CN107341082A - A kind of server system places an order and deposits power consumption test design method in vivo - Google Patents

A kind of server system places an order and deposits power consumption test design method in vivo Download PDF

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Publication number
CN107341082A
CN107341082A CN201710600692.7A CN201710600692A CN107341082A CN 107341082 A CN107341082 A CN 107341082A CN 201710600692 A CN201710600692 A CN 201710600692A CN 107341082 A CN107341082 A CN 107341082A
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China
Prior art keywords
power consumption
consumption test
internal memory
resistance
test adapter
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Pending
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CN201710600692.7A
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Chinese (zh)
Inventor
谷俊杰
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Zhengzhou Yunhai Information Technology Co Ltd
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Zhengzhou Yunhai Information Technology Co Ltd
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Priority to CN201710600692.7A priority Critical patent/CN107341082A/en
Publication of CN107341082A publication Critical patent/CN107341082A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/34Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3409Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment for performance assessment
    • G06F11/3414Workload generation, e.g. scripts, playback
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Biological Materials (AREA)

Abstract

Placed an order the invention discloses a kind of server system and deposit power consumption test design method in vivo, belong to server energy consumption technical field of measurement and test, specific method is that power consumption test adapter is configured on monomer internal memory;Resistance is configured on the power consumption test adapter;By measuring the magnitude of voltage at described resistance both ends, the monomer power consumption number of the internal memory is calculated.The present invention is compared to the prior art, simple to operate, and power consumption number test is accurate so that power consumption analysis result is more accurate, with more directive significance.

