CN107179450B - A kind of microwave electric field strength measurement method and measuring device - Google Patents

A kind of microwave electric field strength measurement method and measuring device Download PDF

Info

Publication number
CN107179450B
CN107179450B CN201710400038.1A CN201710400038A CN107179450B CN 107179450 B CN107179450 B CN 107179450B CN 201710400038 A CN201710400038 A CN 201710400038A CN 107179450 B CN107179450 B CN 107179450B
Authority
CN
China
Prior art keywords
light
electric field
rubidium
microwave electric
microwave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201710400038.1A
Other languages
Chinese (zh)
Other versions
CN107179450A (en
Inventor
廖开宇
何鹏
张新定
黄巍
杜炎雄
颜辉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qingyuan tianzhiheng Quantum Technology Co.,Ltd.
Original Assignee
South China Normal University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by South China Normal University filed Critical South China Normal University
Priority to CN201710400038.1A priority Critical patent/CN107179450B/en
Publication of CN107179450A publication Critical patent/CN107179450A/en
Application granted granted Critical
Publication of CN107179450B publication Critical patent/CN107179450B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12Measuring electrostatic fields or voltage-potential

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The invention discloses a kind of microwave electric field strength measurement method and measuring devices, the measurement method includes the following steps: that the detection light for generating first laser device is divided into two bundles identical detection light, wherein a branch of detection light enters rubidium bubble, and another beam detection light enters vacuum equipment;Second laser generate coupling light enter rubidium bubble, coupling light and detect light by rubidium steep in hot atom from ground state coherent excitation to Rydberg states, and in atomic vapour room realize electromagnetically induced it is transparent;The microwave electric field that microwave source generates is applied on hot atom, another neighbouring Rydberg states are coupled on three-level EIT system, a four-level system is formed;It separately detects and determines the time difference of two-way transmitted light by analyzing the dispersion relation of two-way transmitted light from the two-way transmitted light that rubidium bubble and vacuum equipment are emitted, can be obtained microwave electric field intensity.

