CN103854704A - Automatic detection method and automatic detection device of flash memory bad block - Google Patents
Automatic detection method and automatic detection device of flash memory bad block Download PDFInfo
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- CN103854704A CN103854704A CN201210510107.1A CN201210510107A CN103854704A CN 103854704 A CN103854704 A CN 103854704A CN 201210510107 A CN201210510107 A CN 201210510107A CN 103854704 A CN103854704 A CN 103854704A
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Abstract
The invention discloses an automatic detection method and an automatic detection device of flash memory bad block. The automatic detection method comprises the following steps: starting an embedded system, logging in a website interface, selecting testing software; burning the software into a flash memory; judging whether the burning is successful or not, if the judge result is negative, recording the fail information and burning the testing software for another time, if the judge result is positive, continuing to carry out the next step; restarting the embedded system; operating the testing software, recording the operation information of the testing software; erasing the testing software, and burning the testing software into the flash memory for another time. Testing software is circularly written and erased in a flash memory, and the testing software is operated in an embedded system to detect whether a bad block exists in the flash memory and automatically records the results, so the automatic detection method and the automatic detection device can high-efficiently carry out automatic detections on flash memories, and moreover the error rate is greatly reduced.
Description
Technical field
The present invention relates to a kind of automatic testing method and automatic detection device of flash memory bad block.
Background technology
In in the past 20 years, embedded system is used the memory device of read-only memory as them always, however in recent years flash memory full substitution the status of read-only memory in embedded system, obtained very widely application.Flash memory is the one of storage chip, can revise the data of the inside by specific program.Flash memory not only possesses the performance of electronics erasable programmable, and reading out data, can not lose because of power-off data fast.
But a problem that needs emphasis to consider is its reliability in the time adopting data stored by flash memory.And for the test of reliability of flash memory, writing of needing constantly to repeat wipes to verify.Existing method of testing can only be write and be wiped to detect flash memory and whether have bad piece by manual repeating.But manual detection need to spend a large amount of time of testing staff, is difficult for complete monitoring record simultaneously, can cause testing staff's fatigue, lower efficiency, may cause the problems such as false retrieval.
Summary of the invention
Thereby the technical problem to be solved in the present invention is in prior art, to adopt the method test flash memory reliability of manual detection to bring the not high defect that may cause false retrieval of higher human cost and efficiency in order to overcome, a kind of automatic testing method and automatic detection device of flash memory bad block are proposed, by writing of a web interface circulation, wipe a software program, and whether there is bad piece automatic record by moving this software program detection flash memory in embedded system, thereby can be in automatically detecting omnidistance recording-related information, efficiently flash memory is detected, and be difficult for causing false retrieval.
The present invention solves above-mentioned technical matters by following technical proposals:
The invention provides a kind of automatic testing method of flash memory bad block, comprise a flash memory, this flash memory is installed in an embedded system, and its feature is, this automatic testing method comprises the following steps:
S
101, start this embedded system, log in a web interface, and a selected testing software;
S
102, this testing software is burned onto in this flash memory;
S
103, judge the whether success of this burning process, perform step S be no in the situation that in judged result
104b, perform step S for be in the situation that in judged result
104a;
S
104b, record the information of burning failure, and carry out this step S
102;
S
104a, restart this embedded system;
S
105, move this testing software, record the operation information of this testing software;
S
106, wipe this testing software, and carry out this step S
102.
Wherein, the software program of this testing software as long as can normally moving in this embedded system.Those skilled in the art are to be understood that, this web interface is also referred to as web-based management interface, by url(URL(uniform resource locator)) management embedded system, each step in this automatic testing method is controlled by the instruction of url mode, can also Long-distance Control automatically detect like this in realizing automatic detection.
At this step S
103middlely judge the whether success of this burning process, refer in the completeness of for example burning process of some information from burning process or burning process and whether report an error to judge.In the time that burning process is unsuccessful, records the information of burning failure, and carry out this step S
102, carry out again the burning of this testing software.Only burning process successfully can not be determined in flash memory not bad piece, thus also need to be burned onto this testing software in this flash memory restarting operation after this embedded system, and record this operation information.If this testing software cannot normally move in this embedded system, that just illustrates that this flash memory still exists bad piece.After once completing, need to wipe this testing software, so that carry out test next time.
