CN109584762A - Test method, test circuit and the display device of display panel - Google Patents
Test method, test circuit and the display device of display panel Download PDFInfo
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- CN109584762A CN109584762A CN201811598879.9A CN201811598879A CN109584762A CN 109584762 A CN109584762 A CN 109584762A CN 201811598879 A CN201811598879 A CN 201811598879A CN 109584762 A CN109584762 A CN 109584762A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
Include: step S1 this application discloses a kind of test method of display panel, test circuit and display device, the test method of the display panel, receives the voltage signal of signal input part input；Step S2, according to the voltage signal adjustment test circuit of signal input part input, so that conductive sheet is connected with data line, or so that conductive sheet is connected with scan line.The technical solution of the application can be improved the voltage signal of measurement data line and measure the efficiency of the voltage signal of scan line, reduces measurement cost.
Description
Technical field
The present invention relates to field of display technology, in particular to a kind of test method of display panel, test circuit and display
Device.
Background technique
In display device, voltage signal is transmitted by data line in array substrate and scan line, so that
Display device realizes display function.However, voltage signal passes through since the cabling of array substrate is there are certain capacitor and resistance
After data line and scan line transmission, it may occur that distorted signals.It is therefore desirable to measure through the data line and scan line in array substrate
The voltage signal decayed after transmission.Because the end of data line and scan line is located at the edge of glass substrate, only in glass
Voltage signal after the decaying that ability measurement data line and scan line are transmitted after glass sliver, the time which needs
It is long, low efficiency, and glass sliver can make product be destroyed, and testing cost is caused to increase.
Summary of the invention
The application provides test method, test circuit and the display device of a kind of display panel, it is intended to solve in measurement number
It when according to line or the voltage signal of scan line, is only just capable of measuring after glass sliver, leads to the low efficiency of measurement, measurement cost
High problem.
To solve the above problems, the application provides a kind of test method of display panel, the test side of the display panel
Method is applied to display device, and the display device includes data line, scan line and conductive sheet, the data line and the conductive sheet
Between by test circuit connection, pass through the test circuit connection, the display between the scan line and the conductive sheet
The test method of panel includes:
Step S1 receives the voltage signal of signal input part input；
Step S2 adjusts the test circuit according to the voltage signal of signal input part input, so that the conduction
Piece is connected with the data line, alternatively, so that the conductive sheet is connected with the scan line.
Optionally, the test circuit includes:
Signal input part；
The input terminal of first switch circuit, the first switch circuit is connect with the data line；
The input terminal of second switch circuit, the second switch circuit is connect with the scan line；
ON-OFF control circuit, the input terminal of the ON-OFF control circuit are connect with the signal input part, the switch control
The output end of circuit processed is connect with the controlled end of the controlled end of the first switch circuit and the second switch circuit；
Third switching circuit, the input terminal of the third switching circuit are connect with the output end of the first switch circuit,
The output end of the third switching circuit is connect with the conductive sheet；
The input terminal of 4th switching circuit, the 4th switching circuit is connect with the output end of the second switch circuit,
The output end of 4th switching circuit is connect with the conductive sheet；
Voltage detecting circuit, the input terminal of the voltage detecting circuit are connect with the signal input part, the voltage inspection
The output end of slowdown monitoring circuit is connect with the controlled end of the controlled end of the third switching circuit and the 4th switching circuit.
Optionally, the step S2 includes:
Step S21, the voltage signal that the ON-OFF control circuit is inputted according to the signal input part generate control signal
And export, it is opened with controlling the first switch circuit and the second switch circuit；
Step S22, the voltage detecting circuit generate detection signal according to the voltage signal that the signal input part inputs
And export, it is opened with controlling the third switching circuit or the 4th switching circuit, so that the conductive sheet and the number
It is connected according to line, alternatively, so that the conductive sheet is connected with the scan line.
Optionally, the step S22 includes:
Step S221, the voltage detecting circuit is when detecting the voltage signal of the signal input part input, judgement
Whether the voltage signal of the signal input part input is greater than reference voltage signal；
Step S222, when the voltage signal of signal input part input is greater than the reference voltage signal, the electricity
The detection signal of detection circuit output high level is pressed, is opened with controlling the third switching circuit, and controls the 4th switch
Circuit is closed, so that the conductive sheet is connected with the data line.
Optionally, after the step S221, further includes:
Step S223, when the voltage signal of signal input part input is less than the reference voltage signal, the electricity
It presses detection circuit to export low level detection signal, is opened with controlling the 4th switching circuit, and control the third switch
Circuit is closed, so that the conductive sheet is connected with the scan line.
