CN107102173A - The caliberating device and method of a kind of chirp grating based on probe beam deflation principle - Google Patents
The caliberating device and method of a kind of chirp grating based on probe beam deflation principle Download PDFInfo
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- CN107102173A CN107102173A CN201710479439.0A CN201710479439A CN107102173A CN 107102173 A CN107102173 A CN 107102173A CN 201710479439 A CN201710479439 A CN 201710479439A CN 107102173 A CN107102173 A CN 107102173A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
- G01P21/02—Testing or calibrating of apparatus or devices covered by the preceding groups of speedometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
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Abstract
The invention discloses a kind of caliberating device of chirp grating based on probe beam deflation principle and method, belong to field of sensor calibration.Light source is used as using tunable narrow-band laser, interfered using Michelson's interferometer, the interference signal frequency and reflection point position in interferometer of return are linear, sweep light wavelength scanning range covers the wave-length coverage of chirp grating, the interval interference signal of different wave length is demodulated, the corresponding grid region position of the range of wavelengths can be obtained, the relation of chirped grating length and wavelength is can obtain, so as to obtain chirped grating length, chirp rate.The present invention is simple to operate, and measurement is accurate, and is non-cpntact measurement, to grating without damage.
Description
Technical field
The invention belongs to the technical field of transducer calibration, and in particular to a kind of chirped light based on probe beam deflation principle
The caliberating device and method of grid.
Background technology
Detonation wave is a kind of a kind of strong shock wave for carrying high-speed chemical reaction zone, being propagated in explosive, detonation wave
Speed abbreviation explosion velocity, general is one of important characterisitic parameter of explosive up to several thousand metres/second, to research explosive property, blast
During energy transmission etc. it is significant.
The measurement of explosion velocity can use chirp grating method, and chirp grating (CFBG) belongs to one kind of fibre optical sensor.Utilize
When chirp grating surveys detonation wave velocity, detonation wave is acted on chirp grating, reduces the length of grating, return signal light intensity subtracts
It is weak, the continuous velocity of detonation wave can be measured using this phenomenon.
For solving speed, it is necessary to which the length to chirp grating is demarcated, the length value of chirp grating is obtained.And it is long
The whether accurate precision for directly influencing the speed finally tried to achieve of degree.
The scaling method of conventional chirp grating has two kinds at present, and the first is patterning method, is taken with one in a collection of grating
Root is cut, each cutting position and the light intensity magnitude returned by recording, to obtain the length of chirp grating.But this
There is a fatal defect in the method for kind, that is, this demarcation is destructive, has demarcated rear grating and has also damaged, it is impossible to has continued
Use, in addition, the method is just the same being regarded as with batch of grating, although being actually with a collection of grating, individual
Between still have difference.It is for second thermoprobe method, this method observes the reflectance spectrum of chirp grating using spectrometer, when with heat
Position on probe contact grating grid region, the corresponding reflectance spectrum in contact site can produce depression, and after thermal probe is removed, depression disappears
Lose, restore to the original state, record the ripple that a series of chirped grating reflection on the contact positions and correspondence spectrometer of probe composes recessed location
Long data, by carrying out linear relationship and overall length that linear fit can obtain chirped grating length and wavelength to wavelength data
Degree, although this method will not cause expendable infringement to grating, larger error is easily produced in artificial calibration process, this
High speed detonation wave data noise can directly be caused.
The content of the invention
In order to solve the above problems, the present invention proposes a kind of caliberating device of the chirp grating based on probe beam deflation principle
And method, this method is simple to operate, can carry out accurate calibration to chirp grating in the non-contact case, be a kind of brand-new
Scaling method.
