CN104580894B - The multi-point correcting method and system of a kind of infrared focus plane - Google Patents
The multi-point correcting method and system of a kind of infrared focus plane Download PDFInfo
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Abstract
The invention belongs to technical field of image processing, more particularly to a kind of multi-point correcting method of infrared focus plane, including：Step 1, infrared focal plane detector is used as background image under operational temperature conditions every 5 DEG C of images for gathering different temperatures black matrix；Step 2, start shutter, obtain shutter image relevant parameter, and equation below acquisition shutter corrected parameter is inserted according to background image：Wherein, Δ O is shutter corrected parameter, and shutter image relevant parameter includes shutter image XsWith the average of shutter imageBiIt is the i-th width background image,It is the average of background image, KsIt is the corresponding gain calibration parameter of shutter image,It is KsAverage；Step 3, according to shutter corrected parameter Δ O, target image corresponding gain calibration parameter K and bias correction parameter B is introducedjPut school and carry out two point correction, substitute into equation below, calculate image Y after correction,Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background image, K is gain calibration parameter.
Description
Technical field
The invention belongs to technical field of image processing, more particularly to a kind of infrared focus plane multi-point correcting method and be
System.
Background technology
Infrared focal plane array image-forming system is because with sensitivity height, small volume, compact conformation, operating distance is remote, anti-
Interference is good, it is strong to penetrate flue dust haze ability, can all weather operations the advantages of, it has also become Development of Infrared Thermal Imaging Technology becomes
Gesture, and gazing type infrared focal plane array has turned into the main flow sensitive detection parts of following infra-red thermal imaging system development.
Based on infrared imaging system these it is excellent the characteristics of, it has been widely used for various military (such as early warning, inspections
Survey tracking, Imaging Guidance etc.) and civil (such as scientific research, remote sensing, industry monitoring, medical science) field.Infrared detector is exactly
Sightless infrared emanation is converted into a kind of device of visible or measurable signal, it is most closed in infrared system
One of element of key.Large-scale infrared focal plane array device is class infrared detector the most advanced now, is state
The inside and outside class infrared detector all given priority to.Infrared focal plane array has to sensitive for infrared radiation and signal transacting simultaneously
Function, the response signal of all probe units in device can be converted into by the reading circuit of device by orderly image and believed
Number output.And the presence of infrared focal plane array heterogeneity greatly reduces the temperature resolution and imaging matter of imaging system
Amount, therefore for high-quality infra-red thermal imaging system, Nonuniformity Correction is the most key image processing techniques
One of.
However, diversified infrared focal plane array heterogeneity bearing calibration has at home and abroad been occurred in that, according to
The method difference that correction coefficient is obtained can substantially be divided into heterogeneity school of two major classes based on reference source and based on scene
Positive technology.Wherein the correcting algorithm based on reference source such as a point calibration, two point correction and Supplements is the most ripe
It is the class correcting algorithm most generally used, but these algorithms are only applicable to the linear response area detected, for non-linear
Response region correction is all influenceed by the response of infrared focal plane array image-forming mission nonlinear, works as infrared focal plane array image-forming
During the change of the environment temperature of system and operating temperature, the working condition of infrared focal plane array device also changes therewith,
Calibration result will be deteriorated, so as to influence Nonuniformity Correction precision, it usually needs periodically calibration, without adaptive
Calibration capability, therefore, it is difficult to tackle environment complicated and changeable.
The content of the invention
It is an object of the invention to provide a kind of multi-point correcting method of infrared focus plane, it is intended to solves existing infrared Jiao
Planar array has intrinsic heterogeneity, i.e., each detection of infrared focal plane array is single when identical homogeneous radiation is inputted
The response output of member is inconsistent.And a point calibration, two point correction and Supplements conventional at present, all by infrared focus plane battle array
The influence of row imaging system nonlinear response, when the change of the environment temperature and operating temperature of infrared focal plane array image-forming system
When, the working condition of infrared focal plane array device also changes therewith, causes the precision and ability of correction to be all deteriorated.
