CN110394981A - 用于生成地制造三维结构件的设备 - Google Patents

用于生成地制造三维结构件的设备 Download PDF

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CN110394981A
CN110394981A CN201910661202.3A CN201910661202A CN110394981A CN 110394981 A CN110394981 A CN 110394981A CN 201910661202 A CN201910661202 A CN 201910661202A CN 110394981 A CN110394981 A CN 110394981A
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radiation
focal adjustments
fusing
monitoring system
sensor device
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F·赫尔佐克
F·贝希曼
T·贝克斯
F·措伊尔纳
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Concept Laser Co ltd
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Abstract

本发明涉及用于生成地制造三维结构件(2)的设备，包括：构造成发射熔化束的激光器(4)，熔化束包括构造成熔化并因此依次固化各个建造材料的层(3)的辐射，建造材料的层分别限定建造平面(7)，来自熔化束的辐射在建造平面(7)中产生熔化区(6)；过程监控系统(20)，包括传感器装置(8)，其构造成从熔化区(6)检测的反射的辐射(9)生成传感器值，指示与熔化区(6)和/或结构件(2)的质量对应的尺寸、形状和/或温度；光学的焦点跟踪装置(20)，能够通过至少部分地从传感器值导出的电子机器数据控制，以对由过程监控系统(20)检测的反射的辐射(9)进行第一焦点调节，然后对由激光器(4)发射的熔化束进行第二焦点调节。