Description

A kind of microwave electric field strength measurement method and measuring device
Technical field
The present invention relates to a kind of microwave electric field strength measurement method and measuring devices.
Background technique
2012, the Pfau study group of the Shaffer study group and Stuttgart university, Germany of Oklahoma university, the U.S. Using Rydberg atom EIT, (Electromagnetically Induced Transparency, electromagnetism are inducted for the first time for cooperation It is bright) and AT (Autler-Townes) division, optical frequency measurement is converted by the measurement of microwave electric field intensity, is experimentally realized Microwave electric field measurement, the field minimum intensity measured are 8 μ Vcm-1, sensitivity is 30 μ Vcm-1Hz-1/2, it is much better than conventional dipole Antenna microwave electric field meter.And then in 2013, they realize the survey in polarized microwave direction on original experiment basis again Amount, polarimetry accuracy are 0.5 °.2014, National Institute of Standards and Technology (NIST) experimentally realize from The High-precision Microwave electric field measurement of 15GHz to 105GHz and the imaging of high-resolution sub-wavelength microwave electric field.
But according to current experiment measurement and theoretical analysis shows that, based on the microwave electric field Detection Techniques of AT division, In the case that microwave electric field is weaker, detection light transmission peak is only in fine pits and not yet cleaves, at this time to microwave electric field There are difficulty for detection;Detect simultaneously the width of light transparent window then by laser linewidth, cross jump broadening, shot noise and Reed The influence of the factors such as fort atom decoherence can not realize accurate measurement to extremely weak microwave electric field.
Summary of the invention
In order to overcome the deficiencies of the above existing technologies, purpose of the present invention is to provide a kind of microwave electric field ionization meters Method and measuring device, with the measurement for the time difference propagated by selection to detection optical dispersion and in different media, realization pair The accurate measurement of fainter microwave electric field, structure is simple and convenient to operate, measures that accurate, feasibility is strong, and is easy to practical Change.
In view of the above and other objects, the present invention proposes a kind of microwave electric field strength measurement method, include the following steps:
The detection light that first laser device generates is divided into two bundles identical detection light, wherein a branch of detection light enters rubidium bubble, Another beam detection light enters vacuum equipment;
The coupling light that second laser generates enters rubidium bubble, coupling light and detect light by rubidium steep in hot atom from ground state phase It is dry to be energized into Rydberg states, and realize that electromagnetically induced is transparent in atomic vapour room;
The microwave electric field that microwave source generates is applied on hot atom, another neighbouring Rydberg states are coupled to three-level On EIT system, a four-level system is formed;
The two-way transmitted light being emitted from rubidium bubble and vacuum equipment is separately detected, the dispersion by analyzing two-way transmitted light is closed System, determines the time difference of two-way transmitted light, can be obtained microwave electric field intensity.
Further, the calculation formula of microwave electric field intensity E is as follows:
Wherein, τ is the time difference of two-way transmitted light, and OD is the optical thickness of medium, and γ is spontaneous emission rate, ΩcFor Couple the Rabi frequency of light.
Further, the hot atom is rubidium atom.
In order to achieve the above objectives, the present invention also provides a kind of microwave electric field strength meters, including the first photodetection Device, rubidium bubble, first laser device, second laser, beam splitter, dichroic mirror, vacuum equipment, microwave source, shows the second photodetector Wave device;
The direction of the launch of first laser device, second laser and microwave source is steeped towards rubidium;Microwave source is for generating microwave Electric field;Rubidium bubble is used for the preparation of hot atom gas;Vacuum equipment is for generating vacuum environment;Beam splitter is arranged in first laser device Between rubidium bubble, dichroic mirror setting is between second laser, the first photodetector and rubidium bubble;
The detection light that first laser device generates generates the identical Gaussian detection light of two beams after beam splitter, and two-way detects light Pass through rubidium bubble and vacuum equipment respectively;Second laser generates coupling light and enters rubidium bubble after dichroic mirror reflects, for steeping rubidium In hot atom from ground state coherent excitation to Rydberg states;First photodetector, for detecting by after rubidium bubble and from double-colored The Gaussian of mirror transmission detects light;Second photodetector detects light for detecting the Gaussian after passing through vacuum equipment;Oscillography Device, the dispersion relation measured for analyzing the first photodetector of light and the second photodetector, determine two-way transmitted light when Between it is poor, can be obtained microwave electric field intensity.
Further, first photodetector and the second photodetector are all made of photomultiplier tube.
Further, the rubidium bubble is glass evacuated chamber, and the hot atom is rubidium atom.
Further, a length of 479nm-488nm of coupling light wave that the second laser generates.
Further, a length of 780nm of detection light wave that the first laser device generates.
Compared with prior art, a kind of microwave electric field strength measurement method of the present invention and measuring device are based on hot Rydberg Atom and EIT slow light effect, the dispersion relation of medium when detecting application microwave electric field by crossing, measurement light pulse pass through EIT and are situated between The time difference of matter and reference path realizes the measurement of microwave electric field intensity.
Detailed description of the invention
Fig. 1 is the system architecture diagram of microwave electric field strength meter of the present invention;
Fig. 2 is the level structure schematic diagram of hot atom;
Fig. 3 is the step flow chart of microwave electric field strength measurement method of the present invention.
Specific embodiment
Below by way of specific specific example and embodiments of the present invention are described with reference to the drawings, those skilled in the art can Understand further advantage and effect of the invention easily by content disclosed in the present specification.The present invention can also pass through other differences Specific example implemented or applied, details in this specification can also be based on different perspectives and applications, without departing substantially from Various modifications and change are carried out under spirit of the invention.
Fig. 1 is the system architecture diagram of microwave electric field strength meter of the present invention.As shown in Figure 1, a kind of microwave of the present invention Electric field intensity measuring device, comprising: the first photodetector 1, the second photodetector 9, rubidium steep 2, first laser device 4, second Laser 6, beam splitter 7, dichroic mirror 8, vacuum equipment 10, microwave source 5, oscillograph.
Wherein, the direction of the launch of first laser device 4, second laser 6 and microwave source 5 is towards rubidium bubble 2;Microwave source 5 is used In generation microwave electric field;Rubidium bubble 2 is used for the preparation of hot atom gas 3;Vacuum equipment 10 is for generating vacuum environment;Beam splitter 7 Between first laser device 4 and rubidium bubble 2, the setting of dichroic mirror 8 steeps 2 in second laser 6, the first photodetector 1 and rubidium for setting Between.