It will be appreciated by those skilled in the art that the information of burning failure and this operation information, except comprising the relevant information of this testing software, also should record temporal information.In this automatic testing method of the present invention, do not comprise and whether exist bad piece to do directly judgement to this flash memory, but by circulation automatic test repeatedly, by omnidistance the relevant information in test record, so that provide the comprehensively sufficient information of those skilled in the art to judge whether this flash memory exists bad piece, and can greatly reduce the possibility that false retrieval occurs.
Preferably, this step S
105comprise the following steps:
S
1051, open this testing software;
S
1052, revise the configuration of this embedded system;
S
1053, check whether the configuration of amendment comes into force, and record result.
By revising the configuration of this embedded system, and check whether come into force, can be stricter to being burned onto, whether this testing software of this flash memory complete errorlessly judges.
Preferably, this step S
102this testing software of middle burning completes by a curl order.
Curl order is the file transfer instrument that a kind of url of utilization grammer is worked under command line mode, utilizes curl order can easily carry out the burning of this testing software.The concrete setting of this curl order belongs to this area routine techniques means, does not repeat them here.
The present invention also provides a kind of automatic detection device of flash memory bad block, and its feature is, comprising:
One burning module, for being burned onto a testing software in one flash memory of one embedded system;
One judge module, be used for judging that whether this burning process is successful, restart this embedded system and enable a detection module for be in the situation that in judged result, the information of burning failure is stored to a memory module and enables this burning module be no in the situation that in judged result;
This detection module, for moving this testing software, is stored to this memory module by the operation information of this testing software, and enables one and wipe module;
This wipes module, for wiping this testing software at this flash memory, and enables this burning module;
This memory module, for storing information and this operation information of burning failure.
Preferably, this detection module comprises that a dispensing unit and checks unit, and this dispensing unit is for moving this testing software and revising the configuration of this embedded system, and this checks whether unit comes into force for the configuration that checks amendment.
Meeting on the basis of this area general knowledge, above-mentioned each optimum condition, can combination in any, obtains the preferred embodiments of the invention.
Positive progressive effect of the present invention is:
The automatic testing method of a kind of flash memory bad block of the present invention and automatic detection device, write, wipe a testing software by circulation, and whether there is bad piece automatic record by moving this testing software detection flash memory in embedded system, thereby omnidistance recording-related information in automatically detecting, can detect flash memory efficiently, and be difficult for causing false retrieval.
Brief description of the drawings
Fig. 1 is the process flow diagram of the automatic testing method of the flash memory bad block of the embodiment of the present invention 1.
Fig. 2 is the schematic diagram of the automatic detection device of the flash memory bad block of the embodiment of the present invention 3.
Embodiment
Provide preferred embodiment of the present invention below in conjunction with accompanying drawing, to describe technical scheme of the present invention in detail, but therefore do not limit the present invention among described scope of embodiments.
As shown in Figure 1, the automatic testing method of the flash memory bad block of the present embodiment, comprises a flash memory, and this flash memory is installed in an embedded system, and this automatic testing method comprises the following steps:
S
101, start this embedded system, log in a web interface, and a selected testing software;
S
102, this testing software is burned onto in this flash memory;
S
103, judge the whether success of this burning process, perform step S be no in the situation that in judged result
104b, perform step S for be in the situation that in judged result
104a;
S
104b, record the information of burning failure, and carry out this step S
102;
S
104a, restart this embedded system;
S
105, move this testing software, record the operation information of this testing software;
S
106, wipe this testing software, and carry out this step S
102.
