CN107102173B - Calibration device and method of chirped grating based on optical frequency domain reflection principle - Google Patents
Calibration device and method of chirped grating based on optical frequency domain reflection principle Download PDFInfo
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- CN107102173B CN107102173B CN201710479439.0A CN201710479439A CN107102173B CN 107102173 B CN107102173 B CN 107102173B CN 201710479439 A CN201710479439 A CN 201710479439A CN 107102173 B CN107102173 B CN 107102173B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
- G01P21/02—Testing or calibrating of apparatus or devices covered by the preceding groups of speedometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
Abstract
The invention discloses a calibration device and a calibration method of a chirped grating based on an optical frequency domain reflection principle, and belongs to the field of sensor calibration. A tunable narrow-band laser is used as a light source, a Michelson interferometer is used for interference, the frequency of a returned interference signal is in a linear relation with the position of a reflection point in the interferometer, the wavelength scanning range of the swept-frequency light covers the wavelength range of the chirped grating, interference signals in different wavelength ranges are demodulated, the position of a grating area corresponding to the wavelength range can be obtained, the relation between the length of the chirped grating and the wavelength can be obtained, and therefore the length of the chirped grating and the chirp rate can be obtained. The invention has simple operation, accurate measurement, non-contact measurement and no damage to the grating.
Description
Technical Field
The invention belongs to the technical field of sensor calibration, and particularly relates to a chirped grating calibration device and method based on an optical frequency domain reflection principle.
Background
The detonation wave is a strong shock wave which is provided with a high-speed chemical reaction area and is propagated in the explosive, the velocity of the detonation wave is called the detonation velocity for short, generally can reach thousands of meters per second, is one of important characteristic parameters of the explosive, and has important significance for researching the performance of the explosive, energy transfer in the explosion process and the like.
The measurement of the explosion velocity can adopt a chirped grating method, and a chirped grating (CFBG) belongs to one of the optical fiber sensors. When the chirp grating is used for measuring the detonation wave speed, the detonation wave acts on the chirp grating, so that the length of the grating is reduced, the light intensity of a return signal is weakened, and the continuous speed of the detonation wave can be measured by utilizing the phenomenon.
In order to solve the speed, the length of the chirped grating needs to be calibrated to obtain the length value of the chirped grating. And whether the length is accurate or not directly influences the accuracy of the finally obtained speed.
The first method is a cutting method, one of the gratings in the same batch is cut, and the length of the chirped grating is obtained by recording the cutting position and the returned light intensity of each time. However, this method has a fatal defect that the calibration is destructive, and the grating is destroyed after the calibration is finished, so that the grating cannot be used continuously. The second method is a thermal probe method, which adopts a spectrometer to observe the reflection spectrum of the chirped grating, when the thermal probe is contacted with the grating region of the grating, the position on the reflection spectrum corresponding to the contact part can generate a depression, when the thermal probe is removed, the depression disappears and recovers to the original state, a series of contact positions of the probe and wavelength data corresponding to the depressed position of the reflection spectrum of the chirped grating on the spectrometer are recorded, and the linear relation between the length and the wavelength of the chirped grating and the total length can be obtained by performing linear fitting on the wavelength data.
Disclosure of Invention
In order to solve the problems, the invention provides a calibration device and a calibration method of a chirped grating based on an optical frequency domain reflection principle, the method is simple to operate, the chirped grating can be accurately calibrated under the non-contact condition, and the calibration device and the calibration method are a brand-new calibration method.
