CN106707641A - Liquid crystal display panel with test circuit structure and liquid crystal display device - Google Patents
Liquid crystal display panel with test circuit structure and liquid crystal display device Download PDFInfo
- Publication number
- CN106707641A CN106707641A CN201611199402.4A CN201611199402A CN106707641A CN 106707641 A CN106707641 A CN 106707641A CN 201611199402 A CN201611199402 A CN 201611199402A CN 106707641 A CN106707641 A CN 106707641A
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- Prior art keywords
- test
- liquid crystal
- crystal display
- signal
- display panel
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
Abstract
The invention provides a liquid crystal display panel with test circuit structure, comprising a signal drive chip, data lines, scanning lines, pixel units and a test circuit structure; the test circuit structure comprises a test control line, a test signal line and test switch tubes, the test control line is used for inputting a test control signal, the test signal line is used for inputting a test signal, the control ends of the test switch tubes are connected to the test control line, the input ends of the test switch tubes are connected to the test signal line, and the output ends of the test switch tubes are connected to the input ends of the corresponding scanning lines. The invention also provides a liquid crystal display device; with the test circuit structure, multiple thin-film transistors of the liquid crystal display panel under test are switched on or off at the same time so that it is convenient to test the device stability of the liquid crystal display panel.
Description
Technical field
The present invention relates to liquid crystal panel field, more particularly to a kind of liquid crystal display panel with test circuit structure and
Liquid crystal display device.
Background technology
Liquid crystal display panel experienced very long phase of basic research, after big production and commercialization is realized, its product
The advantages of product are with frivolous, environmentally friendly and high-performance, enjoys and is increasingly widely applied field.
The manufacture craft of liquid crystal display panel include array processes technology, color membrane process technology, molding process technology and
Module technology, per pass manufacturing process may produce industrial yield issues and integrity problem.Therefore, it is right
Some displays are bad to be parsed into for the indispensable self-criticism link of LCD board industry.
Therefore, it is necessary to a kind of liquid crystal display panel and liquid crystal display device with test circuit structure are provided, to solve
The problems of prior art.
The content of the invention
The embodiment of the present invention provide it is a kind of liquid crystal display panel can easily be detected with test circuit structure
Liquid crystal display panel and liquid crystal display device；It is relatively low with the yield for solving existing liquid crystal display panel and liquid crystal display device
And the poor technical problem of reliability.
The embodiment of the present invention provides a kind of liquid crystal display panel with test circuit structure, and it includes：
Signal driving chip, for generating the data-signal and the scanning signal；
Data wire, for transmitting data-signal；
Scan line, for transmitting scanning signal；
Pixel cell, is staggered to form by the data wire and the scan line；And
Test circuit structure, is arranged on the side of the scan line, for the scan line input test signal；
Wherein described test circuit structure includes：
Testing and control line, for input test control signal；
Test signal line, for input test signal；And
Test switching tube, the control end of the test switching tube is connected with the testing and control line, the test switching tube
Input be connected with the test signal line, it is described test switching tube output end and corresponding scan line input connect
Connect.
In the liquid crystal display panel with test circuit structure of the present invention, when the liquid crystal display panel is in
During working condition, the testing and control line input low level signal, the test switching tube is off；When the liquid crystal
When display panel is in test mode, the testing and control line input high level signal, the test switching tube is on shape
State.
In the liquid crystal display panel with test circuit structure of the present invention, when the liquid crystal display panel is in
During working condition, the signal driving chip generates the data-signal and the scanning signal；When the LCD
When plate is in test mode, the signal driving chip is stopped.
In the liquid crystal display panel with test circuit structure of the present invention, led when the test switching tube is in
During logical state, by the test signal line input high level test signal, realizing that the liquid crystal display panel is corresponding thin
The conducting of film transistor；By to the test signal line input low level test signal, realizing the liquid crystal display panel pair
The disconnection of the thin film transistor (TFT) answered.
In the liquid crystal display panel with test circuit structure of the present invention, the same test signal line with it is many
The input connection of the individual test switching tube；The same testing and control line connects with the control end of multiple test switching tubes
Connect.
In the liquid crystal display panel with test circuit structure of the present invention, at the multiple test switching tube
When conducting state, by the test signal line input high level test signal, realizing the liquid crystal display panel correspondence
Multiple thin film transistor (TFT)s while turn on；By to the test signal line input low level test signal, realizing the liquid
Disconnected while LCD panel corresponding multiple thin film transistor (TFT)s.
