CN112098737B - Method and device for measuring intensity of microwave electric field - Google Patents
Method and device for measuring intensity of microwave electric field Download PDFInfo
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- CN112098737B CN112098737B CN202010874926.9A CN202010874926A CN112098737B CN 112098737 B CN112098737 B CN 112098737B CN 202010874926 A CN202010874926 A CN 202010874926A CN 112098737 B CN112098737 B CN 112098737B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
Abstract
The invention provides a method and a device for measuring the intensity of a microwave electric field, wherein the measuring method comprises the following steps: the method is based on the quantum superheterodyne principle, is clear in principle, is easy to realize and apply, and utilizes the Redberg atoms as a microwave sensitive medium to realize high-sensitivity measurement of the intensity of the microwave electric field.
Description
Technical Field
The invention relates to the field of microwave electric field intensity measurement, in particular to a method and a device for measuring the microwave electric field intensity.
Background
High sensitivity measurement of microwave electric field intensity plays an important role in astronomy, communication, radar and other fields. At present, the intensity of the microwave electric field is usually measured by using an antenna, an electric field probe and other traditional sensor devices, and the detection sensitivity is about 1V/m. In recent years, with the development of quantum technology, research on a method for realizing high-sensitivity measurement of microwave electric field intensity by using quantum technology is started internationally.
The microwave electric field intensity measurement scheme based on quantum EIT-AT effect is limited by the width of a detection light transparent window, and the width of the detection light window is influenced by factors such as laser linewidth, photon shot noise, and Redberg atom decoherence, so that precise measurement of an extremely weak microwave electric field is difficult to realize.
Therefore, a measurement method is needed to solve the above problems.
Disclosure of Invention
In order to solve at least one of the above problems, the present invention provides a method for measuring the intensity of a microwave electric field, wherein atoms in a reed burg state are arranged at positions capable of sensing a local microwave electric field and a signal microwave electric field to be measured; and receiving a detection signal of a set frequency band or frequency after the detection light irradiates the atoms by using a detector, so as to determine the intensity of the signal microwave electric field according to the detection signal.
Further, the calculation formula of the microwave electric field intensity is as follows:
|E|＝E local area +E Signal signal cos(Δωt+Δφ)
Wherein E is Local area For local microwave electric field amplitude, E Signal signal The amplitude of the signal microwave electric field, delta omega is the frequency difference between the local microwave and the signal microwave, delta phi is the phase difference between the local microwave and the signal microwave, and the phase difference between the local microwave electric field and the signal microwave electric field is constant.
In some embodiments, the set frequency band or frequency is generated according to the frequency of the local microwave electric field and the signal microwave electric field to be measured; alternatively, the method further comprises: and acquiring the set frequency band or frequency.
In some embodiments, the atoms are obtained by exciting set atoms with the coupled light and the probe light.
In certain embodiments, the atom is a base atom.
The second aspect of the invention provides a measuring device for the intensity of a microwave electric field, which comprises an atomic air chamber, wherein atoms excited to a Redberg state are accommodated in the atomic air chamber, and the atomic air chamber is positioned at a position capable of inducing a local microwave electric field and a signal microwave electric field to be measured; and the detector receives a detection signal of a set frequency band or frequency after the detection light irradiates the atoms, so as to determine the intensity of the signal microwave electric field according to the detection signal.
In certain embodiments, a Redberg state atomic excitation component is also included to excite atoms in the atomic gas cell to the Redberg state.
In some embodiments, the reed-burg state atomic excitation assembly includes a probe light optical path unit and a coupled light optical path unit that cooperate to excite an atom in the atomic gas chamber to a reed-burg state by two photons.
In some embodiments, the probe light optical path unit includes: the linear polarization detection light emitted by the detection light laser sequentially passes through the first half-wave plate, the first laser isolator, the second half-wave plate, the first polarization beam splitter prism, the first reflecting mirror and the third half-wave plate and then enters the atomic gas chamber;
the coupled light path unit includes: the linear polarization coupling light emitted by the coupling light laser sequentially passes through the sixth half-wave plate, the second laser isolator, the fifth half-wave plate, the third polarization beam splitter prism and the dichroic mirror and then enters the atomic gas chamber;
after passing through the atomic gas chamber, the detection light sequentially passes through a dichroic mirror and a fourth half-wave plate and then enters the detector.
In some embodiments, the detector is a balanced homodyne detector, and the detection light generated by the balanced homodyne detector is split into two beams by a beam splitter, wherein one beam enters the balanced homodyne detector, and the other beam enters the balanced homodyne detector after being reflected by a second reflecting mirror.