The technical scheme adopted by the invention is as follows: a calibration device of chirped grating based on optical frequency domain reflection principle is characterized in that a tunable narrow-band laser is used as a light source, two Michelson interferometers are respectively used as a main interferometer and an auxiliary interferometer, photoelectric conversion is carried out by adopting a photoelectric detector, an acquisition system is triggered and acquired by a light source scanning trigger signal, and an interference signal returned by the auxiliary interferometer is used as a system sampling clock;
the tunable narrow-band laser is used for providing linear scanning light, the light is split by the coupler and enters the main interferometer and the auxiliary interferometer, and the tunable narrow-band laser is the basis for realizing difference frequency interference by the device;
the scanning trigger signal is a TTL level pulse signal, is triggered at the beginning of scanning and at fixed wavelength intervals later, and has the function of triggering the acquisition system to start acquiring and determining time domain signals corresponding to different wavelength intervals;
the main interferometer is a Michelson interferometer and consists of a second 1:1 coupler, two main interferometer arms and a fiber reflector, wherein sweep laser enters the second 1:1 coupler from a port of the second 1:1 coupler, the second 1:1 coupler divides light into two beams to enter the two interferometer arms, the two interferometer arms are a main interferometer reference arm (11) and a main interferometer sensing arm (13), the tail end of the main interferometer reference arm is connected with the fiber reflector to return the light, the main interferometer sensing arm is connected with a chirped grating, the grating returns the laser with corresponding wavelength, the return light of the two interferometer arms is subjected to difference frequency interference in the second 1:1 coupler and then is output from a port of the second 1:1 coupler to enter a first photoelectric detector, and an electric signal output by the first photoelectric detector is collected by a data collection system;
the auxiliary interferometer is a Michelson interferometer and consists of a first 1:1 coupler, two auxiliary interferometer arms and two optical fiber reflectors, wherein swept laser enters the first 1:1 coupler from a port of the first 1:1 coupler, the first 1:1 coupler divides light into two beams which enter the two auxiliary interferometer arms, the tail ends of the two auxiliary interferometer arms are connected with the optical fiber reflectors, the two beams of light are respectively returned by the reflectors and subjected to difference frequency interference in the first 1:1 coupler, then the two beams of light are output from the port of the first 1:1 coupler and enter a second photoelectric detector, an output signal of the second photoelectric detector enters a data acquisition system to serve as a sampling clock signal, the difference frequency interference signal is in a direct proportion relation with the length difference of the Michelson two auxiliary interferometer arms, and the sampling frequency is equal to or more than two times of the signal frequency according to the Nyquist theorem, therefore, the arm length difference of the auxiliary interferometer is equal to or more than two times of the arm length difference of the main interferometer;
the difference frequency interference light returned by the auxiliary interferometer reflects the nonlinear change of the frequency of the laser sweep frequency light, and the difference frequency interference light serving as the sampling clock of the device can correct the sweep frequency nonlinearity of the light source.
The device adopts a Michelson interferometer, a forward light path and a return light path of the Michelson interferometer are symmetrical, and light is transmitted back and forth in an arm, so that the influence of an optical rotation effect on the polarization state of laser light can be eliminated, and the attenuation of interference signals caused by the change of the polarization state is eliminated.
The invention also provides a method for calibrating the chirped grating based on the optical frequency domain reflection principle, which comprises the following steps:
step 1: the tunable narrow-band laser emits linear scanning laser, a scanning trigger signal is emitted when scanning starts to trigger an acquisition system to acquire data, and swept-frequency light enters a 95:5 coupler, wherein 5% of light enters an auxiliary interferometer and 95% of light enters a main interferometer;
step 2: the difference frequency interference light returned by the auxiliary interferometer is converted into an electric signal by a photoelectric detector and is output as a sampling clock of a signal acquisition system;
and step 3: the interference signal returned by the main interferometer is used as a sensing signal and is collected by a collecting system, and the sensing signal comprises the wavelength and the position information of the chirp grating to be detected;
and 4, step 4: the acquisition system acquires the scanning trigger signal, sends out TTL pulse level at the beginning and every other fixed wavelength of the laser scanning, and can determine the interference signals corresponding to different wavelength intervals;
and 5: and processing the data to obtain the corresponding relation between the wavelength and the position of the chirped grating, thereby realizing the calibration of the chirped grating.
The wavelength scanning range of the laser covers the wavelength range of the chirped grating by adopting an optical frequency domain reflection technology, difference frequency interference signals in different wavelength intervals comprise position information of the wavelength intervals in the chirped grating, the wavelength distribution of the chirped grating can be obtained by demodulating signals in each wavelength interval, and the starting point and the end point of a chirped grating area can also be directly calibrated.
Compared with the prior art, the invention has the advantages that:
the method can calibrate the information of each wavelength and position of the chirped grating under the non-contact condition, can obtain the linear relation of the wavelength and the position by fitting, can also directly calibrate the starting point and the end point of the grating region of the grating, has no damage to the grating in the calibration process, is simple to operate, has no complicated working procedures compared with the prior art, and is a novel chirped grating calibration method.
