CN107256668B - Experimental device for solid refractive index measurement - Google Patents
Experimental device for solid refractive index measurement Download PDFInfo
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- CN107256668B CN107256668B CN201710452496.XA CN201710452496A CN107256668B CN 107256668 B CN107256668 B CN 107256668B CN 201710452496 A CN201710452496 A CN 201710452496A CN 107256668 B CN107256668 B CN 107256668B
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- turntable
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- solar cell
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
- G09B23/00—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes
- G09B23/06—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes for physics
- G09B23/22—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes for physics for optics
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
Abstract
The invention discloses an experimental device for measuring a solid refractive index. Transmitting a light beam emitted by the semiconductor laser to a flaky solid sample through a polaroid, and converting the generated reflected light on the elongated flexible solar cell into a voltage signal to be output; the sample is placed on a rotary disk of a cylindrical test cavity to change the incident angle of an optical beam, and a rotary encoder connected below the rotary disk outputs angle information, so that the refractive index of a solid can be measured, the Fresnel law can be verified and the like by matching with an analytical instrument, and the experiment can be carried out in a bright room.
Description
Technical Field
The invention belongs to a teaching experiment device, in particular to a solid refractive index measurement experiment device in a physical experiment of a college and universities, and can verify a Fresnel law.
Background
Light waves are reflected and refracted when passing through the interfaces between two homogeneous media, and at any moment, the electric vectors of the incident and reflected waves can be divided into two vectors, one parallel to the incident plane (denoted by P) and one perpendicular to the incident plane (denoted by S), according to fresnel' S law, in the form of propagation from the optically thinner medium to the optically denser medium: the reflection intensity of the P light gradually decreases with the increase of the incident angle, and the phenomenon that the reflection intensity tends to zero (the light intensity is minimum in practical experiments) appears at a certain angle, which is the brewster angle, and the reflection intensity rapidly shows enhancement once the increase of the incident angle exceeds the brewster angle. If the media are different, the curve of the reflection intensity versus the incident angle is different.
According to the fresnel law, the calculation of the refractive index is done by the following formula:
n2＝tgθB
in order to verify the fresnel law and measure the refractive index of the solid, the changing incident angle needs to be recorded, and the light intensity of the reflected light needs to be tracked and measured at the same time, so that the change curve of the reflection intensity and the incident angle can be obtained, the corresponding angle when the light intensity is minimum is measured, and then the refractive index is measured (if the polaroid rotates 90 degrees, P or S can be observed).
However, in the existing experimental device, the rocker arm provided with the photoelectric converter is arranged at the edge of the sample turntable, and when one incident angle is changed, the rocker arm needs to be rotated back and forth to find the angle at which the light intensity of the reflected light is maximum. The error is large, and the method is inconvenient and needs to be carried out in a dark room.
Disclosure of Invention
The invention aims to provide a solid refractive index measurement experimental device aiming at the defects of the prior art.
The purpose of the invention is realized by the following technical scheme: a solid refractive index measurement experimental device comprises a base, a semiconductor laser, a mounting seat, a rotary encoder, a vertical cylinder, a cylindrical test cavity, a rotary handle, a sample iron seat and an analytical instrument; the vertical cylinder is installed on the base, the test cavity is installed at the upper end of the vertical cylinder, and the flexible solar cell is attached to the inner side wall of the test cavity. The laser hole is formed in the side wall of the test cavity, the front end of the mounting seat is connected with the laser hole, the semiconductor laser is fixedly connected with the rear end of the mounting seat, and the polaroid is mounted in the mounting seat. A turntable and a rotating gear are arranged in the test cavity, the rotating gear is embedded in a chassis of the test cavity, the turntable is of an inverted frustum structure and is coaxially arranged with the chassis, and a gear structure meshed with the rotating gear is arranged on the side surface of the lower part of the turntable;
the rotary handle is arranged on the lower end surface of the chassis and is connected with the rotary gear through a round rod; the rotary encoder is fixed in the vertical cylinder, and a measuring shaft of the rotary encoder penetrates through the base plate and is connected with a central shaft of the rotary table. The sample iron seat is positioned on the rotary table, and a sample to be detected loaded on the sample iron seat and the diameter of the rotary table are positioned in the same vertical plane; laser emitted by the semiconductor laser passes through the polarizing film, then penetrates through the laser hole to be emitted to a test sample fixed on the sample iron base, and is reflected to the flexible solar cell by the test sample. The rotary encoder and the flexible solar cell are connected with an analyzer; the analyzer collects the output voltage of the flexible solar cell, obtains the illumination intensity of reflected light, and obtains the reflection angle of the laser relative to the test sample through the rotary encoder.