First laser device 4, the detection light for being 780nm for generation wavelength, the wavelength are the detection light of 780nm through beam splitter The identical Gaussian detection light of two beams is generated after 7, two-way detects light respectively by rubidium bubble 2 and vacuum equipment 10;Second laser 6, Generation wavelength is the coupling light of 480nm, and rubidium bubble 2 is entered after the reflection of dichroic mirror 8, for rubidium to be steeped to the hot atom in 2 from ground state Coherent excitation is to Rydberg states;First photodetector 1, for detecting the Gaussian by transmiting after rubidium bubble 2 and from dichroic mirror 8 Detect light;Second photodetector 9 detects light for detecting the Gaussian after passing through vacuum equipment 10;Oscillograph, for analyzing The dispersion relation that light the first photodetector 1 and the second photodetector 9 measure, determines the time difference of two-way transmitted light Obtain microwave electric field intensity.
In the specific embodiment of the invention, rubidium bubble 2 be glass evacuated chamber, it is glass evacuated it is intracavitary be high vacuum, with reduce make an uproar The influence of sound, and improve the accuracy of measurement.The hot atom gas 3 is transparent for realizing electromagnetically induced, makes by therein Detection light group velocity slows down.In the specific embodiment of the invention, hot atom gas is rubidium (Rb) steam, preferably, rubidium bubble 2 passes through Using the temperature of heating temperature control device control rubidium bubble, rubidium steam is heated to increase its optical thickness.
Preferably, the first photodetector 1 and the second photodetector 9 are all made of photomultiplier tube, and precision may be implemented Measurement.
When measurement, rubidium is steeped the intermediate state of hot atom in 2 and inner by the close coupling light that generates first with second laser 6 Moral fort state is coupled into two dressed states, and hot atom does generation quantum cancellation between the channel of two dressed state energy level transitions It relates to, results in the anti-absorption peak at atomic resonance frequency, realize that the electromagnetically induced of rubidium bubble 2 endogenous pyrogens is transparent.Hot atom provides Normal dispersion, group's refraction coefficient ng>=1, vg≤ c, i.e. pulse propagation velocity slow down.Heat when applying microwave electric field by detection in this way The dispersion relation of atom, measurement light pulse pass through the time difference of hot atom and reference path, microwave electric field intensity can be completed Measurement.
Fig. 2 is the level structure schematic diagram of hot atom.In the specific embodiment of the invention, the spy of the generation of first laser device 4 Survey light is Gaussian beam, and for the coupling light that second laser 6 generates for coupling intermediate state and Rydberg states, microwave electric field will be another Neighbouring Rydberg states are coupled on three-level EIT system, form a four-level system, which includes ground state level 5S1/2, intermediate state 5P3/2With two neighbour's Rydberg states.In Fig. 2,11 (| 0 >=5S1/2) be hot atom in state ground state, 12 (| 1 >=5P3/2) and 13 (| 2 >=53D5/2) be respectively state in hot atom intermediate state and Rydberg states, pass through the relevant of close coupling light Intermediate state and ground state, can be coupled into two dressed states, to realize that electromagnetically induced is transparent by operation.4 ' be the detection of wavelength 780nm Light, 6 ' be the coupling light of wavelength 480nm, and the effect for coupling light is that hot atom is energized into Rydberg states and realizes that electromagnetically induced is saturating It is bright;14 (| 3 >=54P3/2) it is an auxiliary Rydberg states (neighbouring with Rydberg states 13);15 be to act on 13 He of Rydberg states The microwave electric field between Rydberg states 14 is assisted, above-mentioned S, P and D indicate that orbital angular momentum is respectively 0,1,2 intratomic state.
Fig. 3 is a kind of step flow chart of microwave electric field strength measurement method of the present invention.Microwave electric field intensity of the present invention is surveyed The main thought of amount method is the measurement for converting the measurement of microwave electric field intensity to from the measurement of frequency dispersion relation, specific to wrap Include following steps:
Step 401, by first laser device generate detection light be divided into two bundles identical detection light, wherein a branch of detection light into Enter rubidium bubble, another beam detection light enters vacuum equipment;
Step 402, second laser generate coupling light enter rubidium bubble, coupling light and detect light by rubidium steep in hot atom Realize that electromagnetically induced is transparent from ground state coherent excitation to Rydberg states, and in atomic vapour room;
Step 403, the microwave electric field that microwave source generates is applied on hot atom, another neighbouring Rydberg states is coupled to On three-level EIT system, a four-level system is formed;
Step 404, the two-way transmitted light being emitted from rubidium bubble and vacuum equipment is separately detected, analysis two-way transmitted light is passed through Dispersion relation determines the time difference of two-way transmitted light, can be obtained microwave electric field intensity.
Specifically, the time difference of two-way transmitted light can be provided by the group velocity of light pulse in both media.Light arteries and veins The group velocity of punching depends on the polarization coefficient of medium, and then depends on the stiffness of coupling of microwave field and energy level, i.e. Rabi frequency Ωc, by measuring time difference Δ t, microwave electric field intensity to be measured, the pass of microwave electric field intensity E and delay time T can be found out System:
Wherein OD is the optical thickness of medium, and γ is spontaneous emission rate, ΩcFor the Rabi frequency for coupling light.
In conclusion microwave electric field strength measurement method of the present invention and measuring device are based on hot Rydberg atom and EIT Slow light effect, the dispersion relation of medium when applying microwave electric field by detection, measurement light pulse pass through EIT medium and reference path Time difference, realize the measurement of microwave electric field intensity.
The invention has the following beneficial effects:
1, microwave electric field measurement accuracy can be improved three to four by the measurement to transmission optical pulse dispersion relationship by the present invention Times, so that the accurate measurement research for microwave electric field provides new technical foundation;Meanwhile it not yet being sent out completely at detection light transmission peak It is estranged when splitting, still electric field can effectively be measured, so that making up current EIT and AT spectral measurement methods can not achieve more The defect of small electric field measurement.
2, the present invention is suitable for pyrogen subsystem, and method is easy, it is easy to accomplish.
3, the present invention is according to characteristic possessed by Rydberg atom state itself, as the natural width of spectral line is relatively narrow, the energy level longevity Life is long, small from High Rydberg state spontaneous transition to the probability of relatively low state, still has biggish eelctric dipole in weak electric field Square etc. can generate stronger interaction under weaker electric field, improve microwave electric field measurement accuracy.
4, the present invention has automatic calibration function, treats the physics ruler that micrometer wave electric jamming is smaller, independent of probe The advantages such as very little have broad application prospects and scientific research value for the epoch of current device miniaturization.
Anyone skilled in the art without departing from the spirit and scope of the present invention, repair above-described embodiment Decorations and change.Therefore, the scope of the present invention, should be as listed in the claims.

