CN109584762B - Display panel test method, test circuit and display device - Google Patents
Display panel test method, test circuit and display device Download PDFInfo
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- CN109584762B CN109584762B CN201811598879.9A CN201811598879A CN109584762B CN 109584762 B CN109584762 B CN 109584762B CN 201811598879 A CN201811598879 A CN 201811598879A CN 109584762 B CN109584762 B CN 109584762B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The application discloses a test method, a test circuit and a display device of a display panel, wherein the test method of the display panel comprises the following steps: step S1, receiving the voltage signal input by the signal input end; and step S2, adjusting the test circuit according to the voltage signal input by the signal input terminal to make the conductive sheet and the data line conductive, or to make the conductive sheet and the scan line conductive. According to the technical scheme, the efficiency of measuring the voltage signal of the data line and the voltage signal of the scanning line can be improved, and the measurement cost is reduced.
Description
Technical Field
The invention relates to the technical field of display, in particular to a test method and a test circuit for a display panel and a display device.
Background
In the display device, voltage signals are transmitted through data lines and scanning lines on the array substrate, so that the display device achieves a display function. However, since the trace of the array substrate has a certain capacitance and resistance, signal distortion occurs after the voltage signal is transmitted through the data line and the scan line. Therefore, it is necessary to measure a voltage signal attenuated after being transmitted through the data lines and the scan lines on the array substrate. Because the tail ends of the data line and the scanning line are positioned at the edge of the glass substrate, the attenuated voltage signals transmitted by the data line and the scanning line can be measured only after the glass is cracked, the testing method needs long time and is low in efficiency, and the glass is cracked to damage products, so that the testing cost is increased.
Disclosure of Invention
The application provides a test method, a test circuit and a display device of a display panel, and aims to solve the problems that when a voltage signal of a data line or a scanning line is measured, the measurement can be carried out only after glass is split, the measurement efficiency is low, and the measurement cost is high.
In order to solve the above problems, the present application provides a method for testing a display panel, where the method for testing a display panel is applied to a display device, the display device includes a data line, a scan line and a conductive plate, the data line is connected to the conductive plate through a test circuit, the scan line is connected to the conductive plate through the test circuit, and the method for testing a display panel includes:
step S1, receiving the voltage signal input by the signal input end;
step S2, adjusting the test circuit according to the voltage signal input by the signal input terminal to make the conductive sheet and the data line conductive, or to make the conductive sheet and the scan line conductive.
Optionally, the test circuit includes:
a signal input terminal;
the input end of the first switch circuit is connected with the data line;
the input end of the second switch circuit is connected with the scanning line;
the input end of the switch control circuit is connected with the signal input end, and the output end of the switch control circuit is connected with the controlled end of the first switch circuit and the controlled end of the second switch circuit;
the input end of the third switching circuit is connected with the output end of the first switching circuit, and the output end of the third switching circuit is connected with the conducting strip;
the input end of the fourth switch circuit is connected with the output end of the second switch circuit, and the output end of the fourth switch circuit is connected with the conducting strip;
and the input end of the voltage detection circuit is connected with the signal input end, and the output end of the voltage detection circuit is connected with the controlled end of the third switch circuit and the controlled end of the fourth switch circuit.
Optionally, the step S2 includes:
step S21, the switch control circuit generates and outputs a control signal according to the voltage signal input by the signal input terminal to control the first switch circuit and the second switch circuit to be turned on;
step S22, the voltage detection circuit generates a detection signal according to the voltage signal input by the signal input terminal and outputs the detection signal to control the third switch circuit or the fourth switch circuit to open, so as to enable the conductive sheet to be conducted with the data line, or to enable the conductive sheet to be conducted with the scan line.
Optionally, the step S22 includes:
step S221, when the voltage detection circuit detects the voltage signal input by the signal input terminal, determining whether the voltage signal input by the signal input terminal is greater than a reference voltage signal;
in step S222, when the voltage signal input by the signal input terminal is greater than the reference voltage signal, the voltage detection circuit outputs a high-level detection signal to control the third switch circuit to be turned on and control the fourth switch circuit to be turned off, so that the conductive sheet is conducted with the data line.
Optionally, after step S221, the method further includes:
in step S223, when the voltage signal input by the signal input terminal is smaller than the reference voltage signal, the voltage detection circuit outputs a low-level detection signal to control the fourth switch circuit to be turned on and control the third switch circuit to be turned off, so that the conductive sheet is conducted with the scan line.