At this step S
103middlely judge the whether success of this burning process, refer in the completeness of for example burning process of some information from burning process or burning process and whether report an error to judge.In the time that burning process is unsuccessful, records the information of burning failure, and carry out this step S
102.Only burning process successfully can not be determined in flash memory not bad piece, so also need to be burned onto this testing software in this flash memory restarting after this embedded system operation, and record this operation information, judge from the angle of this testing software of being newly burnt to this flash memory.If this testing software cannot normally move in this embedded system, that just illustrates that this flash memory still exists bad piece.After once completing, need to wipe this testing software, so that carry out test next time.
In this automatic testing method of the present invention, do not comprise and whether exist bad piece to do directly judgement to this flash memory, but by circulation automatic test repeatedly, by omnidistance the relevant information in test record, so that provide the comprehensively sufficient information of those skilled in the art to judge whether this flash memory exists bad piece, can greatly reduce the possibility that false retrieval occurs.
Hold intelligible, if record information show that, in the test of continuous several times, this testing software all can normally move, that just illustrates not bad piece of this flash memory.And if record the information of burning failure repeatedly or the information that this testing software cannot normally move, can be easy to judge has bad piece exist in this flash memory.
Preferably, this step S
102this testing software of middle burning completes by a curl order.
Utilize curl order can easily carry out the burning of this testing software.The concrete setting of this curl order belongs to this area routine techniques means, does not repeat them here.
Embodiment 2
The automatic testing method of the flash memory bad block of the present embodiment is compared with embodiment 1, and difference is only:
This step S
105comprise the following steps:
S
1051, open this testing software;
S
1052, revise the configuration of this embedded system;
S
1053, check whether the configuration of amendment comes into force, and record result.
By revising the configuration of this embedded system, and check whether come into force, can be stricter to being burned onto, whether this testing software of this flash memory complete errorlessly judges.
Embodiment 3
As shown in Figure 2, the automatic detection device 1 of the flash memory bad block of the present embodiment comprises:
One burning module 11, for being burned onto a testing software in one flash memory of one embedded system;
One judge module 12, be used for judging that whether this burning process is successful, restart this embedded system and enable a detection module 13 for be in the situation that in judged result, the information of burning failure is stored to a memory module 15 and enables this burning module 11 be no in the situation that in judged result;
This detection module 13, for moving this testing software, is stored to this memory module 15 by the operation information of this testing software, and enables one and wipe module 14;
This wipes module 14, for wiping this testing software at this flash memory, and enables this burning module 11;
This memory module 15, for storing information and this operation information of burning failure.
Preferably, this detection module 13 comprises that a dispensing unit and checks unit, and this dispensing unit is for moving this testing software and revising the configuration of this embedded system, and this checks whether unit comes into force for the configuration that checks amendment.
Although more than described the specific embodiment of the present invention, it will be understood by those of skill in the art that these only illustrate, protection scope of the present invention is limited by appended claims.Those skilled in the art is not deviating under the prerequisite of principle of the present invention and essence, can make various changes or modifications to these embodiments, but these changes and amendment all fall into protection scope of the present invention.
Claims (5)
1. an automatic testing method for flash memory bad block, comprises a flash memory, and this flash memory is installed in an embedded system, it is characterized in that, this automatic testing method comprises the following steps:
S
101, start this embedded system, log in a web interface, and a selected testing software;
S
102, this testing software is burned onto in this flash memory;
S
103, judge the whether success of this burning process, perform step S be no in the situation that in judged result
104b, perform step S for be in the situation that in judged result
104a;
S
104b, record the information of burning failure, and carry out this step S
102;
S
104a, restart this embedded system;
S
105, move this testing software, record the operation information of this testing software;
S
106, wipe this testing software, and carry out this step S
102.
2. automatic testing method as claimed in claim 1, is characterized in that, this step S
105comprise the following steps:
S
1051, open this testing software;
S
1052, revise the configuration of this embedded system;
S
1053, check whether the configuration of amendment comes into force, and record result.
3. automatic testing method as claimed in claim 1, is characterized in that, this step S
102this testing software of middle burning completes by a curl order.