Claims (6)

1. a kind of microwave electric field strength measurement method, which comprises the steps of:
The detection light that first laser device generates is divided into two bundles identical detection light, wherein a branch of detection light enters rubidium bubble, it is another Beam detection light enters vacuum equipment;
The coupling light that second laser generates enters rubidium bubble, coupling light and detect light by rubidium steep in hot atom swash from ground state is relevant Rydberg states are dealt into, and realize that electromagnetically induced is transparent in atomic vapour room;
The microwave electric field that microwave source generates is applied on hot atom, another neighbouring Rydberg states are coupled to three-level EIT system On system, a four-level system is formed;
The two-way transmitted light being emitted from rubidium bubble and vacuum equipment is separately detected, by analyzing the dispersion relation of two-way transmitted light, really The time difference for determining two-way transmitted light can be obtained microwave electric field intensity.
2. microwave electric field strength measurement method as described in claim 1, which is characterized in that the calculating of microwave electric field intensity E is public Formula is as follows:
Wherein, τ is the time difference of two-way transmitted light, and OD is the optical thickness of medium, and γ is spontaneous emission rate, ΩcTo couple light Rabi frequency.
3. a kind of microwave electric field strength meter, it is characterised in that: including the first photodetector, the second photodetector, Rubidium bubble, first laser device, second laser, beam splitter, dichroic mirror, vacuum equipment, microwave source, oscillograph;
The direction of the launch of first laser device, second laser and microwave source is steeped towards rubidium;Microwave source is for generating microwave electric field; Rubidium bubble is used for the preparation of hot atom gas;Vacuum equipment is for generating vacuum environment;Beam splitter is arranged in first laser device and rubidium Between bubble, dichroic mirror setting is between second laser, the first photodetector and rubidium bubble;
The detection light that first laser device generates generates the identical Gaussian detection light of two beams after beam splitter, and two-way detects light difference Pass through rubidium bubble and vacuum equipment;Second laser generates coupling light and enters rubidium bubble after dichroic mirror reflects, used in steeping rubidium Hot atom is from ground state coherent excitation to Rydberg states;First photodetector, it is after being steeped for detection by rubidium and saturating from dichroic mirror The Gaussian detection light penetrated;Second photodetector detects light for detecting the Gaussian after passing through vacuum equipment;Oscillograph, The dispersion relation measured for analyzing the first photodetector and the second photodetector, determines the time difference of two-way transmitted light, It can be obtained microwave electric field intensity.
4. microwave electric field strength meter as claimed in claim 3, it is characterised in that: first photodetector and Two photodetectors are all made of photomultiplier tube.
5. microwave electric field strength meter as claimed in claim 3, it is characterised in that: the coupling that the second laser generates Light combination wavelength is 479nm-488nm.
6. microwave electric field strength meter as claimed in claim 3, it is characterised in that: the spy that the first laser device generates Survey a length of 780nm of light wave.
CN201710400038.1A 2017-05-31 2017-05-31 A kind of microwave electric field strength measurement method and measuring device Active CN107179450B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710400038.1A CN107179450B (en) 2017-05-31 2017-05-31 A kind of microwave electric field strength measurement method and measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710400038.1A CN107179450B (en) 2017-05-31 2017-05-31 A kind of microwave electric field strength measurement method and measuring device