In order to solve the above problem, the present application further provides a test circuit, the test circuit is disposed in a display device, the display device includes a data line, a scan line, and a conductive sheet, the test circuit includes:
a signal input terminal;
the input end of the first switch circuit is connected with the data line;
the input end of the second switch circuit is connected with the scanning line;
the input end of the switch control circuit is connected with the signal input end, the output end of the switch control circuit is connected with the controlled end of the first switch circuit and the controlled end of the second switch circuit, and the switch control circuit is configured to generate and output a control signal according to a voltage signal input by the signal input end so as to control the first switch circuit and the second switch circuit to be opened;
the input end of the third switching circuit is connected with the output end of the first switching circuit, and the output end of the third switching circuit is connected with the conducting strip;
the input end of the fourth switch circuit is connected with the output end of the second switch circuit, and the output end of the fourth switch circuit is connected with the conducting strip;
the input end of the voltage detection circuit is connected with the signal input end, the output end of the voltage detection circuit is connected with the controlled end of the third switch circuit and the controlled end of the fourth switch circuit, and the voltage detection circuit is configured to generate and output a detection signal according to a voltage signal input by the signal input end so as to control the third switch circuit to be opened, so that the conducting strip is conducted with the data line;
the voltage detection circuit is further configured to generate a detection signal according to the voltage signal input by the signal input end and output the detection signal to control the fourth switch circuit to be opened so that the conductive sheet is conducted with the scanning line.
Optionally, the switch control circuit includes a flip-flop and a phase inverter, a clock signal input end of the flip-flop is an input end of the switch control circuit, a data input end of the flip-flop is connected with an output end of the phase inverter, a data output end of the flip-flop is connected with an input end of the phase inverter, and an output end of the phase inverter is an output end of the switch control circuit.
Optionally, the switch control circuit further includes a first resistor, a first end of the first resistor is connected to the output end of the inverter, and a second end of the first resistor is grounded.
Optionally, the voltage detection circuit includes a first comparator, a non-inverting input terminal of the first comparator is an input terminal of the voltage detection circuit, a non-inverting input terminal of the first comparator inputs a reference voltage signal, and an output terminal of the first comparator is an output terminal of the voltage detection circuit.
To achieve the above object, the present application further provides a display device including a display panel and the test circuit as described in any one of the above.
The technical scheme of this application, voltage signal adjustment test circuit according to signal input part input to make the data line communicate through test circuit and conducting strip, perhaps make the scanning line communicate through test circuit and conducting strip, through the voltage signal who measures the conducting strip, can obtain the voltage signal of data line or the voltage signal of scanning line, so set up, need not make the glass lobe of a leaf can measure the voltage signal of data line or scanning line, the measurement of high efficiency and measurement cost is low.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a schematic flow chart illustrating a testing method of a display panel according to an embodiment of the present invention;
FIG. 2 is a detailed flowchart of step S2 in FIG. 1;
FIG. 3 is a detailed flowchart of step S22 in FIG. 2;
FIG. 4 is a block diagram of a test circuit according to an embodiment of the present invention;
FIG. 5 is a schematic circuit diagram of a test circuit according to an embodiment of the present invention.
The reference numbers illustrate:
the implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that, if directional indications (such as up, down, left, right, front, and back … …) are involved in the embodiment of the present invention, the directional indications are only used to explain the relative positional relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, if there is a description of "first", "second", etc. in an embodiment of the present invention, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
The invention provides a test method of a display panel.
Referring to fig. 1, the test method of the display panel is applied to a display device, the display device includes a data line 10, a scan line 20 and a conductive sheet 50, the data line 10 is connected to the conductive sheet 50 through a test circuit, the scan line 20 is connected to the conductive sheet 50 through the test circuit, the test circuit includes a signal input terminal a, a first switch circuit 60, a second switch circuit 70, a third switch circuit 80, a fourth switch circuit 90, a switch control circuit 30 and a voltage detection circuit 40, wherein an input terminal of the first switch circuit 60 is connected to the data line 10, an output terminal of the first switch circuit 60 is connected to an input terminal of the third switch circuit 80, and an output terminal of the third switch circuit 80 is connected to the conductive sheet 50; the input end of the second switch circuit 70 is connected to the scan line 20, the output end of the second switch circuit 70 is connected to the input end of the fourth switch circuit 90, and the output end of the fourth switch circuit 90 is connected to the conductive sheet 50; the input end of the switch control circuit 30 is connected to the signal input end a, and the output end of the switch control circuit 30 is connected to the controlled end of the first switch circuit 60 and the controlled end of the second switch circuit 70; the input end of the voltage detection circuit 40 is connected to the signal input end a, and the output end of the voltage detection circuit 40 is connected to the controlled end of the third switch circuit 80 and the controlled end of the fourth switch circuit 90.
In this embodiment, the test circuit further includes a Timing Controller, the Timing Controller may be disposed on a Timing Controller (TCON) board of the display device, the Timing Controller (TCON) board is further provided with a power management integrated circuit, a gate driving circuit and a source driving circuit, a voltage signal output by the system motherboard is processed by the Timing Controller, and is connected to the display area through the gate driving circuit and the source driving circuit, and the voltage signal is transmitted through a data line and a scan line on the Array substrate. The display device can be a display device with a display panel, such as a television, a tablet computer, a mobile phone and the like.
