CN102298891A - Method for testing signal transmission line, integrated circuit and display panel module - Google Patents
Method for testing signal transmission line, integrated circuit and display panel module Download PDFInfo
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- CN102298891A CN102298891A CN2011102123002A CN201110212300A CN102298891A CN 102298891 A CN102298891 A CN 102298891A CN 2011102123002 A CN2011102123002 A CN 2011102123002A CN 201110212300 A CN201110212300 A CN 201110212300A CN 102298891 A CN102298891 A CN 102298891A
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- 238000012360 testing method Methods 0.000 title claims abstract description 71
- 230000008054 signal transmission Effects 0.000 title claims abstract description 15
- 238000000034 method Methods 0.000 title claims abstract description 14
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical group O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 241001417495 Serranidae Species 0.000 description 5
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- GRPQBOKWXNIQMF-UHFFFAOYSA-N indium(3+) oxygen(2-) tin(4+) Chemical class [Sn+4].[O-2].[In+3] GRPQBOKWXNIQMF-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention discloses a method for testing a signal transmission line, an integrated circuit and a display panel module. The integrated circuit includes a plurality of contacts, a logic gate group and an output unit. The plurality of contacts are respectively connected to a plurality of external signal transmission lines; the logic gate group is provided with a plurality of input ends which are respectively coupled with the plurality of contacts under a test mode; the output unit is coupled to at least one output end of the logic gate group and used for generating at least one test result signal according to at least one output signal of the logic gate group and transmitting the at least one test result signal to an output end of the integrated circuit so as to judge the electrical connection state of the plurality of external signal transmission lines.
Description
Technical field
The present invention relates to a kind of method of the electric connection state that is used for a plurality of signal transmssion lines of being linked on the test panel, refer to that especially a kind of utilization is made in the method that the logic gate group in the integrated circuit comes the electric connection state of a plurality of signal transmssion lines on the test panel.
Background technology
In panel module, digital signal can be produced by control panel, and digital signal is sent to drive integrated circult on the panel through a plurality of signal transmssion lines, yet, may have on the signal transmssion line and open circuit or the situation of short circuit generation, therefore, before panel module dispatches from the factory, need test to judge whether signal transmssion line is normal.In general, usually need can judge whether to have on the signal transmssion line by the operation of reality and open circuit or short circuit, yet, if the quantity of video data is too huge, then open circuit or short circuit is difficult to be found, therefore can can't detect the problem of signal transmssion line really, and make defective products flow out to client.
Summary of the invention
Therefore, one of purpose of the present invention is to provide a kind of method of the electric connection state that is used for testing a plurality of signal transmssion lines that linked on the panel and relevant integrated circuit and display module, to solve the above problems.
According to one embodiment of the invention, an integrated circuit includes a plurality of contacts, a logic gate group and an output unit.These a plurality of contacts are connected to a plurality of external signal transmission lines respectively; This logic gate group has a plurality of input ends, and it is respectively coupled to these a plurality of contacts under a test pattern; This output unit is coupled at least one output terminal of this logic gate group, and be used at least one output signal according to this logic gate group to produce at least one test result signal, and will this at least one test result signal be sent to an output terminal of this integrated circuit, for the electric connection state of judging these a plurality of external signal transmission lines.
According to another embodiment of the present invention, a display module includes a panel and an integrated circuit, and wherein linking on this panel has a plurality of signal transmssion lines, and this integrated circuit includes a plurality of contacts, a logic gate group and an output unit.These a plurality of contacts are connected to a plurality of signal transmssion lines respectively; This logic gate group has a plurality of input ends, and it is respectively coupled to these a plurality of contacts under a test pattern; This output unit is coupled at least one output terminal of this logic gate group, and be used at least one output signal according to this logic gate group to produce at least one test result signal, and will this at least one test result signal be sent to an output terminal of this integrated circuit, for the electric connection state of judging these a plurality of signal transmssion lines.
