CN1595537A - A system for simulating physical damage of NAND flash memory and method thereof - Google Patents
A system for simulating physical damage of NAND flash memory and method thereof Download PDFInfo
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- CN1595537A CN1595537A CN 200410035405 CN200410035405A CN1595537A CN 1595537 A CN1595537 A CN 1595537A CN 200410035405 CN200410035405 CN 200410035405 CN 200410035405 A CN200410035405 A CN 200410035405A CN 1595537 A CN1595537 A CN 1595537A
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Abstract
The invention relates to an imitation system and the related method, which is used to imitate the physically damage done to the NAND flash memory. Using serial port, the communication link is set up between the upper machine and the lower one. The detecting block is downloaded to the lower machine from the upper one. Start and run, the existing real physics bad blocks can be seen in the memory of the lower machine, through communicating with the upper machine. Users may program the operation sequences, increase the imitated bad blocks of the memory, and make the procedure reversible. With the operation sequences executed in batch processing mode, the physically damaged NAND memory can then be imitated.
Description
Technical field
The present invention relates to the technical field of storer physical damage, be specifically related to NAND flash storer is carried out the simulation system and the method thereof of physical damage.
Background technology
Along with the develop rapidly of present electronic equipment, the software control amount of electronic product increases greatly, and therefore the storage to the electronic appliance software program becomes an insoluble problem.In order to address that need, NAND type flash storer arises at the historic moment, increase along with procedure quantity, nand memory is fit to jumbo storage more, because NAND is under the situation that big memory space can guarantee, that volume can be done simultaneously is very little, and execution speed improves a lot, therefore at present numerous mobile phone, MP3 equipment, digital camera and USB flash disks media that adopt this NAND flash storer as storage more.Because nand type memory can not directly carry out read-write operation by the read write command of CPU to it, and electronic equipment development company can't be seen intuitively for the storage area that NAND type Products Development is relevant to NAND.And damaging may appear in the storage block block of NAND flash storer, nand type memory is except first block, storer manufacturer does not guarantee that all block all do not damage when dispatching from the factory, therefore need electronic equipment manufacturer that fault-tolerant processing after block breaks down can be provided.
Owing to the instability of NAND flash memory section product, the situation of bad piece might appear at any time, and give and adopt NAND flash to bring the solution of more error handling processing as the research and development of the electronic product of data-carrier store.Yet whether the makeing mistakes of portion's product is not to control, and this storage block damage probability should be lower on engineering.Because the position of makeing mistakes also is unfixing, thus portion's product of really makeing mistakes sought, and the position of bad piece is difficult to accomplish in the research and development of products application of place in reality that we require, so the fault-tolerant processing after storage block breaks down is difficult to verify.
Summary of the invention
Purpose of the present invention, just provide and a kind of NAND flash storer is carried out physical damage system for simulating and method, can the arbitrary bad piece of on nand type memory, producing simulation, for the research staff provides a kind of good simulation environment of makeing mistakes, utilize this invention, can on intact portion's product, imitate the bad piece of makeing mistakes arbitrarily, and the piece of can giving a piece of bad advice appears at Anywhere.So just can simulate the nand memory that produces physical damage fully, but thereby provide the experiment porch of a storer error handling processing for the research staff, can verify the fault-tolerant processing ability of electronic equipment after the block of storer breaks down, improve the fault-tolerant processing ability of electronic equipment greatly.
Native system adopts serial communication, and application host computer (PC) is set up communication with slave computer and is connected, and detection module is downloaded in the slave computer by PC, utilizes detection module to substitute the program of lower computer operation then.Mutual by with host computer can be seen the real bad piece of physics that has existed in the slave computer storer, then, as required, the user is scheduled operation easily, increase the bad piece of simulation of storer, or changing original bad piece of simulation becomes available block.The sequence of operation is carried out by batch processing mode.