The test method of the display panel comprises the following steps:
step S1, receiving the voltage signal input by the signal input terminal a;
step S2, adjusting the test circuit according to the voltage signal input from the signal input terminal a, so as to make the conductive sheet 50 and the data line 10 conductive, or to make the conductive sheet 50 and the scan line 20 conductive.
Specifically, in the initial state, the first switch circuit 60 and the second switch circuit 70 are both in the off state, and at this time, the data line 10 is disconnected from the conductive sheet 50, and the scan line 20 is also disconnected from the conductive sheet 50.
When the voltage signal of the data line 10 or the voltage signal of the scan line 20 needs to be measured, a voltage signal that changes from low to high may be provided by a timing controller or an external circuit and input to the switch control circuit 30 and the voltage detection circuit 40, and the voltage signal may be kept at a high level or pulled down by a program setting of the timing controller or a setting of the external circuit to control an electronic element on a test circuit, and the conductive sheet 50 may be connected to the data line 10 or the conductive sheet 50 may be connected to the scan line 10 by changing a state of the electronic element on the test circuit. The electronic components that can switch the connection of the conductive sheet 50 may include a switch, a resistor, a flip-flop, an inverter, a comparator, and the like. By controlling the operating state of the electronic component on the test circuit, the conductive sheet 50 can be conducted with the data line 10, or the conductive sheet 50 can be conducted with the scan line 20, so that the voltage signal of the data line 10 can be measured through the conductive sheet 50, or the voltage signal of the scan line 20 can be tested through the conductive sheet 50. Specifically, referring to fig. 2, step S2 includes:
step S21, the switch control circuit 30 generates and outputs a control signal according to the voltage signal input by the signal input terminal a, so as to control the first switch circuit 60 and the second switch circuit 70 to be turned on;
step S22, the voltage detection circuit 40 generates and outputs a detection signal according to the voltage signal input by the signal input terminal a, so as to control the third switch circuit 80 or the fourth switch circuit 90 to open, so as to enable the conductive sheet 50 to be conducted with the data line 10, or to enable the conductive sheet 50 to be conducted with the scan line 20;
in this embodiment, the first switch circuit 60, the second switch circuit 70, the third switch circuit 80, and the fourth switch circuit 90 have two states of being turned off and turned on, and may be implemented by circuits including various transistors, such as MOS transistors, triodes, and other composite switch circuits including multiple transistors. When the voltage signal of the data line 10 or the voltage signal of the scan line 20 needs to be measured, the switch control circuit 30 generates a corresponding control signal according to the voltage signal input by the signal input terminal a and outputs the control signal to control the first switch circuit 60 and the second switch circuit 70 to be turned on, the first switch circuit 60 and the second switch circuit 70 may both be high-level conductive switch circuits, in other embodiments, the first switch circuit 60 and the second switch circuit 70 may both be low-level conductive switch circuits, and the present invention is not limited herein.
Meanwhile, the voltage detection circuit 40 generates a corresponding detection signal according to the voltage signal input by the signal input terminal a and outputs the detection signal to control one of the third switch circuit 80 and the fourth switch circuit 90 to be turned on, wherein the first switch circuit 60 and the third switch circuit 80 are connected in series, when the first switch circuit 60 and the third switch circuit 80 are both turned on, the conductive sheet 50 is conducted with the data line 10, the second switch circuit 70 and the fourth switch circuit 90 are connected in series, and when the second switch circuit 70 and the fourth switch circuit 90 are both turned on, the conductive sheet 50 is conducted with the scan line 20. Specifically, referring to fig. 3, step S22 includes:
step S221, when the voltage detection circuit 40 detects the voltage signal input by the signal input terminal a, determining whether the voltage signal input by the signal input terminal a is greater than a reference voltage signal;
in step S222, when the voltage signal input at the signal input terminal a is greater than the reference voltage signal, the voltage detection circuit 40 outputs a high-level detection signal to control the third switch circuit 80 to be turned on and control the fourth switch circuit 90 to be turned off, so that the conductive sheet 50 is conducted with the data line 10.
A switch circuit in which the third switch circuit is turned on at a high level and a switch circuit in which the fourth switch circuit is turned on at a low level will be described as an example. The voltage detection circuit 40 compares the voltage signal input from the signal input terminal a with a reference voltage signal Vref, which may be provided from an external circuit or a regulated power supply. When the voltage signal input by the signal input terminal a is detected to be greater than the reference voltage signal Vref, the voltage detection circuit 40 outputs a high-level detection signal to control the third switch circuit 80 to be turned on, the fourth switch circuit 90 to be turned off, when the third switch circuit 80 is turned on, the conductive sheet 50 and the data line 10 are conducted through the first switch circuit 60 and the third switch circuit 80, and at this time, the voltage signal of the data line 10 can be measured through the conductive sheet 50.
In step S223, when the voltage signal input at the signal input terminal a is smaller than the reference voltage signal, the voltage detection circuit 40 outputs a low-level detection signal to control the fourth switch circuit 90 to be turned on and control the third switch circuit 80 to be turned off, so that the conductive sheet 50 is conducted with the scan line 20.
