CN107274820B - Test circuit, test method thereof and display panel - Google Patents
Test circuit, test method thereof and display panel Download PDFInfo
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- CN107274820B CN107274820B CN201710606157.2A CN201710606157A CN107274820B CN 107274820 B CN107274820 B CN 107274820B CN 201710606157 A CN201710606157 A CN 201710606157A CN 107274820 B CN107274820 B CN 107274820B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The invention discloses a test circuit, a test method thereof and a display panel, relates to the technical field of testing, and aims to solve the problems that in the prior art, a VT curve test is used for testing a signal transmission line, so that raw materials are easily wasted, and the production cost is increased. The test circuit includes: n transmission line test sub-circuits corresponding to the n signal transmission lines one-to-one, wherein the n signal transmission lines are divided into at least one group of transmission line groups, and the first transmission line test sub-circuit corresponding to the first signal transmission line in the transmission line groups is used for: controlling whether the input signal end is connected with the first end of the first signal transmission line; the ith transmission line test sub-circuit corresponding to the ith signal transmission line in the transmission line group is used for: and controlling whether the input signal end is connected with the first end of the ith signal transmission line or not. The test circuit provided by the invention is used for measuring whether the signal transmission line is broken or not.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a testing circuit, a testing method thereof and a display panel.
Background
With the continuous development of display technology, liquid crystal displays are more and more widely applied, and in order to improve the production yield of the liquid crystal displays, products obtained after different process flows are correspondingly tested in the production process of the liquid crystal displays. For example: after the display panel is formed by a box process, a voltage-transmittance curve (VT curve) test is generally performed on the display panel, and whether a signal transmission line on the display panel is open-circuited is tested, but since the VT curve test can not only obtain the voltage-transmittance curve of the display panel, but also simultaneously test whether the signal transmission line is open-circuited, in the prior art, the VT curve of the display panel and whether the signal transmission line is open-circuited are often tested by the VT curve test.
However, due to the optical rotation characteristic of the liquid crystal in the liquid crystal display panel, the VT curve test can be performed only after the polarizer is attached to the display panel, so that when the VT curve test finds that the signal transmission line in the display panel has an open circuit problem, the waste of the raw materials such as the polarizer is caused, and the production cost is increased.
Disclosure of Invention
The invention aims to provide a test circuit, a test method thereof and a display panel, which are used for solving the problems that raw materials are easily wasted and the production cost is increased due to the fact that a VT curve test is used for testing a signal transmission line in the prior art.
In order to achieve the above purpose, the invention provides the following technical scheme:
the first aspect of the invention provides a test circuit, wherein the test circuit is arranged in a non-display area of a display panel, the display area of the display panel is provided with n signal transmission lines, the test circuit comprises n transmission line test sub-circuits which are in one-to-one correspondence with the n signal transmission lines, and n is more than or equal to 1;
the n signal transmission lines are divided into at least one group of transmission line groups, a first transmission line testing sub-circuit corresponding to a first signal transmission line in the transmission line groups is respectively connected with a control signal input end, a trigger signal input end, an input signal end and a first end of the first signal transmission line, and the first transmission line testing sub-circuit is used for: controlling whether the input signal end is connected with the first end of the first signal transmission line or not under the control of the control signal input end and the trigger signal input end; an ith transmission line test sub-circuit corresponding to an ith signal transmission line in the transmission line group is respectively connected to the control signal input terminal, the second end of an (i-1) th signal transmission line in the transmission line group, the input signal terminal, and the first end of the ith signal transmission line, and the ith transmission line test sub-circuit is configured to: controlling whether the input signal end is connected with the first end of the ith signal transmission line or not under the control of the control signal input end and the second end of the (i-1) th signal transmission line, wherein i is more than or equal to 2; and the second end of the last signal transmission line in the transmission line group is connected with the output signal test end corresponding to the transmission line group.
Further, the first transmission line test sub-circuit includes: a first input control unit and a first input unit; the first input control unit is respectively connected with the control signal input end, the trigger signal input end and the first input unit, and is used for controlling whether the trigger signal input end is connected with the first input unit or not under the control of the control signal input end and the trigger signal input end; the first input unit is respectively connected with an input signal end and the first end of the first signal transmission line, and is used for controlling whether the input signal end is connected with the first end of the first signal transmission line or not under the control of the first input control unit;
the ith transmission line test sub-circuit includes: an ith input control unit and an ith input unit; the ith input control unit is respectively connected with the control signal input end, the second end of the (i-1) th signal transmission line and the ith input unit, and is used for controlling whether the second end of the (i-1) th signal transmission line is connected with the ith input unit or not under the control of the control signal input end and the second end of the (i-1) th signal transmission line; the ith input unit is respectively connected with an input signal end and the first end of the ith signal transmission line, and is used for controlling whether the input signal end is connected with the first end of the ith signal transmission line or not under the control of the ith input control unit.
Further, the first input control unit comprises a first control switch tube and a first trigger switch tube, and the first input unit comprises a first input switch tube; the grid electrode of the first control switch tube is connected with the control signal input end, the grid electrode of the first trigger switch tube and the first pole of the first trigger switch tube are both connected with the trigger signal input end, and the second pole of the first trigger switch tube is connected with the first pole of the first control switch tube; the grid electrode of the first input switch tube is connected with the second pole of the first control switch tube, the first pole of the first input switch tube is connected with the input signal end, and the second pole of the first input switch tube is connected with the first end of the first signal transmission line;
the ith input control unit comprises an ith control switch tube and an ith trigger switch tube, and the ith input unit comprises an ith input switch tube; the grid electrode of the ith control switch tube is connected with the control signal input end, the grid electrode of the ith trigger switch tube and the first pole of the ith trigger switch tube are both connected with the second end of the (i-1) th signal transmission line, and the second pole of the ith trigger switch tube is connected with the first pole of the ith control switch tube; the grid electrode of the ith input switch tube is connected with the second pole of the ith control switch tube, the first pole of the ith input switch tube is connected with the input signal end, and the second pole of the ith input switch tube is connected with the first end of the ith signal transmission line.
Further, the n signal transmission lines include at least one gate line and at least one data line, and the test circuit includes at least one gate line test sub-circuit corresponding to the at least one gate line one to one, and at least one data line test sub-circuit corresponding to the at least one data line one to one; the at least one group of transmission line groups comprise a grid line transmission line group and a data line transmission line group; the gate line transmission line group includes the at least one gate line, and the data line transmission line group includes the at least one data line.
