CN107179450B - Method and device for measuring microwave electric field strength - Google Patents
Method and device for measuring microwave electric field strength Download PDFInfo
- Publication number
- CN107179450B CN107179450B CN201710400038.1A CN201710400038A CN107179450B CN 107179450 B CN107179450 B CN 107179450B CN 201710400038 A CN201710400038 A CN 201710400038A CN 107179450 B CN107179450 B CN 107179450B
- Authority
- CN
- China
- Prior art keywords
- electric field
- laser
- microwave electric
- rubidium bubble
- photodetector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000005684 electric field Effects 0.000 title claims abstract description 64
- 238000000034 method Methods 0.000 title claims description 10
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 claims abstract description 53
- 229910052701 rubidium Inorganic materials 0.000 claims abstract description 51
- 239000000523 sample Substances 0.000 claims abstract description 36
- 239000006185 dispersion Substances 0.000 claims abstract description 13
- 230000005283 ground state Effects 0.000 claims abstract description 9
- 230000008878 coupling Effects 0.000 claims description 10
- 238000010168 coupling process Methods 0.000 claims description 10
- 238000005859 coupling reaction Methods 0.000 claims description 10
- 230000003287 optical effect Effects 0.000 claims description 9
- 238000002360 preparation method Methods 0.000 claims description 3
- 230000002269 spontaneous effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 28
- 238000001514 detection method Methods 0.000 abstract description 8
- 238000000691 measurement method Methods 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000011160 research Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000001795 light effect Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
本发明公开了一种微波电场强度测量方法及测量装置，所述测量方法包括如下步骤：将第一激光器产生的探测光分为两束相同的探测光，其中一束探测光进入铷泡，另一束探测光进入真空设备；第二激光器产生的耦合光进入铷泡，耦合光和探测光将铷泡中的热原子从基态相干激发到里德堡态，并在原子蒸气室内实现电磁诱导透明；将微波源产生的微波电场施加到热原子上，将另一邻近里德堡态耦合到三能级EIT系统上，形成一个四能级系统；分别探测从铷泡和真空设备出射的两路透射光，通过分析两路透射光的色散关系，确定两路透射光的时间差，即可获得微波电场强度。
The invention discloses a microwave electric field intensity measurement method and a measurement device. The measurement method includes the following steps: dividing the detection light generated by the first laser into two identical detection light beams, one of which enters the rubidium bubble, and the other A beam of probe light enters the vacuum device; the coupled light generated by the second laser enters the rubidium bubble, and the coupled light and probe light coherently excite the hot atoms in the rubidium bubble from the ground state to the Rydberg state, and realize electromagnetically induced transparency in the atomic vapor chamber ; The microwave electric field generated by the microwave source is applied to the hot atoms, and another adjacent Rydberg state is coupled to the three-level EIT system to form a four-level system; respectively detect the two-way transparent energy emitted from the rubidium bubble and the vacuum device By analyzing the dispersion relationship of the two transmitted lights and determining the time difference between the two transmitted lights, the microwave electric field intensity can be obtained.
Description
技术领域technical field
本发明涉及一种微波电场强度测量方法和测量装置。The invention relates to a microwave electric field intensity measurement method and a measurement device.
背景技术Background technique
2012年，美国Oklahoma大学的Shaffer研究组与德国Stuttgart大学的Pfau研究组合作首次利用里德堡原子EIT(Electromagnetically Induced Transparency,电磁感生透明)和AT(Autler-Townes)分裂，将微波电场强度的测量转化为光学频率测量，实验上实现了微波电场测量，测到的最小电场强度为8μVcm-1，灵敏度为30μVcm-1Hz-1/2,远优于传统偶极天线微波电场计。紧接着在2013年，他们又在原来的实验基础上实现了微波偏振方向的测量，偏振测量精确度为0.5°。2014年，美国国家标准与技术研究院(NIST)实验上实现了从15GHz到105GHz的高精度微波电场测量和高分辨率的亚波长微波电场成像。In 2012, the Shaffer research group of Oklahoma University in the United States cooperated with the Pfau research group of Stuttgart University in Germany for the first time to use Rydberg atoms EIT (Electromagnetically Induced Transparency, electromagnetically induced transparency) and AT (Autler-Townes) The measurement was transformed into optical frequency measurement, and the microwave electric field measurement was realized experimentally. The measured minimum electric field strength was 8μVcm -1 , and the sensitivity was 30μVcm -1 Hz -1/2 , which is far superior to the traditional dipole antenna microwave electric field meter. Then in 2013, based on the original experiment, they realized the measurement of the microwave polarization direction, and the polarization measurement accuracy was 0.5°. In 2014, the National Institute of Standards and Technology (NIST) experimentally realized high-precision microwave electric field measurement from 15GHz to 105GHz and high-resolution subwavelength microwave electric field imaging.