When the voltage signal input by the signal input terminal a is detected to be smaller than the reference voltage signal Vref, the voltage detection circuit 40 outputs a low-level detection signal to control the third switch circuit 80 to be turned off, the fourth switch circuit 90 to be turned on, when the fourth switch circuit 90 is turned on, the conductive sheet 50 and the scan line 20 are conducted through the second switch circuit 70 and the fourth switch circuit 90, and the voltage signal of the scan line 20 can be measured through the conductive sheet 50. In other embodiments, the third switching circuit 80 may be a low conducting switching circuit, and the fourth switching circuit 90 may be a high conducting switching circuit, which is not limited herein.
According to the technical scheme of the embodiment, the test circuit is adjusted according to the voltage signal input by the signal input end a, so that the data line 10 can be conducted with the conductive sheet 50 through the test circuit, or the scan line 20 is conducted with the conductive sheet 50 through the test circuit, and the voltage signal of the data line 10 or the voltage signal of the scan line 20 can be obtained by measuring the voltage signal of the conductive sheet 50; with the arrangement, the voltage signal of the data line 10 or the voltage signal of the scanning line 20 can be measured without breaking glass, so that the measurement efficiency is high and the measurement cost is low.
The invention provides a test circuit.
Referring to fig. 4, the test circuit is disposed in a display device, the display device includes a data line 10, a scan line 20, and a conductive sheet 50, and the test circuit includes: a signal input end A, a conducting strip 50, a first switch circuit 60, a second switch circuit 70, a switch control circuit 30, a third switch circuit 80, a fourth switch circuit 90 and a voltage detection circuit 40; the input end of the first switch circuit 60 is connected to the data line 10, the output end of the first switch circuit 60 is connected to the input end of the third switch circuit 80, and the output end of the third switch circuit 80 is connected to the conductive sheet 50; the input end of the second switch circuit 70 is connected to the scan line 20, the output end of the second switch circuit 70 is connected to the input end of the fourth switch circuit 90, and the output end of the fourth switch circuit 90 is connected to the conductive sheet 50; the input end of the switch control circuit 30 is connected to the signal input end a, and the output end of the switch control circuit 30 is connected to the controlled end of the first switch circuit 60 and the controlled end of the second switch circuit 70; the input end of the voltage detection circuit 40 is connected to the signal input end a, and the output end of the voltage detection circuit 40 is connected to the controlled end of the third switch circuit 80 and the controlled end of the fourth switch circuit 90.
The first switch circuit 60, the second switch circuit 70, the third switch circuit 80, and the fourth switch circuit 90 have two states of being turned off and turned on, and may be implemented by circuits including various transistors, such as MOS transistors, triodes, and other complex switch circuits including a plurality of transistors.
The switch control circuit 30 is configured to generate a control signal according to the voltage signal input by the signal input terminal a and output the control signal to control the first switch circuit 60 and the second switch circuit 70 to be turned on or off.
The voltage detection circuit 40 may adopt a sampling resistor for voltage division detection, a hall sensor or a special voltage detection chip for voltage detection, and is not limited here. And the detection circuit is used for generating a detection signal according to the voltage signal input by the signal input end a and outputting the detection signal so as to control the third switching circuit 80 to be opened and the fourth switching circuit 90 to be closed, or control the third switching circuit 80 to be closed and the fourth switching circuit to be opened 90.
In this embodiment, the test circuit further includes a Timing Controller, the Timing Controller may be disposed on a Timing Controller (TCON) board of the display device, the Timing Controller (TCON) board is further provided with a power management integrated circuit, a gate driving circuit and a source driving circuit, a voltage signal output by the system motherboard is processed by the Timing Controller, and is connected to the display area through the gate driving circuit and the source driving circuit, and the voltage signal is transmitted through a data line and a scan line on the Array substrate.
In order to measure the attenuated voltage signal transmitted through the data line 10 and the attenuated voltage signal transmitted through the scan line 20, that is, the voltage signal of the end position of the data line and the voltage signal of the end position of the scan line. According to the technical scheme, the switch control circuit 30 is arranged to control the first switch circuit 60 and the second switch circuit 70 to be opened or closed, the voltage detection circuit 40 is arranged to control the third switch circuit 80 and the fourth switch circuit 90 to be opened or closed, the first switch circuit 60 and the third switch circuit 80 are connected in series, when the first switch circuit 60 and the third switch circuit 80 are opened simultaneously, the conducting strips 50 are conducted with the data lines 10, and at the moment, the voltage signals of the data lines 10 can be measured through the conducting strips 50 arranged on the fan-out area of the display panel. The second switch circuit 70 and the fourth switch circuit 90 are connected in series, when the second switch circuit 70 and the fourth switch circuit 90 are simultaneously turned on, the conductive sheet 50 is conducted with the scan line 20, and at this time, the voltage signal of the scan line 20 can be measured through the conductive sheet 50.