Further, the n signal transmission lines include at least one gate line and at least one data line, and the test circuit includes at least one gate line test sub-circuit corresponding to the at least one gate line one to one, and at least one data line test sub-circuit corresponding to the at least one data line one to one; the at least one group of transmission line groups comprise odd grid line transmission line groups, even grid line transmission line groups, odd data line transmission line groups and even data line transmission line groups; the odd gate line transmission line group includes an odd gate line of the at least one gate line, the even gate line transmission line group includes an even gate line of the at least one gate line, the odd data line transmission line group includes an odd data line of the at least one data line, and the even data line transmission line group includes an even data line of the at least one data line.
Based on the technical solution of the test circuit, a second aspect of the invention provides a display panel, which includes the test circuit.
Based on the technical solution of the test circuit, a third aspect of the present invention provides a test method applied to the test circuit, for at least one group of transmission line groups, the test method including:
in a test period, under the control of the control signal input end and the trigger signal input end, the control input signal end of the first transmission line test sub-circuit is connected with the first end of the first signal transmission line in the transmission line group; under the control of the control signal input end and the second end of the (i-1) th signal transmission line in the transmission line group, the ith transmission line test sub-circuit controls the input signal end to be connected with the first end of the ith signal transmission line in the transmission line group; detecting the level of an output signal test end corresponding to the transmission line group;
in a non-test period, under the control of the control signal input end and the trigger signal input end, the first transmission line test sub-circuit controls the input signal end to be disconnected from the first end of the first signal transmission line; under the control of the control signal input end and the second end of the (i-1) th signal transmission line, the (i) th transmission line test sub-circuit controls the input signal end to be disconnected with the first end of the (i) th signal transmission line.
Further, when the first transmission line test sub-circuit includes a first input control unit and a first input unit, and the ith transmission line test sub-circuit includes an ith input control unit and an ith input unit, the first input control unit controls the trigger signal input terminal to be connected with the first input unit under the control of the control signal input terminal and the trigger signal input terminal during the test period; under the control of the first input control unit, the first input unit controls the input signal end to be connected with the first end of the first signal transmission line; under the control of the control signal input end and the second end of the (i-1) th signal transmission line, the ith input control unit controls the second end of the (i-1) th signal transmission line to be connected with the ith input unit; under the control of the ith input control unit, the ith input unit controls the input signal end to be connected with the first end of the ith signal transmission line; the first input control unit controls the trigger signal input terminal to be disconnected from the first input unit under the control of the control signal input terminal and the trigger signal input terminal in the non-test period; under the control of the first input control unit, the first input unit controls the input signal end to be disconnected with the first end of the first signal transmission line; under the control of the control signal input end and the second end of the (i-1) th signal transmission line, the ith input control unit controls the second end of the (i-1) th signal transmission line to be disconnected with the ith input unit; under the control of the ith input control unit, the ith input unit controls the input signal end to be disconnected with the first end of the ith signal transmission line.
Further, when the first input control unit includes a first control switch tube and a first trigger switch tube, and the first input unit includes a first input switch tube, in the test period, the first trigger switch tube is turned on under the control of the trigger signal input end, and under the control of the control signal input end, the first control switch tube is turned on, so that the trigger signal input end is connected with the gate of the first input switch tube, and the first input switch tube is controlled to be turned on, so that the input signal end is connected with the first end of the first signal transmission line; in the non-test period, the first trigger switch tube is cut off under the control of the trigger signal input end, and the first control switch tube is cut off under the control of the control signal input end, so that the trigger signal input end is not connected with the grid electrode of the first input switch tube, the first input switch tube is controlled to be cut off, and the input signal end is not connected with the first end of the first signal transmission line.
Further, when the ith input control unit comprises an ith control switch tube and an ith trigger switch tube, and the ith input unit comprises an ith input switch tube, in the test period, the ith trigger switch tube is turned on under the control of the second end of the i-1 th signal transmission line, and under the control of the control signal input end, the ith control switch tube is turned on, so that the second end of the i-1 th signal transmission line is connected with the gate of the ith input switch tube, and the ith input switch tube is controlled to be turned on, so that the input signal end is connected with the first end of the ith signal transmission line; in the non-test period, the ith trigger switch tube is turned off under the control of the second end of the ith-1 signal transmission line, the ith control switch tube is turned off under the control of the control signal input end, so that the second end of the ith-1 signal transmission line is not connected with the grid electrode of the ith input switch tube, the ith input switch tube is controlled to be turned off, and the input signal end is not connected with the first end of the ith signal transmission line.
In the test circuit provided by the invention, the test circuit is arranged in the non-display area of the display panel and can provide test signals for each signal transmission line in the display area of the display panel, and the level of the output signal test end arranged in the non-display area of the display panel is detected to judge whether the signal transmission line in the display panel is broken or not, so that the test circuit provided by the invention can test the signal transmission line in the display panel after the signal transmission line is manufactured, and the signal transmission line does not need to be detected after the attachment process of the polaroid is finished, thereby reducing the possibility of wasting raw materials to the lowest, and saving the production cost to the maximum extent.
In addition, since the n signal transmission lines are divided into at least one group of transmission line groups, and in each group of transmission line groups, the transmission line test sub-circuit corresponding to the second signal transmission line to the last signal transmission line is controlled by the adjacent previous signal transmission line of the corresponding signal transmission line, i.e. the input signal end can be connected with the corresponding signal transmission line under the common control of the adjacent previous signal transmission line and the control signal input end, so as to realize the purpose of providing the test signal for the corresponding signal transmission line, in the test circuit provided by the invention, the signal transmission lines included in one group of transmission line groups are all connected in series, when detecting whether the signal transmission line with the open circuit exists in each group of signal transmission line groups, only the second end of the last signal transmission line in each group of signal transmission line groups needs to be connected with the output signal test end corresponding to the group, and by detecting the level of the output signal test terminal, whether a broken signal transmission line exists in the group can be determined.
Moreover, the test circuit provided by the embodiment of the invention comprises transmission line test sub-circuits which are in one-to-one correspondence with the signal transmission lines in the display area, wherein each transmission line test sub-circuit is connected with the input signal end and is used for controlling the input signal end to provide a test signal for the corresponding signal transmission line, so that the test signals of all the signal transmission lines in the display area are provided by the input signal end through the corresponding transmission line test sub-circuits, namely, all the signal transmission lines are connected in parallel, and the problems that the input impedance is too large and the level of the output signal test end cannot be effectively detected due to the fact that all the signal transmission lines are connected in series are solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic structural diagram of a display panel according to an embodiment of the present invention;
FIG. 2 is a basic diagram of the connection relationship between signal transmission line groups and corresponding transmission line test sub-circuits according to an embodiment of the present invention;
FIG. 3 is a first detailed diagram of the connection relationship between signal transmission line groups and corresponding transmission line test sub-circuits according to the embodiment of the present invention;
FIG. 4 is a timing diagram illustrating the absence of open circuit in the signal transmission line during testing according to an embodiment of the present invention;
FIG. 5 is a timing diagram illustrating a disconnection of a signal transmission line during a test period according to an embodiment of the present invention;
FIG. 6 is a timing diagram of a non-test period according to an embodiment of the present invention;
fig. 7 is a schematic grouping diagram of gate lines according to an embodiment of the present invention;
FIG. 8 is a block diagram of data lines provided by an embodiment of the present invention;
fig. 9 is a second detailed diagram of the connection relationship between the signal transmission line groups and the corresponding transmission line test sub-circuits according to the embodiment of the invention.