但是，根据目前的实验测量和理论分析表明，基于AT分裂的微波电场探测技术，在微波电场较弱的情况下，探测光透射峰仅呈微小凹陷而尚未发生劈裂，此时对微波电场的探测存在难度；同时探测光透明窗口的宽度则受到激光线宽、渡跃展宽、散粒噪声以及里德堡原子退相干等因素的影响，无法对极微弱的微波电场实现精密测量。However, according to the current experimental measurement and theoretical analysis, the microwave electric field detection technology based on AT splitting, when the microwave electric field is weak, the detection light transmission peak is only slightly depressed and has not yet split. The detection is difficult; at the same time, the width of the detection light transparent window is affected by factors such as laser linewidth, transition broadening, shot noise, and Rydberg atom decoherence, and it is impossible to achieve precise measurement of the extremely weak microwave electric field.
发明内容Contents of the invention
为克服上述现有技术存在的不足，本发明之目的在于提供一种微波电场强度测量方法及测量装置，以通过选择对探测光色散和在不同介质中传播的时间差的测量，实现对更微弱的微波电场的精密测量，其结构简单、操作方便、测量精确、可行性强，且易于实用化。In order to overcome the deficiencies in the above-mentioned prior art, the purpose of the present invention is to provide a microwave electric field strength measurement method and measurement device, to realize the measurement of the weaker The precise measurement of the microwave electric field has the advantages of simple structure, convenient operation, accurate measurement, strong feasibility and easy practical application.
为达上述及其它目的，本发明提出一种微波电场强度测量方法，包括如下步骤：For reaching above-mentioned and other purposes, the present invention proposes a kind of microwave electric field strength measurement method, comprises the steps:
将第一激光器产生的探测光分为两束相同的探测光，其中一束探测光进入铷泡，另一束探测光进入真空设备；Dividing the probe light generated by the first laser into two identical probe beams, one of which enters the rubidium bubble, and the other probe beam enters the vacuum device;
第二激光器产生的耦合光进入铷泡，耦合光和探测光将铷泡中的热原子从基态相干激发到里德堡态，并在原子蒸气室内实现电磁诱导透明；The coupling light generated by the second laser enters the rubidium bubble, and the coupling light and probe light coherently excite the hot atoms in the rubidium bubble from the ground state to the Rydberg state, and realize electromagnetically induced transparency in the atomic vapor chamber;
将微波源产生的微波电场施加到热原子上，将另一邻近里德堡态耦合到三能级EIT系统上，形成一个四能级系统；The microwave electric field generated by the microwave source is applied to the hot atoms, and another adjacent Rydberg state is coupled to the three-level EIT system to form a four-level system;
分别探测从铷泡和真空设备出射的两路透射光，通过分析两路透射光的色散关系，确定两路透射光的时间差，即可获得微波电场强度。The two transmitted lights from the rubidium bubble and the vacuum equipment are respectively detected, and the microwave electric field intensity can be obtained by analyzing the dispersion relationship of the two transmitted lights and determining the time difference between the two transmitted lights.
进一步地，微波电场强度E的计算公式如下：Further, the calculation formula of microwave electric field strength E is as follows:
其中，τ为两路透射光的时间差，OD为介质的光学厚度，γ为自发辐射速率，Ωc为耦合光的拉比频率。Among them, τ is the time difference between the two transmitted lights, OD is the optical thickness of the medium, γ is the spontaneous emission rate, and Ω c is the Rabi frequency of the coupled light.
进一步地，所述热原子为铷原子。Further, the thermal atoms are rubidium atoms.
