CN114518342A - Device and method for detecting transmittance of film polaroid - Google Patents
Device and method for detecting transmittance of film polaroid Download PDFInfo
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- CN114518342A CN114518342A CN202210158218.4A CN202210158218A CN114518342A CN 114518342 A CN114518342 A CN 114518342A CN 202210158218 A CN202210158218 A CN 202210158218A CN 114518342 A CN114518342 A CN 114518342A
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
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- G—PHYSICS
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract
A detection device for the transmittance of a film polaroid belongs to the technical field of laser, and the specific scheme is as follows: the utility model provides a detection apparatus for film polaroid transmissivity, including the test light source, the polarization cube, the revolving stage, the mount pad, convex lens and power meter, the mount pad is fixed to be set up on the revolving stage and both center coincidences, the film polaroid setting that awaits measuring is on the mount pad and both center coincidences, the light that the test light source sent passes the polarization cube, incide to the center of the film polaroid that awaits measuring, through the film polaroid reflection that awaits measuring to the center of convex lens, then reach the power meter, the distance at the center of convex lens and the center of revolving stage and the distance between the center of convex lens and the power meter are 2 f. The detection device can ensure that reflected light can be always stably incident to the center of the probe of the power meter when the film polaroid is rotated near the Brewster angle, so that the test error caused by repeated movement of the position of the power meter in the test process is avoided, and the measurement accuracy is ensured.
Description
Technical Field
The invention belongs to the technical field of laser, and particularly relates to a device and a method for detecting the transmittance of a film polaroid.
Background
The thin film polarizer is one of optical polarizers, and utilizes an interference effect of a multilayer dielectric film to obtain polarized light. When an optical film is coated on a material such as glass, the film polarizer will allow s-polarized light to be reflected and p-polarized light to be transmitted when the film is incident at certain specific angles. The angle of incidence is typically designed to be at the brewster angle so that reflection losses of transmitted light back-facing are avoided. YAG laser, and the transmittance of p-polarized light is an important parameter to be considered when designing the Q-switched laser, so that it is critical to accurately obtain the p-transmittance of the thin film polarizer. Although the polarizer is provided with a detection report by a manufacturer in the factory, it is necessary for a user to perform retesting or retesting before use.
The transmittance of a thin film polarizer is generally measured by the "transmission method" in which incident light is incident on the polarizer at an angle of approximately brewster, and then p-ray transmission power and an incident power value are recorded separately by a power meter, and the ratio is regarded as the transmittance of the polarizer. Although the method is simple and direct, the transmittance test result is very inaccurate due to the fact that the light transmission power is very close to the incident light power and the reading fluctuation during the measurement of the power meter. Although the transmittance can also be obtained by measuring the reflectance, since the reflected power is related to the incident angle of the incident light, the reflected power is greatly different due to different incident angles; in addition, the reflection direction of the reflected light is changed while the incident angle is adjusted, so that the position of the probe of the power meter needs to be adjusted continuously, inconvenience is brought to the test, an additional measurement error is brought, and the test result is inaccurate. The invention provides a device and a method for detecting the transmittance of a film polaroid, which are used for obtaining the transmittance of the polaroid by measuring the reflectivity, and simultaneously, reflected light can be always stably incident into a probe of a power meter in the process of adjusting the incident angle, so that the accuracy of a test result is ensured.
Disclosure of Invention
The invention provides a device for detecting the transmittance of a film polarizer, aiming at solving the problem that the transmittance of the film polarizer in the prior art cannot be accurately tested.
The second purpose of the invention is to provide a method for detecting the transmittance of the thin film polaroid.
In order to achieve the purpose, the invention adopts the following technical scheme:
the utility model provides a detection apparatus for film polaroid transmissivity, includes test light source, polarization cube, revolving stage, mount pad, convex lens and power meter, the mount pad is fixed to be set up on the revolving stage and both center coincidences, and the film polaroid setting that awaits measuring is on the mount pad and both center coincidences, the light that the test light source sent passes the polarization cube, incides to the center of the film polaroid that awaits measuring, and through the film polaroid that awaits measuring reflection to convex lens's center, then reachs the power meter, the contained angle alpha between the light that the test light source sent and the film polaroid place plane that awaits measuring is 33 +/-1, the focus of convex lens is f, the distance at the center of convex lens and the center of revolving stage and the distance between the center of convex lens and the power meter are 2 f.