Reference numerals:
1-a display panel, 2-a display area,
3-non-display area, 4-test circuit,
41-a first transmission line test sub-circuit, 42-a second transmission line test sub-circuit,
4 i-ith transmission line test sub-circuit, Tin-ith input switch tube,
5-a first end, 6-a second end,
7-a first input control unit, 8-a first input unit,
9-ith input control unit, 10-ith input unit,
11-a first set of gate line transmission line groups, 12-a second set of gate line transmission line groups,
13-a first group of data line transmission line groups, 14-a second group of data line transmission line groups,
switch-control signal input, Reset-trigger signal input,
Input-Input signal terminal, Output-Output signal test terminal,
g1-first gate line, G3-third gate line,
g (2k-1) -the (2k-1) th gate line, G (2k +1) -the (2k +1) th gate line,
x1-the first signal transmission line, X2-the second signal transmission line,
x (i-1) -the (i-1) th signal transmission line, Xi-the ith signal transmission line,
t1 c-first trigger switch tube, T2 c-second trigger switch tube,
t3 c-a third trigger switch tube, T (2k +1) c-a (2k +1) th trigger switch tube,
tic-ith trigger switch tube, T1 s-first control switch tube,
t2 s-second control switch tube, T3 s-third control switch tube,
t (2k +1) s-the (2k +1) th control switch tube, Tis-the ith control switch tube,
t1 n-first input switch tube, T2 n-second input switch tube,
t3 n-third input switch tube, T (2k +1) n-2 k +1 th input switch tube.
Detailed Description
In order to further explain the test circuit, the test method thereof and the display panel provided by the embodiment of the invention, the following detailed description is made with reference to the accompanying drawings.
Referring to fig. 1 and 2, an embodiment of the invention provides a test circuit 4, where the test circuit 4 is disposed in a non-display area 3 of a display panel 1, n signal transmission lines are disposed in a display area 2 of the display panel 1, and the test circuit 4 includes n transmission line test sub-circuits corresponding to the n signal transmission lines one to one, where n is greater than or equal to 1.
The n signal transmission lines are divided into at least one group of transmission line groups, a first transmission line test sub-circuit 41 corresponding to a first signal transmission line X1 in the group of transmission lines is respectively connected to the control signal Input Switch, the trigger signal Input Reset, the Input signal Input, and the first end 5 of the first signal transmission line X1, and the first transmission line test sub-circuit 41 is configured to: under the control of the control signal Input terminal Switch and the trigger signal Input terminal Reset, controlling whether the Input signal terminal Input is connected with the first end 5 of the first signal transmission line X1; the ith transmission line test sub-circuit 4i corresponding to the ith signal transmission line Xi in the transmission line group is respectively connected to the control signal Input terminal Switch, the second end 6 of the (i-1) th signal transmission line X (i-1) in the transmission line group, the Input signal terminal Input, and the first end 5 of the ith signal transmission line Xi, and the ith transmission line test sub-circuit 4i is configured to: under the control of a control signal Input end Switch and a second end 6 of an (i-1) th signal transmission line X (i-1), controlling whether an Input signal end Input is connected with a first end 5 of an ith signal transmission line Xi, wherein i is more than or equal to 2; the second terminal 6 of the last signal transmission line in the transmission line group is connected to the Output signal test terminal Output corresponding to the transmission line group.
When the test circuit 4 is applied to test signal transmission lines, for at least one group of transmission line groups, in a test period, under the control of the control signal Input terminal Switch and the trigger signal Input terminal Reset, the first transmission line test sub-circuit 41 controls the Input signal terminal Input to be connected with the first end 5 of the first signal transmission line X1 in the transmission line group; the ith transmission line test sub-circuit 4i controls the Input signal terminal Input to be connected to the first terminal 5 of the ith signal transmission line Xi in the transmission line group under the control of the control signal Input terminal Switch and the second terminal 6 of the (i-1) th signal transmission line X (i-1) in the transmission line group; detecting the level of the Output signal test end Output corresponding to the transmission line group, as shown in fig. 4, when a high level signal is Input to the control signal Input end Switch, the trigger signal Input end Reset, and the Input signal end Input, and when the level of the Output signal test end Output is measured to be the same as the level of the test signal Input by the Input signal end Input and is also a high level signal, it indicates that there is no open-circuited signal transmission line in the transmission line group. As shown in fig. 5, when high-level signals are Input to the control signal Input terminal Switch, the trigger signal Input terminal Reset, and the Input signal terminal Input, and when no voltage Output signal is Output from the Output signal test terminal Output, it is determined that there is an open-circuited signal transmission line in the transmission line group; in the non-test period, as shown in fig. 6, the control signal Input terminal Switch, the trigger signal Input terminal Reset and the Input signal terminal Input all Input low level signals, and under the control of the control signal Input terminal Switch and the trigger signal Input terminal Reset, the first transmission line test sub-circuit 41 controls the Input signal terminal Input not to be connected to the first terminal 5 of the first signal transmission line X1; under the control of the control signal Input terminal Switch and the second terminal 6 of the (i-1) th signal transmission line X (i-1), the ith transmission line test sub-circuit 4i controls the Input signal terminal Input not to be connected with the first terminal 5 of the ith signal transmission line Xi, so that in a non-test period, the signal transmission lines are independent of each other and can be controlled by a gate driving circuit and a control chip on the display panel, and the display panel 1 is ensured to realize a normal display function.