为达到上述目的，本发明还提供一种微波电场强度测量装置，包括第一光电探测器、第二光电探测器、铷泡、第一激光器、第二激光器、分束器、双色镜、真空设备、微波源、示波器；To achieve the above object, the present invention also provides a microwave electric field intensity measuring device, comprising a first photodetector, a second photodetector, a rubidium bubble, a first laser, a second laser, a beam splitter, a dichroic mirror, a vacuum device , microwave source, oscilloscope;
第一激光器、第二激光器和微波源的发射方向均朝向铷泡；微波源用于产生微波电场；铷泡用于热原子气体的制备；真空设备用于产生真空环境；分束器设置在第一激光器和铷泡之间，双色镜设置在第二激光器、第一光电探测器和铷泡之间；The emission directions of the first laser, the second laser and the microwave source are all towards the rubidium bubble; the microwave source is used to generate microwave electric field; the rubidium bubble is used for the preparation of hot atomic gas; the vacuum equipment is used to generate a vacuum environment; the beam splitter is set at Between the first laser and the rubidium bubble, the dichroic mirror is arranged between the second laser, the first photodetector and the rubidium bubble;
第一激光器产生的探测光经分束器后产生两束相同的高斯型探测光，两路探测光分别通过铷泡和真空设备；第二激光器产生耦合光经双色镜反射后进入铷泡，用于将铷泡中的热原子从基态相干激发到里德堡态；第一光电探测器，用于探测通过铷泡后并从双色镜透射的高斯型探测光；第二光电探测器，用于探测通过真空设备后的高斯型探测光；示波器，用于分析光第一光电探测器和第二光电探测器测得的色散关系，确定两路透射光的时间差，即可获得微波电场强度。The probe light generated by the first laser passes through the beam splitter to produce two beams of the same Gaussian probe light, and the two probe beams respectively pass through the rubidium bubble and the vacuum device; the coupled light generated by the second laser enters the rubidium bubble after being reflected by the dichroic mirror, and used It is used to coherently excite the hot atoms in the rubidium bubble from the ground state to the Rydberg state; the first photodetector is used to detect the Gaussian probe light passing through the rubidium bubble and transmitted from the dichroic mirror; the second photodetector is used to Detect the Gaussian probe light after passing through the vacuum equipment; the oscilloscope is used to analyze the dispersion relationship measured by the first photodetector and the second photodetector, and determine the time difference between the two transmitted lights to obtain the microwave electric field intensity.
进一步地，所述第一光电探测器和第二光电探测器均采用光电倍增管。Further, both the first photodetector and the second photodetector use photomultiplier tubes.
进一步地，所述铷泡为玻璃真空腔，所述热原子为铷原子。Further, the rubidium bubble is a glass vacuum cavity, and the hot atoms are rubidium atoms.
进一步地，所述第二激光器产生的耦合光波长为479nm-488nm。Further, the wavelength of the coupled light generated by the second laser is 479nm-488nm.
进一步地，所述第一激光器产生的探测光波长为780nm。Further, the wavelength of the probe light generated by the first laser is 780nm.
与现有技术相比，本发明一种微波电场强度测量方法及测量装置是基于热里德堡原子和EIT慢光效应，通过过探测施加微波电场时介质的色散关系，测量光脉冲通过EIT介质与参考光路的时间差，实现了微波电场强度的测量。Compared with the prior art, a microwave electric field strength measuring method and measuring device of the present invention is based on thermal Rydberg atoms and the EIT slow light effect, by detecting the dispersion relation of the medium when the microwave electric field is applied, and measuring the light pulse passing through the EIT medium The time difference with the reference optical path realizes the measurement of the microwave electric field intensity.
附图说明Description of drawings
图1为本发明微波电场强度测量装置的系统架构图；Fig. 1 is a system architecture diagram of a microwave electric field strength measuring device of the present invention;
图2为热原子的能级结构示意图；Figure 2 is a schematic diagram of the energy level structure of thermal atoms;
图3为本发明微波电场强度测量方法的步骤流程图。Fig. 3 is a flow chart of the steps of the method for measuring microwave electric field strength of the present invention.
具体实施方式Detailed ways
以下通过特定的具体实例并结合附图说明本发明的实施方式，本领域技术人员可由本说明书所揭示的内容轻易地了解本发明的其它优点与功效。本发明亦可通过其它不同的具体实例加以施行或应用，本说明书中的各项细节亦可基于不同观点与应用，在不背离本发明的精神下进行各种修饰与变更。The implementation of the present invention is described below through specific examples and in conjunction with the accompanying drawings, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
图1为本发明微波电场强度测量装置的系统架构图。如图1所示，本发明一种微波电场强度测量装置，包括：第一光电探测器1、第二光电探测器9、铷泡2、第一激光器4、第二激光器6、分束器7、双色镜8、真空设备10、微波源5、示波器。Fig. 1 is a system architecture diagram of a microwave electric field strength measuring device of the present invention. As shown in Figure 1, a kind of microwave electric field strength measuring device of the present invention comprises: first photodetector 1, second photodetector 9, rubidium bubble 2, first laser 4, second laser 6, beam splitter 7 , dichroic mirror 8, vacuum equipment 10, microwave source 5, oscilloscope.