The invention has the beneficial effects that:
the invention provides a method and a device for measuring the intensity of a microwave electric field, wherein the measuring method comprises the following steps: the method is based on the quantum superheterodyne principle, is clear in principle, is easy to realize and apply, and utilizes the Redberg atoms as a microwave sensitive medium to realize high-sensitivity measurement of the intensity of the microwave electric field.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the invention, and that other drawings can be obtained from them without inventive effort for a person skilled in the art.
Fig. 1 shows a schematic diagram of a method for measuring the intensity of a microwave electric field in an embodiment of the invention.
Fig. 2 shows a schematic diagram of a measuring apparatus for microwave electric field intensity in an embodiment of the present invention.
Reference numerals of fig. 2, 1, a probe light laser; 2. a first 1/2 wave plate; 3. a first laser isolator; 4. a second 1/2 wave plate; 5. a first polarization beam splitter prism; 6. a first mirror; 7. a third 1/2 wave plate; 8. a base atom gas chamber; 9. a local microwave module; 10. a signal microwave module; 11. a dichroic mirror; 12. a fourth 1/2 wave plate; 13. a second polarization beam splitter prism; 14. a second mirror; 15. a balanced homodyne detector; 16. a third polarization beam splitter prism; 17. a fifth 1/2 wave plate; 18. a second laser isolator; 19. a sixth 1/2 wave plate; 20. a coupled optical laser.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present invention without making any inventive effort, are intended to fall within the scope of the present invention.
As shown in fig. 1, the invention provides a method for measuring the intensity of a microwave electric field, which comprises the following steps:
s11: arranging atoms in a Redberg state at positions capable of inducing a local microwave electric field and a signal microwave electric field to be detected;
s12: and receiving a detection signal of a set frequency band or frequency after the detection light irradiates the atoms by using a detector, so as to determine the intensity of the signal microwave electric field according to the detection signal.
The invention provides a method for measuring the intensity of a microwave electric field, which is characterized in that atoms in a Redberg state are arranged at positions capable of sensing a local microwave electric field and a signal microwave electric field to be measured; the method is based on the quantum superheterodyne principle, utilizes the Redburg atom as a microwave sensitive medium to realize high-sensitivity measurement of the microwave electric field intensity, can obviously improve the measurement sensitivity of the microwave electric field intensity, has clear principle, simple structure and easy realization and application, breaks through the existing index, realizes the purpose of improving the measurement precision of the microwave electric field by one order of magnitude, and provides a new technical foundation for the precision measurement research of the microwave electric field intensity.
It is apparent to those skilled in the art that the reed-burg atom refers to a state of an atom in which an electron in the atom is excited to a higher number of main quanta on a larger-sized orbit than the ion entity, and the present invention utilizes this state to be extremely sensitive to the influence of a microwave electric field, to have an extremely reactive capability, and to easily react with microwave radiation.
In some embodiments, the present invention may use the pre-set reed-burg atoms, or the atoms in the atomic gas chamber may be excited to the reed-burg state by excitation, which is not limited herein.
It will be appreciated that the reed burg state requires two light beams formed by two-photon excitation, which may include probe light or may be separate light beams.
Preferably, the coupling light and the detection light couple light excite atoms in the atomic gas chamber to a reed-burg state by two-photon excitation.
Preferably, the atoms in the atomic gas chamber are rubidium atoms.
Further, the calculation formula of the microwave electric field intensity is as follows:
|E|＝E local area +E Signal signal cos(Δωt+Δφ)
Wherein E is Local area For local microwave electric field amplitude, E Signal signal The electric field amplitude of the signal microwaves is delta omega, which is the frequency difference between the local microwaves and the signal microwaves, and delta phi, which is the phase difference between the local microwaves and the signal microwaves.
Further, the phase difference between the local microwave electric field and the signal microwave electric field is constant.
In some embodiments, the signal in the probe light is a signal with a frequency equal to the frequency difference between the local microwave electric field and the signal microwave electric field, and the set frequency band or frequency can be generated according to the frequencies of the local microwave electric field and the signal microwave electric field to be detected; alternatively, the method further comprises: and acquiring the set frequency band or frequency, wherein the set frequency band or frequency is not limited in secondary.
Preferably, the signal frequency in the probe light is 100kHz.