According to another embodiment of the present invention, a kind of method that is used for testing the electric connection state of a plurality of signal transmssion lines that linked on the panel, include: an integrated circuit is provided, and wherein this integrated circuit includes: a plurality of contacts are connected to a plurality of signal transmssion lines respectively; One logic gate group has a plurality of input ends, and it is respectively coupled to these a plurality of contacts under a test pattern; An and output unit, be coupled at least one output terminal of this logic gate group, be used at least one output signal according to this logic gate group to produce at least one test result signal, and will this at least one test result signal be sent to an output terminal of this integrated circuit, for the electric connection state of judging these a plurality of signal transmssion lines; And under a test pattern: these a plurality of input ends of this logic gate group are respectively coupled to this a plurality of contacts; One first group of test signal is inputed to this a plurality of signal transmssion lines; After this first test signal inputed to these a plurality of signal transmssion lines, this output terminal of measuring this integrated circuit was to obtain one first test result; One second group of test signal is inputed to this a plurality of signal transmssion lines; After this second test signal inputed to these a plurality of signal transmssion lines, this output terminal of measuring this integrated circuit was to obtain one second test result; And according to this first test result and this second test result to judge the electric connection state of these a plurality of signal transmssion lines.
Beneficial effect of the present invention is to judge the electric connection state of signal transmssion line by being arranged at a logic gate group in the drive integrated circult, can very simply test and only need the very short test duration, thereby be convenient to production line operation, and do not need extra checkout equipment, can reduce testing cost.
Description of drawings
Fig. 1 is the synoptic diagram according to the display module of one embodiment of the invention;
Fig. 2 is the synoptic diagram according to the drive integrated circult of the present invention one first embodiment;
Fig. 3 (A) and Fig. 3 (B) open circuit for signal transmssion line and the synoptic diagram of short circuit;
Fig. 4 for take place when signal transmssion line as Fig. 3 (A) and Fig. 3 (B) open circuit and during short circuit condition, the synoptic diagram of the digital signal that drive integrated circult is received;
Fig. 5 is the synoptic diagram according to the drive integrated circult of the present invention one second embodiment.
Wherein, Reference numeral
100 display modules, 120,200,500 drive integrated circults
130 flexible circuit boards, 210,510 multiplexers
220,520 logic gate groups
222,224,226,228,522,524,526,528 XOR gate
229 or the door 230,530 output units
532,534,536,538 output subelement P1～PM contacts
L1～LM signal transmssion line DB0～DBN digital signal
Embodiment
Please refer to Fig. 1, Fig. 1 is the synoptic diagram according to the display module 100 of one embodiment of the invention.As shown in Figure 1, display module 100 includes panel 110, drive integrated circult 120 and flexible circuit board (Flexible Printed Circuit, FPC) 130, wherein flexible circuit board 130 is pressed together on the panel 110, and panel 110 links M bars transmission line L1～LM, that is M bars transmission line L1～LM includes many tin indium oxides (Indium Tin Oxide, ITO) signal transmssion line on signal transmssion line and the flexible circuit board 130 that is made on the panel 110.In addition, drive integrated circult 120 has M the contact P1～PM that is connected in many barss transmission line L1～LM, and wherein M is the positive integer greater than 1.
Please refer to Fig. 2, Fig. 2 is the synoptic diagram according to the drive integrated circult 200 of the present invention one first embodiment.As shown in Figure 2, drive integrated circult 200 includes multiplexer 210, logic gate group 220 and output unit 230, wherein multiplexer 210 has two input end OUT_1 and OUT_2, and input end OUT_1 is connected to the operation element of drive integrated circult 200 when normal running, and input end OUT_2 is connected to the input end of logic gate group 220; In addition, logic gate group 220 includes 222～228 and one of four XOR gate (XOR gate) or (an OR gate) 229.In the following relevant explanation of drive integrated circult 200, hypothesis driven integrated circuit 200 receives the digital signal DB0～DB7 that is transmitted through many barss transmission line L1～L8 from a plurality of contact P1～P8 respectively, yet, the bit number of the quantity of contact and signal transmssion line and digital signal only is example explanation, and is not as restriction of the present invention.
In the operation of drive integrated circult 200, at first, multiplexer 210 in the drive integrated circult 200 receives the digital signal DB0～DB7 that is transmitted through many barss transmission line L1～L8 from a plurality of contact P1～P8 respectively, at this moment, the control of multiplexer 210 by a control signal Vc is switching to a test pattern, that is multiplexer 210 can be sent to received digital signal DB0～DB7 the input end of four XOR gate 222～228 through input end OUT_2.