其中，第一激光器4、第二激光器6和微波源5的发射方向均朝向铷泡2；微波源5用于产生微波电场；铷泡2用于热原子气体3的制备；真空设备10用于产生真空环境；分束器7设置在第一激光器4和铷泡2之间，双色镜8设置在第二激光器6、第一光电探测器1和铷泡2之间。Wherein, the emission directions of the first laser 4, the second laser 6 and the microwave source 5 are all towards the rubidium bubble 2; the microwave source 5 is used to generate a microwave electric field; the rubidium bubble 2 is used for the preparation of the hot atomic gas 3; the vacuum device 10 is used for A vacuum environment is generated; the beam splitter 7 is arranged between the first laser 4 and the rubidium bubble 2 , and the dichroic mirror 8 is arranged between the second laser 6 , the first photodetector 1 and the rubidium bubble 2 .
第一激光器4，用于产生波长为780nm的探测光，该波长为780nm的探测光经分束器7后产生两束相同高斯型探测光，两路探测光分别通过铷泡2和真空设备10；第二激光器6，产生波长为480nm的耦合光，经双色镜8反射后进入铷泡2，用于将铷泡2中的热原子从基态相干激发到里德堡态；第一光电探测器1，用于探测通过铷泡2后并从双色镜8透射的高斯型探测光；第二光电探测器9，用于探测通过真空设备10后的高斯型探测光；示波器，用于分析光第一光电探测器1和第二光电探测器9测得的色散关系，确定两路透射光的时间差，即可获得微波电场强度。The first laser 4 is used to generate a probe light with a wavelength of 780nm. The probe light with a wavelength of 780nm passes through a beam splitter 7 to generate two beams of the same Gaussian probe light. The two probe lights pass through the rubidium bubble 2 and the vacuum device 10 respectively. The second laser 6 generates coupled light with a wavelength of 480nm, which enters the rubidium bubble 2 after being reflected by the dichroic mirror 8, and is used to coherently excite the thermal atoms in the rubidium bubble 2 from the ground state to the Rydberg state; the first photodetector 1, used to detect the Gaussian probe light passing through the rubidium bubble 2 and transmitted from the dichroic mirror 8; the second photodetector 9 is used to detect the Gaussian probe light after passing through the vacuum device 10; the oscilloscope is used to analyze the light The dispersion relationship measured by the first photodetector 1 and the second photodetector 9 determines the time difference between the two transmitted lights, and then the electric field intensity of the microwave can be obtained.
在本发明具体实施例中，铷泡2为玻璃真空腔，玻璃真空腔内为高真空，以减小噪声的影响，并提高测量的精确度。所述热原子气体3用于实现电磁诱导透明，使通过其中的探测光群速度减慢。在本发明具体实施例中，热原子气体为铷(Rb)蒸气，较佳地，铷泡2通过利用加热温控设备控制铷泡的温度，加热铷蒸气以增加其光学厚度。In a specific embodiment of the present invention, the rubidium bubble 2 is a glass vacuum chamber, and the inside of the glass vacuum chamber is a high vacuum to reduce the influence of noise and improve measurement accuracy. The hot atomic gas 3 is used to realize electromagnetically induced transparency, so as to slow down the speed of the detection light group passing through it. In a specific embodiment of the present invention, the thermal atomic gas is rubidium (Rb) vapor. Preferably, the rubidium bubble 2 controls the temperature of the rubidium bubble by using a heating temperature control device, and heats the rubidium vapor to increase its optical thickness.
优选的，第一光电探测器1和第二光电探测器9均采用光电倍增管，可以实现精密测量。Preferably, both the first photodetector 1 and the second photodetector 9 use photomultiplier tubes, which can realize precise measurement.
