored
The minimum time of device inherent characteristic limitation；
Concurrent testing rate-determining steps, it is allowed to which the multiple flash storage test device is according to the test vector with for the moment
Between carry out the concurrent testings of the multiple tested flash storages of multiple stations；
Test result receiving step, receives and comes from each self-corresponding test result of the multiple flash storage test device.
2. the optimal inspection method of flash storage according to claim 1, it is characterised in that the testing time is excellent
Changing step includes：The test vector is sent to multiple flash storage test devices, the algorithm to the test vector enters
Row optimization, makes flash storage in test, and flag bit or result to erasing and write operation judge, when judgement is grasped
Work terminates and after success, is no longer waiting for the remaining operating time and continues to carry out downwards.
3. the optimal inspection method of flash storage according to claim 1 and 2, it is characterised in that the concurrent testing
Including：
Build multiple threads or process, each thread or process are used to controlling a flash storage, each thread or
Process is separate；
Each thread or process independently connect memorizer test device, and each thread or Process Synchronization run；With
And
After a thread or process complete the operation to flash storage test device, the thread or process discharge this immediately
Flash storage test device, so that other threads or process can continue to use flash storage test device.
4. the optimal inspection method of flash storage according to claim 1 and 2, it is characterised in that the test vector
Generated by controller, and the test vector is sent to by multiple flash storage test devices by bus.
5. the optimal inspection device of a kind of flash storage, it is characterised in that including：
Test vector generation module：Generation test vector；
Testing time optimization module：Algorithm to the test vector is optimized, automatic to adapt to tested flash storage herein
The minimum operation time in secondary test, and operated by the minimum operation time, make the testing time close to because Flash is stored
The minimum time of device inherent characteristic limitation；
Concurrent testing control module：Allow the multiple flash storage test device according to the test vector with for the moment
Between carry out the concurrent testings of the multiple tested flash storages of multiple stations；And
Test result receiver module：Receive and come from each self-corresponding test result of the multiple flash storage test device.
6. the optimal inspection device of flash storage according to claim 5, it is characterised in that the testing time is excellent
Changing module includes：
Test vector optimizes submodule, the test vector is sent into multiple flash storage test devices, to the test
The algorithm of vector is optimized；And
Judging submodule, according to the optimum results for testing the vector optimization submodule, makes flash storage in test, right
Erasing and write operation flag bit or result judged, when judge operation terminate and success after, be no longer waiting for remaining behaviour
Make the time and continue to carry out downwards.
7. the optimal inspection device of flash storage according to claim 5, it is characterised in that the concurrent testing control
Molding block is further included：
Thread or process build submodule, build multiple threads or process, and each thread or process are used to control one
Flash storage, each thread or process are separate；
Synchronous operation submodule, controls each thread or process independently to connect flash storage test device, each
Thread or Process Synchronization run；
Memorizer test device seizes submodule, and control is completed to flash storage test device when a thread or process
After operation, the thread or process discharge the flash storage test device immediately, so that other threads or process can continue to
Use flash storage test device.
8. the optimal inspection device according to one of claim 5-7 described flash storage, it is characterised in that by bus
The test vector is sent to the multiple flash storage test device.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107369475A (en) * | 2017-07-18 | 2017-11-21 | 上海市共进通信技术有限公司 | Flash continuously wipes the automated testing method with programming |
| CN109308162A (en) * | 2017-07-26 | 2019-02-05 | 北京兆易创新科技股份有限公司 | Optimization device, optimization method and the equipment of flash memory |
| CN110411442A (en) * | 2018-04-27 | 2019-11-05 | 致伸科技股份有限公司 | Sensor test macro and the method being applied thereon |
| CN112542208A (en) * | 2020-12-29 | 2021-03-23 | 深圳市芯天下技术有限公司 | SD NAND testing method and device, storage medium and terminal |
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Application publication date: 20170623 |