To solve the above problems, the application also provides a kind of test circuit, the test circuit is set in display device,
The display device includes data line, scan line and conductive sheet, and the test circuit includes:
Signal input part；
The input terminal of first switch circuit, the first switch circuit is connect with the data line；
The input terminal of second switch circuit, the second switch circuit is connect with the scan line；
ON-OFF control circuit, the input terminal of the ON-OFF control circuit are connect with the signal input part, the switch control
The output end of circuit processed is connect with the controlled end of the controlled end of the first switch circuit and the second switch circuit, described to open
Control circuit is closed, the voltage signal inputted according to the signal input part is configured as and generates control signal and export, with control
The first switch circuit and the second switch circuit are opened；
Third switching circuit, the input terminal of the third switching circuit are connect with the output end of the first switch circuit,
The output end of the third switching circuit is connect with the conductive sheet；
The input terminal of 4th switching circuit, the 4th switching circuit is connect with the output end of the second switch circuit,
The output end of 4th switching circuit is connect with the conductive sheet；
Voltage detecting circuit, the input terminal of the voltage detecting circuit are connect with the signal input part, the voltage inspection
The output end of slowdown monitoring circuit is connect with the controlled end of the controlled end of the third switching circuit and the 4th switching circuit, the electricity
Detection circuit is pressed, the voltage signal inputted according to the signal input part is configured as and generates detection signal and export, with control
The third switching circuit is opened, so that the conductive sheet is connected with the data line；
The voltage detecting circuit is additionally configured to generate detection letter according to the voltage signal that the signal input part inputs
Number and export, opened with controlling the 4th switching circuit, so that the conductive sheet is connected with the scan line.
Optionally, the ON-OFF control circuit includes trigger and phase inverter, the clock signal input terminal of the trigger
For the input terminal of the ON-OFF control circuit, the data input pin of the trigger is connect with the output end of the phase inverter, institute
The data output end for stating trigger is connect with the input terminal of the phase inverter, and the output end of the phase inverter is the switch control
The output end of circuit.
Optionally, the ON-OFF control circuit further includes first resistor, the first end of the first resistor and the reverse phase
The output end of device connects, the second end ground connection of the first resistor.
Optionally, the voltage detecting circuit includes first comparator, and the non-inverting input terminal of the first comparator is institute
State the input terminal of voltage detecting circuit, the inverting input terminal input reference voltage signal of the first comparator, first ratio
Compared with the output end that the output end of device is the voltage detecting circuit.
To achieve the above object, the application also provides a kind of display device, and the display device includes display panel and such as
Upper described in any item test circuits.
The technical solution of the application, according to the voltage signal adjustment test circuit of signal input part input, so that data
Circuit is connected to line with conductive sheet after tested, or makes scan line circuit is connected to conductive sheet after tested, passes through measurement conductive sheet
Voltage signal, can be obtained the voltage signal of data line or the voltage signal of scan line, so set, not needing to make glass
Sliver can measure the voltage signal of data line or scan line, and measurement efficiency is high and measurement cost is low.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
The structure shown according to these attached drawings obtains other attached drawings.
Fig. 1 is that the invention shows the flow diagrams of one embodiment of test method of panel；
The refinement flow diagram that Fig. 2 is step S2 in Fig. 1；
The refinement flow diagram that Fig. 3 is step S22 in Fig. 2；
Fig. 4 is the structural block diagram of present invention test one embodiment of circuit；
Fig. 5 is the electrical block diagram of present invention test one embodiment of circuit.
Drawing reference numeral explanation:
The embodiments will be further described with reference to the accompanying drawings for the realization, the function and the advantages of the object of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiment is only a part of the embodiments of the present invention, instead of all the embodiments.Base
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts it is all its
His embodiment, shall fall within the protection scope of the present invention.
It is to be appreciated that if relating to directionality instruction (such as up, down, left, right, before and after ...) in the embodiment of the present invention,
Then directionality instruction be only used for explain under a certain particular pose (as shown in the picture) between each component relative positional relationship,
Motion conditions etc., if the particular pose changes, directionality instruction is also correspondingly changed correspondingly.
In addition, being somebody's turn to do " first ", " second " etc. if relating to the description of " first ", " second " etc. in the embodiment of the present invention
Description be used for description purposes only, be not understood to indicate or imply its relative importance or implicitly indicate indicated skill
The quantity of art feature." first " is defined as a result, the feature of " second " can explicitly or implicitly include at least one spy
Sign.It in addition, the technical solution between each embodiment can be combined with each other, but must be with those of ordinary skill in the art's energy
It is enough realize based on, will be understood that the knot of this technical solution when conflicting or cannot achieve when occurs in the combination of technical solution
Conjunction is not present, also not the present invention claims protection scope within.
The present invention provides a kind of test method of display panel.