Further, the polarizing plate in the mount may be rotated.
Furthermore, the mounting seat is provided with a circumferential groove, and a polaroid rotating handle connected with the polaroid is mounted in the groove.
Furthermore, the turntable is engraved with a position mark of the sample iron seat, so that a sample to be measured loaded on the sample iron seat and the diameter of the turntable are positioned in the same vertical plane.
Further, the position mark is a cross line taking the circle center of the turntable as a central point, or a frame line tangent to the diameter of the turntable.
Due to the adoption of the technical scheme, the invention has the following beneficial effects:
1. by adopting the long-strip flexible solar cell and the rotary encoder, the maximum value and the reflection angle of the reflection signal can be accurately measured without using a rocker arm.
2. The incident angle can be continuously changed, the reflected signal and the angle can be synchronously output to an analysis instrument, the refractive index of the solid can be measured, the Fresnel law can be verified, and the like.
3. The device is not influenced by external stray light, and can be used for laboratory experiments to reduce errors.
Drawings
FIG. 1 is a diagram of an embodiment of the present invention;
FIG. 2 is a schematic view of the structure;
FIG. 3 is a schematic diagram of a cylindrical test chamber structure
In the figure: the device comprises a base 1, a semiconductor laser 2, a mounting seat 3, a socket 4, a test sample 5, a sample iron seat 6, a flexible solar cell 7, a rotary table 8, a test cavity 9, a chassis 10, a rotary handle 11, a rotary encoder 12, a vertical cylinder 13, a rotary gear 14, a top cover 15, an analyzer 16, a polaroid rotary handle 17 and a frame line 18.
Detailed Description
The invention is described in further detail below with reference to the following figures and embodiments:
as shown in fig. 1 and fig. 2, an experimental apparatus for measuring a solid refractive index includes a base 1, a semiconductor laser 2, a mounting base 3, a rotary encoder 12, a vertical cylinder 13, a cylindrical test chamber 9, a rotary handle 11, a sample iron base 6, and an analyzer 16;
the vertical cylinder 13 is installed on the base 1, the test chamber 9 is installed at the upper end of the vertical cylinder 13, and the inner side wall of the test chamber 9 is pasted with the flexible solar cell 7. The test chamber 9 comprises chassis, lateral wall and top cap 15 inclosed test cavity, can be in the bright room experiment, and wherein, the lateral wall is opened there is the laser hole, mount pad 3 is installed in the laser hole department of test chamber lateral wall, and semiconductor laser 2 and mount pad 3 fixed connection lay in the mount pad 3 can pivoted polaroid, through adjusting polaroid polarization direction, can survey P or S curve.
As shown in fig. 3, a turntable 8 and a rotary gear 14 are installed in the test chamber 9, the rotary gear 14 is embedded in a chassis 10 of the test chamber 9, the turntable 8 is of an inverted circular truncated cone structure, is installed coaxially with the chassis 10, and is embedded in the upper portion of the chassis 10, and a gear structure meshed with the rotary gear 14 is arranged on the side surface of the lower portion of the turntable 8;
the rotating handle 11 is arranged on the lower end face of the chassis 10 and is connected with the rotating gear 14 through a round rod; the rotary encoder 12 is fixed in the vertical cylinder 13, and a measuring shaft thereof penetrates through the chassis 10 and is connected with the rotating disc 8. The turntable 8 is rotatable by means of a rotary handle 11, the angle of rotation of which is read by means of a rotary encoder 12.