According to the structure of the test circuit 4 provided in the above embodiment and the process of testing the signal transmission lines by using the test circuit 4, it can be seen that in the test circuit 4 provided in the embodiment of the present invention, each signal transmission line corresponds to one transmission line test sub-circuit, each transmission line test sub-circuit provides a test signal for the corresponding signal transmission line, n signal transmission lines are divided into at least one group of transmission line groups, and the corresponding n transmission line test sub-circuits are divided into at least one group of transmission line test sub-circuit groups corresponding to the at least one group of transmission line groups. In a set of transmission line test sub-circuit groups, a first transmission line test sub-circuit 41 can control whether the Input signal terminal Input is connected with the first terminal 5 of the first signal transmission line X1 under the control of the control signal Input terminal Switch and the trigger signal Input terminal Reset, and further control whether the test signal is provided for the first signal transmission line X1, and in the set of transmission line test sub-circuit groups, other transmission line test sub-circuits except the first transmission line test sub-circuit 41 control whether the Input signal terminal Input is connected with the first terminal 5 of the signal transmission line corresponding to the current signal transmission line test sub-circuit under the control of the control signal Input terminal Switch and the second terminal 6 of the adjacent previous signal transmission line of the signal transmission line corresponding to the current signal transmission line test sub-circuit (the adjacent previous signal transmission line in the same transmission line group), and then controlling whether to provide the test signal for the signal transmission line corresponding to the current signal transmission line test sub-circuit.
Because the test circuit 4 provided by the invention is arranged in the non-display area 3 of the display panel 1 and can provide test signals for each signal transmission line in the display area of the display panel 1, and then the level of the Output signal test end Output arranged in the non-display area 3 of the display panel 1 is detected to judge whether the signal transmission line in the display panel 1 is broken, the test circuit 4 provided by the embodiment of the invention can test the signal transmission line in the display panel 1 after the signal transmission line is manufactured, and does not need to detect the signal transmission line after the attachment process of the polarizer is finished, thereby reducing the possibility of wasting raw materials to the lowest, and saving the production cost to the maximum.
In addition, since the n signal transmission lines are divided into at least one group of transmission line groups, and in each group of transmission line groups, the transmission line test sub-circuit corresponding to the second signal transmission line X2 to the last signal transmission line is controlled by the adjacent previous signal transmission line of the corresponding signal transmission line, that is, the Input signal terminal Input can be connected with the corresponding signal transmission line under the common control of the adjacent previous signal transmission line and the control signal Input terminal Switch, so as to provide the test signal for the corresponding signal transmission line, in the test circuit 4 provided in the embodiment of the present invention, it is equivalent to connect the signal transmission lines included in one group of transmission line groups in series, and when detecting whether there is an open-circuited signal transmission line in each group of signal transmission line groups, only the second terminal 6 of the last signal transmission line in each group of signal transmission line groups needs to be connected with the Output signal test terminal Output of the corresponding group, and by detecting the level of the Output signal test end Output, whether a broken signal transmission line exists in the group can be determined.
Moreover, the test circuit 4 provided in the embodiment of the present invention includes transmission line test sub-circuits corresponding to the signal transmission lines in the display area one by one, and each transmission line test sub-circuit is connected to the Input signal end Input and is configured to control the Input signal end Input to provide a test signal for the corresponding signal transmission line, so that the test signals of all the signal transmission lines in the display area are provided by the Input signal end Input through the corresponding transmission line test sub-circuit, which is equivalent to parallel connection of the signal transmission lines, and a problem that the Input impedance is too large and the level of the Output signal test end Output cannot be effectively detected due to serial connection of all the signal transmission lines is avoided.
It should be noted that the signal Input by the control signal Input terminal Switch, the signal Input by the trigger signal Input terminal Reset, and the signal Input by the Input signal terminal Input may all adopt existing operating signals on the display panel, for example: a switching voltage signal including a high level signal (VGH signal) and a low level signal (VGL signal). In order to completely avoid the influence of the Input signal terminal Input on the normal operation of the display panel in the non-test period, the Input signal terminal Input may be connected to the ground line in the non-test period. In addition, the last signal transmission line in each transmission line group is connected with the corresponding Output signal test end Output, so that the signal Output by the second end 6 of the last signal transmission line is easier to detect, and the test circuit provided by the embodiment of the invention is favorable for popularization and application.
In order to more clearly illustrate the test circuit 4 provided in the above embodiment, specific structures and connection modes of the transmission line test sub-circuits corresponding to a group of transmission line groups are given below.
As shown in fig. 3, the first transmission line test sub-circuit 41 provided in the above embodiment includes: a first input control unit 7 and a first input unit 8; the first input control unit 7 is connected to the control signal input Switch, the trigger signal input Reset and the first input unit 8, and is configured to control whether the trigger signal input Reset is connected to the first input unit 8 under the control of the control signal input Switch and the trigger signal input Reset; the first Input unit 8 is respectively connected to the Input signal terminal Input and the first end 5 of the first signal transmission line X1, and is configured to control whether the Input signal terminal Input is connected to the first end 5 of the first signal transmission line X1 under the control of the first Input control unit 7.
The above-described embodiment provides the i-th transmission line test sub-circuit 4i including: an ith input control unit 9 and an ith input unit 10; the ith input control unit 9 is connected to the control signal input terminal Switch, the second end 6 of the (i-1) th signal transmission line X (i-1) and the ith input unit 10, and is configured to control whether the second end 6 of the (i-1) th signal transmission line X (i-1) is connected to the ith input unit 10 under the control of the control signal input terminal Switch and the second end 6 of the (i-1) th signal transmission line X (i-1); the ith Input unit 10 is respectively connected to the Input signal terminal Input and the first end 5 of the ith signal transmission line Xi, and is configured to control whether the Input signal terminal Input is connected to the first end 5 of the ith signal transmission line Xi under the control of the ith Input control unit 9.
Specifically, in the test period, under the control of the control signal input terminal Switch and the trigger signal input terminal Reset, the first input control unit 7 controls the trigger signal input terminal Reset to be connected with the first input unit 8; under the control of the first Input control unit 7, the first Input unit 8 controls the Input signal terminal Input to be connected with the first terminal 5 of the first signal transmission line X1; the ith input control unit 9 controls the second end 6 of the (i-1) th signal transmission line X (i-1) to be connected to the ith input unit 10 under the control of the control signal input terminal Switch and the second end 6 of the (i-1) th signal transmission line X (i-1); under the control of the ith Input control unit 9, the ith Input unit 10 controls the Input signal terminal Input to be connected to the first terminal 5 of the ith signal transmission line Xi.
In the non-test period, the first input control unit 7 controls the trigger signal input terminal Reset to be disconnected from the first input unit 8 under the control of the control signal input terminal Switch and the trigger signal input terminal Reset; under the control of the first Input control unit 7, the first Input unit 8 controls the Input signal terminal Input not to be connected with the first terminal 5 of the first signal transmission line X1; the ith input control unit 9 controls the second terminal 6 of the (i-1) th signal transmission line to be disconnected from the ith input unit 10 under the control of the control signal input terminal Switch and the second terminal 6 of the (i-1) th signal transmission line X (i-1); under the control of the ith Input control unit 9, the ith Input unit 10 controls the Input signal terminal Input not to be connected to the first terminal 5 of the ith signal transmission line Xi.