Referring to Fig.1, the test method of the display panel is applied in display device, and the display device includes data line
10, scan line 20 and conductive sheet 50 pass through test circuit connection, the scanning between the data line 10 and the conductive sheet 50
By the test circuit connection between line 20 and the conductive sheet 50, the test circuit includes signal input part A, first opens
Powered-down road 60, second switch circuit 70, third switching circuit 80, the 4th switching circuit 90, ON-OFF control circuit 30 and voltage inspection
Slowdown monitoring circuit 40, wherein the input terminal of the first switch circuit 60 is connect with the data line 10, first switch circuit 60 it is defeated
Outlet is connect with the input terminal of the third switching circuit 80, the output end of the third switching circuit 80 and the conductive sheet 50
Connection；The input terminal of the second switch circuit 70 is connect with the scan line 20, the output end of the second switch circuit 70
It is connect with the input terminal of the 4th switching circuit 90, the output end and the conductive sheet 50 of the 4th switching circuit 90 connect
It connects；The input terminal of the ON-OFF control circuit 30 is connect with the signal input part A, the output end of the ON-OFF control circuit 30
It is connect with the controlled end of the controlled end of the first switch circuit 60 and the second switch circuit 70；The voltage detecting circuit
40 input terminal is connect with the signal input part A, the output end of the voltage detecting circuit 40 and the third switching circuit
The connection of the controlled end of 80 controlled end and the 4th switching circuit 90.
In the present embodiment, which further includes sequence controller, which can be set in display device
Timing control (Timing Controller, TCON) plate on, on timing control (Timing Controller, TCON) plate also
Be provided with power management integrated circuit, gate driving circuit and source electrode drive circuit, the voltage signal of system board output through when
After sequence controller processing, it is connect by gate driving circuit and source electrode drive circuit with display area, passes through Array (array base
Plate) on data line and scan line voltage signal is transmitted.The display device can be television set, tablet computer, mobile phone
Deng the display device with display panel.
The test method of the display panel includes:
Step S1 receives the voltage signal of signal input part A input；
Step S2 adjusts the test circuit according to the voltage signal of signal input part A input, so that the conduction
Piece 50 and the data line 10 are connected, alternatively, so that the conductive sheet 50 and the scan line 20 are connected.
Specifically, in the initial state, first switch circuit 60 and second switch circuit 70 are in off state, at this point,
Data line 10 and conductive sheet 50 disconnect, and scan line 20 is also disconnected with conductive sheet 50.
When the voltage signal for the voltage signal or scan line 20 for needing measurement data line 10, timing control can be passed through
Device or external circuit provide by low turn of high voltage signal and are input to ON-OFF control circuit 30 and voltage detecting circuit 40, and
By the setting of the program setting or external circuit of sequence controller, the voltage signal is made to keep high level, or by the electricity
Pressure signal drags down, to control the electronic component on test circuit, by changing the state of electronic component on test circuit,
Conductive sheet 50 can be made to connect with data line 10, or conductive sheet 50 is connect with scan line 10.Wherein, these can rise
Electronic component to the connection type of switching conductive sheet 50 may include switching tube, resistance, trigger, phase inverter, comparator etc..
By controlling the working condition of the electronic component on the test circuit, conductive sheet 50 and data line 10 can be made to be connected, or lead
Electric piece 50 is connected with scan line 20, so as to pass through the voltage signal of 50 measurement data line 10 of conductive sheet, or passes through conduction
The voltage signal of the test scan line 20 of piece 50.Specifically, referring to Fig. 2, step S2 includes:
Step S21, the voltage signal that the ON-OFF control circuit 30 is inputted according to the signal input part A generate control
Signal simultaneously exports, and is opened with controlling the first switch circuit 60 and the second switch circuit 70；
Step S22, the voltage detecting circuit 40 generate detection letter according to the voltage signal that the signal input part A is inputted
Number and export, opened with controlling the third switching circuit 80 or the 4th switching circuit 90, so that the conductive sheet 50
It is connected with the data line 10, alternatively, so that the conductive sheet 50 and the scan line 20 are connected；
In the present embodiment, the first switch circuit 60, second switch circuit 70, third switching circuit 80 and the 4th switch
Circuit 90 all has closing and opens two states, can be realized using the circuit of various transistors composition, such as metal-oxide-semiconductor, three
Pole pipe and other composite switch circuits being made of multiple transistors.When the voltage signal for needing measurement data line 10 or
When the voltage signal of person's scan line 20, the voltage signal that ON-OFF control circuit 30 is inputted according to signal input part A is generated corresponding
Control signal simultaneously exports, and is opened with controlling first switch circuit 60 and second switch circuit 70, the first switch circuit 60 and the
Two switching circuits 70 can be the switching circuit of high level conducting, in other embodiments, first switch electricity also can be set
Road 60 and second switch circuit 70 are the switching circuit of low level conducting, unlimited herein.
Meanwhile the voltage signal that voltage detecting circuit 40 is inputted according to signal input part A, generate corresponding detection signal simultaneously
Output is opened, wherein first switch with controlling third switching circuit 80 or the one of switching circuit of the 4th switching circuit 90
Circuit 60 and third switching circuit 80 are to be connected in series, when first switch circuit 60 and third switching circuit 80 are opened, institute
It states conductive sheet 50 and the data line 10 is connected, second switch circuit 70 and the 4th switching circuit 90 are to be connected in series, second
When switching circuit 70 and the 4th switching circuit 90 are opened, the conductive sheet 50 is connected with the scan line 20.Specifically, reference
Fig. 3, step S22 include:
Step S221, the voltage detecting circuit 40 are sentenced when detecting the voltage signal of the signal input part A input
Whether the voltage signal that the signal input part A is inputted that breaks is greater than reference voltage signal；
Step S222, when the voltage signal of signal input part A input is greater than the reference voltage signal, the electricity
It presses detection circuit 40 to export the detection signal of high level, is opened with controlling the third switching circuit 80, and control the described 4th
Switching circuit 90 is closed, so that the conductive sheet 50 and the data line 10 are connected.
