CN107228984A - 磁芯的来料检验方法 - Google Patents

磁芯的来料检验方法 Download PDF

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CN107228984A
CN107228984A CN201710342835.9A CN201710342835A CN107228984A CN 107228984 A CN107228984 A CN 107228984A CN 201710342835 A CN201710342835 A CN 201710342835A CN 107228984 A CN107228984 A CN 107228984A
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magnetic core
inductance value
quality control
control method
incoming quality
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何保明
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Pubei Fortis Electronic Technology Co Ltd
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Pubei Fortis Electronic Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2611—Measuring inductance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/16—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring distance of clearance between spaced objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection

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  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
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  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Manufacturing Cores, Coils, And Magnets (AREA)
  • Soft Magnetic Materials (AREA)

Abstract

本发明提供一种磁芯的来料检验方法，包括以下步骤：目测：磁芯有无变形、掉磁、表面光滑不粗糙、结晶体等，选择几个磁芯摔破，观看其内部结构是否分布均匀细密；工艺尺寸：根据规格要求，测量磁芯的长、宽、高和气隙；仪测：用电感表测量磁芯的电感量；温升：将被测磁芯做成的变压器(每个规格为1个)测量常温电感量，编号记录放入烘箱内，并用导线连接变压器的引脚引出烘箱外，调节温度，每隔10℃测一次电感量，并记录下来，观察其电感量的变化；将抽检情况记录在来料检验报告表上，并做出允收或退货的判定。本发明特地制定磁芯的来料检验方法，规范检验要求，加强品质监督，提高供货质量，促使生产效率提高。

Description

磁芯的来料检验方法
技术领域
本发明涉及日用电器领域，具体涉及一种磁芯的来料检验方法。
背景技术
IQC即来料品质检验，指对采购进来的原材料、部件或产品做品质确认和查核，即在供应商送原材料或部件时通过抽样的方式对产品进行检验，并最后做出判断该批产品是接收还是退换。
IQC是企业产品在生产前的第一个控制品质的关卡，如把不合格品放到制程中，则会导致制程或最终产品的不合格，造成巨大的损失。IQC不仅影响到公司最终产品的品质，还影响到各种直接或间接成本。
在制造业中，对产品品质有直接影响的通常为设计、来料、制程、储运四大主项，一般来说设计占25％，来料占50％，制程占20％，储运1％到5％。综上所述，来料检验对公司产品质量占压倒性的地位，所以要把来料品质控制升到一个战略性地位来对待。
现有技术中，对于磁芯的来料检验方法尚未见报道。
发明内容
本发明的目的是克服上述现有技术的不足之处，提供一种磁芯的来料检验方法，以提高供货质量。
为达到上述目的，本发明采用如下技术方案：一种磁芯的来料检验方法，包括以下步骤：步骤1：目测：磁芯有无变形、掉磁、表面光滑不粗糙、结晶体等，选择几个磁芯摔破，观看其内部结构是否分布均匀细密；步骤2：工艺尺寸：根据规格要求，测量磁芯的长、宽、高和气隙；步骤3：仪测：用电感表测量磁芯的电感量；步骤4：温升：将被测磁芯做成的变压器(每个规格为1个)测量常温电感量，编号记录放入烘箱内，并用导线连接变压器的引脚引出烘箱外，调节温度，每隔10℃测一次电感量，并记录下来，观察其电感量的变化；步骤5：将抽检情况记录在来料检验报告表上，并做出允收或退货的判定。
进一步地，让步接收：同一批表面有小反光点不影响质量的磁芯。
进一步地，退货：电感量一致性不好(即同一批有偏高的又有偏低的)、有结晶体。
进一步地，电感量＞6mH的变压器允许变化0.1mH。
本发明的有益效果：本发明特地制定磁芯的来料检验方法，规范检验要求，加强品质监督，提高供货质量，促使生产效率提高。
本发明的其它优点、目标和特征将部分通过下面的说明体现，部分还将通过对本发明的研究和实践而为本领域的技术人员所理解。
具体实施方式
结合下列实施例对本发明做进一步的详细说明，以令本领域技术人员参照说明书文字能够据以实施。
本发明磁芯的来料检验方法，包括以下步骤：
步骤1：目测：磁芯有无变形、掉磁、表面光滑不粗糙、结晶体等，选择几个磁芯摔破，观看其内部结构是否分布均匀细密。
步骤2：工艺尺寸：根据规格要求，测量磁芯的长、宽、高和气隙。
步骤3：仪测：用电感表测量磁芯的电感量。
步骤4：温升：将被测磁芯做成的变压器(每个规格为1个)测量常温电感量，编号记录放入烘箱内，并用导线连接变压器的引脚引出烘箱外，调节温度，每隔10℃测一次电感量，并记录下来，观察其电感量的变化，电感量＞6mH的变压器允许变化0.1mH。
步骤5：将抽检情况记录在来料检验报告表上，并做出允收或退货的判定。
让步接收：同一批表面有小反光点不影响质量的磁芯。
退货：电感量一致性不好(即同一批有偏高的又有偏低的)、有结晶体。
规格要求：
表1：磁芯的工艺尺寸
表2：磁芯的电感量
尽管本发明的实施方案已公开如上，但其并不仅仅限于说明书和实施方式中所列运用，它完全可以被适用于各种适合本发明的领域，对于熟悉本领域的人员而言，可容易地实现另外的修改，因此在不背离权利要求及等同范围所限定的一般概念下，本发明并不限于特定的细节和这里示出与描述的实施例。

