CN107256668A - A kind of experimental provision of solid refractometry - Google Patents
A kind of experimental provision of solid refractometry Download PDFInfo
- Publication number
- CN107256668A CN107256668A CN201710452496.XA CN201710452496A CN107256668A CN 107256668 A CN107256668 A CN 107256668A CN 201710452496 A CN201710452496 A CN 201710452496A CN 107256668 A CN107256668 A CN 107256668A
- Authority
- CN
- China
- Prior art keywords
- rotating disk
- sample
- experimental provision
- polarizer
- seat
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
- G09B23/00—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes
- G09B23/06—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes for physics
- G09B23/22—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes for physics for optics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
Abstract
The invention discloses a kind of solid refractometry experimental provision.Semiconductor laser is sent Guang Bouquet to be mapped on chip solid sample through polarizer, the reflected light produced by it is penetrated is converted into voltage signal output on flexible lengths solar cell；Sample is placed on Yi on the rotating disk of the test cavity of cylindrical shape and changes Guang Bouquet incidence angles, while the rotary encoder output angle information of rotating disk lower link, coordinates analytical instrument, it is possible to measures solid refractive index, checking Fresnel law etc., and can be tested in bright room.
Description
Technical field
The invention belongs to experiment device for teaching, more specifically, it belongs to a kind of solid folding in universities and colleges' Physical Experiment
Penetrate rate measurement experiment device, it is possible to verify Fresnel law.
Background technology
Reflection and refraction can occur when light wave is by both of which even dielectric interface, at any time, incidence wave and anti-
The electric vector of ejected wave may be divided into two vectors, and one (is represented) parallel to the plane of incidence with P, and one (is used S perpendicular to the plane of incidence
Represent), according to Fresnel law, in the mode of propagation from optically thinner medium to optically denser medium：The reflected intensity of P light is before this with entering
The increase of firing angle and be gradually reduced, occur that become zero phenomenon of reflective light intensity (shows as light during actual experiment during to a certain angle
It is strong minimum), and the angle is exactly Brewster angle, once incidence angle increases above Brewster angle, reflective light intensity is just rapid
Enhancing is presented.If medium is different, reflected intensity is different from the change curve of incidence angle.
According to Fresnel law, the calculating of refractive index is completed by below equation：
n2=tg θB
It is checking Fresnel law and measurement solid refractive index, it is necessary to record changing incidence angle, and track simultaneously
The light intensity of reflected light is measured, the change curve of reflected intensity and incidence angle could be obtained, corresponding angle when measuring light intensity minimum,
And then measure refractive index (if polarizer is rotated by 90 ° observable P or S).
But existing experimental provision is to install the rocking arm equipped with optical-electrical converter at sample rotary table edge, changes an incidence
Angle, angle during with regard to reflected light light intensity maximum need to be looked for turn round rocking arm.Error is big, and very inconvenient, must also be tested in darkroom.
The content of the invention
In view of the above-mentioned deficiencies in the prior art, it is an object of the present invention to provide a kind of solid refractometry experimental provision.
The purpose of the present invention is to be achieved by the following technical programs：A kind of solid refractometry experimental provision, bag
Include base, semiconductor laser, mounting seat, rotary encoder, vertical tube, cylindric test cavity, rotary handle, sample iron seat,
Analytical instrument；The vertical tube is arranged on base, and the test cavity is arranged on vertical tube upper end, and the experiment chamber inner sidewall posts soft
Property solar battery sheet.Test cavity side wall is provided with laser hole, and the mounting seat front end is connected with laser hole, semiconductor laser
Device is fixedly connected with installing base rear end, and polarizer is provided with mounting seat.Rotating disk and swing pinion are installed in test cavity, it is described
Swing pinion is embedded in the chassis of test cavity, and the rotating disk is inverted round stage structure, is co-axially mounted with chassis, the side of bottom has
With the swing pinion meshed gears structure；
Rotary handle is arranged on the lower surface on chassis, is connected by round bar with swing pinion；The rotary encoder is fixed
In vertical tube, it measures axle and passes through chassis, is connected with disk middle spindle.The sample iron seat is located on rotating disk, is carried on sample
Testing sample on iron seat is located in same perpendicular with disk diameter；The laser of semiconductor laser is through polarizer
Afterwards, it is injected into through laser hole in the test sample being fixed on sample iron seat, sample reflexes to flexible solar electricity after tested
Pond piece.Rotary encoder and the flexible solar battery piece is connected with analyzer；Analyzer gathers flexible solar battery piece
Output voltage, obtain reflected light intensity of illumination, by rotary encoder obtain laser relative to test sample angle of reflection
Degree.