Switching circuit, the 4th switching circuit be connected by high level of third switching circuit is the switch electricity of low level conducting
Illustrate for road.Voltage detecting circuit 40 is when detecting the voltage signal of signal input part A input, by the voltage signal and ginseng
It examines voltage signal Vref to be compared, reference voltage signal Vref can be provided by external circuit or regulated power supply etc..When
When detecting that the voltage signal of signal input part A input is greater than reference voltage signal Vref, voltage detecting circuit 40 exports high electricity
Flat detection signal, to control the opening of third switching circuit 80, the 4th switching circuit 90 is closed, and is opened in third switching circuit 80
When, it is connected between conductive sheet 50 and data line 10 by first switch circuit 60 and third switching circuit 80, at this point, can be by leading
The voltage signal of electric 50 measurement data line 10 of piece.
Step S223, when the voltage signal of signal input part A input is less than the reference voltage signal, the electricity
Pressure detection circuit 40 exports low level detection signal, is opened with controlling the 4th switching circuit 90, and control the third
Switching circuit 80 is closed, so that the conductive sheet 50 and the scan line 20 are connected.
When the voltage signal for detecting signal input part A input is less than reference voltage signal Vref, voltage detecting circuit
The 40 low level detection signals of output, to control the closing of third switching circuit 80, the 4th switching circuit 90 is opened, in the 4th switch
When circuit 90 is opened, be connected between conductive sheet 50 and scan line 20 by second switch circuit 70 and the 4th switching circuit 90, it can
The voltage signal of scan line 20 is measured by conductive sheet 50.In other embodiments, third switching circuit 80 also can be set is
The switching circuit of low conducting, the 4th switching circuit 90 is the switching circuit of high conducting, unlimited herein.
The technical solution of the present embodiment, according to the voltage signal adjustment test circuit of signal input part A input, so that data
Line 10 circuit and conductive sheet 50 can be connected after tested, alternatively, making scan line 20, circuit and conductive sheet 50 are connected after tested, lead to
The voltage signal for crossing measurement conductive sheet 50, can be obtained the voltage signal of data line 10 or the voltage signal of scan line 20；Such as
This setting, do not need to make glass sliver can the voltage signal of the voltage signal to data line 10 or scan line 20 survey
Amount, measurement efficiency is high and measurement cost is low.
The present invention proposes a kind of test circuit.
Referring to Fig. 4, which is set in display device, and the display device includes data line 10, scan line 20
And conductive sheet 50, the test circuit include: signal input part A, conductive sheet 50, first switch circuit 60, second switch circuit 70,
ON-OFF control circuit 30, third switching circuit 80, the 4th switching circuit 90 and voltage detecting circuit 40；The first switch circuit
60 input terminal is connect with the data line 10, the output end of the first switch circuit 60 and the third switching circuit 80
Input terminal connection, the output end of the third switching circuit 80 are connect with the conductive sheet 50；The second switch circuit 70
Input terminal is connect with the scan line 20, the input of the output end of the second switch circuit 70 and the 4th switching circuit 90
End connection, the output end of the 4th switching circuit 90 are connect with the conductive sheet 50；The input of the ON-OFF control circuit 30
End is connect with the signal input part A, and the output end of the ON-OFF control circuit 30 is controlled with the first switch circuit 60
The connection of the controlled end of end and the second switch circuit 70；The input terminal and the signal input part of the voltage detecting circuit 40
The controlled end of A connection, the output end of the voltage detecting circuit 40 and the third switching circuit 80 and the 4th switch electricity
The controlled end on road 90 connects.
The first switch circuit 60, second switch circuit 70, third switching circuit 80 and the 4th switching circuit 90
All have closing and open two states, can using various transistors composition circuit realize, such as metal-oxide-semiconductor, triode, with
And other composite switch circuits for being made of multiple transistors.
The ON-OFF control circuit 30, the voltage signal for being inputted according to the signal input part A generate control signal
And export, it is turned on or off with controlling first switch circuit 60 and second switch circuit 70.
The voltage detecting circuit 40, can be using the detection of sampling resistor partial pressure, Hall sensor or special voltage
Detection chip etc. realizes voltage detecting, unlimited herein.Voltage signal for being inputted according to the signal input part A generates detection
Signal simultaneously exports, and to control the opening of third switching circuit 80, the 4th switching circuit 90 is closed, alternatively, control third switching circuit
80 close, and the 4th switching circuit opens 90.