Further, a detector is used for receiving a detection signal of a set frequency band or frequency after the detection light irradiates the atoms, so that the intensity of the signal microwave electric field is determined according to the detection signal.
Preferably, the detector is a balanced homodyne detector, the detection light generated by the balanced homodyne detector is divided into two beams by a beam splitter, one beam enters the balanced homodyne detector, and the other beam enters the balanced homodyne detector after being reflected by a second reflecting mirror, so that the measurement of the sensitivity of the microwave electric field intensity is realized.
According to the embodiment, the method is based on the quantum superheterodyne principle, utilizes the Redberg atoms as a microwave sensitive medium to realize high-sensitivity measurement of the microwave electric field intensity, can obviously improve the measurement sensitivity of the microwave electric field intensity, has clear principle, simple structure and easy realization and application, breaks through the existing index, and realizes the purpose of improving the measurement accuracy of the microwave electric field by one order of magnitude, thereby providing a new technical basis for the precise measurement research of the microwave electric field intensity.
Based on the same inventive concept, the present invention provides a measuring apparatus for microwave electric field intensity, as shown in fig. 2, and a structure and a measuring method of the measuring apparatus for microwave electric field intensity shown in fig. 2 are described in detail.
As shown in fig. 2, in the measuring device for the intensity of the microwave electric field, linearly polarized light emitted by the detection light laser 1 passes through the first half-wave plate 2 and the first laser isolator 3, so that the working mode of the detection light laser 1 is not affected by the feedback of a subsequent light path; the detection light passes through the second half wave plate 4 and the first polarization beam splitter prism 5 to adjust the intensity of the detection light; the detection light is reflected by the first reflecting mirror 6 and enters the alkali atom air chamber 8 through the third half-wave plate 7;
the linear polarization detection light emitted by the coupled light laser 20 passes through the sixth half-wave plate 19 and the second laser isolator 18, so that the working mode of the coupled light laser 20 is not affected by the feedback of a subsequent light path; the coupled light passes through a fifth half wave plate 17 and a third polarization beam splitter prism 16 to adjust the intensity of the detection light; the coupling light enters the alkali atom gas chamber 8 after being reflected by the dichroic mirror 11, and atoms in the alkali atom gas chamber 8 are excited to a Redberg state by the coupling light and the detection light through two-photon excitation;
the local microwave module 9 is used for generating a local microwave electric field in the alkali atom air chamber 8, the signal microwave module is used for generating a signal microwave electric field in the alkali atom air chamber 8, the signal microwave electric field is coupled to be near resonance at an atomic energy level, and the phase difference between the local microwave electric field and the signal microwave electric field is constant;
after passing through the dichroic mirror 11, the detection light is split into two beams through the fourth half-wave plate 12 and the second polarization beam splitting prism 13, one beam directly enters the balanced homodyne detector 15, and the other beam enters the balanced homodyne detector 15 after being reflected by the second reflecting mirror 14, so that the high-sensitivity measurement of the microwave electric field intensity is finally realized.
It is clear to those skilled in the art that the half-wave plate is used to rotate linearly polarized incoming light, because linearly polarized light is perpendicularly incident to the half-wave plate, the transmitted light is still linearly polarized light, and if the included angle between the vibration plane and the main cross section of the crystal is θ during incidence, the vibration plane of the transmitted linearly polarized light is rotated from the original orientation by 2θ. In the present invention, the half wave plates on the probe light path and the coupling light path may be two, three or one, and the present invention is not limited thereto.
It will be appreciated that the probe light laser and the coupled light laser both emit linearly polarized light.
It is clear to a person skilled in the art that the linearly polarized light vibrates in a light propagation direction, and the light vector vibrates in only one fixed direction, and the locus of the light vector end point is a straight line. The direction of the light vector and the propagation direction of the light form a plane, and the vibration plane of the linearly polarized light is fixed and cannot rotate.
In the specific embodiment of the invention, the balanced homodyne detector is used for subtracting quantum noise, has the special effects of low noise and high sensitivity, and can effectively detect the electric field intensity.
Preferably, the wavelength of the detection light generated by the detection light laser 1 is 780nm, and the stability of the laser frequency of the detection light and the narrowing of the laser line width are realized by using an ultra-stable cavity frequency stabilization method;
preferably, the wavelength of the coupling light generated by the coupling light laser 20 is 480nm, and the ultra-stable cavity frequency stabilization method is utilized to realize the stabilization of the coupling light laser frequency and the narrowing of the laser linewidth;
preferably, the local microwave electric field is constant in phase difference from the signal microwave electric field.