The specific structures of the first input control unit 7, the first input unit 8, the ith input control unit 9, and the ith input unit 10 are various, and a specific structure and a connection manner corresponding to each unit are given below, but the specific structure corresponding to each unit is not limited thereto.
With reference to fig. 3, the first input control unit 7 includes a first control switch T1s and a first trigger switch T1c, and the first input unit 8 includes a first input switch T1 n; the grid of the first control Switch tube T1s is connected to the control signal input Switch, the grid of the first trigger Switch tube T1c and the first pole of the first trigger Switch tube T1c are both connected to the trigger signal input Reset, and the second pole of the first trigger Switch tube T1c is connected to the first pole of the first control Switch tube T1 s; the gate of the first Input switch T1n is connected to the second pole of the first control switch T1s, the first pole of the first Input switch T1n is connected to the Input signal terminal Input, and the second pole of the first Input switch T1n is connected to the first terminal 5 of the first signal transmission line X1.
The ith input control unit 9 comprises an ith control switch tube Tis and an ith trigger switch tube Tic, and the ith input unit 10 comprises an ith input switch tube Tin; the grid electrode of the ith control Switch tube Tis is connected with the control signal input end Switch, the grid electrode of the ith trigger Switch tube Tic and the first pole of the ith trigger Switch tube Tic are both connected with the second end 6 of the (i-1) th signal transmission line X (i-1), and the second pole of the ith trigger Switch tube Tic is connected with the first pole of the ith control Switch tube Tis; the grid electrode of the ith Input switch tube Tin is connected with the second pole of the ith control switch tube Tis, the first pole of the ith Input switch tube Tin is connected with the Input signal end Input, and the second pole of the ith Input switch tube Tin is connected with the first end 5 of the ith signal transmission line Xi.
The working process of the test circuit 4 with the specific structure is as follows:
in a test period, under the control of a trigger signal Input end Reset, the first trigger Switch tube T1c is turned on, and under the control of a control signal Input end Switch, the first control Switch tube T1s is turned on, so that the trigger signal Input end Reset is connected with the gate of the first Input Switch tube T1n, the first Input Switch tube T1n is controlled to be turned on, and an Input signal end Input is connected with the first end 5 of the first signal transmission line X1; under the control of the second end 6 of the (i-1) th signal transmission line X (i-1), the ith trigger Switch tube Tic is conducted, under the control of the control signal Input end Switch, the ith control Switch tube Tis is conducted, so that the second end 6 of the (i-1) th signal transmission line X (i-1) is connected with the grid electrode of the ith Input Switch tube Tin, the ith Input Switch tube Tin is controlled to be conducted, and the Input signal end Input is connected with the first end 5 of the ith signal transmission line Xi.
In the non-test period, under the control of the trigger signal Input terminal Reset, the first trigger Switch tube T1c is turned off, and under the control of the control signal Input terminal Switch, the first control Switch tube T1s is turned off, so that the trigger signal Input terminal Reset is not connected to the gate of the first Input Switch tube T1n, and the first Input Switch tube T1n is controlled to be turned off, so that the Input signal terminal Input is not connected to the first terminal 5 of the first signal transmission line X1. In the non-test period, under the control of the second end 6 of the (i-1) th signal transmission line X (i-1), the ith trigger Switch tube Tic is cut off, under the control of the control signal Input end Switch, the ith control Switch tube Tis is cut off, so that the second end 6 of the (i-1) th signal transmission line X (i-1) is not connected with the grid electrode of the ith Input Switch tube Tin, the ith Input Switch tube Tin is controlled to be cut off, and the Input signal end Input is not connected with the first end 5 of the ith signal transmission line Xi.
The ith input control unit 9 may further include only the ith control switch tube Tis, and correspondingly, the first pole of the ith control switch tube Tis may be directly connected to the second end 6 of the (i-1) th signal transmission line X (i-1), and the ith input control unit 9 of this structure reduces one switch tube compared with the structure including the ith trigger switch tube Tic, which is more beneficial to narrowing the frame of the display device. Of course, the above-mentioned structure in which the ith input control unit 9 includes the ith trigger switch tube Tic is also advantageous, and since the first input control unit 7 includes the first trigger switch tube T1c, the ith input control unit 9 is configured to have the same structure as the first input control unit 7, which is more convenient in designing the array of the display device.
It should be noted that, in order to more clearly show the connection relationship between the transmission line testing sub-circuit and the signal transmission line, fig. 2 also shows the connection relationship between the second transmission line testing sub-circuit 42 when i is 2, and the second transmission line testing sub-circuit 42 is connected to the first end 5 of the second signal transmission line X2, the second end 6 of the first signal transmission line X1, the control signal Input terminal Switch and the Input signal terminal Input, respectively. Fig. 3 also shows that the second transmission line testing sub-circuit 42 includes a second trigger switch T2c, a second control switch T2s, and a second input switch T2n, and the connection relationship of the switches. Fig. 9 also shows a transmission line test sub-circuit corresponding to the third gate line G3, and a specific structure and a connection relationship of the transmission line test sub-circuit corresponding to the (2k +1) th gate line G (2k +1), specifically, the transmission line test sub-circuit corresponding to the third gate line G3 includes a third trigger switch tube T3c, a third control switch tube T3s, and a third input switch tube T3n, and the transmission line test sub-circuit corresponding to the (2k +1) th gate line G (2k +1) includes a (2k +1) th trigger switch tube T (2k +1) c, a (2k +1) th control switch tube T (2k +1) s, and a (2k +1) th input switch tube T (2k +1) n.
In the present embodiment, the trigger switches, the control switches, and the input switches are N-type transistors, and the first electrode is a source electrode and the second electrode is a drain electrode. The trigger switch tubes, the control switch tubes and the input switch tubes can also be P-type transistors, and the circuit design that the trigger switch tubes, the control switch tubes and the input switch tubes are P-type transistors is also within the protection scope of the invention. In addition, for convenience of description, one end of each signal transmission line close to the corresponding transmission line test sub-circuit is defined as a first end 5, and the other end is defined as a second end 6, but the invention is not limited thereto.
It should be noted that the grouping manner of the n signal transmission lines in the display area of the display panel 1 may be selected according to actual needs, and preferably, each signal transmission line only belongs to one group of transmission line groups, and when the n signal transmission lines include at least one gate line and at least one data line, the test circuit 4 includes at least one gate line test sub-circuit corresponding to the at least one gate line and at least one data line test sub-circuit corresponding to the at least one data line. When the n signal transmission lines are divided into at least one group of transmission line groups, optionally, the n signal transmission lines may be divided into one group of transmission line groups, and the group of transmission line groups includes all gate lines and all data lines; alternatively, as shown in fig. 7, all gate lines included in the n signal transmission lines are divided into two parts, one part of the gate lines serves as a first group of gate line transmission line groups 11, and the other part of the gate lines serves as a second group of gate line transmission line groups 12, and as shown in fig. 8, all data lines included in the n signal transmission lines are divided into two parts, one part of the data lines serves as a first group of data line transmission line groups 13, and the other part of the data lines serves as a second group of data line transmission line groups 14.