Further, the clear aperture of the convex lens is not less than 4f tan theta, wherein theta is an included angle between a connecting line between the center of the rotating table and the center of the convex lens and a connecting line between the center of the rotating table and an edge point of the convex lens.
Furthermore, antireflection films corresponding to the working wavelength of the thin film polarizer to be detected are plated on two surfaces of the convex lens.
Furthermore, the transmittance of the antireflection film is greater than 99.9%.
Furthermore, the inner wall of the probe of the power meter is coated with an integrating sphere made of white diffuse reflection materials.
Further, the rotation angle resolution of the rotating platform is greater than 0.1 °.
The method for detecting the transmittance of the thin film polarizer by using the detection device comprises the following steps:
fixing a mounting base at the rotation center of a rotating table, and arranging a film polaroid to be tested at the center of the mounting base;
placing the test light source, enabling the light emitted by the test light source to be incident to the center of the film polaroid to be tested, and rotating the rotating table to enable the included angle alpha between the light emitted by the test light source and the plane of the film polaroid to be tested to be 33 +/-1 degrees;
placing a polarizing cube and a convex lens, so that light emitted by the test light source sequentially passes through the centers of the polarizing cube, the film polaroid to be tested and the convex lens;
step four, adjusting the position of the convex lens to enable the distance between the center of the convex lens and the center of the rotating table to be 2 f;
step five, testing the optical power P1 after passing through the polarization cube by using a power meter, and then moving the power meter to a position 2f away from the center of the convex lens to enable the light rays passing through the convex lens to be incident to the center of a probe of the power meter;
Step six, rotating the rotating platform clockwise and anticlockwise respectively, wherein the rotating angle is smaller than +/-10 degrees, and recording the minimum power value P2 collected by the power meter in the rotating process;
and seventhly, calculating the P light transmittance of the film polarizer to be measured by using the formula T-1-P2/P1.
Further, in the fifth step, before the optical power P1 is tested by using the power meter, the current of the test light source is adjusted so that the output power is 1-1.2W.
Further, in the fifth step, after the optical power P1 is tested by the power meter, the measurement range of the power meter is adjusted to the mW range.
Furthermore, the output wavelength of the test light source is the working wavelength of the film polaroid to be tested, and the beam quality is less than 2.
Compared with the prior art, the invention has the beneficial effects that:
the detection device is used for measuring the reflection power of the film polaroid so as to obtain the transmittance of the polaroid, and compared with the existing method for testing the transmission power, the transmittance measurement accuracy of the polaroid is greatly improved; meanwhile, in the detection device, the distance between the center of the convex lens and the center of the rotating platform and the distance between the center of the convex lens and the power meter are both 2f, so that when the thin film polaroid rotates near the Brewster angle, reflected light can be always stably incident to the center of the probe of the power meter, the position of the probe of the power meter does not need to be adjusted constantly, additional measurement errors are avoided, and the measurement accuracy is improved again. The invention has the advantages of simple testing device and accurate testing result, and can be used for accurately detecting the transmittance of the film polaroid.
Drawings
FIG. 1 shows an apparatus for detecting the transmittance of a thin film polarizer according to the present invention.
In the figure, 1, a test light source, 2, a polarization cube, 3, a rotating table, 4, a mounting seat, 5, a convex lens, 6 and a power meter.
Detailed Description
The technical solutions of the present invention are further described below with reference to the drawings, but the present invention is not limited thereto, and any modifications or equivalent substitutions may be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention.
Detailed description of the invention
The utility model provides a detection apparatus for film polaroid transmissivity, includes test light source 1, polarization cube 2, revolving stage 3, mount pad 4, convex lens 5 and power meter 6, mount pad 4 is fixed to be set up on revolving stage 3 and both center coincidences, and the film polaroid setting that awaits measuring is on mount pad 4 and both center coincidences, the light that test light source 1 sent passes polarization cube 2, incides to the film polaroid that awaits measuring, and through the film polaroid that awaits measuring reflection to convex lens 5's center, then reachs power meter 6, the light that test light source 1 sent and the contained angle alpha that awaits measuring between the film polaroid place plane are 33 + -1, convex lens 5's focus is f, the distance at the center of convex lens 5 and revolving stage 3's center and the distance between convex lens 5's center and the power meter 6 are 2 f. The particular arrangement of the elements is shown in fig. 1, and the polarizing cube is used to obtain p-polarized light of the test light source 1. The specific appearance structure of the mounting seat 4 is designed according to the shape of the film polaroid to be tested.