The technical scheme that the present invention solves above-mentioned technical problem is as follows：A kind of multi-point correcting method of infrared focus plane, bag
Include following steps：
Step 1, infrared focal plane detector gathers the image of different temperatures black matrix every 5 DEG C in operating temperature range
It is used as background image；
Step 2, start shutter, obtain shutter image relevant parameter, and equation below acquisition is inserted in soon according to background image
Door corrected parameter,
Wherein, Δ O is shutter corrected parameter, BiIt is the i-th width background image,It is the average of background image, shutter image phase
Related parameter includes shutter image XsWith the average of shutter imageKsIt is the corresponding gain calibration parameter of shutter image,It is Ks
Average；
Step 3, according to shutter corrected parameter Δ O, introduce the corresponding gain calibration parameter K of target image and join with bias correction
Number BjPut school and carry out two point correction, substitute into equation below, calculate image Y after correction,
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background
Image, K is gain calibration parameter.
On the basis of above-mentioned technical proposal, the present invention can also do following improvement.
Further, the scope of operating temperature is -20 DEG C~80 DEG C in the step 1.
Further, details are as follows for the step 1：
The temperature of the black matrix covers the temperature range of detector Observable scene, and every 5 DEG C of temperature interval from low to high, is carried on the back
Scape image corresponds to B respectively1、B2、B3、……Bn, the average of background image is respectively And
Further, the corresponding gain calibration parameter K of shutter image in the step 2s, it is specially：
The temperature range where shutter timing is determined, obtains the image X of shutters, and calculate the average of shutter image
CompareWith the average of background image, it is determined thatPositioned at intervalThe then corresponding biasing school of shutter image
Positive parameter isThe corresponding gain calibration parameter of shutter image is
Further, the step 2 specifically also includes：
To shutter image XsTwo point correction is carried out, shutter image X is obtainedsImage Y after two point corrections, then Ys=(Xs-Bi)×
Ks；Wherein, BiIt is the i-th width background image, and according to image Y after two point correctionsObtain the offset Δ Y after corrections,Wherein,It is YsAverage；Following equation is substituted into, shutter corrected parameter Δ O is calculated：
It is transformed to
In formula, Δ O is shutter corrected parameter, YsFor the image after two point correction, KsFor the corresponding gain calibration of shutter image
Parameter,It is KsAverage, XsFor shutter image,For the average of shutter image, BiIt is the i-th width background image,It is background
The average of image.
Further, the step 3 specifically includes as follows：
The temperature range according to where the target image of precorrection, calculates the average of target imageCompareWith Background
The average of picture, it is determined thatPositioned at intervalThen the bias correction parameter corresponding to target image is Bj, increase
Beneficial correction parameter isThen, two point correction is carried out to target image, substitutes into equation below,
Calculate image Y after correction：
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background
Image, K is gain calibration parameter.
Another object of the present invention is to provide a kind of system of the Supplements of infrared focus plane, including：
Collecting unit, in operating temperature range, Background to be used as every 5 DEG C of images for gathering different temperatures black matrix
Picture；
Computing unit, for starting shutter, obtains shutter image relevant parameter, and be inserted in equation below according to background image
Shutter corrected parameter is obtained,
Wherein, Δ O is shutter corrected parameter, BiIt is the i-th width background image,It is the average of background image, shutter image phase
Related parameter includes shutter image XsWith the average of shutter imageKsIt is the corresponding gain calibration parameter of shutter image,It is Ks
Average；
Correct unit, for according to shutter corrected parameter Δ O, introduce the corresponding gain calibration parameter K of target image with partially
Put correction parameter BjPut school and carry out two point correction, substitute into equation below, calculate image Y after correction,
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background
Image, K is gain calibration parameter.
Further, the computing unit includes：
First computation subunit, for start it is fast behind the door, according to the average ratio of the shutter image of acquisition and background image compared with,
Calculate the corresponding gain calibration parameter of shutter image；
Second computation subunit, after according to shutter image two point correction, and combines the correction of gain calibration parameter acquiring
Offset afterwards, so as to calculate shutter corrected parameter.
Further, the correction unit includes：
Subelement is obtained, for temperature range where the target image according to precorrection, the average of target image is calculated, from
And get gain calibration parameter；
Subelement is corrected, for according to gain calibration parameter is got, two point correction to be carried out to target image, is substituted into corresponding
Formula, calculate correction after image Y.