Further, alternatively, the n signal transmission lines may be divided into two groups of transmission line groups such that the at least one group of transmission line groups includes a gate line transmission line group and a data line transmission line group, wherein the gate line transmission line group includes the at least one gate line (all gate lines included in the n signal transmission lines) and the data line transmission line group includes the at least one data line (all data lines included in the n signal transmission lines); alternatively, the n signal transmission lines may be divided into four groups of transmission lines such that the at least one group of transmission lines includes an odd gate line transmission line group, an even gate line transmission line group, an odd data line transmission line group, and an even data line transmission line group, wherein the odd gate line transmission line group includes an odd-numbered gate line of the at least one gate line (all gate lines included by the n signal transmission lines), the even gate line transmission line group includes a second even gate line among the at least one gate line (all gate lines included by the n signal transmission lines), the odd data line transmission line group includes an odd data line of the at least one data line (all data lines included by the n signal transmission lines), the even-numbered data line transmission line group includes the second even-numbered data lines of the at least one data line (all data lines included in the n signal transmission lines).
Specifically, referring to fig. 9, taking an odd gate line transmission line group as an example, the odd gate line transmission line group includes a first gate line G1, a third gate line G3 to a (2k +1) th gate line G (2k +1), a first signal transmission line X1 in the odd gate line transmission line group is a first gate line G1, a second signal transmission line X2 in the odd gate line transmission line group is a third gate line G3, a third signal transmission line in the odd gate line transmission line group is a fifth gate line, and so on.
The specific test process of the odd grid line transmission line group is as follows:
in the test period, under the control of the control signal Input terminal Switch and the trigger signal Input terminal Reset, the first transmission line test sub-circuit 41 controls the Input signal terminal Input to be connected to the first terminal 5 of the first gate line G1; under the control of the control signal Input terminal Switch and the second terminal 6 of the (2k-1) th gate line G (2k-1), the (2k +1) th transmission line test sub-circuit controls the Input signal terminal Input to be connected with the first terminal 5 of the (2k +1) th gate line G (2k + 1); and detecting the level of an Output signal test terminal Output corresponding to the transmission line group.
In the non-test period, the first transmission line test sub-circuit 41 controls the Input signal terminal Input to be disconnected from the first terminal 5 of the first gate line G1 under the control of the control signal Input terminal Switch and the trigger signal Input terminal Reset; under the control of the control signal Input terminal Switch and the second terminal 6 of the (2k-1) th gate line G (2k-1), the (2k +1) th transmission line test sub-circuit controls the Input signal terminal Input to be disconnected from the first terminal 5 of the (2k +1) th gate line G (2k + 1).
The embodiment of the invention also provides a display panel, the display panel 1 comprises the test circuit 4 provided by the embodiment, the test circuit 4 is arranged in the non-display area 3 of the display panel 1, after the n signal transmission lines positioned in the display area 2 of the display panel 1 are manufactured, the open circuit condition of the n signal transmission lines can be directly tested through the test circuit 4, the signal transmission lines do not need to be detected after the attachment process of the polaroid is finished, the possibility of wasting raw materials is reduced to the minimum, and the production cost is saved to the maximum extent.
The embodiment of the present invention further provides a test method, which is applied to the test circuit 4 provided in the above embodiment, and for at least one group of transmission line groups, the test method includes:
in the test period, under the control of the control signal Input Switch and the trigger signal Input Reset, the first transmission line test sub-circuit 41 controls the Input signal terminal Input to be connected to the first terminal 5 of the first signal transmission line X1 in the transmission line group; the ith transmission line test sub-circuit 4i controls the Input signal terminal Input to be connected to the first terminal 5 of the ith signal transmission line Xi in the transmission line group under the control of the control signal Input terminal Switch and the second terminal 6 of the (i-1) th signal transmission line X (i-1) in the transmission line group; the level of the Output signal test terminal Output corresponding to the transmission line group is detected.
In the non-test period, the first transmission line test sub-circuit 41 controls the Input signal terminal Input to be unconnected from the first terminal 5 of the first signal transmission line X1 under the control of the control signal Input terminal Switch and the trigger signal Input terminal Reset; the ith transmission line test sub-circuit 4i controls the Input signal terminal Input to be disconnected from the first terminal 5 of the ith signal transmission line Xi under the control of the control signal Input terminal Switch and the second terminal 6 of the (i-1) th signal transmission line X (i-1).
The testing method provided by the embodiment of the invention is realized by adopting the testing circuit 4, so that the technical effect which can be realized by the testing circuit 4 is achieved, namely the testing method provided by the embodiment of the invention can test the signal transmission line in the display panel 1 after the signal transmission line is manufactured, and the signal transmission line does not need to be detected after the attaching process of the polarizer is finished, so that the possibility of wasting raw materials is reduced to the minimum, and the production cost is saved to the maximum extent.
In addition, in the test circuit 4 provided in the above embodiment, it is equivalent to connect signal transmission lines included in a group of transmission line groups in series, and connect the second end 6 of the last signal transmission line in each group of signal transmission line groups with the Output signal test end Output corresponding to the group.
In addition, because the test circuit 4 provided in the above embodiment includes the transmission line test sub-circuits corresponding to the signal transmission lines in the display area one by one, and each transmission line test sub-circuit is connected to the Input signal end Input and is configured to control the Input signal end Input to provide a test signal for the corresponding signal transmission line, therefore, the test signals of all the signal transmission lines in the display area are provided by the Input signal end Input through the corresponding transmission line test sub-circuit.
When the first transmission line test sub-circuit 41 includes the first input control unit 7 and the first input unit 8, and the ith transmission line test sub-circuit 4i includes the ith input control unit 9 and the ith input unit 10, the test method provided by the above embodiment specifically includes:
in a test period, under the control of the control signal input terminal Switch and the trigger signal input terminal Reset, the first input control unit 7 controls the trigger signal input terminal Reset to be connected with the first input unit 8; under the control of the first Input control unit 7, the first Input unit 8 controls the Input signal terminal Input to be connected with the first terminal 5 of the first signal transmission line X1; the ith input control unit 9 controls the second end 6 of the (i-1) th signal transmission line X (i-1) to be connected to the ith input unit 10 under the control of the control signal input terminal Switch and the second end 6 of the (i-1) th signal transmission line X (i-1); under the control of the ith Input control unit 9, the ith Input unit 10 controls the Input signal terminal Input to be connected to the first terminal 5 of the ith signal transmission line Xi.