In the liquid crystal display panel with test circuit structure of the present invention, the same test signal line correspondence
The a plurality of adjacent scan line.
The embodiment of the present invention also provides a kind of liquid crystal display device, and it includes backlight and liquid crystal display panel, wherein
The liquid crystal display panel includes：
Signal driving chip, for generating the data-signal and the scanning signal；
Data wire, for transmitting data-signal；
Scan line, for transmitting scanning signal；
Pixel cell, is staggered to form by the data wire and the scan line；And
Test circuit structure, is arranged on the side of the scan line, for the scan line input test signal；
Wherein described test circuit structure includes：
Testing and control line, for input test control signal；
Test signal line, for input test signal；And
Test switching tube, the control end of the test switching tube is connected with the testing and control line, the test switching tube
Input be connected with the test signal line, it is described test switching tube output end and corresponding scan line input connect
Connect.
In liquid crystal display device of the present invention, when the liquid crystal display panel is in running order, the survey
Examination control line input low level signal, the test switching tube is off；The signal driving chip generates the number
It is believed that number and the scanning signal；When the liquid crystal display panel is in test mode, the testing and control line input is high
Level signal, the test switching tube is in the conduction state；The signal driving chip is stopped.
In liquid crystal display device of the present invention, same test signal line test switching tubes described with multiple
Input is connected；The control end of same testing and control line test switching tube described with multiple is connected；
When the multiple test switching tube is in the conduction state, tested by the test signal line input high level
Signal, realizes being turned on while the liquid crystal display panel corresponding multiple thin film transistor (TFT)s；By to the test signal line
Input low level test signal, realizes being disconnected while the liquid crystal display panel corresponding multiple thin film transistor (TFT)s.
Compared to existing liquid crystal display panel and liquid crystal display device, the liquid crystal with test circuit structure of the invention
The setting that display panel and liquid crystal display device pass through test circuit structure, realizes to the LCD in test mode
Multiple thin film transistor (TFT)s of plate are simultaneously turned on or are simultaneously switched off operation, consequently facilitating it is steady to carry out device to liquid crystal display panel
Qualitative test；Solve the technology that yield is relatively low and reliability is poor of existing liquid crystal display panel and liquid crystal display device
Problem.
It is that the above of the invention can be become apparent, preferred embodiment cited below particularly, and coordinate institute's accompanying drawings, make
Describe in detail as follows：
Brief description of the drawings
Fig. 1 is the structural representation of the preferred embodiment of the liquid crystal display panel with test circuit structure of the invention.
Specific embodiment
The explanation of following embodiment is, with reference to additional schema, to be used to illustrate the particular implementation that the present invention may be used to implement
Example.The direction term that the present invention is previously mentioned, for example " on ", D score, "front", "rear", "left", "right", " interior ", " outward ", " side "
Deng being only the direction with reference to annexed drawings.Therefore, the direction term for using is to illustrate and understand the present invention, and is not used to
The limitation present invention.
In figure, the similar unit of structure is represented with identical label.
Fig. 1 is refer to, Fig. 1 is the knot of the preferred embodiment of the liquid crystal display panel with test circuit structure of the invention
Structure schematic diagram.The liquid crystal display panel 10 with test circuit structure of this preferred embodiment includes signal driving chip 11, number
According to line 12, scan line 13, pixel cell 14 and test circuit structure 15.
Wherein signal driving chip 11 is used to generate data-signal and scanning signal；Data wire 12 is used to transmit data letter
Number；Scan line 13 is used to transmit scanning signal, scan line g1, scan line g2, scan line g3 and scan line g3 in such as Fig. 1
Deng；Pixel cell 14 is staggered to form by data wire 12 and scan line 13, pixel cell S11, pixel cell S21 such as in Fig. 1, as
Plain cell S 31 and pixel cell S41 etc.；Test circuit structure 15 is arranged on the side of scan line, for defeated to scan line 13
Enter test signal.
As shown in figure 1, test circuit structure 15 includes testing and control line 151, test signal line 152 and test switching tube
153, testing and control line 151 is used for input test control signal；Test signal line 152 is used for input test signal；Test switch
The control end of pipe 153 is connected with testing and control line 151, and the input for testing switching tube 153 is connected with test signal line 152, surveys
Try the output end of switching tube 153 to be connected with the input of corresponding scan line 13, the test switching tube q1, test in such as Fig. 1 are opened
Close pipe q2, test switching tube q3 and test switching tube q4 etc..