Claims (4)

1.一种磁芯的来料检验方法，其特征在于包括以下步骤：
步骤1：目测：磁芯有无变形、掉磁、表面光滑不粗糙、结晶体等，选择几个磁芯摔破，观看其内部结构是否分布均匀细密；
步骤2：工艺尺寸：根据规格要求，测量磁芯的长、宽、高和气隙；
步骤3：仪测：用电感表测量磁芯的电感量；
步骤4：温升：将被测磁芯做成的变压器(每个规格为1个)测量常温电感量，编号记录放入烘箱内，并用导线连接变压器的引脚引出烘箱外，调节温度，每隔10℃测一次电感量，并记录下来，观察其电感量的变化；
步骤5：将抽检情况记录在来料检验报告表上，并做出允收或退货的判定。
2.根据权利要求1所述的磁芯的来料检验方法，其特征在于：让步接收：同一批表面有小反光点不影响质量的磁芯。
3.根据权利要求1所述的磁芯的来料检验方法，其特征在于：退货：电感量一致性不好(即同一批有偏高的又有偏低的)、有结晶体。
4.根据权利要求1所述的磁芯的来料检验方法，其特征在于：电感量＞6mH的变压器允许变化0.1mH。
CN201710342835.9A 2017-05-16 2017-05-16 磁芯的来料检验方法 Pending CN107228984A (zh)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109115732A (zh) * 2018-08-02 2019-01-01 华南理工大学广州学院 一种光释光测年实验的感量校正方法
CN113466250A (zh) * 2021-09-06 2021-10-01 南通速图科技有限公司 一种基于视觉相机系统的磁芯表面裂痕检测设备

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CN205301439U (zh) * 2015-11-23 2016-06-08 浙江通达磁业有限公司 一种变压器磁芯测试治具
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CN205317818U (zh) * 2015-11-23 2016-06-15 浙江通达磁业有限公司 一种变压器磁芯测试治具中的测试单元

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109115732A (zh) * 2018-08-02 2019-01-01 华南理工大学广州学院 一种光释光测年实验的感量校正方法
CN109115732B (zh) * 2018-08-02 2021-07-13 华南理工大学广州学院 一种光释光测年实验的感量校正方法
CN113466250A (zh) * 2021-09-06 2021-10-01 南通速图科技有限公司 一种基于视觉相机系统的磁芯表面裂痕检测设备

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Application publication date: 20171003