In the non-test period, the first input control unit 7 controls the trigger signal input terminal Reset to be disconnected from the first input unit 8 under the control of the control signal input terminal Switch and the trigger signal input terminal Reset; under the control of the first Input control unit 7, the first Input unit 8 controls the Input signal terminal Input not to be connected with the first terminal 5 of the first signal transmission line X1; the ith input control unit 9 controls the second end 6 of the (i-1) th signal transmission line X (i-1) to be disconnected from the ith input unit 10 under the control of the control signal input terminal Switch and the second end 6 of the (i-1) th signal transmission line X (i-1); under the control of the ith Input control unit 9, the ith Input unit 10 controls the Input signal terminal Input not to be connected to the first terminal 5 of the ith signal transmission line Xi.
When the first input control unit 7 provided in the above embodiment includes the first control switch tube T1s and the first trigger switch tube T1c, the first input unit 8 includes the first input switch tube T1n, the ith input control unit 9 includes the ith control switch tube Tis and the ith trigger switch tube Tic, and the ith input unit 10 includes the ith input switch tube Tin, the test method provided in the above embodiment specifically includes:
in a test period, under the control of a trigger signal Input end Reset, the first trigger Switch tube T1c is turned on, and under the control of a control signal Input end Switch, the first control Switch tube T1s is turned on, so that the trigger signal Input end Reset is connected with the gate of the first Input Switch tube T1n, the first Input Switch tube T1n is controlled to be turned on, and an Input signal end Input is connected with the first end 5 of the first signal transmission line X1; under the control of the second end 6 of the (i-1) th signal transmission line X (i-1), the ith trigger Switch tube Tic is conducted, under the control of the control signal Input end Switch, the ith control Switch tube Tis is conducted, so that the second end 6 of the (i-1) th signal transmission line X (i-1) is connected with the grid electrode of the ith Input Switch tube Tin, the ith Input Switch tube Tin is controlled to be conducted, and the Input signal end Input is connected with the first end 5 of the ith signal transmission line Xi;
in a non-test period, under the control of a trigger signal Input end Reset, the first trigger Switch tube T1c is turned off, under the control of a control signal Input end Switch, the first control Switch tube T1s is turned off, so that the trigger signal Input end Reset is not connected with the gate of the first Input Switch tube T1n, the first Input Switch tube T1n is controlled to be turned off, and the Input signal end Input is not connected with the first end 5 of the first signal transmission line X1; in the non-test period, under the control of the second end 6 of the (i-1) th signal transmission line X (i-1), the ith trigger Switch tube Tic is cut off, under the control of the control signal Input end Switch, the ith control Switch tube Tis is cut off, so that the second end 6 of the (i-1) th signal transmission line X (i-1) is not connected with the grid electrode of the ith Input Switch tube Tin, the ith Input Switch tube Tin is controlled to be cut off, and the Input signal end Input is not connected with the first end 5 of the ith signal transmission line Xi.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, as for the method embodiments, since they are substantially similar to the product embodiments, they are described simply, and reference may be made to the partial description of the product embodiments for relevant points.
In the foregoing description of embodiments, the particular features, structures, materials, or characteristics may be combined in any suitable manner in any one or more embodiments or examples.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.
Claims (10)
1. A test circuit is characterized in that the test circuit is arranged in a non-display area of a display panel, n signal transmission lines are arranged in a display area of the display panel, the test circuit comprises n transmission line test sub-circuits which are in one-to-one correspondence with the n signal transmission lines, wherein n is more than or equal to 1,
the n signal transmission lines are divided into at least one group of transmission line groups,
a first transmission line test sub-circuit corresponding to a first signal transmission line in the transmission line group is respectively connected with the control signal input terminal, the trigger signal input terminal, the input signal terminal and the first end of the first signal transmission line, and the first transmission line test sub-circuit is configured to: controlling whether the input signal end is connected with the first end of the first signal transmission line or not under the control of the control signal input end and the trigger signal input end;
an ith transmission line test sub-circuit corresponding to an ith signal transmission line in the transmission line group is respectively connected to the control signal input terminal, the second end of an (i-1) th signal transmission line in the transmission line group, the input signal terminal, and the first end of the ith signal transmission line, and the ith transmission line test sub-circuit is configured to: controlling whether the input signal end is connected with the first end of the ith signal transmission line or not under the control of the control signal input end and the second end of the (i-1) th signal transmission line, wherein i is more than or equal to 2;
and the second end of the last signal transmission line in the transmission line group is connected with the output signal test end corresponding to the transmission line group.
2. The test circuit of claim 1, wherein the first transmission line test subcircuit comprises: a first input control unit and a first input unit; wherein the content of the first and second substances,
the first input control unit is respectively connected with the control signal input end, the trigger signal input end and the first input unit, and is used for controlling whether the trigger signal input end is connected with the first input unit or not under the control of the control signal input end and the trigger signal input end;
the first input unit is respectively connected with an input signal end and the first end of the first signal transmission line, and is used for controlling whether the input signal end is connected with the first end of the first signal transmission line or not under the control of the first input control unit;
the ith transmission line test sub-circuit includes: an ith input control unit and an ith input unit; wherein the content of the first and second substances,
the ith input control unit is respectively connected with the control signal input end, the second end of the (i-1) th signal transmission line and the ith input unit, and is used for controlling whether the second end of the (i-1) th signal transmission line is connected with the ith input unit or not under the control of the control signal input end and the second end of the (i-1) th signal transmission line;
the ith input unit is respectively connected with an input signal end and the first end of the ith signal transmission line, and is used for controlling whether the input signal end is connected with the first end of the ith signal transmission line or not under the control of the ith input control unit.
3. The test circuit of claim 2, wherein the first input control unit comprises a first control switch tube and a first trigger switch tube, and the first input unit comprises a first input switch tube; wherein the content of the first and second substances,
the grid electrode of the first control switch tube is connected with the control signal input end,
the grid electrode of the first trigger switch tube and the first pole of the first trigger switch tube are both connected with the trigger signal input end, and the second pole of the first trigger switch tube is connected with the first pole of the first control switch tube;
the grid electrode of the first input switch tube is connected with the second pole of the first control switch tube, the first pole of the first input switch tube is connected with the input signal end, and the second pole of the first input switch tube is connected with the first end of the first signal transmission line;
the ith input control unit comprises an ith control switch tube and an ith trigger switch tube, and the ith input unit comprises an ith input switch tube; wherein the content of the first and second substances,
the grid electrode of the ith control switch tube is connected with the control signal input end,
the grid electrode of the ith trigger switch tube and the first pole of the ith trigger switch tube are both connected with the second end of the (i-1) th signal transmission line, and the second pole of the ith trigger switch tube is connected with the first pole of the ith control switch tube;
the grid electrode of the ith input switch tube is connected with the second pole of the ith control switch tube, the first pole of the ith input switch tube is connected with the input signal end, and the second pole of the ith input switch tube is connected with the first end of the ith signal transmission line.