The technical solution adopted by the present invention is：A kind of caliberating device of the chirp grating based on probe beam deflation principle, should
Device is by tunable narrow-band laser as light source, and two Michelson's interferometers are interfered respectively as main interferometer and auxiliary
Instrument, opto-electronic conversion is carried out using photodetector, and acquisition system is returned by light source scanning trigger signal triggering collection, auxiliary interferometer
The interference signal returned is used as system sampling clock；
The tunable narrow-band laser is used to provide linear scan light, enters main interferometer and auxiliary by coupler light splitting
Interferometer, is the basis that the device realizes difference frequency interference；
The scanning trigger signal is Transistor-Transistor Logic level pulse signal, and it starts in scanning and entered afterwards every fixed wave length
Row triggering, it is that triggering collection system starts to gather and determines the interval corresponding time-domain signal of different wave length that it, which is acted on,；
The main interferometer is Michelson's interferometer, by the 2nd 1:1 coupler, two main interferometer interfere arms, one
Fiber reflector is constituted, and sweeping laser is from the 2nd 1:The port of 1 coupler enters the 2nd 1:1 coupler, the 2nd 1:1 coupler will
Light is divided into two beams into two interfere arms, and two interfere arms are main interferometer reference arm (11) and main interferometer pickup arm (13), trunk
Interferometer reference arm end is connected to fiber reflector and returns to light, and chirp grating, grating return pair are connected with main interferometer pickup arm
The laser of wavelength is answered, two interfere arm return lights are the 2nd 1:Occur in 1 coupler after difference frequency interference by the 2nd 1:The end of 1 coupler
Mouth output enters the first photodetector, and the first photodetector output electric signal is gathered by data collecting system；
The auxiliary interferometer is Michelson's interferometer, by the 1st:1 coupler, two auxiliary interferometer interfere arms and
Two fiber reflectors composition, sweeping laser is from the 1st:The port of 1 coupler enters the 1st:1 coupler, the 1st:1 coupling
Device splits the light into two beams into two auxiliary interferometer interfere arms, and two auxiliary interferometer interfere arm ends are all connected to fiber reflector,
Two-beam is returned and the 1st by speculum respectively:Occur in 1 coupler after difference frequency interference by the 1st:The port of 1 coupler
Output enters the second photodetector, and the second photodetector output signal is believed into data collecting system as sampling clock
Number, the difference frequency interference signal and the auxiliary interferometer interfere arm arm length difference of Michelson two are proportional, are determined by Nyquist
Reason knows that sample frequency is necessarily equal to or more than twice of signal frequency, therefore auxiliary interferometer arm length difference must be equal to or more than trunk
Twice of interferometer arm length difference；
The difference frequency interference light that the auxiliary interferometer is returned reflects the nonlinear change of laser sweep light frequency, and it is made
For the device sampling clock can correct light source frequency sweep it is non-linear.
Wherein, the device uses Michelson's interferometer, and the forward direction light path and return light path of Michelson's interferometer are symmetrical,
Light round-trip transmission in arm can eliminate influence of the optical fiber rotation effect to laser polarization state, be led so as to eliminate by polarization state change
Cause the decay of interference signal.
The present invention also provides a kind of scaling method of the chirp grating based on probe beam deflation principle, and this method step is such as
Under：
Step 1：Tunable narrow-band laser sends linear scan laser, and scanning sends scanning trigger signal triggering when starting
Acquisition system carries out data acquisition, and sweep light enters 95:5 couplers, wherein 5% light enters auxiliary interferometer, 95% light
Into main interferometer；
Step 2：The difference frequency interference light that auxiliary interferometer is returned is converted to electric signal output as signal by photodetector
The sampling clock of acquisition system；
Step 3：The interference signal that main interferometer is returned is collected system acquisition as transducing signal, and it includes tested chirp
The wavelength and positional information of grating；
Step 4：Acquisition system is acquired to scanning trigger signal, and it starts in laser scans and afterwards every fixation
Wavelength sends TTL pulse level, can be by it is determined that the interval corresponding interference signal of different wave length；
Step 5：Data are handled, chirp grating wavelength and the corresponding relation of position is obtained, chirp grating mark is realized
It is fixed.