Then, four XOR gate 222～228 are carried out logical operation to digital signal DB0～DB7 respectively, and or the output signal of 229 pairs of XOR gate 222～228 of door carry out logical operation to produce output signal Dout.At last, output unit 230 receives output signal Dout and also produces test result Dout ', and the contact of test result Dout ' by drive integrated circult 200 be sent to outsidely open circuit or short circuit for judging whether signal transmssion line L1～L8 has.
Specifically, drive integrated circult 200 can receive two groups of different digital signal DB0～DB7, and judge according to the output signal Dout that corresponds to these two groups of different digital signal DB0～DB7 whether signal transmssion line L1～L8 has and open circuit or short circuit that wherein these two groups of different digital signal DB0～DB7 are respectively " 10101010 " and " 01010101 ".When digital signal DB0～DB7 is respectively " 10101010 " and " 01010101 ", and or door 229 output signal Dout when being " 0 ", then the electric connection state of representation signal transmission line L1～L8 normal (not opening circuit or short circuit); And if or door 229 output signal Dout when once being " 1 ", then representation signal transmission line L1～L8 has and opens circuit or short circuit.
For instance, with reference to figure 3 (A) and Fig. 3 (B) and Fig. 4, suppose when the open circuit situation (signal transmssion line L2 and L5 open circuit) of signal transmssion line L1～L8 generation as Fig. 3 (A), then after digital signal " 10101010 " and " 01010101 " successively input to signal transmssion line L1～L8, voltage potential on the contact P1～P8 of drive integrated circult 200 (that is the received digital signal DB0 of drive integrated circult 200～DB7) be respectively " 10100010 " and " 00010101 " (referring to Fig. 4), therefore, the output signal Dout of logic gate group 220 is " 1 "; On the other hand, suppose when the short circuit condition (signal transmssion line L1 and L2 between and L4 and L5 between be short-circuited) of signal transmssion line L1～L8 generation as Fig. 3 (B), then after digital signal " 10101010 " and " 01010101 " successively input to signal transmssion line L1～L8, voltage potential on the contact P1～P8 of drive integrated circult 200 (that is the received digital signal DB0 of drive integrated circult 200～DB7) be respectively " 11111010 " and " 11011101 " (referring to Fig. 4), therefore, the output signal Dout of logic gate group 220 is " 1 ".
As mentioned above, as long as have short circuit or the situation that opens circuit to take place on signal transmssion line L1～L8, then the output signal Dout of logic gate group 220 will be " 1 ", therefore, as long as the voltage potential of the output signal Dout of decision logic door group 220 just can be learnt the electric connection state on signal transmssion line L1～L8 easily.In addition, above-mentioned detection mode simply and only needs the very short test duration, therefore is convenient to produce the line operation, and does not need extra checkout equipment, can reduce testing cost.
In addition, above-mentioned relevant drive integrated circult 200 shown in Figure 2 only can be judged short circuit or the situation that opens circuit on signal transmssion line L1～L8, utilize which bars transmission line of can also further judging of the present invention that problem on the electric connection state is arranged.Fig. 5 is the synoptic diagram according to the drive integrated circult 500 of the present invention one second embodiment.As shown in Figure 5, drive integrated circult 500 includes multiplexer 510, logic gate group 520 and output unit 530, wherein multiplexer 510 has two input end OUT_1 and OUT_2, and input end OUT_1 is connected to the operation element of drive integrated circult 500 when normal running, and input end OUT_2 is connected to the input end of logic gate group 520; In addition, logic gate group 520 includes four XOR gate (XOR gate) 522～528, and output unit 530 includes four output subelements 532～538.In the following relevant explanation of drive integrated circult 500, hypothesis driven integrated circuit 500 receives the digital signal DB0～DB7 that is transmitted through many barss transmission line L1～L8 from a plurality of contact P1～P8 respectively, yet this only is example explanation, and is not as restriction of the present invention.