The sample 5 to be measured is vertically adhered, adsorbed or mechanically fixed on the side surface of the sample iron seat 6, the sample iron seat 6 is placed on the turntable 8, and the position mark of the sample iron seat 6 is arranged on the turntable 8, so that as shown in fig. 2, the diameters of the sample 5 to be measured and the turntable 8 are positioned in the same vertical plane after the sample is placed in each time, and thus, the incident optical path and the reflection optical path are consistent and are both the radius of a wall body, and the calculation is convenient; the position mark is a cross line with the center of the turntable 8 as the center point, or may be a frame line as shown in fig. 2, and one side of the frame line coincides with the diameter of the turntable 8.
Laser emitted by the semiconductor laser 2 passes through the polarizing film, then penetrates through the laser hole to be emitted onto the surface of the test sample 5, and is reflected to the flexible solar cell 7 through the test sample 5. The turntable 8 is rotated by the rotating handle 11, the test sample 5 placed on the turntable rotates along with the turntable, namely, the incident angle of light is changed, and the reflected light is irradiated to the flexible solar cell.
The rotary encoder 12 and the flexible solar cell 7 are respectively connected with an analyzer 16; in the figure, a flexible solar cell 7 is connected with an analyzer 16 through a socket 4 connected to a side wall, an output line of a rotary encoder 12 is connected with the analyzer 16, the analyzer 16 collects output voltage of the flexible solar cell 7 to obtain illumination intensity of reflected light, and a reflection angle of laser relative to a test sample 5 is obtained through the rotary encoder 12. By performing the measurement, the angle corresponding to the minimum light intensity is obtained, and the refractive index of the test sample 5 is obtained. In the figure, the semiconductor laser 2 is powered by an analyzer 16.
In the present invention, the mounting base 3 for rotating the polarizer is a common product in the art, for example, the mounting base 3 is provided with a circumferential groove, the circumferential angle of the groove is 90 °, and the polarizer stem 17 connected to the polarizer is installed in the groove. The polarization direction of the polarizer can be adjusted by dialing the polarizer rotating handle 17.
Finally, it is also noted that the above-mentioned list is only one specific embodiment of the present invention. Obviously, many modifications may be made to the invention, and all modifications which would be apparent to a person skilled in the art from the disclosure herein are to be considered within the scope of the invention.
Claims (5)
1. The utility model provides a solid refractive index measurement experimental apparatus which characterized in that: the device comprises a base (1), a semiconductor laser (2), a mounting seat (3), a rotary encoder (12), a vertical cylinder (13), a cylindrical test cavity (9), a rotary handle (11), a sample iron seat (6) and an analyzer (16); the vertical cylinder (13) is arranged on the base (1), the test cavity (9) is arranged at the upper end of the vertical cylinder (13), a strip-shaped flexible solar cell (7) is stuck on the inner side wall of the test cavity (9), the test cavity (9) is a closed test cavity body formed by a chassis, a side wall and a top cover (15), can be used for laboratory experiments, the side wall of the test cavity (9) is provided with a laser hole, the front end of the mounting seat (3) is connected with the laser hole, the semiconductor laser (2) is fixedly connected with the rear end of the mounting seat (3), the mounting seat (3) is internally provided with a polaroid, the test cavity (9) is internally provided with a turntable (8) and a rotating gear (14), the rotating gear (14) is embedded in a chassis (10) of the test cavity (9), the turntable (8) is of an inverted frustum structure, the gear structure is coaxially arranged with the chassis (10), and the side surface of the lower part of the gear structure is meshed with the rotating gear (14);
the rotating handle (11) is arranged on the lower end surface of the chassis (10) and is connected with the rotating gear (14) through a round rod; the rotary encoder (12) is fixed in the vertical cylinder (13), a measuring shaft of the rotary encoder penetrates through the chassis (10) and is connected with a central shaft of the turntable (8), the sample iron seat (6) is positioned on the turntable (8), the diameters of the test sample (5) loaded on the sample iron seat (6) and the turntable (8) are positioned in the same vertical plane, and the incident optical path and the reflection optical path are the same and are the radiuses of the test cavity 9; laser emitted by the semiconductor laser (2) passes through the polarizing film and then penetrates through the laser hole to enter a test sample (5) fixed on a sample iron seat (6), the laser is reflected to a flexible solar cell (7) through the test sample (5), the rotating disc (8) is rotated through the rotating handle (11), the test sample (5) placed on the rotating disc rotates along with the rotating disc, namely, the incident angle of the light is changed, and the reflected light irradiates the flexible solar cell; the rotary encoder (12) and the flexible solar cell (7) are connected with an analyzer (16); the analyzer (16) collects the output voltage of the flexible solar cell (7), obtains the illumination intensity of reflected light, and obtains the reflection angle of laser relative to the test sample (5) through the rotary encoder (12);
the angle of incidence can be continuously changed without using a rocker arm, and the reflected signal and the angle can be synchronously output to an analytical instrument to measure the refractive index of the solid.