In the present embodiment, the test circuit further includes sequence controller, which can be set fills in display
On timing control (Timing Controller, the TCON) plate set, on timing control (Timing Controller, TCON) plate
It is additionally provided with power management integrated circuit, gate driving circuit and source electrode drive circuit, the voltage signal warp of system board output
After sequence controller processing, it is connect by gate driving circuit and source electrode drive circuit with display area, passes through Array (array
Substrate) on data line and scan line voltage signal is transmitted.
For the voltage signal after measuring the decaying transmitted through data line 10 and the electricity after the decaying transmitted through scan line 20
Press signal, that is, measurement data line terminal position voltage signal and scan line terminal position voltage signal.The application's
Technical solution, by be arranged ON-OFF control circuit 30, with control first switch circuit 60 and second switch circuit 70 opening or
Person close, by be arranged voltage detecting circuit 40, with control third switching circuit 80 and the 4th switching circuit 90 opening or
It closes, wherein first switch circuit 60 and third switching circuit 80 switch to be connected in series in first switch circuit 60 and third
When circuit 80 opens simultaneously, conductive sheet 50 and data line 10 are connected, at this point it is possible to pass through the fan-out area for being set to display panel
On 50 measurement data line 10 of conductive sheet voltage signal.And second switch circuit 70 and the 4th switching circuit 90 are that series connection connects
It connects, when second switch circuit 70 and the 4th switching circuit 90 open simultaneously, conductive sheet 50 and scan line 20 are connected, at this point, can
To measure the voltage signal of scan line 20 by conductive sheet 50.
Specifically, in the initial state, first switch circuit 60 and second switch circuit 70 are in off state, at this point, number
It is disconnected according to line 10 and conductive sheet 50, scan line 20 is also disconnected with conductive sheet 50.
If desired it when the voltage signal of measurement data line 10, can be provided by sequence controller or external circuit by low
Turn high voltage signal and be input to ON-OFF control circuit 30 and voltage detecting circuit 40, and is set by the program of sequence controller
Fixed or external circuit setting, makes the voltage signal keep high level, for example, if reference voltage signal Vref is 1.5V,
3.3V is maintained at after the voltage signal being drawn high.ON-OFF control circuit 30 in the rising edge for receiving the voltage signal,
The control signal of high level is exported to first switch circuit 60 and second switch circuit 70, to control first switch circuit 60 and the
Two switching circuits 70 are opened.In other embodiments, first switch circuit 60 also can be set and second switch circuit 70 is connecing
Opening when receiving low level control signal, it is unlimited herein.And voltage detecting circuit 40 is produced according to the voltage signal of this high level
The detection signal of raw high level is to third switching circuit 80 and the 4th switching circuit 90, since third switching circuit 80 is high level
The switching circuit of conducting, the 4th switching circuit 90 is the switching circuit of low level conducting, at this point, third switching circuit 80 is opened,
Since first switch circuit 60 and third switching circuit 80 are in an open state at this time, conductive sheet 50 is led with data line 10
It is logical, the voltage signal of 50 measurement data line 10 of conductive sheet can be passed through.
When if desired measuring the voltage signal of scan line 20, it can be provided by sequence controller or external circuit by low
Turn high voltage signal and be input to ON-OFF control circuit 30 and voltage detecting circuit 40, then the voltage signal of input is dragged down,
For example, the voltage signal of input can be pulled low to 0V if reference voltage signal Vref is 1.5V.ON-OFF control circuit 30 is connecing
When receiving the rising edge of voltage signal, the control signal of high level is exported to first switch circuit 60 and second switch circuit 70,
It is opened with controlling first switch circuit 60 and second switch circuit 70, and voltage detecting circuit 40 exports low level detection signal
To third switching circuit 80 and the 4th switching circuit 90, due to the switching circuit that third switching circuit 80 is high level conducting, the
Four switching circuits 90 are the switching circuit of low level conducting, at this point, the 4th switching circuit 90 is opened, due to second switch circuit 70
And the 4th switching circuit 90 be in an open state at this time, therefore, conductive sheet 50 and scan line 20 are connected, and can pass through conductive sheet 50
Measure the voltage signal of scan line 20.
When measuring terminates, can be provided again by sequence controller or external circuit by low turn of high voltage
Signal is to ON-OFF control circuit 30, at this point, ON-OFF control circuit 30 exports low level control signal to first switch circuit 60
And second switch circuit 70, it is closed with controlling first switch circuit 60 and second switch circuit 70, so that conductive sheet 50 and data
Line 10 and scan line 20 are off-state, and system restPoses.So set, not needing to survey glass sliver can
Voltage signal of the amount through data line 10 and scanning 20 lines transmission, method are simple and at low cost.