Specifically, in the initial state, the first switch circuit 60 and the second switch circuit 70 are in the off state, and at this time, the data line 10 is disconnected from the conductive sheet 50, and the scan line 20 is also disconnected from the conductive sheet 50.
If the voltage signal of the data line 10 needs to be measured, a voltage signal from low to high may be provided by the timing controller or the external circuit and input to the switch control circuit 30 and the voltage detection circuit 40, and the voltage signal may be kept at a high level by the program setting of the timing controller or the setting of the external circuit, for example, if the reference voltage signal Vref is 1.5V, the voltage signal may be pulled high and then kept at 3.3V. When receiving the rising edge of the voltage signal, the switch control circuit 30 outputs a high-level control signal to the first switch circuit 60 and the second switch circuit 70 to control the first switch circuit 60 and the second switch circuit 70 to be turned on. In other embodiments, the first switch circuit 60 and the second switch circuit 70 may be configured to be turned on when receiving a low-level control signal, which is not limited herein. The voltage detection circuit 40 generates a high-level detection signal to the third switch circuit 80 and the fourth switch circuit 90 according to the high-level voltage signal, because the third switch circuit 80 is a high-level conducting switch circuit and the fourth switch circuit 90 is a low-level conducting switch circuit, at this time, the third switch circuit 80 is turned on, and because the first switch circuit 60 and the third switch circuit 80 are both in an open state at this time, the conductive sheet 50 is conducted with the data line 10, and the voltage signal of the data line 10 can be measured through the conductive sheet 50.
If the voltage signal of the scan line 20 needs to be measured, a timing controller or an external circuit may provide a voltage signal from low to high, and the voltage signal is input to the switch control circuit 30 and the voltage detection circuit 40, and then the input voltage signal is pulled down, for example, if the reference voltage signal Vref is 1.5V, the input voltage signal may be pulled down to 0V. When receiving the rising edge of the voltage signal, the switch control circuit 30 outputs a high-level control signal to the first switch circuit 60 and the second switch circuit 70 to control the first switch circuit 60 and the second switch circuit 70 to be turned on, and the voltage detection circuit 40 outputs a low-level detection signal to the third switch circuit 80 and the fourth switch circuit 90, because the third switch circuit 80 is a high-level on switch circuit and the fourth switch circuit 90 is a low-level on switch circuit, at this time, the fourth switch circuit 90 is turned on, and because the second switch circuit 70 and the fourth switch circuit 90 are both in an on state, the conductive sheet 50 is on with the scan line 20, and the voltage signal of the scan line 20 can be measured through the conductive sheet 50.
When the measurement is finished, the timing controller or the external circuit may provide the voltage signal from low to high to the switch control circuit 30 again, at this time, the switch control circuit 30 outputs the control signal of low level to the first switch circuit 60 and the second switch circuit 70 to control the first switch circuit 60 and the second switch circuit 70 to be turned off, so that the conductive sheet 50, the data line 10 and the scan line 20 are all in the off state, and the system recovers the initial state. By such arrangement, the voltage signals transmitted by the data lines 10 and the scanning lines 20 can be measured without breaking glass, and the method is simple and low in cost.
According to the technical scheme, the conductive sheets 50 are arranged in the fan-out area of the display panel, and are controlled to be conducted with the data line 10 or the scanning line 20 so as to measure the attenuated voltage signals transmitted by the data line 10 or the attenuated voltage signals transmitted by the scanning line 20; with the arrangement, the voltage signal of the data line 10 or the voltage signal of the scanning line 20 can be measured without breaking glass, so that the measurement efficiency is high and the measurement cost is low.
In an embodiment, referring to fig. 4 and 5, the switch control circuit 30 includes a flip-flop U1 and an inverter U2, a clock signal input terminal C of the flip-flop U1 is an input terminal of the switch control circuit 30, a data input terminal D of the flip-flop U1 is connected to an output terminal of the inverter U2, a data output terminal Q of the flip-flop U1 is connected to an input terminal of the inverter U2, and an output terminal of the inverter U2 is an output terminal of the switch control circuit 30.