Drawings
FIG. 1 is a diagram of a chirped grating system calibrated based on optical frequency domain reflection principle;
in the figure: 1. a tunable narrow band laser;
2. a 95:5 coupler;
3. a first 1:1 coupler;
4. an auxiliary interferometer first interference arm;
5. a first fiber mirror;
6. an auxiliary interferometer second interference arm;
7. a second fiber mirror;
8. a first photodetector;
9. a data acquisition system;
10. a second 1:1 coupler;
11. a main interferometer reference arm;
12. a third fiber mirror;
13. a main interferometer sensing arm;
14. a chirped grating;
15. a second photodetector;
16. a computer;
17. scanning a trigger signal by a laser;
18. an auxiliary interferometer;
19. a main interferometer.
Detailed Description
The following description of specific embodiments of the present invention is provided in order to better understand the present invention with reference to the accompanying drawings. It should be emphasized that the following description is merely exemplary in nature and is not intended to limit the scope of the invention or its application.
The matched device of the chirp grating calibration method is shown in figure 1, sweep frequency laser emitted by a tunable narrow-band laser 1 enters a 95:5 coupler 2, the coupler divides light into two beams, 5% of light enters an auxiliary interferometer 18, beat frequency interference output by the auxiliary interferometer enters a first photoelectric detector 8 to be converted into an electric signal and output as a sampling reference clock of a data acquisition system 9; and the other 95 percent of light enters the main interferometer 19, the interference light returned by the main interferometer enters the second photoelectric detector 15 to be converted into an electric signal, the electric signal is collected by the collecting system, and the wavelength and the position relation of the chirped grating are obtained by processing the electric signal by the computer 16.
The laser scanning trigger signal 17 outputs a pulse level at the beginning of scanning by the scanning light source and at every fixed wavelength, and has two functions, namely triggering the acquisition system to acquire at the beginning of scanning, and corresponding the time domain signal sequence to the scanning wavelength.
The main interferometer 19 is a michelson interferometer and is composed of a second 1:1 coupler 10, a main interferometer reference arm 11, a third fiber reflector 12, a main interferometer sensing arm 13 and a chirped grating 14. The swept frequency laser enters the second 1:1 coupler from a port 10a of the second 1:1 coupler, the second 1:1 coupler divides light into two beams and enters two interference arms, the tail end of a reference arm 11 of the main interferometer is connected with an optical fiber reflector to return the light, a chirp grating 14 is connected to a sensing arm 13 of the main interferometer, the grating returns swept frequency light with corresponding wavelength, the two-arm return light is subjected to difference frequency interference in the coupler and then is output from a port 10b of the second 1:1 coupler to enter a second photoelectric detector 15, an electric signal output by the photoelectric detector is collected by a collection system, and the output signal contains wavelength and position information of the chirp grating.
The auxiliary interferometer 18 is a Michelson interferometer and is composed of a first 1:1 coupler 3, an auxiliary interferometer first interference arm 4, an auxiliary interferometer second interference arm 6, a first optical fiber reflector 5 and a second optical fiber reflector 7. The swept laser enters a first 1:1 coupler from a port 3a of the first 1:1 coupler, the first 1:1 coupler divides light into two beams which respectively enter a first interference arm 4 of an auxiliary interferometer and a second interference arm 6 of the auxiliary interferometer, the tail end of each interference arm of the first interference arm 4 of the auxiliary interferometer and the second interference arm 6 of the auxiliary interferometer is connected with an optical fiber reflector, the two beams of light are respectively returned by a first optical fiber reflector 5 and a second optical fiber reflector 7 and output from a port 3b of the first 1:1 coupler to enter a first photoelectric detector 8 after difference frequency interference occurs in the first 1:1 coupler, and an output signal of the first photoelectric detector enters a data acquisition system 9 to serve as a sampling clock signal. The difference frequency interference signal is in a direct proportion relation with the arm length difference of the first interference arm 4 of the auxiliary interferometer and the second interference arm 6 of the auxiliary interferometer of the Michelson, and the sampling frequency is required to be equal to or more than twice of the signal frequency according to the Nyquist theorem, so the arm length difference of the auxiliary interferometer is required to be equal to or more than twice of the arm length difference of the main interferometer.