The beneficial effects of the invention are as follows：By introducing parameters revision so that two point correction becomes Supplements, it can drop
The non-linear influence to correcting result of low-response, so as to more accurately be corrected result；The present invention realizes simple, operand pole
Small, market prospects are wide；Meanwhile, with good scene adaptive, so as to ensure that the validity of calibration result.
Brief description of the drawings
Fig. 1 is a kind of flow chart of the multi-point correcting method for infrared focus plane that the present invention is provided；
Fig. 2 is a kind of structural representation of the Supplements system for infrared focus plane that the present invention is provided.
In accompanying drawing, the list of parts representated by each label is as follows：
21st, collecting unit, 22, computing unit, the 221, first computing unit, the 222, second computing unit, 23, correction it is single
Member, 231, obtain subelement, 232, correction subelement.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
Fig. 1 is a kind of flow chart of the multi-point correcting method for infrared focus plane that the present invention is provided, and details are as follows：
Step 1, infrared focal plane detector gathers the image of different temperatures black matrix every 5 DEG C in operating temperature range
It is used as background image；
In this example, light-sensing element array is arranged on infrared focus plane, the infrared ray launched from wireless distant place passes through
Optical system imaging is on these photo-sensitive cells of system focal plane, and detector, which will receive optical signal and be converted to electric signal, goes forward side by side
Row amplification, sampling are kept, by exporting buffering and multiplex system, are finally sent to monitoring system formation image.
It is preferred that, the scope of operational temperature conditions is -20 DEG C~80 DEG C in the step 1.Can be according to the temperature strip of work
Part chooses the mode of refrigeration mode or non-refrigeration type, and refrigeration mode mode is higher than the mode accuracy of non-refrigeration type；Also can be according to work
It is photon detector or thermal detector that condition, which chooses infrared detector,.
The temperature of the black matrix covers the temperature range of detector Observable scene, and every 5 DEG C of temperature interval from low to high, is carried on the back
Scape image corresponds to B respectively1、B2、B3……Bn, the average of background image is respectively And
Step 2, start shutter, obtain shutter image relevant parameter, and equation below acquisition is inserted in soon according to background image
Door corrected parameter,
Wherein, Δ O is shutter corrected parameter, BiIt is the i-th width background image,It is the average of background image, shutter image phase
Related parameter includes：Xs、KsWithWherein XsIt is shutter image,It is the average of shutter image, KsIt is shutter image correspondence
Gain calibration parameter,It is KsAverage；
It is preferred that, the corresponding gain calibration parameter K of shutter image in the step 2s, it is specially：
The temperature range where shutter timing is determined, obtains the image X of shutters, and calculate the average of shutter image
CompareWith the average of background image, it is determined thatPositioned at intervalThe then corresponding biasing school of shutter image
Positive parameter isThe corresponding gain calibration parameter of shutter image is
It is preferred that, the step 2 specifically also includes：
To shutter image XsTwo point correction is carried out, shutter image X is obtainedsImage Y after two point corrections, then Ys=(Xs-Bi)×
Ks；Wherein, BiIt is the i-th width background image, and according to image Y after two point correctionsObtain the offset Δ Y after corrections,Wherein,It is YsAverage；Following equation is substituted into, shutter corrected parameter Δ O is calculated,
It is transformed to
In formula, Δ O is shutter corrected parameter, YsFor the image after two point correction, KsFor the corresponding gain calibration of shutter image
Parameter,It is KsAverage, XsFor shutter image,For the average of shutter image, BiIt is the i-th width background image,It is background
The average of image.
Step 3：According to shutter corrected parameter Δ O, introduce the corresponding gain calibration parameter K of target image and join with bias correction
Number BjPut school and carry out two point correction, substitute into equation below, calculate image Y after correction,
Y=[X- (Bj+ΔO)]×K
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background
Image, K is gain calibration parameter.
It is preferred that, the step 3 specifically includes as follows：
The temperature range according to where the target image of precorrection, calculates the average of target imageCompareWith Background
The average of picture, it is determined thatPositioned at intervalThen the bias correction parameter corresponding to target image is Bj, increase
Beneficial correction parameter isThen, two point correction is carried out to target image, substitutes into equation below,
Calculate image Y after correction：
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background
Image, K is gain calibration parameter.
