CN107341780A - A kind of Infrared images pre-processing bearing calibration - Google Patents
A kind of Infrared images pre-processing bearing calibration Download PDFInfo
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- G06T2207/10—Image acquisition modality
- G06T2207/10048—Infrared image
Abstract
The invention discloses a kind of Infrared images pre-processing bearing calibration, it is characterised in that comprises the following steps：Step 1：Using the infrared image overall data X of the infrared detector collection target with camera lens；Step 2：The high-temperature infrared image overall data X of black matrix target when gathering high temperature using the infrared detector with camera lensH1With the low temperature infrared image overall data X of black matrix target during low temperatureL1, and calculate high-temperature infrared image overall data XH1With low temperature infrared image overall data XL1Between correction parameter a1And b1.Invention introduces have camera lens and without camera lens infrared detector gathered data, carry out two point correction processing, the image non-uniform caused by infrared detector catch noise is reduced, so that the pretreatment calibration result of infrared image is more accurate.Meanwhile computing of the present invention is simple, treatment effeciency is high, real-time is good, has good market potential, can carry out pretreatment nonuniformity correction to various IR Scenes.
Description
Technical field
The present invention relates to infrared image processing technology field, and in particular to a kind of Infrared images pre-processing bearing calibration.
Background technology
Nowadays, non-refrigerated infrared focal plane probe is one of infrared detector species with the fastest developing speed,
As the important research direction of domestic and international researcher.Cardinal principle is that the heat of object in scene is obtained by infrared focal plane array
Radiation information, imaging is carried out into rear end so as to being converted into electric signal and is shown.Infrared focal plane array has small volume, weight
Gently, the advantages that strong antijamming capability, low-power consumption, high sensitivity, moreover it is possible in round-the-clock carry out steady operation.Infrared focus plane at present
Array image-forming has been widely applied to the various fields such as military security monitor, military guidance, monitoring among the people, remote sensing, medical treatment.
Infrared detector has generally included movement, focal plane, catch, camera lens etc.；Wherein, infrared focal plane array be by into
The detection member composition of thousand quantity up to ten thousand, in ideal conditions, when infrared focal plane array obtains uniform heat radiating object, each
The amplitude of detection member output is identical.However, because infrared detector can be influenceed by material, process conditions etc. so that visit
First existing defects are surveyed, under uniform heat radiation, the amplitude of infrared detector output also differs, i.e. infrared focal plane array
Generate heterogeneity.In addition, in addition to the heterogeneity caused by the defects of array elements itself, the influence of outside environmental elements
Infrared focal plane array can be made to produce heterogeneity；For example, when infrared detector catch, camera lens temperature change when can also make it is red
Outer focal plane arrays (FPA) produces heterogeneity.The heterogeneity of infrared focus plane can cause array elements responsiveness to differ, serious drop
The low temperature resolution and image quality of imaging system.
The content of the invention
It is an object of the invention to overcome, with caused by movement temperature change, detector shell, camera lens, catch etc. are non-master
Want signal overall variation that detector caused by the heating of echo signal and the change of probe substrate temperature exports and it is non-
A kind of the defects of even property changes and influences the temperature resolution and image quality of imaging system, there is provided Infrared images pre-processing school
Correction method.