Further, the polarizer in mounting seat is rotatable.
Further, the mounting seat drives the polarizer turning handle for being provided with and being connected with the polarizer in circumferential groove, groove.
Further, the station location marker of sample iron seat is carved with the rotating disk so that be carried on to be measured on sample iron seat
Sample is located in same perpendicular with disk diameter.
Further, the station location marker is the cross hairs put centered on the rotating disk center of circle, or is tangent with disk diameter
Wire.
Due to using above-mentioned technical proposal, the invention has the advantages that：
1. using flexible lengths solar cell and rotary encoder, it is not required to use rocking arm, so that it may accurate to measure reflection letter
Number maximum and reflection angle.
2. can consecutive variations incidence angle, synchronism output reflected signal and angle supply analytical instrument, measurement solid refractive index, tests
Demonstrate,prove Fresnel law etc..
It 3. not influenceed by external stray light, can be tested in bright room, reduce error.
Brief description of the drawings
Fig. 1 is figure of the embodiment of the present invention；
Fig. 2 is principle schematic diagram；
Fig. 3 is cylindric test cavity structural representation
In figure：Base 1, semiconductor laser 2, mounting seat 3, socket 4, test sample 5, sample iron seat 6, flexible solar
Cell piece 7, rotating disk 8, test cavity 9, chassis 10, rotary handle 11, rotary encoder 12, vertical tube 13, swing pinion 14, top cover
15th, analyzer 16, polarizer turning handle 17, wire 18.
Embodiment
The present invention is described in further detail with embodiment below in conjunction with the accompanying drawings：
As depicted in figs. 1 and 2, a kind of solid refractometry experimental provision, including base 1, semiconductor laser 2, peace
Fill seat 3, rotary encoder 12, vertical tube 13, cylindric test cavity 9, rotary handle 11, sample iron seat 6, analyzer 16；
The vertical tube 13 is arranged on base 1, and the test cavity 9 is arranged on the upper end of vertical tube 13, the madial wall of test cavity 9
Post flexible solar battery piece 7.The test cavity 9 is made up of closed test cavity chassis, side wall and top cover 15, can be
Bright room experiment, wherein, side wall is provided with laser hole, and the mounting seat 3 is installed at the laser hole of test cavity side wall, semiconductor laser
Device 2 is fixedly connected with mounting seat 3, and rotary polarizer is laid in mounting seat 3, by adjusting polarizer polarization direction,
Observable P or S curve.
As shown in figure 3, being provided with rotating disk 8 and swing pinion 14 in test cavity 9, the swing pinion 14 is embedded in test cavity 9
Chassis 10 in, the rotating disk 8 be inverted round stage structure, be co-axially mounted with chassis 10, be embedded in the top of chassis 10, the bottom of rotating disk 8
Side has and the meshed gears structure of swing pinion 14；
Rotary handle 11 is arranged on the lower surface on chassis 10, is connected by round bar with swing pinion 14；The rotary coding
Device 12 is fixed in vertical tube 13, and it measures axle and passes through chassis 10, is connected with rotating disk 8.By the rotatable rotary table 8 of rotary handle 11,
Its anglec of rotation is read by rotary encoder 12.
The side of sample iron seat 6 is pasted, adsorbs or be mechanically anchored in the testing sample 5 vertically, and sample iron seat 6, which is placed on, to be turned
On disk 8, can by setting the station location marker of sample iron seat 6 on rotating disk 8, as shown in Figure 2, it is ensured that be put into every time after sample,
Testing sample 5 is located in same perpendicular with the diameter of rotating disk 8, this ensures that incident light path is consistent with reflection light path, all
For the radius of wall, it is easy to calculate；Station location marker is the cross hairs put centered on the center of circle of rotating disk 8, or as shown in Figure 2
Wire, one side of wire is overlapped with the diameter of rotating disk 8.
