CN104580894A - Multi-point correction method and system for infrared focal plane - Google Patents
Multi-point correction method and system for infrared focal plane Download PDFInfo
- Publication number
- CN104580894A CN104580894A CN201410822449.6A CN201410822449A CN104580894A CN 104580894 A CN104580894 A CN 104580894A CN 201410822449 A CN201410822449 A CN 201410822449A CN 104580894 A CN104580894 A CN 104580894A
- Authority
- CN
- China
- Prior art keywords
- image
- shutter
- parameter
- average
- overbar
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012937 correction Methods 0.000 title claims abstract description 69
- 238000000034 method Methods 0.000 title claims abstract description 18
- 239000013589 supplement Substances 0.000 claims description 10
- 238000004364 calculation method Methods 0.000 claims description 9
- 239000011159 matrix material Substances 0.000 claims description 9
- 208000011580 syndromic disease Diseases 0.000 claims description 4
- 238000012545 processing Methods 0.000 abstract description 3
- 230000004044 response Effects 0.000 description 6
- 238000005057 refrigeration Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 238000001931 thermography Methods 0.000 description 3
- 230000003044 adaptive effect Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 239000003500 flue dust Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003331 infrared imaging Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000035800 maturation Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000011896 sensitive detection Methods 0.000 description 1
- 230000033772 system development Effects 0.000 description 1
Landscapes
- Transforming Light Signals Into Electric Signals (AREA)
- Radiation Pyrometers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410822449.6A CN104580894B (en) | 2014-12-25 | 2014-12-25 | The multi-point correcting method and system of a kind of infrared focus plane |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410822449.6A CN104580894B (en) | 2014-12-25 | 2014-12-25 | The multi-point correcting method and system of a kind of infrared focus plane |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104580894A true CN104580894A (en) | 2015-04-29 |
CN104580894B CN104580894B (en) | 2017-10-31 |
Family
ID=53095992
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410822449.6A Active CN104580894B (en) | 2014-12-25 | 2014-12-25 | The multi-point correcting method and system of a kind of infrared focus plane |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN104580894B (en) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105371964A (en) * | 2015-12-05 | 2016-03-02 | 中国航空工业集团公司洛阳电光设备研究所 | Method and apparatus for eliminating nonuniformity of infrared detector in full-temperature response scope |
CN106341624A (en) * | 2015-07-08 | 2017-01-18 | 上海奕瑞光电子科技有限公司 | Generation method of offset template used for correcting temperature and leakage current |
CN108353135A (en) * | 2015-10-29 | 2018-07-31 | 富士胶片株式会社 | Infrared pick-up device and signal calibration method based on infrared pick-up device |
CN109084899A (en) * | 2018-09-20 | 2018-12-25 | 烟台艾睿光电科技有限公司 | A kind of infrared focal plane detector heterogeneity ontology output calibration method and device |
CN110260991A (en) * | 2019-06-06 | 2019-09-20 | 武汉高德智感科技有限公司 | A kind of method and device of adaptive acquisition temperature drift compensation data amount |
CN111060197A (en) * | 2019-11-27 | 2020-04-24 | 上海传输线研究所(中国电子科技集团公司第二十三研究所) | Photoelectric detector and calibration and test method thereof |
CN111556252A (en) * | 2020-05-22 | 2020-08-18 | 烟台艾睿光电科技有限公司 | Shutter correction method and device and electronic equipment |
CN111562012A (en) * | 2020-05-22 | 2020-08-21 | 烟台艾睿光电科技有限公司 | Infrared image non-uniformity correction method and system |
CN112345088A (en) * | 2021-01-11 | 2021-02-09 | 四川谛达诺科技有限公司 | Real-time double-temperature calibration infrared temperature measuring device and method |
CN113188664A (en) * | 2021-04-02 | 2021-07-30 | 烟台艾睿光电科技有限公司 | Infrared rapid shutter opening method and device and thermal infrared imager |