The technical solution of the application, by the way that conductive sheet 50 is arranged in the fan-out area of display panel, by controlling conductive sheet
It is connected with the conducting of data line 10 or conductive sheet and scan line 20, is believed with the voltage after measuring the decaying transmitted through data line 10
Number, or the voltage signal after the decaying transmitted through scan line 20；So set, not needing to make glass sliver can be to data
The voltage signal of line 10 or the voltage signal of scan line 20 measure, and measurement efficiency is high and measurement cost is low.
In one embodiment, referring to Fig. 4 and Fig. 5, the ON-OFF control circuit 30 includes trigger U1 and phase inverter U2, institute
The clock signal input terminal C for stating trigger U1 is the input terminal of the ON-OFF control circuit 30, and the data of the trigger U1 are defeated
Enter to hold D and the output end of the phase inverter U2 to connect, the input of the data output end Q of the trigger U1 and the phase inverter U2
End connection, the output end of the phase inverter U2 are the output end of the ON-OFF control circuit 30.
In the present embodiment, the trigger U1 is chosen as d type flip flop U1, and the characteristic of d type flip flop U1 is, when clock signal is defeated
When entering to hold C to receive the rising edge of signal, the logic level of its data input pin D is assigned to its data output end Q.In initial shape
Under state, the data input pin D of d type flip flop U1 be it is low, when the electricity for the voltage signal or scan line 20 for needing measurement data line 10
When pressing signal, it can be provided by sequence controller or external circuit corresponding by low turn of high voltage signal.D type flip flop U1's
For clock signal input terminal C when receiving the rising edge of voltage signal of signal input part A input, the data of d type flip flop U1 are defeated
Outlet Q exports low level electric signal to phase inverter U2, the corresponding control signal for exporting high level of phase inverter U2 to first switch
The controlled end of circuit 60 and second switch circuit 70 is opened with controlling first switch circuit 60 and second switch circuit 70, into
Enter measuring state.When do not need measurement when, can be provided again by sequence controller or external circuit it is corresponding by
Low turn of high voltage signal to d type flip flop U1 clock signal input terminal C, since the output end of phase inverter U2 at this time is high electricity
It is flat, correspondingly, the data input pin D of d type flip flop U1 is height, therefore, the data output end Q output high level of d type flip flop U1
For electric signal to phase inverter U2, phase inverter U2 is corresponding to export low level control signal to first switch circuit 60 and second switch electricity
Road 70 is closed with controlling first switch circuit 60 and second switch circuit 70, so that conductive sheet 50 and data line 10 and sweeping
The disconnection of line 20 is retouched, system restPoses.Wherein, the ON-OFF control circuit 30 further includes first resistor R1, passes through setting
The control signal of first resistor R1, the high level that can be exported to avoid phase inverter are pulled low.
In one embodiment, referring to Fig. 4 and Fig. 5, the voltage detecting circuit 40 includes first comparator U3, and described first
The non-inverting input terminal of comparator U3 is the input terminal of the voltage detecting circuit 40, the inverting input terminal of the first comparator U3
Input reference voltage signal, the output end of the first comparator U3 are the output end of the voltage detecting circuit 40.
The characteristic of first comparator U3 is that, if the voltage of normal phase input end is greater than the voltage of negative-phase input, first compares
Device U3 exports high level, if the voltage of normal phase input end is less than or equal to the voltage of negative-phase input, first comparator U3 is defeated
Low level out.The normal phase input end of first comparator U3 receives the voltage signal of signal input part A input, i.e., sequence controller or
The voltage signal that person's external circuit provides；Negative-phase input receives the reference voltage letter of the outputs such as external circuit or regulated power supply
Number Vref, reference voltage signal Vref can be configured as needed, unlimited herein.
It if desired, can be by sequence controller or external circuit output by low turn when the voltage signal of measurement data line 10
High voltage signal to first comparator U3 non-inverting input terminal, and make input voltage signal keep high level so that first
The voltage signal of the non-inverting input terminal of comparator U3 is greater than the reference voltage signal Vref of inverting input terminal, at this point, first compares
Device U3 exports the detection signal of high level to third switching circuit 80 and the controlled end of the 4th switching circuit 90, since third switchs
Circuit 80 is the switching circuit of high level conducting, and the 4th switching circuit 90 is the switching circuit of low level conducting, at this point, third is opened
It opens on powered-down road 80.
When if desired measuring the voltage signal of scan line 20, it can be provided by sequence controller or external circuit by low turn
High voltage signal and the non-inverting input terminal for being input to first comparator U3, and the voltage signal of input is dragged down, so that first
The voltage signal of the non-inverting input terminal of comparator U3 is less than the reference voltage signal Vref of inverting input terminal, at this point, first compares
Device U3 exports low level detection signal, and to control the closing of third switching circuit 80, the 4th switching circuit 90 is opened.
In one embodiment, referring to Fig. 4 and Fig. 5, the first switch circuit 60, second switch circuit 70, third switch
Circuit 80 and the 4th switching circuit 90 all have closing and open two states, can be using the electricity of various transistors composition
Road is realized, such as metal-oxide-semiconductor, triode and other composite switch circuits being made of multiple transistors.