The laser that semiconductor laser 2 is launched is incident upon on the face of test sample 5, after tested after polarizer through laser hole
Sample 5 reflexes to flexible solar battery piece 7.By the rotary turnplate 8 of rotary handle 11, place superincumbent test sample 5 with
Rotation, namely change the incidence angle of light, reflected light is incident upon on flexible solar battery.
The rotary encoder 12 and flexible solar battery piece 7 are connected with analyzer 16 respectively；In figure, flexible solar
Cell piece 7 is connected by the socket 4 being connected on the wall of side with analyzer 16, lead-out wire and the phase of analyzer 16 of rotary encoder 12
Even, the output voltage of the collection flexible solar battery of analyzer 16 piece 7, obtains the intensity of illumination of reflected light, passes through rotary coding
Device 12 obtains reflection angle of the laser relative to test sample 5.By implementing measurement, corresponding angle when obtaining light intensity minimum,
And then obtain the refractive index of test sample 5.In figure, semiconductor laser 2 is powered by analyzer 16.
It should be noted that in the present invention, the mounting seat 3 of polarizer rotation can be caused to belong to the general production of this area
Product, for example, mounting seat 3 opens circumferential groove, the corresponding angle of circumference of groove is 90 °, and be connected with the polarizer inclined is provided with groove
Shake piece turning handle 17.By stirring polarizer turning handle 17, you can adjustment polarizer polarization direction.
Finally, it is also noted that, listed above is only the specific embodiment of the present invention.Obviously, the present invention is gone back
There can be many deformations, it is all that one of ordinary skill in the art directly can export or associate from present disclosure
Deformation, is considered as protection scope of the present invention.
Claims (5)
1. a kind of solid refractometry experimental provision, it is characterised in that：Including base (1), semiconductor laser (2), install
Seat (3), rotary encoder (12), vertical tube (13), cylindric test cavity (9), rotary handle (11), sample iron seat (6), analysis
Instrument (16)；The vertical tube (13) is arranged on base (1), and the test cavity (9) is arranged on vertical tube (13) upper end, the experiment
Chamber (9) madial wall posts flexible solar battery piece (7).Test cavity (9) side wall is provided with laser hole, the mounting seat (3)
Front end is connected with laser hole, and semiconductor laser (2) is fixedly connected with mounting seat (3) rear end, and polarization is provided with mounting seat (3)
Piece.Rotating disk (8) and swing pinion (14) are installed in test cavity (9), the swing pinion (14) is embedded in the chassis of test cavity (9)
(10) in, the rotating disk (8) is inverted round stage structure, is co-axially mounted with chassis (10), and the side of bottom has and the rotary teeth
Take turns (14) meshed gears structure；
Rotary handle (11) is arranged on the lower surface of chassis (10), is connected by round bar with swing pinion (14)；The rotation is compiled
Code device (12) is fixed in vertical tube (13), and it measures axle and passes through chassis (10), is connected with rotating disk (8) central shaft.The sample iron
Seat (6) is located on rotating disk (8), and it is same vertical that the testing sample (5) being carried on sample iron seat (6) is located at rotating disk (8) diameter
In plane；The laser of semiconductor laser (2) transmitting is injected into through laser hole after polarizer and is fixed on sample iron seat (6)
On test sample (5) on, sample (5) reflexes to flexible solar battery piece (7) after tested.The rotary encoder (12) and
Flexible solar battery piece (7) is connected with analyzer (16)；The output electricity of analyzer (16) collection flexible solar battery piece (7)
Pressure, obtains the intensity of illumination of reflected light, and angle of reflection of the laser relative to test sample (5) is obtained by rotary encoder (12)
Degree.
2. experimental provision according to claim 1, it is characterised in that the polarizer in mounting seat (3) is rotatable.
3. experimental provision according to claim 2, it is characterised in that the mounting seat (3) is opened in circumferential groove, groove and installed
There is the polarizer turning handle (17) being connected with the polarizer.