Description

A kind of server system places an order and deposits power consumption test design method in vivo
Technical field
The present invention relates to server system power consumption test technical field, specifically a kind of server system places an order in vivo Deposit power consumption test design method.
Background technology
The continuous development of cloud computing, show to the facility that all trades and professions are brought constantly, we live in cloud computing, The demand of big data also constantly increases, and to meet this ever-increasing demand, various regions large enterprise expands number in continuous increase According to center, the demand of server is also increasing, and the most direct result brought is exactly the increase of electricity needs, in order to realize section Can target, each side all studying more energy efficient data center initiative, is in cabinet-level, the other analysis of server level, nowadays before Finer analysis is needed, to be deep into the distribution of each part power consumption in server, in the hope of finding lower power consumption point, realizes energy-conservation Design, because many parts use golden finger connection power supply, such as internal memory, video card etc., conventional method can not use equipment Direct measurement comes out, especially internal memory, all essential part of various types of servers, obtains its specific energy consumption, right Designing more energy efficient server will be very helpful.
Power consumption test, first we in testing power consumption, most basic method be first tested out using equipment voltage and Electric current, then obtain power consumption number using power consumption formula P=U*I.This mode can be realized in larger space, because main Testing current is depended on, testing current needs current clamp, because current clamp head is larger, and needs to vise power cable, this Sample can just obtain valid data.Internal memory is inserted on mainboard memory slot, is powered using golden finger, no cable, therefore can not be made Use current clamp.
In the power consumption analysis of prior art, the power consumption data of internal memory is obtained by BMC, by dividing mass data Analysis sees that the power consumption of internal memory data obtained by BMC, in the case where similarly configuring, using identical pressure software, power consumption differs greatly, And the power consumption number for being accurate to integer-bit is can only obtain, this has little significance to further Accurate Analysis power consumption.Although can meet pair The acquisition requirement of power consumption of internal memory, but it has the following disadvantages, 1, obtained power consumption number low precision, to power consumption explication de texte meaning Less;2nd, power consumption is obtained by BMC, only waits BMC to be used after the completion of developing in development process, cause power consumption analysis stagnant Afterwards, can not project's earlier stage provide specific effective power consumption analysis opinion.
The content of the invention
The technical assignment of the present invention is to be directed to above weak point, it is proposed that a kind of simple to operate, test result precision is high A kind of server system place an order and deposit power consumption test design method in vivo.
The technical solution adopted for the present invention to solve the technical problems is:Single body power consumption of internal memory is surveyed under a kind of server system Test system, including internal memory, memory slot and power consumption test interconnecting module;Power consumption test interconnecting module include power consumption test adapter and Resistance, described power consumption test adapter are used for transfer internal memory and memory slot, and described resistance configuration is in power consumption test adapter On.
Further, preferable structure is described power consumption test adapter and Memory linkage, power consumption test adapter Pin definition modes are identical with internal memory.
A kind of server system places an order and deposits power consumption test design method in vivo, and described method is applied to server system, Method includes:Power consumption test adapter is configured on monomer internal memory;Resistance is configured on the power consumption test adapter;Pass through survey The magnitude of voltage at the described resistance both ends of amount, calculate the monomer power consumption number of the internal memory.
Further, preferable method is to comprise the following steps that:
S1, make power consumption test adapter, one end connection internal memory of described power consumption test adapter;The other end connects internal memory Groove, described power consumption test adapter have with internal memory as pin definition modes;
S2, on power consumption test adapter, configure a resistance, described resistance is placed on the positive paths of internal memory direct current supply On, test environment is completed;
S3, test start, and measure the magnitude of voltage at resistance both ends respectively;
S4, the monomer power consumption for calculating internal memory.
Further, preferable method is that described resistance is the resistance of 10 milliohms, to reduce pressure drop and internal memory is worked Influence.
Compared to the prior art a kind of server system of the present invention places an order deposits power consumption test design method in vivo, beneficial to effect Fruit is as follows:
1st, the method for testing that uses of the present invention, can to mainboard without destruction in the case of, realize power consumption test, and survey It is high to try precision;
2nd, simple to operate, test result can obtain at once, avoid the generation of power consumption analysis hysteresis, can give in the early stage of the project Go out specific effective power consumption analysis opinion;
3rd, power consumption number test is accurate so that power consumption analysis result is more accurate, has very big reference to system power dissipation distributional analysis Value, with more directive significance.
Brief description of the drawings
The present invention is further described below in conjunction with the accompanying drawings.
A kind of 1 server system of accompanying drawing places an order deposits the structure principle chart of power consumption test system in vivo;
Accompanying drawing 2 is the voltage tester schematic diagram of resistance;
Wherein:1st, internal memory;2nd, memory slot;3rd, power consumption test adapter;4th, resistance.
Embodiment
The invention will be further described with specific embodiment below in conjunction with the accompanying drawings.
The present invention is by making a power consumption test adapter, for connecting internal memory and memory slot, is transferred in power consumption test The resistance of one small resistance is set at the positive pole of the internal memory power supply of card, by high accuracy number universal meter, measures magnitude of voltage, so The monomer power consumption number of internal memory is calculated using formula afterwards, this method of testing can obtain the real power of the real work of internal memory Value, have it is simple to operate, the high advantage of test result precision, can be generalized to completely in the test of server.
Golden finger (connecting finger) be computer hardware such as:(on memory bar between memory bank, video card with Card slot etc.), all signals are all transmitted by golden finger.Golden finger is by numerous golden yellow conductive contact blade groups Into because of its surface gold-plating and conductive contact blade arrangement such as finger-shaped, so being referred to as " golden finger ".
Embodiment 1:
S1, make power consumption test adapter, one end of described power consumption test adapter is using golden finger connection internal memory, in simulation The golden finger size customization deposited.The other end uses memory slot, and even the pin definition at end and internal memory correspond, and thus serve The switching effect of memory slot;The other end connects memory slot, and the pin definition sides as making power consumption test adapter have with internal memory Formula;
S2, on power consumption test adapter, configure the resistance of a small resistance, described resistance is placed on internal memory direct current supply On positive paths, test environment is completed;Described resistance is the resistance of 10 milliohms, to reduce pressure drop and internal memory is worked Influence.
S3, test start, running memory pressure script, and measure the magnitude of voltage at resistance both ends respectively with universal meter;General-purpose Table is that precision reaches 6 half high accuracy number ammeters, to improve measuring accuracy.
S4, with universal meter measurement the magnitude of voltage at resistance both ends is obtained, flow through direction according to electric current, be designated as Ua, Ub respectively;Cause Resistance value is known to be R, current value of the flow measurement through resistance is calculated by the voltage difference at resistance both ends, such as formula 1:I=(Ua- Ub)/R ;Reuse rating formula 2: P=U*I ;Formula 1 is substituted into formula 2 and obtains rating formula 3:P=Ub* (Ua-Ub)/R.Calculate the monomer power consumption of internal memory.
The present invention, which designs, can be directed to single internal memory, the method that power consumption of internal memory is directly tested out under server system, Effectively solve this testing blind zone, there is very big reference value to system power dissipation distributional analysis.
Placed an order present invention additionally comprises a kind of server system of application this method and deposit power consumption test system in vivo, including it is interior Deposit, memory slot and power consumption test interconnecting module;Power consumption test interconnecting module includes power consumption test adapter and resistance, described work( Consumption test adaptor card is used for transfer internal memory and memory slot, and described resistance configuration is on power consumption test adapter.Described power consumption Test adaptor card is by golden finger and Memory linkage, and the pin definition modes of described power consumption test adapter and internal memory phase Together.
The present invention develops power consumption test adapter, by adding small valued resistor on power consumption test adapter, comes real Existing internal memory work is the indirect measurement of electric current, so as to obtain the actual power loss to work under system being present in accurately Value, the data that this measuring method obtains have the characteristics of precision is high, test is simple, more than the data for reading to obtain by software Tool is credible, can provide accurate data supporting for power consumption profile, system level power consumption analysis, be that server system level power consumption is excellent Change and guarantee is provided.
By embodiment above, the those skilled in the art can readily realize the present invention.But should Work as understanding, the present invention is not limited to above-mentioned several embodiments.On the basis of disclosed embodiment, the technology The technical staff in field can be combined different technical characteristics, so as to realize different technical schemes.