In the operation of drive integrated circult 500, at first, multiplexer 510 in the drive integrated circult 500 receives the digital signal DB0～DB7 that is transmitted via many barss transmission line L1～L8 from a plurality of contact P1～P8 respectively, at this moment, the control of multiplexer 510 by a control signal Vc is switching to a test pattern, that is multiplexer 510 can be sent to received digital signal DB0～DB7 the input end of four XOR gate 522～528 via input end OUT_2.
Then, four XOR gate 522～528 are carried out logical operation to digital signal DB0～DB7 respectively, to produce four output signal Dout1～Dout4.At last, four output subelements 532～538 receive four output signal Dout1～Dout4 respectively and produce four test result Dout1 '～Dout4 ', and at least one contact of four test result Dout1 '～Dout4 ' by drive integrated circult 500 be sent to outsidely open circuit or short circuit for judging whether signal transmssion line L1～L8 has.
Specifically, drive integrated circult 500 can receive two groups of different digital signal DB0～DB7, and judge according to the output signal Dout that corresponds to these two groups of different digital signal DB0～DB7 whether signal transmssion line L1～L8 has and open circuit or short circuit, wherein these two groups of different digital signal DB0～DB7 are respectively " 10101010 " and " 01010101 ", and when digital signal DB0～DB7 is respectively " 10101010 " and " 01010101 ", when output signal Dout1～Dout4 is " 0 ", the electric connection state of representation signal transmission line L1～L8 normal (not opening circuit or short circuit) then; And if one of them output signal Dout1～Dout4 is arranged once for " 1 " time, then represent corresponding signal transmssion line to have and open circuit or short circuit.For instance, the value of supposing output signal Dout1 is " 1 ", then representation signal transmission line L1 or L2 one of them have and open circuit or short circuit.
In addition, be noted that, above-mentioned relevant drive integrated circult 200 and drive integrated circult 500 all suppose to have only 8 stroke numeral data, yet, in other embodiments of the invention, can receive many stroke numerals data by a plurality of signal transmssion lines, because those of ordinary skills can be applied to the present invention easily according to the instruction of the foregoing description, so details repeats no more.
Concise and to the point conclusion the present invention, in the method for a kind of electric connection state that is used for testing a plurality of signal transmssion lines that linked on the panel of the present invention and relevant integrated circuit and display module, judge the electric connection state of signal transmssion line by being arranged at a logic gate group in the drive integrated circult, thus, can very simply test and only need the very short test duration, therefore be convenient to production line operation, and do not need extra checkout equipment, can reduce testing cost.
Certainly; the present invention also can have other various embodiments; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (16)
1. an integrated circuit is characterized in that, includes:
A plurality of contacts are connected to a plurality of external signal transmission lines respectively;
One logic gate group has a plurality of input ends, and it is respectively coupled to these a plurality of contacts under a test pattern; And
One output unit, be coupled at least one output terminal of this logic gate group, be used at least one output signal according to this logic gate group to produce at least one test result signal, and will this at least one test result signal be sent to an output terminal of this integrated circuit, for the electric connection state of judging these a plurality of external signal transmission lines.
2. integrated circuit according to claim 1 is characterized in that, this logic gate group includes:
A plurality of XOR gate, its input end are respectively coupled to this a plurality of contacts; And
One or door, wherein should or an input end of door be electrically connected at a plurality of output terminals of these a plurality of XOR gate, and should or an output terminal of door as this output terminal of this logic gate group.
3. integrated circuit according to claim 1 is characterized in that, this logic gate group has a plurality of output terminals, and this logic gate group includes:
A plurality of XOR gate, wherein a plurality of input ends of these a plurality of XOR gate are respectively coupled to this a plurality of contacts, and a plurality of output terminals of these a plurality of XOR gate are as these a plurality of output terminals of this logic gate group.
4. integrated circuit according to claim 3 is characterized in that, this output unit includes:
A plurality of output subelements, be respectively coupled to these a plurality of output terminals of these a plurality of XOR gate, wherein the output signal of the corresponding XOR gate of each output subelement foundation is to produce a corresponding test result signal, and will this corresponding test result signal be sent to an output terminal of this integrated circuit, be coupled to the electric connection state of the external signal transmission line of this corresponding XOR gate for judgement.
5. integrated circuit according to claim 1 is characterized in that, this integrated circuit is the drive integrated circult that is applied to a display panel.