As shown in Fig. 2 a kind of structural representation of the Supplements system for infrared focus plane, including：
Collecting unit 21, in operating temperature range, background to be used as every 5 DEG C of images for gathering different temperatures black matrix
Image；
Computing unit 22, for starting shutter, obtains shutter image relevant parameter, and be inserted in following public affairs according to background image
Formula obtains shutter corrected parameter,
Wherein, Δ O is shutter corrected parameter, BiIt is the i-th width background image,It is the average of background image, shutter image phase
Related parameter includes shutter image XsWith the average of shutter imageKsIt is the corresponding gain calibration parameter of shutter image,It is Ks
Average；
Correct unit 23, for according to shutter corrected parameter Δ O, introduce the corresponding gain calibration parameter K of target image with
Bias correction parameter BjPut school and carry out two point correction, substitute into equation below, Y is schemed after calculating correction,
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background
Image, K is gain calibration parameter.
It is preferred that, the computing unit 22 includes：
First computation subunit 221, for starting soon behind the door, according to the shutter image and the average ratio of background image of acquisition
Compared with calculating the corresponding gain calibration parameter of shutter image；
Second computation subunit 222, after according to shutter image two point correction, and combines gain calibration parameter acquiring school
Offset after just, so as to calculate shutter corrected parameter.
It is preferred that, the correction unit 231 includes：
Subelement 231 is obtained, for temperature range where the target image according to precorrection, the equal of target image is calculated
Value, so as to get gain calibration parameter；
Subelement 232 is corrected, for according to gain calibration parameter is got, two point correction to be carried out to target image, is substituted into
Corresponding formula, calculates image Y after correction.
In embodiments of the present invention, by introducing parameters revision so that two point correction becomes Supplements, it can reduce
Influence of the nonlinearity to correction result, so as to more accurately be corrected result；The present invention realizes simple, operand pole
Small, market prospects are wide；Meanwhile, with good scene adaptive, so as to ensure that the validity of calibration result.
The foregoing is only a specific embodiment of the invention, but protection scope of the present invention is not limited thereto, any
Those familiar with the art the invention discloses technical scope in, the change or replacement that can be readily occurred in, all should
It is included within the scope of the present invention.Therefore, protection scope of the present invention should be defined by scope of the claims.
Claims (9)
1. a kind of multi-point correcting method of infrared focus plane, it is characterised in that comprise the following steps：
Step 1, infrared focal plane detector gathers the image conduct of different temperatures black matrix every 5 DEG C in operating temperature range
Background image；
Step 2, start shutter, obtain shutter image relevant parameter, and equation below acquisition shutter is inserted according to background image and repair
Positive parameter：
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Wherein, Δ O is shutter corrected parameter, BiIt is the i-th width background image,It is the average of background image, shutter image correlation ginseng
Number includes shutter image XsWith the average of shutter imageKsIt is the corresponding gain calibration parameter of shutter image,It is KsIt is equal
Value；
Step 3, according to shutter corrected parameter Δ O, target image corresponding gain calibration parameter K and bias correction parameter B is introducedj
Put school and carry out two point correction, substitute into equation below, calculate image Y after correction,
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background image, K
It is gain calibration parameter.
2. the multi-point correcting method of a kind of infrared focus plane according to claim 1, it is characterised in that in the step 1
The scope of operating temperature is -20 DEG C~80 DEG C.
3. the multi-point correcting method of a kind of infrared focus plane according to claim 1, it is characterised in that the step 1 is detailed
State as follows：
The black matrix temperature covering detector observe scene temperature range, every 5 DEG C of temperature interval from low to high, background image
B is corresponded to respectively1、B2、B3、……Bn, the average of background image is respectively And
4. the multi-point correcting method of a kind of infrared focus plane according to claim 1, it is characterised in that in the step 2
The corresponding gain calibration parameter K of shutter images, it is specially：
The temperature range where shutter timing is determined, obtains the image X of shutters, and calculate the average of shutter imageCompareWith the average of background image, it is determined thatPositioned at intervalThen the corresponding bias correction of shutter image is joined
Number isThe corresponding gain calibration parameter of shutter image is
5. the multi-point correcting method of a kind of infrared focus plane according to claim 4, it is characterised in that the step 2 has
Body also includes：
To shutter image XsTwo point correction is carried out, shutter image X is obtainedsImage Y after two point corrections, then Ys=(Xs-Bi)×Ks；Its
In, BiIt is the i-th width background image, and according to image Y after two point correctionsObtain the offset Δ Y after corrections,
Wherein,It is YsAverage；Following equation is substituted into, shutter corrected parameter Δ O is calculated：
It is transformed to
In formula, Δ O is shutter corrected parameter, YsFor the image after two point correction, KsFor the corresponding gain calibration ginseng of shutter image
Number,It is KsAverage, XsFor shutter image,For the average of shutter image, BiIt is the i-th width background image,It is background image
Average.