Specifically, same test signal line 152 input simultaneously with test switching tube q1, test switching tube q2 here
The input connection of input, the input of test switching tube q3 and test switching tube q4, same testing and control line 151 is simultaneously
Control end, the control end of test switching tube q2, the control end of test switching tube q3 and test switch with test switching tube q1
The control end connection of pipe q4.Here test signal line 152 preferably corresponding a plurality of adjacent scan line 13, so can simultaneously to phase
The thin film transistor (TFT) of adjacent multirow pixel cell 14 is simultaneously turned on or by opening operation, is easy to liquid crystal display panel 10
The continuous viewing area in part carry out device stability test.
When the liquid crystal display panel 10 with test circuit structure of this preferred embodiment is used, when the liquid crystal display panel
10 in normal operating conditions when, all of equal input low level signal of testing and control line 151, thus test switching tube 153 it is equal
It is off；At this moment the generation of signal driving chip 11 data-signal and scanning signal, pixel cell 14 is in scanning signal
Control under corresponding picture is shown according to data-signal.
When liquid crystal display panel 10 is in test mode, signal driving chip 11 is stopped, i.e. signal driving chip
11 stop transmitting scanning signal to scan line 13, while stopping transmitting data-signal to data wire 12.
Such as the equal input high level signal of all of testing and control line 151, test switching tube 153 and be in conducting state.This
When can be by the input high level test signal of test signal line 152 so that high level test signals are by testing switching tube
153rd, scan line 13 is transmitted to the grid of the corresponding thin film transistor (TFT) of liquid crystal display panel 10, it is achieved thereby that liquid crystal display panel
The conducting of 10 corresponding thin film transistor (TFT)s, pixel cell 14 can carry out repid discharge by the thin film transistor (TFT) for turning on, and realize
To the corresponding pixel cell of liquid crystal display panel 10 rapidly switch off the detection of function.
At this moment also can be by the input low level test signal of test signal line 152 so that low level test signal is by surveying
Examination switching tube 153, scan line 13 are transmitted to the grid of the corresponding thin film transistor (TFT) of liquid crystal display panel 10, it is achieved thereby that liquid crystal
The disconnection of the corresponding thin film transistor (TFT) of display panel 10, so as to can whether there is to the corresponding pixel cell of liquid crystal display panel 10
Electric leakage is detected.
Therefore when liquid crystal display panel 10 is in test mode, can be by test circuit structure 15 to liquid crystal display panel
The thin film transistor (TFT) of 10 part or all of pixel cell is simultaneously turned on or is simultaneously switched off operation, so that convenient to film
Transistor carries out the device stability test of different condition.
Here every test signal line 152 and testing and control line 151 control test switching tube 153 quantity can according to
Set the need for family, the thin film transistor (TFT) of the corresponding single row of pixels unit 10 of scan line 13 can at least be turned on
Or opening operation, can at most the behaviour that is turned on or off be carried out to the thin film transistor (TFT) of all pixels unit 14 of liquid crystal display panel 10
Make.The controllable four tests switching tube 153 of every test signal line 152 and testing and control line 151 in Fig. 1, you can while right
The thin film transistor (TFT) of the corresponding four rows pixel cell of four scan lines 13 is simultaneously turned on or is simultaneously switched off operation.
The picture of the liquid crystal display panel 10 with test circuit structure for so completing this preferred embodiment shows
Process and device test procedures.
The setting that the liquid crystal display panel with test circuit structure of this preferred embodiment passes through test circuit structure, it is real
Are showed and multiple thin film transistor (TFT)s of the liquid crystal display panel in test mode are simultaneously turned on or operation is simultaneously switched off, from
And be easy to carry out device stability test to liquid crystal display panel.
The present invention also provides a kind of liquid crystal display device, and the liquid crystal display device includes backlight and LCD
Plate.The liquid crystal display panel includes signal driving chip, data wire, scan line, pixel cell and test circuit structure.
Wherein signal driving chip is used to generate data-signal and scanning signal；Data wire is used to transmit data-signal；
Scan line is used to transmit scanning signal；Pixel cell is staggered to form by data wire and scan line；Test circuit structure is arranged on to be swept
The side of line is retouched, for scan-line data test signal.