CN113375810A (en) * | 2021-05-31 | 2021-09-10 | 昆明物理研究所 | Thermal infrared imager working temperature measuring device and method for adaptively compensating focal plane |
CN113421220A (en) * | 2021-05-11 | 2021-09-21 | 武汉博宇光电系统有限责任公司 | Method for removing pot cover by infrared image |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111043907B (en) * | 2019-12-24 | 2020-12-15 | 北京富吉瑞光电科技有限公司 | Automatic shooting effect correction method based on thermal imaging sighting telescope |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101038209A (en) * | 2007-04-19 | 2007-09-19 | 华中科技大学 | Infrared focal plane array heterogeneity self-adaptive correction method |
CN103076097A (en) * | 2013-01-06 | 2013-05-01 | 河北汉光重工有限责任公司 | Reference-source-based segmented linear non-uniform correction method |
-
2014
- 2014-12-25 CN CN201410822449.6A patent/CN104580894B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101038209A (en) * | 2007-04-19 | 2007-09-19 | 华中科技大学 | Infrared focal plane array heterogeneity self-adaptive correction method |
CN103076097A (en) * | 2013-01-06 | 2013-05-01 | 河北汉光重工有限责任公司 | Reference-source-based segmented linear non-uniform correction method |
Non-Patent Citations (2)
Title |
---|
LI ENKE等: "Nonuniformity Correction Algorithms of IRFPA Nonuniformity Correction Algorithms of IRFPA Based on Radiation Source Scaling", 《2009 FIFTH INTERNATIONAL CONFERENCE ON INFORMATION ASSURANCE AND SECURITY》 * |
黄星明 等: "一种改进的红外焦平面非均匀多点校正方法", 《红外与激光工程》 * |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106341624A (en) * | 2015-07-08 | 2017-01-18 | 上海奕瑞光电子科技有限公司 | Generation method of offset template used for correcting temperature and leakage current |
CN106341624B (en) * | 2015-07-08 | 2019-03-08 | 上海奕瑞光电子科技股份有限公司 | For correcting the generation method of the biasing template of temperature and leakage current |
CN108353135B (en) * | 2015-10-29 | 2020-07-21 | 富士胶片株式会社 | Infrared imaging device and signal correction method using the same |
CN108353135A (en) * | 2015-10-29 | 2018-07-31 | 富士胶片株式会社 | Infrared pick-up device and signal calibration method based on infrared pick-up device |
CN105371964B (en) * | 2015-12-05 | 2018-08-17 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared detector eliminates heteropical method and apparatus in complete warm response range |
CN105371964A (en) * | 2015-12-05 | 2016-03-02 | 中国航空工业集团公司洛阳电光设备研究所 | Method and apparatus for eliminating nonuniformity of infrared detector in full-temperature response scope |
CN109084899A (en) * | 2018-09-20 | 2018-12-25 | 烟台艾睿光电科技有限公司 | A kind of infrared focal plane detector heterogeneity ontology output calibration method and device |
CN110260991A (en) * | 2019-06-06 | 2019-09-20 | 武汉高德智感科技有限公司 | A kind of method and device of adaptive acquisition temperature drift compensation data amount |
CN111060197A (en) * | 2019-11-27 | 2020-04-24 | 上海传输线研究所(中国电子科技集团公司第二十三研究所) | Photoelectric detector and calibration and test method thereof |
CN111556252A (en) * | 2020-05-22 | 2020-08-18 | 烟台艾睿光电科技有限公司 | Shutter correction method and device and electronic equipment |
CN111562012A (en) * | 2020-05-22 | 2020-08-21 | 烟台艾睿光电科技有限公司 | Infrared image non-uniformity correction method and system |
CN111562012B (en) * | 2020-05-22 | 2021-09-03 | 烟台艾睿光电科技有限公司 | Infrared image non-uniformity correction method and system |
CN112345088A (en) * | 2021-01-11 | 2021-02-09 | 四川谛达诺科技有限公司 | Real-time double-temperature calibration infrared temperature measuring device and method |
CN113188664A (en) * | 2021-04-02 | 2021-07-30 | 烟台艾睿光电科技有限公司 | Infrared rapid shutter opening method and device and thermal infrared imager |
CN113421220A (en) * | 2021-05-11 | 2021-09-21 | 武汉博宇光电系统有限责任公司 | Method for removing pot cover by infrared image |
CN113421220B (en) * | 2021-05-11 | 2022-03-15 | 武汉博宇光电系统有限责任公司 | Method for removing pot cover by infrared image |
CN113375810A (en) * | 2021-05-31 | 2021-09-10 | 昆明物理研究所 | Thermal infrared imager working temperature measuring device and method for adaptively compensating focal plane |
Also Published As
Publication number | Publication date |
---|---|
CN104580894B (en) | 2017-10-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN104580894A (en) | Multi-point correction method and system for infrared focal plane | |
