CN107107481B - 用于生成地制造三维结构件的设备 - Google Patents

用于生成地制造三维结构件的设备 Download PDF

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CN107107481B
CN107107481B CN201680005679.0A CN201680005679A CN107107481B CN 107107481 B CN107107481 B CN 107107481B CN 201680005679 A CN201680005679 A CN 201680005679A CN 107107481 B CN107107481 B CN 107107481B
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monitoring system
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CN107107481A (zh
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F·赫尔佐克
F·贝希曼
T·贝克斯
F·措伊尔纳
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Concept Laser Co ltd
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Abstract

本发明涉及一种用于生成地制造三维结构件(2)的设备、即激光熔化设备或激光烧结设备,其中,借助辐射(4)的作用通过熔化建造材料(5)通过依次固化各个由可固化的建造材料组成的层(3)来制造结构件(2),其中,通过点状或线状的能量输入产生的熔化区(6)在其尺寸形状方面和/或在其温度方面可通过过程监控系统的传感器装置(8)探测并由此可得到用于评估结构件质量的传感器值,其中,由熔化区产生的、用于产生传感器值的辐射(9)穿过用于熔化能量输入的扫描器并由扫描器引导到过程监控系统的传感器装置(8)上,其中,在介于扫描器(10)与过程监控系统的传感器装置(8)之间的、用于产生传感器值的光路上布置光学焦点跟踪装置(20),它可通过电子机器数据来控制以进行焦点跟踪。