测量时，首先利用第二激光器6产生的强耦合光将铷泡2中的热原子的中间态和里德堡态耦合成两个缀饰态，热原子向两个缀饰态能级跃迁的通道之间将产生量子相消干涉，导致了原子共振频率处的反吸收峰，实现铷泡2内热原子的电磁诱导透明。热原子提供正常色散，群折射系数ng≥1，vg≤c，即脉冲传播速度减慢。这样通过探测施加微波电场时热原子的色散关系，测量光脉冲通过热原子与参考光路的时间差，即可完成微波电场强度的测量。During the measurement, the intermediate state and the Rydberg state of the thermal atoms in the rubidium bubble 2 are first coupled into two decorated states by the strongly coupled light generated by the second laser 6, and the thermal atoms transition to the energy levels of the two decorated states Quantum destructive interference will be generated between the channels, leading to the anti-absorption peak at the atomic resonance frequency, realizing the electromagnetically induced transparency of the hot atoms in the rubidium bubble 2. Hot atoms provide normal dispersion, with group refraction coefficients n g ≥ 1 and v g ≤ c, i.e. the pulse propagation speed is slowed down. In this way, by detecting the dispersion relationship of the thermal atoms when the microwave electric field is applied, and measuring the time difference between the light pulse passing through the thermal atoms and the reference optical path, the measurement of the microwave electric field intensity can be completed.
图2为热原子的能级结构示意图。在本发明具体实施例中，第一激光器4产生的探测光为高斯光束，第二激光器6产生的耦合光用于耦合中间态和里德堡态，微波电场将另一邻近里德堡态耦合到三能级EIT系统上，形成一个四能级系统，该四能级系统包括基态能级5S1/2，中间态5P3/2和两个近邻里德堡态。图2中，11(|0>＝5S1/2)为热原子内态的基态，12(|1>＝5P3/2)和13(|2>＝53D5/2)分别为热原子内态的中间态和里德堡态，通过强耦合光的相干操作，可将中间态和基态耦合成两个缀饰态，以实现电磁诱导透明。4′为波长780nm的探测光，6′为波长480nm的耦合光，耦合光的作用是将热原子激发到里德堡态和实现电磁诱导透明；14(|3>＝54P3/2)为一个辅助里德堡态(与里德堡态13邻近)；15为作用在里德堡态13和辅助里德堡态14之间的微波电场，上述S、P和D表示轨道角动量分别为0、1、2的原子内态。Figure 2 is a schematic diagram of the energy level structure of thermal atoms. In a specific embodiment of the present invention, the probe light generated by the first laser 4 is a Gaussian beam, the coupling light generated by the second laser 6 is used to couple the intermediate state and the Rydberg state, and the microwave electric field couples another adjacent Rydberg state To the three-level EIT system, a four-level system is formed, which includes the ground state energy level 5S 1/2 , the intermediate state 5P 3/2 and two neighboring Rydberg states. In Fig. 2, 11 (|0>=5S 1/2 ) is the ground state of the thermal atom internal state, 12 (|1>=5P 3/2 ) and 13 (|2>=53D 5/2 ) are thermal atoms respectively The intermediate state and the Rydberg state of the internal state can be coupled into two decorated states through the coherent operation of strongly coupled light to achieve electromagnetically induced transparency. 4' is the probe light with a wavelength of 780nm, and 6' is the coupled light with a wavelength of 480nm. The function of the coupled light is to excite the thermal atoms to the Rydberg state and realize electromagnetically induced transparency; 14(|3>=54P 3/2 ) is An auxiliary Rydberg state (adjacent to the Rydberg state 13); 15 is the microwave electric field acting between the Rydberg state 13 and the auxiliary Rydberg state 14, and the above S, P and D represent the orbital angular momentums respectively 0, 1, 2 atomic internal states.