4. experimental provision according to claim 1, it is characterised in that the position of sample iron seat (6) is carved with the rotating disk (8)
Put mark so that be carried on the testing sample (5) on sample iron seat (6) and be located at rotating disk (8) diameter in same perpendicular.
5. experimental provision according to claim 4, it is characterised in that the station location marker be using rotating disk (8) center of circle in
The cross hairs of heart point, or be the wire tangent with rotating disk (8) diameter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710452496.XA CN107256668B (en) | 2017-06-15 | 2017-06-15 | Experimental device for solid refractive index measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710452496.XA CN107256668B (en) | 2017-06-15 | 2017-06-15 | Experimental device for solid refractive index measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107256668A true CN107256668A (en) | 2017-10-17 |
| CN107256668B CN107256668B (en) | 2022-06-17 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710452496.XA Active CN107256668B (en) | 2017-06-15 | 2017-06-15 | Experimental device for solid refractive index measurement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107256668B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107782698A (en) * | 2017-11-16 | 2018-03-09 | 鞍山师范学院 | Experimental method and device based on fresnel formula measurement refractive index |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4312812A1 (en) * | 1993-04-20 | 1994-10-27 | Deutsche Bundespost Telekom | Process and arrangement for determining the end point of silylation processes of exposed varnishes for masks |
| CN101799413A (en) * | 2010-03-05 | 2010-08-11 | 陕西师范大学 | Experimental apparatus for measuring refractive indexes of liquid and measuring method thereof |
| CN102589452A (en) * | 2012-01-17 | 2012-07-18 | 华南师范大学 | Method and device for measuring thickness and refractive index of thin film |
| CN202421066U (en) * | 2012-01-19 | 2012-09-05 | 杨立荣 | Refractive index measuring instrument |
| CN102749303A (en) * | 2012-07-14 | 2012-10-24 | 浙江师范大学 | Device and method for measuring refractive index of flat plate type transparent medium |
| CN203572632U (en) * | 2013-05-16 | 2014-04-30 | 宁波大学 | Device for measuring optical parameters of dielectric film |
| CN204405543U (en) * | 2014-11-04 | 2015-06-17 | 湖南科技大学 | Rotary Variable multi-angle laser light scattering instrument |
| CN106662519A (en) * | 2014-08-20 | 2017-05-10 | 研究三角协会 | Devices, systems and methods for detecting particles |
-
2017
- 2017-06-15 CN CN201710452496.XA patent/CN107256668B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4312812A1 (en) * | 1993-04-20 | 1994-10-27 | Deutsche Bundespost Telekom | Process and arrangement for determining the end point of silylation processes of exposed varnishes for masks |
| CN101799413A (en) * | 2010-03-05 | 2010-08-11 | 陕西师范大学 | Experimental apparatus for measuring refractive indexes of liquid and measuring method thereof |
| CN102589452A (en) * | 2012-01-17 | 2012-07-18 | 华南师范大学 | Method and device for measuring thickness and refractive index of thin film |
| CN202421066U (en) * | 2012-01-19 | 2012-09-05 | 杨立荣 | Refractive index measuring instrument |
| CN102749303A (en) * | 2012-07-14 | 2012-10-24 | 浙江师范大学 | Device and method for measuring refractive index of flat plate type transparent medium |
| CN203572632U (en) * | 2013-05-16 | 2014-04-30 | 宁波大学 | Device for measuring optical parameters of dielectric film |
| CN106662519A (en) * | 2014-08-20 | 2017-05-10 | 研究三角协会 | Devices, systems and methods for detecting particles |
| CN204405543U (en) * | 2014-11-04 | 2015-06-17 | 湖南科技大学 | Rotary Variable multi-angle laser light scattering instrument |
Non-Patent Citations (1)
| Title |
|---|
| 陈文钦，彭玉霞: "《大学物理实验》", 28 February 2009 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107782698A (en) * | 2017-11-16 | 2018-03-09 | 鞍山师范学院 | Experimental method and device based on fresnel formula measurement refractive index |
| CN107782698B (en) * | 2017-11-16 | 2024-04-12 | 鞍山师范学院 | Experimental method and device for measuring refractive index based on Fresnel formula |
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| Publication number | Publication date |
|---|---|
| CN107256668B (en) | 2022-06-17 |
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