The purpose of the present invention passes through following technical proposals reality：A kind of Infrared images pre-processing bearing calibration, including it is following
Step：
Step 1：Using the infrared image overall data X of the infrared detector collection target with camera lens；
Step 2：The high-temperature infrared image overall data of black matrix target when gathering high temperature using the infrared detector with camera lens
XH1With the low temperature infrared image overall data X of black matrix target during low temperatureL1, and calculate high-temperature infrared image overall data XH1With it is low
Warm infrared image overall data XL1Between correction parameter a1And b1；
Step 3：The camera lens of infrared detector is removed, the high-temperature infrared image of black matrix target integrally counts when gathering high temperature
According to XH2With the low temperature infrared image overall data X of black matrix target during low temperatureL2, and calculate high-temperature infrared image overall data XH2With
Low temperature infrared image overall data XL2Between correction parameter a2And b2；
Step 4：The camera lens of infrared detector is removed, gathers the infrared image overall data of infrared detector catch, and
Nonuniformity correction processing, data X after being corrected are carried out to the infrared image overall data of infrared detector catchB；
Step 5：Nonuniformity correction is carried out to the infrared image overall data X of the target in step 1, obtains correcting result
Y。
Further, high-temperature infrared image overall data X is calculated in the step 2H1With low temperature infrared image overall data
XL1Between correction parameter a1And b1Method be：
YHm+L1=a1.*(XHm+X1)+b1 (1)
YLm+L1=a1.*(XLm+X1)+b1 (2)
Wherein, XHmThe high-temperature infrared view data of black matrix target, X when gathering high temperature with camera lens for infrared detectorLmTo be red
The low temperature infrared picture data of black matrix target, X when external detector gathers low temperature with camera lens1For error information, high-temperature infrared image
Overall data XH1=XHm+X1, low temperature infrared image overall data XL1=XLm+X1, YHmFor high-temperature infrared view data XHmAfter correction
Array, YLmFor low temperature infrared picture data XLmArray after correction, L1For error information X1Array after correction, a1For gain
Correction parameter, b1For bias correction parameter, YHm+L1For high-temperature infrared image overall data XH1Array after correction, YLm+L1To be low
Warm infrared image overall data XL1Array after correction；Wherein,
(i, j) is the pixel that coordinate is the i-th row jth row, and M is infrared focal plane array line number, and N is infrared focal plane array
Columns；Formula (3) is substituted into formula (1), formula (4) is substituted into formula (2), drawn then in conjunction with formula (1) and formula (2)：
b1=YHm+L1-a1.*(XHm+X1) (6)。
High-temperature infrared image overall data X is calculated in the step 3H2With low temperature infrared image overall data XL2Between
Correction parameter a2And b2Method be：
YHB+L2=a2.*(XHB+X2)+b2 (7)
YLB+L2=a2.*(XLB+X2)+b2 (8)
Wherein, XHBThe high-temperature infrared view data of black matrix target, X during the high temperature gathered without camera lens for infrared detectorLB
The low temperature view data of black matrix target, X during the low temperature gathered without camera lens for infrared detector2For error information, high temperature image
Overall data XH2=XHB+X2, low temperature image overall data XL2=XLB+X2, YHBFor high-temperature infrared view data XHBBattle array after correction
Row, YLBFor low temperature infrared picture data XLBArray after correction, L2For error information X2Array after correction, a2For gain calibration
Parameter, b2For bias correction parameter, YHB+L2For high temperature image overall data XH2Array after correction, YLB+L2It is whole for low temperature image
Volume data XL2Array after correction；Wherein,
(i, j) is the pixel that coordinate is the i-th row jth row, and M is the line number of infrared focal plane array, and N is infrared focus plane battle array
The columns of row；Formula (9) is substituted into formula (7), formula (10) is substituted into formula (8), then in conjunction with formula (7) and formula (8)
Draw：
b2=YHB+L2-a2.*(XHB+X2) (12)。
The public affairs of nonuniformity correction processing are carried out to the infrared image overall data of infrared detector catch in the step 4
Formula is：
XB=YB+L2=a2.*(B+X2)+b2 (13)
B be infrared detector catch infrared picture data, X2For error information, L2For error information X2Battle array after correction
Row, YBFor the array after the infrared picture data B corrections of infrared detector catch, YB+L2For the infrared figure of infrared detector catch
Array after being corrected as overall data.
It is to the updating formula of the infrared image overall data X progress nonuniformity corrections of target in the step 5：
Y=(Ym+L1)-(YB+L2)
=a1.*(Xm+X1)+b1-a2.*(B+X2)-b2 (14)
Formula (14) obtains after arranging：
Y=a1.*Xm-a2.*B+(YHm+L1-YHb-L2)-(a1.*XHm-a2.*XHB) (15)
Wherein, XmFor the infrared picture data of target, the infrared image overall data X=X of targetm+X1, YmFor target
Infrared picture data XmData after correction, Y are the data after the infrared image overall data X corrections of target.
The present invention has advantages below and beneficial effect compared with prior art：The present invention is using black matrix target as referring to spoke
Source is penetrated, and black matrix target data is gathered by infrared detector with camera lens and without camera lens two states, and carries out two point correction
Processing；The data of infrared detector catch are gathered simultaneously, and the data of infrared detector catch are corrected；Finally combine school
Correction data is corrected to the data for the target that need to be detected, and effectively reduces target data because of infrared detector catch noise
Caused image non-uniform, so that the pretreatment calibration result of infrared image is more accurate.Meanwhile computing letter of the present invention
Single, treatment effeciency height, real-time are good, have good market potential, various IR Scenes can be carried out to pre-process non-homogeneous school
Just.