4. The test circuit according to any one of claims 1 to 3, wherein the n signal transmission lines include at least one gate line and at least one data line, the test circuit includes at least one gate line test sub-circuit in one-to-one correspondence with the at least one gate line and at least one data line test sub-circuit in one-to-one correspondence with the at least one data line;
the at least one group of transmission line groups comprise a grid line transmission line group and a data line transmission line group; the gate line transmission line group includes the at least one gate line, and the data line transmission line group includes the at least one data line.
5. The test circuit according to any one of claims 1 to 3, wherein the n signal transmission lines include at least one gate line and at least one data line, the test circuit includes at least one gate line test sub-circuit in one-to-one correspondence with the at least one gate line and at least one data line test sub-circuit in one-to-one correspondence with the at least one data line;
the at least one group of transmission line groups comprise odd grid line transmission line groups, even grid line transmission line groups, odd data line transmission line groups and even data line transmission line groups; the odd gate line transmission line group includes an odd gate line of the at least one gate line, the even gate line transmission line group includes an even gate line of the at least one gate line, the odd data line transmission line group includes an odd data line of the at least one data line, and the even data line transmission line group includes an even data line of the at least one data line.
6. A display panel comprising the test circuit according to any one of claims 1 to 5.
7. A test method applied to the test circuit according to any one of claims 1 to 5, wherein the test method comprises the following steps for at least one group of transmission line groups:
in a test period, under the control of the control signal input end and the trigger signal input end, the control input signal end of the first transmission line test sub-circuit is connected with the first end of the first signal transmission line in the transmission line group; under the control of the control signal input end and the second end of the (i-1) th signal transmission line in the transmission line group, the ith transmission line test sub-circuit controls the input signal end to be connected with the first end of the ith signal transmission line in the transmission line group; detecting the level of an output signal test end corresponding to the transmission line group;
in a non-test period, under the control of the control signal input end and the trigger signal input end, the first transmission line test sub-circuit controls the input signal end to be disconnected from the first end of the first signal transmission line; under the control of the control signal input end and the second end of the (i-1) th signal transmission line, the (i) th transmission line test sub-circuit controls the input signal end to be disconnected with the first end of the (i) th signal transmission line.
8. The method of claim 7, wherein when the first transmission line test sub-circuit includes a first input control unit and a first input unit, and the ith transmission line test sub-circuit includes an ith input control unit and an ith input unit,
in the test period, under the control of the control signal input end and the trigger signal input end, the first input control unit controls the trigger signal input end to be connected with the first input unit; under the control of the first input control unit, the first input unit controls the input signal end to be connected with the first end of the first signal transmission line; under the control of the control signal input end and the second end of the (i-1) th signal transmission line, the ith input control unit controls the second end of the (i-1) th signal transmission line to be connected with the ith input unit; under the control of the ith input control unit, the ith input unit controls the input signal end to be connected with the first end of the ith signal transmission line;
the first input control unit controls the trigger signal input terminal to be disconnected from the first input unit under the control of the control signal input terminal and the trigger signal input terminal in the non-test period; under the control of the first input control unit, the first input unit controls the input signal end to be disconnected with the first end of the first signal transmission line; under the control of the control signal input end and the second end of the (i-1) th signal transmission line, the ith input control unit controls the second end of the (i-1) th signal transmission line to be disconnected with the ith input unit; under the control of the ith input control unit, the ith input unit controls the input signal end to be disconnected with the first end of the ith signal transmission line.
9. The testing method of claim 8, wherein when the first input control unit comprises a first control switch tube and a first trigger switch tube, and the first input unit comprises a first input switch tube,
in the test period, the first trigger switch tube is conducted under the control of the trigger signal input end, and the first control switch tube is conducted under the control of the control signal input end, so that the trigger signal input end is connected with the grid electrode of the first input switch tube, the first input switch tube is controlled to be conducted, and the input signal end is connected with the first end of the first signal transmission line;
in the non-test period, the first trigger switch tube is cut off under the control of the trigger signal input end, and the first control switch tube is cut off under the control of the control signal input end, so that the trigger signal input end is not connected with the grid electrode of the first input switch tube, the first input switch tube is controlled to be cut off, and the input signal end is not connected with the first end of the first signal transmission line.
10. The testing method according to claim 8, wherein when the ith input control unit comprises an ith control switch tube and an ith trigger switch tube, and the ith input unit comprises an ith input switch tube,
in the test period, the ith trigger switch tube is conducted under the control of the second end of the ith-1 signal transmission line, the ith control switch tube is conducted under the control of the control signal input end, so that the second end of the ith-1 signal transmission line is connected with the grid electrode of the ith input switch tube, the ith input switch tube is controlled to be conducted, and the input signal end is connected with the first end of the ith signal transmission line;
in the non-test period, the ith trigger switch tube is turned off under the control of the second end of the ith-1 signal transmission line, the ith control switch tube is turned off under the control of the control signal input end, so that the second end of the ith-1 signal transmission line is not connected with the grid electrode of the ith input switch tube, the ith input switch tube is controlled to be turned off, and the input signal end is not connected with the first end of the ith signal transmission line.
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| CN106707641A (en) * | 2016-12-22 | 2017-05-24 | 深圳市华星光电技术有限公司 | Liquid crystal display panel with test circuit structure and liquid crystal display device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR101305379B1 (en) * | 2009-07-21 | 2013-09-06 | 엘지디스플레이 주식회사 | Chip on glass type liquid crystal display device and inspecting method for the same |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102298891A (en) * | 2011-02-14 | 2011-12-28 | 友达光电股份有限公司 | Method for testing signal transmission line, integrated circuit and display panel module |
| CN203055406U (en) * | 2012-12-24 | 2013-07-10 | 北京京东方光电科技有限公司 | Signal line detecting device and display device for substrate |
| CN106201137A (en) * | 2016-07-01 | 2016-12-07 | 厦门天马微电子有限公司 | Display floater and driving method, display device |
| CN106707641A (en) * | 2016-12-22 | 2017-05-24 | 深圳市华星光电技术有限公司 | Liquid crystal display panel with test circuit structure and liquid crystal display device |
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