图3为本发明一种微波电场强度测量方法的步骤流程图。本发明微波电场强度测量方法的主要思想是将微波电场强度的测量从频率的测量转化为色散关系的测量，具体包括如下步骤：Fig. 3 is a flowchart of steps of a method for measuring microwave electric field strength according to the present invention. The main idea of the method for measuring the microwave electric field strength of the present invention is to convert the measurement of the microwave electric field strength from the measurement of the frequency to the measurement of the dispersion relationship, which specifically includes the following steps:
步骤401，将第一激光器产生的探测光分为两束相同的探测光，其中一束探测光进入铷泡，另一束探测光进入真空设备；Step 401, dividing the probe light generated by the first laser into two identical probe beams, wherein one beam of probe light enters the rubidium bubble, and the other probe beam enters the vacuum device;
步骤402，第二激光器产生的耦合光进入铷泡，耦合光和探测光将铷泡中的热原子从基态相干激发到里德堡态，并在原子蒸气室内实现电磁诱导透明；Step 402, the coupling light generated by the second laser enters the rubidium bubble, the coupling light and the probe light coherently excite the hot atoms in the rubidium bubble from the ground state to the Rydberg state, and realize electromagnetically induced transparency in the atomic vapor chamber;
步骤403，将微波源产生的微波电场施加到热原子上，将另一邻近里德堡态耦合到三能级EIT系统上，形成一个四能级系统；Step 403, applying the microwave electric field generated by the microwave source to the hot atoms, coupling another adjacent Rydberg state to the three-level EIT system to form a four-level system;
步骤404，分别探测从铷泡和真空设备出射的两路透射光，通过分析两路透射光的色散关系，确定两路透射光的时间差，即可获得微波电场强度。In step 404, respectively detect two paths of transmitted light emitted from the rubidium bubble and the vacuum device, analyze the dispersion relationship of the two paths of transmitted light, determine the time difference between the two paths of transmitted light, and then obtain the microwave electric field intensity.
具体地，两路透射光的时间差可以通过光脉冲在两种介质中的群速度给出。光脉冲的群速度依赖于介质的极化系数，进而依赖于微波场与能级的耦合强度，即拉比频率Ωc，通过测得时间差Δt，即可求出待测微波电场强度，微波电场强度E与延迟时间τ的关系：Specifically, the time difference of the two transmitted lights can be given by the group velocity of the light pulse in the two media. The group velocity of the optical pulse depends on the polarization coefficient of the medium, and further depends on the coupling strength between the microwave field and the energy level, that is, the Rabi frequency Ω c . By measuring the time difference Δt, the microwave electric field intensity to be measured can be obtained, and the microwave electric field The relationship between intensity E and delay time τ:
其中OD为介质的光学厚度，γ为自发辐射速率，Ωc为耦合光的拉比频率。Where OD is the optical thickness of the medium, γ is the spontaneous emission rate, and Ω c is the Rabi frequency of the coupled light.
综上所述，本发明微波电场强度测量方法和测量装置是基于热里德堡原子和EIT慢光效应，通过探测施加微波电场时介质的色散关系，测量光脉冲通过EIT介质与参考光路的时间差，实现了微波电场强度的测量。In summary, the microwave electric field strength measuring method and measuring device of the present invention are based on thermal Rydberg atoms and the EIT slow light effect, by detecting the dispersion relationship of the medium when the microwave electric field is applied, and measuring the time difference between the light pulse passing through the EIT medium and the reference optical path , to achieve the measurement of microwave electric field strength.
本发明具有如下有益效果：The present invention has following beneficial effects:
1、本发明通过对透射光脉冲色散关系的测量，能将微波电场测量精度提高三到四倍，从而为微波电场的精密测量研究提供新的技术基础；同时，在探测光透射峰尚未完全发生分裂时，依然可以对电场进行有效测量，从而弥补目前EIT和AT光谱测量技术不能实现更小电场测量的缺陷。1. The present invention can improve the measurement accuracy of the microwave electric field by three to four times by measuring the dispersion relationship of the transmitted light pulse, thereby providing a new technical basis for the precise measurement and research of the microwave electric field; at the same time, when the detection light transmission peak has not yet fully occurred When splitting, the electric field can still be effectively measured, thus making up for the defect that the current EIT and AT spectral measurement technologies cannot achieve smaller electric field measurements.
2、本发明适用于热原子体系，方法简便，易于实现。2. The present invention is applicable to thermal atomic systems, and the method is simple and easy to implement.
3、本发明根据里德堡原子态本身所具有的特性，如谱线的自然宽度较窄、能级寿命长、从高里德堡态自发跃迁到比较低的态的几率小、在弱电场中依旧具有较大的电偶极矩等，可以在较弱的电场下产生较强的相互作用，提高微波电场测量精度。3. The present invention is based on the characteristics of the Rydberg atomic state itself, such as the natural width of the spectral line is narrow, the energy level life is long, the probability of spontaneously transitioning from the high Rydberg state to a relatively low state is small, and in a weak electric field The medium still has a large electric dipole moment, etc., which can produce a strong interaction under a weak electric field and improve the measurement accuracy of the microwave electric field.
4、本发明具有自动校准功能，对待测微波电场干扰较小，不依赖于探头的物理尺寸等优势，对于当前器件小型化的时代，具有广阔的应用前景和科研价值。4. The present invention has the advantages of automatic calibration function, less interference of the microwave electric field to be measured, and independent of the physical size of the probe. For the current era of device miniaturization, it has broad application prospects and scientific research value.