Embodiment
The present invention is described in further detail with reference to embodiment, but embodiments of the present invention are not limited to
This.
Embodiment
A kind of Infrared images pre-processing bearing calibration disclosed by the invention, is concretely comprised the following steps：
First, the infrared image overall data X of target is gathered；Need to detect using the infrared detector collection with camera lens
Target infrared image overall data X.
Secondly, the high-temperature infrared image overall data X of black matrix target when gathering high temperature using the infrared detector with camera lensH1
With the low temperature infrared image overall data X of black matrix target during low temperatureL1, and calculate high-temperature infrared image overall data XH1And low temperature
Infrared image overall data XL1Between correction parameter a1And b1.In the present embodiment, the black matrix target, which is used as, refers to uniform spoke
Penetrate source.
Specifically, collection high temperature when black matrix target high-temperature infrared image overall data XH1Refer to that in temperature be 50 DEG C~90
DEG C when the overall data of black matrix target that is gathered, the overall data of the black matrix target gathered when such as temperature being 70 DEG C；Gather low
The low temperature infrared image overall data X of black matrix target when warmL1Refer to the black matrix target gathered when temperature is by 10 DEG C~30 DEG C
Overall data, the overall data of black matrix target gathered when such as temperature being 20 DEG C.By gathering the black matrix mesh at a temperature of two kinds
Target overall data, high-temperature infrared image overall data X is calculated by the way of two point correctionH1Integrally counted with low temperature infrared image
According to XL1Between correction parameter a1 and b1；Specifically computational methods are：
YHm+L1=a1.*(XHm+X1)+b1 (1)
YLm+L1=a1.*(XLm+X1)+b1 (2)
Wherein, XHmThe high-temperature infrared view data of black matrix target, X when gathering high temperature with camera lens for infrared detectorLmTo be red
The low temperature infrared picture data of black matrix target, X when external detector gathers low temperature with camera lens1To include camera lens wall, inside and outside catch
The error information of the radiation such as shell, high-temperature infrared image overall data XH1=XHm+X1, low temperature infrared image overall data XL1=XLm+
X1, YHmFor high-temperature infrared view data XHmArray after correction, YLmFor low temperature infrared picture data XLmArray after correction, L1
For error information X1Array after correction, a1For gain calibration parameter, b1For bias correction parameter, YHm+L1For high-temperature infrared image
Overall data XH1Array after correction, YLm+L1For low temperature infrared image overall data XL1Array after correction；Wherein,
(i, j) is the pixel that coordinate is the i-th row jth row, and M is infrared focal plane array line number, and N is infrared focal plane array
Columns.Formula (3) is substituted into formula (1), formula (4) is substituted into formula (2), can be obtained then in conjunction with formula (1) and formula (2)
Go out：
b1=YHm+L1-a1.*(XHm+X1) (6)。
Again, after the camera lens of infrared detector is removed, then the high temperature with black matrix target during infrared detector collection high temperature
Infrared image overall data XH2With the low temperature infrared image overall data X of black matrix target during low temperatureL2, and calculate high-temperature infrared figure
As overall data XH2With low temperature infrared image overall data XL2Between correction parameter a2 and b2。
Specifically, collection high temperature when black matrix target high-temperature infrared image overall data XH2Refer to that in temperature be 50 DEG C~90
DEG C when the overall data of black matrix target that is gathered, the overall data of the black matrix target gathered when such as temperature being 70 DEG C；Gather low
The low temperature infrared image overall data X of black matrix target when warmL2Refer to the black matrix target gathered when temperature is by 10 DEG C~30 DEG C
Overall data, the overall data of black matrix target gathered when such as temperature being 20 DEG C.
Specifically, calculate high-temperature infrared image overall data XH2With low temperature infrared image overall data XL2Between correction
Parameter a2And b2Method be：
YHB+L2=a2.*(XHB+X2)+b2 (7)
YLB+L2=a2.*(XLB+X2)+b2 (8)
Wherein, XHBThe high-temperature infrared view data of black matrix target, X during the high temperature gathered without camera lens for infrared detectorLB
The low temperature view data of black matrix target, X during the low temperature gathered without camera lens for infrared detector2To contain catch inside and outside shell etc.