6. the multi-point correcting method of a kind of infrared focus plane according to claim 1, it is characterised in that the step 3 has
Body includes as follows：
The temperature range according to where the target image of precorrection, calculates the average of target imageCompareIt is equal with background image
Value, it is determined thatPositioned at intervalThen the bias correction parameter corresponding to target image is Bj, gain calibration
Parameter isThen, two point correction is carried out to target image, substitutes into equation below, calculate school
Image Y after just：
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background image, K
It is gain calibration parameter.
7. a kind of Supplements system of infrared focus plane, it is characterised in that including：
Collecting unit, in operating temperature range, background image to be used as every 5 DEG C of images for gathering different temperatures black matrix；
Computing unit, for starting shutter, obtains shutter image relevant parameter, and be inserted in equation below acquisition according to background image
Shutter corrected parameter,
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Wherein, Δ O is shutter corrected parameter, BiIt is the i-th width background image,It is the average of background image, shutter image correlation ginseng
Number includes shutter image XsWith the average of shutter imageKsIt is the corresponding gain calibration parameter of shutter image,It is KsIt is equal
Value；
Unit is corrected, for according to shutter corrected parameter Δ O, introducing the corresponding gain calibration parameter K of target image and biasing school
Positive parameter BjPut school and carry out two point correction, substitute into equation below, calculate image Y after correction,
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background image, K
It is gain calibration parameter.
8. a kind of Supplements system of infrared focus plane according to claim 7, it is characterised in that the computing unit
Including：
First computation subunit, for starting soon behind the door, according to the average ratio of the shutter image of acquisition and background image compared with calculating
Go out the corresponding gain calibration parameter K of shutter images, it is specially：
The temperature range where shutter timing is determined, obtains the image X of shutters, and calculate the average of shutter imageCompareWith the average of background image, it is determined thatPositioned at intervalThen the corresponding bias correction of shutter image is joined
Number isThe corresponding gain calibration parameter of shutter image is
Second computation subunit, for shutter image XsTwo point correction is carried out, shutter image X is obtainedsImage after two point correction
Ys, then Ys=(Xs-Bi)×Ks；Wherein, BiIt is the i-th width background image, and according to image Y after two point correctionsObtain after correction
Offset Δ Ys,Wherein,It is YsAverage；Following equation is substituted into, shutter corrected parameter Δ O is calculated：
It is transformed to
In formula, Δ O is shutter corrected parameter, YsFor the image after two point correction, KsFor the corresponding gain calibration ginseng of shutter image
Number,It is KsAverage, XsFor shutter image,For the average of shutter image, BiIt is the i-th width background image,It is Background
The average of picture.
9. a kind of Supplements system of infrared focus plane according to claim 7, it is characterised in that the correction unit
Including：
Subelement is obtained, for temperature range where the target image according to precorrection, the average of target image is calculatedCompareWith the average of background image, it is determined thatPositioned at intervalThe then bias correction corresponding to target image
Parameter is Bj, gain calibration parameter is
Subelement is corrected, for according to gain calibration parameter is got, two point correction to be carried out to target image, is substituted into following public
Formula, calculates image Y after correction：
Wherein, X is the image of precorrection, and Y is the image after correction, and Δ O is shutter corrected parameter, BjIt is jth width background image, K
It is gain calibration parameter.
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| CN111043907A (en) * | 2019-12-24 | 2020-04-21 | 北京富吉瑞光电科技有限公司 | Automatic shooting effect correction system and method based on thermal imaging sighting telescope |
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| WO2017073401A1 (en) * | 2015-10-29 | 2017-05-04 | 富士フイルム株式会社 | Infrared imaging device and signal correction method using infrared imaging device |
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