6. a display module is characterized in that, includes:
One panel is connected to a plurality of signal transmssion lines on it; And
One integrated circuit, wherein this integrated circuit includes: a plurality of contacts are connected to a plurality of signal transmssion lines respectively; One logic gate group has a plurality of input ends, and it is respectively coupled to these a plurality of contacts under a test pattern; An and output unit, be coupled at least one output terminal of this logic gate group, be used at least one output signal according to this logic gate group to produce at least one test result signal, and will this at least one test result signal be sent to an output terminal of this integrated circuit, for the electric connection state of judging these a plurality of signal transmssion lines.
7. display module according to claim 6 is characterized in that, this logic gate group includes:
A plurality of XOR gate, its input end are respectively coupled to this a plurality of contacts; And
One or door, wherein should or an input end of door be electrically connected at a plurality of output terminals of these a plurality of XOR gate, and should or an output terminal of door as this output terminal of this logic gate group.
8. display module according to claim 6 is characterized in that, this logic gate group has a plurality of output terminals, and this logic gate group includes:
A plurality of XOR gate, wherein a plurality of input ends of these a plurality of XOR gate are respectively coupled to this a plurality of contacts, and a plurality of output terminals of these a plurality of XOR gate are as these a plurality of output terminals of this logic gate group.
9. display module according to claim 8 is characterized in that, this output unit includes:
A plurality of output subelements, be respectively coupled to these a plurality of output terminals of these a plurality of XOR gate, wherein the output signal of the corresponding XOR gate of each output subelement foundation is to produce a corresponding test result signal, and will this corresponding test result signal be sent to an output terminal of this integrated circuit, be coupled to the electric connection state of the external signal transmission line of this corresponding XOR gate for judgement.
10. display module according to claim 6 is characterized in that, this integrated circuit is the drive integrated circult that is applied to a display panel.
11. display module according to claim 6 is characterized in that, these a plurality of signal transmssion lines include many tin indium oxide signal transmssion lines that are made on the panel.
12. display module according to claim 6 is characterized in that, these a plurality of signal transmssion lines include the signal transmssion line on the flexible circuit board that is pressed on the panel.
13. a method that is used for testing the electric connection state of a plurality of signal transmssion lines that linked on the panel is characterized in that, includes:
One integrated circuit is provided, and wherein this integrated circuit includes: a plurality of contacts are connected to a plurality of signal transmssion lines respectively;
One logic gate group has a plurality of input ends, and it is respectively coupled to these a plurality of contacts under a test pattern; And
One output unit, be coupled at least one output terminal of this logic gate group, be used at least one output signal according to this logic gate group to produce at least one test result signal, and will this at least one test result signal be sent to an output terminal of this integrated circuit, for the electric connection state of judging these a plurality of signal transmssion lines; And
Under a test pattern:
1) these a plurality of input ends with this logic gate group are respectively coupled to this a plurality of contacts;
2) one first group of test signal is inputed to this a plurality of signal transmssion lines;
3) after this first test signal inputs to these a plurality of signal transmssion lines, this output terminal of measuring this integrated circuit is to obtain one first test result;
4) one second group of test signal is inputed to this a plurality of signal transmssion lines;
5) after this second test signal inputs to these a plurality of signal transmssion lines, this output terminal of measuring this integrated circuit is to obtain one second test result; And
6) according to this first test result and this second test result to judge the electric connection state of these a plurality of signal transmssion lines.
14. method according to claim 13 is characterized in that, this logic gate group includes:
A plurality of XOR gate, its input end are respectively coupled to this a plurality of contacts; And
One or door, wherein should or an input end of door be electrically connected at a plurality of output terminals of these a plurality of XOR gate, and should or an output terminal of door as this output terminal of this logic gate group; And
This method includes in addition: when this first group of test signal inputed to this a plurality of signal transmssion line, a first input end of each XOR gate and one second input end received a logical zero signal and a logical one signal respectively; And when this second group of test signal inputed to this a plurality of signal transmssion line, this first input end of each XOR gate and this second input end received a logical one signal and a logical zero signal respectively.