Test circuit structure includes testing and control line, test signal line and test switching tube, and testing and control line is used for defeated
Enter test control signal；Test signal line is used for input test signal；The control end for testing switching tube is connected with testing and control line,
The input for testing switching tube is connected with test signal line, tests the output end of switching tube and connects with the input of corresponding scan line
Connect.
Preferably, when liquid crystal display panel is in running order, testing and control line input low level signal, test switch
Pipe is off；When liquid crystal display panel is in test mode, testing and control line input high level signal, test switch
Pipe is in the conduction state.
Preferably, when liquid crystal display panel is in running order, signal driving chip generation data-signal and scanning
Signal；When liquid crystal display panel is in test mode, signal driving chip is stopped.
Preferably, when testing switching tube and being in the conduction state, by test signal line input high level test signal,
Realize the conducting of the corresponding thin film transistor (TFT) of liquid crystal display panel；It is real by test signal line input low level test signal
The disconnection of the corresponding thin film transistor (TFT) of existing liquid crystal display panel.
Preferably, same test signal line is connected with the input of multiple test switching tube；Same testing and control line with it is many
The control end connection of individual test switching tube.
Preferably, when multiple test switching tube is in the conduction state, tested by test signal line input high level
Signal, realizes being turned on while liquid crystal display panel corresponding multiple thin film transistor (TFT)s；Low electricity is input into by test signal line
Flat test signal, realizes being disconnected while liquid crystal display panel corresponding multiple thin film transistor (TFT)s.
Preferably, a plurality of adjacent scan line of same test signal line correspondence.
The concrete operating principle of liquid crystal display device of the invention and the above-mentioned liquid crystal display with test circuit structure
Description in the preferred embodiment of panel is same or similar, specifically refers to the above-mentioned LCD with test circuit structure
Associated description in the preferred embodiment of plate.
Liquid crystal display panel and liquid crystal display device with test circuit structure of the invention pass through test circuit structure
Setting, realize and multiple thin film transistor (TFT)s of the liquid crystal display panel in test mode simultaneously turned on or while broken
Operation is opened, consequently facilitating carrying out device stability test to liquid crystal display panel；Solve existing liquid crystal display panel and liquid
The technical problem that the yield of crystal device is relatively low and reliability is poor.
In sum, although the present invention it is disclosed above with preferred embodiment, but above preferred embodiment and be not used to limit
The system present invention, one of ordinary skill in the art without departing from the spirit and scope of the present invention, can make various changes and profit
Adorn, therefore protection scope of the present invention is defined by the scope that claim is defined.
Claims (10)
1. a kind of liquid crystal display panel with test circuit structure, it is characterised in that including：
Signal driving chip, for generating the data-signal and the scanning signal；
Data wire, for transmitting data-signal；
Scan line, for transmitting scanning signal；
Pixel cell, is staggered to form by the data wire and the scan line；And
Test circuit structure, is arranged on the side of the scan line, for the scan line input test signal；
Wherein described test circuit structure includes：
Testing and control line, for input test control signal；
Test signal line, for input test signal；And
Test switching tube, the control end of the test switching tube is connected with the testing and control line, described to test the defeated of switching tube
Enter end to be connected with the test signal line, the output end of the test switching tube is connected with the input of corresponding scan line.
2. the liquid crystal display panel with test circuit structure according to claim 1, it is characterised in that
When the liquid crystal display panel is in running order, the testing and control line input low level signal, the test is opened
Pipe is closed to be off；When the liquid crystal display panel is in test mode, the testing and control line input high level letter
Number, the test switching tube is in the conduction state.
3. the liquid crystal display panel with test circuit structure according to claim 2, it is characterised in that
When the liquid crystal display panel is in running order, the signal driving chip generates the data-signal and described
Scanning signal；When the liquid crystal display panel is in test mode, the signal driving chip is stopped.
4. the liquid crystal display panel with test circuit structure according to claim 2, it is characterised in that
It is real by the test signal line input high level test signal when the test switching tube is in the conduction state
The now conducting of the corresponding thin film transistor (TFT) of the liquid crystal display panel；Believed by being tested to the test signal line input low level
Number, realize the disconnection of the corresponding thin film transistor (TFT) of the liquid crystal display panel.
5. the liquid crystal display panel with test circuit structure according to claim 1, it is characterised in that
The input of same test signal line test switching tube described with multiple is connected；The same testing and control line with it is many
The control end connection of the individual test switching tube.