Furthermore, the clear aperture of the convex lens 5 is not less than 4f tan θ, so as to prevent the reflected light from reaching the outside of the convex lens 5 when the thin film polarizer to be measured rotates, where θ is an included angle between a connection line between the rotation center O of the turntable 3 and the center of the convex lens 5 and a connection line between the rotation center O of the turntable 3 and an edge point of the convex lens 5.
Furthermore, antireflection films corresponding to the working wavelength of the thin film polarizer to be measured are plated on two surfaces of the convex lens 5, the transmittance of the antireflection film is greater than 99.9%, and the antireflection film is used for reducing the loss of the convex lens 5 to the reflection power.
Furthermore, the inner wall of the probe of the power meter 6 is coated with an integrating sphere made of white diffuse reflection material, and the measuring range of mW is selected on the head of the meter.
Furthermore, the rotation angle resolution of the rotating platform 3 is greater than 0.1 degree, and the rotating platform can be rotated in an electric mode or a manual mode.
Detailed description of the invention
A method for detecting the transmittance of a thin film polarizer by using the detection device according to the first embodiment, comprising the following steps:
firstly, fixing a mounting seat 4 at the O point of the rotation center of the rotating platform 3, and then arranging a film polaroid to be tested at the center of the mounting seat 4;
Placing the test light source 1, opening the test light source, enabling light rays emitted by the test light source 1 to be incident to the center of the thin film polarizer to be tested, and rotating the rotating table 3 to enable an included angle alpha between the light rays emitted by the test light source 1 and the plane where the thin film polarizer to be tested is located to be 33 +/-1 degrees;
placing the polarizing cube 2 and the convex lens 5, and enabling light emitted by the test light source 1 to sequentially pass through the polarizing cube 2, the thin film polaroid to be tested and the center of the convex lens 5;
step four, adjusting the position of the convex lens 5 to enable the distance between the center of the convex lens 5 and the center of the rotating platform 3 to be 2 f;
step five, adjusting the measurement gear of the power meter 6 to a range of 10W, adjusting the current of the test light source 1 to make the output power of the test light source 1 be 1-1.2W, firstly testing the light power P1 (unit: milliwatt) passing through the polarization cube 2 by the power meter 6, then adjusting the measurement gear of the power meter 6 to a mW range, moving the power meter to a distance of 2f from the center of the convex lens 5, and making the light passing through the convex lens 5 incident to the probe center of the power meter 6;
step six, respectively rotating the rotating platform 3 clockwise and anticlockwise, wherein the rotating angle is less than +/-10 degrees, and recording the minimum power value P2 (unit: milliwatt) collected by the power meter 6 in the rotating process;
and seventhly, calculating the P light transmittance of the film polarizer to be measured by using the formula T-1-P2/P1.
Further, the output wavelength of the test light source 1 is the working wavelength of the film polarizer to be tested, and the beam quality is less than 2.
The core innovation points of the invention are as follows:
firstly, the transmittance of the film polaroid is tested by adopting a method for testing the reflection power, because the reflection power is smaller, the invention adopts a power meter with a milliwatt range, can accurately test the reflection power, and greatly improves the precision compared with a method for directly testing the passing power.
Secondly, when testing reflected power, because the polaroid needs the rotation angle that does not stop to find accurate brewster's angle, at this rotatory in-process, reflection light can remove, and this just need not stop to remove the power meter, and the round trip movement of power meter measures and probably can bring extra error. Because the power of milliwatt level is tested by the invention, the error caused by the back-and-forth movement of the power meter is very large, in order to solve the problems, the convex lens is introduced by the invention, and the distance between the center of the convex lens and the center of the rotating platform and the distance between the center of the convex lens and the power meter are limited to be 2f, so that the reflected light ray is always fixed in the moving process of the polaroid, therefore, the power meter can be always placed at one position, and the reflected light ray almost always strikes at the same position of the power meter, thereby greatly improving the measurement accuracy.
Claims (10)
1. A device for detecting the transmittance of a thin film polarizer, comprising a power meter (6), characterized in that: the detection device also comprises a test light source (1), a polarization cube (2), a rotating table (3), a mounting seat (4) and a convex lens (5), the mounting seat (4) is fixedly arranged on the rotating platform (3) and the centers of the mounting seat and the rotating platform coincide with each other, the film polaroid to be tested is arranged on the mounting seat (4) and the centers of the mounting seat and the rotating platform coincide with each other, the light emitted by the test light source (1) passes through the polarizing cube (2), enters the center of the film polaroid to be tested, is reflected to the center of the convex lens (5) by the film polaroid to be tested, then the light reaches a power meter (6), the included angle alpha between the light rays emitted by the test light source (1) and the plane of the film polaroid to be tested is 33 +/-1 degrees, the focal length of the convex lens (5) is f, and the distance between the center of the convex lens (5) and the center of the rotating platform (3) and the distance between the center of the convex lens (5) and the power meter (6) are both 2 f.