In the present embodiment, the first switch circuit 60, second switch circuit 70 and third switching circuit 80 include single
A NMOS tube (N-type insulating properties field-effect tube), the grid of the NMOS tube are the first switch circuit 60, second switch circuit
70 and third switching circuit 80 controlled end, the drain electrode of the NMOS tube is the first switch circuit 60, second switch circuit
70 and third switching circuit 80 input terminal, the source electrode of the NMOS tube is the first switch circuit 60, second switch circuit
70 and third switching circuit 80 output end, the 4th switching circuit 90 include PMOS tube (p-type insulating properties field-effect tube), institute
The grid for stating PMOS tube is the controlled end of the 4th switching circuit 90, and the source electrode of the PMOS tube and drain electrode are respectively described the
The input terminal and output end of four switching circuits 90.In other embodiments, it is PMOS tube that third switching circuit, which also can be set, the
Four switching circuits are NMOS tube, unlimited at this time.
When needing the voltage signal of measurement data line 10, ON-OFF control circuit 30 export high level control signal up to
The controlled end of first switch circuit 60 and second switch circuit 70, to control first switch circuit 60 and second switch circuit 70,
Meanwhile to export the detection signal of high level controlled to third switching circuit and the 4th switching circuit 90 for voltage detecting circuit 40
End, so that third switching circuit 80 is opened, the 4th switching circuit 90 is closed, in first switch circuit 60 and third switching circuit
80 are in an open state, and conductive sheet 50 and data line 10 are connected, and can pass through the voltage signal of 50 measurement data line 10 of conductive sheet.
When needing to measure the voltage signal of scan line 20, ON-OFF control circuit 30 export high level control signal up to
The controlled end of first switch circuit 60 and the controlled end of second switch circuit 70, to control first switch circuit 60 and second switch
Circuit 70 open, meanwhile, voltage detecting circuit 40 export it is low level detection signal to third switching circuit 80 controlled end and
The controlled end of 4th switching circuit 90, so that third switching circuit 80 is closed, the 4th switching circuit 90 is opened, in second switch
Circuit 70 and the 4th switching circuit 90 are in an open state, and conductive sheet 50 and scan line 20 are connected, and therefore, can pass through conductive sheet
The voltage signal of 50 measurement scan lines 20.
When measuring terminates, low level control signal can be exported by ON-OFF control circuit 30 to first switch electricity
The controlled end on road 60 and the controlled end of second switch circuit 70 are closed with controlling first switch circuit 60 and second switch circuit 70
It closes, so that conductive sheet 50 and data line 10 and scan line 20 are off-state, system restPoses.
The application also proposes that a kind of display device, the display device include display panel and as above described in any item surveys
Circuit is tried, the display panel includes display area and fan-out area, and the conductive sheet 50 of the test circuit is arranged in the fan
Out on region.The detailed construction of the test circuit can refer to above-described embodiment, and details are not described herein again；It is understood that due to
Above-mentioned test circuit is used in the application display device, therefore, the embodiment of the application display device includes above-mentioned test
Whole technical solutions of circuit whole embodiments, and technical effect achieved is also identical, details are not described herein.
In the present embodiment, display device can be television set, tablet computer, mobile phone etc. and fill with the display of display panel
It sets.The display panel can be following any: liquid crystal display panel, OLED display panel, QLED display panel, twisted-nematic
(Twisted Nematic, TN) or super twisted nematic (Super Twisted Nematic, STN) type, plane conversion (In-
Plane Switching, IPS) type, vertical orientation (Vertical Alignment, VA) type, curved face type panel or other are aobvious
Show panel.
The foregoing is merely alternative embodiments of the invention, are not intended to limit the scope of the invention, all at this
Under the inventive concept of invention, using equivalent structure transformation made by description of the invention and accompanying drawing content, or directly/use indirectly
It is included in other related technical areas in scope of patent protection of the invention.
Claims (10)
1. a kind of test method of display panel, be applied in display device, the display device include data line, scan line and
Conductive sheet, by test circuit connection between the data line and the conductive sheet, between the scan line and the conductive sheet
Pass through the test circuit connection, which is characterized in that the test method of the display panel includes:
Step S1 receives the voltage signal of signal input part input；
Step S2 adjusts the test circuit according to the voltage signal of signal input part input so that the conductive sheet with
The data line conducting, alternatively, so that the conductive sheet is connected with the scan line.
2. the test method of display panel as described in claim 1, which is characterized in that the test circuit includes:
Signal input part；
The input terminal of first switch circuit, the first switch circuit is connect with the data line；
The input terminal of second switch circuit, the second switch circuit is connect with the scan line；
ON-OFF control circuit, the input terminal of the ON-OFF control circuit are connect with the signal input part, the switch control electricity
The output end on road is connect with the controlled end of the controlled end of the first switch circuit and the second switch circuit；
Third switching circuit, the input terminal of the third switching circuit is connect with the output end of the first switch circuit, described
The output end of third switching circuit is connect with the conductive sheet；
The input terminal of 4th switching circuit, the 4th switching circuit is connect with the output end of the second switch circuit, described
The output end of 4th switching circuit is connect with the conductive sheet；
Voltage detecting circuit, the input terminal of the voltage detecting circuit are connect with the signal input part, the voltage detecting electricity
The output end on road is connect with the controlled end of the controlled end of the third switching circuit and the 4th switching circuit.