Wherein, using optical frequency domain reflection technology, laser wavelength scanning scope covering chirp grating wave-length coverage, different ripples
Long interval difference frequency interference signal includes positional information of the range of wavelengths in chirp grating, by each range of wavelengths signal solution
Tune can obtain chirp grating Wavelength distribution, also can directly calibrate the beginning and end in chirp grating grid region.
The advantage of the present invention compared with prior art is：
The present invention wavelength-positional information each to chirp grating can be demarcated under noncontact condition, can be by intending
The linear relationship for obtaining wavelength-position is closed, the beginning and end in grating grid region can also be directly calibrated, calibration process will not be right
Grating causes any damage, and simple to operate, compared with prior art, is a kind of new chirped light without complicated process
Grid scaling method.
Brief description of the drawings
Fig. 1 is to demarcate chirp grating system diagram based on probe beam deflation principle；
In figure：1st, tunable narrow-band laser；
2、95:5 couplers；
3rd, the one 1:1 coupler；
4th, the interfere arm of auxiliary interferometer first；
5th, the first fiber reflector；
6th, the interfere arm of auxiliary interferometer second；
7th, the second fiber reflector；
8th, the first photodetector；
9th, data collecting system；
10th, the 2nd 1:1 coupler；
11st, main interferometer reference arm；
12nd, the 3rd fiber reflector；
13rd, main interferometer pickup arm；
14th, chirp grating；
15th, the second photodetector；
16th, computer；
17th, laser scans trigger signal；
18th, auxiliary interferometer；
19th, main interferometer.
Embodiment
The embodiment to the present invention is described below in conjunction with the accompanying drawings, to more fully understand the present invention.Should
, it is emphasized that what the description below was merely exemplary, the scope being not intended to be limiting of the invention and its application.
Chirp grating scaling method corollary apparatus in the present invention as shown in figure 1, tunable narrow-band laser 1 send frequency sweep swash
Light enters one 95:5 couplers 2, coupler splits the light into two beams, and 5% light enters auxiliary interferometer 18, and auxiliary interferometer is defeated
The beat frequency interference gone out enter the first photodetector 8 be converted to electric signal output as data collecting system 9 sample reference when
Clock；Other 95% light enters main interferometer 19, and the interference light that main interferometer is returned is made to change into the second photodetector 15
System acquisition is collected for electric signal, then is carried out with computer 16 handling the wavelength for obtaining chirp grating and position relationship.
Laser scans trigger signal 17 exports a pulse after swept light source starts scanner uni every fixed wave length
Level, it, which is acted on, two, and one is that triggering collection system is acquired when scanning beginning, and two be by time-domain signal sequence and scanning
Wavelength correspondence.
The main interferometer 19 is Michelson's interferometer, by the 2nd 1:1 coupler 10, main interferometer reference arm 11,
Three fiber reflectors 12, main interferometer pickup arm 13 and chirp grating 14 are constituted.Sweeping laser is from the 2nd 1:The port of 1 coupler
10a enters the 2nd 1:1 coupler, the 2nd 1:1 coupler splits the light into two beams into two interfere arms, the end of main interferometer reference arm 11
It is terminated with fiber reflector to return to light, chirp grating 14 is connected with main interferometer pickup arm 13, grating returns to corresponding wavelength
Sweep light, two-arm return light occurs after difference frequency interference in coupler by the 2nd 1:The port 10b outputs of 1 coupler enter second
Photodetector 15, photodetector output electric signal is collected the ripple that chirp grating is contained in system acquisition, output signal
Long, positional information.