The invention comprises the following steps when in actual use:
step 1: the tunable narrow-band laser 1 emits linear scanning laser, a laser scanning trigger signal 17 is emitted when scanning starts to trigger a data acquisition system 9 to acquire data, swept-frequency light enters a 95:5 coupler 2, wherein 5% of the light enters an auxiliary interferometer 18, and 95% of the light enters a main interferometer 19.
Step 2: the difference frequency interference light returned by the auxiliary interferometer is converted into an electric signal by the first photodetector 8 and is output as a sampling clock of the data acquisition system 9.
And step 3: the interference signal returned by the main interferometer is collected by a collection system as a sensing signal, and the sensing signal contains the wavelength and position information of the chirp grating (14) to be measured.
And 4, step 4: the acquisition system acquires the laser scanning trigger signal 17, sends out TTL pulse levels at the beginning and every other fixed wavelength of the laser scanning, and can determine the corresponding interference signals in different wavelength intervals through the TTL pulse levels.
And 5: and processing the data by using the computer 16 to obtain the corresponding relation between the wavelength and the position of the chirped grating, thereby realizing the calibration of the chirped grating.
The tunable laser is in wavelength linear scanning, the scanning range is delta lambda, and the scanning relation is as follows:
λ(t)＝λ0+γ×t (1)
where λ (t) is the real-time wavelength, λ0At the initial wavelength, γ is the laser scan rate and t is the time.
Scanning touch by laserThe signalling 17 may divide Δ Λ equally into k parts, and let the i-th wavelength range be Δ λiCorresponding time domain data is Δ NiFor Δ NiPerforming FFT to obtain frequency domain data, including:
wherein f isiIs the frequency domain peak, liThe reflection position corresponding to the peak frequency, i.e. Δ λiAt corresponding locations in the grating.
Although the embodiments of the present invention have been described above in order to facilitate the understanding of the present invention by those skilled in the art, it should be understood that the present invention is not limited to the scope of the embodiments, and it will be apparent to those skilled in the art that various changes may be made without departing from the spirit and scope of the invention as defined and defined by the appended claims, and all matters produced by the invention using the inventive concept are protected.
Claims (4)
1. The utility model provides a calibration arrangement of chirp grating based on optical frequency domain reflection principle which characterized in that: the device uses a tunable narrow-band laser as a light source, two Michelson interferometers are respectively used as a main interferometer and an auxiliary interferometer, a photoelectric detector is used for photoelectric conversion, an acquisition system is triggered and acquired by a light source scanning trigger signal, and an interference signal returned by the auxiliary interferometer is used as a system sampling clock;
the tunable narrow-band laser is used for providing linear scanning light, the light is split by the coupler and enters the main interferometer and the auxiliary interferometer, and the tunable narrow-band laser is the basis for realizing difference frequency interference by the device;
the scanning trigger signal is a TTL level pulse signal, is triggered at the beginning of scanning and at fixed wavelength intervals later, and has the function of triggering the acquisition system to start acquiring and determining time domain signals corresponding to different wavelength intervals;
the main interferometer (19) is a Michelson interferometer and consists of a second 1:1 coupler, two main interferometer arms and an optical fiber reflector, wherein swept-frequency laser enters the second 1:1 coupler from a port (8a) of the second 1:1 coupler, the second 1:1 coupler divides light into two beams and enters the two interferometer arms, the two interferometer arms are a main interferometer reference arm (11) and a main interferometer sensing arm (13), the tail end of the main interferometer reference arm (11) is connected with the optical fiber reflector to return the light, the main interferometer sensing arm (13) is connected with a chirped grating, the grating returns the laser with corresponding wavelength, the returning light of the two interferometer arms is subjected to difference frequency interference in the second 1:1 coupler and then is output from a port (8b) of the second 1:1 coupler to enter a first photoelectric detector, and an output electric signal of the first photoelectric detector is collected by a data collection system;
the auxiliary interferometer (18) is a Michelson interferometer and consists of a first 1:1 coupler, two auxiliary interferometer arms and two optical fiber reflectors, wherein swept laser enters the first 1:1 coupler from a port (3a) of the first 1:1 coupler, the first 1:1 coupler divides light into two beams and enters the two auxiliary interferometer arms, the tail ends of the two auxiliary interferometer arms are connected with the optical fiber reflectors, the two beams of light are respectively returned by the reflectors and are output from a port (3b) of the first 1:1 coupler to enter a second photoelectric detector after difference frequency interference occurs in the first 1:1 coupler, an output signal of the second photoelectric detector enters a data acquisition system to serve as a sampling clock signal, the difference frequency interference signal is in a proportional relation with the length difference of the Michelson two auxiliary interferometer arms, and the sampling frequency is equal to or more than two times of the signal frequency according to the Nyquist theorem, therefore, the arm length difference of the auxiliary interferometer is equal to or more than two times of the arm length difference of the main interferometer;
the difference frequency interference light returned by the auxiliary interferometer (18) reflects the nonlinear change of the frequency of the laser swept frequency light, and the difference frequency interference light serving as a sampling clock of the device can correct the sweep frequency nonlinearity of a light source;
the device can calibrate the wavelength-position information of the chirped grating under a non-contact condition, can obtain the wavelength-position linear relation through fitting, can also directly calibrate the starting point and the end point of a grating region of the grating, cannot cause any damage to the grating in the calibration process, and is simple to operate without complex procedures.