15. method according to claim 13 is characterized in that, this logic gate group has a plurality of output terminals, and this logic gate group includes:
A plurality of XOR gate, wherein a plurality of input ends of these a plurality of XOR gate are respectively coupled to this a plurality of contacts, and a plurality of output terminals of these a plurality of XOR gate are as these a plurality of output terminals of this logic gate group; And
This method includes in addition: when this first group of test signal inputed to this a plurality of signal transmssion line, a first input end of each XOR gate and one second input end received a logical zero signal and a logical one signal respectively; And when this second group of test signal inputed to this a plurality of signal transmssion line, this first input end of each XOR gate and this second input end received a logical one signal and a logical zero signal respectively.
16. method according to claim 13 is characterized in that, this integrated circuit is the drive integrated circult that is applied to a display panel.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100104756A TWI502207B (en) | 2011-02-14 | 2011-02-14 | Method for testing electrical connection status of a plurality of data lines connected to a panel and associated integrated circuit and display panel module |
| TW100104756 | 2011-02-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102298891A true CN102298891A (en) | 2011-12-28 |
| CN102298891B CN102298891B (en) | 2014-04-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110212300.2A Expired - Fee Related CN102298891B (en) | 2011-02-14 | 2011-07-22 | Method for testing signal transmission line, integrated circuit and display panel module |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN102298891B (en) |
| TW (1) | TWI502207B (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104952382A (en) * | 2014-03-24 | 2015-09-30 | 昆达电脑科技(昆山)有限公司 | Transmission before-after comparison device for images of liquid crystal display television |
| CN107274820A (en) * | 2017-07-24 | 2017-10-20 | 京东方科技集团股份有限公司 | A kind of test circuit and its method of testing, display panel |
| CN108061851A (en) * | 2016-11-09 | 2018-05-22 | 德克萨斯仪器股份有限公司 | For testing the method and apparatus of insertion point |
| CN109738750A (en) * | 2019-01-08 | 2019-05-10 | 京东方科技集团股份有限公司 | Chip, chip assembly and its test method, display component |
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| CN200965682Y (en) * | 2006-11-07 | 2007-10-24 | 英业达股份有限公司 | Mainboard data signal display device |
| CN201251781Y (en) * | 2008-07-23 | 2009-06-03 | 英业达科技有限公司 | Signal measuring device |
| CN101707432A (en) * | 2006-08-22 | 2010-05-12 | 株式会社日立制作所 | Electric power switching device and its abnormal test method |
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| US6334219B1 (en) * | 1994-09-26 | 2001-12-25 | Adc Telecommunications Inc. | Channel selection for a hybrid fiber coax network |
| TWI375806B (en) * | 2007-08-07 | 2012-11-01 | Himax Tech Ltd | Apparatus for testing driving circuit in display |
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- 2011-02-14 TW TW100104756A patent/TWI502207B/en not_active IP Right Cessation
- 2011-07-22 CN CN201110212300.2A patent/CN102298891B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101707432A (en) * | 2006-08-22 | 2010-05-12 | 株式会社日立制作所 | Electric power switching device and its abnormal test method |
| CN200965682Y (en) * | 2006-11-07 | 2007-10-24 | 英业达股份有限公司 | Mainboard data signal display device |
| CN201251781Y (en) * | 2008-07-23 | 2009-06-03 | 英业达科技有限公司 | Signal measuring device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104952382A (en) * | 2014-03-24 | 2015-09-30 | 昆达电脑科技(昆山)有限公司 | Transmission before-after comparison device for images of liquid crystal display television |
| CN108061851A (en) * | 2016-11-09 | 2018-05-22 | 德克萨斯仪器股份有限公司 | For testing the method and apparatus of insertion point |
| CN107274820A (en) * | 2017-07-24 | 2017-10-20 | 京东方科技集团股份有限公司 | A kind of test circuit and its method of testing, display panel |
| CN107274820B (en) * | 2017-07-24 | 2020-11-27 | 京东方科技集团股份有限公司 | Test circuit, test method thereof and display panel |
| CN109738750A (en) * | 2019-01-08 | 2019-05-10 | 京东方科技集团股份有限公司 | Chip, chip assembly and its test method, display component |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201234022A (en) | 2012-08-16 |
| CN102298891B (en) | 2014-04-16 |
| TWI502207B (en) | 2015-10-01 |
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