The auxiliary interferometer 18 is Michelson's interferometer, by the 1st:1 coupler 3, auxiliary interferometer first are interfered
Arm 4, auxiliary interferometer the second interfere arm 6, the first fiber reflector 5, the second fiber reflector 7 are constituted.Sweeping laser is from first
1:The port 3a of 1 coupler enters the 1st:1 coupler, the 1st:1 coupler splits the light into two beams and respectively enters auxiliary interference
The first interfere arm of instrument 4 and the second interfere arm of auxiliary interferometer 6, the first interfere arm of auxiliary interferometer 4 and auxiliary interferometer second are dry
Relate to each interfere arm end of arm 6 and be connected to fiber reflector, two-beam is respectively by the first fiber reflector 5, the second fiber reflection
Mirror 7 is returned and the 1st:Occur in 1 coupler after difference frequency interference by the 1st:The port 3b outputs of 1 coupler enter the first light
Electric explorer 8, the first photodetector output signal is used as sampled clock signal into data collecting system 9.The difference frequency is done
Signal is related to be directly proportional to the first interfere arm of auxiliary interferometer 4 of Michelson and the arm length difference of the second interfere arm of auxiliary interferometer 6
Relation, knows that sample frequency is necessarily equal to or more than twice of signal frequency by Nyquist's theorem, therefore auxiliary interferometer brachium
It is poor to be equal to or more than twice of main interferometer arm length difference.
The present invention is comprised the steps of in actual use：
Step 1：Tunable narrow-band laser 1 sends linear scan laser, and scanning sends laser scans triggering when starting
The trigger data acquisition system 9 of signal 17 carries out data acquisition, and sweep light enters 95:5 couplers 2, wherein 5% light enters auxiliary
Interferometer 18,95% light enters main interferometer 19.
Step 2：The difference frequency interference light that auxiliary interferometer is returned is converted to electric signal output conduct by the first photodetector 8
The sampling clock of data collecting system 9.
Step 3：The interference signal that main interferometer is returned is collected system acquisition as transducing signal, and it includes tested chirp
The wavelength and positional information of grating (14).
Step 4：Acquisition system is acquired to laser scans trigger signal 17, and it starts and afterwards in laser scans
TTL pulse level is sent every fixed wave length, can be by it is determined that the interval corresponding interference signal of different wave length.
Step 5：Data are handled with computer 16, chirp grating wavelength and the corresponding relation of position is obtained, realized
Chirp grating is demarcated.
Tunable laser scans for wavelength linear, and scanning range is Δ Λ, and its scanning relational expression is：
λ (t)=λ0+γ×t (1)
Wherein, λ (t) is real-time wavelength, λ0For initial wavelength, γ is laser scans speed, and t is the time.
Δ Λ can be divided into k parts by laser scans trigger signal 17, if i-th part of wave-length coverage is Δ λi, it is corresponding
Time domain data is Δ Ni, then to Δ NiCarry out FFT and obtain frequency domain data, then have：
Wherein, fiFor frequency domain peak value, liFor the corresponding reflection position of the crest frequency, i.e. Δ λiThe corresponding position in grating
Put.
Although the embodiment to the present invention is described above, in order to which those skilled in the art manage
The solution present invention, it should be apparent that the invention is not restricted to the scope of embodiment, to those skilled in the art
For, as long as various change is in the spirit and scope of the present invention that appended claim is limited and is determined, these changes are
It will be apparent that all utilize the innovation and creation of present inventive concept in the row of protection.