2. The apparatus for calibrating a chirped grating based on an optical frequency domain reflection principle according to claim 1, wherein: the device adopts the Michelson interferometer, and the forward light path and the return light path of Michelson interferometer are symmetrical, and the round trip transmission of light in the arm can eliminate the influence of optical fiber rotation effect on the polarization state of laser light, thereby eliminating the attenuation of interference signals caused by the change of the polarization state.
3. A method for calibrating a chirped grating based on an optical frequency domain reflection principle, which utilizes the apparatus of claim 1, and is characterized in that: the method comprises the following steps:
step 1: the tunable narrow-band laser emits linear scanning laser, a scanning trigger signal is emitted when scanning starts to trigger an acquisition system to acquire data, and swept-frequency light enters a 95:5 coupler (2), wherein 5% of light enters an auxiliary interferometer and 95% of light enters a main interferometer;
step 2: the difference frequency interference light returned by the auxiliary interferometer is converted into an electric signal by a photoelectric detector and is output as a sampling clock of a signal acquisition system;
and step 3: the interference signal returned by the main interferometer is used as a sensing signal and is collected by a collecting system, and the sensing signal comprises the wavelength and the position information of the chirp grating to be detected;
and 4, step 4: the acquisition system acquires the scanning trigger signal, sends out TTL pulse level at the beginning and every other fixed wavelength of the laser scanning, and can determine the interference signals corresponding to different wavelength intervals;
and 5: and processing the data to obtain the corresponding relation between the wavelength and the position of the chirped grating, thereby realizing the calibration of the chirped grating.
4. The method for calibrating a chirped grating based on an optical frequency domain reflection principle according to claim 3, wherein: the wavelength scanning range of the laser covers the wavelength range of the chirped grating by adopting an optical frequency domain reflection technology, difference frequency interference signals in different wavelength intervals comprise position information of the wavelength intervals in the chirped grating, the wavelength distribution of the chirped grating can be obtained by demodulating signals in each wavelength interval, and the starting point and the end point of the chirped grating area can also be directly calibrated.
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| CN109004973B (en) * | 2018-07-04 | 2021-09-07 | 广州广电计量检测股份有限公司 | OTDR performance evaluation device and method |
| CN109682403B (en) * | 2019-01-29 | 2020-10-16 | 南京大学 | Method for correcting nonlinear frequency sweep of tunable laser in optical frequency domain reflectometer |
| CN110375782B (en) * | 2019-07-29 | 2021-09-03 | 武汉昊衡科技有限公司 | Device and method for improving OFDR single scanning demodulation speed |
| JP7363614B2 (en) * | 2020-03-13 | 2023-10-18 | オムロン株式会社 | Optical interference measurement device |
| CN117109646B (en) * | 2023-10-25 | 2024-02-23 | 杭州奕力科技有限公司 | Sensing demodulation method of linear chirped fiber grating |
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Effective date of registration: 20210422 Address after: 261057 room 17, building 23, Wuzhou garden, 1166 Weifang Economic Development Zone, Shandong Province Patentee after: Shandong Shuangshi Security Information Technology Industry Research Institute Co., Ltd Address before: 100191 Haidian District, Xueyuan Road, No. 37, Patentee before: BEIHANG University |