CN103528694B (en) | A kind of method of temperature of infrared heat image instrument measuring target object | |
CN102564598B (en) | Method for calibrating and correcting temperature measurement of infrared probe as well as corresponding temperature measuring method | |
CN106679817B (en) | A method of for Calibration of Infrared Thermal Imager | |
CN102410880B (en) | Infrared focal plane array blind pixel detection method based on integral time adjustment | |
CN102661799B (en) | Fault positioning method and system | |
CN103424192B (en) | A kind of method of infrared thermometer temperature drift compensation | |
CN201653554U (en) | Infrared thermogragh calibrating device | |
CN103335724B (en) | Calibration-based scene self-adaption IRFPA heterogeneity correction method | |
CN102609923B (en) | Infrared image processing method and infrared image processing device | |
CN107341780B (en) | Infrared image preprocessing correction method | |
CN107588854B (en) | High precision measuring temperature method based on built-in reference body | |
CN104251742A (en) | Two-point linear and target and environment-based binary non-linear infrared detector heterogeneity correction method | |
CN103162843B (en) | Zero shutter thermal infrared imager based on voice operated exchange (VOX) detector and use method thereof | |
CN106500846A (en) | A kind of asymmetric correction method of infrared imaging system | |
CN105352988B (en) | A kind of skin heat-insulating property assessment system and method | |
CN103954366A (en) | Huge surface source black body calibration system used under vacuum cold condition | |
CN103335717B (en) | A kind of thermal infrared imager high precision temperature resistance drift temp measuring method based on becoming integral mode | |
CN103940519A (en) | Oversized surface source black body calibration system used under vacuum and low-temperature condition | |
CN106500848A (en) | Emissivity calibration steps for infrared temperature measurement system | |
CN105890873A (en) | Apparatus and method for blind pixel detection of thermal infrared hyperspectral imager | |
CN105043552A (en) | Display and calibration method for chromometry-based temperature measurement system | |
CN105928627A (en) | Method for eliminating image reproduction non-uniformity of refrigeration type thermal imager | |
CN104251738A (en) | Helmet type infrared temperature measurer and method | |
CN202024821U (en) | Thermal imaging system capable of improving imaging quality and temperature measurement precision |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: A multipoint correction method and system for infrared focal plane Effective date of registration: 20211230 Granted publication date: 20171031 Pledgee: Yantai Branch of China Merchants Bank Co.,Ltd. Pledgor: Yantai Airui Photo-Electric Technology Co.,Ltd. Registration number: Y2021980017076 |
|
PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20230106 Granted publication date: 20171031 Pledgee: Yantai Branch of China Merchants Bank Co.,Ltd. Pledgor: Yantai Airui Photo-Electric Technology Co.,Ltd. Registration number: Y2021980017076 |
|
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: A Multi-point Correction Method and System for Infrared Focal Plane Effective date of registration: 20230113 Granted publication date: 20171031 Pledgee: Yantai Branch of China Merchants Bank Co.,Ltd. Pledgor: Yantai Airui Photo-Electric Technology Co.,Ltd. Registration number: Y2023980031040 |
|
PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Granted publication date: 20171031 Pledgee: Yantai Branch of China Merchants Bank Co.,Ltd. Pledgor: Yantai Airui Photo-Electric Technology Co.,Ltd. Registration number: Y2023980031040 |
|
EE01 | Entry into force of recordation of patent licensing contract | ||
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20150429 Assignee: INFIRAY TECHNOLOGIES CO.,LTD. Assignor: Yantai Airui Photo-Electric Technology Co.,Ltd. Contract record no.: X2024980006380 Denomination of invention: A Multipoint Correction Method and System for Infrared Focal Plane Granted publication date: 20171031 License type: Common License Record date: 20240530 |