4. an automatic detection device for flash memory bad block, is characterized in that, comprising:
One burning module, for being burned onto a testing software in one flash memory of one embedded system;
One judge module, be used for judging that whether this burning process is successful, restart this embedded system and enable a detection module for be in the situation that in judged result, the information of burning failure is stored to a memory module and enables this burning module be no in the situation that in judged result;
This detection module, for moving this testing software, is stored to this memory module by the operation information of this testing software, and enables one and wipe module;
This wipes module, for wiping this testing software at this flash memory, and enables this burning module;
This memory module, for storing information and this operation information of burning failure.
5. automatic detection device as claimed in claim 4, it is characterized in that, this detection module comprises that a dispensing unit and checks unit, and this dispensing unit is for moving this testing software and revising the configuration of this embedded system, and this checks whether unit comes into force for the configuration that checks amendment.
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| CN201210510107.1A CN103854704A (en) | 2012-12-03 | 2012-12-03 | Automatic detection method and automatic detection device of flash memory bad block |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105182371A (en) * | 2015-10-08 | 2015-12-23 | 上海华测导航技术股份有限公司 | GNSS product automatic test method based on function test |
| CN107357696A (en) * | 2017-06-22 | 2017-11-17 | 上海斐讯数据通信技术有限公司 | A kind of bad block method of testing of nonvolatile storage and system |
| CN107369475A (en) * | 2017-07-18 | 2017-11-21 | 上海市共进通信技术有限公司 | Flash continuously wipes the automated testing method with programming |
| CN107562584A (en) * | 2017-07-25 | 2018-01-09 | 郑州云海信息技术有限公司 | It is a kind of to verify the method for refreshing storage device success rate in whole machine cabinet |
| CN108491740A (en) * | 2018-02-01 | 2018-09-04 | 珠海全志科技股份有限公司 | A kind of TF card performance method of real-time |
| CN108694988A (en) * | 2017-03-29 | 2018-10-23 | 爱思开海力士有限公司 | Memory testing system and its operating method |
| CN109119124A (en) * | 2018-08-27 | 2019-01-01 | 湖南国科微电子股份有限公司 | The production method and solid state hard disk of solid state hard disk |
| CN116564398A (en) * | 2023-05-26 | 2023-08-08 | 北京得瑞领新科技有限公司 | Method and device for detecting nor flash memory and embedded equipment |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105182371A (en) * | 2015-10-08 | 2015-12-23 | 上海华测导航技术股份有限公司 | GNSS product automatic test method based on function test |
| CN108694988A (en) * | 2017-03-29 | 2018-10-23 | 爱思开海力士有限公司 | Memory testing system and its operating method |
| CN108694988B (en) * | 2017-03-29 | 2022-09-23 | 爱思开海力士有限公司 | Memory test system and operation method thereof |
| CN107357696A (en) * | 2017-06-22 | 2017-11-17 | 上海斐讯数据通信技术有限公司 | A kind of bad block method of testing of nonvolatile storage and system |
| CN107369475A (en) * | 2017-07-18 | 2017-11-21 | 上海市共进通信技术有限公司 | Flash continuously wipes the automated testing method with programming |
| CN107562584A (en) * | 2017-07-25 | 2018-01-09 | 郑州云海信息技术有限公司 | It is a kind of to verify the method for refreshing storage device success rate in whole machine cabinet |
| CN108491740A (en) * | 2018-02-01 | 2018-09-04 | 珠海全志科技股份有限公司 | A kind of TF card performance method of real-time |
| CN109119124A (en) * | 2018-08-27 | 2019-01-01 | 湖南国科微电子股份有限公司 | The production method and solid state hard disk of solid state hard disk |
| CN109119124B (en) * | 2018-08-27 | 2020-05-26 | 湖南国科微电子股份有限公司 | Production method of solid state disk and solid state disk |
| CN116564398A (en) * | 2023-05-26 | 2023-08-08 | 北京得瑞领新科技有限公司 | Method and device for detecting nor flash memory and embedded equipment |
| CN116564398B (en) * | 2023-05-26 | 2023-12-22 | 北京得瑞领新科技有限公司 | Method and device for detecting nor flash memory and embedded equipment |
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Application publication date: 20140611 |