6. the liquid crystal display panel with test circuit structure according to claim 5, it is characterised in that
When the multiple test switching tube is in the conduction state, believed by being tested to the test signal line input high level
Number, realize being turned on while the liquid crystal display panel corresponding multiple thin film transistor (TFT)s；By defeated to the test signal line
Enter low level test signal, realize being disconnected while the liquid crystal display panel corresponding multiple thin film transistor (TFT)s.
7. the liquid crystal display panel with test circuit structure according to claim 6, it is characterised in that the same survey
The a plurality of adjacent scan line of trial signal line correspondence.
8. a kind of liquid crystal display device, it is characterised in that including backlight and liquid crystal display panel, wherein the liquid crystal display
Panel includes：
Signal driving chip, for generating the data-signal and the scanning signal；
Data wire, for transmitting data-signal；
Scan line, for transmitting scanning signal；
Pixel cell, is staggered to form by the data wire and the scan line；And
Test circuit structure, is arranged on the side of the scan line, for the scan line input test signal；
Wherein described test circuit structure includes：
Testing and control line, for input test control signal；
Test signal line, for input test signal；And
Test switching tube, the control end of the test switching tube is connected with the testing and control line, described to test the defeated of switching tube
Enter end to be connected with the test signal line, the output end of the test switching tube is connected with the input of corresponding scan line.
9. liquid crystal display device according to claim 8, it is characterised in that
When the liquid crystal display panel is in running order, the testing and control line input low level signal, the test is opened
Pipe is closed to be off；The signal driving chip generates the data-signal and the scanning signal；
When the liquid crystal display panel is in test mode, the testing and control line input high level signal, the test is opened
Close pipe in the conduction state；The signal driving chip is stopped.
10. liquid crystal display device according to claim 7, it is characterised in that
The input of same test signal line test switching tube described with multiple is connected；The same testing and control line with it is many
The control end connection of the individual test switching tube；
When the multiple test switching tube is in the conduction state, believed by being tested to the test signal line input high level
Number, realize being turned on while the liquid crystal display panel corresponding multiple thin film transistor (TFT)s；By defeated to the test signal line
Enter low level test signal, realize being disconnected while the liquid crystal display panel corresponding multiple thin film transistor (TFT)s.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611199402.4A CN106707641A (en) | 2016-12-22 | 2016-12-22 | Liquid crystal display panel with test circuit structure and liquid crystal display device |
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| CN201611199402.4A CN106707641A (en) | 2016-12-22 | 2016-12-22 | Liquid crystal display panel with test circuit structure and liquid crystal display device |
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| CN106707641A true CN106707641A (en) | 2017-05-24 |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107180604A (en) * | 2017-07-12 | 2017-09-19 | 深圳市华星光电半导体显示技术有限公司 | The test suite and method of testing of display base plate |
| CN107274820A (en) * | 2017-07-24 | 2017-10-20 | 京东方科技集团股份有限公司 | A kind of test circuit and its method of testing, display panel |
| CN108399880A (en) * | 2018-04-19 | 2018-08-14 | 武汉华星光电半导体显示技术有限公司 | Test circuit, array substrate and luminous display unit |
| CN109188812A (en) * | 2018-10-09 | 2019-01-11 | 京东方科技集团股份有限公司 | A kind of array substrate, its test method, display panel and display device |
| CN109243348A (en) * | 2018-11-09 | 2019-01-18 | 惠科股份有限公司 | Measure signal circuit and its method for measurement |
| CN109584762A (en) * | 2018-12-25 | 2019-04-05 | 惠科股份有限公司 | Test method, test circuit and the display device of display panel |
| US10573210B2 (en) | 2018-04-19 | 2020-02-25 | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Test circuit, array substrate, and light-emitting display apparatus |
| WO2021004087A1 (en) * | 2019-07-05 | 2021-01-14 | 昆山国显光电有限公司 | Screen body detection circuit, and display screen and screen body detection method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107180604A (en) * | 2017-07-12 | 2017-09-19 | 深圳市华星光电半导体显示技术有限公司 | The test suite and method of testing of display base plate |
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| CN107274820B (en) * | 2017-07-24 | 2020-11-27 | 京东方科技集团股份有限公司 | Test circuit, test method thereof and display panel |
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| CN109188812B (en) * | 2018-10-09 | 2021-03-30 | 京东方科技集团股份有限公司 | Array substrate, testing method thereof, display panel and display device |
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