任何本领域技术人员均可在不违背本发明的精神及范畴下，对上述实施例进行修饰与改变。因此，本发明的权利保护范围，应如权利要求书所列。Any person skilled in the art can modify and change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be listed in the claims.
Claims (6)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710400038.1A CN107179450B (en) | 2017-05-31 | 2017-05-31 | Method and device for measuring microwave electric field strength |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710400038.1A CN107179450B (en) | 2017-05-31 | 2017-05-31 | Method and device for measuring microwave electric field strength |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107179450A CN107179450A (en) | 2017-09-19 |
| CN107179450B true CN107179450B (en) | 2019-10-11 |
Family
ID=59835667
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710400038.1A Active CN107179450B (en) | 2017-05-31 | 2017-05-31 | Method and device for measuring microwave electric field strength |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107179450B (en) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3729112A4 (en) * | 2017-12-18 | 2022-02-09 | Rydberg Technologies Inc. | Atom-based electromagnetic field sensing element and measurement system |
| CN109001137B (en) * | 2018-09-21 | 2021-01-05 | 山东科技大学 | Broadband light absorption method using microwave-assisted rydberg atoms |
| CN109163815B (en) * | 2018-09-28 | 2020-08-18 | 华南师范大学 | Millimeter wave detection method and device |
| CN109406889A (en) * | 2018-11-06 | 2019-03-01 | 中国科学院电工研究所 | A kind of field measurement device |
| CN110488266B (en) * | 2019-07-08 | 2023-03-21 | 清远市天之衡传感科技有限公司 | Radar speed measurement system and method based on rydberg atom superheterodyne measurement |
| CN110488265B (en) * | 2019-07-08 | 2022-11-18 | 清远市天之衡传感科技有限公司 | Radar speed measurement system and method based on Reedberg atom electromagnetic induction transparency effect |
| CN110261671B (en) * | 2019-07-15 | 2021-07-27 | 中国计量科学研究院 | A microwave power quantum measurement method and vacuum cavity measurement device |
| WO2021078438A1 (en) | 2019-10-24 | 2021-04-29 | British Telecommunications Public Limited Company | Wireless telecommunications network |
| CN111637833B (en) * | 2020-06-03 | 2021-07-27 | 中国人民解放军国防科技大学 | Angle measurement system and method based on Rydberg atomic electromagnetic induction transparency effect |
| GB2597260B (en) * | 2020-07-16 | 2022-12-07 | British Telecomm | Electromagnetic field receiver |
| CN112098736B (en) * | 2020-08-27 | 2023-09-29 | 北京无线电计量测试研究所 | Method for measuring phase of microwave electric field |
| CN112098737B (en) * | 2020-08-27 | 2023-09-29 | 北京无线电计量测试研究所 | Method and device for measuring intensity of microwave electric field |
| CN112098710A (en) * | 2020-08-31 | 2020-12-18 | 华南师范大学 | Microwave power measuring device and method based on cold atoms |
| CN112285444B (en) * | 2020-09-25 | 2024-08-30 | 西安空间无线电技术研究所 | Terahertz electric field measurement method, system and device |
| CN112532320B (en) * | 2020-12-03 | 2022-04-01 | 湖北科技学院 | A method for generating low-speed stable optical solitons in weak light |
| CN112615155B (en) * | 2020-12-10 | 2024-11-05 | 清远市天之衡传感科技有限公司 | Microwave antennas and radars based on Rydberg atoms |
| CN113376449B (en) * | 2021-06-08 | 2022-02-11 | 合肥衡元量子技术有限公司 | Low-frequency microwave electric field sensor based on rydberg atoms and detection method |
| CN114942663B (en) * | 2022-04-21 | 2023-10-20 | 华南师范大学 | Current source feedback circuit based on atomic magnetometer |
| CN115407182A (en) * | 2022-11-03 | 2022-11-29 | 华南师大(清远)科技创新研究院有限公司 | All-optical microwave electric field near-field imaging device and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103616571A (en) * | 2013-12-07 | 2014-03-05 | 山西大学 | Electric field detection method and device based on stark effects of Rydberg atoms |
| CN103616568A (en) * | 2013-12-07 | 2014-03-05 | 山西大学 | Microwave induction method and device based on Rydberg atoms |
| CN104880614A (en) * | 2015-06-09 | 2015-09-02 | 华南师范大学 | Microwave electric field intensity meter based on cold Rydberg atom interferometer and measuring method thereof |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3308146B1 (en) * | 2015-06-15 | 2020-02-26 | The Regents of The University of Michigan | Atom-based electromagnetic radiation electric-field sensor |
-
2017