NAND flash storer is carried out the physical damage system for simulating comprises that computing machine as host computer, slave computer are the electronic equipments that adopts NAND flash storer, connect the data line of host computer and slave computer, it is characterized in that also comprising:
The user generates the instruction editing device of bad piece of simulation or bad piece of cancellation simulation to some piece in the storer;
Reception PC control instruction, and the NAND controller of giving on adding on some piece of a storer specific character mark or cancelling this character marking transmits the detection module of data;
The display-memory dynamic similation is gone bad the device of watching of block condition.
Slave computer is to adopt mobile phone, MP3, USB flash disk, digital camera or the PDA of NAND flash storer as data storage device.
The data line that connects host computer and slave computer is serial port data line or USB port data line.
Storer is generated bad piece of simulation or cancels the instruction editing device employing batch processing mode that bad piece of simulation carries out.
The user is by the piece in the sequence number define storage.
A kind of method of NAND flash storer being carried out the physical damage simulation, this method comprises the computing machine as host computer, slave computer is the electronic equipment that adopts NAND flash storer, connects the data line of host computer and slave computer, it is characterized in that may further comprise the steps:
Host computer is set up with slave computer and is communicated by letter, the step that slave computer is downloaded detection module and started;
Detection module is checked the bad piece of necessary being in the storer, and watches the step of display result in the device at host computer;
The user sends instruction, requires to generate on some piece of storer the step of bad piece of simulation or bad piece of cancellation simulation;
Slave computer receives user instruction, by NAND controller specific character mark or cancel this character marking on adding on some piece of storer, and in the host computer user interface step of the bad block condition of display-memory simulation.
Slave computer is to adopt mobile phone, MP3, USB flash disk, digital camera or the PDA of NAND flash storer as data storage device.
The data line that connects host computer and slave computer is serial port data line or USB port data line.
Host computer generates the instruction that bad piece of simulation or bad piece of cancellation simulation carry out to storer and carries out the batch processing editor.
The user is by the piece in the sequence number define storage.
Description of drawings
Below in conjunction with drawings and Examples the present invention is further described.
Fig. 1 is a hardware connection side block diagram of the present invention;
Fig. 2 is an overall system software flow pattern of the present invention;
Fig. 3 is the bad piece simulated technological process of slave computer of the present invention figure.
Embodiment
As shown in Figure 1, host computer is a computing machine, slave computer is to adopt the mobile phone of enable nand gate flash type storer as program recorded medium, host computer is connected by serial ports with slave computer, because data transmission requires little, therefore adopt serial ports to connect,, can take USB port to connect if volume of transmitted data is bigger.
Host computer mainly is responsible for the process of generation and the communication connection and the detection module implantation of user instruction editor, the dynamic demonstration of simulating the block that breaks down, user's predetermined operation sequence.
Management, command response, communication that slave computer mainly is responsible for the NAND controller connect.
As shown in Figure 2, main flow process of the present invention is to finish control procedure by host computer and slave computer by the transmission of signaling.Host computer is the main body of control, and signaling is initiated by host computer procedure.
Use host computer (PC) and set up communication with mobile phone and is connected, detection module is downloaded in the mobile phone by PC, start detection module then, the alternative handset program of detection module moves.
After the detection module acquire the right of control, detection module can be checked the present memory state situation of mobile phone one time, and the real bad piece of physics that has existed in the mobile phone memory returns to host computer to present memory state.Host computer demonstrates present memory state dynamically according to memory state in watching device.
After top operation finishes, detection module can enter the signaling process circulation, etc. the pending command sequence that sends by host computer, at this moment, the user can formulate the sequence of operation of oneself on host computer procedure, require some piece of storer to generate bad piece of simulation or bad piece of cancellation simulation, the sequence number of user's input store in editing device, wish that such as the user the 20th piece of storer is modeled to bad piece, just in editing device, import 20 as a sequence of operation, the user wishes that the 20th to 30 of storeies all are modeled to bad piece, and just input 20-30 carries out predetermined operation as the sequence of operation by batch processing mode in editing device.
After the user has formulated the sequence of operation that oneself needs, select to carry out, at this moment, host computer decomposes command sequence, sends to detection module one by one and handles.