Description

用于生成地制造三维结构件的设备
本申请是2016年01月12日提交的，申请号为201680005679.0，发明名称为“用于生成地制造三维结构件的设备”的专利申请的分案申请。
技术领域
本发明涉及一种具有权利要求1的进一步特征的、用于生成地(generativen)制造三维结构件的设备，即激光烧结设备或激光熔化设备。
背景技术
在这种设备中，通过建造材料的熔合或熔化通过借助辐射的作用依次固化各个由建造材料尤其是粉末材料组成的层来制造结构件。通过点状或线状的能量输入产生的熔化区在它的尺寸、形状或温度方面通过传感器装置来探测。由此得到用于评估结构件质量的传感器值。通过熔化区产生的、用于产生传感器值的辐射穿过用于熔化能量输入的扫描器。这种设备例如由DE202010010771U1已知。
但是备选地，熔化束的焦点的改变也可以通过改变建造平面与扫描器光学系统之间的距离、即，通过降低和升高建造平台来进行。
发明内容
本发明基于的任务是，这样地设计一种具有权利要求1的前序部分的特征的设备，使得在激光焦点变化和与之伴随的激光焦斑变化的情况下，可以保证优化地实施过程监控。这个任务通过权利要求1的特征部分的特征解决，有利的扩展方案由从属权利要求中得出。
按照本发明的设备首先包括这样一个装置：它使得焦点移动和进而还有光斑尺寸变化成为可能。这可以一方面通过所谓的3D-扫描光学系统来实现，利用该3D-扫描光学系统在过程中可以实现焦点调节、即激光焦斑的位于待熔化的表面上的光斑尺寸的改变。
此外规定，在设备的扫描器与过程监控系统的传感器装置之间布置光学的焦点跟踪装置，该焦点跟踪装置可以通过在设备中在工艺流程中所使用的电子的机器数据来控制以进行焦点跟踪。
通过这些措施使得过程监控系统的“视野”自动地适配于在熔斑的区域中在粉末表面上在过程中实际进行的情况。如果熔化束的焦斑扩大，那么自动地通过所使用的过程数据将过程监控系统的视角这样地扩宽，即，使得扩大的熔斑可以被过程监控系统完全地探测到，也就是说即使在其边缘区域也能被探测到，由此提供足够精确的数据用于过程监控。这同样适用于熔斑缩小的情况，此时通过电子机器数据控制的光学的焦点跟踪装置负责使缩小的熔池可以被精确地检查，这同样导致过程监控结果的显著改善。
例如通过手动调节过程监控系统的物镜系统而实现的手动跟踪可以被取消，过程监控过程自动地分别与使粉末熔化所用的焦点相适配。
用于过程监控系统的焦点跟踪的机器数据例如可以是设备的PC-扫描器控制卡的扫描器控制数据，在存在所谓的3D-扫描器的情况下PC-扫描器控制卡控制扫描器透镜的焦点。但是机器数据也可以是由建造过程参数导出的数据或包括由建造过程参数导出的数据。
焦点跟踪光学系统具有至少一个可机动地移动的光学聚焦元件，例如聚焦透镜，但是聚焦元件也可以设计成可机动地移动的透镜组。
为了在任何情况下确保改善过程监控，可以特别有利的是，过程监控系统的焦点跟踪光学系统在对被引导到粉末层上的熔化束的焦点调节之前实施。这意味着，扫描器数据首先执行过程监控系统的焦点调节,用于熔化束的焦点调节(其同样是通过机器数据来进行控制)在时间上跟随在过程监控系统的焦点调节之后。这可以通过简单的延迟电路或延迟控制来实现，所述延迟电路或延迟控制例如仅当过程监控系统已经被调节到新的焦点上时，才对熔化束进行焦点调节。
传感器装置可以包括多个光敏元件，所述多个光敏元件可以选择地或也可以共同地被引入到过程监控系统的光束中或一部分光束中。这可以通过转向镜、分束器或类似装置实现。如果使用分束器，那么可能的是，使传感器装置的多个或全部光敏元件并行地运行，并且必要时在不同的光谱范围内进行并行测量，该并行测量可以引入到过程监控中。可考虑的传感器范围例如为780-950nm的波长范围，另一个可能感兴趣的波长范围可以选择在1200nm左右。
在每种情况下都必须保证，在过程监控的区域中熔化束焦点调节通过焦点跟踪装置进行补偿。
附图说明
本发明借助于附图中的实施例进行详细解释。在该图中示出:
包括具有光学焦点跟踪的过程监控系统的激光熔化设备形式的、用于生成地制造三维结构件的设备的主要部件的示意图。
具体实施方式
在图1中示出的设备1用于生成地制造三维的结构件2，所述结构件通过建造材料5的熔化借助辐射4的作用通过依次固化可固化的建造材料的层3来制造。建造平面7中的通过点状或线状的能量输入产生的熔化区6在它的尺寸形状方面和/或在它的温度方面通过过程监控系统的传感器装置8进行探测。由此得到用于评估结构件质量的传感器值，其中，通过熔化区6产生的、用于产生传感器值的辐射9仿佛在向后的方向上穿过用于输入熔化能量的扫描器10，并且由该扫描器引导到过程监控系统的传感器装置8上。在过程监控系统中，由熔化区产生的、反射的辐射穿过扫描器沿向后的方向被引导到传感器装置上，这种过程监控系统称为所谓的同轴的过程监控系统，这是因为从激光器发出的用于能量输入的辐射和用于过程监控系统的经反射的辐射同轴地穿过扫描器。
传感器装置8可以包括摄像机15或光电二极管16，或者也可以包括多个光敏元件，其中，可以规定，用于产生传感器值的辐射9穿过分束器17，所述分束器将辐射例如分布到摄像机或光电二极管或另外的光敏元件上。
按照本发明，在扫描器10和过程监控系统的传感器装置8之间布置光学的焦点跟踪装置20，所述焦点跟踪装置可以通过电子的机器数据21、22重新调节以进行焦点跟踪。
焦点跟踪装置包括至少一个可机动地调节的光学聚焦元件，例如可机动地移动的透镜组23，用于实施对用于产生传感器值的辐射9的再聚焦。
当设备的至少包括辐射源和扫描器的光路配备有用于熔化束焦点调节的光学调节装置3，或者熔化束的焦点调节通过机械地移动建造平面7来进行时，实施所述再聚焦。
机器数据一方面可以是或者可以包括来自扫描器控制卡的扫描器控制数据，其中，这种扫描器控制数据主要在Z-轴聚焦方面影响3D-扫描器。
但是机器数据也可以是或者可以包括由建造过程参数导出的数据、尤其是用于对建造平面的高度进行调节的数据，这是因为建造平面的高度调节同样导致熔化束的散焦。
通过被输送给焦点跟踪装置20的机器数据，可以在时间上如此进行控制：即，利用焦点跟踪装置20进行的对用于产生传感器值的辐射9的焦点跟踪在3D-扫描器10的Z-轴调节之前实现，或导致建造平面的高度调节。由此保证，在应用激光辐射并且由此产生待被监控的熔池时，用于产生传感器值的辐射9已经在其焦点方面被优化。
为了能够评价传感器装置8的数据、即来自摄像机15的摄像机数据和来自光电二极管16的传感器数据，设置处理器单元，在该处理器单元中数据可以被处理、存储和必要时转换成一种使3D-数据例如用于逆向工程而能够可视化的格式。
附图标记列表：
1 设备
2 结构件
3 层
4 辐射
5 建造材料
6 熔化区
7 建造平面
8 传感器装置
9 辐射
10 扫描器
15 摄像机
16 光电二极管
17 分束器
20 焦点跟踪装置
21 机器数据
22 机器数据
23 透镜组

Claims (19)