In this embodiment, the flip-flop U1 may be selected as the D flip-flop U1, and the D flip-flop U1 has a characteristic that when the clock signal input terminal C receives a rising edge of a signal, the logic level of the data input terminal D is assigned to the data output terminal Q. In the initial state, the data input terminal D of the D flip-flop U1 is low, and when it is required to measure the voltage signal of the data line 10 or the voltage signal of the scan line 20, a corresponding voltage signal from low to high may be provided by the timing controller or an external circuit. When the clock signal input terminal C of the D flip-flop U1 receives the rising edge of the voltage signal input from the signal input terminal a, the data output terminal Q of the D flip-flop U1 outputs a low-level electrical signal to the inverter U2, and the inverter U2 correspondingly outputs a high-level control signal to the controlled terminals of the first switch circuit 60 and the second switch circuit 70, so as to control the first switch circuit 60 and the second switch circuit 70 to be turned on and enter the measurement state. When the measurement is not needed, a corresponding voltage signal from low to high can be provided to the clock signal input terminal C of the D flip-flop U1 again through the timing controller or the external circuit, since the output terminal of the inverter U2 is at high level at this time, and correspondingly, the data input terminal D of the D flip-flop U1 is at high level, the data output terminal Q of the D flip-flop U1 outputs an electrical signal at high level to the inverter U2, and the inverter U2 correspondingly outputs a control signal at low level to the first switch circuit 60 and the second switch circuit 70, so as to control the first switch circuit 60 and the second switch circuit 70 to be turned off, so that the conductive sheet 50 is disconnected from the data line 10 and the scan line 20, and the system returns to the initial state. The switch control circuit 30 further includes a first resistor R1, and the high-level control signal output by the inverter can be prevented from being pulled low by setting the first resistor R1.
In an embodiment, referring to fig. 4 and 5, the voltage detection circuit 40 includes a first comparator U3, a non-inverting input terminal of the first comparator U3 is an input terminal of the voltage detection circuit 40, an inverting input terminal of the first comparator U3 is inputted with a reference voltage signal, and an output terminal of the first comparator U3 is an output terminal of the voltage detection circuit 40.
The first comparator U3 has a characteristic that the first comparator U3 outputs a high level if the voltage at the positive phase input terminal is greater than the voltage at the negative phase input terminal, and the first comparator U3 outputs a low level if the voltage at the positive phase input terminal is less than or equal to the voltage at the negative phase input terminal. The non-inverting input terminal of the first comparator U3 receives the voltage signal input from the signal input terminal a, which is provided by a timing controller or an external circuit; the negative phase input terminal receives a reference voltage signal Vref output by an external circuit or a regulated power supply, and the reference voltage signal Vref can be set according to needs, and is not limited here.
If the voltage signal of the data line 10 needs to be measured, a timing controller or an external circuit may output a voltage signal from a low level to a high level to the non-inverting input terminal of the first comparator U3, and keep the input voltage signal at a high level, so that the voltage signal at the non-inverting input terminal of the first comparator U3 is greater than the reference voltage signal Vref at the inverting input terminal, at this time, the first comparator U3 outputs a high-level detection signal to the controlled terminals of the third switch circuit 80 and the fourth switch circuit 90, because the third switch circuit 80 is a high-level conducting switch circuit, the fourth switch circuit 90 is a low-level conducting switch circuit, and at this time, the third switch circuit 80 is turned on.
If the voltage signal of the scan line 20 needs to be measured, a timing controller or an external circuit may provide a voltage signal that is changed from low to high and input the voltage signal to the non-inverting input terminal of the first comparator U3, and pull down the input voltage signal, so that the voltage signal at the non-inverting input terminal of the first comparator U3 is smaller than the reference voltage signal Vref at the inverting input terminal, and at this time, the first comparator U3 outputs a low-level detection signal to control the third switch circuit 80 to be turned off and the fourth switch circuit 90 to be turned on.
In an embodiment, referring to fig. 4 and 5, the first switch circuit 60, the second switch circuit 70, the third switch circuit 80, and the fourth switch circuit 90 have two states of being turned off and turned on, and may be implemented by circuits composed of various transistors, such as MOS transistors, triodes, and other complex switch circuits composed of multiple transistors.
In this embodiment, the first switch circuit 60, the second switch circuit 70, and the third switch circuit 80 all include a single NMOS transistor (N-type insulating fet), the gates of the NMOS transistors are the controlled ends of the first switch circuit 60, the second switch circuit 70, and the third switch circuit 80, the drains of the NMOS transistors are the input ends of the first switch circuit 60, the second switch circuit 70, and the third switch circuit 80, the sources of the NMOS transistors are the output ends of the first switch circuit 60, the second switch circuit 70, and the third switch circuit 80, the fourth switch circuit 90 includes a PMOS transistor (P-type insulating PMOS fet), the gate of the PMOS transistor is the controlled end of the fourth switch circuit 90, and the source and the drain of the PMOS transistor are the input end and the output end of the fourth switch circuit 90, respectively. In other embodiments, the third switch circuit may be a PMOS transistor, and the fourth switch circuit may be an NMOS transistor, which is not limited in this case.
When the voltage signal of the data line 10 needs to be measured, the switch control circuit 30 outputs a high-level control signal to the controlled terminals of the first switch circuit 60 and the second switch circuit 70 to control the first switch circuit 60 and the second switch circuit 70, and simultaneously, the voltage detection circuit 40 outputs a high-level detection signal to the controlled terminals of the third switch circuit 90 and the fourth switch circuit 90, so that the third switch circuit 80 is turned on, the fourth switch circuit 90 is turned off, and when the first switch circuit 60 and the third switch circuit 80 are both in an on state, the conductive sheet 50 is conducted with the data line 10, and the voltage signal of the data line 10 can be measured through the conductive sheet 50.