2. The apparatus for detecting the transmittance of a thin film polarizer according to claim 1, wherein: the clear aperture of the convex lens (5) is not less than 4f tan theta, wherein theta is an included angle between a connecting line between the center of the rotating table (3) and the center of the convex lens (5) and a connecting line between the center of the rotating table (3) and an edge point of the convex lens (5).
3. The apparatus for detecting the transmittance of a thin film polarizer according to claim 1, wherein: and two surfaces of the convex lens (5) are plated with antireflection films corresponding to the working wavelength of the film polarizer to be measured.
4. The apparatus for detecting the transmittance of a thin film polarizer according to claim 3, wherein: the transmittance of the antireflection film is more than 99.9%.
5. The apparatus for detecting the transmittance of a thin film polarizer according to claim 1, wherein: and the inner wall of the probe of the power meter (6) is coated with an integrating sphere made of a white diffuse reflection material.
6. The apparatus for detecting the transmittance of a thin film polarizer according to claim 1, wherein: the rotation angle resolution of the rotating platform (3) is larger than 0.1 degree.
7. A method for detecting the transmittance of a thin film polarizer by using the detecting unit according to any one of claims 1 to 6, comprising the steps of:
fixing a mounting seat (4) at the rotation center of a rotating table (3), and arranging a film polaroid to be tested at the center of the mounting seat (4);
placing the test light source (1), enabling the light emitted by the test light source to be incident to the center of the film polaroid to be tested, and rotating the rotating table (3) to enable the included angle alpha between the light emitted by the test light source (1) and the plane of the film polaroid to be tested to be 33 +/-1 degrees;
Placing a polarizing cube (2) and a convex lens (5) to enable light emitted by a test light source (1) to sequentially pass through the polarizing cube (2), the thin film polaroid to be tested and the center of the convex lens (5);
step four, adjusting the position of the convex lens (5) to enable the distance between the center of the convex lens (5) and the center of the rotating platform (3) to be 2 f;
step five, firstly testing the optical power P1 after passing through the polarization cube (2) by using a power meter (6), and then moving the power meter (6) to a position 2f away from the center of the convex lens (5) to enable the light rays passing through the convex lens (5) to be incident to the probe center of the power meter (6);
step six, respectively rotating the rotating platform (3) clockwise and anticlockwise, wherein the rotating angle is less than +/-10 degrees, and recording the minimum power value P2 acquired by the power meter (6) in the rotating process;
and seventhly, calculating the P light transmittance of the film polarizer to be measured by using the formula T-1-P2/P1.
8. The method of claim 7, wherein: in the fifth step, before the optical power P1 is tested by using the power meter (6), the current of the test light source (1) is adjusted to make the output power of the test light source 1-1.2W.
9. The method of claim 7, wherein: in the fifth step, after the optical power P1 is tested by using the power meter (6), the measurement gear of the power meter (6) is adjusted to the mW range.
10. The method of claim 7, wherein: the output wavelength of the test light source (1) is the working wavelength of the film polaroid to be tested, and the beam quality of the test light source is less than 2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210158218.4A CN114518342A (en) | 2022-02-21 | 2022-02-21 | Device and method for detecting transmittance of film polaroid |
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| CN202210158218.4A CN114518342A (en) | 2022-02-21 | 2022-02-21 | Device and method for detecting transmittance of film polaroid |
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| CN114518342A true CN114518342A (en) | 2022-05-20 |
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| CN202210158218.4A Pending CN114518342A (en) | 2022-02-21 | 2022-02-21 | Device and method for detecting transmittance of film polaroid |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114812425A (en) * | 2022-06-30 | 2022-07-29 | 江苏康辉新材料科技有限公司 | Method for observing micro-deformation of film surface |
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2022
- 2022-02-21 CN CN202210158218.4A patent/CN114518342A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114812425A (en) * | 2022-06-30 | 2022-07-29 | 江苏康辉新材料科技有限公司 | Method for observing micro-deformation of film surface |
| CN114812425B (en) * | 2022-06-30 | 2022-09-16 | 江苏康辉新材料科技有限公司 | Method for observing micro-deformation of film surface |
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