2. A laboratory device according to claim 1, characterized in that the polarizer in the mounting cup (3) is rotatable.
3. The experimental device according to claim 2, characterized in that the mounting base (3) is provided with a circumferential groove, and a polaroid rotating handle (17) connected with the polaroid is mounted in the groove.
4. The experimental device according to claim 1, characterized in that the turntable (8) is engraved with a position mark of the sample iron seat (6) so that the test sample (5) loaded on the sample iron seat (6) is in the same vertical plane with the diameter of the turntable (8).
5. Laboratory device according to claim 4, characterized in that the position indication is a cross line with the center of the turntable (8) as center point or a frame line tangent to the diameter of the turntable (8).
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| CN201710452496.XA CN107256668B (en) | 2017-06-15 | 2017-06-15 | Experimental device for solid refractive index measurement |
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| CN201710452496.XA CN107256668B (en) | 2017-06-15 | 2017-06-15 | Experimental device for solid refractive index measurement |
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| CN107256668A CN107256668A (en) | 2017-10-17 |
| CN107256668B true CN107256668B (en) | 2022-06-17 |
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| CN107782698B (en) * | 2017-11-16 | 2024-04-12 | 鞍山师范学院 | Experimental method and device for measuring refractive index based on Fresnel formula |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102589452A (en) * | 2012-01-17 | 2012-07-18 | 华南师范大学 | Method and device for measuring thickness and refractive index of thin film |
| CN204405543U (en) * | 2014-11-04 | 2015-06-17 | 湖南科技大学 | Rotary Variable multi-angle laser light scattering instrument |
| CN106662519A (en) * | 2014-08-20 | 2017-05-10 | 研究三角协会 | Devices, systems and methods for detecting particles |
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| DE4312812C2 (en) * | 1993-04-20 | 2001-02-22 | Deutsche Telekom Ag | Method and arrangement for determining the end point of silylation processes of exposed paints for masking |
| CN101799413B (en) * | 2010-03-05 | 2011-07-06 | 陕西师范大学 | Experimental apparatus for measuring refractive indexes of liquid and measuring method thereof |
| CN202421066U (en) * | 2012-01-19 | 2012-09-05 | 杨立荣 | Refractive index measuring instrument |
| CN102749303B (en) * | 2012-07-14 | 2016-06-29 | 浙江师范大学 | A kind of apparatus and method measuring refractive index of flat-plate type transparent medium |
| CN203572632U (en) * | 2013-05-16 | 2014-04-30 | 宁波大学 | Device for measuring optical parameters of dielectric film |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102589452A (en) * | 2012-01-17 | 2012-07-18 | 华南师范大学 | Method and device for measuring thickness and refractive index of thin film |
| CN106662519A (en) * | 2014-08-20 | 2017-05-10 | 研究三角协会 | Devices, systems and methods for detecting particles |
| CN204405543U (en) * | 2014-11-04 | 2015-06-17 | 湖南科技大学 | Rotary Variable multi-angle laser light scattering instrument |
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