When the voltage signal of the scan line 20 needs to be measured, the switch control circuit 30 outputs a high-level control signal to the controlled terminal of the first switch circuit 60 and the controlled terminal of the second switch circuit 70 to control the first switch circuit 60 and the second switch circuit 70 to be turned on, and simultaneously, the voltage detection circuit 40 outputs a low-level detection signal to the controlled terminal of the third switch circuit 80 and the controlled terminal of the fourth switch circuit 90 to turn off the third switch circuit 80 and turn on the fourth switch circuit 90, and when the second switch circuit 70 and the fourth switch circuit 90 are both in an on state, the conductive sheet 50 is conducted with the scan line 20, so that the voltage signal of the scan line 20 can be measured through the conductive sheet 50.
When the measurement is finished, the switch control circuit 30 outputs a low-level control signal to the controlled terminal of the first switch circuit 60 and the controlled terminal of the second switch circuit 70 to control the first switch circuit 60 and the second switch circuit 70 to be turned off, so that the conductive sheet 50, the data line 10 and the scan line 20 are all in an off state, and the system returns to the initial state.
The application also provides a display device, the display device includes display panel and as above any the test circuit, display panel includes display area and fan-out region, test circuit's conducting strip 50 sets up on the fan-out region. The detailed structure of the test circuit can refer to the above embodiments, and is not described herein; it can be understood that, because the display device of the present application uses the test circuit, the embodiment of the display device of the present application includes all technical solutions of all embodiments of the test circuit, and the achieved technical effects are also completely the same, and are not described herein again.
In this embodiment, the display device may be a display device having a display panel, such as a television, a tablet computer, or a mobile phone. The display panel may be any one of: a liquid crystal display panel, an OLED display panel, a QLED display panel, a Twisted Nematic (TN) or Super Twisted Nematic (STN) type, an In-Plane Switching (IPS) type, a Vertical Alignment (VA) type, a curved panel, or other display panels.
The above description is only an alternative embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (9)
1. A test method of a display panel is applied to a display device, the display device comprises a data line, a scanning line and a conducting strip, the data line is connected with the conducting strip through a test circuit, the scanning line is connected with the conducting strip through the test circuit, and the test circuit is characterized by comprising the following steps:
a signal input terminal;
the input end of the first switch circuit is connected with the data line;
the input end of the second switch circuit is connected with the scanning line;
the input end of the switch control circuit is connected with the signal input end, and the output end of the switch control circuit is connected with the controlled end of the first switch circuit and the controlled end of the second switch circuit;
the input end of the third switching circuit is connected with the output end of the first switching circuit, and the output end of the third switching circuit is connected with the conducting strip;
the input end of the fourth switch circuit is connected with the output end of the second switch circuit, and the output end of the fourth switch circuit is connected with the conducting strip;
the input end of the voltage detection circuit is connected with the signal input end, and the output end of the voltage detection circuit is connected with the controlled end of the third switch circuit and the controlled end of the fourth switch circuit;
the test method of the display panel comprises the following steps:
step S1, receiving the voltage signal input by the signal input end;
step S2, adjusting the test circuit according to the voltage signal input by the signal input terminal to make the conductive sheet and the data line conductive, or to make the conductive sheet and the scan line conductive.
2. The method for testing a display panel according to claim 1, wherein the step S2 includes:
step S21, the switch control circuit generates and outputs a control signal according to the voltage signal input by the signal input terminal to control the first switch circuit and the second switch circuit to be turned on;
step S22, the voltage detection circuit generates a detection signal according to the voltage signal input by the signal input terminal and outputs the detection signal to control the third switch circuit or the fourth switch circuit to open, so as to enable the conductive sheet to be conducted with the data line, or to enable the conductive sheet to be conducted with the scan line.
3. The method for testing a display panel according to claim 2, wherein the step S22 includes:
step S221, when the voltage detection circuit detects the voltage signal input by the signal input terminal, determining whether the voltage signal input by the signal input terminal is greater than a reference voltage signal;
in step S222, when the voltage signal input by the signal input terminal is greater than the reference voltage signal, the voltage detection circuit outputs a high-level detection signal to control the third switch circuit to be turned on and control the fourth switch circuit to be turned off, so that the conductive sheet is conducted with the data line.
4. The method for testing a display panel according to claim 3, further comprising, after the step S221:
in step S223, when the voltage signal input by the signal input terminal is smaller than the reference voltage signal, the voltage detection circuit outputs a low-level detection signal to control the fourth switch circuit to be turned on and control the third switch circuit to be turned off, so that the conductive sheet is conducted with the scan line.