Publications (2)

Publication Number Publication Date
CN107179450A CN107179450A (en) 2017-09-19
CN107179450B true CN107179450B (en) 2019-10-11

Family

ID=59835667

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710400038.1A Active CN107179450B (en) 2017-05-31 2017-05-31 A kind of microwave electric field strength measurement method and measuring device

Country Status (1)

Country Link
CN (1) CN107179450B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102513482B1 (en) 2017-12-18 2023-03-23 리드베르크 테크놀로지스 인코퍼레이티드 Atom-Based Electromagnetic Field Sensing Elements and Measurement Systems
CN109001137B (en) * 2018-09-21 2021-01-05 山东科技大学 Broadband light absorption method using microwave-assisted rydberg atoms
CN109163815B (en) * 2018-09-28 2020-08-18 华南师范大学 Millimeter wave detection method and device
CN109406889A (en) * 2018-11-06 2019-03-01 中国科学院电工研究所 A kind of field measurement device
CN110488265B (en) * 2019-07-08 2022-11-18 清远市天之衡传感科技有限公司 Radar speed measurement system and method based on Reedberg atom electromagnetic induction transparency effect
CN110488266B (en) * 2019-07-08 2023-03-21 清远市天之衡传感科技有限公司 Radar speed measurement system and method based on rydberg atom superheterodyne measurement
CN110261671B (en) * 2019-07-15 2021-07-27 中国计量科学研究院 Microwave power quantum measurement method and vacuum cavity measurement device
CN114424111B (en) 2019-10-24 2022-12-27 英国电讯有限公司 Apparatus and system for propagating a signal, and electromagnetic field detector and method of operating the same
CN111637833B (en) * 2020-06-03 2021-07-27 中国人民解放军国防科技大学 Angle measuring system and method based on electromagnetic induction transparent effect of rydberg atoms
GB2597260B (en) * 2020-07-16 2022-12-07 British Telecomm Electromagnetic field receiver
CN112098736B (en) * 2020-08-27 2023-09-29 北京无线电计量测试研究所 Method for measuring phase of microwave electric field
CN112098737B (en) * 2020-08-27 2023-09-29 北京无线电计量测试研究所 Method and device for measuring intensity of microwave electric field
CN112285444B (en) * 2020-09-25 2024-08-30 西安空间无线电技术研究所 Terahertz electric field measurement method, system and device
CN112532320B (en) * 2020-12-03 2022-04-01 湖北科技学院 Method for generating weak light low-speed stable light solitons
CN112615155B (en) * 2020-12-10 2024-11-05 清远市天之衡传感科技有限公司 Microwave antenna and radar based on Redberg atoms
CN113376449B (en) * 2021-06-08 2022-02-11 合肥衡元量子技术有限公司 Low-frequency microwave electric field sensor based on rydberg atoms and detection method
CN114942663B (en) * 2022-04-21 2023-10-20 华南师范大学 Current source feedback circuit based on atomic magnetometer
CN115407182A (en) * 2022-11-03 2022-11-29 华南师大(清远)科技创新研究院有限公司 All-optical microwave electric field near-field imaging device and method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103616571A (en) * 2013-12-07 2014-03-05 山西大学 Electric field detection method and device based on stark effects of Rydberg atoms
CN103616568A (en) * 2013-12-07 2014-03-05 山西大学 Microwave induction method and device based on Rydberg atoms
CN104880614A (en) * 2015-06-09 2015-09-02 华南师范大学 Microwave electric field intensity meter based on cold Rydberg atom interferometer and measuring method thereof