3. the test method of display panel as claimed in claim 2, which is characterized in that the step S2 includes:
Step S21, the voltage signal that the ON-OFF control circuit is inputted according to the signal input part, generation control signal are simultaneously defeated
Out, it is opened with controlling the first switch circuit and the second switch circuit；
Step S22, the voltage signal that the voltage detecting circuit is inputted according to the signal input part generate detection signal and defeated
Out, it is opened with controlling the third switching circuit or the 4th switching circuit, so that the conductive sheet and the data line
Conducting, alternatively, so that the conductive sheet is connected with the scan line.
4. the test method of display panel as claimed in claim 3, which is characterized in that the step S22 includes:
Step S221, the voltage detecting circuit is when detecting the voltage signal of the signal input part input, described in judgement
Whether the voltage signal of signal input part input is greater than reference voltage signal；
Step S222, when the voltage signal of signal input part input is greater than the reference voltage signal, the voltage inspection
Slowdown monitoring circuit exports the detection signal of high level, is opened with controlling the third switching circuit, and control the 4th switching circuit
It closes, so that the conductive sheet is connected with the data line.
5. the test method of display panel as claimed in claim 3, which is characterized in that after the step S221, further includes:
Step S223, when the voltage signal of signal input part input is less than the reference voltage signal, the voltage inspection
Slowdown monitoring circuit exports low level detection signal, is opened with controlling the 4th switching circuit, and control the third switching circuit
It closes, so that the conductive sheet is connected with the scan line.
6. a kind of test circuit, the test circuit is set in display device, and the display device includes data line, scan line
And conductive sheet, which is characterized in that the test circuit includes:
Signal input part；
The input terminal of first switch circuit, the first switch circuit is connect with the data line；
The input terminal of second switch circuit, the second switch circuit is connect with the scan line；
ON-OFF control circuit, the input terminal of the ON-OFF control circuit are connect with the signal input part, the switch control electricity
The output end on road is connect with the controlled end of the controlled end of the first switch circuit and the second switch circuit, the switch control
Circuit processed is configured as the voltage signal inputted according to the signal input part and generates control signal and export, described in control
First switch circuit and the second switch circuit are opened；
Third switching circuit, the input terminal of the third switching circuit is connect with the output end of the first switch circuit, described
The output end of third switching circuit is connect with the conductive sheet；
The input terminal of 4th switching circuit, the 4th switching circuit is connect with the output end of the second switch circuit, described
The output end of 4th switching circuit is connect with the conductive sheet；
Voltage detecting circuit, the input terminal of the voltage detecting circuit are connect with the signal input part, the voltage detecting electricity
The output end on road is connect with the controlled end of the controlled end of the third switching circuit and the 4th switching circuit, the voltage inspection
Slowdown monitoring circuit is configured as the voltage signal inputted according to the signal input part and generates detection signal and export, described in control
Third switching circuit is opened, so that the conductive sheet is connected with the data line；
The voltage detecting circuit is additionally configured to generate detection signal simultaneously according to the voltage signal that the signal input part inputs
Output is opened with controlling the 4th switching circuit, so that the conductive sheet is connected with the scan line.
7. test circuit as claimed in claim 6, which is characterized in that the ON-OFF control circuit includes trigger and reverse phase
Device, the clock signal input terminal of the trigger are the input terminal of the ON-OFF control circuit, the data input of the trigger
End is connect with the output end of the phase inverter, and the data output end of the trigger is connect with the input terminal of the phase inverter, institute
The output end for stating phase inverter is the output end of the ON-OFF control circuit.
8. test circuit as claimed in claim 7, which is characterized in that the ON-OFF control circuit further includes first resistor, institute
The first end for stating first resistor is connect with the output end of the phase inverter, the second end ground connection of the first resistor.
9. test circuit as claimed in claim 6, which is characterized in that the voltage detecting circuit includes first comparator, institute
The non-inverting input terminal for stating first comparator is the input terminal of the voltage detecting circuit, the inverting input terminal of the first comparator
Input reference voltage signal, the output end of the first comparator are the output end of the voltage detecting circuit.
10. a kind of display device, which is characterized in that the display device includes display panel and any one of such as claim 6 to 9
The test circuit.
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| CN201811598879.9A CN109584762B (en) | 2018-12-25 | 2018-12-25 | Display panel test method, test circuit and display device |
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| CN201811598879.9A CN109584762B (en) | 2018-12-25 | 2018-12-25 | Display panel test method, test circuit and display device |
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| CN109584762B (en) | 2022-04-01 |
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