The error information of radiation, high temperature image overall data XH2=XHB+X2, low temperature image overall data XL2=XLB+X2, YHBFor high temperature
Infrared picture data XHBArray after correction, YLBFor low temperature infrared picture data XLBArray after correction, L2For error information X2
Array after correction, a2For gain calibration parameter, b2For bias correction parameter, YHB+L2For high-temperature infrared image overall data XH2
Array after correction, YLB+L2For low temperature infrared image overall data XL2Array after correction；Wherein,
(i, j) is the pixel that coordinate is the i-th row jth row, and M is the line number of infrared focal plane array, and N is infrared focus plane battle array
The columns of row.Formula (9) is substituted into formula (7), formula (10) is substituted into formula (8), then in conjunction with formula (7) and formula (8)
It can draw：
b2=YHB+L2-a2.*(XHB+X2) (12)。
Then, after the camera lens of infrared detector is removed, then with infrared detector gather infrared detector catch it is infrared
Image overall data, and nonuniformity correction processing is carried out to the infrared image overall data of infrared detector catch, corrected
Data X afterwardsB；After the camera lens of infrared detector is removed, when the catch of infrared detector enters visual field, infrared acquisition is gathered
The infrared image overall data of device catch, and data are corrected.
Specifically, the formula of the infrared image overall data progress nonuniformity correction processing to infrared detector catch is：
XB=YB+L2=a2.*(B+X2)+b2 (13)
B be infrared detector catch infrared picture data, X2To contain the error information of the radiation such as catch inside and outside shell,
The infrared image overall data of infrared detector catch is equal to B+X2, L2For error information X2Array after correction, YBFor infrared spy
The array surveyed after the infrared picture data B corrections of device catch, YB+L2For the infrared image overall data school of infrared detector catch
Array after just.
Finally, black matrix target and the correction data of infrared detector catch detected to the needs collected with reference to above-mentioned
The infrared image overall data X of target carries out nonuniformity correction, obtains correcting result Y.Specifically, with reference to formula (1) and formula
(13) understand, the specific updating formula to the infrared image overall data X progress nonuniformity corrections of target is：
Y=(Ym+L1)-(YB+L2)
=a1.*(Xm+X1)+b1-a2.*(B+X2)-b2 (14)
Formula (14) obtains after arranging：
Y=a1.*Xm-a2.*B+(YHm+L1-YHb-L2)-(a1.*XHm-a2.*XHB) (15)
Wherein, XmFor the infrared picture data of target, the infrared image overall data X=X of targetm+X1, YmFor target
Infrared picture data XmData after correction, Y are the data after the infrared image overall data X corrections of target.
As described above, the present invention can be realized well.
Claims (5)
1. a kind of Infrared images pre-processing bearing calibration, it is characterised in that comprise the following steps：
Step 1：Using the infrared image overall data X of the infrared detector collection target with camera lens；
Step 2：The high-temperature infrared image overall data X of black matrix target when gathering high temperature using the infrared detector with camera lensH1With
The low temperature infrared image overall data X of black matrix target during low temperatureL1, and calculate high-temperature infrared image overall data XH1It is red with low temperature
Outer image overall data XL1Between correction parameter a1And b1；
Step 3：The camera lens of infrared detector is removed, the high-temperature infrared image overall data X of black matrix target when gathering high temperatureH2
With the low temperature infrared image overall data X of black matrix target during low temperatureL2, and calculate high-temperature infrared image overall data XH2And low temperature
Infrared image overall data XL2Between correction parameter a2And b2；
Step 4：The camera lens of infrared detector is removed, gathers the infrared image overall data of infrared detector catch, and to red
The infrared image overall data of external detector catch carries out nonuniformity correction processing, data X after being correctedB；
Step 5：Nonuniformity correction is carried out to the infrared image overall data X of the target in step 1, obtains correcting result Y.