According to the embodiment, the invention provides a measuring device for the intensity of the microwave electric field, atoms in a Redberg state are arranged at positions capable of sensing a local microwave electric field and a signal microwave electric field to be measured, then a detector is used for receiving detection signals of a set frequency band or frequency after the detection light irradiates the atoms, and further the intensity of the signal microwave electric field can be determined according to the detection signals.
In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are referred to each other, and each embodiment is mainly described as different from other embodiments. In particular, for the device embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, as relevant to see the section of the method embodiments.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present specification. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example.
Furthermore, the various embodiments or examples described in this specification and the features of the various embodiments or examples may be combined and combined by those skilled in the art without contradiction. The above description is merely an embodiment of the present specification and is not intended to limit the present specification. Various modifications and changes may be made to the embodiments herein by those skilled in the art. Any modification, equivalent replacement, improvement, or the like, which is made within the spirit and principle of the embodiments of the present specification, should be included in the scope of the claims of the embodiments of the present specification.
Claims (9)
1. A method for measuring the intensity of a microwave electric field, comprising:
arranging atoms in a Redberg state at positions capable of inducing a local microwave electric field and a signal microwave electric field to be detected;
receiving a detection signal of a set frequency band or frequency after the detection light irradiates the atoms by using a detector, so as to determine the intensity of the signal microwave electric field according to the detection signal;
the calculation formula of the microwave electric field intensity is as follows:
|E|＝E local area +E Signal signal cos(Δωt+Δφ)
Wherein E is Local area For local microwave electric field amplitude, E Signal signal The amplitude of the signal microwave electric field, delta omega is the frequency difference between the local microwave and the signal microwave, delta phi is the phase difference between the local microwave and the signal microwave, and the phase difference between the local microwave electric field and the signal microwave electric field is constant.
2. The measurement method according to claim 1, characterized by further comprising:
generating the set frequency band or frequency according to the frequency of the local microwave electric field and the signal microwave electric field to be detected; alternatively, the method further comprises: and acquiring the set frequency band or frequency.
3. The measurement method according to claim 1, characterized by further comprising:
and exciting a set atom by using the coupling light and the detection light to obtain the atom.
4. The method of measurement according to claim 1, wherein the atom is a base atom.
5. A device for measuring the intensity of a microwave electric field, comprising:
an atomic air chamber which accommodates atoms excited to a Redberg state and is positioned at a position capable of inducing a local microwave electric field and a signal microwave electric field to be detected;
and the detector is used for receiving a detection signal of a set frequency band or frequency after the detection light irradiates the atoms so as to determine the intensity of the signal microwave electric field according to the detection signal.
6. The measurement device of claim 5, further comprising: and a Redberg state atom excitation component for exciting atoms in the atom gas chamber to the Redberg state.
7. The measurement device of claim 6, further comprising: the Redberg state atomic excitation assembly comprises a detection light optical path unit and a coupling light optical path unit, wherein the detection light optical path unit and the coupling light optical path unit are matched to excite atoms in the two-photon excited atomic gas chamber to the Redberg state.
8. The measuring apparatus according to claim 7, wherein,
the probe light optical path unit includes: the linear polarization detection light emitted by the detection light laser sequentially passes through the first half-wave plate, the first laser isolator, the second half-wave plate, the first polarization beam splitter prism, the first reflecting mirror and the third half-wave plate and then enters the atomic gas chamber;
the coupled light path unit includes: the linear polarization coupling light emitted by the coupling light laser sequentially passes through the sixth half-wave plate, the second laser isolator, the fifth half-wave plate, the third polarization beam splitter prism and the dichroic mirror and then enters the atomic gas chamber;
after passing through the atomic gas chamber, the detection light sequentially passes through a dichroic mirror and a fourth half-wave plate and then enters the detector.
9. The measuring apparatus according to claim 5, wherein,
the detector is a balanced homodyne detector, the detection light generated by the balanced homodyne detector is divided into two beams through a beam splitter, one beam enters the balanced homodyne detector, and the other beam enters the balanced homodyne detector after being reflected by a second reflecting mirror.
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| CN115561518B (en) * | 2022-11-16 | 2023-09-19 | 中国人民解放军国防科技大学 | Electromagnetic wave frequency measurement method and device based on Redberg atoms |
| CN116243059A (en) * | 2022-12-19 | 2023-06-09 | 中国科学院空间应用工程与技术中心 | Antenna near-field testing method based on Redburg atoms |
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