5. The utility model provides a test circuit, test circuit sets up in display device, display device includes data line, scanning line and conducting strip, its characterized in that, test circuit includes:
a signal input terminal;
the input end of the first switch circuit is connected with the data line;
the input end of the second switch circuit is connected with the scanning line;
the input end of the switch control circuit is connected with the signal input end, the output end of the switch control circuit is connected with the controlled end of the first switch circuit and the controlled end of the second switch circuit, and the switch control circuit is configured to generate and output a control signal according to a voltage signal input by the signal input end so as to control the first switch circuit and the second switch circuit to be opened;
the input end of the third switching circuit is connected with the output end of the first switching circuit, and the output end of the third switching circuit is connected with the conducting strip;
the input end of the fourth switch circuit is connected with the output end of the second switch circuit, and the output end of the fourth switch circuit is connected with the conducting strip;
the input end of the voltage detection circuit is connected with the signal input end, the output end of the voltage detection circuit is connected with the controlled end of the third switch circuit and the controlled end of the fourth switch circuit, and the voltage detection circuit is configured to generate and output a detection signal according to a voltage signal input by the signal input end so as to control the third switch circuit to be opened, so that the conducting strip is conducted with the data line;
the voltage detection circuit is further configured to generate a detection signal according to the voltage signal input by the signal input end and output the detection signal to control the fourth switch circuit to be opened so that the conductive sheet is conducted with the scanning line.
6. The test circuit of claim 5, wherein the switch control circuit comprises a flip-flop and an inverter, wherein a clock signal input of the flip-flop is an input of the switch control circuit, a data input of the flip-flop is connected to an output of the inverter, a data output of the flip-flop is connected to an input of the inverter, and an output of the inverter is an output of the switch control circuit.
7. The test circuit of claim 6, wherein the switch control circuit further comprises a first resistor, a first terminal of the first resistor being connected to the output terminal of the inverter, a second terminal of the first resistor being connected to ground.
8. The test circuit of claim 5, wherein the voltage detection circuit comprises a first comparator, a non-inverting input of the first comparator is an input of the voltage detection circuit, an inverting input of the first comparator is an input of the voltage detection circuit, and an output of the first comparator is an output of the voltage detection circuit.
9. A display device comprising a display panel and a test circuit according to any one of claims 5 to 8.
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| CN201811598879.9A CN109584762B (en) | 2018-12-25 | 2018-12-25 | Display panel test method, test circuit and display device |
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| CN110288931B (en) * | 2019-06-12 | 2021-10-01 | 北海惠科光电技术有限公司 | Grid line defect detection method, display panel and readable storage medium |
| CN113447697B (en) * | 2021-04-19 | 2022-11-08 | 深圳市爱协生科技有限公司 | Signal detection circuit, signal detection method, touch panel and display device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101315472A (en) * | 2008-06-24 | 2008-12-03 | 友达光电股份有限公司 | Detection circuit and method of liquid crystal display panel, and liquid crystal display panel |
| CN101958093A (en) * | 2009-07-17 | 2011-01-26 | 友达光电(厦门)有限公司 | Testing device and testing method for display panel |
| CN103544912A (en) * | 2013-10-25 | 2014-01-29 | 深圳市华星光电技术有限公司 | Panel detection device and display panel |
| CN104280908A (en) * | 2014-10-21 | 2015-01-14 | 深圳市华星光电技术有限公司 | Detection circuit, liquid crystal display panel and manufacturing method of liquid crystal display panel |
| CN106707641A (en) * | 2016-12-22 | 2017-05-24 | 深圳市华星光电技术有限公司 | Liquid crystal display panel with test circuit structure and liquid crystal display device |
| WO2018150875A1 (en) * | 2017-02-17 | 2018-08-23 | パナソニック液晶ディスプレイ株式会社 | Display device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101305379B1 (en) * | 2009-07-21 | 2013-09-06 | 엘지디스플레이 주식회사 | Chip on glass type liquid crystal display device and inspecting method for the same |
-
2018
- 2018-12-25 CN CN201811598879.9A patent/CN109584762B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101315472A (en) * | 2008-06-24 | 2008-12-03 | 友达光电股份有限公司 | Detection circuit and method of liquid crystal display panel, and liquid crystal display panel |
| CN101958093A (en) * | 2009-07-17 | 2011-01-26 | 友达光电(厦门)有限公司 | Testing device and testing method for display panel |
| CN103544912A (en) * | 2013-10-25 | 2014-01-29 | 深圳市华星光电技术有限公司 | Panel detection device and display panel |
| CN104280908A (en) * | 2014-10-21 | 2015-01-14 | 深圳市华星光电技术有限公司 | Detection circuit, liquid crystal display panel and manufacturing method of liquid crystal display panel |
| CN106707641A (en) * | 2016-12-22 | 2017-05-24 | 深圳市华星光电技术有限公司 | Liquid crystal display panel with test circuit structure and liquid crystal display device |
| WO2018150875A1 (en) * | 2017-02-17 | 2018-08-23 | パナソニック液晶ディスプレイ株式会社 | Display device |
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