2. according to a kind of Infrared images pre-processing bearing calibration described in claim 1, it is characterised in that in the step 2
Calculate high-temperature infrared image overall data XH1With low temperature infrared image overall data XL1Between correction parameter a1And b1Method
For：
YHm+L1=a1.*(XHm+X1)+b1 (1)
YLm+L1=a1.*(XLm+X1)+b1 (2)
Wherein, XHmThe high-temperature infrared view data of black matrix target, X when gathering high temperature with camera lens for infrared detectorLmFor infrared spy
Survey the low temperature infrared picture data of black matrix target when device gathers low temperature with camera lens, X1It is overall for error information, high-temperature infrared image
Data XH1=XHm+X1, low temperature infrared image overall data XL1=XLm+X1, YHmFor high-temperature infrared view data XHmBattle array after correction
Row, YLmFor low temperature infrared picture data XLmArray after correction, L1For error information X1Array after correction, a1For gain calibration
Parameter, b1For bias correction parameter, YHm+L1For high-temperature infrared image overall data XH1Array after correction, YLm+L1It is red for low temperature
Outer image overall data XL1Array after correction；Wherein,
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(i, j) is the pixel that coordinate is the i-th row jth row, and M is infrared focal plane array line number, and N arranges for infrared focal plane array
Number；Formula (3) is substituted into formula (1), formula (4) is substituted into formula (2), drawn then in conjunction with formula (1) and formula (2)：
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b1=YHm+L1-a1.*(XHm+X1) (6)。
3. according to a kind of Infrared images pre-processing bearing calibration described in claim 2, it is characterised in that in the step 3
Calculate high-temperature infrared image overall data XH2With low temperature infrared image overall data XL2Between correction parameter a2And b2Method
For：
YHB+L2=a2.*(XHB+X2)+b2 (7)
YLB+L2=a2.*(XLB+X2)+b2 (8)
Wherein, XHBThe high-temperature infrared view data of black matrix target, X during the high temperature gathered without camera lens for infrared detectorLBTo be red
The low temperature view data of black matrix target, X during the low temperature that external detector gathers without camera lens2It is overall for error information, high temperature image
Data XH2=XHB+X2, low temperature image overall data XL2=XLB+X2, YHBFor high-temperature infrared view data XHBArray after correction,
YLBFor low temperature infrared picture data XLBArray after correction, L2For error information X2Array after correction, a2Join for gain calibration
Number, b2For bias correction parameter, YHB+L2For high temperature image overall data XH2Array after correction, YLB+L2It is overall for low temperature image
Data XL2Array after correction；Wherein,
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(i, j) is the pixel that coordinate is the i-th row jth row, and M is the line number of infrared focal plane array, and N is infrared focal plane array
Columns；Formula (9) is substituted into formula (7), formula (10) is substituted into formula (8), drawn then in conjunction with formula (7) and formula (8)：
<mrow>
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b2=YHB+L2-a2.*(XHB+X2) (12)。
4. according to a kind of Infrared images pre-processing bearing calibration described in claim 3, it is characterised in that in the step 4
The formula that nonuniformity correction processing is carried out to the infrared image overall data of infrared detector catch is：
XB=YB+L2=a2.*(B+X2)+b2 (13)
B be infrared detector catch infrared picture data, X2For error information, L2For error information X2Array after correction, YB
For the array after the infrared picture data B corrections of infrared detector catch, YB+L2Infrared image for infrared detector catch is whole
Array after volume data correction.
5. according to a kind of Infrared images pre-processing bearing calibration described in claim 4, it is characterised in that in the step 5
The updating formula that nonuniformity correction is carried out to the infrared image overall data X of target is：
Y=(Ym+L1)-(YB+L2)
=a1.*(Xm+X1)+b1-a2.*(B+X2)-b2 (14)
Formula (14) obtains after arranging：
Y=a1.*Xm-a2.*B+(YHm+L1-YHb-L2)-(a1.*XHm-a2.*XHB) (15)
Wherein, XmFor the infrared picture data of target, the infrared image overall data X=X of targetm+X1, YmFor the infrared figure of target
As data XmData after correction, Y are the data after the infrared image overall data X corrections of target.
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| CN113432723A (en) * | 2021-08-29 | 2021-09-24 | 北方夜视科技(南京)研究院有限公司 | Image processing method, system and computer system for weakening stray radiation |
| CN113432723B (en) * | 2021-08-29 | 2021-11-05 | 北方夜视科技(南京)研究院有限公司 | Image processing method, system and computer system for weakening stray radiation |
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