Claims (4)
1. a kind of caliberating device of the chirp grating based on probe beam deflation principle, it is characterised in that：The device is by tunable narrow
Band laser is as light source, and two Michelson's interferometers are respectively as main interferometer and auxiliary interferometer, using photodetection
Device carries out opto-electronic conversion, and acquisition system is by light source scanning trigger signal triggering collection, and the interference signal that auxiliary interferometer is returned is made
For system sampling clock；
The tunable narrow-band laser is used to provide linear scan light, enters main interferometer by coupler light splitting and auxiliary is interfered
Instrument, is the basis that the device realizes difference frequency interference；
The scanning trigger signal is Transistor-Transistor Logic level pulse signal, and it starts in scanning and touched afterwards every fixed wave length
Hair, it is that triggering collection system starts to gather and determines the interval corresponding time-domain signal of different wave length that it, which is acted on,；
The main interferometer (19) is Michelson's interferometer, by the 2nd 1:1 coupler, two main interferometer interfere arms, one
Fiber reflector is constituted, and sweeping laser is from the 2nd 1:The port (8a) of 1 coupler enters the 2nd 1:1 coupler, the 2nd 1:1 coupling
Device splits the light into two beams into two interfere arms, and two interfere arms are main interferometer reference arm (11) and main interferometer pickup arm (13),
Main interferometer reference arm (11) end is connected to fiber reflector and returns to light, and main interferometer pickup arm is connected with chirped light on (13)
Grid, grating returns to the laser of corresponding wavelength, and two interfere arm return lights are the 2nd 1:Occur in 1 coupler after difference frequency interference by second
1:Port (8b) output of 1 coupler enters the first photodetector, and the first photodetector exports electric signal by data acquisition
System acquisition；
The auxiliary interferometer (18) is Michelson's interferometer, by the 1st:1 coupler, two auxiliary interferometer interfere arms and
Two fiber reflectors composition, sweeping laser is from the 1st:The port (3a) of 1 coupler enters the 1st:1 coupler, the 1st:1
Coupler splits the light into two beams into two auxiliary interferometer interfere arms, and two auxiliary interferometer interfere arm ends are all connected to fiber reflection
Mirror, two-beam is returned and the 1st by speculum respectively:Occur in 1 coupler after difference frequency interference by the 1st:The end of 1 coupler
Mouth (3b) output enters the second photodetector, when the second photodetector output signal enters data collecting system as sampling
Clock signal, the difference frequency interference signal and the auxiliary interferometer interfere arm arm length difference of Michelson two are proportional, by Nai Kuisi
Specific reason knows that sample frequency is necessarily equal to or more than twice of signal frequency, therefore auxiliary interferometer arm length difference must be equal to or more than
Twice of main interferometer arm length difference；
The difference frequency interference light that the auxiliary interferometer (18) returns reflects the nonlinear change of laser sweep light frequency, and it is made
For the device sampling clock can correct light source frequency sweep it is non-linear.
2. the caliberating device of the chirp grating according to claim 1 based on probe beam deflation principle, it is characterised in that：Should
Device uses Michelson's interferometer, and the forward direction light path and return light path of Michelson's interferometer are symmetrical, and light is in arm toward back pass
The defeated influence that can eliminate optical fiber rotation effect to laser polarization state, so that eliminate causes declining for interference signal by polarization state change
Subtract.
3. a kind of scaling method of the chirp grating based on probe beam deflation principle, it is characterised in that：This method step is as follows：
Step 1：Tunable narrow-band laser sends linear scan laser, and scanning sends scanning trigger signal triggering collection when starting
System carries out data acquisition, and sweep light enters 95:5 couplers (2), wherein 5% light enters auxiliary interferometer, 95% light enters
Enter main interferometer；
Step 2：The difference frequency interference light that auxiliary interferometer is returned is converted to electric signal output as signal acquisition by photodetector
The sampling clock of system；
Step 3：The interference signal that main interferometer is returned is collected system acquisition as transducing signal, and it includes tested chirp grating
Wavelength and positional information；
Step 4：Acquisition system is acquired to scanning trigger signal, and it starts in laser scans and afterwards every fixed wave length
TTL pulse level is sent, can be by it is determined that the interval corresponding interference signal of different wave length；
Step 5：Data are handled, chirp grating wavelength and the corresponding relation of position is obtained, realize that chirp grating is demarcated.