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016205330A1 (en) * 2015-06-15 2016-12-22 The Regents Of The University Of Michigan Atom-based electromagnetic radiation electric-field sensor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103616571A (en) * 2013-12-07 2014-03-05 山西大学 Electric field detection method and device based on stark effects of Rydberg atoms
CN103616568A (en) * 2013-12-07 2014-03-05 山西大学 Microwave induction method and device based on Rydberg atoms
CN104880614A (en) * 2015-06-09 2015-09-02 华南师范大学 Microwave electric field intensity meter based on cold Rydberg atom interferometer and measuring method thereof

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Spatial distribution measurement of the microwave electric field strength via the Autler-Townes effect of Rydberg atom;Liu Jiasheng等;《2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization(NEMO)》;IEEE;20160908;全文 *
基于里德堡原子的电场测量;黄巍等;《物理学报》;20150831;第64卷(第16期);全文 *

Also Published As

Publication number Publication date
CN107179450A (en) 2017-09-19

Similar Documents

Publication Publication Date Title
CN107179450B (en) A kind of microwave electric field strength measurement method and measuring device
Ackley et al. Neutron Star Extreme Matter Observatory: A kilohertz-band gravitational-wave detector in the global network
CN107329006A (en) A kind of microwave electric field strength measurement method and measurement apparatus
CN104880614B (en) Microwave electric field intensitometer and its measuring method based on cold Rydberg atom interferometer
Stamper et al. Faraday-rotation measurements of megagauss magnetic fields in laser-produced plasmas
CN103616571B (en) Based on electric field detecting method and the device of Rydberg atom Stark effect
CN102538775B (en) Cold atom beam interference gyro device
Hennequin et al. Doppler backscattering system for measuring fluctuations and their perpendicular velocity on Tore Supra
Consortini et al. Measuring inner scale of atmospheric turbulence by angle of arrival and scintillation
CN104568764A (en) Optical fiber evanescent wave form quartz enhanced photoacoustic spectrum sensor and gas measurement method
Du et al. Measurement of the velocity inside an all-fiber DBR laser by self-mixing technique
CN105043930A (en) Detection device and method for metal steam atomic density of microstructure alkali metal gas chambers
CN103454074B (en) Method for measuring reflectivity of small-aperture high-reflectivity mirror
CN111343778A (en) Method for measuring high wave number spectrum in plasma turbulence
Consortini et al. A mixed method for measuring the inner scale of atmospheric turbulence
CN107894395A (en) A kind of Aerosol Extinction Coefficients measuring method based on Research on Cavity Ring Down Spectroscopy
CN113608151B (en) Atomic magnetometer based on atomic vapor quantum association light source
Samuell et al. Verification of Doppler coherence imaging for 2D ion velocity measurements on DIII-D
CN105953929A (en) Single-pulse width and energy measurement device
CN111637833B (en) Angle measuring system and method based on electromagnetic induction transparent effect of rydberg atoms
CN110426653B (en) Method for measuring optical pumping rate
Love et al. Active probing of cloud multiple scattering, optical depth, vertical thickness, and liquid water content using Wide-Angle Imaging Lidar
Herbst et al. Studies of sidescatter and backscatter from pre‐ionized plasmas
US11415456B2 (en) Electromagnetic dosimeter
Liu et al. Comparison of three technique of Brillouin lidar for remote sensing of the ocean

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20211207

Address after: 511500 No. 01, floor t0114, industrial building, Tian'an Zhigu science and Technology Industrial Park, No. 18, Chuangxing Avenue, high tech Industrial Development Zone, Qingyuan City, Guangdong Province

Patentee after: Qingyuan tianzhiheng Quantum Technology Co.,Ltd.

Address before: 510000 No.55, Zhongshan Avenue West, Tianhe District, Guangzhou City, Guangdong Province

Patentee before: SOUTH CHINA NORMAL University

TR01 Transfer of patent right