Description

用于生成地制造三维结构件的设备
技术领域
本发明涉及一种用于生成地(generativen)制造三维结构件的设备,即激光烧结设备或激光熔化设备。
背景技术
在这种设备中,通过建造材料的熔合或熔化通过借助辐射的作用依次固化各个由建造材料尤其是粉末材料组成的层来制造结构件。通过点状或线状的能量输入产生的熔化区在它的尺寸、形状或温度方面通过传感器装置来探测。由此得到用于评估结构件质量的传感器值。通过熔化区产生的、用于产生传感器值的辐射穿过用于熔化能量输入的扫描器。这种设备例如由DE202010010771U1已知。
但是备选地,熔化束的焦点的改变也可以通过改变建造平面与扫描器光学系统之间的距离、即,通过降低和升高建造平台来进行。
发明内容
本发明基于的任务是,这样地设计一种用于生成地制造三维结构件的设备、即激光熔化设备或激光烧结设备,使得在激光焦点变化和与之伴随的激光焦斑变化的情况下,可以保证优化地实施过程监控。
按照本发明的设备首先包括这样一个装置:它使得焦点移动和进而还有光斑尺寸变化成为可能。这可以一方面通过所谓的3D-扫描光学系统来实现,利用该3D-扫描光学系统在过程中可以实现焦点调节、即激光焦斑的位于待熔化的表面上的光斑尺寸的改变。
此外规定,在设备的扫描器与过程监控系统的传感器装置之间布置光学的焦点跟踪装置,该焦点跟踪装置可以通过在设备中在工艺流程中所使用的电子的机器数据来控制以进行焦点跟踪。
通过这些措施使得过程监控系统的“视野”自动地适配于在熔斑的区域中在粉末表面上在过程中实际进行的情况。如果熔化束的焦斑扩大,那么自动地通过所使用的过程数据将过程监控系统的视角这样地扩宽,即,使得扩大的熔斑可以被过程监控系统完全地探测到,也就是说即使在其边缘区域也能被探测到,由此提供足够精确的数据用于过程监控。这同样适用于熔斑缩小的情况,此时通过电子机器数据控制的光学的焦点跟踪装置负责使缩小的熔池可以被精确地检查,这同样导致过程监控结果的显著改善。
例如通过手动调节过程监控系统的物镜系统而实现的手动跟踪可以被取消,过程监控过程自动地分别与使粉末熔化所用的焦点相适配。
用于过程监控系统的焦点跟踪的机器数据例如可以是设备的PC-扫描器控制卡的扫描器控制数据,在存在所谓的3D-扫描器的情况下PC-扫描器控制卡控制扫描器透镜的焦点。但是机器数据也可以是由建造过程参数导出的数据或包括由建造过程参数导出的数据。
焦点跟踪光学系统具有至少一个可机动地移动的光学聚焦元件,例如聚焦透镜,但是聚焦元件也可以设计成可机动地移动的透镜组。
为了在任何情况下确保改善过程监控,可以特别有利的是,过程监控系统的焦点跟踪光学系统在对被引导到粉末层上的熔化束的焦点调节之前实施。这意味着,扫描器数据首先执行过程监控系统的焦点调节,用于熔化束的焦点调节(其同样是通过机器数据来进行控制)在时间上跟随在过程监控系统的焦点调节之后。这可以通过简单的延迟电路或延迟控制来实现,所述延迟电路或延迟控制例如仅当过程监控系统已经被调节到新的焦点上时,才对熔化束进行焦点调节。
传感器装置可以包括多个光敏元件,所述多个光敏元件可以选择地或也可以共同地被引入到过程监控系统的光束中或一部分光束中。这可以通过转向镜、分束器或类似装置实现。如果使用分束器,那么可能的是,使传感器装置的多个或全部光敏元件并行地运行,并且必要时在不同的光谱范围内进行并行测量,该并行测量可以引入到过程监控中。可考虑的传感器范围例如为780-950nm的波长范围,另一个可能感兴趣的波长范围可以选择在1200nm左右。
在每种情况下都必须保证,在过程监控的区域中熔化束焦点调节通过焦点跟踪装置进行补偿。
附图说明
本发明借助于附图中的实施例进行详细解释。在该图中示出:
包括具有光学焦点跟踪的过程监控系统的激光熔化设备形式的、用于生成地制造三维结构件的设备的主要部件的示意图。
具体实施方式
在图1中示出的设备1用于生成地制造三维的结构件2,所述结构件通过建造材料5的熔化借助辐射4的作用通过依次固化可固化的建造材料的层3来制造。建造平面7中的通过点状或线状的能量输入产生的熔化区在它的尺寸形状方面和/或在它的温度方面通过过程监控系统的传感器装置8进行探测。由此得到用于评估结构件质量的传感器值,其中,通过熔化区产生的、用于产生传感器值的辐射9仿佛在向后的方向上穿过用于输入熔化能量的扫描器10,并且由该扫描器引导到过程监控系统的传感器装置8上。在过程监控系统中,由熔化区产生的、反射的辐射穿过扫描器沿向后的方向被引导到传感器装置上,这种过程监控系统称为所谓的同轴的过程监控系统,这是因为从激光器发出的用于能量输入的辐射和用于过程监控系统的经反射的辐射同轴地穿过扫描器。
传感器装置8可以包括摄像机15或光电二极管16,或者也可以包括多个光敏元件,其中,可以规定,用于产生传感器值的辐射9穿过分束器17,所述分束器将辐射例如分布到摄像机或光电二极管或另外的光敏元件上。
按照本发明,在扫描器10和过程监控系统的传感器装置8之间布置光学的焦点跟踪装置20,所述焦点跟踪装置可以通过电子的机器数据21、22重新调节以进行焦点跟踪。
焦点跟踪装置包括至少一个可机动地调节的光学聚焦元件,例如可机动地移动的透镜组23,用于实施对用于产生传感器值的辐射9的再聚焦。
当设备的至少包括辐射源和扫描器的光路配备有用于熔化束焦点调节的光学调节装置30,或者熔化束的焦点调节通过机械地移动建造平面7来进行时,实施所述再聚焦。
机器数据一方面可以是或者可以包括来自扫描器控制卡的扫描器控制数据,其中,这种扫描器控制数据主要在Z-轴聚焦方面影响3D-扫描器。
但是机器数据也可以是或者可以包括由建造过程参数导出的数据、尤其是用于对建造平面的高度进行调节的数据,这是因为建造平面的高度调节同样导致熔化束的散焦。
通过被输送给焦点跟踪装置20的机器数据,可以在时间上如此进行控制:即,利用焦点跟踪装置20进行的对用于产生传感器值的辐射9的焦点跟踪在3D-扫描器10的Z-轴调节之前实现,或导致建造平面的高度调节。由此保证,在应用激光辐射并且由此产生待被监控的熔池时,用于产生传感器值的辐射9已经在其焦点方面被优化。
为了能够评价传感器装置8的数据、即来自摄像机15的摄像机数据和来自光电二极管16的传感器数据,设置处理器单元,在该处理器单元中数据可以被处理、存储和必要时转换成一种使3D-数据例如用于逆向工程而能够可视化的格式。
附图标记列表:
1 设备
2 结构件
3 层
4 辐射
5 建造材料
7 建造平面
8 传感器装置
9 辐射
10 扫描器
15 摄像机
16 光电二极管
17 分束器
20 焦点跟踪装置
21 机器数据
22 机器数据
23 透镜组
30 光学调节装置