4. the scaling method of the chirp grating according to claim 3 based on probe beam deflation principle, it is characterised in that：Adopt
With optical frequency domain reflection technology, laser wavelength scanning scope covering chirp grating wave-length coverage, the interval difference frequency of different wave length is done
Signal is related to comprising the range of wavelengths in the positional information of chirp grating, chirp can be obtained by being demodulated to each range of wavelengths signal
Grating wavelength is distributed, and also can directly calibrate the beginning and end in chirp grating grid region.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109004973A (en) * | 2018-07-04 | 2018-12-14 | 广州广电计量检测股份有限公司 | A kind of OTDR capability evaluating device and method |
| CN109682403A (en) * | 2019-01-29 | 2019-04-26 | 南京大学 | The method of tunable laser nonlinear frequency sweeping is corrected in a kind of optical frequency domain reflectometer |
| CN110375782A (en) * | 2019-07-29 | 2019-10-25 | 武汉隽龙科技股份有限公司 | Improve the device and method of OFDR single sweep operation demodulation speed |
| CN113390333A (en) * | 2020-03-13 | 2021-09-14 | 欧姆龙株式会社 | Optical interference measuring device |
| CN117109646A (en) * | 2023-10-25 | 2023-11-24 | 杭州奕力科技有限公司 | Sensing demodulation method of linear chirped fiber grating |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20060102801A (en) * | 2005-03-25 | 2006-09-28 | 광주과학기술원 | Apparatus and method for compensation of the nonlinearity of an ofdr system |
| CN101680781B (en) * | 2008-02-29 | 2011-11-23 | 株式会社藤仓 | Physical quantity measuring device of optical frequency range reflection measuring type, and temperature and strain simultaneous measuring method using the device |
| US8909040B1 (en) * | 2013-02-05 | 2014-12-09 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method and apparatus of multiplexing and acquiring data from multiple optical fibers using a single data channel of an optical frequency-domain reflectometry (OFDR) system |
-
2017
- 2017-06-22 CN CN201710479439.0A patent/CN107102173B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20060102801A (en) * | 2005-03-25 | 2006-09-28 | 광주과학기술원 | Apparatus and method for compensation of the nonlinearity of an ofdr system |
| CN101680781B (en) * | 2008-02-29 | 2011-11-23 | 株式会社藤仓 | Physical quantity measuring device of optical frequency range reflection measuring type, and temperature and strain simultaneous measuring method using the device |
| US8909040B1 (en) * | 2013-02-05 | 2014-12-09 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method and apparatus of multiplexing and acquiring data from multiple optical fibers using a single data channel of an optical frequency-domain reflectometry (OFDR) system |
Non-Patent Citations (3)
| Title |
|---|
| 徐兴贤: ""基于OFDR系统的分布式应力传感技术的研究"", 《中国优秀硕士学位论文全文数据库》 * |
| 李政颖 等: ""基于光频域反射技术的超弱反射光纤光栅传感技术研究"", 《光学学报》 * |
| 李沼云 等: ""光频域反射光纤光栅分布式应变传感研究"", 《光器件》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109004973A (en) * | 2018-07-04 | 2018-12-14 | 广州广电计量检测股份有限公司 | A kind of OTDR capability evaluating device and method |
| CN109682403A (en) * | 2019-01-29 | 2019-04-26 | 南京大学 | The method of tunable laser nonlinear frequency sweeping is corrected in a kind of optical frequency domain reflectometer |
| CN109682403B (en) * | 2019-01-29 | 2020-10-16 | 南京大学 | Method for correcting nonlinear frequency sweep of tunable laser in optical frequency domain reflectometer |
| CN110375782A (en) * | 2019-07-29 | 2019-10-25 | 武汉隽龙科技股份有限公司 | Improve the device and method of OFDR single sweep operation demodulation speed |
| CN110375782B (en) * | 2019-07-29 | 2021-09-03 | 武汉昊衡科技有限公司 | Device and method for improving OFDR single scanning demodulation speed |
| CN113390333A (en) * | 2020-03-13 | 2021-09-14 | 欧姆龙株式会社 | Optical interference measuring device |
| CN117109646A (en) * | 2023-10-25 | 2023-11-24 | 杭州奕力科技有限公司 | Sensing demodulation method of linear chirped fiber grating |
| CN117109646B (en) * | 2023-10-25 | 2024-02-23 | 杭州奕力科技有限公司 | Sensing demodulation method of linear chirped fiber grating |
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