- 2017-05-31 CN CN201710400038.1A patent/CN107179450B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103616571A (en) * | 2013-12-07 | 2014-03-05 | 山西大学 | Electric field detection method and device based on stark effects of Rydberg atoms |
| CN103616568A (en) * | 2013-12-07 | 2014-03-05 | 山西大学 | Microwave induction method and device based on Rydberg atoms |
| CN104880614A (en) * | 2015-06-09 | 2015-09-02 | 华南师范大学 | Microwave electric field intensity meter based on cold Rydberg atom interferometer and measuring method thereof |
Non-Patent Citations (2)
| Title |
|---|
| Spatial distribution measurement of the microwave electric field strength via the Autler-Townes effect of Rydberg atom;Liu Jiasheng等;《2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization(NEMO)》;IEEE;20160908;全文 * |
| 基于里德堡原子的电场测量;黄巍等;《物理学报》;20150831;第64卷(第16期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107179450A (en) | 2017-09-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107179450B (en) | Method and device for measuring microwave electric field strength | |
| CN107329006A (en) | A kind of microwave electric field strength measurement method and measurement apparatus | |
| CN104880614B (en) | Microwave electric field intensitometer and its measuring method based on cold Rydberg atom interferometer | |
| CN103744034B (en) | A kind of difference method improving the sensitivity of CPT atom magnetometer and absolute precision | |
| CN104714110B (en) | Apparatus and method based on the transparent effect measurement high-frequency microwave field strength of electromagnetically induced | |
| CN112904351B (en) | Single-source positioning method based on quantum entanglement light correlation characteristic | |
| CN106842095B (en) | Rf electric field proofreading method and device based on Rydberg atom quantum coherence effect | |
| CN105651649A (en) | Real-time online atomic density measuring method suitable for atom magnetometer | |
| CN107121593A (en) | The measuring method of rf electric field frequency based on Rydberg atom quantum coherence effect | |
| CN108519566A (en) | A SERF atomic magnetometer device and method based on optical frequency shift modulation | |
| CN104964932A (en) | Terahertz vertical transmission spectrum and reflectance spectrum measuring integral system and application thereof | |
| CN113238097A (en) | Design method of single-frequency microwave electric field intensity measurement system based on rydberg atoms | |
| CN107462849B (en) | Device and method for measuring radio frequency line transmission factor based on atomic energy level | |
| CN105277188A (en) | Sagnac angular velocity measurement system and method | |
| CN109782197B (en) | Implementation method of chip atomic sensing and its sensor | |
| CN103869462A (en) | Device for carrying out splicing mirror common-phase control by utilizing cavity ring-down technology | |
| CN106017783A (en) | Method of measuring pressures of two gases in alkali metal gas chamber simultaneously | |
| CN103075966A (en) | Displacement measuring system | |
| CN111060747A (en) | A highly sensitive detection method of nuclear spin precession based on electron spin | |
| CN102288584A (en) | Continuous single-beam testing method for electronic spin useful life in semiconductor | |
| CN111895446A (en) | A kind of laser ignition instrument, laser ignition system and optical path quantitative detection method | |
| CN107167437B (en) | An accurate measurement method of atomic density based on hybrid optical pumping | |
| Li et al. | Dynamic calibration method of temperature sensor based on Quasi‐δ pulse temperature excitation | |
| CN104181128B (en) | Trnaslucent materials based on time-correlated single photon counting t radiation property measurement method | |
| CN102798764B (en) | Method for measuring medium loss by using phase change of electromagnetic evanescent wave |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20211207 Address after: 511500 No. 01, floor t0114, industrial building, Tian'an Zhigu science and Technology Industrial Park, No. 18, Chuangxing Avenue, high tech Industrial Development Zone, Qingyuan City, Guangdong Province Patentee after: Qingyuan tianzhiheng Quantum Technology Co.,Ltd. Address before: 510000 No.55, Zhongshan Avenue West, Tianhe District, Guangzhou City, Guangdong Province Patentee before: SOUTH CHINA NORMAL University |