Claims (5)

1. a kind of server system places an order and deposits power consumption test system in vivo, it is characterised in that is surveyed including internal memory, memory slot and power consumption Preliminary operation connection module;Power consumption test interconnecting module includes power consumption test adapter and resistance, and described power consumption test adapter is used for Switching internal memory and memory slot, described resistance configuration is on power consumption test adapter.
2. a kind of server system according to claim 1 places an order and deposits power consumption test system in vivo, it is characterised in that described Power consumption test adapter and Memory linkage, the pin definition modes of power consumption test adapter are identical with internal memory.
3. a kind of server system places an order and deposits power consumption test design method in vivo, it is characterised in that described method is applied to clothes Business device system, method include:Power consumption test adapter is configured on monomer internal memory;Electricity is configured on the power consumption test adapter Resistance;By measuring the magnitude of voltage at described resistance both ends, the monomer power consumption number of the internal memory is calculated.
4. a kind of server system according to claim 3 places an order and deposits power consumption test design method in vivo, it is characterised in that Comprise the following steps that:
S1, make power consumption test adapter, one end connection internal memory of described power consumption test adapter;The other end connects internal memory Groove, described power consumption test adapter have with internal memory as pin definition modes;
S2, on power consumption test adapter, configure a resistance, described resistance is placed on the positive paths of internal memory direct current supply On, test environment is completed;
S3, test start, and measure the magnitude of voltage at resistance both ends respectively;
S4, the monomer power consumption for calculating internal memory.
5. a kind of server system according to claim 3 or 4 places an order and deposits power consumption test design method in vivo, its feature exists In described resistance is the resistance of 10 milliohms, with the influence for reducing pressure drop and working internal memory.
CN201710600692.7A 2017-07-21 2017-07-21 A kind of server system places an order and deposits power consumption test design method in vivo Pending CN107341082A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107992387A (en) * 2017-11-30 2018-05-04 郑州云海信息技术有限公司 Monomer hard disk power consumption test method under a kind of server system
CN111929495A (en) * 2020-09-17 2020-11-13 天津飞腾信息技术有限公司 Memory power consumption testing device, system and application method thereof

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060107120A1 (en) * 2001-03-28 2006-05-18 Intel Corporation Microprocessor design support for computer system and platform validation
CN203397348U (en) * 2013-07-19 2014-01-15 浪潮电子信息产业股份有限公司 Novel memory-chip testing jig
CN104317683A (en) * 2014-09-26 2015-01-28 浪潮电子信息产业股份有限公司 Method for testing power consumption of memory
CN105092958A (en) * 2015-07-22 2015-11-25 浪潮电子信息产业股份有限公司 Method for testing disk power consumption

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060107120A1 (en) * 2001-03-28 2006-05-18 Intel Corporation Microprocessor design support for computer system and platform validation
CN203397348U (en) * 2013-07-19 2014-01-15 浪潮电子信息产业股份有限公司 Novel memory-chip testing jig
CN104317683A (en) * 2014-09-26 2015-01-28 浪潮电子信息产业股份有限公司 Method for testing power consumption of memory
CN105092958A (en) * 2015-07-22 2015-11-25 浪潮电子信息产业股份有限公司 Method for testing disk power consumption

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107992387A (en) * 2017-11-30 2018-05-04 郑州云海信息技术有限公司 Monomer hard disk power consumption test method under a kind of server system
CN111929495A (en) * 2020-09-17 2020-11-13 天津飞腾信息技术有限公司 Memory power consumption testing device, system and application method thereof

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Application publication date: 20171110