1.一种用于生成地制造三维结构件(2)的设备，其特征在于，所述设备包括：
激光器(4)，所述激光器被构造成发射熔化束，所述熔化束包括被构造成熔化并因此依次固化各个建造材料的层(3)的辐射，所述建造材料的层分别限定建造平面(7)，来自所述熔化束的所述辐射在所述建造平面(7)中产生熔化区(6)；
过程监控系统(20)，所述过程监控系统包括传感器装置(8)，所述传感器装置被构造成从所述熔化区(6)检测到的反射的辐射(9)生成传感器值，所述传感器值指示与所述熔化区(6)和/或结构件(2)的质量对应的尺寸、形状和/或温度；以及
光学的焦点跟踪装置(20)，所述光学的焦点跟踪装置能够通过至少部分地从所述传感器值导出的电子机器数据控制，以对由所述过程监控系统(20)检测到的反射的辐射(9)进行第一焦点调节，然后对由所述激光器(4)发射的所述熔化束进行第二焦点调节。
2.根据权利要求1所述的设备，其特征在于，其中至少部分地通过机械调节所述建造平面(7)来执行所述第二焦点调节。
3.根据权利要求1或2所述的设备，其特征在于，包括：
光学调节装置(30)，所述光学调节装置布置在所述熔化束的路径上，其中至少部分地通过所述光学调节装置(30)来执行所述第二焦点调节。
4.根据权利要求1-3中任一项所述的设备，其特征在于，其中所述过程监控系统包括延迟电路或延迟控制，所述延迟电路或延迟控制被构造成在所述第一焦点调节之后执行所述第二焦点调节。
5.根据权利要求1-4中任一项所述的设备，其特征在于，其中所述光学的焦点跟踪装置(20)包括能够通过电机移动的透镜组。
6.根据权利要求1-5中任一项所述的设备，其特征在于，其中所述传感器装置(8)包括多个光敏元件(15，16)。
7.根据权利要求1-6中任一项所述的设备，其特征在于，其中所述传感器装置(8)的至少一部分被构造成用于780nm-950nm的波长范围。
8.根据权利要求1-7中任一项所述的设备，其特征在于，其中所述传感器装置(8)的至少一部分被构造成用于1200nm左右的波长范围。
9.根据权利要求1-8中任一项所述的设备，其特征在于，其中所述传感器装置(8)包括摄像机(15)，光电二极管(16)，和分束器(17)，所述分束器被构造成将所述反射的辐射(9)的第一部分导向所述摄像机(15)并将所述反射的辐射(9)的第二部分导向所述光电二极管(16)。
10.一种生成地制造三维结构件的方法，其特征在于，所述方法包括：
发射熔化束，所述熔化束包括来自激光器(4)的辐射，所述熔化束被构造成熔化并因此依次固化连续的建造材料的层(3)，所述建造材料的层分别限定建造平面(7)，所述熔化束在所述建造平面(7)中产生熔化区(6)；
利用过程监控系统(20)检测来自所述熔化区(6)的反射的辐射(9)，所述过程监控系统包括传感器装置(8)，所述传感器装置被构造成生成传感器值，所述传感器值指示与所述熔化区(6)和/或结构件(2)的质量对应的尺寸、形状和/或温度；
使用光学的焦点跟踪装置(20)对通过所述过程监控系统(20)检测到的反射的辐射(9)进行第一焦点调节，所述光学的焦点跟踪装置能够通过至少部分地从所述传感器值导出的电子机器数据控制；以及
在所述第一焦点调节之后，对由所述激光器(4)发射的所述熔化束进行第二焦点调节。
11.根据权利要求10所述的方法，其特征在于，其中进行所述第二焦点调节包括机械地调节所述建造平面(7)。
12.根据权利要求10或11所述的方法，其特征在于，其中进行所述第二焦点调节包括移动布置在所述熔化束的路径上的光学调节装置(30)。
13.根据权利要求10-12中任一项所述的方法，其特征在于，其中所述过程监控系统包括延迟电路或延迟控制，所述延迟电路或延迟控制被构造成在所述第一焦点调节之后进行所述第二焦点调节。
14.根据权利要求10-13中任一项所述的方法，其特征在于，其中进行第一焦点调节包括使用电机移动所述光学的焦点跟踪装置(20)的透镜组。
15.根据权利要求10-14中任一项所述的方法，其特征在于，其中所述传感器装置(8)包括多个光敏元件(15，16)。
16.根据权利要求10-15中任一项所述的方法，其特征在于，其中所述传感器装置(8)的至少一部分被构造用于780nm-950nm的波长范围。
17.根据权利要求10-16中任一项所述的方法，其特征在于，其中所述传感器装置(8)的至少一部分被构造用于1200nm左右的波长范围。
18.根据权利要求10-17中任一项所述的方法，其特征在于，其中所述传感器装置(8)包括摄像机(15)，光电二极管(16)，和分束器(17)，所述分束器被构造成将所述反射的辐射(9)的第一部分导向所述摄像机(15)并将所述反射的辐射(9)的第二部分导向所述光电二极管(16)。
19.一种计算机可读介质，其特征在于，所述计算机可读介质包括计算机可执行指令，当由处理器执行所述计算机可执行指令时，所述计算机可执行指令使所述处理器执行如权利要求10-18中任一项所述的方法。
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CN107107481B (zh) 2019-08-20
CN107107481A (zh) 2017-08-29
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US11179806B2 (en) 2021-11-23
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