Claims (13)

1.一种用于生成地制造三维结构件(2)的设备、即激光熔化设备或激光烧结设备,在该设备中,借助辐射(4)的作用通过建造材料(5)的熔化通过依次固化各个由能固化的建造材料组成的层(3)来制造所述结构件(2),其中,通过点状或线状的能量输入产生的熔化区(6)在其尺寸形状方面和/或在温度方面能通过过程监控系统的传感器装置(8)来探测,并由此能得到用于评估结构件质量的传感器值,其中,由熔化区产生的、用于产生传感器值的辐射(9)穿过用于输入熔化能量的扫描器,并由所述扫描器引导到过程监控系统的传感器装置(8)上,其特征在于,在介于扫描器(10)与过程监控系统的传感器装置(8)之间的、用于产生传感器值的光路上布置有光学的焦点跟踪装置(20),所述焦点跟踪装置能由电子的机器数据进行控制以进行焦点跟踪。
2.根据权利要求1所述的设备,其特征在于,所述设备的至少包括辐射源和扫描器的光路配备有用于熔化束焦点调节的光学调节装置(30)。
3.根据权利要求1或2所述的设备,其特征在于,熔化束(4)的焦点调节通过机械地移动建造平面(7)来实施。
4.根据权利要求1或2所述的设备,其特征在于,机器数据是PC-扫描器控制卡的扫描器控制数据或包括PC-扫描器控制卡的扫描器控制数据。
5.根据权利要求1或2所述的设备,其特征在于,机器数据是从建造过程参数中导出的数据或包括从建造过程参数中导出的数据。
6.根据权利要求1或2所述的设备,其特征在于,焦点跟踪光学系统具有至少一个能以电机驱动的方式移动的光学的聚焦元件。
7.根据权利要求6所述的设备,其特征在于,聚焦元件被构造成能以电机驱动的方式移动的透镜组。
8.根据权利要求1或2所述的设备,其特征在于,通过焦点跟踪光学系统,过程监控系统的焦点调节能在对被引导到粉末层上的熔化束的焦点调节之前实施。
9.根据权利要求1或2所述的设备,其特征在于,传感器装置(8)包括多个光敏元件(15,16),所述多个光敏元件能选择地或共同地被引入过程监控系统的光束中。
10.根据权利要求1或2所述的设备,其特征在于,过程监控系统的传感器被设计用于780nm-950nm的波长范围。
11.根据权利要求1或2所述的设备,其特征在于,传感器被设计用于1200nm左右的波长范围。
12.根据权利要求1或2所述的设备,其特征在于,从多个传感器中导出的电子信号在一个过程监控系统中并行地进行处理。
13.根据权利要求1或2所述的设备,其特征在于,焦点跟踪装置的焦点跟踪被设计用于对离开扫描器的熔化束的熔化束焦点调节进行补偿。
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