Detection module each bar instruction that is finished all can the link order executing state.Host computer receives the instruction executing state, and is shown to the user in checking device.No matter the result how, as long as communication connects constantly, command sequence all can be carried out in proper order, all is finished until all command sequences.
After command sequence was finished, host computer procedure sent the refresh refresh command, and trace routine reexamines at present dynamic storage state, and the bad block condition of storer is returned to host computer, dynamically was shown to the user.
Fig. 3 is the flow process that the slave computer analog physical damages, slave computer uses the nand type memory of samsung Samsung, the characteristic decision of NANDflash storer, in the time of a NAND flash block physical damage, the special address of his block has the specific character mark.Therefore, we utilize this characteristics, the realization of refresh order be exactly in the consults memory the special address of each block have or not the specific character mark, if having, indicating this block physical damage so.Same, this specific character labelling method we simulate realized after, the physical address that just becomes simulation damages, the physical address that promptly can produce simulation damages, the physical address that also can cancel simulation damages.Because NAND flash can not directly visit by memory address, so all bottom operations are all undertaken by the NAND controller.
Therefore, the bottom layer realization of the sequence of operation is as follows:
(1) detection module receives an operational order from the sequence of operation;
(2), be labeled as the bottom function response of bad piece so if be labeled as bad block operations of simulation; If bad block operations of cancellation simulation, the bottom function response of removing bad piece so.
(3) no matter be the sort of operation, all operate by the NAND controller, the response of concurrent back operations success, after operation is finished, return to host computer by serial ports and be shown to the user, followed by continuing to enter operation cycle, after all sequences of operation are finished, be subjected to the refresh refresh command, return the current phone state.
Claims (10)
1. one kind is carried out the physical damage system for simulating to NAND flash storer, this system comprises the computing machine as host computer, slave computer is the electronic equipment that adopts NAND flash storer, connects the data line of host computer and slave computer, it is characterized in that also comprising:
The user generates the instruction editing device of bad piece of simulation or bad piece of cancellation simulation to some piece in the storer;
Reception PC control instruction, and the NAND controller of giving on adding on some piece of a storer specific character mark or cancelling this character marking transmits the detection module of data;
The display-memory dynamic similation is gone bad the device of watching of block condition.
2. according to claim 1 NAND flash storer is carried out the physical damage system for simulating, it is characterized in that slave computer is to adopt mobile phone, MP3, USB flash disk, digital camera or the PDA of NAND flash storer as data storage device.
3. according to claim 1 NAND flash storer is carried out the physical damage system for simulating, the data line that it is characterized in that connecting host computer and slave computer is serial port data line or USB port data line.
4. according to claim 1 NAND flash storer is carried out the physical damage system for simulating, it is characterized in that storer is generated the instruction editing device that bad piece of simulation or bad piece of cancellation simulation carry out adopts batch processing mode.
5. according to any claim in the claim 1 to 4 is described NAND flash storer is carried out the physical damage system for simulating, it is characterized in that the user passes through the piece in the sequence number define storage.
6. method of NAND flash storer being carried out physical damage simulation, this method comprises the computing machine as host computer, slave computer is the electronic equipment that adopts NAND flash storer, connects the data line of host computer and slave computer, it is characterized in that may further comprise the steps:
Host computer is set up with slave computer and is communicated by letter, the step that slave computer is downloaded detection module and started;
Detection module is checked the bad piece of necessary being in the storer, and in the host computer user interface step of display result;
The user sends instruction, requires to generate on some piece of storer the step of bad piece of simulation or bad piece of cancellation simulation;
Slave computer receives user instruction, by NAND controller specific character mark or cancel this character marking on adding on some piece of storer, and watches the step of the bad block condition of display-memory simulation in the device at host computer.
7. the method that NAND flash storer is carried out the physical damage simulation according to claim 6 is characterized in that slave computer is to adopt mobile phone, MP3, USB flash disk, digital camera or the PDA of NAND flash storer as data storage device.
8. the method that NAND flash storer is carried out physical damage simulation according to claim 6, the data line that it is characterized in that connecting host computer and slave computer is serial port data line or USB port data line.
9. the method that NAND flash storer is carried out physical damage simulation according to claim 6 is characterized in that host computer generates the instruction that bad piece of simulation or bad piece of cancellation simulation carry out to storer and carries out the batch processing editor.
10. according to the described method that NAND flash storer is carried out the physical damage simulation of any claim in the claim 6 to 9, it is characterized in that the user passes through the piece in the sequence number define storage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CNB2004100354055A CN100337285C (en) | 2004-07-13 | 2004-07-13 | A system for simulating physical damage of NAND flash memory and method thereof |
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| CNB2004100354055A CN100337285C (en) | 2004-07-13 | 2004-07-13 | A system for simulating physical damage of NAND flash memory and method thereof |
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| CN1595537A true CN1595537A (en) | 2005-03-16 |
| CN100337285C CN100337285C (en) | 2007-09-12 |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103854704A (en) * | 2012-12-03 | 2014-06-11 | 上海斐讯数据通信技术有限公司 | Automatic detection method and automatic detection device of flash memory bad block |
| CN104375913A (en) * | 2014-11-14 | 2015-02-25 | 浪潮(北京)电子信息产业有限公司 | Method and device for testing capacity of storage system for tolerating bad sector |
| CN104750535A (en) * | 2013-12-26 | 2015-07-01 | 珠海全志科技股份有限公司 | NAND Flash simulation controller and controlling and debugging method |
| CN106339246A (en) * | 2016-08-31 | 2017-01-18 | 福建联迪商用设备有限公司 | Programming method and programming system used in production phase of NANDFLASH |
| CN106909484A (en) * | 2017-03-06 | 2017-06-30 | 郑州云海信息技术有限公司 | A kind of system and method for the test of storage environment Imitating low-quality disk |
| CN109545266A (en) * | 2018-11-13 | 2019-03-29 | 深圳忆联信息系统有限公司 | A kind of solid state hard disk finds weak piece of method and its system |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7416755A (en) * | 1974-12-23 | 1976-06-25 | Philips Nv | METHOD AND DEVICE FOR TESTING A DIGITAL MEMORY. |
| CN1048624A (en) * | 1989-07-07 | 1991-01-16 | 约翰弗兰克制造公司 | The method and apparatus of ROM (read-only memory) fault diagnosis |
| US6754117B2 (en) * | 2002-08-16 | 2004-06-22 | Micron Technology, Inc. | System and method for self-testing and repair of memory modules |
-
2004
- 2004-07-13 CN CNB2004100354055A patent/CN100337285C/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103854704A (en) * | 2012-12-03 | 2014-06-11 | 上海斐讯数据通信技术有限公司 | Automatic detection method and automatic detection device of flash memory bad block |
| CN104750535A (en) * | 2013-12-26 | 2015-07-01 | 珠海全志科技股份有限公司 | NAND Flash simulation controller and controlling and debugging method |
| CN104750535B (en) * | 2013-12-26 | 2018-08-07 | 珠海全志科技股份有限公司 | NAND Flash emulation controllers and control adjustment method |
| CN104375913A (en) * | 2014-11-14 | 2015-02-25 | 浪潮(北京)电子信息产业有限公司 | Method and device for testing capacity of storage system for tolerating bad sector |
| CN106339246A (en) * | 2016-08-31 | 2017-01-18 | 福建联迪商用设备有限公司 | Programming method and programming system used in production phase of NANDFLASH |
| CN106909484A (en) * | 2017-03-06 | 2017-06-30 | 郑州云海信息技术有限公司 | A kind of system and method for the test of storage environment Imitating low-quality disk |
| CN106909484B (en) * | 2017-03-06 | 2019-12-17 | 苏州浪潮智能科技有限公司 | System and method for simulating bad disk test in storage environment |
| CN109545266A (en) * | 2018-11-13 | 2019-03-29 | 深圳忆联信息系统有限公司 | A kind of solid state hard disk finds weak piece of method and its system |
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| Publication number | Publication date |
|---|---|
| CN100337285C (en) | 2007-09-12 |
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